Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6243488B2 - - Google Patents
[go: Go Back, main page]

JPS6243488B2 - - Google Patents

Info

Publication number
JPS6243488B2
JPS6243488B2 JP55072482A JP7248280A JPS6243488B2 JP S6243488 B2 JPS6243488 B2 JP S6243488B2 JP 55072482 A JP55072482 A JP 55072482A JP 7248280 A JP7248280 A JP 7248280A JP S6243488 B2 JPS6243488 B2 JP S6243488B2
Authority
JP
Japan
Prior art keywords
output
photoelectric converter
shutter
light scattering
meter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55072482A
Other languages
Japanese (ja)
Other versions
JPS56168532A (en
Inventor
Masanori Matsuoka
Toshuki Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rion Co Ltd
Original Assignee
Rion Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rion Co Ltd filed Critical Rion Co Ltd
Priority to JP7248280A priority Critical patent/JPS56168532A/en
Publication of JPS56168532A publication Critical patent/JPS56168532A/en
Publication of JPS6243488B2 publication Critical patent/JPS6243488B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Description

【発明の詳細な説明】 この発明は、光散乱微粒子計の改良された自動
校正装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improved automatic calibration device for a light scattering particulate meter.

光散乱微粒子計の感度(微粒子の大きさと検出
されたパルス信号の波高値との比)を決める要因
として、微粒子自体のもつている被屈折率、セン
サの光学系条件(測定に使う光の波長、微粒子に
よる散乱光を捕捉する機構等)によるもの、すな
わち、センサを設計する段階で決定されてその後
は変化しない要因の他に、光源の明るさ、光学系
の損失(たとえば、レンズやミラーのくもり)の
度合、光電変換器の感度や電子回路の増幅率のよ
うに、微粒子計を使用している間に変化を生ずる
ものがあり、そのため測定を始める前に微粒子計
の感度を調べる必要がある。
The factors that determine the sensitivity of a light scattering particle meter (the ratio between the particle size and the peak value of the detected pulse signal) are the refractive index of the particles themselves, the sensor optical system conditions (the wavelength of the light used for measurement), and the refractive index of the particles themselves. In addition to factors that are determined at the sensor design stage and do not change afterward (e.g., mechanisms that capture light scattered by particles, etc.), brightness of the light source, optical system losses (e.g., There are some things that change while using a particle meter, such as the degree of cloudiness (cloudiness), the sensitivity of the photoelectric converter, and the amplification factor of the electronic circuit, so it is necessary to check the sensitivity of the particle meter before starting measurements. be.

通常、光散乱微粒子計を製造して出荷する前
に、あらかじめ粒径と屈折率が既知の標準粒子
を、1個1個分離してカウンタに加えて感度を校
正しているが、この校正には特殊な装置と技術が
必要であり、ユーザーが手軽に校正する手段とし
ては適切でない。
Normally, before a light scattering particle meter is manufactured and shipped, standard particles whose particle size and refractive index are known are separated one by one and added to the counter to calibrate the sensitivity. requires special equipment and techniques, and is not suitable as a means for users to easily calibrate.

そのため、従来の光散乱微粒子計には、照射光
を光学フアイバに導き、孔をあけた回転円板でこ
の光をパルス状に変えた(光チヨツピング)あ
と、集光系を通じて光電変換器に加えるようにし
た自己診断装置が内蔵されている。この方法によ
れば、光電変換器に接続されたプリアンプからと
り出された校正パルスの波高値をメータで測り、
製造出荷時と同一指示になるように調節すれば、
わざわざ標準粒子を用いて校正することなく、測
定現場で手軽に感度校正ができる。このように光
チヨツピングによる内部基準光方式を、前記の標
準粒子による一次校正に対して二次校正と呼んで
いる。
For this reason, conventional light scattering particle counters introduce irradiated light into an optical fiber, convert the light into pulses using a rotating disk with holes (optical chopping), and then apply the light to a photoelectric converter through a condensing system. It has a built-in self-diagnosis device. According to this method, the peak value of the calibration pulse taken out from the preamplifier connected to the photoelectric converter is measured with a meter,
If you adjust it so that the instructions are the same as those at the time of manufacturing shipment,
Sensitivity calibration can be easily performed at the measurement site without having to go through the trouble of calibrating using standard particles. The internal reference light method using optical chopping is called a secondary calibration in contrast to the primary calibration using the standard particle described above.

上記従来の二次校生は便利である反面、校正を
手動で行うことから、メータの読みとり誤差、操
作ミスまたは校正を忘れてしまうなどの問題があ
る。
Although the conventional secondary proofreader described above is convenient, since the proofreading is performed manually, there are problems such as meter reading errors, operational errors, or forgetting the proofreading.

