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JPS6156599B2 - - Google Patents
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JPS6156599B2 - - Google Patents

Info

Publication number
JPS6156599B2
JPS6156599B2 JP56199475A JP19947581A JPS6156599B2 JP S6156599 B2 JPS6156599 B2 JP S6156599B2 JP 56199475 A JP56199475 A JP 56199475A JP 19947581 A JP19947581 A JP 19947581A JP S6156599 B2 JPS6156599 B2 JP S6156599B2
Authority
JP
Japan
Prior art keywords
field effect
transistor
transistors
effect transistors
junction gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56199475A
Other languages
Japanese (ja)
Other versions
JPS58102391A (en
Inventor
Masao Suzuki
Tsunetaka Sudo
Kazuo Nagafune
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP56199475A priority Critical patent/JPS58102391A/en
Publication of JPS58102391A publication Critical patent/JPS58102391A/en
Publication of JPS6156599B2 publication Critical patent/JPS6156599B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)

Description

【発明の詳細な説明】 本発明は回路構成が簡単で、低消費電力であ
り、読出し、書込み時間が短く高速なシヨツトキ
接合ゲート型電界効果トランジスタを用いた記憶
回路に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a memory circuit using a Schottky junction gate field effect transistor that has a simple circuit configuration, low power consumption, short read and write times, and high speed.

シヨツトキ接合ゲート型電界効果トランジスタ
(以下簡単の為単にトランジスタと称す)を用い
た記憶回路として従来、第1図に示す如く、4つ
のトランジスタQ1,Q2,Q3及びQ4を有し、それ
等トランジスタQ1及びQ2のドレインDがそれぞ
れ例えば抵抗R1及びR2でなる負荷M1及びM2を通
じて電源線L1に、又トランジスタQ1及びQ2のソ
ースSが互に接続されて電源線L1と対となる電
源線L2に接続され、トランジスタQ1及びQ2のゲ
ートがそれぞれQ2及びQ1のトランジスタのドレ
インに接続され、トランジスタQ3及びQ4のソー
ス(又はドレイン)がそれぞれトランジスタQ1
及びQ2ドレインに、トランジスタQ3及びQ4のゲ
ートが互いに接続されてワード線Wに、又トラン
ジスタQ3及びQ4のもう一方のドレイン(又はソ
ース)がそれぞれビツト線B1及びB2を通じてセ
ンスアンプSAの2個の入力S1及びS2並びに2個
のゲートトランジスタQ5及びQ6を通じて2本の
データ書込み線D1及びD2に接続されてなる記憶
回路セルを用いる構成のものが提案されている。
Conventionally, a memory circuit using a Schottky junction gate field effect transistor (hereinafter simply referred to as a transistor for simplicity) has four transistors Q 1 , Q 2 , Q 3 and Q 4 as shown in FIG. The drains D of the transistors Q 1 and Q 2 are connected to the power supply line L 1 through loads M 1 and M 2 , for example consisting of resistors R 1 and R 2 , respectively, and the sources S of the transistors Q 1 and Q 2 are connected to each other. The gates of transistors Q 1 and Q 2 are connected to the drains of transistors Q 2 and Q 1 , respectively, and the sources ( or drain) is each transistor Q1
and Q 2 drains, the gates of transistors Q 3 and Q 4 are connected together to word line W, and the other drains (or sources) of transistors Q 3 and Q 4 are connected through bit lines B 1 and B 2 , respectively. A configuration using a memory circuit cell connected to two data write lines D1 and D2 through two inputs S1 and S2 of a sense amplifier SA and two gate transistors Q5 and Q6 . Proposed.

ところで第1図に示すような記憶回路は、その
トランジスタQ1及びQ2、負荷M1及びM2、電源線
L1及びL2をもつてフリツプフロツプを構成し、
而して電源線L1及びL2にそれぞれ高電位及び低
電位が与えられている状態でトランジスタQ1
(又はQ2)及びQ2(又はQ1)がそれぞれオン及びオ
フしており、これに応じてトランジスタQ1(又
はQ2)及びQ2(又はQ1)にドレインがそれぞれ低
電位及び高電位になつている態様で情報を記憶し
ているものであるが、その情報の読出し、書込み
が次に述べるように構成されている。
By the way , the memory circuit shown in FIG .
Construct a flip-flop with L 1 and L 2 ,
Therefore, the transistor Q 1
(or Q 2 ) and Q 2 (or Q 1 ) are on and off, respectively, and correspondingly, the drains of transistors Q 1 (or Q 2 ) and Q 2 (or Q 1 ) are at low and high potentials, respectively. Information is stored in a state where the potential is maintained, and reading and writing of the information is configured as described below.

