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JPS6159459B2 - - Google Patents
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JPS6159459B2 - - Google Patents

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Publication number
JPS6159459B2
JPS6159459B2 JP53008360A JP836078A JPS6159459B2 JP S6159459 B2 JPS6159459 B2 JP S6159459B2 JP 53008360 A JP53008360 A JP 53008360A JP 836078 A JP836078 A JP 836078A JP S6159459 B2 JPS6159459 B2 JP S6159459B2
Authority
JP
Japan
Prior art keywords
attenuation rate
circuit
product
detection circuit
detects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53008360A
Other languages
Japanese (ja)
Other versions
JPS54102188A (en
Inventor
Juji Sawakuri
Moryasu Harada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asahi Tec Corp
Original Assignee
Asahi Malleable Iron Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Malleable Iron Co Ltd filed Critical Asahi Malleable Iron Co Ltd
Priority to JP836078A priority Critical patent/JPS54102188A/en
Publication of JPS54102188A publication Critical patent/JPS54102188A/en
Publication of JPS6159459B2 publication Critical patent/JPS6159459B2/ja
Granted legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【発明の詳細な説明】 本発明は鋳造品の良否判別装置に関するもの
で、鋳造品の数種の欠陥の種類を判別すると共
に、欠陥検査の精度の向上を計すことを目的とす
るものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a device for determining the quality of a cast product, and its purpose is to determine the types of several defects in a cast product and to improve the accuracy of defect inspection. be.

各種鋳造品の欠陥には種々のものがある。例え
ば鋳造時における鋳物の形状による冷却速度の不
均等、収縮の妨害などのためや、熱処理時に発生
するワレがあり、また鋳型に水分が多かつたり、
冷し金が湿つていたりしたときの注湯に際して、
水蒸気またはガスが発生して気泡が生じるキライ
がある。
There are various defects in various castings. For example, during casting, there may be uneven cooling rates due to the shape of the casting, interference with shrinkage, cracks that occur during heat treatment, or excessive moisture in the mold.
When pouring hot water when the chiller is damp,
There is a problem where water vapor or gas is generated and bubbles are formed.

また、球状黒鉛鋳鉄に関しては球状化率が鋳物
の品質に影響を与える。
Furthermore, regarding spheroidal graphite cast iron, the spheroidization rate affects the quality of the casting.

そこで、このような欠陥が鋳造品を打撃したと
きの固有振動にどのような変化を与えるかを試験
検討した結果次のことがわかつた。すなわちワレ
は固有振動の基音と上音群の減衰速度を増大させ
る。キライは過渡波形にエンベロープ変化を与え
る。球状化率の低いものは上音群の減衰速度はあ
まり変化せず、基音の減衰速度が増大する。さら
に、鋳造品の種類や同種類でも形状の大小などに
より固有振動数が異なる。
As a result of testing and examining how such defects affect the natural vibration of a cast product when it is struck, the following findings were made. In other words, cracks increase the attenuation rate of the fundamental tone and upper tone group of natural vibrations. Kirai gives an envelope change to the transient waveform. When the spheroidization rate is low, the attenuation speed of the upper tone group does not change much, but the attenuation speed of the fundamental tone increases. Furthermore, the natural frequency varies depending on the type of cast product and the size of the shape even if the product is of the same type.

本発明は上述の現象を利用して発明されたもの
であり、製品を打撃して、その結果生ずる固有振
動音を検出し、その信号を増幅する増幅回路と、
その増幅回路へ付属するパルス供給回路と鋳造品
のキライを判別する過渡波形全体のエンベロープ
を検出するエンベロープ検出回路と、鋳造品の種
類や形状の大小を判別する過渡波形全体の減衰率
を検出する減衰率検出回路と、主に鋳造品のワレ
と球状化率を判別する基音よび上音の周波数を選
択し、かつ選択された周波数の減衰率を検出する
周波数選択および減衰率検出回路とを具備してな
る鋳造品の良否判別装置を特徴とするものであ
る。
The present invention was invented using the above-mentioned phenomenon, and includes an amplifier circuit that hits a product, detects the resulting natural vibration sound, and amplifies the signal.
A pulse supply circuit attached to the amplifier circuit, an envelope detection circuit that detects the envelope of the entire transient waveform that determines whether the casting is objectionable, and an attenuation rate of the entire transient waveform that determines the type and shape of the casting. Equipped with an attenuation rate detection circuit, and a frequency selection and attenuation rate detection circuit that selects the frequencies of the fundamental tone and overtone, which mainly determine the cracking and spheroidization rate of a cast product, and detects the attenuation rate of the selected frequency. The present invention is characterized by a device for determining the quality of cast products.

