Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6211760B2 - - Google Patents
[go: Go Back, main page]

JPS6211760B2 - - Google Patents

Info

Publication number
JPS6211760B2
JPS6211760B2 JP56159978A JP15997881A JPS6211760B2 JP S6211760 B2 JPS6211760 B2 JP S6211760B2 JP 56159978 A JP56159978 A JP 56159978A JP 15997881 A JP15997881 A JP 15997881A JP S6211760 B2 JPS6211760 B2 JP S6211760B2
Authority
JP
Japan
Prior art keywords
coin
frequency
magnetic field
generating means
field generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56159978A
Other languages
Japanese (ja)
Other versions
JPS5860389A (en
Inventor
Ko Arai
Sadao Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Denki Co Ltd
Original Assignee
Sanyo Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Denki Co Ltd filed Critical Sanyo Denki Co Ltd
Priority to JP56159978A priority Critical patent/JPS5860389A/en
Publication of JPS5860389A publication Critical patent/JPS5860389A/en
Publication of JPS6211760B2 publication Critical patent/JPS6211760B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Coins (AREA)
  • Sorting Of Articles (AREA)

Description

【発明の詳細な説明】 (イ) 産業上の利用分野 本発明は交番磁界中に硬貨を通過させ、磁界へ
の影響度に基づき硬貨の適正及び種類を判定する
硬貨判別方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a coin discrimination method for passing a coin through an alternating magnetic field and determining the appropriateness and type of the coin based on the degree of influence on the magnetic field.

(ロ) 従来の技術 かかる硬貨判別において問題となるのは発振周
波数のドリフトであり、特に比較的高い周波数の
交番磁界を形成し硬貨の通過による磁界への影響
度である周波数変化にて硬貨の板厚及び直径を測
定する場合には誤りを生じる原因となつていた。
即ち第3図は板厚或いは直径を検査する場合の信
号波形を示しており、待機状態でfiの周波数で発
振して磁界を形成しているところに硬貨が通過す
ると、その板厚或いは直径に応じてインダクタン
スが変化し発振周波数がfpまで変動するが、従来
はこのfpの値が適正硬貨を交番磁界に置いたとき
に生じるのと同じ値であるかによつて硬貨を判別
していた。しかしながら待機周波数fiが変動した
場合には、検査硬貨の通過による最大変化周波数
もfpから変動することになつて、正確な硬貨判別
は困難となる。そのため特開昭48−29499号公報
には、待機周波数の変動分を最大変化周波数から
加減算することで、変動による影響を打消すよう
にした硬貨判別方法について示されている。
(b) Prior Art A problem in such coin discrimination is the drift of the oscillation frequency, and in particular, a relatively high frequency alternating magnetic field is formed, and the change in frequency, which is the degree of influence on the magnetic field due to the passing of the coin, is This has caused errors when measuring plate thickness and diameter.
In other words, Figure 3 shows the signal waveform when inspecting the thickness or diameter of a plate.When a coin passes through a magnetic field that is oscillating at a frequency of fi in a standby state, the thickness or diameter of the plate is inspected. The inductance changes accordingly, and the oscillation frequency fluctuates up to fp. Conventionally, coins were identified by whether the value of fp was the same as that produced when a proper coin was placed in an alternating magnetic field. However, if the standby frequency fi fluctuates, the maximum frequency of change due to passage of the test coin will also fluctuate from fp, making accurate coin discrimination difficult. For this reason, Japanese Patent Laid-Open No. 48-29499 discloses a coin discrimination method in which the influence of fluctuations is canceled by adding or subtracting the fluctuation amount of the standby frequency from the maximum frequency of change.

(ハ) 発明が解決しようとする問題点 上記公報の発明は、待機周波数が変動しても、
硬貨が交番磁界を通過したときの周波数の変化分
△fは常に一定であるとの認識に基づいている。
しかしながら待機周波数を測定した後に第3図の
点線で示すように周波数が変動すると、待機周波
数fiからの変動分△f′は誤差を含んだ値となつて
誤つた判定を下すことになる。
(c) Problems to be solved by the invention The invention of the above publication does not solve the problem even if the standby frequency changes.
This is based on the recognition that the frequency change Δf when a coin passes through an alternating magnetic field is always constant.
However, if the frequency fluctuates as shown by the dotted line in FIG. 3 after measuring the standby frequency, the variation Δf' from the standby frequency fi becomes a value that includes an error, resulting in an erroneous determination.

