JPS6253933B2 - - Google Patents
Info
- Publication number
- JPS6253933B2 JPS6253933B2 JP12703378A JP12703378A JPS6253933B2 JP S6253933 B2 JPS6253933 B2 JP S6253933B2 JP 12703378 A JP12703378 A JP 12703378A JP 12703378 A JP12703378 A JP 12703378A JP S6253933 B2 JPS6253933 B2 JP S6253933B2
- Authority
- JP
- Japan
- Prior art keywords
- growth
- substrate
- gas
- gas supply
- crystal growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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- Crystals, And After-Treatments Of Crystals (AREA)
- Semiconductor Lasers (AREA)
Description
【発明の詳細な説明】
この発明は2元素成分以上の半導体結晶を気相
法で成長させる半導体結晶成長装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor crystal growth apparatus for growing semiconductor crystals having two or more elemental components by a vapor phase method.
半導体結晶の成長方法の一つである気相法はSi
については既に一般によく用いられている。 The vapor phase method, which is one of the methods for growing semiconductor crystals, uses Si
is already commonly used.
Si気相エピタキシヤル成長装置の一断面例を第
1図に示す。第1図でSi基板1は傾斜させた基板
設定板2上におかれ、石英管3内に設定されてい
る。結晶成長させるために、高周波を用いて基板
設定板2を昇温し、基板1を所定温度に制御す
る。図示していないが、成長用原料ガス、例えば
SiCl4は水素をキヤリアガスとして第1図の左側
(矢印4側)からSi基板1上に供給される。Si基
板は所望温度に加熱されているので、Si基板上に
Siが析出する。成長層の電気伝導度やその伝導形
を制御するためには、予め所定濃度の不純物ガ
ス、例えばPH3やB2H6等をSiCl4ガス中に先に混
合しておいてから、その混合ガスをSi基板1上に
供給することで行なわれている。この方法で第2
図に成長層の断面を示したようにSi基板5上に所
望電気伝導度の成長層Si6を成長させることがで
きる。 FIG. 1 shows an example of a cross section of a Si vapor phase epitaxial growth apparatus. In FIG. 1, a Si substrate 1 is placed on an inclined substrate setting plate 2 and set inside a quartz tube 3. In order to grow the crystal, the temperature of the substrate setting plate 2 is increased using high frequency, and the temperature of the substrate 1 is controlled to a predetermined temperature. Although not shown, growth source gas, e.g.
SiCl 4 is supplied onto the Si substrate 1 from the left side (arrow 4 side) in FIG. 1 using hydrogen as a carrier gas. Since the Si substrate is heated to the desired temperature,
Si precipitates. In order to control the electrical conductivity and conductivity type of the grown layer, an impurity gas such as PH 3 or B 2 H 6 is mixed in advance into the SiCl 4 gas at a predetermined concentration, and then the mixture is This is done by supplying gas onto the Si substrate 1. In this way the second
As shown in the cross section of the grown layer, a grown layer Si6 having a desired electrical conductivity can be grown on the Si substrate 5.
かかる場合において、基板5の不純物濃度が高
くて成長層6の不純物濃度が低い場合には、いわ
ゆるオートドーピングやその影響に寄与する停帯
層が存在するために、基板5と成長層6との界面
で急峻な濃度プロフアイルの結晶が得られ難い。
さらに、成長層6の伝導形をかえて成長層6の数
を増やした場合、供給ガスの切換場所から、基板
までの容積が大きいために、そのガス置換に時間
がかかり、成長層6で急峻な伝導形の変化が実現
されない欠点がある。 In such a case, if the impurity concentration of the substrate 5 is high and the impurity concentration of the growth layer 6 is low, there is a stop layer that contributes to so-called autodoping and its effects, so that the relationship between the substrate 5 and the growth layer 6 is low. It is difficult to obtain crystals with a steep concentration profile at the interface.