以下図面につき本発明の実施例を説明する。図
中1は無響箱、2は吊り具3を介して無響箱1内
に吊り下げた製品(鋳造品)、4はこの製品2を
打撃するための電磁式槌、5はマイクロホン、6
は増幅回路、7はパルス供給回路、8は過渡波形
全体のエンベロープ検出回路、9は過渡波形全体
の減衰率検出回路、10は基音Fの周波数選択お
よび減衰率検出回路、11は第1上音U1の周波
数選択および減衰率検出回路、12は第2上音
U2の周波数選択および減衰率検出回路、13は
プログラマブル出力回路である。
Embodiments of the present invention will be described below with reference to the drawings. In the figure, 1 is an anechoic box, 2 is a product (cast product) suspended in the anechoic box 1 via a hanging device 3, 4 is an electromagnetic mallet for hitting this product 2, 5 is a microphone, and 6
1 is an amplifier circuit, 7 is a pulse supply circuit, 8 is an envelope detection circuit for the entire transient waveform, 9 is an attenuation rate detection circuit for the entire transient waveform, 10 is a frequency selection and attenuation rate detection circuit for the fundamental tone F, 11 is the first upper tone U 1 frequency selection and attenuation rate detection circuit, 12 is the second upper tone
U2 frequency selection and attenuation rate detection circuit, 13 is a programmable output circuit.

以下、本発明を第1図に基いて説明する。すな
わち製品2を電磁式槌4などで打撃して、その固
有振動音をマイクロホン5で検出して、その信号
を増幅回路6で増幅し、その出力を下記に示すそ
れぞれの回路の入力とする。
The present invention will be explained below based on FIG. That is, the product 2 is struck with an electromagnetic mallet 4 or the like, the natural vibration sound is detected by the microphone 5, the signal is amplified by the amplifier circuit 6, and the output thereof is used as the input of each circuit shown below.

(1) 過渡波形全体のエンベロープ検出回路8。(1) Envelope detection circuit 8 for the entire transient waveform.

(2) 過渡波形全体の減衰率を検出する減衰率検出
回路9。
(2) Attenuation rate detection circuit 9 that detects the attenuation rate of the entire transient waveform.

(3) 基音Fおよび第1上音U1、第2上音U2……
をそれぞれ選択する周波数選択回路および選択
した周波数の減衰率を検出する選択周波数減衰
率検出回路10,11,12……。
(3) Fundamental tone F, first upper tone U 1 , second upper tone U 2 ...
a frequency selection circuit that selects each frequency, and selected frequency attenuation rate detection circuits 10, 11, 12, etc. that detect the attenuation rate of the selected frequency.

そして、キライは過渡波形全体のエンベロープ
検出回路8で検出した出力で検出される。例えば
製品2が送電線を懸架する碍子に取り付けられる
鋳物製のキヤツプのときには2〜10Hzの範囲でエ
ンベロープのゆれ変化がある。また、ワレは基音
F、第1上音U1、第2上音U2…の減衰率が良品
の減衰率よりも大きいときに検出され、球状化率
の低いものは基音Fの減衰率のみが良品の減衰率
より大きいときに検出され、その検出された信号
でプログラマブル検査出力を得る。
The dislike is detected by the output detected by the envelope detection circuit 8 of the entire transient waveform. For example, when the product 2 is a cast metal cap that is attached to an insulator that suspends a power transmission line, there is an envelope fluctuation change in the range of 2 to 10 Hz. In addition, cracks are detected when the attenuation rates of the fundamental note F, the first upper note U 1 , the second upper note U 2 . is detected when the attenuation rate is greater than the attenuation rate of a non-defective product, and the detected signal provides a programmable test output.

