JPH0133778B2 - - Google Patents
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- Publication number
- JPH0133778B2 JPH0133778B2 JP61251055A JP25105586A JPH0133778B2 JP H0133778 B2 JPH0133778 B2 JP H0133778B2 JP 61251055 A JP61251055 A JP 61251055A JP 25105586 A JP25105586 A JP 25105586A JP H0133778 B2 JPH0133778 B2 JP H0133778B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample plate
- plate
- storage container
- lever
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
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- Sampling And Sample Adjustment (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、電気泳動装置において用いられる試
料供給装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a sample supply device used in an electrophoresis apparatus.
[従来の技術]
自動電気泳動装置において使用される試料皿
は、第4図に示す如く、一つの試料皿1に複数の
試料分注用凹部1aが形成されて成るものであ
り、これらに夫々異なる試料2が入れられてい
る。そして、この試料2からの水分の蒸発を防止
しつつ試料皿1を供給する試料供給装置は、例え
ば本願出願人の特願昭54−57845号において発明
されている。即ち、その試料供給装置は、第5図
に示した如く、上部開口3aと内側の寸法が試料
皿1の外側寸法とほぼ同じであつて複数の試料皿
1を上下方向に重ね収納することが出来且つ下端
部に一つの試料皿1が通り得る大きさの前部開口
3bを有していると共に支持台4上に設置された
試料皿収納容器3と、最上位の試料皿1の上に置
かれた試料皿保護カバー5と、最下位の試料皿1
を前部開口3bを通して試料付着位置Aへ移送す
るためのピストン式試料移送機6と、使用済みの
試料皿1を収納する受け皿7とを備え、試料移送
機構6により最下位の試料皿1を前部開口3bよ
り押し出して試料付着位置Aまで移動させ、ここ
で試料塗布具8の塗布先9に試料2を付着させて
から試料塗布位置Bにおいて塗布先9に付着して
いる試料2を支持体10上に塗布し、この間に試
料移送機構6を再作動させて続いて最下位になつ
た二番目の試料皿1を試料付着位置Aまで押し出
し、この時それまで試料付着位置Aにあつた最初
の試料皿1を二番目の試料皿1の移動により押し
て受け皿7内に落下せしめ、以上の動作を順次繰
返すようにして成るものであつて、試料皿1はそ
れが試料皿収納容器3内にある間即ち試料付着位
置Aへ移動せしめられるまでの間は保護カバー5
又はすぐ上に重ねられた試料皿1によつて密封状
態が維持されこれにより試料2からの水分の蒸発
が防止されていた。[Prior Art] As shown in FIG. 4, a sample dish used in an automatic electrophoresis apparatus is one in which a plurality of sample dispensing recesses 1a are formed in one sample dish 1. A different sample 2 is included. A sample supply device for supplying the sample dish 1 while preventing the evaporation of water from the sample 2 has been invented, for example, in Japanese Patent Application No. 57845/1983 filed by the applicant of the present invention. That is, as shown in FIG. 5, the sample supply device has an upper opening 3a and an inner dimension that is almost the same as an outer dimension of the sample dish 1, so that a plurality of sample dishes 1 can be stacked and stored in the vertical direction. A sample plate storage container 3, which has a front opening 3b large enough to allow one sample plate 1 to pass through at its lower end and is installed on a support stand 4, and a sample plate 1 on the uppermost one. The placed sample plate protective cover 5 and the lowest sample plate 1
It is equipped with a piston type sample transfer device 6 for transferring the sample to the sample attachment position A through the front opening 3b, and a receiving tray 7 for storing the used sample plate 1. The sample 2 is pushed out through the front opening 3b and moved to the sample attachment position A, where the sample 2 is attached to the coating tip 9 of the sample applicator 8, and then the sample 2 attached to the coating tip 9 is supported at the sample coating position B. During this time, the sample transfer mechanism 6 was reactivated, and the second sample tray 1, which was at the lowest position, was pushed out to the sample attachment position A. The first sample plate 1 is pushed by the movement of the second sample plate 1 and falls into the receiving tray 7, and the above operation is repeated sequentially. , that is, until it is moved to the sample attachment position A, the protective cover 5 is
Alternatively, a sealed state was maintained by the sample plate 1 stacked directly above, thereby preventing moisture from evaporating from the sample 2.
