JPS6156461B2 - - Google Patents
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- Publication number
- JPS6156461B2 JPS6156461B2 JP18159381A JP18159381A JPS6156461B2 JP S6156461 B2 JPS6156461 B2 JP S6156461B2 JP 18159381 A JP18159381 A JP 18159381A JP 18159381 A JP18159381 A JP 18159381A JP S6156461 B2 JPS6156461 B2 JP S6156461B2
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- moisture
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- sample
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/045—Circuits
- G01N27/046—Circuits provided with temperature compensation
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
【発明の詳細な説明】
本発明は電気抵抗式水分計の温度補償方法と装
置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a temperature compensation method and apparatus for an electrical resistance moisture meter.
電気式水分計は被測定物(以下試料という)の
含有水分率とその電気特性即ち電気容量、電気抵
抗等との相関性を利用したものである。しかしな
がら、試料の電気特性を含有水分率の多少で変化
すると共に、試料の温度によつても変化する。 An electric moisture meter utilizes the correlation between the moisture content of an object to be measured (hereinafter referred to as a sample) and its electrical properties, such as electrical capacity and electrical resistance. However, the electrical properties of the sample change depending on the moisture content, and also change depending on the temperature of the sample.
温度による電気特性の変化の大きさは、電気抵
抗式で穀物の水分を測定する場合で、±10℃の温
度変化に対して水分変化換算でおよそ±1.0%で
あり通常は〓0.1%/1℃の水分温度補正を行つ
ている。この温度補正を正確に行う為には試料の
温度を検出する必要があるが、試料粉砕を行い加
圧して水分を測定する電気水分計の場合、小量の
試料を狭い電極間で測定する為、試料温度を検出
するセンサを電極間の試料の中に挿入するのが困
難であり、通常電極近傍に温度検出センサを置
き、その検出温度で水分温度補正を行つている。
この方法は、試料を粉砕し電極間で加圧して水分
測定を行う際、試料と電極金属間で熱の授受があ
り、水分測定時点では試料温度は電極温度に近づ
き、当初の試料温度と電極温度との差の1/3程度
の大きさの差になることから大きな誤差にはなら
ないものとして使われている。即ち、当初試料温
度と電極温度の差が10℃であれば、水分測定時点
では3℃位の差となり、電極近傍の温度で水分温
度補正を行つても0.3%の誤差である。 The magnitude of change in electrical properties due to temperature is approximately ±1.0% in terms of moisture change for a temperature change of ±10°C when measuring grain moisture using an electrical resistance method, and is usually 0.1%/1. Moisture temperature correction is performed in °C. In order to accurately perform this temperature correction, it is necessary to detect the temperature of the sample, but in the case of an electric moisture meter that measures moisture by crushing the sample and applying pressure, it is necessary to measure a small amount of sample between narrow electrodes. Since it is difficult to insert a sensor that detects sample temperature into the sample between the electrodes, a temperature detection sensor is usually placed near the electrodes, and the moisture temperature is corrected using the detected temperature.
In this method, when measuring moisture content by crushing the sample and applying pressure between the electrodes, heat is exchanged between the sample and the electrode metal, and at the time of moisture measurement, the sample temperature approaches the electrode temperature, and the initial sample temperature and electrode The difference is about 1/3 of the difference from the temperature, so it is used as something that does not cause a large error. That is, if the initial difference between the sample temperature and the electrode temperature is 10°C, there will be a difference of about 3°C at the time of moisture measurement, and even if the moisture temperature is corrected using the temperature near the electrode, the error will be 0.3%.
しかしながら、近年穀物の火力乾燥が普及し、
乾燥中の穀物を取り出して含有水分率を測定する
ことが行われており、このような場合の当初の穀
物と電極近傍の温度の差は10℃〜20℃ある場合が
多く、その水分温度補正誤差を無視することはで
きない。 However, in recent years, thermal drying of grains has become popular,
Grain being dried is taken out and its moisture content is measured. In such cases, the difference in temperature between the initial grain and the vicinity of the electrode is often 10°C to 20°C, so the moisture temperature must be corrected. Errors cannot be ignored.