さらに鋳造品の種類や同種類でも大きさの違い
のあるもの〔例えば品番の違うもの〕などは周波
数のスペクトラム分布が異なるので、特定種類、
特定品番のもの以外は基音F、第1上音U1、第
2上音U2…の周波数選択回路10,11,12
…の出力が無出力となるとともに過渡波形全体の
減衰率が異なるため判別可能となる。
Furthermore, different types of castings and items of the same type but with different sizes (for example, items with different part numbers) have different frequency spectrum distributions, so
Frequency selection circuits 10, 11, 12 for fundamental tone F, first upper tone U 1 , second upper tone U 2 . . . except for those with specific product numbers
The output of ... becomes non-output, and the attenuation rate of the entire transient waveform is different, so it can be distinguished.

なお、増幅回路6に付属したパルス供給回路7
は増幅回路6で増幅された打音波形のち衝撃音波
形である初期期間(t00からt0)の衝撃パルスを消
去し、また、衝撃音波形を除く打音波形(過渡波
形)が各減衰率測定回路に至るまでの時間(t0
らt1)を見計らいタイムラグをもつて減衰率測定
が開始され、減衰率測定時間(t1からt2)を与える
回路である。つぎに本発明装置を第2図および第
3図によつて説明すると、検査する製品2を打撃
して、その結果生ずる振動音をマイクロホン5で
検出してマイクロホン出力を増幅回路6で増幅す
る。この振動波形を第3図中のcに示す。そして
その一部を微分回路14を通し、波形を整え、遅
延回路15により初期t00に対して各時間t0,t1
t2の遅延パルスbが作られる。t00からt0は打音の
衝撃パルスを消去するため信号系にゲート回路1
6を設け、衝撃パルスを消去した過渡波形Aを得
る。この過渡波形Aは過渡波形全体と基音F、第
1上音U1、第2上音U2……成分に分けて個別の
チヤンネルを構成する。
Note that the pulse supply circuit 7 attached to the amplifier circuit 6
erases the shock pulse in the initial period (t 00 to t 0 ) which is the shock waveform after the strike waveform amplified by the amplifier circuit 6, and also erases the shock pulse in the initial period (t 00 to t 0 ) which is the shock waveform after the shock waveform is amplified by the amplifier circuit 6, and also erases the shock waveform (transient waveform) excluding the shock waveform at each attenuation. The attenuation rate measurement is started with a time lag in consideration of the time (t 0 to t 1 ) until reaching the rate measurement circuit, and the circuit provides the attenuation rate measurement time (t 1 to t 2 ). Next, the apparatus of the present invention will be explained with reference to FIGS. 2 and 3. The product 2 to be inspected is struck, the resulting vibration sound is detected by the microphone 5, and the microphone output is amplified by the amplifier circuit 6. This vibration waveform is shown in c in FIG. Then, a part of it is passed through a differentiating circuit 14 to adjust the waveform, and a delay circuit 15 divides the waveform at each time t 0 , t 1 , with respect to the initial t 00 .
A delayed pulse b of t 2 is produced. From t 00 to t 0 , gate circuit 1 is installed in the signal system to eliminate the impact pulse of the hitting sound.
6 to obtain a transient waveform A with the impact pulse eliminated. This transient waveform A is divided into the entire transient waveform, the fundamental tone F, the first upper tone U 1 , the second upper tone U 2 . . . components to form individual channels.

つまり、過渡波形全体は整流回路17により整
流され200Hz程度の低域フイルタ18を通過後過
渡波形全体のエンベロープ変化を検出するための
帯域フイルタ19に至る。そして整流回路20に
より整流された出力21を検出する。
That is, the entire transient waveform is rectified by a rectifier circuit 17, passes through a low-pass filter 18 of about 200 Hz, and then passes through a band filter 19 for detecting envelope changes of the entire transient waveform. Then, the output 21 rectified by the rectifier circuit 20 is detected.

また、基音F、第1上音U1、第2上音U2…は
前もつて鋳造品が良品のときの基音F、第1上音
U1、第2上音U2…に設定された可変周波数選択
フイルタ22,23…を通過する。
In addition, the fundamental tone F, the first upper tone U 1 , the second upper tone U 2 ... are the fundamental tone F, the first upper tone when the cast product is of good quality.
It passes through variable frequency selection filters 22, 23, etc. set to U 1 , second upper tone U 2 .

