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JPS6158767B2 - - Google Patents
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JPS6158767B2 - - Google Patents

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Publication number
JPS6158767B2
JPS6158767B2 JP19342581A JP19342581A JPS6158767B2 JP S6158767 B2 JPS6158767 B2 JP S6158767B2 JP 19342581 A JP19342581 A JP 19342581A JP 19342581 A JP19342581 A JP 19342581A JP S6158767 B2 JPS6158767 B2 JP S6158767B2
Authority
JP
Japan
Prior art keywords
phase
signal
unbalance
rotating body
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP19342581A
Other languages
Japanese (ja)
Other versions
JPS5895238A (en
Inventor
Yoshio Kawamori
Masato Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP19342581A priority Critical patent/JPS5895238A/en
Publication of JPS5895238A publication Critical patent/JPS5895238A/en
Publication of JPS6158767B2 publication Critical patent/JPS6158767B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M1/00Testing static or dynamic balance of machines or structures
    • G01M1/14Determining imbalance
    • G01M1/16Determining imbalance by oscillating or rotating the body to be tested
    • G01M1/22Determining imbalance by oscillating or rotating the body to be tested and converting vibrations due to imbalance into electric variables
    • G01M1/225Determining imbalance by oscillating or rotating the body to be tested and converting vibrations due to imbalance into electric variables for vehicle wheels
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M1/00Testing static or dynamic balance of machines or structures
    • G01M1/14Determining imbalance
    • G01M1/16Determining imbalance by oscillating or rotating the body to be tested
    • G01M1/22Determining imbalance by oscillating or rotating the body to be tested and converting vibrations due to imbalance into electric variables

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Balance (AREA)

Description

【発明の詳細な説明】 本発明は動つりあい試験機の位相角度の零度調
整を自動的に行なう装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for automatically adjusting the zero degree of the phase angle of a dynamic balance tester.

動つりあい試験機は、一般に、振動検出器が力
検出器等による不つりあい検出器の信号S1と、試
験体の基準位置となるべく試験体に付されたマー
クや、試験体表面の凸凹、材料の変化等を、フオ
トセルや近接スイツチ等の検出器にて検出して得
られる基準位相信号S2とにより不つりあいの大き
さと、位置を求めるものであるが、上記信号S1
S2との位相差θは、上記両検出器の幾何学的配
置角Θや各検出器の位相特性α,αを含む
為、試験体上の上記基準位置と不つりあいの存在
する位置とのなす角度θとは一般に一致しない。
このためθを上述のΘおよびα,αの角度
に相当するβなる角度にて補正し、 θ=θ−β なる真の不つりあい存在角度を求める必要があ
る。
A dynamic balance tester generally uses a vibration detector that detects the signal S1 from an unbalance detector such as a force detector, a mark placed on the test piece as the reference position of the test piece, irregularities on the surface of the test piece, and material. The magnitude and position of the unbalance are determined by the reference phase signal S2 obtained by detecting changes in the signal S1 with a detector such as a photocell or proximity switch.
The phase difference θ 0 with S 2 includes the geometrical arrangement angle Θ of both detectors and the phase characteristics α 1 and α 2 of each detector, so there is an imbalance with the reference position on the test specimen. The angle θ formed with the position generally does not match.
Therefore, it is necessary to correct θ 0 by the above-mentioned Θ and an angle β corresponding to the angles α 1 and α 2 to obtain the true unbalance existence angle θ=θ 0 −β.

従来の装置においては、この補正をするため
に、CR位相回路が単安定回路等にて構成された
移相器を用いていた。従つて、例えば試験体の任
意の位置にためしおもりを取り付け、その位置か
ら基準位相信号を検出する、すなわちためしおも
りを取り付けた位置を基準位置とし、試験を行な
う場合、上記移相器を操作して、上記βをθ
一致させ、 θ=θ−β=0 なる位相角度零度調整を手動操作で行なつてい
た。しかしながら、上記移相器を構成する回路に
おいては、その目的とする移相角が入力信号周波
数に依存する、すなわち試験体回転数に依存する
という欠点をもつている。
In conventional devices, in order to perform this correction, a phase shifter in which the CR phase circuit is constituted by a monostable circuit or the like is used. Therefore, for example, when a test weight is attached to an arbitrary position on the test object and a reference phase signal is detected from that position, that is, when a test is performed using the position where the test weight is attached as the reference position, the phase shifter described above is used. The above-mentioned β was made to coincide with θ 0 by manual operation, and the phase angle was adjusted to zero so that θ=θ 0 −β=0. However, the circuit constituting the phase shifter has a disadvantage in that the intended phase shift angle depends on the input signal frequency, that is, the rotational speed of the test object.

