JPS6337882B2 - - Google Patents
Info
- Publication number
- JPS6337882B2 JPS6337882B2 JP55151621A JP15162180A JPS6337882B2 JP S6337882 B2 JPS6337882 B2 JP S6337882B2 JP 55151621 A JP55151621 A JP 55151621A JP 15162180 A JP15162180 A JP 15162180A JP S6337882 B2 JPS6337882 B2 JP S6337882B2
- Authority
- JP
- Japan
- Prior art keywords
- panel
- casing
- light
- detection device
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Inking, Control Or Cleaning Of Printing Machines (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
この発明は、オフセツト印刷版などのパネルの
絵柄面積測定装置などに用いられる検査ヘツドに
係り、特に検査ヘツドの照射光学系の照明用光源
を覆うマスクの構造に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an inspection head used in a pattern area measuring device for panels such as offset printing plates, and more particularly to the structure of a mask that covers an illumination light source of an irradiation optical system of an inspection head.
オフセツト印刷版などのパネルの絵柄面積率を
計測する絵柄面積測定装置は、本体ハウジング前
面に形成されるテーブル上に被測定パネル(金属
プレートや可撓性樹脂シートなどを含む。)を吸
着して固定しており、固定されたパネル面の絵柄
面積は検査ヘツドをパネル面上で移動走査するこ
とにより測定されるようになつている。 A pattern area measuring device that measures the pattern area ratio of panels such as offset printing plates adsorbs the panel to be measured (including metal plates, flexible resin sheets, etc.) onto a table formed on the front of the main housing. The image area on the fixed panel surface is measured by moving and scanning the inspection head over the panel surface.
検査ヘツドはパネル面上に照射光を照明する照
射光学系と、照明されたパネル面からの反射光を
受光する光学的検出装置とを有し、この光学的検
出装置でパネル面からの反射光の強度を光学的に
検出している。 The inspection head has an irradiation optical system that illuminates the panel surface with irradiation light, and an optical detection device that receives reflected light from the illuminated panel surface.This optical detection device detects the reflected light from the panel surface. The intensity of the light is detected optically.
しかして、パネルの絵柄面積率を光学的に検出
する場合、その検出精度を向上させるためには、
照明光学系からの照射光をパネル面の検出域に確
実に照射(露光)し、その検出域からの反射光の
みが光学的検出装置で受光されるようにしなけれ
ばならない。 Therefore, in order to improve the detection accuracy when optically detecting the picture area ratio of the panel, it is necessary to
It is necessary to reliably irradiate (expose) the detection area on the panel surface with the illumination light from the illumination optical system so that only the reflected light from the detection area is received by the optical detection device.
この発明は上述した点を考慮し、照明光学系か
らの照明光を、パネル面の検出域に確実に照射
し、この検出域からの反射光を光学的検出装置に
案内し、検出精度の向上を確実に図ることができ
るようにしたパネルの絵柄面積測定装置等用検査
ヘツドを提供することを目的とする。 In consideration of the above-mentioned points, this invention reliably illuminates the detection area on the panel surface with illumination light from the illumination optical system, and guides the reflected light from this detection area to the optical detection device, thereby improving detection accuracy. An object of the present invention is to provide an inspection head for a panel pattern area measuring device, etc., which can reliably measure the pattern area of a panel.
以下、この発明の実施例について添付図面を参
照して説明する。 Embodiments of the present invention will be described below with reference to the accompanying drawings.
