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JPS6248194B2 - - Google Patents
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JPS6248194B2 - - Google Patents

Info

Publication number
JPS6248194B2
JPS6248194B2 JP56188344A JP18834481A JPS6248194B2 JP S6248194 B2 JPS6248194 B2 JP S6248194B2 JP 56188344 A JP56188344 A JP 56188344A JP 18834481 A JP18834481 A JP 18834481A JP S6248194 B2 JPS6248194 B2 JP S6248194B2
Authority
JP
Japan
Prior art keywords
contact
ground
voltage measuring
input terminal
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56188344A
Other languages
Japanese (ja)
Other versions
JPS5890176A (en
Inventor
Michihiro Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP18834481A priority Critical patent/JPS5890176A/en
Publication of JPS5890176A publication Critical patent/JPS5890176A/en
Publication of JPS6248194B2 publication Critical patent/JPS6248194B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145Indicating the presence of current or voltage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【発明の詳細な説明】 本発明は高感度な電圧測定器に用いられるプロ
ーブに関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a probe used in a highly sensitive voltage measuring instrument.

高感度な電圧測定器は、被測定体にプローブの
接触子を接触させて、測定を行う前に、プローブ
のグランド接触端子を入力端子線の接触子に接触
させてグランド電位の校正を行い、そのグランド
電位を基準にして被測定体の高精度の電位測定を
行うものである。こうして高感度な電圧測定器
は、電子回路の発展に伴い広く用いられており、
常に高確度な電圧測定を能率良く測定できる装置
とプローブが求められていた。
A highly sensitive voltage measuring instrument calibrates the ground potential by bringing the probe's ground contact terminal into contact with the input terminal wire contact before making a measurement by bringing the probe's contact into contact with the object to be measured. The potential of the object to be measured is measured with high precision using the ground potential as a reference. Highly sensitive voltage measuring instruments have become widely used with the development of electronic circuits.
There was a need for equipment and probes that could consistently and efficiently perform highly accurate voltage measurements.

本発明は、以上のような点に鑑みて成されたも
のであり、校正作業時に、プローブのグランド接
触端子を入力端子線の接触子に接続してグランド
電圧の校正をする手間を必要とせず、常時校正状
態にして測定の時のみ簡単なボタン操作で信号端
子を信号ラインに接続させることができるプロー
ブを提供することを目的とするものである。
The present invention has been made in view of the above points, and eliminates the need to calibrate the ground voltage by connecting the ground contact terminal of the probe to the contact of the input terminal line during calibration work. It is an object of the present invention to provide a probe which is always in a calibration state and whose signal terminal can be connected to a signal line by a simple button operation only during measurement.

すなわち、本発明の一つは、電圧測定器に接続
されるプローブであつて、被測定体と接触される
接触子と、被測定体のグランド電位と接触される
グランド接触端子と、上記接触子と上記電圧測定
器との間を結ぶ入力端子線と、上記グランド接触
端子と電圧測定器内のアース端子との間を結ぶア
ース線と、上記入力端子線の途中に設けられ、コ
モン端子が電圧測定器側の入力端子線に接続され
ていると共に、ノーマルクローズ接点とノーマル
オープン接点の一方が上記接触子側の入力端子線
と接続され、他方が上記アース線の一部と接続さ
れる切換スイツチと、を具備することを特徴とす
るものであり、今一つの発明は第1の発明を主要
部とし、かつ切換スイツチの切換状態を検出する
スイツチ信号検出回路の信号接点を具備すること
を特徴とするものである。
That is, one aspect of the present invention is a probe that is connected to a voltage measuring device, which includes a contact that comes into contact with an object to be measured, a ground contact terminal that comes into contact with the ground potential of the object to be measured, and a contactor that is connected to a voltage measuring device. An input terminal wire connects the terminal and the voltage measuring device, a grounding wire connects the grounding contact terminal and the grounding terminal in the voltage measuring device, and a common terminal is provided in the middle of the input terminal wire. A changeover switch that is connected to the input terminal wire on the measuring instrument side, one of the normally closed contact and the normally open contact is connected to the input terminal wire on the contactor side, and the other is connected to a part of the ground wire. Another invention is characterized in that it has the first invention as a main part, and also includes a signal contact of a switch signal detection circuit that detects the switching state of the changeover switch. It is something to do.

