JPH0216869B2 - - Google Patents
Info
- Publication number
- JPH0216869B2 JPH0216869B2 JP1626282A JP1626282A JPH0216869B2 JP H0216869 B2 JPH0216869 B2 JP H0216869B2 JP 1626282 A JP1626282 A JP 1626282A JP 1626282 A JP1626282 A JP 1626282A JP H0216869 B2 JPH0216869 B2 JP H0216869B2
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- JP
- Japan
- Prior art keywords
- temperature
- sample
- electrode
- moisture
- uncorrected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012937 correction Methods 0.000 claims description 14
- 238000005259 measurement Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 7
- 238000010586 diagram Methods 0.000 description 8
- 238000013459 approach Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 238000003825 pressing Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/045—Circuits
- G01N27/046—Circuits provided with temperature compensation
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Description
【発明の詳細な説明】
本発明は電気抵抗式水分計の温度補償方法に関
する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a temperature compensation method for an electrical resistance moisture meter.
電気式水分計は被測定物(以下試料という)の
含有水分率とその電気特性即ち電気容量、電気抵
抗等との相関性を利用したものである。しかしな
がら、試料の電気特性は含有水分率の多少で変化
すると共に、試料の温度によつても変化する。 An electric moisture meter utilizes the correlation between the moisture content of an object to be measured (hereinafter referred to as a sample) and its electrical properties, such as electrical capacity and electrical resistance. However, the electrical properties of a sample vary depending on the moisture content and also vary depending on the temperature of the sample.
温度による電気特性の変化の大きさは、電気抵
抗式で穀物の水分を測定する場合で、±10℃の温
度変化に対して水分変化換算でおよそ±1.0%で
あり、通常は〓0.1%/±1℃の水分温度補正を
行つている。この温度補正を正確に行う為には試
料の温度を検出する必要があるが、試料粉砕を行
い加圧して水分を測定する電気水分計の場合、小
量の試料を狭い電極間で測定する為、試料温度を
検出するセンサを電極間の試料の中に挿入するの
が困難であり、通常電極近傍に温度検出センサを
置き、その検出温度で水分温度補正を行つてい
る。この方法は、試料を粉砕し電極間で加圧して
水分測定を行う際、試料と電極金属間で熱の授受
があり、水分測定時点では試料温度は電極温度に
近づき、当初の試料温度と電極温度との差の1/3
程度の大きさの差になることから大きな誤差には
ならないものとして使われている。即ち、当初試
料温度と電極温度の差が10℃であれば、試料粉砕
後の水分測定時点では3℃位の差となり、電極近
傍の温度で水分温度補正を行つても0.3%位の誤
差である。またとくに、試料温度と電極温度との
差が大きい場合は試料を放置して電極温度に馴じ
ませてから測定している。 The magnitude of change in electrical properties due to temperature is approximately ±1.0% in terms of moisture change for a temperature change of ±10°C when measuring grain moisture using an electrical resistance method, and normally 0.1%/ Moisture temperature correction of ±1°C is performed. In order to accurately perform this temperature correction, it is necessary to detect the temperature of the sample, but in the case of an electric moisture meter that measures moisture by crushing the sample and applying pressure, it is necessary to measure a small amount of sample between narrow electrodes. Since it is difficult to insert a sensor that detects sample temperature into the sample between the electrodes, a temperature detection sensor is usually placed near the electrodes, and the moisture temperature is corrected using the detected temperature. In this method, when measuring moisture content by crushing the sample and applying pressure between the electrodes, heat is exchanged between the sample and the electrode metal, and at the time of moisture measurement, the sample temperature approaches the electrode temperature, and the initial sample temperature and electrode 1/3 of the difference from temperature
It is used as something that does not result in a large error because it is a difference in magnitude. In other words, if the initial difference between the sample temperature and the electrode temperature is 10°C, there will be a difference of about 3°C at the time of moisture measurement after crushing the sample, and even if the moisture temperature is corrected using the temperature near the electrode, the error will be about 0.3%. be. In particular, when the difference between the sample temperature and the electrode temperature is large, the sample is left to adjust to the electrode temperature before measurement.
しかしながら、近年穀物の火力乾燥が普及し、
乾燥中の穀物を取り出して含有水分率を測定する
ことが行われており、このような場合の当初の穀
物と電極近傍の温度の差は10℃〜20℃ある場合が
多く、迅速な測定が要求されるため乾燥機から取
り出した試料を直ぐ水分測定することになるがそ
の水分温度補正誤差を無視することはできない。 However, in recent years, thermal drying of grains has become popular,
Grain being dried is taken out and its moisture content is measured. In such cases, the difference in temperature between the initial grain and the vicinity of the electrode is often 10°C to 20°C, making rapid measurement difficult. Because of this requirement, the moisture content of the sample taken out of the dryer must be measured immediately, but the moisture temperature correction error cannot be ignored.