本発明は、上記の欠点を解決するためになされ
たものであり、任意の回転数における不つりあい
信号S1と基準位相信号S2との位相差θを、自動
的に零度調整する装置の提供を目的とする。
The present invention was made in order to solve the above-mentioned drawbacks, and is a device that automatically adjusts the phase difference θ 0 between the unbalance signal S 1 and the reference phase signal S 2 at a given rotation speed to zero. For the purpose of providing.

以下、本発明実施例を図面にもとづいて説明す
る。
Embodiments of the present invention will be described below based on the drawings.

図面は本発明実施例の回路構成図を示す。 The drawings show circuit configuration diagrams of embodiments of the present invention.

回路は、図示しない動つりあい試験機本体に取
り付けられた不つりあい検出器1および基準位相
検出器2とそれらの増幅器、3,4、基準位相信
号に基づく第一基準パルス発生器5、その出力を
導入し不つりあい信号を二つの直流信号に分離・
変換する二成分分離回路6、不つりあい信号を整
流し振幅Aを求める整流回路7、その出力Aで上
記二成分分離回路6の出力の二つの直流信号を除
し位相差の正弦および余弦を算出する割算回路
8、その出力を記憶する記憶回路9、記憶回路9
の出力により上記二成分分離回路6の出力の二つ
の直流信号に座標回転演算を施す乗・加算回路1
0、試験体回転数とは無関係な周波数を発生する
第二基準パルス発生器12、その出力を導入し上
記乗・加算回路10の出力を交流信号に合成する
二成分合成回路11、その交流信号と上記第二基
準パルスの基準位相との位相差を検出する位相差
検出回路13およびその検出値を表示する角度表
示メータ14により構成されている。
The circuit includes an unbalance detector 1 and a reference phase detector 2 attached to the main body of a dynamic balance tester (not shown), their amplifiers 3, 4, a first reference pulse generator 5 based on a reference phase signal, and its output. The unbalanced signal is separated into two DC signals.
A two-component separation circuit 6 for conversion, a rectification circuit 7 for rectifying the unbalanced signal to obtain the amplitude A, and dividing the two DC signals output from the two-component separation circuit 6 by its output A to calculate the sine and cosine of the phase difference. A division circuit 8 that stores the output thereof, a storage circuit 9 that stores the output thereof, and a storage circuit 9 that stores the output thereof.
A multiplication/addition circuit 1 that performs a coordinate rotation operation on the two DC signals output from the two-component separation circuit 6 using the output of the two-component separation circuit 6.
0, a second reference pulse generator 12 that generates a frequency unrelated to the rotational speed of the test object; a two-component synthesis circuit 11 that introduces its output and synthesizes the output of the multiplication/addition circuit 10 into an alternating current signal; and the alternating current signal; and the reference phase of the second reference pulse, and an angle display meter 14 that displays the detected value.

次に、本発明実施例の回路の作用を説明する。 Next, the operation of the circuit according to the embodiment of the present invention will be explained.

