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JPS6158766B2 - - Google Patents
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JPS6158766B2 - - Google Patents

Info

Publication number
JPS6158766B2
JPS6158766B2 JP2618181A JP2618181A JPS6158766B2 JP S6158766 B2 JPS6158766 B2 JP S6158766B2 JP 2618181 A JP2618181 A JP 2618181A JP 2618181 A JP2618181 A JP 2618181A JP S6158766 B2 JPS6158766 B2 JP S6158766B2
Authority
JP
Japan
Prior art keywords
circuit
cds
amplifier
information
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2618181A
Other languages
Japanese (ja)
Other versions
JPS57141522A (en
Inventor
Koji Matsushima
Kazuo Shiozawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Priority to JP2618181A priority Critical patent/JPS57141522A/en
Publication of JPS57141522A publication Critical patent/JPS57141522A/en
Publication of JPS6158766B2 publication Critical patent/JPS6158766B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Exposure Control For Cameras (AREA)

Description

【発明の詳細な説明】 本発明は、カメラの測光回路の改良、特に電気
信号により露出制御を行うカメラのCdS受光素子
を用いた測光回路に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in a photometric circuit for a camera, and more particularly to a photometric circuit using a CdS photodetector for a camera that controls exposure using electrical signals.

従来、カメラの測光回路には、CdS受光素子
が、シリコンダイオードなどの光起電素子よりも
測光回路を安価に構成できることから、多く用い
られている。しかし、CdS受光素子を用いた測光
回路は、CdS受光素子で得られる入射光量情報を
電圧情報として取り出してアペツクス演算に適す
るように補正抵抗で調整しても、それだけでは入
射光量の変化に対する電圧の変化率や電圧レベル
が低くて電気信号で露出制御を行うカメラには不
適当であり、しかも、CdS受光素子が抵抗比の異
なるCdSを複数個単一基板上に焼結した複合形
CdSからなつていて、複合形CdSには高抵抗と低
抵抗の比や入射光量に対する抵抗値の変化率γと
いつた特性にばらつきがあり、そのために電圧の
変化率やレベルがばらついて、光起電素子を用い
た測光回路よりも精度が悪いので、もつぱらCdS
受光素子で得られる入射光量情報を電流情報とし
て取り出してメータ針を振らせるようにし、その
針の振れ角がアペツクス情報として機械的制御に
より露出制御を行うカメラに利用されるようなも
のであつた。
Conventionally, CdS light-receiving elements have been widely used in camera photometry circuits because they can be constructed at a lower cost than photovoltaic elements such as silicon diodes. However, in a photometry circuit using a CdS photodetector, even if the information on the amount of incident light obtained from the CdS photodetector is extracted as voltage information and adjusted with a correction resistor to be suitable for apex calculation, this alone will not allow the voltage to respond to changes in the amount of incident light. The rate of change and voltage level are low, making it unsuitable for cameras that control exposure using electrical signals.Moreover, the CdS photodetector is a composite type in which multiple CdS with different resistance ratios are sintered onto a single substrate.
Composite CdS has variations in characteristics such as the ratio of high resistance to low resistance and the rate of change in resistance value with respect to the amount of incident light. Since the accuracy is lower than that of a photometric circuit using an electromotive element, CdS
Information on the amount of incident light obtained by the light receiving element was extracted as current information to cause the meter needle to swing, and the swing angle of the needle was used as apex information in a camera that controlled exposure through mechanical control. .

本発明は、CdS受光素子で得られる入射光量情
報を電圧情報として取り出してアペツクス情報と
して電気信号により露出制御を行うカメラに利用
できる測光回路を提供するものであり、本発明の
測光回路は、CdS受光素子を用いた入射光量の変
化に応じ変化する電圧を出力する検出回路に、該
検出回路の出力電圧の入射光量の変化に対する変
化率を調整可能に増幅する比例増幅回路と、前記
検出回路の出力電圧のレベルを調整可能に変化す
る実質的な加算回路とを設けたことを特徴とす
る。
The present invention provides a photometry circuit that can be used in a camera that extracts incident light amount information obtained by a CdS light receiving element as voltage information and uses it as apex information to control exposure using an electric signal. A detection circuit that outputs a voltage that changes according to a change in the amount of incident light using a light receiving element includes a proportional amplifier circuit that adjustably amplifies the rate of change in the output voltage of the detection circuit with respect to a change in the amount of incident light; The present invention is characterized in that it includes a substantial adder circuit that adjustably changes the level of the output voltage.

