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JPS6333101B2 - - Google Patents
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JPS6333101B2 - - Google Patents

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Publication number
JPS6333101B2
JPS6333101B2 JP61251056A JP25105686A JPS6333101B2 JP S6333101 B2 JPS6333101 B2 JP S6333101B2 JP 61251056 A JP61251056 A JP 61251056A JP 25105686 A JP25105686 A JP 25105686A JP S6333101 B2 JPS6333101 B2 JP S6333101B2
Authority
JP
Japan
Prior art keywords
sample
sample plate
storage container
plate
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP61251056A
Other languages
Japanese (ja)
Other versions
JPS62142262A (en
Inventor
Hideaki Ida
Ryo Fujimori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP61251056A priority Critical patent/JPS62142262A/en
Publication of JPS62142262A publication Critical patent/JPS62142262A/en
Publication of JPS6333101B2 publication Critical patent/JPS6333101B2/ja
Granted legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、自動電気泳動装置において用いられ
る電気泳動用試料供給装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an electrophoresis sample supply device used in an automatic electrophoresis apparatus.

[従来の技術] 自動電気泳動装置において使用される試料皿
は、第4図に示す如く、一つの試料皿1に複数の
試料分注用凹部1aが形成されて成るものであ
り、これらに夫々異なる試料2が入れられてい
る。そして、この試料2からの水分の蒸発を防止
しつつ試料皿1を供給する試料供給装置は、例え
ば本出願人の特願昭54―57845号において発明さ
れている。即ち、その試料供給装置は、第5図に
示した如く、上部開口3aと内側の寸法が試料皿
1の外側寸法とほぼ同じであつて複数の試料皿1
を上下方向に重ね収納することが出来且つ下端部
に一つの試料皿1が通り得る大きさの前部開口3
bを有していると共に支持台4上に設置された試
料皿収納容器3と、最上位の試料皿1の上に置か
れた試料皿保護カバー5と、最下位の試料皿1を
前部開口3bを通して試料付着位置aへ移送する
ためのピストン式試料移送機構6と、使用済みの
試料皿1を収納する受け皿7とを備え、試料移送
機構6により最下位の試料皿1を前部開口3bよ
り押し出して試料付着位置Aまで移動させ、ここ
で試料塗布具8の塗布先9に試料2を付着させて
から試料塗布位置Bにおいて塗布先9に付着して
いる試料2を支持体10上に塗布し、この間に試
料移送機構6を再作動させて続いて最下位になつ
た二番目の試料皿1を試料付着位置Aまで押し出
し、この時それまで試料付着位置Aにあつた最初
の試料皿1を二番目の試料皿1の移動により押し
て受け皿7内に落下せしめ、以上の動作を順次繰
返すようにして成るものであつて、試料皿1はそ
れが試料皿収納容器3内にある間即ち試料付着位
置Aへ移動せしめられるまでの間は保護カバー5
又はすぐ上に重ねられた試料皿1によつて密封状
態が維持されこれにより試料2からの水分の蒸発
が防止されていた。
[Prior Art] As shown in FIG. 4, a sample dish used in an automatic electrophoresis apparatus is one in which a plurality of sample dispensing recesses 1a are formed in one sample dish 1. A different sample 2 is included. A sample supply device for supplying the sample dish 1 while preventing moisture from evaporating from the sample 2 has been invented, for example, in Japanese Patent Application No. 57845/1984 filed by the present applicant. That is, as shown in FIG. 5, the sample supply device has an upper opening 3a and an inner dimension that is approximately the same as an outer dimension of the sample dish 1, and a plurality of sample dishes 1.
can be stacked vertically and stored, and the front opening 3 is large enough to allow one sample dish 1 to pass through at the lower end.
b, and a sample plate storage container 3 installed on a support stand 4, a sample plate protection cover 5 placed on the uppermost sample plate 1, and a lowermost sample plate 1 placed on the front side. It is equipped with a piston-type sample transfer mechanism 6 for transferring the sample to the sample attachment position a through the opening 3b, and a receiving tray 7 for storing the used sample plate 1, and the sample transfer mechanism 6 moves the lowest sample plate 1 to the front opening. 3b and move it to the sample attachment position A, here the sample 2 is attached to the coating tip 9 of the sample applicator 8, and then at the sample coating position B, the sample 2 attached to the coating tip 9 is transferred onto the support 10. During this time, the sample transfer mechanism 6 is reactivated and the second sample plate 1, which is now at the lowest position, is pushed out to the sample attachment position A. At this time, the first sample that had been at the sample attachment position A is The plate 1 is pushed by the movement of the second sample plate 1 and falls into the receiving plate 7, and the above operation is repeated in sequence, and the sample plate 1 is moved while it is in the sample plate storage container 3. In other words, the protective cover 5 is closed until it is moved to the sample attachment position A.
Alternatively, a sealed state was maintained by the sample plate 1 stacked directly above, thereby preventing moisture from evaporating from the sample 2.