本発明は試料温度を検出して温度補正精度を向
上させる温度補正方法を提供することを目的とし
たものであり、その原理は試料の電気抵抗値には
含有水分率と試料温度との2つの情報を含んでい
ることを利用している。即ち試料の電気抵抗値
は、温度が一定であれば含有水分率と1:1の対
応をし、含有水分率が一定であれば試料温度と
1:1に対応をする。 The purpose of the present invention is to provide a temperature correction method that improves temperature correction accuracy by detecting sample temperature. It takes advantage of the fact that it contains information. That is, the electrical resistance value of the sample corresponds 1:1 to the moisture content if the temperature is constant, and corresponds 1:1 to the sample temperature if the moisture content is constant.
しかしながら、試料の含有水分率と温度の組み
合わせは固定されない為、試料の電気抵抗値のみ
から試料の含有水分率と試料温度を分離すること
はできない。本発明に於ては、試料の電気抵抗値
とその時間的変化から試料温度と電極温度の差を
知り、電極温度は電極近傍の温度センサで測定
し、実質的に試料温度を知り、試料温度に基づい
た水分温度補正を行う。 However, since the combination of the moisture content of the sample and the temperature is not fixed, it is not possible to separate the moisture content of the sample and the sample temperature from only the electrical resistance value of the sample. In the present invention, the difference between the sample temperature and the electrode temperature is known from the electrical resistance value of the sample and its change over time, the electrode temperature is measured with a temperature sensor near the electrode, and the sample temperature is essentially known. Perform moisture temperature correction based on
以下図面を参照して本発明の実施例を詳細に説
明する。 Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図イ〜ハは電気抵抗式水分計の電極構造の
例であり第1図イは試料を電極間で粉砕しながら
加圧するタイプ、第1図ロは予め粉砕した試料を
電極間で加圧するタイプ。第1図ハはローラ電極
で粉砕加圧しながら水分測定するタイプである。
第1図イ,ロの電極構造の場合、試料が電極間で
加圧されると試料と電極間で熱の授受があるが、
電極と試料の熱容量の違いで、電極の温度は殆ん
ど変化しないが、試料の温度は電極の温度へと近
づいていく。その特性を第2図に示す。 Figures 1A to 1C are examples of the electrode structure of an electrical resistance moisture meter. Figure 1A is a type in which the sample is crushed between the electrodes while pressurized, and Figure 1B is a type in which a pre-pulverized sample is applied between the electrodes. Pressure type. Figure 1C shows a type in which moisture is measured while crushing and pressurizing with a roller electrode.
In the case of the electrode structures shown in Figure 1 A and B, when the sample is pressurized between the electrodes, heat is exchanged between the sample and the electrodes.
Due to the difference in heat capacity between the electrode and the sample, the temperature of the electrode hardly changes, but the temperature of the sample approaches the temperature of the electrode. Its characteristics are shown in Figure 2.
第2図に於て電極温度は20℃で試料の初期温度
T0はA1では30℃、B1では20℃、C1では10℃のグ
ラフで、試料温度は時間と共に電極温度に近づく
が、数秒の間に、試料温度と電極温度の差は初期
の差の1/3程度となつている。試料温度の変化量
は試料の初期温度T0と電極温度との間に差があ
るほど大きく、第2図のB1のように、試料温度
と電極温度が最初から等しければ試料温度の変化
はない。 In Figure 2, the electrode temperature is 20℃ and the initial temperature of the sample.
The graph shows that T 0 is 30℃ for A 1 , 20℃ for B 1 , and 10℃ for C 1.The sample temperature approaches the electrode temperature with time, but within a few seconds, the difference between the sample temperature and the electrode temperature decreases from the initial value. This is about 1/3 of the difference. The amount of change in sample temperature increases as there is a difference between the initial sample temperature T0 and the electrode temperature.If the sample temperature and electrode temperature are equal from the beginning, as shown in B1 in Figure 2 , the change in sample temperature do not have.