[発明が解決しようとする問題点]
この試料供給装置は、上述の如く使用済みの試
料皿1を受け皿7内に落としてしまうため、再検
査等のために試料2の再利用が出来ないという欠
点があつた。又、試料付着位置Aと試料塗布位置
Bとの間に受け皿7が位置するため両位置A、B
間の距離が長くなり、その結果両位置A、B間に
おける塗布先9の移動時間が長くなつて該塗布先
9に付着した試料2が支持体10上に塗布される
までに乾燥し、測定結果に悪影響が及ぶという欠
点もあつた。[Problems to be Solved by the Invention] This sample supply device drops the used sample plate 1 into the receiving tray 7 as described above, so the sample 2 cannot be reused for re-inspection, etc. There were flaws. In addition, since the tray 7 is located between the sample attachment position A and the sample application position B, both positions A and B
As a result, the moving time of the coating tip 9 between the two positions A and B becomes longer, and the sample 2 adhering to the coating tip 9 dries before it is coated on the support 10, making it difficult to measure. It also had the disadvantage of having a negative impact on the results.
本発明は、上記欠点に鑑みてなされたもので、
電気泳動装置に適した試料供給装置を提供するこ
とを目的とする。 The present invention has been made in view of the above drawbacks, and
The purpose is to provide a sample supply device suitable for an electrophoresis device.
本発明は上面の前縁部分に試料収容部を形成
し、後縁部分に傾斜部を有している試料皿と、該
試料皿を収納する試料皿収納容器と、該試料皿収
納容器の下部に設けられた開口を通して試料皿を
試料付着位置と排出位置に移送する試料皿搬送機
構と、試料皿収納容器の試料皿排出用開口の後方
に固定された支持部材に上下動可能に保持され、
底面が試料皿の頂面より低く位置して、排出され
た試料皿を被う試料皿カバーとを有するものであ
る。
The present invention provides a sample plate having a sample accommodating portion formed at the front edge portion of the upper surface and an inclined portion at the rear edge portion, a sample plate storage container for storing the sample plate, and a lower portion of the sample plate storage container. a sample plate transport mechanism that transfers the sample plate to a sample attachment position and a sample discharge position through an opening provided in the sample plate storage container;
It has a sample plate cover whose bottom surface is located lower than the top surface of the sample plate and which covers the discharged sample plate.
[実施例]
本発明の1実施例を第1図及び第2図A,Bを
参照して説明する。[Embodiment] An embodiment of the present invention will be described with reference to FIG. 1 and FIGS. 2A and 2B.