本発明は試料温度を検出して温度補正精度を向
上させることを目的とする。 An object of the present invention is to detect sample temperature and improve temperature correction accuracy.
以下図面を参照して本発明の実施例を詳細に説
明する。 Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図イ〜ハは電気抵抗式水分計の電極構造の
例であり第1図イは試料を電極間で粉砕しながら
加圧するタイプ、第1図ロは予め粉砕した試料を
電極間で加圧するタイプ、第1図ハはローラ電極
で粉砕加圧しながら水分測定するタイプである。
第1図イ,ロの電極構造の場合、試料が電極間で
加圧されると試料と電極間で熱の授受があるが、
電極と試料の熱容量の違いで、電極の温度は殆ん
ど変化しないが、試料の温度は電極の温度へと近
づいていく。その特性を第2図に示す。 Figure 1 A to C are examples of the electrode structure of an electrical resistance moisture meter. Figure 1 A is a type in which the sample is crushed between the electrodes and pressurized, and Figure 1 B is a type in which a pre-pulverized sample is applied between the electrodes. The pressure type, Fig. 1 (c), is the type that measures moisture while crushing and pressurizing with a roller electrode.
In the case of the electrode structures shown in Figure 1 A and B, when the sample is pressurized between the electrodes, heat is exchanged between the sample and the electrodes.
Due to the difference in heat capacity between the electrode and the sample, the temperature of the electrode hardly changes, but the temperature of the sample approaches the temperature of the electrode. Its characteristics are shown in Figure 2.
第2図に於て電極温度は20℃で試料の初期温度
T0はA1では30℃、B1では20℃、c1では10℃のグ
ラフで、試料温度は時間と共に電極温度に近づく
が、数秒の間に、試料温度と電極温度の差は初期
の差の1/3程度となつている。試料温度の変化量
は試料の初期温度T0と電極温度との間に差があ
るほど大きく、第2図のB1のように、試料温度
と電極温度が最初から等しければ試料温度の変化
はない。 In Figure 2, the electrode temperature is 20℃ and the initial temperature of the sample.
T 0 is 30 °C for A 1 , 20 °C for B 1 , and 10 °C for C 1. The sample temperature approaches the electrode temperature with time, but within a few seconds, the difference between the sample temperature and the electrode temperature decreases from the initial value. This is about 1/3 of the difference. The amount of change in sample temperature increases as there is a difference between the initial sample temperature T0 and the electrode temperature.If the sample temperature and electrode temperature are equal from the beginning, as shown in B1 in Figure 2 , the change in sample temperature do not have.
第3図のA2,B2,C2は、一定水分の試料を第
2図のA1,B1,C1と同一条件で測定した場合の
温度未補正の水分計出力が時間と共に変化する特
性を示す。この温度未補正水分計出力の時間変化
は、試料の抵抗値の変化を表わし、初期の粉砕圧
力の変化による抵抗値変化の後は、試料の温度変
化による抵抗値の変化を表わしている。第3図の
初期の試料印加圧力変動部分を除いた温度未補正
水分出力は第2図の試料温度変化に対応するもの
で、試料温度1℃の変化は水分計出力の0.1%変
化となる。従つて、温度未補正の水分計出力信号
の変化から試料温度の変化を知ることができる。 A 2 , B 2 , and C 2 in Figure 3 are the temperature-uncorrected moisture meter outputs that change over time when a sample with a constant moisture content is measured under the same conditions as A 1 , B 1 , and C 1 in Figure 2. It shows the characteristic that This time change in the temperature-uncorrected moisture meter output represents a change in the resistance value of the sample, and after the initial change in resistance value due to a change in crushing pressure, it represents a change in resistance value due to a change in temperature of the sample. The temperature-uncorrected moisture output in FIG. 3 excluding the initial sample applied pressure fluctuation portion corresponds to the sample temperature change in FIG. 2, and a 1°C change in sample temperature results in a 0.1% change in the moisture meter output. Therefore, changes in the sample temperature can be determined from changes in the moisture meter output signal without temperature correction.