したがつて本発明は硬貨が通過する直前の待機
周波数を検出することで、正確な測定を行なわん
とするものである。そして本発明は硬貨が接近し
ていることを確実に検出して、そのときの待機周
〓〓〓〓〓
波数を測定する方法を提供するものである。
Therefore, the present invention attempts to perform accurate measurement by detecting the standby frequency immediately before the coin passes. The present invention reliably detects the approach of coins and changes the waiting period at that time.
This provides a method for measuring wave numbers.

(ニ) 問題点を解決するための手段 板厚及び直径のセンサーの前に低周波数による
電磁界を形成する材質検査センサーを配置して、
この材質検査センサーにより硬貨の投入を検知す
ると板厚検査センサー及び直径検査センサーの待
機周波数を検出し、硬貨がこれらセンサーに達し
て最大変化周波数を検出したときにこの待機周波
数からの変動分をもとめる。そしてこの変動分に
応じて硬貨の適正を判定するとともに、材質検査
センサーによる検査結果に基づく硬貨の適正判定
の両方で適正が判定されると、この硬貨を適正と
判別する。
(d) Measures to solve the problem Placing a material inspection sensor that generates a low frequency electromagnetic field in front of the plate thickness and diameter sensor,
When this material inspection sensor detects the insertion of a coin, it detects the standby frequency of the plate thickness inspection sensor and diameter inspection sensor, and when the coin reaches these sensors and detects the maximum change frequency, the variation from this standby frequency is determined. . Then, the appropriateness of the coin is determined according to this variation, and when the appropriateness of the coin is determined based on the inspection result by the material inspection sensor, the coin is determined to be appropriate.

(ホ) 作用 材質検査は磁束が硬貨の内部にまで浸透するよ
う比較的低い周波数により交番磁界を形成するた
めに、発振周波数が安定しておりドリフトは小さ
い。したがつて硬貨の到達を確実に検出でき、し
かもこのときに板厚検査センサーや直径検査セン
サーの周波数を測定することは、まさしく硬貨が
通過する直前の待機周波数を測定していることに
なる。
(e) Effect In material inspection, an alternating magnetic field is formed at a relatively low frequency so that the magnetic flux penetrates into the inside of the coin, so the oscillation frequency is stable and drift is small. Therefore, it is possible to reliably detect the arrival of a coin, and to measure the frequency of the plate thickness inspection sensor or diameter inspection sensor at this time is to measure the standby frequency just before the coin passes.

(ヘ) 実施例 第1図は硬貨選別装置の概略的な構成を示し、
4は硬貨投入口、5は硬貨投入口4よりの導入硬
貨が転動する硬貨通路、1は材質検査センサー、
2は板厚検査センサー、3は直径検査センサー、
6は硬貨を適正或いは非適正に応じて返却通路7
或いは受入通路8に振分ける硬貨ゲート、9は受
入通路8への硬貨の導入を検知する硬貨検出器で
ある。第2図にはかかる硬貨選別装置の回路構成
を示す。同図で示すように材質検査センサー1は
励磁コイル10基準コイル11及び検出コイル1
2を具備しており、励磁コイル10は発振器13
と接続されて比較的低い3KHzの電磁界を形成し
ている。低周波数の電磁界を形成した場合は周波
数変化が小さいためにドリフトが少なく、材質検
査センサー1は硬貨の投入を検出するセンサーと
しては非常に有効である。反面、周波数変化が小
さいということは、硬貨の材質を検出する感度も
低いということである。この相反する目的を解決
するために本発明では材質検査の場合は硬貨の通
過による信号位相差または電圧変化を測定するこ
とで磁界への影響度を大きく捉えるもので、しか
も待機周波数が変動したとしてもその影響分を誤
差範囲内に吸収できる利点がある。そこで本例で
は硬貨通路5を硬貨が通過したときの基準コイル
11と検出コイル12の信号波形の位相差を検出
する場合で説明する。
(F) Embodiment Figure 1 shows a schematic configuration of a coin sorting device,
4 is a coin input port, 5 is a coin passage where coins introduced from the coin input port 4 roll, 1 is a material inspection sensor,
2 is a plate thickness inspection sensor, 3 is a diameter inspection sensor,
6 is a return path 7 depending on whether the coin is proper or not.
Alternatively, the coin gate 9 distributes coins to the receiving passage 8, and the coin detector 9 detects the introduction of coins into the receiving passage 8. FIG. 2 shows the circuit configuration of such a coin sorting device. As shown in the figure, the material inspection sensor 1 includes an excitation coil 10, a reference coil 11, and a detection coil 1.
2, the excitation coil 10 is equipped with an oscillator 13
is connected to form a relatively low 3KHz electromagnetic field. When a low-frequency electromagnetic field is formed, the frequency change is small, so there is little drift, and the material inspection sensor 1 is very effective as a sensor for detecting the insertion of coins. On the other hand, the small frequency change means that the sensitivity for detecting the material of the coin is also low. In order to solve these contradictory objectives, the present invention measures the signal phase difference or voltage change due to the passing of a coin in the case of material inspection to largely grasp the degree of influence on the magnetic field. This has the advantage that the influence can be absorbed within the error range. Therefore, in this example, a case will be explained in which the phase difference between the signal waveforms of the reference coil 11 and the detection coil 12 when a coin passes through the coin passage 5 is detected.