第4図及び第5図と同一の部材には同一符号を
付して説明する。第1図において使用される試料
皿1′は第2図A,Bに示すように、その頂点の
前縁側部分に複数の試料分注用凹部1′aが形成
され且つ後縁部分に傾斜部1′bが形成されてい
ると共にその底面の後縁部分に後述の試料皿送り
レバーの上端が係合し得る左右一対の係合穴1′
cが形成されている試料皿3′は基本的構造が従
来の試料皿収納容器3と同じであるが更にその下
端部に一つの試料皿1′が通り得る大きさの後部
開口3′cが設けられた試料皿収納容器、4′は基
本的構造が従来の支持台4と同じであるが更にそ
の頂壁に後述の試料皿送りレバーの上端が貫通す
る前後に長い左右一対のスロツト4′aが設けら
れた支持台、5′は基本的構造が従来の試料皿保
護カバー5と同じであるが更にその底面の後縁側
部分に後述の試料皿送りレバーの上端が係合し得
る左右一対の係合穴5′aが形成されている試料
皿保護カバーである。11は試料皿収納容器3′
の後方近傍において支持台4′上に取り外し可能
に固定されていると共にその下端部に一つの試料
皿1′が通り得る大きさの孔11aが設けられた
固定部材、12は後方に延出するようにして固定
部材11に固定された水平支持棒、13は支持棒
12に一定の範囲内で上下動可能に装架されてい
ると共にその底面の位置(支持台4′の頂面から
の高さH′)が支持台4上に置かれた試料皿1′の
頂面の位置(試料皿1′の厚さH)よりも通常は
低くなつており且つ後方に向つて直列している複
数個の試料皿カバーである。14は支持台4′の
低い壁上に固定された支持部材、15は支持部材
14に上下動可能に取付けられた鉛直支軸、16
は鉛直支軸15の上端に個着された上側レバー、
17、は鉛直支軸15の下端に固着された下側レ
バー、18は上側レバー16と支持部材14との
間に介在せしめられていて鉛直支軸15、上側レ
バー16、下側レバー17全体に上方への移動習
性を付与しているスプリング、19は支持部材1
4の上端に固着されていて鉛直支軸15、上側レ
バー16、下側レバー17全体の上昇を所定の位
置まで規制するストツパー、20は下端20aが
下側レバー17に枢着されていて全体が鉛直面内
にて揺動可能となつており且つ上端20bが支持
台4′のスロツト4′aを貫通して試料皿1′の係
合穴1′cに係合し得るようになつていると共に
その中央部に長手方向に長いスロツト20cが設
けられている左右一対の試料皿送りレバー、21
は図示しないモータにより回転せしめられる円盤
22の外周部の所定位置に固着されていると共に
その先端がスロツト20cに係合している駆動ピ
ンである。そして、円盤22の第1図時計方向の
回転による駆動ピン21の変位によつて、試料送
りレバー20の上端20bは、リセツト位置a
(第1図点線図示位置。この時、駆動ピン21が
スプリング18の弾力に抗して上側レバー16を
上昇規制位置からストロークhだけ押し下げてい
るので、試料送りレバー20も上昇規制位置から
ストロークhだけ下降せしめられている。)、前方
死点位置b(第1図実線図示位置。この時、駆動
ピン21が上側レバー16から外れてしまうの
で、試料送りレバー20はスプリング18の弾力
によりストロークhだけ上昇して上昇規制位置に
戻つている。)、後方死点位置c(第1図一点鎖線
図示位置。この時、駆動ピン21が上側レバー1
6をまだ押し下げてはいないので、試料送りレバ
ー21は上昇規制位置に位置したままである。)
を順次とるようにして揺動及び上下動せしめら
れ、これが繰返されるようになつている。又、試
料送りレバー20の上端20bのリセツト位置a
から前方死点位置bにかけての変位による試料皿
1′の前部開口3′からの前方移動距離は、該試料
皿1′の前後幅wよりも小さくなると共に試料皿
1′の試料分注用凹部1′aが試料皿収納容器3′
から十分露出する程度になるように設定されてい
る。又、試料送りレバー20の上端20bの前方
死点位置bから後方死点位置cにかけての変位に
よる試料皿1′の後部開口3′cからの後方移動距
離は、該試料皿1′の前後幅Wよりも大きくなる
ように設定されている。 The same members as in FIGS. 4 and 5 will be described with the same reference numerals. As shown in FIGS. 2A and 2B, the sample dish 1' used in FIG. 1'b is formed, and a pair of left and right engagement holes 1' in which the upper end of a sample plate feeding lever, which will be described later, can be engaged with the rear edge portion of the bottom surface thereof.