第4図は試料が電極間に装填又は狭まれた時刻
t0を開始点としてt1時t2時(t1<t2)に於ける温度
未補正の水分計出力をM1,M2とした特性図であ
る。第4図において、A3,B3,C3は試料温度が
電極温度より大の場合の例を表わし、それぞれ試
料温度と電極温度の差が大、小、ゼロの場合を示
し、M1−M2の値は試料の温度変化に対応し、初
期の試料温度Tと電極温度T0との差が大である
程大であるから、T−T0に比例すると1次近似
できる。 Figure 4 shows the time when the sample is loaded or squeezed between the electrodes.
It is a characteristic diagram in which M 1 and M 2 are the moisture meter outputs without temperature correction at t 1 and t 2 (t 1 < t 2 ) with t 0 as the starting point. In FIG. 4, A 3 , B 3 , and C 3 represent cases where the sample temperature is higher than the electrode temperature, and indicate cases where the difference between the sample temperature and the electrode temperature is large, small, and zero, respectively, and M 1 − The value of M 2 corresponds to the temperature change of the sample, and the larger the difference between the initial sample temperature T and the electrode temperature T 0 , the larger it becomes. Therefore, when it is proportional to T - T 0 , it can be approximated to the first order.
即ち、T−T0∝M1−M2でK′を比例定数とする
と
T=T0+K′(M1−M2) …(1)
となる。 That is, if T-T 0 ∝M 1 -M 2 and K' is a constant of proportionality, then T=T 0 +K' (M 1 -M 2 )...(1).
第5図は試料温度が時間と共に変化する様子を
示した特性図である。第5図において、試料の初
期温度Tと電極温度T0の差が大の場合が特性A4
であり、小の場合が特性B4であり、T−T0が大
なる程、試料温度の変化は大である。 FIG. 5 is a characteristic diagram showing how the sample temperature changes over time. In Figure 5, when the difference between the initial temperature T of the sample and the electrode temperature T 0 is large, the characteristic is A 4
, and the small case is characteristic B 4 , and the larger T-T 0 is, the larger the change in sample temperature is.
従つて、時刻t2における試料温度T2と電極温度
T0との差は初期の試料温度Tと電極温度T0との
差が大きい程大であるから、T2−T0はT−T0に
比例すると1次近似できる。 Therefore, the sample temperature T 2 and the electrode temperature at time t 2
Since the difference from T 0 becomes larger as the difference between the initial sample temperature T and the electrode temperature T 0 becomes larger, T 2 −T 0 can be linearly approximated when it is proportional to T − T 0 .
即ち、T2−T0∝T−T0となる。これに上記第
1式を代入すると、
T2−T0∝K′(M1−M2) …(2)
従つて、第2式は
T2=T0+K(M1−M2) …(3)
と近似できる。 That is, T 2 −T 0 ∝T−T 0 . Substituting the above first equation into this, T 2 −T 0 ∝K′(M 1 −M 2 )…(2) Therefore, the second equation becomes T 2 =T 0 +K(M 1 −M 2 )… It can be approximated as (3).
ここでKは電極の構造、材質、被測定試料の種
類等により定まる比例定数である。更に正確な試
料温度T2を求めるには、T2をM1−M2の高次式で
与える。なお、電極温度T0は電極近傍に感温素
子を設置して検出する。 Here, K is a proportionality constant determined by the structure and material of the electrode, the type of sample to be measured, etc. In order to obtain a more accurate sample temperature T 2 , T 2 is given by a higher-order expression of M 1 −M 2 . Note that the electrode temperature T 0 is detected by installing a temperature sensing element near the electrode.