不つりあい検出器1により検出された信号は増
幅器3で増幅されて、Aを振幅、ωを試験体角
速度、θを基準位相との位相差とすれば、 S1=Asin(ω1t+θ) なる不つりあい信号として二成分分離回路6に導
かれる。一方、基準位相検出器2により検出され
た信号は増幅器4を経て、第一基準パルス発生器
5に導かれ、試験体の回転数に同期し、基準位相
と同位相のパルスと、上記回転数に同期し、基準
位相と90゜の位相差を持つパルスとを発生し二成
分分離回路6に出力する。二成分分離回路6にお
いて、上記二つのパルスにより不つりあい信号 S1=Asin(ω1t+θ) は、不つりあいの90゜分力成分に相当した直流信
号 x=Acosθ および y=Asinθ に分離・変換され、演算回路8および乗・加算回
路10に導入される。演算回路8において、上記
xおよびyは、不つりあい信号S1を整流する整流
回路7により求められた振幅Aにより除算され、 x/A=cosθ および y/A=sinθ
が記憶回路9にスイツチ15を介して出力され
る。スイツチ15は、演算回路8の出力sinθ
とcosθか又は別途設定されると0と1かを記
憶回路9に導入する選択の為に設けられており、
また記憶回路9には記憶指令スイツチ16が付属
されている。乗・加算回路10において、二成分
分離回路6の出力x,yと、記憶回路9の出力と
により、直角座標変換の原理に基づき、座標回転
の計算がなされる。すなわち、記憶回路9の出力
がsinθとcosθの場合、 X=xcosθ+ysinθ Y=−xsinθ+ycosθ なる計算を実施し、座標をθだけ回転させる。
記憶回路9の出力が0と1の場合、 X=x×1+y×0=x Y=−x×0+y×1=y にて、座標変換されない。この直流信号Xおよび
Yは二成分合成回路11に出力され、二成分合成
回路11において、上記直流信号XおよびYは、
試験体回転数には無関係な周波数ω/2πを持ち、互 いに90゜の位相差を持つ二種のパルスを発生する
第二基準パルス発生器12の出力を用いて、周波
数ω/2πを持つた交流信号に合成・変換される。こ の交流信号は位相差検出回路13に導かれ、上記
第二基準パルスの基準位相との位相差が検出され
角度表示メータ14に出力される。記憶回路9の
出力が0と1の場合、すなわち直流信号が X=x=Acosθ Y=y=Asinθ で、座標回転が施されていない場合、二成分合成
回路11によりωを用いて合成・変換された交
流信号は、 Asin(ω2t+θ) となり、位相差検出回路13において、θが検
出され、角度表示メータ14にてθが表示され
る。記憶回路9の出力がsinθとcosθの場
合、すなわち、直流信号が X=xcosθ+ysinθ Y=−xsinθ+ycosθ とθだけ座標回転が施されている場合、 x=Acosθ,y=Asinθ より X=A,Y=0 となり、二成分合成回路11によりωを用いて
合成・変換された交流信号は Asinω2t となり、従つて位相差検出回路13において位相
差は検出されず、角度表示メータ14には0が表
示される。
The signal detected by the unbalance detector 1 is amplified by the amplifier 3, and if A is the amplitude, ω 1 is the angular velocity of the specimen, and θ 0 is the phase difference from the reference phase, then S 1 = Asin (ω 1 t + θ 0 ) is guided to the two-component separation circuit 6 as an unbalance signal. On the other hand, the signal detected by the reference phase detector 2 is guided to the first reference pulse generator 5 via the amplifier 4, and is synchronized with the rotational speed of the test object, and generates a pulse having the same phase as the reference phase and a pulse at the rotational speed mentioned above. , a pulse having a phase difference of 90° from the reference phase is generated and output to the two-component separation circuit 6. In the two-component separation circuit 6, the unbalance signal S 1 = Asin (ω 1 t + θ 0 ) due to the above two pulses is transformed into DC signals x = Acos θ 0 and y = Asin θ 0 corresponding to the 90° component of the unbalanced force component. It is separated and converted and introduced into the arithmetic circuit 8 and the multiplication/addition circuit 10. In the arithmetic circuit 8, the above x and y are divided by the amplitude A obtained by the rectifier circuit 7 that rectifies the unbalance signal S1 , and x/A=cosθ 0 and y/A=sinθ
0 is output to the memory circuit 9 via the switch 15. The switch 15 outputs the output sinθ0 of the arithmetic circuit 8.
and cos θ are provided to select whether to introduce 0 or 0 and 1 if separately set into the memory circuit 9,
A storage command switch 16 is also attached to the storage circuit 9. In the multiplication/addition circuit 10, coordinate rotation is calculated based on the principle of rectangular coordinate transformation using the outputs x, y of the two-component separation circuit 6 and the output of the storage circuit 9. That is, when the outputs of the memory circuit 9 are sin θ 0 and cos θ 0 , the following calculation is performed: X=xcos θ 0 +ysin θ 0 Y=−xsin θ 0 +ycos θ 0 , and the coordinates are rotated by θ 0 .
When the outputs of the memory circuit 9 are 0 and 1, coordinates are not transformed as follows: X=x×1+y×0=x Y=−x×0+y×1=y. These DC signals X and Y are output to a two-component synthesis circuit 11, and in the two-component synthesis circuit 11, the DC signals X and Y are
The frequency ω 2 /2π is determined by using the output of the second reference pulse generator 12, which generates two types of pulses with a phase difference of 90° and having a frequency ω 2 /2π that is independent of the rotational speed of the test object. It is synthesized and converted into an AC signal. This AC signal is guided to a phase difference detection circuit 13, where the phase difference with the reference phase of the second reference pulse is detected and output to the angle display meter 14. When the output of the memory circuit 9 is 0 and 1 , that is, when the DC signal is The synthesized and converted AC signal becomes Asin(ω 2 t+θ 0 ), and the phase difference detection circuit 13 detects θ 0 , and the angle display meter 14 displays θ 0 . When the output of the memory circuit 9 is sinθ 0 and cosθ 0 , that is, when the DC signal is subjected to coordinate rotation by X=xcosθ 0 +ysinθ 0 Y=−xsinθ 0 +ycosθ 0 and θ 0 , x=Acosθ 0 , Since y=Asinθ 0, X=A, Y=0, and the AC signal synthesized and converted using ω 2 by the two-component synthesis circuit 11 becomes Asinω 2 t, so the phase difference is detected by the phase difference detection circuit 13. 0 is displayed on the angle display meter 14.