[発明が解決しようとする問題点] この試料供給装置は、上述の如く使用済みの試
料皿1を受け皿7内に落としてしまうため、再検
査等のために試料2の再利用が出来ないという欠
点があつた。又、試料付着位置Aと試料塗布位置
Bとの間に受け皿7が位置するため両位置A,B
間の距離が長くなり、その結果両位置A,B間に
おける塗布先9の移動時間が長くなつて該塗布先
9に付着した試料2が支持体10上に塗布される
までに乾燥し、測定結果に悪影響が及ぶという欠
点もあつた。
[Problems to be Solved by the Invention] This sample supply device drops the used sample plate 1 into the receiving tray 7 as described above, so the sample 2 cannot be reused for re-inspection, etc. There were flaws. In addition, since the tray 7 is located between the sample attachment position A and the sample application position B, both positions A and B
As a result, the moving time of the coating tip 9 between the two positions A and B becomes longer, and the sample 2 adhering to the coating tip 9 dries before it is coated on the support 10, making it difficult to measure. It also had the disadvantage of having a negative impact on the results.

本発明は、上記欠点に鑑みてなされたもので、
電気泳動用試料を適切に供給することができる電
気泳動用試料供給装置を提供することを目的とす
る。
The present invention has been made in view of the above drawbacks, and
An object of the present invention is to provide an electrophoresis sample supply device that can appropriately supply an electrophoresis sample.

[問題点を解決するための手段及び作用] 複数の試料を収納するための複数の凹部を有す
る試料皿と、複数の試料皿を上下方向に重ね収納
し、下端部に一つの試料皿が通り得る大きさの開
口を有する試料皿収納容器と、上記試料皿収納容
器に収納された試料皿の上部に載置された試料皿
保護カバーと、上記試料皿を上記開口を通して、
試料付着位置及び試料皿収納容器外へ移送するた
めの試料皿移送機構と、上記試料皿収納容器外へ
移送された試料皿を被う試料皿カバーとを有して
おり、試料皿の試料から水分の蒸発を防いで、試
料皿を電気泳動装置の試料付着位置及び試料皿収
納容器外へ移送することができる。
[Means and effects for solving the problem] A sample plate having a plurality of recesses for storing a plurality of samples, and a plurality of sample plates stacked vertically and stored, with one sample plate passing through the bottom end. a sample plate storage container having an opening large enough to obtain a sample plate, a sample plate protection cover placed on top of the sample plate stored in the sample plate storage container, and passing the sample plate through the opening;
It has a sample plate transfer mechanism for transferring the sample to the sample attachment position and outside the sample plate storage container, and a sample plate cover that covers the sample plate transferred to the outside of the sample plate storage container. The sample plate can be transferred to the sample attachment position of the electrophoresis apparatus and outside the sample plate storage container while preventing moisture from evaporating.

[実施例] 本発明の一実施を第1図及び第2図A,Bを参
照して説明する。
[Example] One implementation of the present invention will be described with reference to FIG. 1 and FIGS. 2A and 2B.

第4図及び第5図と同一の部材には同一符号を
付して説明する。
The same members as in FIGS. 4 and 5 will be described with the same reference numerals.