次に、本発明に係るプローブの第1の実施例を
第1図について説明する。図中1が本発明に係る
プローブであり、2はこのプローブ1と接続され
る電圧測定器である。上記プローブ1は絶縁材よ
りなる円筒状の外筐部3を有しており、この外筐
部3の前端3aには被測定体と接触される接触子
4が取り付けられている。この接触子4は針状と
され、その先端4aは外筐部3の前端3aよりさ
らに前方に突出されており、基部側は前端3a内
に埋設されていると共に、基部側端部4bは外筐
部3の内空部3b内に露出されている。上記外筐
部3の内空部3bには、上記接触子4と電圧測定
器2との間を結ぶ入力端子線5と、グランド接触
端子6と電圧測定器2内のアース端子7との間を
結ぶアース線8が通挿されており、上記グランド
接触端子6はワニグチクリツプが用いられ、アー
ス線8はこのグランド接触端子6から外筐部3の
側壁を貫通して内空部3bに引き入れられてい
る。さらに、内空部3bにおける上記入力端子線
5の途中には切換スイツチSが設けられており、
この切換スイツチSとしてリードスイツチが用い
られ、該切換スイツチSのコモン接点COが電圧
測定器2側の入力端子線5aに接続されていると
共に、ノーマルオープン接点NOが接触子4側の
入力端子線5bに接続され、ノーマルクローズ接
点NCが上記アース線8の一部と接続されてい
る。また、上記外筐部3における上記切換スイツ
チSと対応する箇所にはスイツチ操作ボタン取付
スリツト9が形成されており、この取付スリツト
9にはスイツチ操作ボタン10が該取付スリツト
9に沿つて滑動自在として取り付けられ、このス
イツチ操作ボタン10の内空部3b側には、前記
切換スイツチSを励磁して該切換スイツチSのコ
モン接点COとノーマルクローズ接点NCとの接触
からコモン接点COとノーマルオープン接点NOと
の接触に切り換えるマグネツトMが固着されてい
る。また、測定器2側の入力端子線5aの途中に
は、入力電圧の分割を目的とする抵抗Rと交流特
性改善のためのコンデンサCによる並列回路11
が挿入されている。上記切換スイツチSと並列回
路11を内包する外筐部3の後端3cからは、上
記入力端子線5とアース線8が外部に導出されて
おり、各端部は着脱コネクタ12a,12bによ
り前記電圧測定器2に接続されている。上記アー
ス線8はコネクタ12bを介して電圧測定器2内
のアース端子7に接続され、上記入力端子線5は
コネクタ12aを介してFET13等による高入
力インピーダンス回路14に接続されており、こ
の高入力インピーダンス回路14は電位差計(図
示せず)等に接続されている。
Next, a first embodiment of the probe according to the present invention will be described with reference to FIG. In the figure, 1 is a probe according to the present invention, and 2 is a voltage measuring device connected to this probe 1. The probe 1 has a cylindrical outer housing 3 made of an insulating material, and a contact 4 that comes into contact with the object to be measured is attached to the front end 3a of the outer housing 3. This contactor 4 is shaped like a needle, and its tip 4a protrudes further forward than the front end 3a of the outer casing 3, and the base side is buried in the front end 3a, and the base side end 4b is outside. It is exposed within the inner cavity 3b of the housing 3. In the inner space 3b of the outer casing 3, there is an input terminal wire 5 connecting the contact 4 and the voltage measuring device 2, and a connection between the ground contact terminal 6 and the grounding terminal 7 inside the voltage measuring device 2. An alligator clip is used as the ground contact terminal 6, and the ground wire 8 is inserted from the ground contact terminal 6 through the side wall of the outer casing 3 and into the inner cavity 3b. It is being Furthermore, a changeover switch S is provided in the middle of the input terminal wire 5 in the inner space 3b,
A reed switch is used as the changeover switch S, and the common contact CO of the changeover switch S is connected to the input terminal line 5a on the voltage measuring device 2 side, and the normally open contact NO is connected to the input terminal line on the contactor 4 side. 5b, and a normally closed contact NC is connected to a part of the ground wire 8. Further, a switch operation button mounting slit 9 is formed in the outer casing 3 at a location corresponding to the changeover switch S, and a switch operation button 10 is slidable along the mounting slit 9. The changeover switch S is energized and the common contact CO and the normally open contact NC of the changeover switch S are brought into contact with each other, and the common contact CO and the normally open contact are connected to the inner cavity 3b side of the switch operation button 10. A magnet M that switches to contact with NO is fixed. Also, in the middle of the input terminal line 5a on the side of the measuring instrument 2, a parallel circuit 11 consisting of a resistor R for the purpose of dividing the input voltage and a capacitor C for improving AC characteristics is provided.
has been inserted. The input terminal wire 5 and the ground wire 8 are led out from the rear end 3c of the outer casing 3 containing the changeover switch S and the parallel circuit 11, and each end is connected to the It is connected to the voltage measuring device 2. The ground wire 8 is connected to the ground terminal 7 in the voltage measuring device 2 via the connector 12b, and the input terminal line 5 is connected to the high input impedance circuit 14 made of FET 13 etc. via the connector 12a. The input impedance circuit 14 is connected to a potentiometer (not shown) or the like.