以上の本発明実施例を使用するとき、実際の測
定に先立つて次のような手順で較正を行う。すな
わち、例えばマスタロータ等のつりあいのとれた
試験体の基準位置(0゜)にためしおもりを取り
付け、測定を行う。このとき、記憶指令スイツチ
16はON、すなわち記憶回路9の出力が入力信
号と等しい状態とするとともに、スイツチ15は
それぞれ0と1の信号が記憶回路9の入力信号と
なるように設定しておく。この状態では、角度表
示メータ14に前述したθが表示される。そし
て、その状態における、図示しない不つりあい量
メータ(二成分合成回路11の出力を導入して振
巾Aを表示する)の指示値を読み取つておく。
When using the above-described embodiment of the present invention, calibration is performed in the following procedure prior to actual measurement. That is, a test weight is attached to a reference position (0°) of a balanced test object such as a master rotor, and the measurement is performed. At this time, the memory command switch 16 is set to ON, that is, the output of the memory circuit 9 is equal to the input signal, and the switch 15 is set so that the signals of 0 and 1 respectively become the input signals of the memory circuit 9. . In this state, the above-mentioned θ 0 is displayed on the angle display meter 14. Then, in that state, the indicated value of an unbalance amount meter (not shown) (which displays the amplitude A by introducing the output of the two-component synthesis circuit 11) is read.

次に、スイツチ15を操作して、記憶回路9へ
の入力信号をsinθおよびcosθとする。これ
により、座標回転が行われて、角度表示メータ1
4には0が表示されることになる。このとき、同
時に不つりあい量のメータの指示値を読み取り、
その値がスイツチ15の操作前と同じ値であれ
ば、整流回路7、割算回路8等にアナログ回路部
分におけるゲイン調整が正しいということであつ
て、この確認を行つた後、記憶指令スイツチ16
を操作して記憶回路9を記憶状態として較正動作
を終了する。
Next, the switch 15 is operated to set the input signals to the memory circuit 9 to be sin θ 0 and cos θ 0 . As a result, coordinate rotation is performed and the angle display meter 1
4 will be displayed as 0. At this time, read the unbalance meter reading at the same time,
If the value is the same as the value before operating the switch 15, it means that the gain adjustment in the analog circuit portion of the rectifier circuit 7, divider circuit 8, etc. is correct, and after this confirmation, the memory command switch 16
is operated to put the memory circuit 9 into the memory state and complete the calibration operation.

その状態で、以後、実際の測定を行えば、角度
表示メータ14の指示値は位相オフセツト量θ
が減じられた真の不つりあい角度を表示すること
になる。
If actual measurements are made in this state, the indicated value of the angle display meter 14 will be the phase offset amount θ 0
The true unbalance angle will be displayed with the value reduced.