以下、本発明を図面に基づいて説明する。 Hereinafter, the present invention will be explained based on the drawings.

第1図および第3図は本発明の実施例を示す回
路図、第2図は第1図の回路の入射光量と出力電
圧の関係を示すグラフである。
1 and 3 are circuit diagrams showing embodiments of the present invention, and FIG. 2 is a graph showing the relationship between the amount of incident light and the output voltage of the circuit shown in FIG.

図において、定電圧電源1に接続されたCdS受
光素子2と補正抵抗3,4および5の組合せから
なる回路が一般にも広く用いられている検出回路
で、低抵抗CdS2aおよび高抵抗CdS2bからな
るCdS受光素子に光が入射すると、可変の補正抵
抗5の摺動端子にはLV値換算された入射光量に
比例する第2図にAで示したような電圧が出力さ
れる。この出力電圧Aは、先に述べたように、
CdS受光素子への入射光量変化に対する変化率と
レベルが低いし、それらがまたCdS受光素子の特
性によつてばらつくので、このまゝでは露出制御
のための電気信号としては用いられない。
In the figure, a circuit consisting of a combination of a CdS light receiving element 2 connected to a constant voltage power supply 1 and correction resistors 3, 4 and 5 is a commonly used detection circuit, and a CdS light receiving element 2 consisting of a low resistance CdS 2a and a high resistance CdS 2b is used. When light is incident on the light receiving element, a voltage as shown by A in FIG. 2 is outputted to the sliding terminal of the variable correction resistor 5, which is proportional to the amount of incident light converted into an LV value. As mentioned earlier, this output voltage A is
Since the rate and level of change with respect to changes in the amount of light incident on the CdS light-receiving element are low, and these also vary depending on the characteristics of the CdS light-receiving element, it cannot be used as an electrical signal for exposure control as it is.

そこで、上述の検出回路の出力電圧Aを増幅器
6のプラス端子に入力し、そのマイナス入力端子
に出力端子の出力電圧を可変抵抗7によつて分配
して入力するようにした増幅器6を含む比例増幅
回路を設けて、入射光量変化に対する変化率と電
圧レベルを高め、変化率のCdS受光素子によるば
らつきを補正するようにしている。すなわち、増
幅器6の出力端子には検出回路の出力電圧を(R
+r)/r倍した電圧Bが第2図に示すように出
力される。なお、Rおよびrは可変抵抗7の分配
抵抗であり、この分配抵抗は増幅器6のマイナス
入力端子にBr/(R+r)の電圧を入力する。
Therefore, the output voltage A of the above-mentioned detection circuit is inputted to the positive terminal of the amplifier 6, and the output voltage of the output terminal is distributed by the variable resistor 7 and inputted to the negative input terminal thereof. An amplifier circuit is provided to increase the rate of change and voltage level with respect to changes in the amount of incident light, and to correct variations in the rate of change due to the CdS light receiving element. That is, the output voltage of the detection circuit is connected to the output terminal of the amplifier 6 (R
A voltage B multiplied by +r)/r is output as shown in FIG. Note that R and r are distribution resistances of the variable resistor 7, and this distribution resistance inputs a voltage of Br/(R+r) to the negative input terminal of the amplifier 6.

この比例増幅回路によつて検出回路の出力電圧
は変化率とレベルを高められ、しかも可変抵抗7
によつてCdS受光素子によるばらつきを補正され
て、殆ど露出制御に利用し得るようになるが、ま
たCdS受光素子によるレベルのばらつきの影響を
受けるので普遍的対応性がない。
With this proportional amplifier circuit, the rate of change and level of the output voltage of the detection circuit can be increased, and the variable resistance 7
Although variations due to the CdS light receiving element are corrected by this method, it can be used for almost all exposure control, but it is also affected by level variations due to the CdS light receiving element, so there is no universal compatibility.