第1図において使用される試料皿1′は、第2
図A,Bに示すように、 1′はその頂面の前縁側部分に複数の試料分注
用凹部1′aが形成され且つ後縁部分に傾斜部
1′bが形成されていると共にその底面の後縁部
分に後述の試料皿送りレレバーの上端が係合し得
る左右一対の係合穴1′が形成されている試料皿、
3′は基本的構造が従来の試料皿収納容器3と同
じであるが更にその下端部に一つの試料皿1′が
通り得る大きさの後部開口3′cが設けられた試
料皿収納容器、4′は基本的構造が従来の支持台
4と同じであるが更にその頂壁に後述の試料皿送
りレバー上端が貫通する前後に長い左右一対のス
ロツト4′aが設けられた支持台、5′は基本的構
造が従来の試料皿保護カバー5と同じであるが更
にその底面の後縁側部分に後述の試料皿送りレバ
ーの上端が係合し得る左右一対の係合穴5′aが
形成されている試料皿保護カバーである。11は
試料皿収納容器3′の後方近傍において支持台
4′上に取り外し可能に固定されていると共にそ
の下端部に一つの試料皿1′が通り得る大きさの
孔11aが設けられた固定部材、12は後方に延
出するようにして固定部材11に固定された水平
支持棒、13は支持棒12に一定の範囲内で上下
動可能に装架されていると共にその底面の位置
(支持台4′の頂面からの高さH′)が支持台4上
に置かれた試料皿1′の頂面の位置(試料皿1′の
厚さH)よりも通常は低くなつており且つ後方に
向つて直列している複数個の試料皿カバーであ
る。14は支持台4′の底壁上に固定された支持
部材、15は支持部材14に上下動可能に取付け
られた鉛直支軸、16は鉛直支軸15の上端に固
着された上側レバー、17、は鉛直支軸15の下
端に固着された下側レバー、18は上側レバー1
6と支持部材14との間に介在せしめられていて
鉛直支軸15、上側レバー16、下側レバー17
全体に上方への移動習性を付与しているスプリン
グ、19は支持部材14の上端に固着されていて
鉛直支軸15、上側レバー16、下側レバー17
全体の上昇を所定の位置まで規制するストツパ
ー、20は下端20aが下側レバー17に枢着さ
れていて全体が鉛直面内にて揺動可能となつてお
り且つ上端20bが支持台4′のスロツト4′aを
貫通して試料皿1′の係合穴1′cに係合し得るよ
うになつていると共にその中央部に長手方向に長
いスロツト20cが設けられている左右一対の試
料皿送りレバー、21は図示しないモータにより
回転せしめられる円盤22の外周部の所定位置に
固着されていると共にその先端がスロツト20c
に係合している駆動ピンである。そして、円盤2
2の第1図時計方向の回転による駆動ピン21の
変位によつて、試料送りレバー20の上端20b
は、リセツト位置a(第1図点線図示位置。この
時、駆動ピン21がスプリング18の弾力に抗し
て上側レバー16を上昇規制位置からストローク
hだけ押し下げているので、試料送りレバー20
も上昇規制位置からストロークhだけ下降せしめ
られている。),前方死点位置b(第1図実線図示
位置。この時、駆動ピン21が上側レバー16か
ら外れてしまうので、試料送りレバー20はスプ
リング18の弾力によりストロークhだけ上昇し
て上昇規制位置に戻つている。)、後方死点位置c
(第1図―点鎖線図示位置。この時、駆動ピン2
1が上側レバー16をまだ押し下げていないの
で、試料送りレバー21は上昇規制位置に位置し
たままである。)を順次とるようにして揺動及び
上下動せしめられ、これが繰返されるようになつ
ている。又、試料送りレバー20の上端20bの
リセツト位置aから前方死点位置bにかけての変
位による試料皿1′の前部開口3′からの前方移動
距離は、該試料皿1′の前後幅Wよりも小さくな
ると共に試料皿1′の試料分注用凹部1′aが試料
皿収納容器3′から十分露出する程度になるよう
に設定されている。又、試料送りレバー20の上
端20bの前方死点位置bから後方死点位置cに
かけての変位による試料皿1′の後部開口3′cか
らの後方移動距離は、該試料皿1′の前後幅Wよ
りも大きくなるように設定されている。
The sample dish 1' used in FIG.
As shown in Figures A and B, 1' has a plurality of sample dispensing recesses 1'a formed on the leading edge side of its top surface, and an inclined part 1'b formed on its rear edge. A sample plate, in which a pair of left and right engagement holes 1' are formed in the rear edge of the bottom surface, into which the upper end of a sample plate feed lever (described later) can be engaged;
3' is a sample plate storage container which has the same basic structure as the conventional sample plate storage container 3, but is further provided with a rear opening 3'c at its lower end large enough to allow one sample plate 1' to pass therethrough; Reference numeral 4' denotes a support stand which has the same basic structure as the conventional support stand 4, but is further provided with a pair of long left and right slots 4'a on its top wall, through which the upper end of a sample plate feed lever (described later) passes through. ' has the same basic structure as the conventional sample plate protection cover 5, but in addition, a pair of left and right engagement holes 5'a are formed on the rear edge side of the bottom surface, into which the upper end of the sample plate feed lever, which will be described later, can be engaged. This is a protective cover for the sample pan. Reference numeral 11 denotes a fixing member that is removably fixed on the support stand 4' near the rear of the sample plate storage container 3', and has a hole 11a in its lower end that is large enough to allow one sample plate 1' to pass through. , 12 is a horizontal support rod fixed to the fixed member 11 so as to extend rearward, and 13 is mounted on the support rod 12 so as to be movable up and down within a certain range. 