基準コイル11と検出コイル12の出力信号は
夫々波形整形回路14,15で波形成形されて
ANDゲート16へ導入される。一方ANDゲート
16にはクロツクパルス発生回路17よりクロツ
クパルスが導入されているためにANDゲート1
6は出力信号の位相差に相当するクロツクパルス
を出力することになる。また板厚検査センサー2
は硬貨通路5を挾み発振コイル18及び19を直
列逆相接続して成り、発振器20に接続されて比
較的高い周波数1MHzの電磁界を形成している。
そして板厚検査センサー2は硬貨通路5を硬貨が
通過したとき発振コイル18と硬貨面までの距離
及び発振コイル19と硬貨面までの距離に応じて
相互インダクタンスが変化することによる発振周
波数の変動に基づき硬貨の板厚を測定するもので
ある。一方直径検査センサー3は発振器22と接
続されて比較的高い周波数1MHzの電磁界を形成
する発振コイル21を具備しており、第1図より
明らかなごとく硬貨通路5の上方に間隔hをもつ
て配置されている。したがつて硬貨が通過すると
その直径に応じて直径検査センサー3と硬貨とが
重合する部分の面積が異ることによるインダクタ
ンス変化の違いを利用しており、発振周波数を検
出することで硬貨の径を測定するものである。ま
た23は硬貨判定装置、24は硬貨判定装置23
より制御信号aが導入されるとANDゲート16
からのクロツクパルスを出力するANDゲート、
25は硬貨判定装置23より制御信号bが導入さ
れると発振器20の発振信号を出力するANDゲ
ート、26は硬貨判定装置23より制御信号cが
導入されると発振器22の発振信号を出力する
ANDゲート、27はカウンタである。
The output signals of the reference coil 11 and the detection coil 12 are waveform-shaped by waveform shaping circuits 14 and 15, respectively.
It is introduced into the AND gate 16. On the other hand, since the clock pulse is introduced into the AND gate 16 from the clock pulse generation circuit 17, the AND gate 16
6 outputs a clock pulse corresponding to the phase difference of the output signals. Also, plate thickness inspection sensor 2
is made up of oscillating coils 18 and 19 connected in series with opposite phases across the coin passage 5, and is connected to an oscillator 20 to form an electromagnetic field with a relatively high frequency of 1 MHz.
The plate thickness inspection sensor 2 detects fluctuations in the oscillation frequency due to changes in mutual inductance depending on the distance between the oscillation coil 18 and the coin surface and the distance between the oscillation coil 19 and the coin surface when the coin passes through the coin passage 5. The thickness of the coin is measured based on this. On the other hand, the diameter inspection sensor 3 is equipped with an oscillation coil 21 that is connected to an oscillator 22 to form an electromagnetic field with a relatively high frequency of 1 MHz.As is clear from FIG. It is located. Therefore, when a coin passes, the difference in inductance due to the difference in the area of the overlap between the diameter inspection sensor 3 and the coin is used depending on the diameter of the coin, and by detecting the oscillation frequency, the diameter of the coin can be determined. It is used to measure. Further, 23 is a coin determining device, and 24 is a coin determining device 23.
When the control signal a is introduced, the AND gate 16
AND gate that outputs the clock pulse from
25 is an AND gate that outputs the oscillation signal of the oscillator 20 when the control signal b is introduced from the coin judging device 23; and 26 is an AND gate that outputs the oscillating signal of the oscillator 22 when the control signal c is introduced from the coin judging device 23.
AND gate, 27 is a counter.