また、各レベル調整器も装置の動作を考慮して
あらかじめ決定されるものである。
Further, each level adjuster is also determined in advance in consideration of the operation of the apparatus.

そして、過渡波形全体のエンベロープ変化を検
出するチヤンネル以外の各チヤンネルはそれぞれ
整流回路24,25…により整流後、各スペクト
ル成分が1KHz程度ないし、それ以上のときには
200Hz程度の低域フイルタ18,26,27…を
通してサンプルホールド28,29,30…およ
びピークホールドレベル31,32,33…に比
率をもつ基準電圧によりt1からt2間の減衰率を比
較回路34,35,36…を介して比較する。
Then, after each channel other than the channel for detecting the envelope change of the entire transient waveform is rectified by the rectifier circuits 24, 25, etc., each spectral component is about 1 KHz, and if it is higher than that, then
Comparison circuit that compares the attenuation rate between t 1 and t 2 using a reference voltage having a ratio to sample hold 28, 29, 30... and peak hold levels 31, 32, 33... through low-pass filters 18, 26, 27... of about 200 Hz. 34, 35, 36, and so on.

サンプルホールドはt1,t2において2度行なわ
れ第3図に図示したステツプを得るがピークホー
ルドはt1において得られたレベルであるため過渡
波形および各周波数成分のエンベロープの減衰程
度を過渡波形の絶対レベルに無関係にもとめるこ
とが可能である。そして、各比較回路を通過した
出力は第3図に示すような代表的プログラマブル
条件によつて良否の判定を行うことができる。す
なわち第3図中の1はt2における減衰速さが良品
設定値より大のときの動作を表わし、0は1の逆
の条件を表わすものである。
Sample and hold is performed twice at t 1 and t 2 to obtain the steps shown in Figure 3, but since the peak hold is at the level obtained at t 1 , the transient waveform and the degree of attenuation of the envelope of each frequency component are calculated as follows: can be determined regardless of the absolute level of The outputs passed through each comparison circuit can be judged to be good or bad based on typical programmable conditions as shown in FIG. That is, 1 in FIG. 3 represents the operation when the attenuation speed at t2 is greater than the good product setting value, and 0 represents the opposite condition to 1.

また、鋳造品の種類や同種類でも大きさの違う
もの〔例えば品番の違うもの〕などは周波数のス
ペクトラム分布が異なるので基音F、第1上音
U1、第2上音U2…の周波数選択回路の出力が無
出力となるとともに過渡波形全体の減衰率が異な
る。
In addition, the frequency spectrum distribution of different types of cast products and of the same type but different sizes (for example, different part numbers) is different, so the fundamental tone F and the first upper tone are different.
The outputs of the frequency selection circuits for U 1 , second upper tone U 2 . . . become non-output, and the attenuation rates of the entire transient waveforms are different.