第6図は本発明の温度補正を実現するための電
気水分計の1実施例のブロツク図であり、電極に
試料が入つたことを知らせる試料セツトスイツチ
手段4でマイクロプロセツサ部6のタイマが始動
してΔt時間後のt1時に転送スイツチ8Aを閉じ
て電極部1からの信号を変換部2で直線化・レベ
ル調整等の処理を行いA/Dコンバータ5の入力
とし、A/D変換を開始させ、その変換デイジタ
ル信号をマイクロプロセツサ6で読み込みデータ
D1とする。更にt2時に同じく電極からの信号を読
み込みD2とする。このデータD1,D2が温度未補
正水分信号M1,M2を表わすように信号変換部2
が設計されていれば直接に、そうでなければマイ
クロプロセツサ6がD1,D2を所定の水分換算式
で演算して温度未補正信号M1,M2を得る。次に
転送スイツチ8Bを閉じて、温度検出部3からの
電極温度信号をA/D変換部5の入力とし、その
出力をマイクロプロセツサ6で読み込んで電極温
度データT0を得る。ここでマイクロプロセツサ
6は広義のもので入出力ポート、ROM,RAM等
を含む。又時刻t1は測定開始後1秒程度、t2は更
に数秒後とすれば水分測定時間は数秒ですむ。ス
イツチ8A,8Bはゲートを有するアナログスイ
ツチを使用する。マイクロプロセツサ6はこれら
のデータM1,M2,T0と前もつて定められている
定数Kを用いて第3式のT2=T0+K(M1−M2)
を演算する。 FIG. 6 is a block diagram of one embodiment of an electric moisture meter for realizing the temperature correction of the present invention, in which a timer in a microprocessor section 6 is started by the sample set switch means 4 which notifies that a sample has entered the electrode. After Δt time, at t1, the transfer switch 8A is closed, and the signal from the electrode section 1 is linearized, level adjusted, etc. in the converter section 2, and is input to the A/D converter 5, which performs A/D conversion. The converted digital signal is read by the microprocessor 6 and processed as data.
Let D be 1 . Furthermore, at time t 2 , the signal from the electrode is also read and set as D 2 . The signal converter 2 converts the data D 1 and D 2 into temperature-uncorrected moisture signals M 1 and M 2 .
If not, the microprocessor 6 calculates D 1 and D 2 using a predetermined moisture conversion formula to obtain uncorrected temperature signals M 1 and M 2 . Next, the transfer switch 8B is closed, the electrode temperature signal from the temperature detection section 3 is input to the A/D conversion section 5, and its output is read by the microprocessor 6 to obtain electrode temperature data T0 . Here, the microprocessor 6 is broadly defined and includes input/output ports, ROM, RAM, etc. Furthermore, if the time t 1 is set to about 1 second after the start of the measurement, and the time t 2 is set several seconds later, the moisture measurement time can be a few seconds. The switches 8A and 8B are analog switches with gates. The microprocessor 6 uses these data M 1 , M 2 , T 0 and a predetermined constant K to calculate the third equation T 2 =T 0 +K(M 1 −M 2 ).
Calculate.
この試料温度T2と温度未補正水分信号M2と予
め定められている温度補正係数(0.1%/1℃)
を用いて試料の温度補正された水分Mを
M=M2−α(T2−20) …(4)
の演算式に代入して計算する。αは試料の種類に
よつて決まる定数である。 This sample temperature T2 , temperature uncorrected moisture signal M2 , and predetermined temperature correction coefficient (0.1%/1℃)
Calculate by substituting the temperature-corrected moisture content M of the sample into the equation M=M 2 −α(T 2 −20) (4). α is a constant determined by the type of sample.
ここで温度補正は20℃を基準としてあり、温度
未補正水分信号M2は、試料温度20℃の場合はそ
のまま試料の含有水分率を示すよう信号変換器2
の出力レベル又はマイクロプロセツサ6での読込
みデータD2から水分未補正信号M2の演算式が設
計されている。この温度補正された試料の含有水
分率Mを水分表示装置7に出力する。 Here, the temperature correction is based on 20°C, and the uncorrected temperature moisture signal M2 is sent to the signal converter 2 so that it directly indicates the moisture content of the sample when the sample temperature is 20°C.