4' from the top surface is usually lower than the position of the top surface of the sample plate 1' placed on the support stand 4 (thickness H of the sample plate 1'), and A plurality of sample pan covers are arranged in series facing toward the front. 14 is a support member fixed on the bottom wall of the support base 4', 15 is a vertical support shaft attached to the support member 14 so as to be movable up and down, 16 is an upper lever fixed to the upper end of the vertical support shaft 15, 17 , is a lower lever fixed to the lower end of the vertical support shaft 15, and 18 is an upper lever 1
A vertical support shaft 15, an upper lever 16, and a lower lever 17 are interposed between the support member 14 and the support member 14.
A spring 19 that gives the whole body the ability to move upward is fixed to the upper end of the support member 14, and includes a vertical support shaft 15, an upper lever 16, and a lower lever 17.
The stopper 20, which restricts the rise of the whole to a predetermined position, has a lower end 20a pivotally connected to the lower lever 17 so that the whole can swing in a vertical plane, and an upper end 20b of the stopper 20 that is attached to the support base 4'. A pair of left and right sample plates that penetrate through the slot 4'a and can be engaged with the engagement hole 1'c of the sample plate 1', and are provided with a longitudinally long slot 20c in the center thereof. The feed lever 21 is fixed at a predetermined position on the outer periphery of a disk 22 rotated by a motor (not shown), and its tip is connected to the slot 20c.
The drive pin is engaged with the drive pin. And disk 2
The upper end 20b of the sample feed lever 20 is moved by the displacement of the drive pin 21 due to the clockwise rotation in FIG.
is the reset position a (the position shown by the dotted line in FIG.
is also lowered by a stroke h from the raising restriction position. ), front dead center position b (position shown by the solid line in Figure 1. At this time, the drive pin 21 comes off the upper lever 16, so the sample feed lever 20 moves up by the stroke h due to the elasticity of the spring 18 and reaches the rise restriction position. ), rear dead center position c
(Fig. 1 - Position shown in dotted chain line. At this time, drive pin 2
1 has not yet pushed down the upper lever 16, the sample feed lever 21 remains at the upward restriction position. ) is made to swing and move up and down in sequence, and this is repeated. Further, the forward movement distance of the sample pan 1' from the front opening 3' due to the displacement of the upper end 20b of the sample feed lever 20 from the reset position a to the front dead center position b is determined by the front-to-back width W of the sample pan 1'. The sample dispensing recess 1'a of the sample dish 1' is also set to be sufficiently exposed from the sample dish storage container 3'. Further, the backward movement distance from the rear opening 3'c of the sample pan 1' due to the displacement of the upper end 20b of the sample feed lever 20 from the front dead center position b to the rear dead center position c is equal to the front-to-back width of the sample pan 1'. It is set to be larger than W.