上記構成で硬貨投入口4より投入された硬貨は
先ず材質検査センサー1を通過するが待機状態で
硬貨判定装置23は制御信号aを出力しており、
硬貨が材質検査センサー1に接近するにつれて第
4図Bに示すように位相差信号は増大する。そし
てカウンタ27で計数される位相差が所定のスレ
ツシヨルド値Sより大きくなると硬貨判定装置2
〓〓〓〓〓
3は制御信号bを出力して発振器20の待機周波
数を測定する。周波数は例えば1msの基準時間
内で発振出力をカウンタ27で計数することで測
定するもので、硬貨判定装置23は制御信号bを
1msの間出力し、この間のカウンタ27の計数
値を待機周波数f11として記憶する。次に硬貨判
定装置23は制御信号Cを同様1msの間出力し
カウンタ27の計数値を発振器22の待機周波数
f21として記憶する。しかして発振器20,22
における待機周波数を記憶すると硬貨判定装置2
3は再び制御信号aを出力してカウンタ27には
位相差に関するクロツクパルスを導入する。そし
て硬貨が材質検査センサー1に最も接近したとき
のカウンタ27による位相差の値ψを検出すると
硬貨判定装置23は予め設定されている硬貨種類
毎の正貨の場合の基準値と比較し、何れかの基準
値と許容誤差範囲内で一致していると、先ず材質
において一致した基準値にかかわる種類の硬貨と
判定する。こうして材質に関する判定が終了する
と硬貨判定装置23は制御信号bを1ms毎出力
してカウンタ27に発振器20の発振出力を導入
させる。そして硬貨が板厚検査センサー2に最も
接近したときの発振器20の最大周波数f1である
カウンタ27による計数値を検出すると、硬貨判
定装置23は先に記憶した待機周波数f11との差
により周波数の変動分を算出し、予め設定されて
いる硬貨種類毎の正貨の場合の基準値と比較し、
前述したのと同様一致した基準値にかかわる種類
の硬貨と判定する。板厚判定が終了すると硬貨判
定装置23は制御信号Cを1ms毎出力してカウ
ンタ27に発振器22の発振出力を導入させ、硬
貨が直径検査センサー3に最も接近したときの発
振器22の最大周波数f2がカウンタ27で計数さ
れると、待機周波数f21との差により周波数の変
動分を算出する。そしてやはり予め設定されてい
る硬貨種類毎の正貨の場合の基準値と比較して一
致した場合にその基準値に係る種類の硬貨と判定
する。
With the above configuration, a coin inserted from the coin input port 4 first passes through the material inspection sensor 1, but in a standby state, the coin determination device 23 outputs a control signal a.
As the coin approaches the material inspection sensor 1, the phase difference signal increases as shown in FIG. 4B. When the phase difference counted by the counter 27 becomes larger than a predetermined threshold value S, the coin determining device 2
〓〓〓〓〓
3 outputs a control signal b to measure the standby frequency of the oscillator 20. The frequency is measured by counting the oscillation output with a counter 27 within a reference time of 1 ms, for example, and the coin determining device 23 outputs the control signal b for 1 ms, and the count value of the counter 27 during this period is used as the standby frequency f. Remember as 11 . Next, the coin determining device 23 similarly outputs the control signal C for 1 ms and converts the count value of the counter 27 into the standby frequency of the oscillator 22.
Store as f 21 . Therefore, the oscillators 20, 22
When the standby frequency is memorized, the coin determining device 2
3 outputs the control signal a again to introduce a clock pulse related to the phase difference into the counter 27. When the counter 27 detects the phase difference value ψ when the coin approaches the material inspection sensor 1, the coin determination device 23 compares it with a preset reference value for a genuine coin for each coin type, and determines which If the coin matches the reference value within the allowable error range, it is first determined that the coin is of a type related to the matched reference value in terms of material. When the determination regarding the material is completed, the coin determining device 23 outputs the control signal b every 1 ms to cause the counter 27 to receive the oscillation output of the oscillator 20. When the counter 27 detects the maximum frequency f 1 of the oscillator 20 when the coin approaches the plate thickness inspection sensor 2, the coin determination device 23 determines the frequency based on the difference from the previously stored standby frequency f 11 . Calculate the fluctuation amount and compare it with the preset standard value for specie coins for each coin type,
As described above, it is determined that the coin is of a type related to the matching reference value. When the plate thickness determination is completed, the coin determination device 23 outputs a control signal C every 1 ms to introduce the oscillation output of the oscillator 22 to the counter 27, and calculates the maximum frequency f of the oscillator 22 when the coin approaches the diameter inspection sensor 3 most. 2 is counted by the counter 27, the frequency variation is calculated from the difference from the standby frequency f21 . Then, the coin is compared with a preset standard value for genuine coins for each type of coin, and if they match, the coin is determined to be of the type corresponding to the standard value.

