JPS6251904B2 - - Google Patents
Info
- Publication number
- JPS6251904B2 JPS6251904B2 JP9584281A JP9584281A JPS6251904B2 JP S6251904 B2 JPS6251904 B2 JP S6251904B2 JP 9584281 A JP9584281 A JP 9584281A JP 9584281 A JP9584281 A JP 9584281A JP S6251904 B2 JPS6251904 B2 JP S6251904B2
- Authority
- JP
- Japan
- Prior art keywords
- tin
- tin oxide
- film
- forming
- tin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 22
- 229910001887 tin oxide Inorganic materials 0.000 claims description 22
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 19
- 239000000758 substrate Substances 0.000 claims description 8
- 238000005530 etching Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 7
- 229910052787 antimony Inorganic materials 0.000 claims description 5
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 4
- 239000001301 oxygen Substances 0.000 claims description 4
- 229910052760 oxygen Inorganic materials 0.000 claims description 4
- 238000004544 sputter deposition Methods 0.000 claims description 2
- 238000007740 vapor deposition Methods 0.000 claims 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 13
- 238000007796 conventional method Methods 0.000 description 6
- 229920002120 photoresistant polymer Polymers 0.000 description 6
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 229910003437 indium oxide Inorganic materials 0.000 description 3
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 3
- 238000000059 patterning Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- 150000007513 acids Chemical class 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/22—Surface treatment of glass, not in the form of fibres or filaments, by coating with other inorganic material
- C03C17/23—Oxides
- C03C17/27—Oxides by oxidation of a coating previously applied
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2218/00—Methods for coating glass
- C03C2218/30—Aspects of methods for coating glass not covered above
- C03C2218/32—After-treatment
- C03C2218/328—Partly or completely removing a coating
- C03C2218/33—Partly or completely removing a coating by etching
Landscapes
- Liquid Crystal (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Surface Treatment Of Glass (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Manufacturing Of Electric Cables (AREA)
Description
【発明の詳細な説明】
本発明は、耐酸性、耐アルカリ性を有する酸化
スズを用いた透明電極パターンの形成方法に関す
るものであり、耐薬品性の強い酸化錫を容易に所
定のパターンに形成できるようにしたものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for forming a transparent electrode pattern using tin oxide, which has acid resistance and alkali resistance, and allows tin oxide, which has strong chemical resistance, to be easily formed into a predetermined pattern. This is how it was done.
従来、液晶表示デイスプレイ等に使用されてい
る透明電極は、主として錫を少量含む酸化インジ
ウムで構成されている。しかし、この透明電極と
して酸化インジウムを使用する方法は、デバイス
を作製する工程で薬品処理を施す工程が多い場
合、酸化インジウムが酸およびアルカリ等によつ
て浸されるため、抵抗が上がるという欠点を有し
ている。 Transparent electrodes conventionally used in liquid crystal displays and the like are mainly composed of indium oxide containing a small amount of tin. However, this method of using indium oxide as a transparent electrode has the disadvantage that when the device fabrication process involves many chemical treatments, the indium oxide is immersed in acids and alkalis, resulting in increased resistance. have.
これに反し、同じように透明電極として用いら
れる酸化錫は耐薬品性が優れているため、薬品処
理を製作工程中に多く含むデバイスの透明電極と
して用いる利用価値は非常に大きい。従来、酸化
錫を所定のパターンに形成する方法は、亜鉛粉を
用いて酸化錫を還元して錫にし、酸、特に希塩酸
でエツチングする方法が知られている。 On the other hand, tin oxide, which is also used as a transparent electrode, has excellent chemical resistance, so it has great utility as a transparent electrode in devices that involve many chemical treatments in the manufacturing process. Conventionally, a known method for forming tin oxide into a predetermined pattern is to reduce tin oxide to tin using zinc powder and then etching it with acid, particularly dilute hydrochloric acid.
