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JPS6248370B2 - - Google Patents
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JPS6248370B2 - - Google Patents

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Publication number
JPS6248370B2
JPS6248370B2 JP4597276A JP4597276A JPS6248370B2 JP S6248370 B2 JPS6248370 B2 JP S6248370B2 JP 4597276 A JP4597276 A JP 4597276A JP 4597276 A JP4597276 A JP 4597276A JP S6248370 B2 JPS6248370 B2 JP S6248370B2
Authority
JP
Japan
Prior art keywords
growth
solution
substrate
liquid phase
atmospheric gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4597276A
Other languages
Japanese (ja)
Other versions
JPS52129277A (en
Inventor
Saburo Yamamoto
Morichika Yano
Yukio Kurata
Kaneki Matsui
Akira Komuro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP4597276A priority Critical patent/JPS52129277A/en
Publication of JPS52129277A publication Critical patent/JPS52129277A/en
Publication of JPS6248370B2 publication Critical patent/JPS6248370B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 本発明は新規なる液相エピタキシヤル成長法に
関するものである。本発明は溶液中に発生する微
結晶が原因となつてできる成長層中の欠陥の数を
減少させることを目的とする。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a novel liquid phase epitaxial growth method. An object of the present invention is to reduce the number of defects in a grown layer caused by microcrystals generated in a solution.

液相エピタキシヤル成長は一般的に次のような
方法で行われる。第1図に示すように所定の添加
物を含む溶液1を入れたボート2、及び基板結晶
3を収納したスライダ4は溶液と基板結晶とが分
離した状態で配置されており、この状態におかれ
た液相エピタキシヤル成長系に外部から酸化防止
用の雰囲気ガスが導入される。液相エピタキシヤ
ル成長系を高純度雰囲気ガス中で所定温度で所定
時間保持し、溶液を熱平衡状態に保つ。しかる
後、所定の冷却速度で降温しながらスライダを移
動して基板結晶と溶液を接触させる。この降温途
中で溶液中に微結晶が発生する現象がある。この
微結晶を含んだままの溶液によつてエピタキシヤ
ル成長を続行すると、微結晶直下の成長層中には
結晶成分の不足した欠陥が形成され、あるいは微
結晶が成長層中にとり込まれたりする。このよう
な結晶を用いて作つた半導体装置は電気的、光学
的特性が好ましくない。
Liquid phase epitaxial growth is generally performed in the following manner. As shown in FIG. 1, a boat 2 containing a solution 1 containing predetermined additives and a slider 4 containing a substrate crystal 3 are arranged in a state where the solution and the substrate crystal are separated. An atmospheric gas for preventing oxidation is introduced from the outside into the liquid phase epitaxial growth system. The liquid phase epitaxial growth system is maintained at a predetermined temperature for a predetermined time in a high-purity atmospheric gas to maintain the solution in a thermal equilibrium state. Thereafter, the slider is moved while lowering the temperature at a predetermined cooling rate to bring the substrate crystal into contact with the solution. During this cooling process, there is a phenomenon in which microcrystals are generated in the solution. If epitaxial growth is continued with a solution containing these microcrystals, defects lacking crystal components will be formed in the growth layer directly under the microcrystals, or microcrystals will be incorporated into the growth layer. . Semiconductor devices made using such crystals have unfavorable electrical and optical properties.

本発明は溶液中の微結晶が原因となつてできる
欠陥をほとんど含まない結晶の成長方法を提供す
るものである。
The present invention provides a method for growing crystals that contains almost no defects caused by microcrystals in a solution.

