JPS6341880B2 - - Google Patents
Info
- Publication number
- JPS6341880B2 JPS6341880B2 JP10423883A JP10423883A JPS6341880B2 JP S6341880 B2 JPS6341880 B2 JP S6341880B2 JP 10423883 A JP10423883 A JP 10423883A JP 10423883 A JP10423883 A JP 10423883A JP S6341880 B2 JPS6341880 B2 JP S6341880B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- compartment
- light source
- discharge
- high frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000758 substrate Substances 0.000 claims description 24
- 239000007789 gas Substances 0.000 claims description 14
- 239000012495 reaction gas Substances 0.000 claims description 8
- 230000003287 optical effect Effects 0.000 claims description 7
- 239000010409 thin film Substances 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 239000013078 crystal Substances 0.000 description 9
- 230000007547 defect Effects 0.000 description 6
- 239000000376 reactant Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 1
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
- C30B25/105—Heating of the reaction chamber or the substrate by irradiation or electric discharge
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Description
【発明の詳細な説明】 本発明は光CVD装置に関する。[Detailed description of the invention] The present invention relates to an optical CVD apparatus.
従来、薄膜形成の方法として、反応ガスを熱分
解反応或はプラズマ分解反応させ、その反応物の
結晶を基板上に成長させて薄膜を得るCVD
(Chemical Vapor Deposition)法が知られてい
る。而してこれらの方法では基板表面を約500℃
から700℃に加熱しなければ反応物の結晶が成長
せず良質の薄膜が形成されないが、こうした温度
では基板内からその組成原子が脱離する現象すな
わち基板結晶の誘起欠陥現象を生じ、不良の超
LSIや化合物半導体が製造され勝ちである不都合
がある。 Conventionally, as a method for forming thin films, CVD involves subjecting a reactive gas to a thermal decomposition reaction or plasma decomposition reaction, and growing crystals of the reactant on a substrate to form a thin film.
(Chemical Vapor Deposition) method is known. In these methods, the substrate surface is heated to approximately 500℃.
If the reactant is not heated to 700°C, the crystals of the reactant will not grow and a good quality thin film will not be formed. However, at such a temperature, the constituent atoms of the reactant will be removed from the substrate, that is, an induced defect phenomenon in the substrate crystal will occur, leading to defects. Hyper
There is a disadvantage that LSI and compound semiconductors are manufactured and prevail.
かかる不都合の解消のために第1図示のような
紫外線、レーザー光線等の光を光源aから基板b
に当て、基板bの近傍の反応ガス分子を励起する
とともに基板bの表面をも励起して結晶成長を行
なう光CVD法が提案され、これによれば基板表
面の温度を基板結晶の誘起欠陥を生じない程度の
低い温度としても基板上に反応物の結晶を成長さ
せ得て有利である。 In order to eliminate this inconvenience, light such as ultraviolet rays or laser beams is transmitted from light source a to substrate b as shown in the first diagram.
For this purpose, an optical CVD method has been proposed in which crystal growth is performed by exciting reactive gas molecules near substrate b and also exciting the surface of substrate b. According to this method, the temperature of the substrate surface is controlled to reduce the induced defects in the substrate crystal. It is advantageous that crystals of the reactant can be grown on the substrate even at a temperature so low that it does not occur.
しかし乍らこの光CVD法ではレーザー光線等
の光源のための電源を設備しなければならない不
便がある。 However, this optical CVD method has the inconvenience of requiring a power source for a light source such as a laser beam.