以下、従来の方法を第1図を参照して説明する
と、まず第1図aに示すようにガラス絶縁基板1
上に形成された酸化錫膜2をフオトレジスト3で
パターンニングし、しかる後、第1図bに示すよ
うに酸化錫膜2およびフオトレジスト3上に亜鉛
粉4を塗布し、これを塩酸等の酸につけ、亜鉛粉
4と塩酸とが反応する際に発生する水素で酸化錫
膜2を還元して第1図cに示すように錫膜5を形
成し、しかる後、還元によつて得られた錫膜5を
塩酸でエツチング除去し、最後にフオトレジスト
3を除けば、所定のパターンに形成された酸化錫
膜2が得られる。 Hereinafter, the conventional method will be explained with reference to FIG. 1. First, as shown in FIG. 1a, a glass insulating substrate 1 is
The tin oxide film 2 formed above is patterned with a photoresist 3, and then, as shown in FIG. The tin oxide film 2 is reduced by hydrogen generated when the zinc powder 4 and hydrochloric acid react to form a tin film 5 as shown in FIG. The tin film 5 thus formed is removed by etching with hydrochloric acid, and finally the photoresist 3 is removed to obtain a tin oxide film 2 formed in a predetermined pattern.
しかしながら、このような従来の方法は、亜鉛
粉を均一の粒径にそろえ、しかも酸化錫膜上のフ
オトレジストを傷つけないで均等に塗る必要があ
り、数10μmのパターンが形成し難く、酸化錫の
厚みが1000Åを越えると、亜鉛と塩酸との反応で
発生した水素による酸化錫の還元が内部にまで浸
透しにくいという多くの欠点を有している。 However, in this conventional method, it is necessary to make the zinc powder uniform in particle size and apply it evenly without damaging the photoresist on the tin oxide film, making it difficult to form a pattern of several tens of micrometers. If the thickness exceeds 1000 Å, it has many drawbacks, such as the reduction of tin oxide by hydrogen generated by the reaction between zinc and hydrochloric acid, which makes it difficult to penetrate into the interior.
本発明は、このような従来の欠点を除去し、数
10μmのパターンが容易に得られ、しかも酸化錫
膜の厚みが厚い場合でも利用できる透明電極パタ
ーンの形成方法を提供するものであり、蒸着法も
しくはスパツター法を用いてガラス絶縁基板上に
アンチモンを含む錫膜を形成した後、エツチング
によつて錫膜を所定の電極パターンに形成し、し
かる後、パターニングされた錫膜を酸素プラズマ
中で酸化することを特徴としたものである。 The present invention eliminates these conventional drawbacks and reduces the number of
The present invention provides a method for forming a transparent electrode pattern in which a 10 μm pattern can be easily obtained and can be used even when the tin oxide film is thick. After forming the tin film, the tin film is etched to form a predetermined electrode pattern, and then the patterned tin film is oxidized in oxygen plasma.
なお、本発明において酸化錫中にアンチモンを
ドープするのは、最終的に得られる酸化錫膜の抵
抗を下げるためであり、具体的には錫膜を形成す
る際に、アンチモンを同時に蒸着するか、もしく
はアンチモンをドープしたスパツターで錫膜の形
成を得る。 In addition, in the present invention, the purpose of doping antimony into tin oxide is to lower the resistance of the tin oxide film finally obtained. Specifically, when forming the tin film, antimony is doped at the same time. Alternatively, a tin film can be formed using an antimony-doped sputter.
以下、本発明の一実施例について図面を参照し
て具体的に説明する。 Hereinafter, one embodiment of the present invention will be specifically described with reference to the drawings.
第2図a,b,cは本発明の各工程を示したも
のであり、まず、ガラス絶縁基板1上に、真空蒸
着あるいはアンチモンをドープしたアルゴン雰囲
気中でのスパツターでアンチモンを少量含む錫膜
5を形成し、この上に第2図aに示すようにフオ
トレジスト3を用いて所定のパターニングを行
う。次にこのようにして準備した基板1を、水と
塩酸を1:1の割合で希釈してエツチング液に浸
して錫膜5のエツチングを行つた後、不要のフオ
トレジストを除去する。(第2図b)この際に用
いるエツチング液は、エツチング速度がおおよそ
50Å/sec程度であり、この値はエツチングする
基板の枚数および、錫膜の厚みによつて影響され
るが、従来の方法来にべ良い点は、時間調整、エ
ツチング液濃度を変えることにより、むらのない
所定のパターンの錫膜が形成できることにある。
従来の方法であると、亜鉛粉との反応で発生する
水素の量は、塩酸の濃度が変化するにつれ変化し
十分に酸化錫を還元し得なくなり、酸化錫が所定
のパターン以外に残り、パターンむらができる。 Figures 2a, b, and c show each step of the present invention. First, a tin film containing a small amount of antimony is deposited on a glass insulating substrate 1 by vacuum evaporation or by sputtering in an argon atmosphere doped with antimony. 5 is formed, and a predetermined patterning is performed thereon using a photoresist 3 as shown in FIG. 2a. Next, the substrate 1 thus prepared is immersed in an etching solution diluted with water and hydrochloric acid at a ratio of 1:1 to etch the tin film 5, and then unnecessary photoresist is removed. (Figure 2b) The etching solution used at this time has an etching speed of approximately
This value is about 50 Å/sec, and this value is affected by the number of substrates to be etched and the thickness of the tin film, but the advantage over conventional methods is that by adjusting the time and changing the etching solution concentration, It is possible to form a tin film with a predetermined pattern without unevenness.