An arithmetic expression for the moisture uncorrected signal M2 is designed from the output level of the microprocessor 6 or the read data D2 from the microprocessor 6. This temperature-corrected moisture content M of the sample is output to the moisture display device 7.
本発明による温度補正法と装置を用いれば、試
料温度による真水分率の温度補正が可能であり、
火力乾燥時の高温の穀物に対して誤差が少ない水
分測定をすることができ、穀物が過乾燥、未乾燥
等のない適正な含有水分を有するように仕上げで
きるという大なる効果が得られる。 By using the temperature correction method and device according to the present invention, it is possible to correct the true moisture content according to the sample temperature,
It is possible to measure the moisture content of high-temperature grains during thermal drying with little error, and it is possible to finish the grains so that they have an appropriate moisture content without being over-dried or under-dried.
第1図イ〜ハはそれぞれ、水分計の試料電極構
造の例を示す図、第2図は、時間対試料温度の特
性図、第3図と第4図は、実験データに基づく時
間対温度未補正水分計出力の特性図、第5図は、
時間対試料温度の特性図、第6図は本発明の実施
例による水分計の温度補正装置のブロツク図であ
る。
E……試料電極、G……試料、1……試料電
極、3……温度検出素子、4……試料セツトスイ
ツチ、8A,8B……転送スイツチ、6……マイ
クロプロセツサ、7……水分表示装置。
Figure 1 A to C are diagrams each showing an example of the sample electrode structure of a moisture analyzer, Figure 2 is a characteristic diagram of time versus sample temperature, and Figures 3 and 4 are time versus temperature based on experimental data. The characteristic diagram of the uncorrected moisture meter output, Figure 5, is
FIG. 6, which is a characteristic diagram of time versus sample temperature, is a block diagram of a temperature correction device for a moisture meter according to an embodiment of the present invention. E...Sample electrode, G...Sample, 1...Sample electrode, 3...Temperature detection element, 4...Sample set switch, 8A, 8B...Transfer switch, 6...Microprocessor, 7...Moisture display Device.
Claims (1)
ていく型式の電気抵抗式水分計の温度補正方法に
おいて、被測定物を電極部に装填又は挾持した時
点からそれぞれ異なる一定時間後のt1時とt2時
に、被測定物の電気抵抗を測定して温度未補正水
分信号とし、t1時とt2時との温度未補正水分信号
の差に応じて、予め求められた時間対温度未補正
水分信号特性データに基づく推定式から上記被測
定物の電極部装填時温度と電極部温度との差を演
算し、その結果と電極部温度とからt1時又はt2時
における被測定物の温度を求め、それらの温度に
基づいて、t1時又はt2時の温度未補正水分信号の
温度補正をする電気抵抗式水分計の温度補正方
法。 2 上記電気水分計の組立体の温度、該組立体近
傍の温度、または上記電極部近傍の温度を上記電
極部の温度の近似値として用いる特許請求の範囲
第1項記載の方法。 3 上記電気抵抗測定時間はt1<t2の関係を有
し、t2時は上記温度平衡時より十分早く設定され
ている特許請求の範囲第1項または第2項記載の
方法。 4 上記電極部は被測定物に比べて熱容量が大で
ある特許請求の範囲第1項、第2項または第3項
記載の方法。 5 被測定物の温度が測定電極部の温度に平衡し
ていく型式の電気抵抗式水分計の温度補正装置に
おいて、マイクロプロセツサと、被測定物が上記
電極部に装填又は挾持された時点にカウントを開
始するタイマ手段と、カウント開始後t1時とt2時
(t1<t2)に、測定電極部から、被測定物の温度未
補正水分測定信号M1,M2を、並びに上記測定電
極部の温度を表わす信号T0を取り出し、かつ
A/D変換して上記マイクロプロセツサに取り込
む信号取込手段を含み、上記マイクロプロセツサ
において、t2時の試料温度T2=T0+K(M1−
M2)、ここでKは電極部の構造、材質、被測定物
等により定まる比例定数を演算し、その結果に基
づいて温度依存水分値を求め、温度補正された水
分測定値を水分表示部に表示するようにした水分
計の温度補正装置。 6 上記温度補正された水分値MはT2の演算値
をM=M2−α(T2−TA)(ここでαは被測定物
によつて決まる温度係数、TAは温度補正基準温
度)なる演算式に代入して求めるようにした特許
請求の範囲第5項記載の水分計の温度補正装置。[Scope of Claims] 1. In a temperature correction method for an electrical resistance moisture meter in which the temperature of the object to be measured is balanced with the temperature of the measurement electrode section, each At t 1 and t 2 after different fixed times, the electrical resistance of the object to be measured is measured to obtain a temperature-uncorrected moisture signal, and according to the difference in the temperature-uncorrected moisture signal between t 1 and t 2 , The difference between the temperature at the time of loading the electrode part of the object to be measured and the temperature of the electrode part is calculated from the estimation formula based on the time-temperature uncorrected moisture signal characteristic data determined in advance, and the difference between the temperature at the time of loading the electrode part of the object to be measured and the temperature of the electrode part is calculated from the result and the temperature of the electrode part at t 1 o'clock. Alternatively, a temperature correction method for an electric resistance moisture meter that calculates the temperature of the object to be measured at t 2 and corrects the temperature-uncorrected moisture signal at t 1 or t 2 based on those temperatures. 