次に、上述した構成によるプローブの作用を説
明する。
Next, the operation of the probe configured as described above will be explained.

まず、プローブ1の入力端子線5とアース線8
をコネクタ12a,12bにより電圧測定器2に
接続し、グランド接触端子6を被測定体のグラン
ド電位となる箇所に挾持させる。この状態が測定
の待機状態であつて、この待機状態においてグラ
ンド接触端子6からのグランド電位は、電圧測定
器2内のアース端子7と一致されると共に、その
グランド電位は、切換スイツチSのノーマルクロ
ーズ接点NC、コモン接点CO、並列回路11及び
入力端子線5を介して電圧測定器2の高入力イン
ピーダンス回路14に加えられており、これによ
り図中2に示す電圧測定器の測定回路動作の1つ
であるグランド電圧の校正が行われる。次に、接
触子4を被測定体に接触させて、スイツチ操作ボ
タン10をマグネツトMが切換スイツチSに近接
する方向にスライド操作すると、スイツチSは励
磁され、ノーマルクローズ接点NCとコモン接点
COとの接触が断たれると共にノーマルオープン
接点NOとコモン接点COとの接触が成される。従
つて、被測定体の電位は、接触子4、切換スイツ
チSのノーマルオープン接点NO、コモン接点
NC、並列回路11及び入力端子線5を介して電
圧測定器2の高入力インピーダンス回路14に加
えられて電圧が測定される。このように、待機中
は常にグランド電位の校正信号が測定器に与えら
れるため、計測直前に校正が成されたことにな
り、高精度の測定を行うことができ、且つ校正作
業のためにグランド接触端子6をわざわざ接触子
4に接続するという手間を必要としないものであ
る。従つて第5図に示すように従来グランド電位
を測定器に与え、測定器内のDCオフセツト電圧
を校正し0Vとし、次に測定に移りそのまま測定
を継続すると温度変化などにより測定器内のDC
オフセツトが変化し測定値の誤差が大きくなつた
が、この発明によるプローブを用いれば、電圧計
のグランド電位校正をスイツチ操作ボタン10を
押すたびに行うため多数箇所の測定にあたつても
DC電圧校正が容易に成され能率良く高確度測定
が可能となる。
First, input terminal wire 5 of probe 1 and ground wire 8
are connected to the voltage measuring device 2 through connectors 12a and 12b, and the ground contact terminal 6 is clamped at a location of the object to be measured that has a ground potential. This state is a standby state for measurement, and in this standby state, the ground potential from the ground contact terminal 6 is matched with the ground terminal 7 in the voltage measuring device 2, and the ground potential is equal to the normal voltage of the changeover switch S. It is connected to the high input impedance circuit 14 of the voltage measuring instrument 2 via the close contact NC, common contact CO, parallel circuit 11, and input terminal wire 5, thereby controlling the operation of the measuring circuit of the voltage measuring instrument shown in 2 in the figure. Calibration of one ground voltage is performed. Next, when the contactor 4 is brought into contact with the object to be measured and the switch operation button 10 is slid in the direction in which the magnet M approaches the changeover switch S, the switch S is energized and the normally closed contact NC and the common contact
Contact with CO is cut off, and contact is made between the normally open contact NO and the common contact CO. Therefore, the potential of the object to be measured is determined by the contact 4, the normally open contact NO of the changeover switch S, and the common contact.
The voltage is applied to the high input impedance circuit 14 of the voltage measuring device 2 via the NC, parallel circuit 11 and input terminal line 5, and the voltage is measured. In this way, since the calibration signal of the ground potential is always given to the measuring instrument during standby, it means that the calibration has been completed immediately before measurement, making it possible to perform highly accurate measurements. This eliminates the need for the trouble of connecting the contact terminal 6 to the contactor 4. Therefore, as shown in Figure 5, if you apply the conventional ground potential to the measuring instrument, calibrate the DC offset voltage inside the measuring instrument to 0V, then proceed to measurement and continue measurement, the DC inside the measuring instrument will increase due to temperature changes.
However, with the probe according to the present invention, the ground potential of the voltmeter is calibrated every time the switch operation button 10 is pressed, making it easier to measure multiple locations.
DC voltage calibration can be easily performed and efficient and highly accurate measurements can be performed.