本発明はこうした不便のない光CVD装置を提
供することを目的としたもので、反応ガスが流れ
る区画室内に、基板と該区画室の外部の高周波コ
イルで加熱されるヒータとを設け、該反応ガスに
化学反応を生じさせるべく光源から光を照射し、
該基板上に反応物の薄膜を形成する式のものに於
て、該光源を、該区画室の外周に設けた前記高周
波コイルの高周波で発光するHeその他の放電ガ
スが流通する放電室で構成して成る。 The purpose of the present invention is to provide an optical CVD apparatus free from such inconveniences, and a substrate and a heater heated by a high-frequency coil outside the compartment are provided in a compartment through which a reaction gas flows, and the reaction gas is heated by a high-frequency coil. Irradiates light from a light source to cause a chemical reaction in the gas,
In the type of forming a thin film of a reactant on the substrate, the light source is constituted by a discharge chamber through which He or other discharge gas that emits light at a high frequency of the high frequency coil provided on the outer periphery of the compartment chamber flows. It consists of
本発明の実施例を図面を参照して説明する。第
2図に於て1は左右に反応ガスの注入口2と排出
口3を設けた横長の透明ガラス製の区画室、4は
該区画室1内に設けた導電性材料からなる台状の
ヒータ、5は該ヒータ4上に載置されたシリコン
その他の基板を示し、該注入口2から例えばアル
シン、トリメチルガリウム、トリメチルアルミニ
ウム等の組成を有する混合ガスが該区画室1内で
10Torr乃至760Torrの圧力になるように注入さ
れる。6は該区画室1の外周にこれを囲繞して形
成した光源7を構成する放電室でその内部には
H2、He、Ne或はAr等の放電ガスが0.01乃至
1Torrの圧力で流入口8から流出口9へと循環供
給される。該放電室6内のガスはその外周の高周
波コイル10への通電によりグロー放電し、その
放電光が区画室1内の反応ガスおよび基板5を励
起する。該高周波コイル10には基板5の結晶の
欠陥を生じない程度の例えば560℃にヒータ4が
加熱されるように電流、周波数等を制御した電力
が供給される。励起した反応ガスは基板5と反応
し、基板5の表面に付着成長し、例えばエピタキ
シヤル膜を形成する。 Embodiments of the present invention will be described with reference to the drawings. In Fig. 2, 1 is an oblong transparent glass compartment with reaction gas inlets 2 and exhaust ports 3 on the left and right sides, and 4 is a platform-shaped compartment made of a conductive material provided inside the compartment 1. A heater 5 indicates a silicon or other substrate placed on the heater 4, and a mixed gas having a composition of, for example, arsine, trimethylgallium, trimethylaluminum, etc. is injected into the compartment 1 from the inlet 2.
It is injected to a pressure of 10 Torr to 760 Torr. Reference numeral 6 denotes a discharge chamber constituting a light source 7 formed around the outer periphery of the compartment 1;
Discharge gas such as H 2 , He, Ne or Ar is 0.01~
It is circulated and supplied from the inlet 8 to the outlet 9 at a pressure of 1 Torr. The gas in the discharge chamber 6 glow discharges by energizing the high frequency coil 10 on its outer periphery, and the discharge light excites the reaction gas and the substrate 5 in the compartment 1. The high frequency coil 10 is supplied with electric power whose current, frequency, etc. are controlled so that the heater 4 is heated to a temperature of, for example, 560° C., which does not cause crystal defects in the substrate 5. The excited reaction gas reacts with the substrate 5 and grows on the surface of the substrate 5, forming, for example, an epitaxial film.
該区画室1は第3図示のようにベル形の縦形に
形成することも可能であり、また基板5を載置す
るヒータ4を該区画室1に導入した駆動軸11で
旋回するようにしてもよい。尚、高周波コイル1
0は第4図、第5図示のようにグロー放電用のコ
イル10aとヒータ4の加熱用のコイル10bと
に区分し、コイル10bの高周波電力を制御して
ヒータ4の温度を制御することも出来る。その作
動を説明するに、放電室6にAr等の放電ガスを
流通させると共に高周波コイル10にヒータ4の
温度が基板5の結晶の欠陥を生じさせない程度の
温度となるように電力を供給すると、該基板5の
結晶は欠陥を誘起しない温度に加熱されると共に
該放電室6の放電ガスは該コイル10の磁界の作
用でグロー放電する。次で区画室1内に反応ガス
を注入すると該ガスは放電室6のグロー放電によ
る光で励起され、同時に励起された基板5の表面
で反応を起してそこに例えばエピタキシヤル膜を
形成する。 The compartment 1 can be formed vertically in a bell shape as shown in the third figure, and the heater 4 on which the substrate 5 is placed can be rotated by a drive shaft 11 introduced into the compartment 1. Good too. Furthermore, high frequency coil 1
0 is divided into a coil 10a for glow discharge and a coil 10b for heating the heater 4, as shown in FIGS. 4 and 5, and the temperature of the heater 4 can be controlled by controlling the high frequency power of the coil 10b. I can do it. To explain its operation, when a discharge gas such as Ar is passed through the discharge chamber 6 and electric power is supplied to the high frequency coil 10 so that the temperature of the heater 4 becomes a temperature that does not cause defects in the crystal of the substrate 5, The crystal of the substrate 5 is heated to a temperature that does not induce defects, and the discharge gas in the discharge chamber 6 glow discharges under the action of the magnetic field of the coil 10. Next, when a reactive gas is injected into the compartment 1, the gas is excited by the light generated by the glow discharge in the discharge chamber 6, and at the same time a reaction occurs on the excited surface of the substrate 5, forming, for example, an epitaxial film there. .