ワード線Wに高電位が与えられた場合トランジ
スタQ3及びQ4がオンし、電流がビツト線B1(又
はB2)側からトランジスタQ3(又はQ4)を介して
トランジスタQ1(又はQ2)のドレインD側へ流れ
込むか、又はトランジスタQ1(又はQ2)のドレイ
ンD側からトランジスタQ3(又はQ4)を介してビ
ツト線B1(又はB2)側へ流れ込んで情報の読出
し、書込みがなされるが、このときゲートトラン
ジスタQ5及びQ6がオンしており、かつデータ書
込み線D1及びD2により書込み用の信号電位が与
えられたとき情報の書込みが行われ、逆にゲート
トランジスタQ5及びQ6がオフしておりセンスア
ンプSAによりトランジスタQ3(又はQ4)を流れ
る電流を介してフリツプフロツプの状態が検出さ
れたとき情報の読出しが行われるように構成され
ている。
When a high potential is applied to the word line W, transistors Q 3 and Q 4 turn on, and current flows from the bit line B 1 (or B 2 ) side through the transistor Q 3 (or Q 4 ) to the transistor Q 1 (or Information flows into the drain D side of transistor Q 1 (or Q 2 ), or flows into the bit line B 1 (or B 2 ) side via transistor Q 3 ( or Q 4 ). Reading and writing are performed, but at this time, when gate transistors Q5 and Q6 are on and a signal potential for writing is applied by data write lines D1 and D2 , information is written. Conversely, when gate transistors Q 5 and Q 6 are off and the state of the flip-flop is detected by the sense amplifier SA through the current flowing through transistor Q 3 (or Q 4 ), information is read out. has been done.

このように回路が構成されていたので、読出し
の際フリツプフロツプがトランジスタQ3及びQ4
を介して流れる電流の影響を受け、その状態が変
つてしまうことが起こる。また読出し、書込みの
際信号電流が流れるトランジスタQ3及びQ4は上
記の影響を少なくするため、その大きさに制限が
ある。従つてそのオン抵抗が大きくそれにより信
号電流が余り流せず、読出し、書込み時間が遅く
なるといつた欠点を有していた。
Since the circuit was configured in this way, the flip-flop was connected to transistors Q 3 and Q 4 during readout.
Its state may change due to the influence of the current flowing through it. Furthermore, in order to reduce the above-mentioned influence, there is a limit to the size of the transistors Q 3 and Q 4 through which signal current flows during reading and writing. Therefore, the on-resistance is large, which makes it difficult to allow much signal current to flow, resulting in a disadvantage that reading and writing times become slow.

本発明はこれらの欠点を解決するため、読出し
の際フリツプフロツプが外部回路の影響を受け
ず、また読出し、書込みの際信号電流が流れるゲ
ートトランジスタのオン抵抗を下げるようにした
もので、以下図面について詳細に説明する。
In order to solve these drawbacks, the present invention is designed so that the flip-flop is not affected by external circuits during reading, and the on-resistance of the gate transistor through which the signal current flows during reading and writing is reduced. Explain in detail.