本発明による試料供給装置は上述の如く構成さ
れているから、まず多数の試料皿1′を試料皿収
納容器3′内に上部開口3′aから順次挿入してや
れば、上部開口3′aと内側の寸法が試料皿1′の
外側寸法とほぼ同じなので試料皿1′は必ず水平
状態で落下し、試料皿収納容器3′内にて正確に
積み重なる。その後、試料皿保護カバー5′も上
部開口3′aから挿入して最上位の試料皿1′の上
に置く。尚、この時試料送りレバー20の上端2
0bはリセツト位置aで停止している。次に、円
盤22を回転させると、まず駆動ピン21が上側
レバー16から外れるので試料皿送りレバー20
の上端20bが上昇して最下位の試料皿1′の係
合穴1′cに係合し、続いて上端20bが前方死
点位置bまで移動するので最下位の試料皿1′は
試料皿収納容器3′の前部開口3′bを通つて試料
分注用凹部1′aが試料付着位置Aに達するまで
前方移動せしめられる。そして、ここで第5図と
同様に試料塗布具8の塗布先9に試料分注用凹部
1′a内の試料2を付着させ、更に試料塗布位置
Bにおいて塗布先9に付着している試料2を支持
体10上に塗布する。尚、この場合、最下位の試
料皿1′の前部開口3′bからの前方移動距離が該
試料皿1′の前後幅より小さく設定してあるので、
最下位の試料皿1′の後部が試料皿収納容器3′内
に残留し、そのため下から二番目以上に位置する
試料皿1′は下降できないでいる。次に試料皿送
りレバー20の上端20bが後方死点位置まで移
動するので、試料付着の終了した最下位の試料皿
1′は試料皿収納容器3′の後部開口3′c及び固
定部材11の孔11aを通つて後方移動せしめら
れ、試料皿1′の傾斜部1′bの作用により試料皿
カバー13を押し上げつつ移動して該カバー13
と一致した位置で停止する。そして、この間に、
残りの試料皿1′と保護カバー5′は自重により試
料皿一個分だけ下降し、二番目にあつた試料皿
1′が最下位に位置するようになる。続いて、試
料皿送りレバー20の上端bが再び前方へ移動し
始めるが、これと同時に駆動ピン21が上側レバ
ー16を押し下げ始めるので上端20bは下降も
開始し、而も前方移動に比べて下降の方が速いの
で上端20bは試料皿1′を前方へ移動せしめる
ことなく係合穴1′cから離脱し、リセツト位置
aで停止する。かくして、以上の動作が順次繰返
されることにより、試料収納容器3′内の全ての
試料皿1′についての試料2の供給が行われ、全
ての試料皿1′は試料付着後試料皿カバー13の
下へ送られる。そして、分析終了後試料皿カバー
13を支持している固定部材11を水平支持棒1
2と一緒に支持台4′から取り外すことにより使
用済みの試料皿1′が回収される。
Since the sample supply device according to the present invention is constructed as described above, if a large number of sample plates 1' are first sequentially inserted into the sample plate storage container 3' from the upper opening 3'a, then the upper opening 3'a and the inside Since the dimensions of are almost the same as the outer dimensions of the sample pan 1', the sample pans 1' always fall horizontally and are accurately stacked in the sample pan storage container 3'. Thereafter, the sample plate protective cover 5' is also inserted through the upper opening 3'a and placed on top of the uppermost sample plate 1'. At this time, the upper end 2 of the sample feed lever 20
0b is stopped at reset position a. Next, when the disk 22 is rotated, the drive pin 21 comes off from the upper lever 16, so the sample plate feed lever 20
The upper end 20b rises and engages with the engagement hole 1'c of the lowest sample pan 1', and then the upper end 20b moves to the front dead center position b, so the lowest sample pan 1' becomes a sample pan. The sample dispensing recess 1'a is moved forward through the front opening 3'b of the storage container 3' until it reaches the sample attachment position A. Then, as in FIG. 5, the sample 2 in the sample dispensing recess 1'a is attached to the tip 9 of the sample applicator 8, and the sample 2 attached to the tip 9 at the sample application position B is 2 is applied onto the support 10. In this case, since the forward movement distance of the lowest sample plate 1' from the front opening 3'b is set smaller than the front-to-back width of the sample plate 1',
The rear part of the lowest sample plate 1' remains in the sample plate storage container 3', and therefore the second and higher sample plates 1' from the bottom cannot be lowered. Next, the upper end 20b of the sample plate feed lever 20 moves to the rear dead center position, so that the lowest sample plate 1' to which the sample has been attached is moved to the rear opening 3'c of the sample plate storage container 3' and the fixing member 11. The sample plate cover 13 is moved backward through the hole 11a, and moved while pushing up the sample plate cover 13 by the action of the inclined portion 1'b of the sample plate 1'.
It will stop at the position that matches. And during this time,
The remaining sample pans 1' and protective cover 5' are lowered by one sample pan due to their own weight, and the second sample pan 1' is positioned at the lowest position. Subsequently, the upper end b of the sample plate feed lever 20 begins to move forward again, but at the same time, the drive pin 21 begins to push down the upper lever 16, so the upper end 20b begins to descend, and is lower than the forward movement. Since this is faster, the upper end 20b disengages from the engagement hole 1'c without moving the sample plate 1' forward and stops at the reset position a. In this way, by sequentially repeating the above operations, the sample 2 is supplied to all the sample plates 1' in the sample storage container 3', and all the sample plates 1' are covered with the sample plate cover 13 after the sample is attached. sent down. After the analysis is completed, the fixing member 11 supporting the sample plate cover 13 is moved to the horizontal support rod 1.
The used sample dish 1' is recovered by removing it together with the sample dish 2 from the support stand 4'.