第3図のA2,B2,C2は、一定水分の試料を第
2図のA1,B1,C1と同一条件で測定した場合の
温度未補正の水分計出力が時間と共に変化する特
性を示す。この温度未補正水分計出力の時間変化
は、試料の抵抗値の変化を表わし、初期の粉砕圧
力の変化による抵抗値変化の後は、試料の温度変
化による抵抗値の変化を表わしている。第3図の
初期の試料印加圧力変動部分を除いた温度未補正
水分出力は第2図の試料温度変化に対応するもの
で、試料温度1℃の変化は水分計出力の0.1%変
化となる。従つて、温度未補正の水分計出力信号
の変化から試料温度の変化を知ることができる。 A 2 , B 2 , and C 2 in Figure 3 are the temperature-uncorrected moisture meter outputs that change over time when a sample with a constant moisture content is measured under the same conditions as A 1 , B 1 , and C 1 in Figure 2. It shows the characteristic that This time change in the temperature-uncorrected moisture meter output represents a change in the resistance value of the sample, and after the initial change in resistance value due to a change in crushing pressure, it represents a change in resistance value due to a change in temperature of the sample. The temperature-uncorrected moisture output in FIG. 3 excluding the initial sample applied pressure fluctuation portion corresponds to the sample temperature change in FIG. 2, and a 1°C change in sample temperature results in a 0.1% change in the moisture meter output. Therefore, it is possible to know the change in sample temperature from the change in the moisture meter output signal without temperature correction.
第4図は試料が電極間に装填又は狭まれた時刻
t0を開始点としてt1時、t1′時、t2時(t1<t1′<t2)
に於ける温度未補正の水分計出力をM1,M1′,
M2とした特性図である。第4図において、A3,
B3,C3は試料温度が電極温度より大の場合の例
を表わし、それぞれ試料温度と電極温度の差が
大、小、ゼロの場合を示し、M1−M2の値は試料
の温度変化に対応し、初期の試料温度Tと電極温
度T0との差が大である程大であるから、T−T0
に比例すると1次近似できる。 Figure 4 shows the time when the sample is loaded or squeezed between the electrodes.
Starting from t 0 , at t 1 , t 1 ′, and t 2 (t 1 < t 1 ′ < t 2 )
The temperature-uncorrected moisture meter output at M 1 , M 1 ′,
It is a characteristic diagram with M2 . In Figure 4, A 3 ,
B 3 and C 3 represent examples where the sample temperature is higher than the electrode temperature, and indicate cases where the difference between the sample temperature and the electrode temperature is large, small, and zero, respectively, and the value of M 1 − M 2 is the sample temperature. Corresponding to the change, the larger the difference between the initial sample temperature T and the electrode temperature T 0 , the larger the difference, so T-T 0
If it is proportional to , it can be approximated to first order.
即ちT−T0∝M1−M2でK′を比例定数とする
と
T=T0+K′(M1−M2) ……(1)
となる。 That is, if T-T 0 ∝M 1 -M 2 and K' is a constant of proportionality, then T=T 0 +K' (M 1 -M 2 )...(1).
第5図は試料温度が時間と共に変化する様子を
示した特性図である。第5図において、試料の初
期温度Tと電極温度T0の差が大の場合が特性A4
であり、小の場合が特性B4であり、T−T0が大
なる程、試料温度の変化は大である。 FIG. 5 is a characteristic diagram showing how the sample temperature changes over time. In Figure 5, when the difference between the initial temperature T of the sample and the electrode temperature T 0 is large, the characteristic is A 4
, and the small case is characteristic B 4 , and the larger T-T 0 is, the larger the change in sample temperature is.
従つて、時刻t2における試料温度T2と電極温度
T0との差は初期の試料温度Tと電極温度T0との
差が大きい程大であるから、T2−T0はT−T0に
比例すると1次近似できる。 Therefore, the sample temperature T 2 and the electrode temperature at time t 2
Since the difference from T 0 becomes larger as the difference between the initial sample temperature T and the electrode temperature T 0 becomes larger, T 2 −T 0 can be linearly approximated when it is proportional to T − T 0 .
即ちT2−T0∝T−T0となる。これに上記第1
式を代入すると、
T2−T0∝K′(M1−M2) ……(2)
従つて、第2式は
T2=T0+K(M1−M2) ……(3)
と近似できる。 That is, T 2 −T 0 ∝T−T 0 . Add to this the first
Substituting the formula, T 2 −T 0 ∝K′(M 1 −M 2 ) ……(2) Therefore, the second equation becomes T 2 =T 0 +K(M 1 −M 2 ) ……(3) It can be approximated as
ここでKは電極の構造、材質、被測定試料の種
類等により定まる比例定数である。更に正確な試
料温度T2を求めるには、T2をM1−M2の高次式
で与える。なお、電極温度T0は電極近傍に感温
素子を設置して検出する。 Here, K is a proportionality constant determined by the structure and material of the electrode, the type of sample to be measured, etc. In order to obtain a more accurate sample temperature T 2 , T 2 is given by a higher-order expression of M 1 −M 2 . Note that the electrode temperature T 0 is detected by installing a temperature sensing element near the electrode.