次に、本発明に係るプローブの第2、第3、第
4の実施例をそれぞれ第2図、第3図、第4図に
ついて説明する。なお、上述した第1の実施例と
同様の箇所には同等の符号を付し、その説明は省
略する。
Next, second, third, and fourth embodiments of the probe according to the present invention will be described with reference to FIGS. 2, 3, and 4, respectively. Note that the same parts as in the first embodiment described above are given the same reference numerals, and the explanation thereof will be omitted.

第2図に示す第2の実施例は、上述した第1の
実施例による構成のほかに切換スイツチSの切換
状態を検出するスイツチ信号検出回路20の信号
接点20aを設け、電圧測定器2側において切換
スイツチSの切換状態を認識できるようにしたも
のである。プローブ1内に前記切換スイツチSと
近接してリードスイツチが設けられ、そのリード
スイツチのコモン接点CO′とノーマルオープン接
点NO′が上記スイツチ信号検出回路20の信号接
点20aとされており、コモン接点CO′は検出線
21とコネクタ21dを介して電圧測定器2内の
スイツチ信号検出回路20に接続され、ノーマル
オープン接点NO′は電源線22とコネクタ12c
を介して電圧測定器2内の電源23に接続され、
ノーマルクローズ接点NC′はアース線23とコネ
クタ12eを介して電圧測定器2内のアース端子
24に接続されている。
In the second embodiment shown in FIG. 2, in addition to the configuration of the first embodiment described above, a signal contact 20a of a switch signal detection circuit 20 for detecting the switching state of the changeover switch S is provided, and a signal contact 20a is provided on the voltage measuring device 2 side. The switching state of the changeover switch S can be recognized at the time of the changeover. A reed switch is provided in the probe 1 in close proximity to the changeover switch S, and the common contact CO' and normally open contact NO' of the reed switch are used as the signal contact 20a of the switch signal detection circuit 20, and the common contact CO' is connected to the switch signal detection circuit 20 in the voltage measuring device 2 via the detection line 21 and the connector 21d, and the normally open contact NO' is connected to the power line 22 and the connector 12c.
is connected to the power supply 23 in the voltage measuring device 2 via
The normally closed contact NC' is connected to a ground terminal 24 in the voltage measuring device 2 via a ground wire 23 and a connector 12e.