以上の動作中、試料皿収納容器3′内にある各
試料皿1′は保護カバー5′又はすぐ上に重ねられ
た試料皿1′によつて密封状態が維持されるので、
これにより試料2からの水分の蒸発が防止され
る。更に、試料付着後も各試料皿1′は試料皿カ
バー13により密封されるので、試料2からの水
分の蒸発が防止される。又、こうした状態で使用
済みの試料2からの水分の蒸発が防止されるの
で、再検査等のために試料2を再利用することが
出来る。更に、試料付着位置Aと試料塗布位置B
との間に何の部材も位置しないので両位置A,B
間の距離が短くなり、その結果塗布先9の移動時
間が短くなつて該塗布先9に付着した試料2を支
持体10上に塗布するまでにほとんど乾燥させな
いで済む。又、最下位の試料皿1′の前後移動が
完了するまで、試料皿収納容器3′内の二番目以
上の試料皿1′の下降が最下位の試料皿1′自身に
よつて防止される構造となつているので、二番目
以上の試料を皿1′を一時保持し且つその後落下
せしめるというような特別な機構を必要としな
い。
During the above operation, each sample plate 1' in the sample plate storage container 3' is maintained in a sealed state by the protective cover 5' or the sample plate 1' placed directly above it.
This prevents moisture from evaporating from sample 2. Furthermore, since each sample plate 1' is sealed by the sample plate cover 13 even after the sample is attached, evaporation of moisture from the sample 2 is prevented. Further, in this state, evaporation of moisture from the used sample 2 is prevented, so the sample 2 can be reused for re-inspection or the like. Furthermore, sample attachment position A and sample application position B
Since there is no member located between them, both positions A and B
As a result, the moving time of the coating tip 9 is shortened, and the sample 2 attached to the coating tip 9 hardly needs to be dried before being coated onto the support 10. Further, until the back and forth movement of the lowest sample plate 1' is completed, the second and higher sample plates 1' in the sample plate storage container 3' are prevented from descending by the lowest sample plate 1' itself. Because of this structure, there is no need for a special mechanism for temporarily holding the second or more samples on the plate 1' and then allowing them to fall.