この発明は、上記の問題を解消するものであ
り、測定開始の直前、自動的に自己診断と感度の
調節とを毎回行うことができ、高い信頼度の測定
値を求め得る効果を有するものである。
This invention solves the above problem, and has the effect of automatically performing self-diagnosis and adjusting sensitivity every time immediately before starting measurement, and obtaining highly reliable measured values. be.

以下、図面の実施例についてこの発明を詳述す
ると、第1図において、ハロゲンランプのごとき
光源1の光を照射レンズ系2で照射領域Pに集光
して照射する。この照射領域Pにはノズル3から
噴出される試料空気流4が通過する。5は吸入管
である。試料空気流中の微粒子によつて生ずる散
乱光は集光レンズ系6で光電子増倍管7の如き光
電変換器に集光される。ここまでは従来のセンサ
の測定光学系である。
Hereinafter, the present invention will be described in detail with reference to the embodiments shown in the drawings. In FIG. 1, light from a light source 1 such as a halogen lamp is focused and irradiated onto an irradiation area P by an irradiation lens system 2. A sample air flow 4 ejected from the nozzle 3 passes through this irradiation area P. 5 is an inhalation pipe. Scattered light caused by particulates in the sample air stream is focused by a focusing lens system 6 onto a photoelectric converter such as a photomultiplier tube 7. The measurement optical system of the conventional sensor has been described so far.

この発明は、校正光学系として、ソレノイド8
で駆動されるシヤツタ9を照射レンズ系2の光軸
2Aの延長上に配置し、光学フアイバ10の入力
端10Aをシヤツタ9に近接せしめ、出力端10
Bを集光レンズ系6の光軸6Aと一致せしめ、光
電子増倍管7に指向せしめる。照射光軸2Aと集
光光軸6Aとは適宜の角度θ(たとえば70゜)を
なしているので、光学フアイバ10の入力端10
Aと出力端10Bとのなす角度もこのθに合致せ
しめることになる。
This invention uses a solenoid 8 as a calibration optical system.
A shutter 9 driven by the shutter 9 is arranged on an extension of the optical axis 2A of the irradiation lens system 2, the input end 10A of the optical fiber 10 is brought close to the shutter 9, and the output end 10
B is made to coincide with the optical axis 6A of the condensing lens system 6 and directed to the photomultiplier tube 7. Since the irradiation optical axis 2A and the condensing optical axis 6A form an appropriate angle θ (for example, 70°), the input end 10 of the optical fiber 10
The angle formed between A and the output end 10B is also made to match this θ.

上記の校正光学系の動作は、校正のときのみソ
レノイド8によつてシヤツタ9が開かれ、測定に
用いられる照射光が光学フアイバ10を通つて光
電子増倍管7に加えられる。測定に入る前に必ず
ソレノイド8が動作してシヤツタ9を開くように
構成することは容易にできる。
In the operation of the above calibration optical system, the shutter 9 is opened by the solenoid 8 only during calibration, and the irradiation light used for measurement is applied to the photomultiplier tube 7 through the optical fiber 10. It is easy to configure so that the solenoid 8 always operates to open the shutter 9 before starting measurement.

次に、第2図は自動校正に関する電子的処理部
で、プリアンプ11を介して光電子増倍管7に接
続された波高弁別回路12に基準電源13が接続
されている。波高弁別回路12の出力側は、発振
器14が接続されたアツプダウンカウンタ15の
制御端子に接続されている。アツプダウンカウン
タ15のデジタル出力は、D―Aコンバータ16
で電圧変換され、光電子増倍管7に加えられる高
圧電源17に備えられた電圧制御部に加えられ高
圧電源17の出力電圧を変化させるように構成さ
れている。
Next, FIG. 2 shows an electronic processing section for automatic calibration, in which a reference power source 13 is connected to a pulse height discrimination circuit 12 connected to a photomultiplier tube 7 via a preamplifier 11. The output side of the pulse height discrimination circuit 12 is connected to a control terminal of an up-down counter 15 to which an oscillator 14 is connected. The digital output of the up-down counter 15 is output from the D-A converter 16.
The voltage is converted into a voltage and applied to the photomultiplier tube 7 .The voltage is applied to a voltage control section provided in the high voltage power source 17 to change the output voltage of the high voltage power source 17 .