本発明の方法を以下に述べる。第2図に示すよ
うに最高温度保持中には雰囲気ガス流量を極力小
さくして、溶液及び基板結晶からの成分の蒸発を
押え、成長開始の少し前から雰囲気ガス流量を増
加させる。この雰囲気ガスは溶液基板結晶及びこ
れらを保持するカーボン治具が酸化されないよう
に流す不活性ガスまたは還元ガスであり、雰囲気
ガスを流すことによつてボート、スライダから熱
を奪い溶液は内部より周辺部の方が早く冷却する
ようになる。この状態で炉全体を冷却することに
よりエピタキシヤル成長を行えば、溶液中に発生
する微結晶は溶液のボート壁に接した部分へ引き
つけられ成長層には影響を与えない。
The method of the present invention will be described below. As shown in FIG. 2, while the maximum temperature is maintained, the flow rate of the atmospheric gas is minimized to suppress evaporation of components from the solution and the substrate crystal, and the flow rate of the atmospheric gas is increased shortly before the start of growth. This atmospheric gas is an inert gas or reducing gas that is flowed to prevent the solution substrate crystals and the carbon jig that holds them from being oxidized. area will cool down faster. If epitaxial growth is performed by cooling the entire furnace in this state, the microcrystals generated in the solution will be attracted to the part of the solution in contact with the boat wall and will not affect the growing layer.

さらに第1図に示すようにボート部の壁の厚さ
dよりもスライダ部の厚さDを十分大きくすれ
ば、ボート部の方がスライダ部よりも速く雰囲気
ガスによつて熱を奪われるから、この発明の効果
は大となる。
Furthermore, as shown in Figure 1, if the thickness D of the slider section is made sufficiently larger than the thickness d of the wall of the boat section, heat will be removed from the boat section by the atmospheric gas faster than the slider section. , the effect of this invention is great.

また、溶液面積より基板面積を小さくすれば、
横方向の温度分布による基板周辺の成長層の盛り
上りを軽減できる。
Also, if the substrate area is made smaller than the solution area,
It is possible to reduce the swelling of the growth layer around the substrate due to lateral temperature distribution.

<好ましい実施例> 次に本発明の実施例としてGaAs結晶をエピタ
キシヤル成長させた場合について述べる。
<Preferred Embodiment> Next, as an embodiment of the present invention, a case where GaAs crystal is epitaxially grown will be described.

まず初期工程でGaAs多結晶及びドーパントを
添加したGaメルト1を入れたボート2及びGaAs
基板3を収納したスライダ4はGaメルト1と基
板3を分離した状態で雰囲気ガスとして例えば水
素(H2)ガスを選択し高純度H2ガス中で800℃ま
で昇温し、3時間保持してGaメルトをAsで飽和
させた。この間のH2ガス流量は0.1/分とし
て、溶液及び基板からの成分の蒸発を極力押え
た。次の成長工程でこのH2がガス流量を0.4/
分に切り換えて10分後に降温を開始した。5℃降
りたところでスライダを移動して、基板とGaメ
ルトを接触させ成長を開始した。800℃から10℃
降りたところで基板上からGaメルトを取り去り
成長を停止させた。この成長表面に観察される微
結晶が原因となつてできる欠陥(径1μ以上の
穴)の数は103/cm2以下であつた。又、H2ガス流
量を終止0.1/分のままで成長を行つたものの
表面には105/cm2以上の欠陥が観察された。
First, in the initial process, boat 2 containing Ga melt 1 with GaAs polycrystals and dopants added and GaAs
With the Ga melt 1 and the substrate 3 separated from each other, the slider 4 housing the substrate 3 is heated to 800°C in high-purity H 2 gas by selecting hydrogen (H 2 ) gas as the atmospheric gas and holding it for 3 hours. The Ga melt was saturated with As. During this time, the H 2 gas flow rate was set to 0.1/min to suppress evaporation of components from the solution and the substrate as much as possible. In the next growth process, this H 2 increases the gas flow rate by 0.4/
After 10 minutes, the temperature started to decrease. When the temperature dropped to 5°C, the slider was moved to bring the substrate into contact with the Ga melt and growth started. 800℃ to 10℃
Once the substrate had descended, the Ga melt was removed from the substrate to stop growth. The number of defects (holes with a diameter of 1 μm or more) caused by microcrystals observed on the growth surface was less than 10 3 /cm 2 . In addition, defects of 10 5 /cm 2 or more were observed on the surface of the film that was grown with the H 2 gas flow rate unchanged at 0.1/min.