尚、上記実施例の場合、試料皿収納容器3′内
に試料皿1′が水平状態で落下し得るようにする
ために上部開口3′aと内側寸法を試料皿1′の外
側寸法と同じにしているが、その代わりに第3図
に示した如く試料皿1′の左右端にU字状の凹部
1′dを設け且つ試料皿収納容器3′の左右内壁に
該凹部1′dが嵌合し得る図示しない鉛直ガイド
を設けても良い。
In the case of the above embodiment, in order to allow the sample plate 1' to fall horizontally into the sample plate storage container 3', the inner dimensions of the upper opening 3'a are made to be the same as the outer dimensions of the sample plate 1'. However, instead, as shown in FIG. 3, U-shaped recesses 1'd are provided at the left and right ends of the sample dish 1', and the recesses 1'd are provided on the left and right inner walls of the sample dish storage container 3'. A vertical guide (not shown) that can be fitted may also be provided.

以上のように、上記実施例によれば、試料付着
前は勿論のこと試料付着後も試料皿内の試料から
の水分の蒸発が防止され、更に塗布先に付着した
試料を支持体上に塗布するまでにほとんど乾燥さ
せないで済むので、試料濃縮等による測定結果へ
の悪影響を防止することが出来る。又、試料付着
後も試料皿内の使用済み試料からの水分の蒸発が
防止されるので、再検査等のために試料を再利用
することが出来る。又、試料皿収納容器内の二番
目以上の試料皿を一時保持し且つその後落下せし
めるというような特別な機構を必要としないの
で、全体の構造が比較的簡単になるという利点も
有している。
As described above, according to the above embodiment, the evaporation of water from the sample in the sample pan is prevented not only before the sample is attached but also after the sample is attached, and furthermore, the sample attached to the coating destination is coated onto the support. Since it is not necessary to dry the sample until the sample is completely dried, it is possible to prevent sample concentration from affecting the measurement results. Further, even after the sample is attached, evaporation of moisture from the used sample in the sample dish is prevented, so the sample can be reused for reexamination, etc. Furthermore, since there is no need for a special mechanism for temporarily holding the second or more sample plates in the sample plate storage container and then allowing them to fall, it also has the advantage that the overall structure is relatively simple. .

[発明の効果] 本発明によれば、試料皿の試料から水分の蒸発
を防いで、試料皿を電気泳動装置の試料付着位置
及び試料皿収納容器外へ移送することができる。
[Effects of the Invention] According to the present invention, it is possible to prevent moisture from evaporating from the sample in the sample dish and to transfer the sample dish to the sample attachment position of the electrophoresis apparatus and to the outside of the sample dish storage container.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の垂直断面図、第2
図Aは本発明に使用される試料皿の一実施例の斜
視図、第2図Bは第2図Aの横断面図、第3図は
本発明に使用される試料皿の他の実施例の斜視
図、第4図は従来の試料皿の斜視図、第5図は従
来の試料供給装置の垂直断面図である。 A……試料付着位置、1′……試料皿、2……
試料、3′……試料皿収納容器、20……試料皿
送りレバー、21……駆動ピン、22……円盤。
FIG. 1 is a vertical sectional view of one embodiment of the present invention, and FIG.
Figure A is a perspective view of one embodiment of the sample plate used in the present invention, Figure 2 B is a cross-sectional view of Figure 2 A, and Figure 3 is another embodiment of the sample plate used in the present invention. FIG. 4 is a perspective view of a conventional sample dish, and FIG. 5 is a vertical sectional view of a conventional sample supply device. A...Sample attachment position, 1'...Sample plate, 2...
Sample, 3'... Sample plate storage container, 20... Sample plate feed lever, 21... Drive pin, 22... Disc.

Claims (1)

【特許請求の範囲】[Claims] 1 複数の試料を収納するための複数の凹部を有
する試料皿と、複数の試料皿を上下方向に重ね収
納し、下端部に一つの試料皿が通り得る大きさの
開口を有する試料皿収納容器と、この試料皿収納
容器に収納された試料皿の上部に載置された試料
皿保護カバーと、上記試料皿を上記開口を通し
て、試料付着位置及び試料皿収納容器外へ移送す
るための試料皿移送機構と、上記試料皿収納容器
外へ移送された試料皿を被う試料皿カバーとを有
することを特徴とする電気泳動用試料供給装置。
1. A sample plate with multiple recesses for storing multiple samples, and a sample plate storage container that stores multiple sample plates stacked vertically and has an opening at the bottom end large enough for one sample plate to pass through. a sample plate protective cover placed on top of the sample plate stored in the sample plate storage container; and a sample plate for transferring the sample plate to the sample attachment position and outside the sample plate storage container through the opening. A sample supply device for electrophoresis, comprising a transfer mechanism and a sample plate cover that covers the sample plate transferred to the outside of the sample plate storage container.
JP61251056A 1986-10-22 1986-10-22 Sample supplying device for electrophoresis Granted JPS62142262A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61251056A JPS62142262A (en) 1986-10-22 1986-10-22 Sample supplying device for electrophoresis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61251056A JPS62142262A (en) 1986-10-22 1986-10-22 Sample supplying device for electrophoresis

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP13773979A Division JPS5661641A (en) 1979-05-11 1979-10-26 Sample feeder

Publications (2)

Publication Number Publication Date
JPS62142262A JPS62142262A (en) 1987-06-25
JPS6333101B2 true JPS6333101B2 (en) 1988-07-04

Family

ID=17216962

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61251056A Granted JPS62142262A (en) 1986-10-22 1986-10-22 Sample supplying device for electrophoresis

Country Status (1)

Country Link
JP (1) JPS62142262A (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6038660A (en) * 1983-08-12 1985-02-28 Shibaura Eng Works Co Ltd Ripple removal of dc signal

Also Published As

Publication number Publication date
JPS62142262A (en) 1987-06-25

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