第2の実施例によるプローブは上述した構成と
されているので、スイツチSの切換操作に連動し
て信号接点20aが操作され、これにより電源2
3よりコネクタ12c、電源線22、ノーマルオ
ープン接点NO′、コモン接点CO′、検出線21、
及びコネクタ21dを介してスイツチ信号検出回
路20に電流が供給されてスイツチSの切換操作
が成されたことが電圧測定器2側で認識される。
従つて、この信号をタイミングとして測定と自己
校正動作を測定器内部で切換えることにより校正
作業を自動化することができ、且つ測定の都度
(スイツチ10を押された都度)測定値を表示す
れば測定値の誤読のおそれがなく、測定値を電圧
測定器に接続された記録計に入力させる際には記
録のタイミング信号として用いることによりスイ
ツチを押す都度測定値が記録可能となる。
Since the probe according to the second embodiment has the above-described configuration, the signal contact 20a is operated in conjunction with the switching operation of the switch S, and thereby the power supply 2
3 to connector 12c, power line 22, normally open contact NO', common contact CO', detection line 21,
Current is supplied to the switch signal detection circuit 20 through the connector 21d, and the voltage measuring device 2 side recognizes that the switch S has been switched.
Therefore, by using this signal as a timing to switch between measurement and self-calibration operations within the measuring instrument, the calibration work can be automated, and by displaying the measured value each time a measurement is made (each time the switch 10 is pressed), the measurement can be performed. There is no risk of misreading of the value, and by using it as a recording timing signal when inputting the measured value to a recorder connected to the voltage measuring device, the measured value can be recorded each time the switch is pressed.

第3図に示す第3の実施例は、上述した第2の
実施例で示した信号接点20aとして、手動操作
のマイクロスイツチが用いられており、その信号
接点20aの一方が電源線22と接続され、他方
が検出線21と接続されている。さらに、上記検
出線21の途中にはリレー駆動用コイル30が設
けられ、このリレー駆動用コイル30はリードス
イツチである切換スイツチSに巻回されてリード
リレーが構成されている。
In the third embodiment shown in FIG. 3, a manually operated micro switch is used as the signal contact 20a shown in the second embodiment, and one of the signal contacts 20a is connected to the power line 22. and the other end is connected to the detection line 21. Further, a relay driving coil 30 is provided in the middle of the detection line 21, and this relay driving coil 30 is wound around a changeover switch S, which is a reed switch, to constitute a reed relay.

第3の実施例によるプローブは上述した構成と
されているので、その信号接点20aが手動操作
によりONされると、リレー駆動用コイル30と
スイツチ信号検出回路20に電流が供給されて、
切換スイツチSが切換操作されると共に、第2の
実施例と同様にしてスイツチSの切換操作が成さ
れたことが電圧測定器2側で認識される。第3図
中の能動回路31は第1,2図における並列回路
11が例えば増幅器などに置きかえられたもので
あり、プローブ内に能動回路31が実装された時
の温度変化によるDCオフセツト電圧の影響を校
正する時にはこの実施例の切換スイツチの設置は
特に有効である。
Since the probe according to the third embodiment has the above-described configuration, when the signal contact 20a is turned ON by manual operation, current is supplied to the relay drive coil 30 and the switch signal detection circuit 20.
When the changeover switch S is operated, the voltage measuring device 2 side recognizes that the changeover operation of the switch S has been performed in the same manner as in the second embodiment. The active circuit 31 in Fig. 3 is the parallel circuit 11 in Figs. 1 and 2 replaced with, for example, an amplifier, and the influence of DC offset voltage due to temperature changes when the active circuit 31 is mounted in the probe. The installation of the changeover switch of this embodiment is particularly effective when calibrating the.

第4図に示す第4の実施例は、スイツチ操作ボ
タン10′を押しボタン式にしたものであり、マ
グネツトMが切換スイツチSに向けて進退自在と
なるようにスイツチ操作ボタン10′は、板バネ
40を介して外筐部3に取り付けられている。
In the fourth embodiment shown in FIG. 4, the switch operation button 10' is a push button type. It is attached to the outer casing 3 via a spring 40.