第4図C3のように試料温度と電極温度が一致
していて温度未補正水分計出力の時間変動がない
場合も、t2時まで待つことは不要である。従つて
t1′時(t1<t1′<t2)の温度未補正水分計出力
M1′を測定し、このM1′をt1時の温度未補正水分
計出力M1とを比較してある幅以内の差であれば
試料温度と電極温度が一致していると判断し、電
極近傍温度T0で温度未補正水分信号M1又は
M1′を補正し含水率値を得る。この際温度未補正
水分信号は0.01%のオーダーで一致すれば試料温
度と電極温度が一致していると判断しても測定確
度上充分である。 Even if the sample temperature and electrode temperature match and there is no time variation in the temperature-uncorrected moisture meter output as shown in C 3 in Figure 4, it is not necessary to wait until t 2 o'clock. accordingly
Temperature uncorrected moisture meter output at t 1 ′ (t 1 < t 1 ′ < t 2 )
Measure M 1 ′ and compare this M 1 ′ with the temperature-uncorrected moisture meter output M 1 at t 1. If the difference is within a certain range, it is determined that the sample temperature and electrode temperature match. , temperature uncorrected moisture signal M 1 or
Correct M 1 ′ to obtain the moisture content value. At this time, if the temperature-uncorrected moisture signals match on the order of 0.01%, it is sufficient in terms of measurement accuracy even if it is determined that the sample temperature and electrode temperature match.
第6図は本発明の温度補正を実現するための電
気水分計の1実施例のブロツク図であり、電極に
試料が入つたことを知らせる試料セツトスイツチ
手段4でマイクロプロセツサ部6のタイマが始動
して△t時間後のt1時に転送スイツチ8Aを閉じ
て電極部1からの信号を変換部2で直線化・レベ
ル調整等の処理を行いA/Dコンバータ5の入力
とし、A/D変換を開始させ、その変換デイジタ
ル信号をマイクロプロセツサ6で読み込みデータ
D1とする。更にt1′時に同じく電極からの信号を
読み込みD1′とする。このデータD1,D1′が温度未
補正水分信号M1,M1′を表わすように信号変換
部2が設計されていれば直接に、そうでなければ
マイクロプロセツサ6がD1,D1′を所定の水分換
算式で演算して温度未補正信号M1,M1′を得る。
また転送スイツチ8Bを閉じて、温度検出部3か
らの電極温度信号をA/D変換部5の入力とし、
その出力をマイクロプロセツサ6で読み込んで電
極温度データT0を得る。M1とM1′の差が設定し
たある幅以内であれば試料温度と電極温度は等し
いと判断し、電極温度T0で温度未補正水分信号
M1又はM1′を補正して含水率値を計算する。M1
とM1′の差が上記設定幅より大であればt2時に温
度未補正信号M2を測定する。ここでマイクロプ
ロセツサ6は広義のもので入出力ポート、
ROM,RAM等を含む。又時刻t1は測定開始後
0.5秒程度、t1′は更に0.5秒後、t2は更に1〜2秒
後とすれば水分測定時間は数秒ですみ、試料温度
と電極温度が近い場合には1秒程度で測定ができ
ることになる。スイツチ8A,8Bはゲートを有
するアナログスイツチを使用する。マイクロプロ
セツサ6はこれらのデータM1,M2,T0と前もつ
て定められている定数Kを用いて第3式のT2=
T0+K(M1−M2)を演算する。 FIG. 6 is a block diagram of one embodiment of an electric moisture meter for realizing the temperature correction of the present invention, in which a timer in a microprocessor section 6 is started by the sample set switch means 4 which notifies that a sample has entered the electrode. After Δt time, at t 1 , the transfer switch 8A is closed, and the signal from the electrode section 1 is linearized, level adjusted, etc. in the conversion section 2, and is input to the A/D converter 5, where it is A/D converted. The converted digital signal is read by the microprocessor 6 and processed as data.