第1図は発明に係る検査ヘツド10を用いたパ
ネルの絵柄面積測定装置を示す全体斜視図であつ
て、図面符号11は絵柄面積測定装置の本体ハウ
ジングを示す。この本体ハウジング11内にブロ
ア等の負圧源(図示せず)が収納されるととも
に、その前面にテーブル12が一体成形されてい
る。テーブル12の前面はパンチングブレート1
3で覆われ、オフセツト印刷版などのパネル14
を載置する載置面が形成される。この載置面は上
方に向つて本体ハウジング11の背側に漸次近づ
くように傾斜しており、この傾斜により、テーブ
ル12のパンチングプレート13上にパネル14
が簡単かつスムーズに載置される。テーブル12
上に載置されたパネル14は下部の位置決めバー
15および左右いずれかの位置決めピン16によ
り位置決めされ、保持される。 FIG. 1 is an overall perspective view showing a panel picture area measuring device using an inspection head 10 according to the invention, and reference numeral 11 indicates a main body housing of the picture area measuring device. A negative pressure source (not shown) such as a blower is housed within the main body housing 11, and a table 12 is integrally molded on the front surface thereof. The front of the table 12 is the punching plate 1
Panel 14 covered by 3 and offset printing plate etc.
A mounting surface is formed on which the material is placed. This mounting surface is inclined upward so as to gradually approach the back side of the main body housing 11, and due to this inclination, the panel 14 is placed on the punching plate 13 of the table 12.
is placed easily and smoothly. table 12
The panel 14 placed above is positioned and held by a lower positioning bar 15 and either left or right positioning pins 16.
一方、本体ハウジング11の前面上下部には一
対のガイドロツド17,18が水平方向に設けら
れており、上記ガイドロツド17,18により検
査ヘツド10の水平方向の移動が案内される。検
査ヘツド10はテーブル12を跨ぐように装架さ
れ、テーブル12上で往復動される。この検査ヘ
ツド10の移動走査によりテーブル12上のパネ
ル面の絵柄面積率が測定される。 On the other hand, a pair of guide rods 17 and 18 are provided horizontally at the upper and lower front surfaces of the main body housing 11, and the horizontal movement of the inspection head 10 is guided by the guide rods 17 and 18. The inspection head 10 is mounted so as to straddle the table 12 and is reciprocated on the table 12. The pattern area ratio of the panel surface on the table 12 is measured by this movement and scanning of the inspection head 10.
検査ヘツド10はボツクス状ケーシング20を
有するとともに、このケーシング20内に、第2
図に原理的に示すように、照明光学系21と光学
的検出装置22とが設けられる。照明光学系21
は線状照明光源として並設された二本の螢光灯2
3,23を有する。螢光灯23,23は第3図に
示すように端部近傍が固定保持具24で保持さ
れ、ケーシング20の両側底部に固定される。 The inspection head 10 has a box-like casing 20, inside which a second
As shown in principle in the figure, an illumination optical system 21 and an optical detection device 22 are provided. Illumination optical system 21
Two fluorescent lamps 2 are installed in parallel as a linear illumination light source.
It has 3.23. As shown in FIG. 3, the fluorescent lamps 23, 23 are held near their ends by fixed holders 24, and are fixed to both bottoms of the casing 20.
また、光学的検出装置22は、第4図に示すよ
うに両螢光灯23,23間の中間部上方に設置さ
れ、断面L字状の取付固定具25によりケーシン
グ20の底壁に固定され、ケーシング20のボツ
クス状内に収容される。光学的検出装置22は列
状に整列配置された多数の遮光ボツクス26と、
この遮光ボツクス26の頂部に取付けられた受光
器としてのフオトダイオート等の光センサー27
とを有する。遮光ボツクス26の下部は開口する
一方、この下端開口部にスリツト28が設けられ
る。しかし、上記遮光ボツクス26の下端開口部
の両側に前記螢光灯23が設置される。 The optical detection device 22 is installed above the intermediate portion between the two fluorescent lamps 23, 23, as shown in FIG. 4, and is fixed to the bottom wall of the casing 20 by a mounting fixture 25 having an L-shaped cross section. , are housed in a box-like shape of the casing 20. The optical detection device 22 includes a large number of light shielding boxes 26 arranged in a row,
A light sensor 27 such as a photodiode as a light receiver is attached to the top of this light shielding box 26.
and has. The lower part of the light-shielding box 26 is open, and a slit 28 is provided at the lower end opening. However, the fluorescent lamps 23 are installed on both sides of the opening at the lower end of the light shielding box 26.
