JPS632483B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an automatic resonant frequency adjuster for a dielectric coaxial resonator (hereinafter referred to as a coaxial resonator).

Conventionally, a coaxial resonator 1, for example a TEM resonator, has a ceramic dielectric 2 as shown in FIGS.
The outer and inner circumferential surfaces of the thick-walled ring, and in some cases, one end surface perpendicular to the axial direction of the thick-walled ring, are baked with silver or copper plated to form the outer and inner conductors 3, 3. is formed and manufactured.

By the way, the resonant frequency of the coaxial resonator 1 is
It varies depending on the axial dimension of the ceramic dielectric 2 and the dielectric constant of the ceramic dielectric 2. However,
In manufacturing the above coaxial resonator 1, variations in the axial dimension of the ceramic dielectric 2 and variations in the dielectric constant of the ceramic dielectric 2 cannot be avoided. Therefore, conventionally, the resonant frequency of the coaxial resonator 1 has been adjusted by the following method.

That is, after measuring the resonant frequency of the coaxial resonator 1 by the frequency measuring means, the resonant frequency of the coaxial resonator 1 is measured.
What is the manual process of polishing the end face 1a of the coaxial resonator 1 according to the target value so that the resonant frequency reaches the target value, then measuring the resonant frequency of the coaxial resonator 1 again, and polishing the end face 1a? I've done it over and over again.

However, such polishing and frequency measurement work of the coaxial resonator 1 is performed through repeated and tedious manual operations, which is time-consuming and increases production costs. There is a problem.

Further, since the end face 1a of the coaxial resonator 1 is ground based on the assumption as described above, there is also the problem that the end face 1a is polished too much, resulting in a coaxial resonator having a frequency higher than the target frequency.

Therefore, the present invention was made to solve the above problems, and it is possible to automatically adjust the frequency of the coaxial resonator to a target frequency, reduce manufacturing costs, and improve product quality. The purpose is to provide an automatic resonance frequency adjustment machine that can improve and equalize quality.

Therefore, the automatic resonant frequency adjustment machine according to the present invention checks the coaxial resonator at a certain position, rotates it at a certain angle, stops the open end surface of the coaxial resonator at the polishing/measurement position, and then checks the coaxial resonator at a certain angle. a rotary feeding device that rotates and carries out the coaxial resonator; a processing machine that has a frequency measuring means and a polishing machine and selectively moves the frequency measuring means or the polishing machine to the polishing/measurement position; In response to the output of the measuring means and the output representing the rotation of the polishing machine, the frequency measuring means of the processing machine or the polishing machine is selectively moved to the polishing/measurement position, and the rotation speed of the polishing machine is controlled. and a control device that outputs a signal, and by operating the processing machine with the output of the control device, the polishing machine is driven to rotate at a constant rotation speed with respect to a coaxial resonator stopped at a polishing/measurement position. The end face of the coaxial resonator is polished by a controller, and the rate of change in frequency with respect to the rotational speed is calculated in a control device based on the output of the frequency measuring means and a signal representing the rotational speed of the polishing machine, and based on the rate of change. to calculate a rotation speed corresponding to a pre-stage frequency that is less than the target frequency, and after rotating the polishing machine at a predetermined number of rotations using a signal representing the rotation speed, causing the frequency measurement means to measure the frequency of the coaxial resonator; Comparing the measured frequency output from the frequency measuring means with the preceding frequency, calculating a corrected change rate of the frequency with respect to the rotational speed based on a signal representing the deviation between the two frequencies, and expressing the corrected change rate. Based on the signal, a signal representing the rotation speed of the polishing machine is created in order to obtain the target frequency, and the signal is output to the processing machine to automatically obtain the coaxial resonator having the target frequency. .

The present invention will be specifically described below based on illustrated embodiments.

In FIGS. 3 and 4, 6 is a material supply device, 7 is a rotary table as a rotary feed device, 8 is a processing machine, 9 is a good product storage member, 10 is a defective product storage member,
11 is a control device.

The material supply device 6 is fixed to the upper end of the support stand 12 and includes a hopper 13 and a carry-in rotor 14. The hopper 13 has an outlet narrowed so that the large number of coaxial resonators 1 put into the hopper 13 are supplied to the carry-in rotor 14 one by one. The carry-in rotor 14 has a large number of coaxial resonator insertion grooves 14a, . . . , 1 along the axial direction near the outer periphery.
4a, and one coaxial resonator 1 is inserted from the hopper 13 at the upper end position of the groove 14a.
is inserted into the groove 14a, while the groove 14a is inserted into the groove 14a.
The coaxial resonator 1 is inserted into the groove 14a by the operation of a drive cylinder (not shown) from the back side into a chuck member at the tip of the arm (described later) of the rotary table 7 located in front of the supply device 6 at the lower end position of the rotary table 7. I have to.