The basic structure of the sample plate 3' in which c is formed is the same as that of the conventional sample plate storage container 3, but it also has a rear opening 3'c at its lower end large enough for one sample plate 1' to pass through. The provided sample plate storage container 4' has the same basic structure as the conventional support stand 4, but it also has a pair of long left and right slots 4' in the front and back, through which the upper end of the sample plate feeding lever, which will be described later, passes through the top wall. The support stand 5' on which a is provided has the same basic structure as the conventional sample plate protection cover 5, but it also has a left and right pair on the rear edge side of the bottom surface of which the upper end of the sample plate feed lever, which will be described later, can engage. This is a sample plate protection cover in which an engagement hole 5'a is formed. 11 is a sample plate storage container 3'
A fixing member 12 extends rearward, and is removably fixed on the support stand 4' near the rear of the sample plate 1', and has a hole 11a at its lower end large enough to allow one sample dish 1' to pass through. The horizontal support rod 13 fixed to the fixed member 11 in this manner is mounted on the support rod 12 so as to be movable up and down within a certain range, and the position of the bottom surface (height from the top surface of the support base 4') is The thickness H') is usually lower than the position of the top surface of the sample plate 1' placed on the support stand 4 (thickness H of the sample plate 1'), and the plurality of plates are arranged in series toward the rear. This is a sample plate cover. 14 is a support member fixed on the low wall of the support base 4'; 15 is a vertical support shaft attached to the support member 14 so as to be movable up and down; 16
is an upper lever individually attached to the upper end of the vertical support shaft 15;
17 is a lower lever fixed to the lower end of the vertical support shaft 15; 18 is interposed between the upper lever 16 and the support member 14; A spring 19 is a support member 1 that provides an upward movement habit.
A stopper is fixed to the upper end of 4 and restricts the vertical support shaft 15, upper lever 16, and lower lever 17 from rising to a predetermined position. It is capable of swinging in a vertical plane, and the upper end 20b can pass through the slot 4'a of the support base 4' and engage with the engagement hole 1'c of the sample plate 1'. and a pair of left and right sample plate feed levers 21, each having a longitudinally long slot 20c in the center thereof.
A driving pin is fixed at a predetermined position on the outer periphery of a disc 22 rotated by a motor (not shown), and its tip is engaged with the slot 20c. Then, due to the displacement of the drive pin 21 due to the rotation of the disk 22 in the clockwise direction in FIG.
(Position shown by the dotted line in Figure 1. At this time, the drive pin 21 is pushing down the upper lever 16 by a stroke h from the raising restriction position against the elasticity of the spring 18, so the sample feed lever 20 is also moving from the raising restriction position by a stroke h. ), and the front dead center position b (the position shown by the solid line in FIG. ), and the rear dead center position c (the position shown by the dashed line in FIG. 1. At this time, the drive pin 21 is
6 has not been pushed down yet, the sample feed lever 21 remains at the upward restriction position. )
It is made to swing and move up and down sequentially, and this is repeated. Also, the reset position a of the upper end 20b of the sample feed lever 20
The forward movement distance of the sample pan 1' from the front opening 3' due to the displacement from the front dead center position b to the front dead center position b is smaller than the longitudinal width w of the sample pan 1', and the distance for dispensing the sample of the sample pan 1' The recess 1'a is the sample plate storage container 3'
The settings are set to provide sufficient exposure. Further, the backward movement distance from the rear opening 3'c of the sample pan 1' due to the displacement of the upper end 20b of the sample feed lever 20 from the front dead center position b to the rear dead center position c is equal to the front-to-back width of the sample pan 1'. It is set to be larger than W.