本実施例では、鋳造品の欠陥のうち特に重大欠
陥であるワレとキライ、鋳巣や球状黒鉛鋳鉄の球
状化率の程度の判別が人手を要さずできるととも
に、鋳造品の種類や同種類でも大きさの違うもの
〔例えば品番の違うもの〕も判別でき。つまり、
本発明によれば、製品の欠陥の種類の判別や種類
の違いとか、同種類でも大きさの違うものなども
判別出来、かつその判別も人手を要さずできるな
どのすぐれた効果がある。
In this example, it is possible to distinguish cracks and dents, which are particularly serious defects among casting products, and the degree of spheroidization of cast cavities and spheroidized graphite cast iron, without requiring manual labor, as well as to determine the type of casting products and the degree of spheroidization of spheroidal graphite cast iron. However, it is also possible to distinguish between items of different sizes (for example, items with different product numbers). In other words,
According to the present invention, there are excellent effects such as being able to determine the type of product defect, the difference in type, and the same type of defect but with different sizes, and that the determination can be made without the need for manpower.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の原理図、第2図は本発明の実
施例を示すブロツク図、第3図は本発明による各
部の波形および代表的プログラマブル出力条件を
示す図表である。 1…無響箱、2…製品、3…吊り具、4…電磁
式槌、5…マイクロホン、6…増幅回路、7…パ
ルス供給回路、8…エンベロープ検出回路、9…
減衰率検出回路、10,11,12…周波数選択
および減衰率検出回路、13…プログラマブル回
路。
FIG. 1 is a diagram showing the principle of the present invention, FIG. 2 is a block diagram showing an embodiment of the invention, and FIG. 3 is a chart showing waveforms of various parts and typical programmable output conditions according to the invention. DESCRIPTION OF SYMBOLS 1... Anechoic box, 2... Product, 3... Hanging tool, 4... Electromagnetic mallet, 5... Microphone, 6... Amplification circuit, 7... Pulse supply circuit, 8... Envelope detection circuit, 9...
Attenuation rate detection circuit, 10, 11, 12... Frequency selection and attenuation rate detection circuit, 13... Programmable circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 製品を打撃して、その結果生ずる固有振動音
を検出し、その信号を増幅する増幅回路と、その
増幅回路へ付属するパルス供給回路と、鋳造品の
キライを判別する過渡波形全体のエンベロープを
検出するエンベロープ検出回路と、鋳造品の種類
や形状の大小を判別する過渡波形全体の減衰率を
検出する減衰率検出回路と、主に鋳造品のワレと
球状化率を判別する基音および上音の周波数を選
択し、かつ選択された周波数の減衰率を検出する
周波数選択および減衰率検出回路とを具備してな
る鋳造品の良否判別装置。
1. An amplifier circuit that detects the natural vibration sound generated by striking a product and amplifies the signal, a pulse supply circuit attached to the amplifier circuit, and an envelope of the entire transient waveform that determines whether the casting product is objectionable. An envelope detection circuit that detects, an attenuation rate detection circuit that detects the attenuation rate of the entire transient waveform that determines the type and shape of the casting, and a fundamental and overtone that mainly determines cracks and spheroidization of the casting. A device for determining the quality of a cast product, comprising a frequency selection and attenuation rate detection circuit that selects a frequency and detects an attenuation rate of the selected frequency.
JP836078A 1978-01-30 1978-01-30 Defective and nonndefective discriminating method of product and its device Granted JPS54102188A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP836078A JPS54102188A (en) 1978-01-30 1978-01-30 Defective and nonndefective discriminating method of product and its device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP836078A JPS54102188A (en) 1978-01-30 1978-01-30 Defective and nonndefective discriminating method of product and its device

Publications (2)

Publication Number Publication Date
JPS54102188A JPS54102188A (en) 1979-08-11
JPS6159459B2 true JPS6159459B2 (en) 1986-12-16

Family

ID=11691055

Family Applications (1)

Application Number Title Priority Date Filing Date
JP836078A Granted JPS54102188A (en) 1978-01-30 1978-01-30 Defective and nonndefective discriminating method of product and its device

Country Status (1)

Country Link
JP (1) JPS54102188A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0286292U (en) * 1988-12-23 1990-07-09

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5779764U (en) * 1980-10-31 1982-05-17
JPS60218063A (en) * 1984-04-13 1985-10-31 Nippon Telegr & Teleph Corp <Ntt> Diagnosing method of deterioration of manhole iron cover
JPS60256051A (en) * 1984-06-01 1985-12-17 Mitsubishi Heavy Ind Ltd Non-destructive inspection apparatus
JPH0658351B2 (en) * 1987-11-27 1994-08-03 鹿島建設株式会社 Cavity detection device for concrete structures
JP2535417B2 (en) * 1989-08-11 1996-09-18 日本碍子株式会社 Defective insulator detection method
JP2006250758A (en) * 2005-03-11 2006-09-21 Tdk Corp Inspection method and inspection device
JP5305023B2 (en) * 2009-06-15 2013-10-02 パルステック工業株式会社 Product inspection device and product inspection method
WO2015145914A1 (en) * 2014-03-28 2015-10-01 日本電気株式会社 Anchor-bolt evaluation system, and method and program for use therein

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0286292U (en) * 1988-12-23 1990-07-09

Also Published As

Publication number Publication date
JPS54102188A (en) 1979-08-11

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