そこで、第1図の例についていえば、増幅器8
のプラス入力端子に定電圧電源1の電圧を可変抵
抗9によつて分配して入力し、マイナス入力端子
に比例増幅回路の増幅器6の出力と増幅器8の出
力とをそれぞれ抵抗10と11を介して入力する
ようにした増幅器8を含む加算回路を設けてCdS
受光素子特性のばらつきによる検出電圧レベルの
ばらつきの補正をするようにしている。すなわ
ち、可変抵抗9の分配抵抗を変えることによつて
増幅器8の出力電圧は第2図のC,C′で示すよ
うに比例増幅回路の出力電圧Bをほヾ平行に移動
した形で変化する。もつとも、抵抗10と11の
抵抗比によつては増幅器8の出力電圧Cあるいは
C′の入射光量変化に対する変化率は比例増幅回
路の出力電圧Bの変化率と異なるが、変化率は比
例増幅回路で調整し得るので、上述の加算回路は
実質的な加算回路ということができる。
Therefore, in the example of FIG. 1, the amplifier 8
The voltage of the constant voltage power supply 1 is distributed through a variable resistor 9 and inputted to the positive input terminal of the circuit, and the output of the amplifier 6 and the output of the amplifier 8 of the proportional amplifier circuit are connected to the negative input terminal through resistors 10 and 11, respectively. CdS
The variation in detection voltage level due to variation in light-receiving element characteristics is corrected. That is, by changing the distribution resistance of the variable resistor 9, the output voltage of the amplifier 8 changes in a manner that the output voltage B of the proportional amplifier circuit is shifted almost in parallel, as shown by C and C' in FIG. . However, depending on the resistance ratio of the resistors 10 and 11, the output voltage C of the amplifier 8 or
The rate of change of C' with respect to the change in the amount of incident light is different from the rate of change of the output voltage B of the proportional amplifier circuit, but since the rate of change can be adjusted by the proportional amplifier circuit, the above-mentioned adding circuit can be said to be a substantial adding circuit. .

以上述べたように、CdS受光素子を用いた検出
回路の出力電圧が、比例増幅回路によつて、入射
光量の変化に対する変化率とレベルを露出制御に
利用し得るまでに高められるとともに、変化率の
CdS受光素子によるばらつきも補正され、加算回
路によつてさらに、CdS受光素子によるレベルの
ばらつきも補正されるから、その補正された測光
回路の出力電圧は普遍的に露出制御のための電気
信号として利用できる。
As described above, the output voltage of the detection circuit using the CdS photodetector is increased by the proportional amplifier circuit to the extent that the rate of change and level in response to changes in the amount of incident light can be used for exposure control. of
Variations caused by the CdS photodetector are corrected, and the adder circuit further corrects level variations caused by the CdS photodetector, so the corrected output voltage of the photometry circuit is universally used as an electrical signal for exposure control. Available.

第3図は、比例増幅回路と加算回路の間に、比
例増幅回路の増幅器6の出力情報をASA情報、
開放F値情報、シヤツタ速度情報によつて補正す
る、補正回路を加えた、シヤツタ速度優先の露出
制御カメラのための測光回路の例を示している。
したがつて、第3図においても第1図と同じ機能
部材は同じ符号で示している。
In Figure 3, the output information of the amplifier 6 of the proportional amplifier circuit is transferred between the proportional amplifier circuit and the adder circuit by ASA information,
This figure shows an example of a photometry circuit for an exposure control camera that prioritizes shutter speed and includes a correction circuit that performs correction based on aperture f-number information and shutter speed information.
Therefore, in FIG. 3, the same functional members as in FIG. 1 are designated by the same reference numerals.

第3図において、可変抵抗12,13,14は
それぞれASA情報、開放F値情報、シヤツタ速
度情報の設定抵抗であり、可変抵抗12,13,
14によつて設定されたそれらの情報は、それぞ
れ増幅器15,16,17でインピーダンス変換
されて、抵抗18,19,20を介し、1EV変化
に対する電圧変化が同じの電圧情報として、同じ
く抵抗21を介する比例増幅回路の増幅器6の出
力と共に増幅器22に入力される。それにより増
幅器22は増幅器6の出力すなわち、測光情報を
ASA情報、開放F値情報およびシヤツタ速度情
報で補正した形の電圧情報を出力する。この増幅
器22の出力が第1図の比例増幅回路の増幅器6
の出力と同様に加算回路によつて補正され、補正
された加算回路の増幅器8の出力が絞り設定に利
用される。
In FIG. 3, variable resistors 12, 13, and 14 are resistances for setting ASA information, open F value information, and shutter speed information, respectively.
The information set by 14 is impedance-converted by amplifiers 15, 16, and 17, respectively, and is passed through resistors 18, 19, and 20 as voltage information with the same voltage change for a 1EV change, and is also transmitted to resistor 21. The signal is input to the amplifier 22 along with the output of the amplifier 6 of the proportional amplification circuit via. Thereby, the amplifier 22 receives the output of the amplifier 6, that is, the photometric information.
Outputs voltage information corrected with ASA information, open F value information, and shutter speed information. The output of this amplifier 22 is the output of the amplifier 6 of the proportional amplifier circuit shown in FIG.
The output of the amplifier 8 of the addition circuit is corrected in the same way as the output of the addition circuit, and the corrected output of the amplifier 8 of the addition circuit is used for setting the aperture.