第2図は本発明による記憶回路の一例を示し、
第1図との対応部分には同一符号を付して説明す
る。シヨツトキ接合ゲート型電界効果トランジス
タ(以下簡単の為単にトランジスタと称す)Q1
及びQ2のドレインDがそれぞれ例えば抵抗R1
びR2でなる負荷M1及びM2を通じてワード電源線
W1に、又トランジスタQ1及びQ2のソースSが互
いに接続されてワード電源線W1と対となるワー
ド電源線W2に接続され、Q7及びQ8のゲートGが
それぞれトランジスタQ1,Q2のドレインDに、
トランジスタQ7及びQ8のソースSがそれぞれビ
ツト線B1及びB2を通じてセンスアンプSAの2つ
のの入力S1及びS2並びにゲート―ソース間電圧に
より定電流源としての電流量を制御するトランジ
スタQ9及びQ10のドレインDに、トランジスタQ7
及びQ8のドレインDが互に接続されてデータ書
込み線D3に接続され、トランジスタQ9及びQ10
ゲートGがそれぞれ電流制御用信号源に、トラン
ジスタQ9及びQ10のソースSが互に接続されて電
源線L3に接続される構成を有する。
FIG. 2 shows an example of a memory circuit according to the present invention,
Components corresponding to those in FIG. 1 will be described with the same reference numerals. Schottky junction gate field effect transistor (hereinafter simply referred to as transistor for simplicity) Q 1
The drains D of _
W 1 and the sources S of transistors Q 1 and Q 2 are connected to each other and connected to the word power line W 2 which is a pair with the word power line W 1 , and the gates G of Q 7 and Q 8 are connected to the transistor Q 1 respectively. , to the drain D of Q 2 ,
A transistor whose sources S of transistors Q7 and Q8 control the amount of current as a constant current source by the two inputs S1 and S2 of the sense amplifier SA and the gate-source voltage through the bit lines B1 and B2 , respectively. At the drain D of Q 9 and Q 10 , transistor Q 7
The drains D of transistors Q 9 and Q 8 are connected to each other and connected to the data write line D 3 , the gates G of transistors Q 9 and Q 10 are respectively connected to current control signal sources, and the sources S of transistors Q 9 and Q 10 are connected to each other. It has a configuration in which it is connected to the power supply line L3 .

この構成によれば第1図の場合と同様に、トラ
ンジスタQ1及びQ2、負荷M1及びM2、ワード電源
線W1及びW2をもつてフリツプフロツプを構成
し、ワード電源線W1及びW2の間に一定電圧が与
えられている状態で、トランジスタQ1(又は
Q2)及びQ2(又はQ1)がそれぞれオン及びオフし
ており、これに応じてトランジスタQ1(又は
Q2)及びQ2(又はQ1)のドレインがそれぞれ低電
位及び高電位になつている状態で情報を記憶して
いるものであるが、その情報の読出しが次に述べ
るようになされるべく構成されているものであ
る。
According to this configuration, as in the case of FIG. 1, a flip-flop is constructed with transistors Q 1 and Q 2 , loads M 1 and M 2 , and word power lines W 1 and W 2 , and word power lines W 1 and W 2 are connected to each other. With a constant voltage applied between W 2 and transistor Q 1 (or
Q 2 ) and Q 2 (or Q 1 ) are turned on and off, respectively, and the transistor Q 1 (or
Information is stored while the drains of Q 2 ) and Q 2 (or Q 1 ) are at a low potential and a high potential, respectively, and the information should be read out as described below. It is configured.

ワード電源線W1及びW2にその間の電圧を一定
に保つたまま高電位を与え、かつデータ書込み線
D3に高電位を与えると共にトランジスタQ9及び
Q10のゲートに高電位を与えて一定電流を流すよ
うにすれば、トランジスタQ7及びはオンし一
定電流が流れトランジスタQ9及びQ10を負荷とす
るソースフオロワ回路として動作し、フリツプフ
ロツプを構成するトランジスタQ1及びQ2のドレ
イン電圧の高低に応じて、トランジスタQ7及び
Q8のソースに高低の電圧が生じ、これをセンス
アンプSAの入力S1及びS2により検出することに
より読出しが行われる。従つて読出しの際フリツ
プフロツプの電流を外部に引き出すことなく、つ
まりフリツプフロツプに外部の影響を与えること
なく安定に読出すことができる。又読出し時間も
ビツト線B1,B2に大きな電流を流すことによ
り、ビツト線B1,B2の有する容量を速く充放電
し電圧を変化させることができるのでより高速に
フリツプフロツプの状態をセンスアンプSAで検
出し読出すことができる。
Apply a high potential to the word power supply lines W1 and W2 while keeping the voltage between them constant, and also apply a high potential to the data write line
While applying a high potential to D 3 , transistors Q 9 and
When a high potential is applied to the gate of Q 10 to cause a constant current to flow, transistors Q 7 and 8 are turned on and a constant current flows, operating as a source follower circuit with transistors Q 9 and Q 10 as loads, forming a flip-flop. Depending on the level of drain voltage of transistors Q1 and Q2 , transistors Q7 and
A high and low voltage is generated at the source of Q8 , and reading is performed by detecting this with the inputs S1 and S2 of the sense amplifier SA. Therefore, during readout, the flip-flop current can be read out stably without drawing out the current from the flip-flop, that is, without external influences on the flip-flop. In addition, the readout time is also improved by allowing a large current to flow through the bit lines B 1 and B 2 , which quickly charges and discharges the capacitance of the bit lines B 1 and B 2 and changes the voltage, allowing the state of the flip-flop to be sensed more quickly. It can be detected and read by amplifier SA.