上記の構成による動作について述べると、シヤ
ツタ9が開くと光学フアイバ10を通つた光によ
つて光電子増倍管7に電流が流れる。この電流を
プリアンプ11で電圧に変え、波高弁別回路12
で基準電源13の電圧と比較する。そして、基準
電圧値より例えば1%以上高ければアツプダウン
カウンタ15にカウントダウンの指令信号を発
し、逆に1%以上低いときはカウントアツプの指
令信号を発する。アツプダウンカウンタ15は、
発振器14からの出力を用いて波高弁別回路12
からの加算、減算の指令に従つて、その時点での
カウント数(たとえば10000)を、加算指令なら
ば10001,10002,……,減算指令のときは9999,
9998,……というように変えてゆく機能を備えて
いる。D―Aコンバータ16は、例えば10000カ
ウントのデジタル信号をアナログ量1ボルトに変
換する機能を有しているので、波高弁別回路12
からアツプダウンカウンタ15へ減算指令が出さ
れると、カウント数が9999,9998……と減つてゆ
くのでD―Aコンバータ16の出力も0.9999V,
0.9998V……と順次低下する。次に、このアナロ
グ信号は、光電子増倍管7の感度を決める高圧電
源17の電圧制御部に伝えられて電圧が除々に下
り、光電子増倍管7の出力電流も減少(感度が下
つたので)し、波高弁別回路12に加えられてい
た電圧が低下する。そして、この電圧が基準電圧
値に対して±1%以内の範囲に入つたとき、波高
弁別回路12からアツプダウンカウンタ15への
指令信号は停止し、アツプダウンカウンタ15
は、その時点における数値をもち続ける。
Regarding the operation of the above configuration, when the shutter 9 is opened, a current flows through the photomultiplier tube 7 due to light passing through the optical fiber 10. This current is converted into voltage by the preamplifier 11, and the pulse height discrimination circuit 12
The voltage is compared with the voltage of the reference power supply 13. If the voltage is higher than the reference voltage value by, for example, 1% or more, a countdown command signal is issued to the up-down counter 15, and conversely, if it is lower than the reference voltage value by 1% or more, a count-up command signal is issued. The up-down counter 15 is
The pulse height discrimination circuit 12 uses the output from the oscillator 14.
According to addition and subtraction commands from
9998, etc. It has the function to change. Since the D-A converter 16 has the function of converting, for example, a digital signal of 10,000 counts into an analog quantity of 1 volt, the wave height discrimination circuit 12
When a subtraction command is issued to the up-down counter 15 from
It gradually decreases to 0.9998V... Next, this analog signal is transmitted to the voltage control section of the high-voltage power supply 17 that determines the sensitivity of the photomultiplier tube 7, and the voltage gradually decreases, and the output current of the photomultiplier tube 7 also decreases (because the sensitivity has decreased). ), and the voltage applied to the pulse height discrimination circuit 12 decreases. When this voltage falls within ±1% of the reference voltage value, the command signal from the wave height discrimination circuit 12 to the up-down counter 15 is stopped, and the up-down counter 15
continues to have the value at that point.

こうして校正は終了するのであるが、すべての
動作は、シヤツタ9が開いてからおおよそ1/100
秒程度の間に終了する。校正が終るとシヤツタ9
は自動的に閉じ、微粒子の測定に入る。
In this way, the calibration is completed, but all operations are performed approximately 1/100 times after the shutter 9 opens.
It finishes in about seconds. When the calibration is finished, the shutter 9
automatically closes and begins particle measurement.

上記の自動校正装置を備えた微粒子計は、手動
で感度調節する要がないので、校正用のメータや
ツマミをパネル面に設ける必要がない。たとえば
“CAL”と表示した青い表示灯を設けて、この表
示灯が点灯していれば微粒子計が正常に動作して
いることを確認できるようにする程度で足りるの
である。
The particle meter equipped with the automatic calibration device described above does not require manual sensitivity adjustment, so there is no need to provide a meter or knob for calibration on the panel surface. For example, it is sufficient to install a blue indicator light that displays "CAL" and, if this indicator light is lit, confirm that the particle meter is operating normally.

上述したようにこの発明は、光散乱微粒子計の
感度校正を迅速、適確になしうる格段の効果を有
し、工業上多大の利益をもたらす。
As described above, the present invention has the remarkable effect of quickly and accurately calibrating the sensitivity of a light scattering particle meter, and brings about great industrial benefits.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例光学系要部の概略
斜視図、第2図は同じく電子的処理部のブロツク
図である。 1……光源、2……照射レンズ系、3……ノズ
ル、4……試料空気流、5……吸入管、6……集
光レンズ系、7……光電子増倍管、8……ソレノ
イド、9……シヤツタ、10……光学フアイバ、
P……照射領域。
FIG. 1 is a schematic perspective view of the main parts of an optical system according to an embodiment of the present invention, and FIG. 2 is a block diagram of the electronic processing section. DESCRIPTION OF SYMBOLS 1...Light source, 2...Irradiation lens system, 3...Nozzle, 4...Sample air flow, 5...Suction tube, 6...Condensing lens system, 7...Photomultiplier tube, 8...Solenoid , 9...Shutter, 10...Optical fiber,
P...irradiation area.