照明光学系21を構成する螢光灯23,23は
マスク30で両外方から覆われている。マスク3
0,30はケーシング20の下部に取付けられ、
螢光灯23,23を外側から覆う円弧状あるいは
楕円状曲線部31と、この曲線部31の外側下端
からパネル14またはテーブル12面に向つて斜
めに延びる直線部32とを有する。螢光灯23は
曲線部31の中心または焦点位置に配置されてパ
ネル14面側に開口している。また、上記曲線部
31は螢光灯23からの照射光を反射する反射面
31Aとして形成される。また、両マスク30の
直線部32は黒色塗布され、螢光灯32からの照
射光を吸収する非反射面32Aとして形成され、
この非反射面32Aからの反射による悪影響を未
然に防止している。非反射面32Aの領域は螢光
灯がスリツト28から光学的検出装置22の遮光
ボツクス26内に直接入射されるのを防止できる
範囲内であればよい。 The fluorescent lamps 23, 23 constituting the illumination optical system 21 are covered from both sides with a mask 30. mask 3
0,30 are attached to the lower part of the casing 20,
It has an arcuate or elliptical curved section 31 that covers the fluorescent lamps 23, 23 from the outside, and a straight section 32 that extends obliquely from the outer lower end of the curved section 31 toward the panel 14 or table 12 surface. The fluorescent lamp 23 is disposed at the center or focal point of the curved portion 31 and opens toward the panel 14 side. Further, the curved portion 31 is formed as a reflective surface 31A that reflects the irradiated light from the fluorescent lamp 23. Further, the linear portions 32 of both masks 30 are coated with black and are formed as non-reflective surfaces 32A that absorb the irradiated light from the fluorescent lamps 32.
This prevents adverse effects caused by reflection from the non-reflective surface 32A. The area of the non-reflective surface 32A may be within a range that can prevent the fluorescent light from directly entering the light shielding box 26 of the optical detection device 22 from the slit 28.
また、マスク30の両直線部32,32はパネ
ル面側に向つて漸次接近する方向に傾斜して、パ
ネル14面近傍で終端し、細長い矩形の窓部35
が形成される。この窓部35は螢光灯23の長手
方向に平行に延びており、螢光灯23からの照射
光が窓部35を通してパネル面の検出域Aをスリ
ツト露光させるようになつている。 Further, both the linear parts 32, 32 of the mask 30 are inclined in a direction that gradually approaches the panel surface side, and terminate near the panel 14 surface, forming an elongated rectangular window part 35.
is formed. This window portion 35 extends parallel to the longitudinal direction of the fluorescent lamp 23, and the irradiation light from the fluorescent lamp 23 passes through the window portion 35 and exposes the detection area A on the panel surface to a slit.
すなわち、マスク30はパネル面の近接位置に
矩形の窓部35が形成され、これによりパネル面
の検出域Aだけを照射し、スリツト露光してい
る。一方、第5図に示すように、マスク30に傾
斜した直線部32を設けることにより、検出域A
以外からのパネル14の反射光がカツトされ、そ
の反射光が光学的検出装置22に入射されるのを
未然に防止できる。もし、直線部32がない場合
には、一点鎖線で示すように螢光灯23からパネ
ル面のP点に照射され、このP点で反射した反射
光の影響が検出域Aに及ぼされる。その場合、P
点はオフセツト印刷版などのパネル面であり、絵
柄の有無により反射光量が異なるため、P点から
の反射光量の影響が検出域Aの照度変化となり、
測定誤差の要因となる恐れがある。また、直線部
32の内面を非反射面(反射防止面)32Aとす
ることにより、非反射面32Aで破線で示すよう
な反射光が存在しないので、直線部32での反射
の変化がパネル14の検出域Aの照度に影響を及
ぼすことがない。したがつて、パネル14の検出
域Aは常に一定の照度となる。 That is, a rectangular window 35 is formed in the mask 30 at a position close to the panel surface, thereby irradiating only the detection area A on the panel surface for slit exposure. On the other hand, as shown in FIG. 5, by providing the mask 30 with an inclined straight part 32, the detection area A
The reflected light of the panel 14 from other sources is cut off, and the reflected light can be prevented from entering the optical detection device 22. If there is no straight portion 32, the fluorescent lamp 23 irradiates a point P on the panel surface as shown by a dashed line, and the detection area A is affected by the reflected light reflected at this point P. In that case, P
The point is the panel surface of an offset printing plate, etc., and the amount of reflected light varies depending on the presence or absence of a pattern, so the influence of the amount of reflected light from point P changes the illuminance of detection area A.