In the conventional method, the amount of hydrogen generated by the reaction with zinc powder changes as the concentration of hydrochloric acid changes, making it impossible to sufficiently reduce tin oxide. It can be uneven.
次に、このようにして所定の電極パターンに形
成した錫膜5を、基板1を陽極側に設置して酸素
プラズマにより酸化し、ガラス基板1上に酸化錫
膜2を形成する。このようにし第2図cに示すよ
うな所望の電極パターンを有する酸化錫膜が形成
できる。 Next, the tin film 5 thus formed into a predetermined electrode pattern is oxidized by oxygen plasma with the substrate 1 placed on the anode side to form a tin oxide film 2 on the glass substrate 1. In this way, a tin oxide film having a desired electrode pattern as shown in FIG. 2c can be formed.
以上の説明から明らかなように、本発明は耐薬
品性の強い酸化錫をパターンニングせず錫を塩酸
でエツチングしているため、容易にしかも正確に
パターニングができる。しかも本発明は特に錫を
酸素プラズマ中で酸化するようにしているため、
低抵抗で膜厚1000〜2000Å程度の厚い酸化錫を形
成することができ、それにより従来の方法では不
可能であつた数10μmのパターンおよび膜厚1000
Å以上の酸化錫膜の形成も可能という非常に優れ
た効果が得られるものである。 As is clear from the above description, since the present invention etches tin with hydrochloric acid without patterning tin oxide, which has strong chemical resistance, patterning can be easily and accurately performed. Moreover, since the present invention specifically oxidizes tin in oxygen plasma,
It is possible to form a thick tin oxide film with a thickness of about 1000 to 2000 Å with low resistance, which makes it possible to form patterns of several tens of μm and a film thickness of 1000 Å, which was impossible with conventional methods.
A very excellent effect can be obtained in that it is possible to form a tin oxide film with a thickness of Å or more.
第1図a,b,c,dは透明電極パターンの形
成方法の従来例の各工程を示す断面図、第2図
a,b,cは本発明の各工程を示す断面図であ
る。
1……ガラス絶縁基板、2……酸化錫膜、3…
…フオトレジスト、5……錫膜。
FIGS. 1A, 1B, 1D, and 1D are sectional views showing each step of a conventional method for forming a transparent electrode pattern, and FIGS. 2A, 2B, and 2C are sectional views showing each step of the present invention. 1...Glass insulating substrate, 2...Tin oxide film, 3...
...Photoresist, 5...Tin film.
Claims (1)
絶縁基板上にアンチモンを含む錫膜を形成した
後、エツチングにより前記錫膜を所定の電極パタ
ーンに形成し、しかる後、この錫膜を酸素プラズ
マ中で酸化して、酸化錫に転換することを特徴と
する透明電極パターンの形成方法。1 After forming a tin film containing antimony on a glass insulating substrate using a vapor deposition method or a sputtering method, the tin film is formed into a predetermined electrode pattern by etching, and then this tin film is oxidized in oxygen plasma. A method for forming a transparent electrode pattern, characterized by converting the tin oxide into tin oxide.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56095842A JPS57209852A (en) | 1981-06-19 | 1981-06-19 | Method for forming transparent electrode pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56095842A JPS57209852A (en) | 1981-06-19 | 1981-06-19 | Method for forming transparent electrode pattern |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57209852A JPS57209852A (en) | 1982-12-23 |
| JPS6251904B2 true JPS6251904B2 (en) | 1987-11-02 |
Family
ID=14148624
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56095842A Granted JPS57209852A (en) | 1981-06-19 | 1981-06-19 | Method for forming transparent electrode pattern |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57209852A (en) |
-
1981
- 1981-06-19 JP JP56095842A patent/JPS57209852A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57209852A (en) | 1982-12-23 |
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