なお、第3図において、可変抵抗14を絞り情
報の設定抵抗にして加算回路の増幅器8の出力で
シヤツタ速度を設定するようにすれば、第3図の
回路は絞り優先の露出制御カメラの測光回路にな
る。また、入力情報を測光情報、ASA情報、開
放F値情報にして、増幅器8の出力でシヤツタ速
度および絞りが一義的に定まる回路を駆動するよ
うにすれば、それはプログラム露出制御カメラへ
の応用ということになる。
In addition, in FIG. 3, if the variable resistor 14 is used as an aperture information setting resistor and the output of the amplifier 8 of the adder circuit is used to set the shutter speed, the circuit in FIG. It becomes a circuit. Also, if the input information is photometry information, ASA information, and aperture aperture information, and the output of amplifier 8 drives a circuit that uniquely determines the shutter speed and aperture, it can be applied to a program exposure control camera. It turns out.

以上述べたように、本発明のCdS受光素子を用
いた測光回路は、電気信号により露出制御を行う
カメラに幅広く適用できる。
As described above, the photometry circuit using the CdS light receiving element of the present invention can be widely applied to cameras that perform exposure control using electrical signals.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第3図は本発明の実施例を示す回
路図、第2図は第1図の回路の入射光量と出力電
圧の関係を示すグラフである。 1……定電圧電源、2……CdS受光素子、2a
……低抵抗CaS、2b……高抵抗CdS、3,4,
10,11,18〜21……抵抗、5,7,9,
12〜14……可変抵抗、6,8,15〜17,
22……増幅器。
1 and 3 are circuit diagrams showing embodiments of the present invention, and FIG. 2 is a graph showing the relationship between the amount of incident light and the output voltage of the circuit shown in FIG. 1... Constant voltage power supply, 2... CdS light receiving element, 2a
...Low resistance CaS, 2b...High resistance CdS, 3, 4,
10, 11, 18-21...Resistance, 5, 7, 9,
12-14...variable resistor, 6, 8, 15-17,
22...Amplifier.

Claims (1)

【特許請求の範囲】[Claims] 1 CdS受光素子を用いた入射光量の変化に応じ
変化する電圧を出力する検出回路に、該検出回路
の出力電圧の入射光量の変化に対する変化率を調
整可能に増幅する比例増幅回路と、前記検出回路
の出力電圧のレベルを調整可能に変化する実質的
な加算回路とを設けたことを特徴とするカメラの
測光回路。
1. A detection circuit that uses a CdS light receiving element and outputs a voltage that changes according to a change in the amount of incident light, a proportional amplifier circuit that adjustably amplifies the rate of change in the output voltage of the detection circuit with respect to a change in the amount of incident light; A photometry circuit for a camera, comprising a substantial adding circuit that adjustably changes the level of the output voltage of the circuit.
JP2618181A 1981-02-26 1981-02-26 Photometric circuit of camera Granted JPS57141522A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2618181A JPS57141522A (en) 1981-02-26 1981-02-26 Photometric circuit of camera

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2618181A JPS57141522A (en) 1981-02-26 1981-02-26 Photometric circuit of camera

Publications (2)

Publication Number Publication Date
JPS57141522A JPS57141522A (en) 1982-09-01
JPS6158766B2 true JPS6158766B2 (en) 1986-12-13

Family

ID=12186345

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2618181A Granted JPS57141522A (en) 1981-02-26 1981-02-26 Photometric circuit of camera

Country Status (1)

Country Link
JP (1) JPS57141522A (en)

Also Published As

Publication number Publication date
JPS57141522A (en) 1982-09-01

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