Furthermore, when the conductivity type of the growth layer 6 is changed to increase the number of growth layers 6, since the volume from the place where the supply gas is switched to the substrate is large, it takes time to replace the gas, and the growth layer 6 has a steep slope. The disadvantage is that a significant change in conduction type cannot be realized.
本発明はかかる欠点に鑑みてなされたもので、
成長用ガス供給部を基板に近接開口して設けるこ
とにより、またさらに該成長用ガス供給部に近接
してエツチング用ガス供給部又は掃気用ガス供給
部の少なくともいずれか一方を設けることによ
り、上記従来装置における濃度変化,伝導形変化
が小さいという欠点を除去し、最近急速に必要と
なつてきている―族化合物半導体結晶やその
混晶等にも有用に適用できる半導体結晶成長装置
を提供することを目的としている。 The present invention has been made in view of these drawbacks.
By providing a growth gas supply section with an opening close to the substrate, and further providing at least one of an etching gas supply section or a scavenging gas supply section close to the growth gas supply section, the above-mentioned method can be achieved. To provide a semiconductor crystal growth apparatus which eliminates the drawbacks of small concentration changes and conductivity type changes in conventional apparatuses, and which can be usefully applied to - group compound semiconductor crystals and their mixed crystals, etc., which have recently been rapidly becoming necessary. It is an object.
この発明の一実施例を第3図に沿つて説明す
る。 An embodiment of this invention will be described with reference to FIG.
第3図aは成長装置の概略断面図で、第3図b
は第3図aのAA′の断面図であり、ガス供給シス
テムや基板加熱用電源は図示されていない。 Figure 3a is a schematic cross-sectional view of the growth apparatus, and Figure 3b is a schematic cross-sectional view of the growth apparatus.
is a cross-sectional view taken along line AA' in FIG. 3a, and the gas supply system and substrate heating power source are not shown.
―族化合物半導体結晶の一つであるInPを
気相成長させるものを例にとつて実施例を説明す
る。 An example will be described using as an example a method in which InP, which is one of the - group compound semiconductor crystals, is grown in a vapor phase.
第3図aに於て、7はInP基板、8は基板設定
加熱板で回転可能であり、9は加熱用高周波コイ
ルで、そのリード線10は加熱用電源に導通して
いる。12は4本の成長用ガス供給管で、これら
は各々上記基板7に近接して開口し、該基板7の
真上に各成長用ガスを供給するためのものであ
る。11,13は各々上記成長用ガス供給管12
に近接して設けられたエツチング用ガス供給管,
掃気用ガス供給管、14はガス排出口である。実
際に結晶を成長させる場合には次のようにして行
なわれる。予め処理を行なつたInP基板7を第3
図aのように設定する。所望の雰囲気ガス中で所
定温度に昇温する。このときInP基板7よりPが
蒸発していくのを防ぐためにPH3を流しておく。
結晶成長前にガス供給管13より基板エツチング
用ガスを基板7上に供給してInP基板7表面を清
浄化する。次に掃気用ガスである水素ガスをガス
供給管11より供給しエツチング用ガスを除去す
る。除去後直ちに水素ガスを停止し、ガス供給管
12(4本ある)の1つより所定分圧の例えばIn
(C2H5)3を、その他の一つより所定分圧のPH3を
InP基板7上に供給する。所定時間ガスを供給す
ることにより、所望の成長層膜厚が得られる。こ
こで、上記In(C2H5)3とPH3とは、互いに反応可
能な物質であるものの、上記の如く構成されてい
る半導体結晶装置では結晶成長用のガス供給管1
2の開口部が上記基板7に近接して設けられてい
るので、上記In(C2H5)3とPH3とが基板7に到達
する以前に互いに反応し望ましくない物質を生成
することは、ほとんどない。成長を停止するとき
には、成長用ガスの供給を停止すると同時に管1
1より水素ガスを供給し、InP基板7上に残留し
ている成長用ガスを除去し、かつ温度を下げる。 In FIG. 3a, 7 is an InP substrate, 8 is a substrate setting heating plate which is rotatable, and 9 is a heating high frequency coil, the lead wire 10 of which is connected to a heating power source. Reference numeral 12 designates four growth gas supply pipes, each of which opens close to the substrate 7 to supply each growth gas directly above the substrate 7. 11 and 13 are the growth gas supply pipes 12, respectively.