以上説明したように本発明によれば、プローブ
にグランド接触端子と接触子とを切り換えて入力
端子線に接続する切換スイツチを設けた構成とし
たので、計測待機中は常にグランド電位を電圧測
定器に対し直流校正用の0V信号を与える効果が
あり、これにより計測直前に校正が成されること
になり高精度の測定を行うことができる効果があ
る。従つて校正作業のためにグランド接触端子を
わざわざ接触子に接続するという手間が省け、多
数箇所を順次測定している時でも1回ごとに0V
校正をしながら計測することができる効果があ
り、そのため本プローブを用いる電圧測定器本体
が安価なDCドリフトの大きなものであつても高
確度測定可能となる効果がある。
As explained above, according to the present invention, the probe is provided with a changeover switch that switches between the ground contact terminal and the contact and connects it to the input terminal line. This has the effect of providing a 0V signal for DC calibration to the DC calibration, which allows calibration to be performed immediately before measurement, resulting in highly accurate measurements. Therefore, there is no need to go to the trouble of connecting the ground contact terminal to the contactor for calibration work, and even when measuring multiple points one after another, 0V is measured every time.
This has the effect of being able to perform measurements while being calibrated, and therefore enables highly accurate measurements even if the voltage measuring device using this probe is inexpensive and has a large DC drift.

また本発明において切換スイツチの切換状態を
検出するスイツチ信号検出回路を設けた構成とす
ると、その信号をタイミング信号として用いるこ
とにより校正作業を自動化することができる効果
があり、且つ操作スイツチを押された都度測定値
を表示すれば測定値の誤続のおそれがなく、デー
タを記録計に入力させる際には測定させようとし
たその時の測定値が記録されるため事後の確認が
容易となる効果がある。
Further, in the present invention, if a switch signal detection circuit for detecting the switching state of the changeover switch is provided, the calibration work can be automated by using the signal as a timing signal, and the operation switch can be pressed. By displaying the measured value each time, there is no risk of incorrect reading of the measured value, and when inputting data into the recorder, the measured value at the time of measurement is recorded, making it easier to confirm after the fact. There is.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係るプローブの第1の実施例
を示す断面図、第2図は同第2の実施例を示す回
路図、第3図は同第3の実施例を示す回路図、第
4図は、第4の実施例における切換スイツチの周
辺を示す説明図、第5図は第2、第3の実施例の
スイツチ動作と自己校正、測定との時間関係を示
すタイミングチヤート説明図である。 1……プローブ、2……電圧測定器、4……接
触子、5……入力端子線、6……グランド接触端
子、7……アース端子、8……アース線、20…
…スイツチ信号検出回路、20a……信号接点、
S……切換スイツチ、CO……コモン接点、NO…
…ノーマルオープン接点、NC……ノーマルクロ
ーズ接点。
FIG. 1 is a sectional view showing a first embodiment of the probe according to the present invention, FIG. 2 is a circuit diagram showing the second embodiment, and FIG. 3 is a circuit diagram showing the third embodiment. FIG. 4 is an explanatory diagram showing the surroundings of the changeover switch in the fourth embodiment, and FIG. 5 is a timing chart explanatory diagram showing the time relationship between switch operation, self-calibration, and measurement in the second and third embodiments. It is. 1... Probe, 2... Voltage measuring device, 4... Contact, 5... Input terminal wire, 6... Ground contact terminal, 7... Earth terminal, 8... Earth wire, 20...
...Switch signal detection circuit, 20a...Signal contact,
S...Selector switch, CO...Common contact, NO...
…Normally open contact, NC…Normally closed contact.