Let D be 1 . Furthermore, at time t 1 ′, a signal from the electrode is also read and set as D 1 ′. If the signal converter 2 is designed so that the data D 1 , D 1 ′ represent the temperature-uncorrected moisture signals M 1 , M 1 ′, the data D 1 , D 1 ′ are directly converted into the data D 1 , D 1 ′. 1 ' is calculated using a predetermined moisture conversion formula to obtain temperature uncorrected signals M 1 and M 1 '.
Also, close the transfer switch 8B, input the electrode temperature signal from the temperature detection section 3 to the A/D conversion section 5,
The output is read by the microprocessor 6 to obtain electrode temperature data T0 . If the difference between M 1 and M 1 ′ is within a certain width, it is determined that the sample temperature and the electrode temperature are equal, and the temperature-uncorrected moisture signal is determined at the electrode temperature T 0 .
Calculate the moisture content value by correcting M 1 or M 1 '. M1
If the difference between Here, the microprocessor 6 is broadly defined as an input/output port,
Including ROM, RAM, etc. Also, time t 1 is after the start of measurement.
If the time is about 0.5 seconds, t 1 ' is after another 0.5 seconds, and t 2 is after another 1 to 2 seconds, the moisture measurement time can be several seconds.If the sample temperature and electrode temperature are close, the measurement can be done in about 1 second. become. The switches 8A and 8B are analog switches with gates. The microprocessor 6 uses these data M 1 , M 2 , T 0 and a predetermined constant K to calculate T 2 = T 2 =
Calculate T 0 +K(M 1 −M 2 ).
この試料温度T2と温度未補正水分信号M2と予
め定められている温度補正係数(0.1%/1℃)
を用いて試料の温度補正された水分Mを
M=M2−α(T2−20) ……(4)
の演算式で計算する。αは試料の種類等によつて
決まる定数である。 This sample temperature T2 , temperature uncorrected moisture signal M2 , and predetermined temperature correction coefficient (0.1%/1℃)
Calculate the temperature-corrected moisture content M of the sample using the following formula: M=M 2 −α(T 2 −20) (4). α is a constant determined by the type of sample, etc.
ここで温度補正は20℃を基準としてあり、温度
未補正水分信号M2は、試料温度20℃の場合はそ
のまま試料の含有水分率を示すよう信号変換器2
の出力レベル又はマイクロプロセツサ6での読込
みデータD2からの水分未補正信号M2の演算式が
設計されている。この温度補正された試料の含有
水分率Mを水分表示装置7に出力する。 Here, the temperature correction is based on 20°C, and the uncorrected temperature moisture signal M2 is sent to the signal converter 2 so that it directly indicates the moisture content of the sample when the sample temperature is 20°C.
An arithmetic expression for the output level or the moisture uncorrected signal M 2 from the read data D 2 by the microprocessor 6 is designed. This temperature-corrected moisture content M of the sample is output to the moisture display device 7.
第7図は以上の動作を流れ図で例示したもので
ある。ここでtA,tB,tC秒の遅延はそれぞれ0.5秒
程度でよい。 FIG. 7 is a flowchart illustrating the above operation. Here, the delays of t A , t B , and t C seconds may each be about 0.5 seconds.
本発明の温度補正法によれば、試料温度による
真水分率の温度補正が可能であり、火力乾燥時の
高温の穀物に対して誤差が少ない水分測定をする
ことができ、穀物が過乾燥、未乾燥等のない適正
な含有水分を有するように仕上げできるという大
なる効果が得られる。 According to the temperature correction method of the present invention, it is possible to correct the true moisture content based on the sample temperature, and it is possible to measure the moisture content with less error for grains that are hot during thermal drying, and to prevent grains from being overdried or A great effect can be obtained in that it can be finished to have an appropriate moisture content without drying.
同様に試料と電極の温度が異なる場合にも、直
ちに測定が可能であり、試料と電極の温度がほぼ
等しい場合には迅速な水分測定ができ、従来の時
間感覚とも大差のない測定ができる。 Similarly, even if the temperature of the sample and the electrode are different, it can be measured immediately, and if the temperature of the sample and the electrode are almost the same, the moisture can be measured quickly, and the measurement can be made without much difference from the conventional sense of time.