試料供給装置は上述の如く構成されているか
ら、まず多数の試料皿1′を試料皿収納容器3′内
に上部開口3′aから順次挿入してやれば、上部
開口3′aと内側の寸法が試料皿1′の外側寸法と
ほぼ同じなので該試料皿1′は必ず水平状態で落
下し、試料皿収納容器3′内にて正確に積み重な
る。その後、試料皿保護カバー5′も上部開口
3′aから挿入して最上位の試料皿1′の上に置
く。尚、この時試料皿送りレバー20の得端20
bはリセツト位置aで停止している。次に、円盤
22を回転させると、まず駆動ピン21が上側レ
バー16から外れるので試料皿送りレバー20の
上端20bが上昇して最下位の試料皿1′の係合
穴1′cに係合し、続いて上端20bが前方死点
位置bまで移動するので最下位の試料皿1′は試
料皿収納容器3′の前部開口3′bを通つて試料分
注用凹部1′aが試料付着位置Aに達するまで前
方移動せしめられる。そして、ここで第5図の従
来例と同様に試料塗布具8の塗布先9に試料分注
用凹部1′a内の試料2を付着させ、更に試料塗
布位置Bにおいて塗布先9に付着している試料2
を支持体10上に塗布する。尚、この場合、最下
位の試料皿1′の前部開口3′bからの前方移動距
離が該試料皿1′の前後幅より小さく設定してあ
るので、最下位の試料皿1′の後部が試料皿収納
容器3′内に残留し、そのため下から二番目以上
に位置する試料皿1′は下降できないでいる。次
に試料皿送りレバー20の上端20bが後方死点
位置まで移動するので、試料付着の終了した最下
位の試料皿1′は試料皿収納容器3′の後部開口
3′c及び固定部材11の孔11aを通つて後方
移動せしめられ、試料皿1′の傾斜部1′bの作用
により試料皿カバー13を押し上げつつ移動して
該カバー13と一致した位置で停止する。そし
て、この間に、残りの試料皿1′と保護カバー
5′は自重により試料皿一個分だけ下降し、二番
目にあつた試料皿1′が最下位に位置するように
なる。続いて、試料皿送りレバー20の上端20
bが再び前方へ移動し始めるが、これと同時に駆
動ピン21が上側レバー16を押し下げ始めるの
で上端20bは下降も開始し、而も前方移動に比
べて下降の方が速いので上端20bは試料皿1′
を前方へ移動せしめることなく係合穴1′cから
離脱し、リセツト位置aで停止する。かくして、
以上の動作が順次繰返されることにより、試料収
納容器3′内の全ての試料皿1′についての試料2
の供給が行われ、全ての試料皿1′は試料付着後
試料皿カバー13の下へ送られる。そして、分析
終了後試料皿カバー13を支持している固定部材
11を水平支持棒12と一緒に支持台4′から取
外すことにより使用済みの試料皿1′が回収され
る。 Since the sample supply device is constructed as described above, firstly, by sequentially inserting a large number of sample plates 1' into the sample plate storage container 3' from the upper opening 3'a, the dimensions of the upper opening 3'a and the inside are adjusted. Since the outer dimensions are approximately the same as the sample trays 1', the sample trays 1' always fall horizontally and are accurately stacked in the sample tray storage container 3'. Thereafter, the sample plate protection cover 5' is also inserted through the upper opening 3'a and placed on top of the uppermost sample plate 1'. At this time, the end 20 of the sample plate feed lever 20
b is stopped at reset position a. Next, when the disk 22 is rotated, the drive pin 21 is first disengaged from the upper lever 16, so the upper end 20b of the sample plate feed lever 20 rises and engages with the engagement hole 1'c of the lowest sample plate 1'. Then, as the upper end 20b moves to the front dead center position b, the lowermost sample tray 1' passes through the front opening 3'b of the sample tray storage container 3', and the sample dispensing recess 1'a is inserted into the sample tray 1'. It is moved forward until it reaches the attachment position A. Here, the sample 2 in the sample dispensing recess 1'a is attached to the coating tip 9 of the sample applicator 8, as in the conventional example shown in FIG. sample 2
is applied onto the support 10. In this case, since the forward moving distance from the front opening 3'b of the lowest sample pan 1' is set to be smaller than the longitudinal width of the sample pan 1', the rear of the lowest sample pan 1' remains in the sample plate storage container 3', and therefore the sample plates 1' located second or higher from the bottom cannot be lowered. Next, the upper end 20b of the sample plate feed lever 20 moves to the rear dead center position, so that the lowest sample plate 1' to which the sample has been attached is moved to the rear opening 3'c of the sample plate storage container 3' and the fixing member 11. It is moved backward through the hole 11a, moves while pushing up the sample plate cover 13 by the action of the inclined portion 1'b of the sample plate 1', and stops at a position coincident with the cover 13. During this time, the remaining sample plates 1' and protective cover 5' are lowered by one sample plate due to their own weight, and the second sample plate 1' is positioned at the lowest position. Next, the upper end 20 of the sample plate feed lever 20
b begins to move forward again, but at the same time, the drive pin 21 begins to push down the upper lever 16, so the upper end 20b also begins to descend, and since the lowering is faster than the forward movement, the upper end 20b is placed in the sample pan. 1′
It disengages from the engagement hole 1'c without moving forward and stops at the reset position a. Thus,
By sequentially repeating the above operations, the sample 2 for all sample dishes 1' in the sample storage container 3' is
is supplied, and all the sample plates 1' are sent under the sample plate cover 13 after the samples are attached. After the analysis is completed, the used sample plate 1' is recovered by removing the fixing member 11 supporting the sample plate cover 13 from the support base 4' together with the horizontal support rod 12.