Claims (1)

【特許請求の範囲】 1 試料空気流4の照射領域Pを照射することに
よつて生じる散乱光を光電変換器7に集光せしめ
前記光電変換器7からのパルス出力を計数する光
散乱微粒子計において、 照射光軸2A延長上に配置したシヤツタ9に、
入力端10Aを近接せしめ出力端10Bを前記光
電変換器7に指向せしめた光学フアイバ10と、 基準電源13が接続されており前記光電変換器
7の出力が加わる波高弁別回路12、前記波高弁
別回路12の出力で制御され発振器14で駆動さ
れるアツプダウンカウンタ15の出力が、D―A
変換器16を介して加えられる電圧制御部で制御
される前記光電変換器7用の高圧電源17でなる
ことを特徴とする光散乱微粒子計の自動校正装
置。 2 シヤツタ9がソレノイド8により駆動される
特許請求の範囲第1項記載の光散乱微粒子計の自
動校正装置。
[Scope of Claims] 1. A light scattering particle meter that focuses scattered light generated by irradiating an irradiation area P of a sample air flow 4 onto a photoelectric converter 7 and counts the pulse output from the photoelectric converter 7. In the shutter 9 placed on the extension of the irradiation optical axis 2A,
an optical fiber 10 with its input end 10A brought close to it and its output end 10B directed toward the photoelectric converter 7; a pulse height discrimination circuit 12 to which a reference power source 13 is connected and to which the output of the photoelectric converter 7 is applied; and the wave height discrimination circuit. The output of the up-down counter 15 controlled by the output of 12 and driven by the oscillator 14 is
An automatic calibration device for a light scattering particulate meter, comprising a high voltage power source 17 for the photoelectric converter 7, which is controlled by a voltage control unit applied via a converter 16. 2. An automatic calibration device for a light scattering particle meter according to claim 1, wherein the shutter 9 is driven by the solenoid 8.
JP7248280A 1980-05-30 1980-05-30 Automatic calibration device for light scattering fine grain meter Granted JPS56168532A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7248280A JPS56168532A (en) 1980-05-30 1980-05-30 Automatic calibration device for light scattering fine grain meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7248280A JPS56168532A (en) 1980-05-30 1980-05-30 Automatic calibration device for light scattering fine grain meter

Publications (2)

Publication Number Publication Date
JPS56168532A JPS56168532A (en) 1981-12-24
JPS6243488B2 true JPS6243488B2 (en) 1987-09-14

Family

ID=13490579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7248280A Granted JPS56168532A (en) 1980-05-30 1980-05-30 Automatic calibration device for light scattering fine grain meter

Country Status (1)

Country Link
JP (1) JPS56168532A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6244648A (en) * 1985-08-22 1987-02-26 Canon Inc Particle analyzing device
JPS639838A (en) * 1986-06-30 1988-01-16 Shimizu Constr Co Ltd Particulate detection device
KR100962541B1 (en) 2010-02-11 2010-06-14 한은정 Method of calibration of particle counter
CN115629021A (en) * 2022-12-20 2023-01-20 合肥金星智控科技股份有限公司 Laser particle analyzer system, method of calibrating the same, medium, and computer apparatus

Also Published As

Publication number Publication date
JPS56168532A (en) 1981-12-24

Similar Documents

Publication Publication Date Title
CN104483104A (en) Spectral response analysis system for photoelectric detector
Clarke High accuracy spectrophotometry at the National Physical Laboratory
US3857641A (en) Optical measuring apparatus
JPS6243488B2 (en)
JPS6037418B2 (en) Lens performance inspection device
JP2886031B2 (en) Apparatus for detecting backscattering of light in living tissue
CN100501374C (en) Quantitative moisture measurement method for near-infrared paper
CN106501184B (en) Optical glass measuring device and measuring method thereof
CN112629654A (en) Detection device, laser plasma light source and adjusting method thereof
JPS614945A (en) Infrared absorption moisture meter with calibrating device
JP2636051B2 (en) Particle measurement method and device
CN214121411U (en) Detection device and laser plasma light source
JPH07508590A (en) Configuration for point-like measurement of diffuse reflection on surfaces
JPH0718788B2 (en) Optical particle measuring device
WO1991014935A1 (en) A method and an apparatus for cleaning control
EP0067292A2 (en) Apparatus useful for positioning a light filter
CN121231316B (en) Method for detecting concentration of particles with wide particle size
JPS6019452B2 (en) Nitrate/nitrite ion concentration measurement method and device
CN121595025A (en) A laser wavelength calibration device and a fluorescence spectral detector for laser wavelength calibration.
JPH0230659B2 (en)
RU2082960C1 (en) Laser gas analyzer
JP3002936B2 (en) Inspection method and inspection device for filter element
JPH065613Y2 (en) Moisture meter detection circuit
JPS6010255B2 (en) Method for detecting agglutination reactions in blood, etc.
JPH06273330A (en) Turbidity measuring device