an etching gas supply pipe installed close to the
The scavenging gas supply pipe 14 is a gas discharge port. When actually growing a crystal, it is performed as follows. The pre-treated InP substrate 7 is placed in the third
Set as shown in Figure a. The temperature is raised to a predetermined temperature in a desired atmospheric gas. At this time, PH 3 is poured to prevent P from evaporating from the InP substrate 7.
Before crystal growth, a substrate etching gas is supplied onto the substrate 7 from the gas supply pipe 13 to clean the surface of the InP substrate 7. Next, hydrogen gas, which is a scavenging gas, is supplied from the gas supply pipe 11 to remove the etching gas. Immediately after the removal, the hydrogen gas is stopped, and a predetermined partial pressure of, for example, In
(C 2 H 5 ) 3 at a predetermined partial pressure of PH 3 from the other one.
It is supplied onto the InP substrate 7. By supplying gas for a predetermined period of time, a desired thickness of the grown layer can be obtained. Here, although In(C 2 H 5 ) 3 and PH 3 are substances that can react with each other, in the semiconductor crystal device configured as described above, the gas supply pipe 1 for crystal growth is
Since the opening 2 is provided close to the substrate 7, it is possible to prevent the In(C 2 H 5 ) 3 and PH 3 from reacting with each other and producing undesirable substances before reaching the substrate 7. ,rare. When stopping growth, the supply of growth gas is stopped and at the same time the tube 1 is
1, hydrogen gas is supplied to remove the growth gas remaining on the InP substrate 7, and the temperature is lowered.
このようにしてInP基板7上にInPを成長させ
ることができる。尚、均一な成長層を得るために
InP基板7を基板設定加熱板8により回転させて
おく。成長層への不純物の添加が必要なときに
は、ガス供給管12のその他の一つを使用して不
純物のドーピングを行なうことができる。 In this way, InP can be grown on the InP substrate 7. In addition, in order to obtain a uniform growth layer,
The InP substrate 7 is rotated by the substrate setting heating plate 8. When it is necessary to add impurities to the growth layer, the other one of the gas supply pipes 12 can be used to dope the impurities.
ガス供給管12の独立な4つのそれぞれに例え
ば所定分圧のIn(C2H5)3,Ga(C2H5)3,AsH3,
PH3をInP基板7上に供給することによつて所定
組成の4元化合物半導体結晶InxGa1―xAs1―yPy
を成長させることができる。この場合特に組成を
階段状にかえてかつ2層以上成長させるためには
これら供給成分ガスの分圧比を階段状にかえて、
基板7上に供給しなければならない。 For example, a predetermined partial pressure of In(C 2 H 5 ) 3 , Ga(C 2 H 5 ) 3 , AsH 3 ,
By supplying PH 3 onto the InP substrate 7, a quaternary compound semiconductor crystal of a predetermined composition, InxGa 1 -xAs 1 -yPy
can be grown. In this case, in particular, in order to change the composition in a stepwise manner and grow two or more layers, the partial pressure ratio of these component gases to be supplied is changed in a stepwise manner.
It must be supplied onto the substrate 7.