以上の動作中、試料皿収納容器3′内にある各
試料皿1′は保護カバー5′又はすぐ上に重ねられ
た試料皿1′によつて密封状態が維持されるので、
これにより試料2からの水分の蒸発が防止され
る。更に、試料付着後も各試料皿1′は試料皿カ
バー13により密封されるので、試料2からの水
分の蒸発が防止される。又、こうした状態で使用
済みの試料2からの水分の蒸発が防止されるの
で、再検査等のために試料2を再利用することが
出来る。更に、試料付着位置Aと試料塗布位置B
との間に何の部材も位置しないので両位置A、B
間の距離が短くなり、その結果塗布先9の移動時
間が短くなつて該塗布先9に付着した試料2を支
持体10上に塗布するまでにほとんど乾燥させな
いで済む。又、最下位の試料皿1′の前後移動が
完了するまで、試料皿収納容器3′内の二番目以
上の試料皿1′の下降が最下位の試料皿1′自身に
よつて防止される構造となつているので、二番目
以上の試料を皿1′を一時保持し且つその後落下
せしめるというような特別な機構を必要としな
い。 During the above operation, each sample plate 1' in the sample plate storage container 3' is maintained in a sealed state by the protective cover 5' or the sample plate 1' placed directly above it.
This prevents moisture from evaporating from sample 2. Furthermore, since each sample plate 1' is sealed by the sample plate cover 13 even after the sample is attached, evaporation of moisture from the sample 2 is prevented. Further, in this state, evaporation of moisture from the used sample 2 is prevented, so the sample 2 can be reused for re-inspection or the like. Furthermore, sample attachment position A and sample application position B
Both positions A and B because no member is located between them.
As a result, the moving time of the coating tip 9 is shortened, and the sample 2 attached to the coating tip 9 hardly needs to be dried before being coated onto the support 10. Further, until the back and forth movement of the lowest sample plate 1' is completed, the second and higher sample plates 1' in the sample plate storage container 3' are prevented from descending by the lowest sample plate 1' itself. Because of this structure, there is no need for a special mechanism for temporarily holding the second or more samples on the plate 1' and then allowing them to fall.
尚、上記実施例の場合、試料皿収納容器3′内
に試料皿1′が水平状態で落下し得るようにする
ために上部開口3′aと内側寸法を試料皿1′の外
側寸法とほぼ同じにしているが、その代わりに第
3図に示した如く試料皿1′の左右端にU字状の
凹部1′dを設け且つ試料皿収納容器3′の左右内
壁に該凹部1′dが篏合し得る図示しない鉛直ガ
イドを設けても良い。 In the case of the above embodiment, in order to allow the sample plate 1' to fall horizontally into the sample plate storage container 3', the inner dimensions of the upper opening 3'a are approximately the same as the outer dimensions of the sample plate 1'. However, as shown in FIG. 3, U-shaped recesses 1'd are provided at the left and right ends of the sample plate 1', and recesses 1'd are provided at the left and right inner walls of the sample plate storage container 3'. A vertical guide (not shown) with which the two can be engaged may be provided.