一方書込みの場合、今フリツプフロツプのトラ
ンジスタQ1がオン、Q2がオフし、それぞれのド
レイン電圧が低電位、高電位の状態にあつたとし
て、これを逆の状態に書込む場合の動作を説明す
ると以下のようになる。ワード電源線W1及びW2
にその間の電圧を一定に保つたまま高電位を与
え、かつデータ書込み線D3に低電位を与え、フ
リツプフロツプのトランジスタでドレイン電圧が
高電位であつて書込みによつて低電位へ降ろすべ
きトランジスタQ2の側の電流制御用トランジス
タQ10のゲートに高電位を与えオンさせて一定電
流(書込み用電流)を流し、フリツプフロツプの
トランジスタでドレイン電圧が低電位であつて書
込みによつて高電位へ上げるべきトランジスタ
Q1の側の電流制御用トランジスタQ9のゲートに
低電位を与えてオフさせて電流をしや断する。す
ると、上記一定電流(書込み用電流)はビツト線
B2を介してトランジスタQ8に流れるが、そのト
ランジスタQ8のドレインと接続されたデータ書
込み線D3が低電位であるので、大部分の電流は
Q8のゲート電流となり、この電流は負荷M2を流
れる。従つてトランジスタQ1のゲート電位を下
げてフリツプフロツプを反転させ書込みが行われ
る。従つて書込みの際、必要な書込み電流を大き
く設定し、オンからオフすべきフリツプフロツプ
のトランジスタのゲート電位を高速に高電位から
低電位へと変化させることができるので、高速に
フリツプフロツプの状態を反転させ書込むことが
でき、書込み時間を短くすることができる。
On the other hand, in the case of writing, assume that transistor Q 1 of the flip-flop is on and transistor Q 2 is off, and the respective drain voltages are in a state of low potential and high potential. Explain the operation when writing to the opposite state. Then it will look like this: Word power line W 1 and W 2
A high potential is applied while keeping the voltage between them constant, and a low potential is applied to the data write line D3 . A high potential is applied to the gate of the current control transistor Q10 on the side of 2 to turn it on and a constant current (write current) flows.The drain voltage of the flip-flop transistor is at a low potential and is raised to a high potential by writing. should transistor
Apply a low potential to the gate of the current control transistor Q9 on the side of Q1 to turn it off and cut off the current. Then, the above constant current (writing current) is
The current flows through transistor Q 8 through B 2 , but since the data write line D 3 connected to the drain of transistor Q 8 is at a low potential, most of the current is
This becomes the gate current of Q 8 , and this current flows through the load M 2 . Therefore, writing is performed by lowering the gate potential of transistor Q1 and inverting the flip-flop. Therefore, during writing, the required write current can be set to a large value and the gate potential of the flip-flop transistor to be turned off can be quickly changed from high potential to low potential, so the state of the flip-flop can be quickly reversed. The writing time can be shortened.

以上説明したように、本発明の記憶回路の構成
により、読出しの際フリツプフロツプへの外部の
影響がなく安定であると共に、高速な読出しも可
能となる。又書込みも高速に行わせることがで
き、高速な記憶回路を必要とする情報処理装置へ
の応用が期待される。
As described above, the configuration of the memory circuit of the present invention provides stability without external influences on the flip-flop during readout, and also enables high-speed readout. Furthermore, writing can be performed at high speed, and application to information processing devices requiring high-speed storage circuits is expected.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の記憶回路を示す接続図、第2図
は本発明による記憶回路の一例を示す接続図であ
る。 Q1,Q2……フリツプフロツプを構成するシヨ
ツトキ接合型電界効果トランジスタ、Q3〜Q8
…シヨツトキ接合型電界効果トランジスタを用い
たゲートトランジスタ、Q9,Q10……シヨツトキ
接合型電界効果トランジスタを用いた電流制御ト
ランジスタ、M1,R1,M2,R2……負荷(抵
抗)、SA……センスアンプ、S1,S2……センスア
ンプ入力端子、L1,L2,L3……電源線、W……
ワード線、W1,W2……ワード電源線、B1,B2
…ビツト線、D1,D2,D3……データ書込み線、
S……ソース、G……ゲート、D……ドレイン。
FIG. 1 is a connection diagram showing a conventional memory circuit, and FIG. 2 is a connection diagram showing an example of a memory circuit according to the present invention. Q 1 , Q 2 ... Schottky junction field effect transistors forming a flip-flop, Q 3 to Q 8 ...
...Gate transistor using a Schottky junction field effect transistor, Q 9 , Q 10 ... Current control transistor using a Schottky junction field effect transistor, M 1 , R 1 , M 2 , R 2 ... Load (resistance) , SA...Sense amplifier, S1 , S2 ...Sense amplifier input terminal, L1 , L2 , L3 ...Power line, W...
Word line, W 1 , W 2 ... Word power line, B 1 , B 2 ...
...Bit line, D 1 , D 2 , D 3 ... Data write line,
S...source, G...gate, D...drain.