本発明は単層のみの成長だけでなく多層構造を
有する成長層にも適用できる。たとえばダブルヘ
テロ形レーザを本発明を用いて成長させると成長
層中の欠陥、特に活性層中の欠陥を減少させるこ
とができる。実際に本発明を用いてダブルヘテロ
形レーザを作つたところ、その室温連続発振の寿
命は5000時間以上であり、従来の欠陥を多く含ん
だダブルヘテロ形レーザは500時間以下の寿命し
か得られなかつた。
The present invention is applicable not only to the growth of a single layer but also to growth layers having a multilayer structure. For example, when a double-hetero laser is grown using the present invention, defects in the grown layers, particularly in the active layer, can be reduced. When a double-hetero laser was actually created using the present invention, its continuous oscillation life at room temperature was over 5,000 hours, whereas conventional double-hetero lasers with many defects had a lifespan of less than 500 hours. Ta.

本発明はその他のあらゆる半導体装置に適用で
きる。
The present invention can be applied to all other semiconductor devices.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は液相成長用ボートの図で、aは側面か
ら見た断面図、bは前面から見た断面図である。 1……溶液、2……ボート部、3……基板結
晶、4……スライダ部、d……ボート部の壁の厚
み、D……スライダ部の厚み。 第2図aは成長温度サイクルを示す線図であ
る。 縦軸……温度、横軸……時間、斜線部……成長
中の時間を示す。 第2図bはガス流量サイクルを示す線図であ
る。 縦軸……ガス流量、横軸……時間、斜線部……
成長中の時間を示す。
FIG. 1 is a diagram of a boat for liquid phase growth, in which a is a sectional view seen from the side and b is a sectional view seen from the front. 1...Solution, 2...Boat part, 3...Substrate crystal, 4...Slider part, d...Thickness of wall of boat part, D...Thickness of slider part. FIG. 2a is a diagram showing the growth temperature cycle. Vertical axis: temperature; horizontal axis: time; diagonal line: time during growth. FIG. 2b is a diagram showing the gas flow cycle. Vertical axis: gas flow rate, horizontal axis: time, shaded area...
Indicates time during growth.

Claims (1)

【特許請求の範囲】[Claims] 1 成長用溶液と成長用基板結晶が配設された液
相エピタキシヤル成長系に高純度の雰囲気ガスを
導入し、該雰囲気ガス中で前記基板結晶上に前記
溶液から成長層を得る液相エピタキシヤル成長法
において、導入される前記雰囲気ガスの流量を小
さく設定して前記溶液を高温保持する初期工程
と、該初期工程に続いて、前記流量を増大させ、
前記溶液を前記基板結晶上に接触させて降温し、
前記基板結晶上にエピタキシヤル成長層を得る成
長工程と、を具備して成る液相エピタキシヤル成
長法。
1 Liquid phase epitaxy in which a high purity atmospheric gas is introduced into a liquid phase epitaxial growth system in which a growth solution and a growth substrate crystal are arranged, and a layer is grown from the solution on the substrate crystal in the atmospheric gas. In the barrel growth method, an initial step of maintaining the solution at a high temperature by setting a small flow rate of the introduced atmospheric gas, and following the initial step, increasing the flow rate,
bringing the solution into contact with the substrate crystal and lowering the temperature;
A liquid phase epitaxial growth method comprising: a growth step of obtaining an epitaxial growth layer on the substrate crystal.
JP4597276A 1976-04-21 1976-04-21 Liquid phase epitaxial growth method Granted JPS52129277A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4597276A JPS52129277A (en) 1976-04-21 1976-04-21 Liquid phase epitaxial growth method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4597276A JPS52129277A (en) 1976-04-21 1976-04-21 Liquid phase epitaxial growth method

Publications (2)

Publication Number Publication Date
JPS52129277A JPS52129277A (en) 1977-10-29
JPS6248370B2 true JPS6248370B2 (en) 1987-10-13

Family

ID=12734126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4597276A Granted JPS52129277A (en) 1976-04-21 1976-04-21 Liquid phase epitaxial growth method

Country Status (1)

Country Link
JP (1) JPS52129277A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57191294A (en) * 1981-05-22 1982-11-25 Hitachi Ltd Automatic epitaxial device of liquid phase

Also Published As

Publication number Publication date
JPS52129277A (en) 1977-10-29

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