The rotary table 7 is formed by rotatably supporting a cross member consisting of four arm portions 7a, . . . , 7a arranged at 90° intervals on a support stand 12. A chuck member 1 is provided at the tip of each arm portion 7a.
5 is provided, and by opening and closing the chuck member 15 as the cylinder 22 is driven, the outer peripheral surface of the coaxial resonator 1 is polished and measured (hereinafter referred to as
The coaxial resonator 1 is chucked or carried out with the end surface (abbreviated as "end face") 1a protruding toward the processing machine. The chuck member 15 is
As shown in FIG. 4, the cylinder 16 is driven to move back and forth in the axial direction of the coaxial resonator 1, and the end face of the coaxial resonator 1 comes into contact with a polishing machine 20, which will be described later.
A can be polished. Each arm 7 above
a rotates around the rotation axis 17 by about 90 degrees,
In FIG. 3, the rotary shaft 17 is stopped at an upper carry-in position A, a left and right polishing/measuring position B, a lower good product carry-out position C, and a left defective product carry-out position D.

The processing device 8 is disposed substantially behind the polishing/measuring position B of the arm 7a of the rotary table 7, and the frequency measuring means 1 is arranged in a straight line in the vertical direction from above.
8. Provide the brush 19 and the polishing plate 20a of the polisher 20, and use the rotary table 7 to polish and measure position B.
With respect to the end face 1a of the coaxial resonator 1 located at I have to.

The frequency measuring means 18 is configured such that a measuring chuck (not shown) approaches the coaxial resonator 1 and measures the resonant frequency of the coaxial resonator 1. The polishing machine 20 is configured to polish the end surface 1a of the coaxial resonator 1 by rotating a polishing plate 20a. The brush 19 removes shavings, dust, etc. adhering to the end surface 1a of the coaxial resonator 1 polished by the polisher 20 when the processing machine 8 descends.

Further, the good product storage member 9 is provided at a good product carry-out position C of the arm 7a of the rotary table 7,
A large number of coaxial resonator housing grooves 9a,..., near the outer periphery.
The coaxial resonator 1, which is a rotatable cylindrical body having a diameter 9a, is polished by a processing machine 8, and after the frequency has been measured, the chuck member 15 is opened, and the coaxial resonator 1, which has reached the target frequency, is opened in its respective storage grooves. The non-defective product storage member 9 is rotated to sequentially store the non-defective products in the storage member 9a.

On the other hand, the defective product storage box 10 is provided at the defective product carry-out position D of the arm 7a of the rotary table 7,
Of the coaxial resonator 1 that was polished and frequency measured,
Defective coaxial resonators 1' that did not reach the target frequency are carried out from the chuck member 15 and stored.

Further, the control device 11 is composed of a microcomputer, and by operating the processing machine 8 based on the output of the control device 11, the coaxial resonator 1, which is stopped at the polishing/measurement position B, is
The coaxial resonator 1 is rotated at a constant rotation speed.
The end face 1a of the blade is polished. Then, a rate of change in frequency with respect to the number of rotations is calculated based on the output of the frequency measuring means 18 and a signal representing the number of rotations of the polishing machine 20, and based on the rate of change, a response is made to a pre-stage frequency that is less than the target frequency. The polishing machine 20 is rotated at a predetermined number of revolutions using a signal representing the number of revolutions. Thereafter, the frequency of the coaxial resonator 1 is measured by the frequency measuring means 18, and the actual measured frequency outputted from the frequency measuring means 18 is compared with the preceding frequency, and based on the signal representing the deviation between the two frequencies. , calculate the corrected rate of change of frequency with respect to rotational speed. and,
Based on the signal representing the corrected rate of change, a signal representing the rotation speed of the polishing machine 20 is created to obtain the target frequency, and is output to the processing machine 8 to automatically convert the coaxial resonator 1 having the target frequency. I'm trying to get it.

Next, the operation of the automatic adjuster according to the above configuration will be explained.

First, the coaxial resonator 1 inserted into the hopper 13
is carried to the carry-in position A by the rotation of the carry-in rotor 14, and the coaxial resonator 1 is chucked to the chuck member 15 of the arm 7a of the rotary table 7 located at the carry-in position A. In this state, the polished/measured end face 1a of the coaxial resonator 1 is not coated with silver.
protrudes from the chuck member 15 toward the support stand, that is, toward the processing machine. Then, the arm 7a of the rotary table 7 is rotated 90 degrees around the hour hand in FIG. 3, and the chucked coaxial resonator 1 is stopped at the polishing/measurement position B.