2. The method according to claim 1, wherein the temperature of the assembly of the electric moisture meter, the temperature near the assembly, or the temperature near the electrode section is used as an approximate value of the temperature of the electrode section. 3. The method according to claim 1 or 2, wherein the electrical resistance measurement time has a relationship of t 1 <t 2 , and t 2 is set sufficiently earlier than the temperature equilibrium time. 4. The method according to claim 1, 2, or 3, wherein the electrode portion has a larger heat capacity than the object to be measured. 5. In a temperature correction device for an electrical resistance moisture meter in which the temperature of the object to be measured is balanced with the temperature of the measurement electrode section, the microprocessor and the object to be measured are loaded or clamped on the electrode section. A timer means for starting counting, and at t 1 and t 2 (t 1 < t 2 ) after the start of counting, the temperature-uncorrected moisture measurement signals M 1 and M 2 of the object to be measured are sent from the measurement electrode section, and It includes a signal acquisition means for taking out a signal T 0 representing the temperature of the measurement electrode section, A/D converting it, and inputting it into the microprocessor, and in the microprocessor, the sample temperature T 2 =T at time t 2 is obtained. 0 +K(M 1 −
M 2 ), where K calculates a proportionality constant determined by the structure, material, and object of the electrode part, etc., calculates the temperature-dependent moisture value based on the result, and displays the temperature-corrected moisture measurement value on the moisture display section. Temperature correction device for a moisture meter that displays 6 The temperature-corrected moisture value M is the calculated value of T 2 as M = M 2 - α (T 2 - T A ) (where α is the temperature coefficient determined by the object to be measured, and T A is the temperature correction standard. 6. The temperature correction device for a moisture meter according to claim 5, wherein the temperature is calculated by substituting the temperature into an arithmetic expression (temperature).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18159381A JPS5883240A (en) | 1981-11-12 | 1981-11-12 | Method and device for compensating temperature of electric resistance type moisture meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18159381A JPS5883240A (en) | 1981-11-12 | 1981-11-12 | Method and device for compensating temperature of electric resistance type moisture meter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5883240A JPS5883240A (en) | 1983-05-19 |
| JPS6156461B2 true JPS6156461B2 (en) | 1986-12-02 |
Family
ID=16103516
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18159381A Granted JPS5883240A (en) | 1981-11-12 | 1981-11-12 | Method and device for compensating temperature of electric resistance type moisture meter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5883240A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5430384A (en) * | 1994-07-22 | 1995-07-04 | Onset Computer Corp. | Temperature compensated soil moisture sensor |
-
1981
- 1981-11-12 JP JP18159381A patent/JPS5883240A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5883240A (en) | 1983-05-19 |
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