[発明の効果]
以上のように、本発明の試料供給装置によれ
ば、試料付着後も試料皿内の使用済み試料からの
水分の蒸発が防止されるので、再検査等のために
試料を再利用することが出来る。[Effects of the Invention] As described above, according to the sample supply device of the present invention, evaporation of water from the used sample in the sample pan is prevented even after the sample has been deposited, so it is possible to prevent the sample from being removed for reexamination, etc. It can be reused.
第1図は本発明の一実施例の垂直断面図、第2
図Aは、本発明に使用される試料皿の斜視図、第
2図Bは第2図Aの横断面図、第3図は本発明に
使用される試料皿の他の実施例の斜視図、第4図
は従来の試料皿の斜視図、第5図は従来の試料供
給装置の垂直断面図である。
1′……試料皿、2……試料、3′……試料皿収
納容器、13……試料皿レバー、20……試料皿
送りカバー。
FIG. 1 is a vertical sectional view of one embodiment of the present invention, and FIG.
Figure A is a perspective view of a sample plate used in the present invention, Figure 2B is a cross-sectional view of Figure 2A, and Figure 3 is a perspective view of another embodiment of the sample plate used in the present invention. , FIG. 4 is a perspective view of a conventional sample dish, and FIG. 5 is a vertical sectional view of a conventional sample supply device. 1'... Sample plate, 2... Sample, 3'... Sample plate storage container, 13... Sample plate lever, 20... Sample plate feeding cover.
Claims (1)
部分に傾斜部を有している試料皿と、該試料皿を
収納する試料皿収納容器と、該試料皿収納容器の
下部に設けられた開口を通して試料皿を試料付着
位置と排出位置に移送する試料皿搬送機構と、試
料皿収納容器の試料皿排出用開口の後方に固定さ
れた支持部材に上下動可能に保持され、底面が試
料皿の頂面より低く位置して、排出された試料皿
を被う試料皿カバーとを有することを特徴とする
試料供給装置。1. A sample plate having a sample accommodating portion formed at the front edge of the upper surface and a sloped portion at the rear edge, a sample plate storage container for storing the sample plate, and a sample plate storage container provided at the bottom of the sample plate storage container. The sample plate transport mechanism transports the sample plate to the sample attachment position and discharge position through the opening provided in the sample plate. A sample supply device comprising: a sample plate cover positioned lower than the top surface of the sample plate and covering the ejected sample plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61251055A JPS62142261A (en) | 1986-10-22 | 1986-10-22 | Sample supplying device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61251055A JPS62142261A (en) | 1986-10-22 | 1986-10-22 | Sample supplying device |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13773979A Division JPS5661641A (en) | 1979-05-11 | 1979-10-26 | Sample feeder |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62142261A JPS62142261A (en) | 1987-06-25 |
| JPH0133778B2 true JPH0133778B2 (en) | 1989-07-14 |
Family
ID=17216946
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61251055A Granted JPS62142261A (en) | 1986-10-22 | 1986-10-22 | Sample supplying device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62142261A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6326828B2 (en) * | 2014-01-27 | 2018-05-23 | セイコーエプソン株式会社 | Sensor unit complex, Raman spectroscopic device, and electronic device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5929818B2 (en) * | 1976-05-10 | 1984-07-23 | 株式会社日立製作所 | automatic chemical analyzer |
| JPS5322495A (en) * | 1976-08-13 | 1978-03-01 | Shimadzu Corp | Automatic analyzer |
| GB1542835A (en) * | 1976-11-24 | 1979-03-28 |
-
1986
- 1986-10-22 JP JP61251055A patent/JPS62142261A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62142261A (en) | 1987-06-25 |
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