This may cause measurement errors. Furthermore, by making the inner surface of the straight portion 32 a non-reflective surface (anti-reflection surface) 32A, there is no reflected light as shown by the broken line on the non-reflective surface 32A, so that changes in reflection at the straight portion 32 are caused by changes in the reflection on the panel 14. The illuminance of the detection area A is not affected. Therefore, the detection area A of the panel 14 always has a constant illuminance.
なお、符号37はパネルのキヤリブレーシヨン
マーク38を通る位置の両側に取付けられた遮光
板である。 Incidentally, reference numeral 37 denotes light shielding plates attached to both sides of the panel at a position passing through the calibration mark 38.
さらに、マスク30の非反射面の上限は、第4
図において例えばL点であればよい。このB点
は、窓部35の中心と螢光灯23の中心Oとを結
ぶ線がパネル面から角度αをなす場合、この角度
αの線に直交し、上記中心Oを通る直線がマスク
30と交差する点である。 Furthermore, the upper limit of the non-reflective surface of the mask 30 is
For example, it may be point L in the figure. When a line connecting the center of the window 35 and the center O of the fluorescent lamp 23 forms an angle α from the panel surface, this point B is perpendicular to the line of this angle α, and a straight line passing through the center O is the mask 30. This is the point where it intersects with
次に検査ヘツド10の作用について述べる。 Next, the operation of the inspection head 10 will be described.
照明光学系21の両螢光灯23,23からの照
射光を、マスク30の矩形窓部35を通して、パ
ネル14の検出域Aに照射し、その部分をスリツ
ト露光する。その際、パネル14はテーブル12
上に吸着され、所定位置に固定されている。スリ
ツト露光により、パネル14の検出域Aからの反
射光はスリツト28を通り、光学的検出装置22
の各遮光ボツクス26内に入り、それらの各頂部
に設置された受光器としてのフオトダイオード等
の光センサ27で受光され、その反射光の強弱に
より各遮光ボツクス26毎にパネルの絵柄面積が
計測される。しかして、各遮光ボツクスの光セン
サ27がそれぞれ絵柄面積を測定することによ
り、スリツト露光されたパネル検出域Aの絵柄面
積率が測定される。 Irradiation light from both fluorescent lamps 23, 23 of the illumination optical system 21 is irradiated onto the detection area A of the panel 14 through the rectangular window 35 of the mask 30, and that area is subjected to slit exposure. At that time, the panel 14 is
It is attracted to the top and fixed in place. Due to the slit exposure, the reflected light from the detection area A of the panel 14 passes through the slit 28 and is detected by the optical detection device 22.
The light enters each light shielding box 26 and is received by a light sensor 27 such as a photodiode as a light receiver installed at the top of each of them, and the pattern area of the panel is measured for each light shielding box 26 based on the strength of the reflected light. be done. Thus, the photo sensor 27 of each light-shielding box measures the pattern area, thereby measuring the pattern area ratio of the panel detection area A subjected to slit exposure.
特定のパネル検出域Aの絵柄面積率が測定され
ると、検査ヘツド10は次のパネル検出域の絵柄
面積率を測定するため移動される。実際には、パ
ネル検出域Aの絵柄(パターン)の面積率は光学
的検出装置22により瞬時に測定されるので、検
出ヘツド10は連続的に移動走査される。 Once the picture area ratio of a particular panel detection area A has been measured, the inspection head 10 is moved to measure the picture area ratio of the next panel detection area. Actually, since the area ratio of the picture (pattern) in the panel detection area A is instantaneously measured by the optical detection device 22, the detection head 10 is continuously moved and scanned.