このようにして投入硬貨が硬貨通路5を転動し
て材質検査センサー1・板厚検査センサー2・直
径検査センサー3を通過するにしたがい夫々でそ
の適正及び種類が判定され、全ての検査結果が一
致している場合に硬貨判定装置23はその硬貨種
を示す信号A・B・C・Dを出力する。そして信
号A・B・C・Dの何れかが出力されると硬貨ゲ
ート6がソレノイドの作用により基板28から退
出し硬貨通路5よりの硬貨は受入通路8に導入さ
れる。しかしてこの受入硬貨が硬貨検出器9で検
知されると、自動販売機の計数装置は信号A・
B・C・Dに応じて投入金額を加算計数する。し
かしながら上記の3通りの検査結果が一致しない
場合或いは何れか一つででも非適正と判定される
と硬貨判定装置23より信号A・B・C・Dは出
力されず、そのため硬貨ゲート6は基板28より
突出したままで硬貨は返却通路7へ導入される。
In this way, as the inserted coin rolls through the coin passage 5 and passes through the material inspection sensor 1, the plate thickness inspection sensor 2, and the diameter inspection sensor 3, its suitability and type are determined respectively, and all inspection results are If they match, the coin determining device 23 outputs signals A, B, C, and D indicating the coin type. When any one of the signals A, B, C, and D is output, the coin gate 6 is moved out of the base plate 28 by the action of a solenoid, and the coins from the coin passage 5 are introduced into the receiving passage 8. However, when the received coin is detected by the coin detector 9, the counting device of the vending machine receives a signal A.
Add and count the input amount according to B, C, and D. However, if the above three inspection results do not match, or if any one of them is determined to be inappropriate, the coin determination device 23 will not output the signals A, B, C, and D, and therefore the coin gate 6 will not output the signals A, B, C, and D. The coin is introduced into the return path 7 while remaining protruding from 28.

(ト) 発明の効果 本発明に依ると、発振が安定してドリフトの少
い低周波電磁界を形成する材質検査センサーを高
周波電磁界を形成する板厚センサー及び直径セン
サーの前に配置して、材質検査センサーによる硬
貨投入の検知にて板厚センサー及び直径センサー
の待機周波数を検出するものである。したがつて
硬貨の通過直前の待機周波数が検出されるため、
硬貨通過によるこれらセンサーの周波数変動分を
ドリフト分を含まずに正確に測定することができ
る。しかも硬貨の投入直後は転動が安定せず硬貨
はその前後面に振動しがちであるが、低周波電磁
界では磁束が浸透するために振動による影響を受
けることがなく、この面でも低電磁界を形成する
センサーを高電磁界を形成するセンサーの前に配
置すると有効である。
(G) Effects of the Invention According to the present invention, a material inspection sensor that forms a low-frequency electromagnetic field with stable oscillation and little drift is placed in front of a plate thickness sensor and a diameter sensor that form a high-frequency electromagnetic field. , the standby frequency of the plate thickness sensor and diameter sensor is detected by detecting coin insertion by the material inspection sensor. Therefore, since the standby frequency immediately before the coin passes is detected,
It is possible to accurately measure frequency fluctuations of these sensors due to coin passage without including drift. Moreover, immediately after coins are inserted, the rolling motion is unstable and the coins tend to vibrate back and forth, but in a low-frequency electromagnetic field, the magnetic flux penetrates, so they are not affected by vibration, and in this respect, the electromagnetic field is also low. It is effective to place a sensor that generates a high electromagnetic field in front of a sensor that generates a high electromagnetic field.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は硬貨選別装置の概略的な構成図、第2
図は回路構成図、第3図はドリフトを示す信号波
形図、第4図は本発明に依る動作波形図を示す。 1……材質検査センサー、2……板厚検査セン
サー、3……直径検査センサー、4……硬貨投入
口、5……硬貨通路、6……硬貨ゲート、7……
返却通路、8……受入通路、23……硬貨判定装
置。
Figure 1 is a schematic diagram of the coin sorting device, Figure 2 is a schematic diagram of the coin sorting device.
FIG. 3 shows a circuit configuration diagram, FIG. 3 shows a signal waveform diagram showing drift, and FIG. 4 shows an operation waveform diagram according to the present invention. 1...Material inspection sensor, 2...Plate thickness inspection sensor, 3...Diameter inspection sensor, 4...Coin slot, 5...Coin passage, 6...Coin gate, 7...
Return passageway, 8... Acceptance passageway, 23... Coin determination device.