Next, the processing machine 8 is raised by driving the drive cylinder 21 so that the polishing plate 20a of the polishing machine 20 faces the coaxial resonator 1 (see FIG. 4), and the cylinder provided at the tip of the arm 16, the coaxial resonator 1 is moved backward toward the processing machine together with the chuck member 15, and the end surface 1a of the coaxial resonator 1 is slightly polished to surface it. this is,
When hand-painting the silver that forms the conductor of the coaxial resonator 1 onto the ceramic dielectric 2 (see Figure 2), the coaxial resonator 1 may be coated with silver in excess or due to manufacturing errors in the ceramic dielectric 2. This is because the end surface 1a of 1 does not form a completely flat surface.

Next, the processing machine 8 is lowered by the drive cylinder 21, and the end face 1a of the coaxial resonator 1 is cleaned by the brush 19, and then the initial frequency of the coaxial resonator 1 is measured by the frequency measuring means 18 (as indicated by the dashed line in FIG. 3). ). Then, the processing machine 8 is raised by the drive cylinder 21, and the end face 1a of the coaxial resonator 1 is again polished by rotating the polishing plate 20a by a constant rotation speed _n1 (as shown by the solid line in FIG. 3). Then, the processing machine 8 is lowered again and the frequency is measured by the frequency measuring means 18 of the coaxial resonator 1 to obtain the frequency change f ₁ corresponding to the constant rotation speed n ₁ . Next, the change f ₁ in the output of the frequency measuring means 18 and the rotation speed of the polishing machine 20 are determined.
Based on the signal representing n ₁ , the rate of change (f ₁ /n ₁ ) of frequency f ₁ with respect to the rotational speed n ₁ is determined. The rate of change is the slope of the straight line shown as a solid line in FIG. Based on this rate of change, the number of rotations of the polishing machine 20 from the frequency f ₁ to the target frequency f ₂ (n ₂ - n ₁ ) [=
(f ₂ /f ₁ n ₁ − n ₁ )]. Therefore, in order to obtain the target frequency f ₂ , the coaxial resonator 1 may be polished by rotating the polishing machine 20 by the number of rotations (n ₂ - n ₁ ), but due to the error in the rate of change described above, In order to prevent the frequency of the coaxial resonator 1 from exceeding the target frequency f ₂ due to not being able to obtain the target frequency or due to excessive cutting of the coaxial resonator 1, it corresponds to the pre-stage frequency f ₃ that is less than the target frequency f ₂ . After calculating _{the number of rotations (n 3 - n 1 ) to} The frequency of the coaxial resonator 1 is measured by the measuring device 18 . As a result, if the frequency f ₃ is obtained corresponding to the number of rotations (n ₃ - _{n 1} ), then the number of rotations n ₂ and n ₃
If the coaxial resonator 1 is polished by rotating the polishing machine 20 by (n ₂ - _{n 3} ) corresponding to the difference between the target frequency and
A coaxial resonator 1 of f ₂ is obtained. However _, if _{an actually measured frequency f 4 is} obtained as shown by the two-dot chain line in FIG _. Based on the signal representing the number of rotations of the polishing machine 20, the corrected frequency change rate (f ₄ −f ₁ )/(n ₃ −n ₁ ) is calculated. The corrected rate of change is represented by the slope of the straight line shown by the two-dot chain line in FIG. This corrected rate of change (D=
Based on the signal representing f ₄ − f ₁ /n ₃ − n ₁ ), the number of rotations of the polishing machine 20 to obtain the target frequency f ₂ (n ₄ − n ₃ )=
Calculate 1/D(f ₂ - f ₄ )=f ₂ - f ₄ /f ₄ - f ₁ (n ₃ - n ₁ ). Then, the coaxial resonator 1 is polished by rotating the polishing machine 20 by the number of revolutions (n ₄ -n ₃ ), thereby obtaining the coaxial resonator 1 having the target frequency f ₂ . The coaxial resonator 1 with this target frequency f ₂ moves the rotary table 7 to the third
The arm 7a is rotated 90 degrees clockwise in the figure, the chuck member 15 is opened at the non-defective product delivery position C, and the product is transported into the non-defective storage member 9.