しかして、検査ヘツド10の移動走査により、
パネル14は各検出域毎に絵柄の面積率が測定さ
れる。 Therefore, due to the moving scanning of the inspection head 10,
On the panel 14, the area ratio of the pattern is measured for each detection area.
なお、マスクの直線部は断面がストレートな一
直線である必要はかならずしもなく、断面が直線
に近似していればよく、またなめらかであれば湾
曲していてもよい。 Note that the straight section of the mask does not necessarily have to be a straight straight line; it is sufficient if the cross section approximates a straight line, and it may be curved as long as it is smooth.
さらに、光学的検出装置の各遮光ボツクス内面
を黒色塗布して、反射を防止する非反射面として
もよい。 Furthermore, the inner surface of each light-shielding box of the optical detection device may be coated with black to provide a non-reflective surface to prevent reflection.
以上に述べたようにこの発明に係る、パネルの
絵柄面積測定装置等用検出ヘツドにおいては、照
明光学系の照明用光源を覆うようにマスクを設
け、上記マスクはパネル面側に延び、パネル近接
位置においてスリツト露光させるように窓部を形
成したから、この窓部を通してパネルの検出域上
に照射光を確実に照射し、スリツト露光すること
ができる。そして、スリツト露光された検出域の
反射光が光学的検出装置に入射され、パネル検出
域以外の反射光はマスクで遮光されるので、パネ
ル検出域の検出精度が向上し、パネル検出域を効
率的かつ正確に光学的に測定することができる。 As described above, in the detection head for a panel pattern area measuring device, etc. according to the present invention, a mask is provided so as to cover the illumination light source of the illumination optical system, and the mask extends toward the panel surface and is close to the panel. Since the window portion is formed to perform slit exposure at the position, the irradiation light can be reliably irradiated onto the detection area of the panel through the window portion, and slit exposure can be performed. Then, the reflected light from the slit-exposed detection area enters the optical detection device, and the reflected light from areas other than the panel detection area is blocked by a mask, improving the detection accuracy of the panel detection area and making the panel detection area more efficient. can be measured optically and precisely.
また、線状照明光源を覆う曲線部とこの曲線部
からパネル面側に延びる直線部とを有するマスク
において、その直線部を照射光を吸収用非反射面
とした場合には、非反射面で反射した光が光学的
検出装置に直接案内されることは全くない。した
がつて、直線部からの反射光等の外乱が光学的検
出装置に案内されることがなく、パネル検出域の
検出精度をより向上させることができる。 In addition, in a mask that has a curved part that covers the linear illumination light source and a straight part that extends from this curved part to the panel surface side, if the straight part is used as a non-reflective surface for absorbing the irradiated light, the non-reflective surface No reflected light is guided directly to the optical detection device. Therefore, disturbances such as reflected light from the straight portion are not guided to the optical detection device, and the detection accuracy of the panel detection area can be further improved.
第1図はこの発明に係る検査ヘツドを用いたパ
ネルの絵柄面積測定装置を示す全体斜視図、第2
図はこの発明に係るパネルの絵柄面積測定装置等
用検査ヘツドの原理図、第3図は上記検査ヘツド
の下半分を部分的に示す図、第4図は第3図の
−線に沿う断面図、第5図は検査ヘツドの照明
光学系からの照射光の反射原理を示す第4図と同
様な断面図である。
10……検査ヘツド、11……本体ハウジン
グ、12……テーブル、14……パネル、20…
…ケーシング、21……照明光学系、22……光
学的検出装置、23……螢光灯、26……遮光ボ
ツクス、27……光センサ、28……スリツト、
30……マスク、31……曲線部、31A……反
射面、32……直線部、32A……非反射面、3
5……窓部、A……パネルの検出域。
FIG. 1 is an overall perspective view showing a panel pattern area measuring device using an inspection head according to the present invention, and FIG.