Claims (1)

【特許請求の範囲】[Claims] 1 比較的低い周波数による電磁界を形成する低
周波磁界発生手段及び比較的高い周波数による電
磁界を形成する高周波磁界発生手段を硬貨の転動
方向に沿つて順次配置して成る硬貨判別装置にお
いて、硬貨が先ず前記低周波磁界発生手段に達し
たとき信号位相差若しくは電圧を検出してこの検
出値により硬貨の適正を判定すると共に前記高周
波磁界発生手段の待機周波数を測定し、続いて硬
貨が前記高周波磁界発生手段に達したとき該高周
波磁界発生手段の周波数の測定後前記待機周波数
からの変動分を演算してこの変動分の値により硬
貨の適正を判定し、両方の前記判定に基づき硬貨
の適正を判定することを特徴とした硬貨判別方
法。
1. A coin discriminating device in which a low frequency magnetic field generating means for generating an electromagnetic field at a relatively low frequency and a high frequency magnetic field generating means for generating an electromagnetic field at a relatively high frequency are sequentially arranged along the rolling direction of the coin, When the coin first reaches the low frequency magnetic field generating means, the signal phase difference or voltage is detected, and based on this detected value, the suitability of the coin is determined, and the standby frequency of the high frequency magnetic field generating means is measured, and then the coin reaches the high frequency magnetic field generating means. When reaching the high frequency magnetic field generating means, after measuring the frequency of the high frequency magnetic field generating means, the variation from the standby frequency is calculated and the suitability of the coin is determined based on the value of this variation, and the coin is determined based on both of the above determinations. A coin discrimination method characterized by determining suitability.
JP56159978A 1981-10-06 1981-10-06 Discrimination of coin Granted JPS5860389A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56159978A JPS5860389A (en) 1981-10-06 1981-10-06 Discrimination of coin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56159978A JPS5860389A (en) 1981-10-06 1981-10-06 Discrimination of coin

Publications (2)

Publication Number Publication Date
JPS5860389A JPS5860389A (en) 1983-04-09
JPS6211760B2 true JPS6211760B2 (en) 1987-03-14

Family

ID=15705323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56159978A Granted JPS5860389A (en) 1981-10-06 1981-10-06 Discrimination of coin

Country Status (1)

Country Link
JP (1) JPS5860389A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60118988A (en) * 1983-11-30 1985-06-26 アンリツ株式会社 Coin processor
JPS63164883U (en) * 1987-04-15 1988-10-27

Also Published As

Publication number Publication date
JPS5860389A (en) 1983-04-09

Similar Documents

Publication Publication Date Title
US5351798A (en) Coin discrimination apparatus and method
US5213190A (en) Method and apparatus for testing coins
US5568854A (en) Coin discrimination method
US6173826B1 (en) Method and apparatus for validating coins
US5337877A (en) Coin validators
EP0527874B1 (en) Method and apparatus for testing coins
JPS6211760B2 (en)
JPH0797424B2 (en) Coin sorter
GB2174227A (en) Apparatus for discriminating between different metallic articles
JPH0117195B2 (en)
JPS623396A (en) Coin discrimination/processing system
WO1993021608A1 (en) Method and apparatus for testing coins
JPS6013517B2 (en) coin inspection device
JP2538288B2 (en) Coin sorter
JPH07118031B2 (en) Coin discriminator
JPH081669B2 (en) Coin discriminator
KR920005340B1 (en) Coin sorter for vending machine
JPH05242332A (en) Coin selecting device
JPH0654510B2 (en) Coin discriminator
JPS6058514B2 (en) coin sorting device
JPH11175795A (en) Coin discriminating device
JPS6013516B2 (en) coin inspection device
JPH0797423B2 (en) Coin sorting method
JPH1131249A (en) Method and device for inspecting authenticity of coin
JPS5931753B2 (en) coin sorting device