第1図イ〜ハはそれぞれ、水分計の試料電極構
造の例を示す図、第2図は、時間対試料温度の特
性図、第3図と第4図は、実験データに基づく時
間対温度未補正水分計出力の特性図、第5図は、
時間対試料温度の特性図、第6図は本発明を実施
するための水分計の温度補正装置の実施例のブロ
ツク図、第7図は本発明の実施例を説明するため
の流れ図である。
E……試料電極、G……試料、1……試料電
極、3……温度検出素子、4……試料セツトスイ
ツチ、8A,8B……転送スイツチ、6……マイ
クロプロセツサ、7……水分表示装置。
Figure 1 A to C are diagrams each showing an example of the sample electrode structure of a moisture analyzer, Figure 2 is a characteristic diagram of time versus sample temperature, and Figures 3 and 4 are time versus temperature based on experimental data. The characteristic diagram of the uncorrected moisture meter output, Figure 5, is
A characteristic diagram of time versus sample temperature, FIG. 6 is a block diagram of an embodiment of a temperature correction device for a moisture meter for carrying out the present invention, and FIG. 7 is a flowchart for explaining an embodiment of the present invention. E...Sample electrode, G...Sample, 1...Sample electrode, 3...Temperature detection element, 4...Sample set switch, 8A, 8B...Transfer switch, 6...Microprocessor, 7...Moisture display Device.
Claims (1)
ていく型式の電気抵抗式水分計の温度補正方法に
おいて、被測定物を電極部に装填又は挾持した時
点t0から、それぞれ異なる一定時間後のt1,t1′,
t2(t1<t1′<t2)とに複数回被測定物の電気抵抗を
測定して温度未補正水分信号とし、t1時とt1′時の
温度未補正水分信号の差が所定値以下である場合
上記温度平衡の状態と判定してその電極部温度で
温度補正を行ない、それ以外の場合には、更にt2
時で被測定物の電気抵抗を測定し、温度未補正信
号を得、t1時とt2時との温度未補正水分信号の差
M1−M2と電極部温度T0を予め求めれた時間対温
度未補正水分信号特性データに基づく推定式T2
に与え、 T2=T0+K(M1−M2)t2時における被測定物
の温度を求め、それらの温度に基づいて、t1時又
はt2時の温度未補正水分信号の温度補正をする電
気抵抗式水分計の温度補正方法。[Claims] 1. In a temperature correction method for an electrical resistance moisture meter in which the temperature of the object to be measured is balanced with the temperature of the measurement electrode section, the time point t 0 when the object to be measured is loaded or clamped on the electrode section. t 1 , t 1 ′, after different fixed times from
The electrical resistance of the object to be measured is measured multiple times at t 2 (t 1 < t 1 ′ < t 2 ) to obtain a temperature-uncorrected moisture signal, and the difference between the temperature-uncorrected moisture signals at t 1 and t 1 ′ is calculated. is below a predetermined value, it is determined that the temperature is in the above-mentioned state of equilibrium, and the temperature is corrected using that electrode temperature; otherwise, t 2
Measure the electrical resistance of the measured object at t, obtain a temperature uncorrected signal, and calculate the difference in temperature uncorrected moisture signal between t 1 and t 2 .
Estimation formula T 2 based on time vs. temperature uncorrected moisture signal characteristic data obtained in advance for M 1 −M 2 and electrode temperature T 0
T 2 = T 0 + K (M 1 - M 2 ) Find the temperature of the measured object at t 2 , and based on those temperatures, calculate the temperature of the uncorrected moisture signal at t 1 or t 2 . Temperature correction method for electric resistance moisture meter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1626282A JPS58135444A (en) | 1982-02-05 | 1982-02-05 | Temperature compensating method of electric resistance type moisture meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1626282A JPS58135444A (en) | 1982-02-05 | 1982-02-05 | Temperature compensating method of electric resistance type moisture meter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58135444A JPS58135444A (en) | 1983-08-12 |
| JPH0216869B2 true JPH0216869B2 (en) | 1990-04-18 |
Family
ID=11911635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1626282A Granted JPS58135444A (en) | 1982-02-05 | 1982-02-05 | Temperature compensating method of electric resistance type moisture meter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58135444A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4592002A (en) * | 1983-12-13 | 1986-05-27 | Honeywell Inc. | Method of digital temperature compensation and a digital data handling system utilizing the same |
| JPS6156566U (en) * | 1984-09-18 | 1986-04-16 | ||
| JPH0454700A (en) * | 1990-06-25 | 1992-02-21 | Hitachi Ltd | Sensor input circuit |
| CN115144539B (en) * | 2022-06-29 | 2024-09-24 | 西安元智系统技术有限责任公司 | Temperature compensation method for water content measurement |
-
1982
- 1982-02-05 JP JP1626282A patent/JPS58135444A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58135444A (en) | 1983-08-12 |
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