このように本発明によるときは反応ガスに照射
する光の光源を区画室の外周に設けた放電ガスが
流通する放電室で構成し、ヒータ加熱用の高周波
で該放電ガスを放電発光させるようにしたので、
光源を区画室と一体に形成出来別途に光源を設備
する必要がなく光源用の電源を特に設ける必要も
ないので光CVD装置の構成を簡略化し得組立も
容易になる等の効果がある。 In this way, according to the present invention, the light source for irradiating the reaction gas is configured with a discharge chamber provided on the outer periphery of a compartment chamber through which discharge gas flows, and the discharge gas is caused to discharge and emit light using high frequency waves for heating the heater. So,
Since the light source can be formed integrally with the compartment, there is no need to install a separate light source, and there is no need to specifically provide a power source for the light source, so the configuration of the optical CVD device can be simplified and assembly can be facilitated.
第1図は従来の光CVD装置の断面線図、第2
図は本発明装置の実施例の断面図、第3図乃至第
5図は夫々本発明の他の実施例の断面図を示す。
1…区画室、4…ヒータ、5…基板、6…放電
室、7…光源、10…高周波コイル。
Figure 1 is a cross-sectional diagram of a conventional optical CVD device, Figure 2
The figure shows a sectional view of an embodiment of the apparatus of the present invention, and FIGS. 3 to 5 show sectional views of other embodiments of the invention. DESCRIPTION OF SYMBOLS 1... Compartment chamber, 4... Heater, 5... Substrate, 6... Discharge chamber, 7... Light source, 10... High frequency coil.
Claims (1)
室の外部の高周波コイルで加熱されるヒータとを
設け、該反応ガスに化学反応を生じさせるべく光
源から光を照射し、該基板上に反応物の薄膜を形
成する式のものに於て、該光源を、該区画室の外
周に設けた前記高周波コイルの高周波で発光する
Heその他の放電ガスが流通する放電室で構成し
て成る光CVD装置。1. A substrate and a heater heated by a high-frequency coil outside the compartment are provided in a compartment through which a reaction gas flows, and light is irradiated from a light source to cause a chemical reaction in the reaction gas to cause a reaction on the substrate. In a type that forms a thin film of an object, the light source emits light at a high frequency from the high frequency coil provided on the outer periphery of the compartment.
An optical CVD device consisting of a discharge chamber through which He or other discharge gas flows.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10423883A JPS59232992A (en) | 1983-06-13 | 1983-06-13 | Optical cvd device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10423883A JPS59232992A (en) | 1983-06-13 | 1983-06-13 | Optical cvd device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59232992A JPS59232992A (en) | 1984-12-27 |
| JPS6341880B2 true JPS6341880B2 (en) | 1988-08-19 |
Family
ID=14375374
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10423883A Granted JPS59232992A (en) | 1983-06-13 | 1983-06-13 | Optical cvd device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59232992A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6193830A (en) * | 1984-10-15 | 1986-05-12 | Nec Corp | Optical gaseous phase growing method |
-
1983
- 1983-06-13 JP JP10423883A patent/JPS59232992A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59232992A (en) | 1984-12-27 |
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