The figure is a principle diagram of an inspection head for a panel picture area measuring device, etc. according to the present invention, FIG. 3 is a partial view of the lower half of the inspection head, and FIG. 4 is a cross section taken along the - line in FIG. 3. 5 is a sectional view similar to FIG. 4 showing the principle of reflection of irradiated light from the illumination optical system of the inspection head. 10... Inspection head, 11... Main body housing, 12... Table, 14... Panel, 20...
... Casing, 21 ... Illumination optical system, 22 ... Optical detection device, 23 ... Fluorescent lamp, 26 ... Light shielding box, 27 ... Light sensor, 28 ... Slit,
30...Mask, 31...Curved part, 31A...Reflective surface, 32...Straight line part, 32A...Non-reflective surface, 3
5... Window section, A... Panel detection area.
Claims (1)
のパネルに照射光を照射する照射光学系と、照射
されたパネルからの反射光を検出するためケーシ
ング内に収容された光学的検出装置とを有するパ
ネルの絵柄面積測定装置等用検査ヘツドにおい
て、前記照射光学系はケーシングの下部に並設さ
れた複数本の線状照明用光源を有する一方、光学
的検出装置は各線状照明用光源間の上方において
ケーシング内に収容されており、前記各線状照明
用光源を外側方から覆うようにマスクが設けら
れ、前記各マスクは前記各線状照明用光源を覆い
かつパネル面側に向つて開口する円弧状あるいは
楕円状曲線部と、この曲線部の一端からパネル面
側に向つて斜めに延び、パネル面近接位置で終端
する直線部とを有し、隣合う直線部間にパネル面
検出域をスリツト露光させるように矩形の窓部が
形成され、前記マスクの曲線部は前記線状照明用
光源からの照射光を反射する反射面に、直線部は
照射光を吸収する非反射面としてそれぞれ形成さ
れたパネルの絵柄面積測定装置等用検査ヘツド。1 A panel having an irradiation optical system that irradiates a panel such as an offset printing plate placed on a table with irradiation light, and an optical detection device housed in a casing to detect reflected light from the irradiated panel. In the inspection head for a picture area measuring device, etc., the irradiation optical system has a plurality of linear illumination light sources arranged in parallel at the bottom of the casing, while the optical detection device has a plurality of linear illumination light sources arranged in parallel at the bottom of the casing, while the optical detection device has a plurality of linear illumination light sources arranged in parallel at the bottom of the casing. A mask is housed in a casing and is provided to cover each of the linear illumination light sources from the outside, and each mask has an arc-shaped or It has an elliptical curved section and a straight section that extends obliquely from one end of the curved section toward the panel surface and terminates at a position close to the panel surface, and exposes the panel surface detection area to slit exposure between adjacent straight sections. A panel in which a rectangular window portion is formed as shown in FIG. Inspection head for picture area measuring devices, etc.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55151621A JPS5774606A (en) | 1980-10-29 | 1980-10-29 | Inspection head for panel pattern area measuring apparatus or the like |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55151621A JPS5774606A (en) | 1980-10-29 | 1980-10-29 | Inspection head for panel pattern area measuring apparatus or the like |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5774606A JPS5774606A (en) | 1982-05-10 |
| JPS6337882B2 true JPS6337882B2 (en) | 1988-07-27 |
Family
ID=15522537
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55151621A Granted JPS5774606A (en) | 1980-10-29 | 1980-10-29 | Inspection head for panel pattern area measuring apparatus or the like |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5774606A (en) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3754822A (en) * | 1971-02-26 | 1973-08-28 | Xerox Corp | Scanning system |
| JPS5444914A (en) * | 1977-09-14 | 1979-04-09 | Mitsuo Tanaka | Method of easily adjusting ink in flat plate printing |
-
1980
- 1980-10-29 JP JP55151621A patent/JPS5774606A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5774606A (en) | 1982-05-10 |
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