なお、スイツチ15を設けた理由は、上述した
ようにアナログ回路のゲイン調整の程度の確認
と、更に、較正動作時においてスイツチ15を操
作したとき、角度表示メータ14の指示値が正し
くθから0になることを確認することにより、
回路全体が正常であることを確かめるためであ
る。
The reason for providing the switch 15 is to confirm the degree of gain adjustment of the analog circuit as described above, and also to ensure that the indicated value of the angle display meter 14 is correct from θ 0 when the switch 15 is operated during the calibration operation. By checking that it becomes 0,
This is to confirm that the entire circuit is normal.

上述の実施例において、振幅Aを求める為に整
流回路7を用いず、二成分分離回路6の出力 x=Acosθ および y=Asinθ
から A=√22 なる計算を実施する演算手段を用いてもよいし、
また更には、sinθ,cosθを求める手段とし
て二成分分離回路6の出力 x=Acosθ および y=Asinθ
から、 θ=tan-1x/y を求め、sinθ,cosθを算出する演算手段を
用いてもよいことは勿論である。
In the above embodiment, in order to obtain the amplitude A, the rectifier circuit 7 is not used, and the output of the two-component separation circuit 6 is
You may use an arithmetic means that performs the calculation from 0 to A = √ 2 + 2 , or
Furthermore, as a means to obtain sinθ 0 and cosθ 0 , the outputs of the two-component separation circuit 6 x=Acosθ 0 and y=Asinθ
Of course, it is also possible to use an arithmetic means that obtains θ 0 =tan −1 x/y from 0 and calculates sin θ 0 and cos θ 0 .

以上説明したように、本発明によれば、座標回
転の原理に基づく演算により、試験体の任意の回
転数において不つりあい信号と基準位相信号との
位相差を直ちに零度に調整することができるの
で、較正時において、従来のように移相器等を手
動調節することなく、試験機に固有の位相オフセ
ツト量θを補償することができる。しかも、入
力周波数には全く依存しないから、例えば試験体
外周にベルトを押圧して回転を与えるタイプの動
つりあい試験機において、試験体外周寸法が異な
ればその回転数が異なつて入力周波数が変化する
ことになり、従来装置によればその都度較正を必
要としていたが、本発明では一旦較正すれば、試
験体が変わつても較正のしなおしを必要としな
い。
As explained above, according to the present invention, the phase difference between the unbalance signal and the reference phase signal can be immediately adjusted to zero at any rotation speed of the test object by calculation based on the principle of coordinate rotation. During calibration, it is possible to compensate for the phase offset amount θ 0 specific to the testing machine without manually adjusting a phase shifter or the like as in the conventional method. Moreover, since it does not depend on the input frequency at all, for example, in a dynamic balance tester that applies rotation by pressing a belt against the outer circumference of the test object, if the outer circumference of the test object differs, the rotation speed will differ and the input frequency will change. Therefore, with the conventional apparatus, calibration was required each time, but with the present invention, once the calibration is performed, there is no need to recalibrate even if the test specimen is changed.

また、座標回転された新しい座標系のX,Y
は、他に斜交座標系や分力座標系への変換にも供
することができる。
Also, the X, Y of the new coordinate system that has been rotated
can also be converted to an oblique coordinate system or a force component coordinate system.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明実施例の回路構成図を示す。 1……不つりあい検出器、2……基準位相検出
器、3,4……割幅器、5……第一基準パルス発
生器、6……二成分分離回路、7……整流回路、
8……割算回路、9……記憶回路、10……乗・
加算回路、11……二成分合成回路、12……第
二基準パルス発生器、13……位相差検出回路、
14……角度表示メータ。
The drawings show circuit configuration diagrams of embodiments of the present invention. DESCRIPTION OF SYMBOLS 1... Unbalance detector, 2... Reference phase detector, 3, 4...... Divider, 5... First reference pulse generator, 6... Two component separation circuit, 7... Rectifier circuit,
8...Division circuit, 9...Memory circuit, 10...Multiplication/
Addition circuit, 11... Two-component synthesis circuit, 12... Second reference pulse generator, 13... Phase difference detection circuit,
14...Angle display meter.