本装置によると、成長用ガス供給管から基板ま
での容積が小さく、かつ残留ガス除去用のガス供
給管が近接して具備してあるために、成長用のガ
スと残留ガス除去用ガスを所望の流速,時間に設
定することにより、成長層の組成をかえて階段状
に成長させることができる。尚、成長層の組成を
階段状に制御できれば組成を徐々にかえて成長で
きることは自明である。またこの4元化合物で不
純物のドーピングを行なうにはガス供給管を独立
なガス供給管として必要な数、すなわち1ケか2
ケ増やすことによつて容易に行なえる。また、ガ
ス供給管11〜13は管状でなくても、ガス供給
通路を有するガス供給部分であればよい。 According to this device, the volume from the growth gas supply pipe to the substrate is small, and the gas supply pipe for residual gas removal is provided in close proximity, so that the growth gas and the residual gas removal gas can be mixed as desired. By setting the flow rate and time, it is possible to change the composition of the growth layer and grow it in a stepwise manner. It is obvious that if the composition of the growth layer can be controlled stepwise, growth can be achieved by gradually changing the composition. In addition, in order to dope impurities with this quaternary compound, the number of gas supply pipes required as independent gas supply pipes, that is, 1 or 2.
This can be easily done by increasing the number of Moreover, the gas supply pipes 11 to 13 do not have to be tubular, but may be any gas supply portion having a gas supply passage.
以上の説明から明らかなように、この発明によ
れば、成長用ガス供給部を基板に近接して設けた
ので、互いに反応可能な複数種類の結晶成長用ガ
スを上記成長用ガス供給部から供給しても上記基
板に到達する前に上記結晶成長用ガスが互いに反
応してしまうことを防止し、品質の良い成長結晶
が行られるという効果がある。 As is clear from the above description, according to the present invention, since the growth gas supply section is provided close to the substrate, a plurality of types of crystal growth gases that can react with each other are supplied from the growth gas supply section. Even if the crystal growth gas is used, it is possible to prevent the crystal growth gases from reacting with each other before reaching the substrate, resulting in a high-quality grown crystal.
第1図は従来のSi気相成長装置の断面図、第2
図は第1図装置によるSi成長層の断面図、第3図
はこの発明による気相成長装置の一実施例を示す
断面図である。
図中、7はInP基板、8は基板設定加熱板、9
は加熱用高周波コイル、11〜13はガス供給管
を示す。
Figure 1 is a cross-sectional view of a conventional Si vapor phase growth apparatus, Figure 2
The figure is a cross-sectional view of a Si grown layer using the apparatus shown in FIG. 1, and FIG. 3 is a cross-sectional view showing an embodiment of the vapor phase growth apparatus according to the present invention. In the figure, 7 is an InP substrate, 8 is a substrate setting heating plate, 9
1 is a heating high-frequency coil, and 11 to 13 are gas supply pipes.
Claims (1)
る半導体結晶成長装置において、各々加熱板上の
成長用基板に近接して開口し、成長元素もしくは
その組成物質からなり、互いに反応可能な複数種
類の結晶成長用ガスをキヤリアガスによつて上記
成長用基板の真上に各々独立に供給する複数の結
晶成長用ガス供給部を備えたことを特徴とする半
導体結晶成長装置。1. In a semiconductor crystal growth apparatus for vapor-phase growth of semiconductor crystals having two or more elemental components, each opening is adjacent to a growth substrate on a heating plate, and a plurality of types of growth elements or their compositions are capable of reacting with each other. A semiconductor crystal growth apparatus comprising a plurality of crystal growth gas supply units each independently supplying a crystal growth gas directly above the growth substrate using a carrier gas.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12703378A JPS5553414A (en) | 1978-10-16 | 1978-10-16 | Semiconductor crystal growing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12703378A JPS5553414A (en) | 1978-10-16 | 1978-10-16 | Semiconductor crystal growing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5553414A JPS5553414A (en) | 1980-04-18 |
| JPS6253933B2 true JPS6253933B2 (en) | 1987-11-12 |
Family
ID=14949991
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12703378A Granted JPS5553414A (en) | 1978-10-16 | 1978-10-16 | Semiconductor crystal growing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5553414A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0795546B2 (en) * | 1989-03-31 | 1995-10-11 | 工業技術院長 | Silicon surface treatment method |
-
1978
- 1978-10-16 JP JP12703378A patent/JPS5553414A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5553414A (en) | 1980-04-18 |
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