Claims (1)

【特許請求の範囲】 1 電圧測定器に接続されるプローブであつて、
被測定体と接触される接触子と、被測定体のグラ
ンド電位と接触されるグランド接触端子と、上記
接触子と上記電圧測定器との間を結ぶ入力端子線
と、上記グランド接触端子と電圧測定器内のアー
ス端子との間を結ぶアース線と、上記入力端子線
の途中に設けられ、コモン接点が電圧測定器側の
入力端子線に接続されていると共に、ノーマルク
ローズ接点とノーマルオープン接点の一方が上記
接触子側の入力端子線と接続され、他方が上記ア
ース線の一部と接続される切換スイツチと、を具
備することを特徴とするプローブ。 2 電圧測定器に接続されるプローブであつて、
被測定体と接触される接触子と、被測定体のグラ
ンド電位と接触されるグランド接触端子と、上記
接触子と上記電圧測定器との間を結ぶ入力端子線
と、上記グランド接触端子と電圧測定器内のアー
ス端子との間を結ぶアース線と、上記入力端子線
の途中に設けられ、コモン接点が電圧測定器側の
入力端子線に接続されていると共に、ノーマルク
ローズ接点とノーマルオープン接点の一方が上記
接触子側の入力端子線と接続され、他方が上記ア
ース線の一部と接続される切換スイツチと、を具
備しており、かつ上記切換スイツチの切換状態を
検出するスイツチ信号検出回路の信号接点を具備
することを特徴とするプローブ。
[Claims] 1. A probe connected to a voltage measuring device,
A contact that comes into contact with the object to be measured, a ground contact terminal that comes into contact with the ground potential of the object to be measured, an input terminal wire that connects the contact and the voltage measuring device, and a voltage between the ground contact terminal and the voltage measuring device. A ground wire connecting the earth terminal inside the measuring instrument and the above input terminal wire are provided in the middle, and the common contact is connected to the input terminal wire on the voltage measuring instrument side, as well as a normally closed contact and a normally open contact. a changeover switch, one of which is connected to the input terminal line on the contact side, and the other of which is connected to a part of the ground wire. 2 A probe connected to a voltage measuring device,
A contact that comes into contact with the object to be measured, a ground contact terminal that comes into contact with the ground potential of the object to be measured, an input terminal wire that connects the contact and the voltage measuring device, and a voltage between the ground contact terminal and the voltage measuring device. A ground wire connecting the earth terminal inside the measuring instrument and the input terminal wire are provided in the middle, and the common contact is connected to the input terminal wire on the voltage measuring instrument side, as well as a normally closed contact and a normally open contact. a changeover switch, one of which is connected to the input terminal line on the contact side and the other connected to a part of the ground wire, and a switch signal detection device that detects the switching state of the changeover switch. A probe characterized by comprising a signal contact of a circuit.
JP18834481A 1981-11-26 1981-11-26 Probe Granted JPS5890176A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18834481A JPS5890176A (en) 1981-11-26 1981-11-26 Probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18834481A JPS5890176A (en) 1981-11-26 1981-11-26 Probe

Publications (2)

Publication Number Publication Date
JPS5890176A JPS5890176A (en) 1983-05-28
JPS6248194B2 true JPS6248194B2 (en) 1987-10-13

Family

ID=16221969

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18834481A Granted JPS5890176A (en) 1981-11-26 1981-11-26 Probe

Country Status (1)

Country Link
JP (1) JPS5890176A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0616055B2 (en) * 1985-07-19 1994-03-02 光一 吉田 Spring contact type probe
JPS62104165U (en) * 1985-12-19 1987-07-02
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
WO2005093437A1 (en) 2004-03-26 2005-10-06 Nec Corporation Electric characteristic measurement method and electric characteristic measurement device
JP2011052969A (en) * 2009-08-31 2011-03-17 Hioki Ee Corp Wire routing structure of z-axis unit in substrate inspection device
JP2013113822A (en) * 2011-11-30 2013-06-10 Hioki Ee Corp Measurement device
JP2013120077A (en) * 2011-12-06 2013-06-17 Hioki Ee Corp Measuring device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS579846Y2 (en) * 1977-07-01 1982-02-25

Also Published As

Publication number Publication date
JPS5890176A (en) 1983-05-28

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