Claims (1)

【特許請求の範囲】[Claims] 1 供試回転体を回転させ、その回転体の遠心力
又は振動からその回転体の不つりあい信号を検出
する不つりあい検出器と、上記回転体の表面の状
態の変化を検出し基準位相信号を求める基準位相
検出器とを備え、供試回転体に存在する不つりあ
いの大きさと位置を求める動つりあい試験機にお
いて、上記基準位相検出器の出力を導入し、供試
回転体の回転数に同期し基準位相と同位相のパル
スと、上記回転数に同期し基準位相と90゜の位相
差を持つパルスを発生する第一基準パルス発生手
段と、その出力を入力とし、上記不つりあい信号
を上記基準位相との位相差に関連し、かつ上記不
つりあい信号の90゜分力成分に相当する二つの直
流信号に分離・変換する手段と、その直流信号か
ら上記位相差の正弦および余弦を算出する手段
と、それら算出結果を記憶する手段と、上記二つ
の直流信号を直角座標の回転の原理に基づき、上
記正弦および余弦を使用して上記位相差分だけ演
算によりそれぞれ座標回転する演算手段と、供試
回転体回転数とは無関係な、互いに90゜の位相差
をもつ二種のパルスを発生する第二基準パルス発
生手段と、その出力を導入し上記座標回転演算さ
れた二つの成分を合成する手段と、その合成され
た出力と上記第二基準パルスの基準位相の位相差
を検出する手段とを有し、動つりあい試験機の位
相角度の零度調整を自動的に行なえるよう構成さ
れた、動つりあい試験機の自動角度零調装置。
1 An unbalance detector that rotates a rotating body under test and detects an unbalance signal of the rotating body from the centrifugal force or vibration of the rotating body, and an unbalance detector that detects changes in the surface condition of the rotating body and generates a reference phase signal. In a motion balance testing machine equipped with a reference phase detector to determine the size and position of unbalance existing in the rotating body under test, the output of the reference phase detector is introduced to synchronize with the rotational speed of the rotating body under test. and a first reference pulse generating means for generating a pulse having the same phase as the reference phase and a pulse having a phase difference of 90° from the reference phase in synchronization with the rotation speed, the output of which is input, and the unbalance signal is Means for separating and converting into two DC signals related to the phase difference with the reference phase and corresponding to the 90° component of the unbalance signal, and calculating the sine and cosine of the phase difference from the DC signal. means for storing the calculation results; and calculation means for rotating the coordinates of the two DC signals by calculating the phase difference using the sine and cosine based on the principle of rotation of rectangular coordinates. A second reference pulse generation means that generates two types of pulses having a phase difference of 90 degrees from each other, which is unrelated to the rotational speed of the trial rotating body, and its output are introduced to synthesize the two components calculated by the above coordinate rotation. and means for detecting a phase difference between the combined output thereof and the reference phase of the second reference pulse, and is configured to automatically adjust the zero degree of the phase angle of the dynamic balance tester. Automatic angle zero adjustment device for dynamic balance testing machine.
JP19342581A 1981-11-30 1981-11-30 Automatic angle zero adjusting device for dynamic balancing machine Granted JPS5895238A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19342581A JPS5895238A (en) 1981-11-30 1981-11-30 Automatic angle zero adjusting device for dynamic balancing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19342581A JPS5895238A (en) 1981-11-30 1981-11-30 Automatic angle zero adjusting device for dynamic balancing machine

Publications (2)

Publication Number Publication Date
JPS5895238A JPS5895238A (en) 1983-06-06
JPS6158767B2 true JPS6158767B2 (en) 1986-12-13

Family

ID=16307751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19342581A Granted JPS5895238A (en) 1981-11-30 1981-11-30 Automatic angle zero adjusting device for dynamic balancing machine

Country Status (1)

Country Link
JP (1) JPS5895238A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02277951A (en) * 1989-04-18 1990-11-14 Matsushita Electric Ind Co Ltd Seal device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6071929A (en) * 1983-09-29 1985-04-23 Anritsu Corp Unbalance phase detector
JPS6071930A (en) * 1983-09-29 1985-04-23 Anritsu Corp Unbalance phase detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02277951A (en) * 1989-04-18 1990-11-14 Matsushita Electric Ind Co Ltd Seal device

Also Published As

Publication number Publication date
JPS5895238A (en) 1983-06-06

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