In addition, in the event that the frequency of the coaxial resonator 1 is _less than the target frequency f2 despite the control operation by the control device 11, the coaxial resonator 1 is
If the non-defective products cannot be carried out at the non-defective delivery position C, they are carried out from the chuck member 15 at the defective product delivery position D, which is further rotated by 90° clockwise in FIG.

Note that the present invention is not limited to this embodiment, and can be implemented in various other embodiments. For example, the number of arms 7a of the rotary table 7 is not limited to four at 90° intervals, but any number of arms 7a may be provided at any interval. Furthermore, the movement of the processing machine 8 is not limited to vertical movement, but may also be made to rotate around one point to achieve the same effect.

As is clear from the above description, according to the present invention, after checking the coaxial resonator at a fixed position, the open end face of the coaxial resonator is stopped at the polishing/measurement position by rotating at a fixed angle, and then at a fixed angle a rotary feeding device that rotates and carries out the coaxial resonator; a processing machine that has a frequency measuring means and a polishing machine and selectively moves the frequency measuring means or the polishing machine to the polishing/measurement position; In response to the output of the measuring means and the output representing the rotation of the polishing machine, the frequency measuring means of the processing machine or the polishing machine is selectively moved to the polishing/measurement position, and the rotation speed of the polishing machine is controlled. and a control device that outputs a signal, and by operating the processing machine with the output of the control device, the polishing machine is driven to rotate at a constant number of revolutions with respect to a coaxial resonator stopped at a polishing/measurement position. The end face of the coaxial resonator is polished, and a control device calculates the rate of change in frequency with respect to the number of rotations based on the output of the frequency measuring means and a signal representing the number of rotations of the polishing machine, and calculates the rate of change in frequency with respect to the number of rotations based on the rate of change. After calculating the rotation speed corresponding to the pre-stage frequency that is lower than the target frequency and rotating the polishing machine at a predetermined rotation speed using a signal representing the rotation speed, the frequency of the coaxial resonator is measured by the frequency measuring means, and the frequency of the coaxial resonator is measured by the frequency measuring means. Compare the actual measured frequency output from the frequency measuring means with the preceding frequency, calculate a corrected change rate of the frequency with respect to the rotational speed based on a signal representing the deviation between the two frequencies, and a signal representing the corrected change rate. Based on this, a signal representing the rotation speed of the polishing machine is created to obtain the target frequency, and is output to the processing machine to automatically obtain a coaxial resonator with the target frequency, reducing manufacturing costs. In addition to being able to aim for
Product quality can be improved and uniformed.

[Brief explanation of the drawing]

1 and 2 are a perspective view and a cross-sectional view showing a coaxial resonator, respectively, FIGS. 3 and 4 are a schematic front view and a side view of an automatic adjustment machine according to an embodiment of the present invention, and FIG. 5 is a polishing machine. FIG. 3 is a diagram showing the rate of change of the resonant frequency of the coaxial resonator with respect to the rotation speed of the coaxial resonator. DESCRIPTION OF SYMBOLS 1... Coaxial resonator, 1a... End face, 7... Rotating table, 8... Processing machine, 11... Control device, 15... Chack member, 18... Frequency measuring means, 20... Polishing machine,
A... Carrying-in position, B... Polishing/measuring position, C... Good product carrying-out position, D... Defective product carrying-out position.

Claims (1)

[Claims] 1. An automatic resonant frequency adjustment machine for a coaxial resonator that polishes the open end face of a dielectric coaxial resonator to adjust it to a target resonant frequency, and after checking the coaxial resonator at a certain position,
The frequency measuring means comprises: a rotation feeding device which rotates at a certain angle and stops at a polishing/measuring position of the coaxial resonator, and further rotates at a certain angle to carry out the coaxial resonator, a frequency measuring means and a polishing machine; or a processing machine for selectively moving the polishing machine to the polishing/measurement position; In order to control the number of rotations, the end face of the coaxial resonator is polished by driving the polisher at a constant number of rotations, and the rate of change in frequency with respect to the number of rotations is determined by combining the output of the frequency measuring means with the number of rotations of the polisher. After calculating the number of revolutions corresponding to the previous stage frequency that is less than the target frequency based on the rate of change and rotating the polishing machine at a predetermined number of revolutions using the signal representing the number of revolutions, The frequency of the coaxial resonator is measured by the frequency measuring means, and the actual measured frequency outputted from the frequency measuring means is compared with the above-mentioned pre-stage frequency. A coaxial resonator characterized by comprising a control device that calculates a corrected rate of change of and generates and outputs a signal representing the rotational speed of a polishing machine to obtain a target frequency based on a signal representing the corrected rate of change. Resonant frequency automatic adjustment machine.