Claims (1)

【特許請求の範囲】[Claims] 1 第1、第2、第3、及び第4のシヨツトキ接
合ゲート型電界効果トランジスタQ1,Q2,Q7
Q8を有し、上記第1及び第2のシヨツトキ接合
ゲート型電界効果トランジスタQ1,Q2のドレイ
ンがそれぞれ第1及び第2の負荷M1,M2を通じ
て第1のワード電源線W1に、上記第1及び第2
のシヨツトキ接合ゲート型電界効果トランジスタ
Q1,Q2のソースが互に接合されて第2のワード
電源線W2に、上記第1及び第2のシヨツトキ接
合ゲート型電界効果トランジスタQ1,Q2のゲー
トがそれぞれ第2及び第1のシヨツトキ接合ゲー
ト型電界効果トランジスタQ2,Q1のドレインに
接続され、上記第3及び第4のシヨツトキ接合ゲ
ート型電界効果トランジスタQ7,Q8のゲートが
それぞれ上記第1及び第2のシヨツトキ接合ゲー
ト型電界効果トランジスタQ1,Q2のドレイン
に、上記第3及び第4のシヨツトキ接合ゲート型
電界効果トランジスタQ7,Q8のソースがそれぞ
れ第1及び第2のデータ入出力線B1,B2に、上
記第3及び第4のシヨツトキ接合ゲート型電界効
果トランジスタQ7,Q8のドレインが互に接続さ
れてデータ書込み線D3に接続されたことを特徴
とするシヨツトキ接合ゲート型電界効果トランジ
スタを用いた記憶回路。
1 first, second, third, and fourth shotgun junction gate field effect transistors Q 1 , Q 2 , Q 7 ,
Q 8 , and the drains of the first and second shotgun junction gate field effect transistors Q 1 and Q 2 are connected to the first word power supply line W 1 through the first and second loads M 1 and M 2 respectively. In the above first and second
Schottky junction gate field effect transistor
The sources of Q 1 and Q 2 are connected to the second word power supply line W 2 , and the gates of the first and second shotgun junction gate type field effect transistors Q 1 and Q 2 are connected to the second and second word power supply lines W 2 , respectively. The gates of the third and fourth Schottky junction gate field effect transistors Q 7 and Q 8 are connected to the drains of the first and second Schottky junction gate field effect transistors Q 2 and Q 1 , respectively. The drains of the shotgun junction gate field effect transistors Q 1 and Q 2 and the sources of the third and fourth shotgun junction gate field effect transistors Q 7 and Q 8 are connected to the first and second data input/output lines B, respectively. 1 and B 2 , the drains of the third and fourth shot junction gate field effect transistors Q 7 and Q 8 are connected to each other and connected to the data write line D 3 . A memory circuit using type field effect transistors.
JP56199475A 1981-12-12 1981-12-12 Storage circuit using schottky junction gate type field effect transistor Granted JPS58102391A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56199475A JPS58102391A (en) 1981-12-12 1981-12-12 Storage circuit using schottky junction gate type field effect transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56199475A JPS58102391A (en) 1981-12-12 1981-12-12 Storage circuit using schottky junction gate type field effect transistor

Publications (2)

Publication Number Publication Date
JPS58102391A JPS58102391A (en) 1983-06-17
JPS6156599B2 true JPS6156599B2 (en) 1986-12-03

Family

ID=16408410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56199475A Granted JPS58102391A (en) 1981-12-12 1981-12-12 Storage circuit using schottky junction gate type field effect transistor

Country Status (1)

Country Link
JP (1) JPS58102391A (en)

Also Published As

Publication number Publication date
JPS58102391A (en) 1983-06-17

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