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JPS634938B2 - - Google Patents
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JPS634938B2 - - Google Patents

Info

Publication number
JPS634938B2
JPS634938B2 JP57113141A JP11314182A JPS634938B2 JP S634938 B2 JPS634938 B2 JP S634938B2 JP 57113141 A JP57113141 A JP 57113141A JP 11314182 A JP11314182 A JP 11314182A JP S634938 B2 JPS634938 B2 JP S634938B2
Authority
JP
Japan
Prior art keywords
chuck table
wafer
outer periphery
vacuum
vacuum suction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57113141A
Other languages
Japanese (ja)
Other versions
JPS594045A (en
Inventor
Shigeo Inomata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57113141A priority Critical patent/JPS594045A/en
Publication of JPS594045A publication Critical patent/JPS594045A/en
Publication of JPS634938B2 publication Critical patent/JPS634938B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/78Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/50Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment

Landscapes

  • Jigs For Machine Tools (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Description

【発明の詳細な説明】 (1) 発明の技術分野 本発明は真空吸着固定装置、詳しくは半導体ウ
エハの如き薄い基板の切削工程において真空で基
板を吸着固着するチヤツクテーブルに関する。
DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a vacuum suction and fixing device, and more particularly to a chuck table that suctions and fixes a thin substrate such as a semiconductor wafer in a process of cutting the same.

(2) 技術の背景 半導体装置の製造工程において、露光、熱処
理、蒸着、化学気相成長(CVD)等のウエハ・
プロセスの施された例えば厚さ625μm程度のウエ
ハを、最終的なアセンブリイ(組立)の前に例え
ば490μmの厚さにまで切削することが行われ、か
かる切削は各種デバイスの作られた表面とは反対
側の裏面に対してなされる。
(2) Background of the technology In the manufacturing process of semiconductor devices, wafer processing such as exposure, heat treatment, vapor deposition, and chemical vapor deposition (CVD) is
Processed wafers with a thickness of, for example, 625 μm are cut to a thickness of, for example, 490 μm before final assembly. is done on the opposite back side.

ウエハ切削をなすための真空吸着固定装置を第
1図の模式的断面図を参照して説明すると、同図
において、12は切削されるべきウエハで、それ
は裏面を上にして真空吸着固定装置10の多孔質
材料で作られたチヤツクテーブル11上に置か
れ、装置10は回転するターンテーブル1上に搭
載されている。切削用のカツプホイール(砥石)
6はターンテーブル1の上方に配置され矢印に示
す方向に高速回転する。なお同図において、3は
モータ、2はスピンドル、4はスピンドル2を上
下さすための駆動手段、5は台を示す。スピンド
ル2内にはモータ3の回転をカツプホイール6に
伝導するための機構が内蔵されている。なお同図
の1点鎖線はターンテーブル1の中心線を示す。
A vacuum suction fixing device for cutting a wafer will be explained with reference to the schematic cross-sectional view of FIG. The device 10 is placed on a chuck table 11 made of a porous material, and the device 10 is mounted on a rotating turntable 1. Cup wheel (grindstone) for cutting
6 is placed above the turntable 1 and rotates at high speed in the direction shown by the arrow. In the figure, 3 is a motor, 2 is a spindle, 4 is a driving means for moving the spindle 2 up and down, and 5 is a stand. A mechanism for transmitting the rotation of the motor 3 to the cup wheel 6 is built into the spindle 2 . Note that the dashed-dotted line in the same figure indicates the center line of the turntable 1.

ターンテーブル1は第2図の模式的平面図に示
される如き構成のもので、その上に複数個の真空
吸着固定装置10が搭載され、ターンテーブル1
およびカツプホイール6はそれぞれ矢印に示す方
向に回転する。なお第2図以下において既に示さ
れたものと同じ部分は同じ符号を付して示す。
The turntable 1 has a configuration as shown in the schematic plan view of FIG. 2, on which a plurality of vacuum suction fixing devices 10 are mounted,
and cup wheel 6 rotate in the directions shown by the arrows. Note that in FIG. 2 and subsequent figures, the same parts as those already shown are designated by the same reference numerals.

真空吸着固定装置10は第3図の断面図に示さ
れる構成のもので、固定手段17によつて一体的
に固定された下方テーブル16と上方テーブル1
8から成り、上方テーブル18上には多孔質チヤ
ツクテーブルが配置され、ウエハ12は、排気ダ
クト15から図に矢印で示す方向に排気し真空室
19を真空にすることによつてチヤツクテーブル
11上に吸着固定される。真空を保つため、チヤ
ツクテーブル11の外周にはプラスチツクカバー
13が塗つてあり、加えて、チヤツクテーブル1
1の外縁に沿つて密封用のプラスチツク14が含
浸されている。
The vacuum suction fixing device 10 has the configuration shown in the cross-sectional view of FIG.
A porous chuck table is disposed on the upper table 18, and the wafer 12 is evacuated from the exhaust duct 15 in the direction shown by the arrow in the figure to evacuate the vacuum chamber 19. 11 by suction and fixation. In order to maintain the vacuum, a plastic cover 13 is applied to the outer periphery of the chuck table 11.
A sealing plastic 14 is impregnated along the outer edge of 1.

(3) 従来技術と問題点 従来技術におけるウエハの切削を第4図の断面
図を参照して説明すると、ウエハ12は図に見て
上面が切削されるべき裏面であり、矢印の示す方
向に動かされ、カツプホイール6の歯先7がウエ
ハを例えば200μm程度切削する。このとき、ウエ
ハ12の12′で示す部分は破砕され、面12が
鏡面仕上げに近い程度に平坦に形成される。なお
同図に8で示す部分は歯先7を保持するカツプ
で、カツプホイール6は軸9を介してスピンドル
2に連結される。1点鎖線はカツプホイールの中
心線を示す。第1図に戻つて、真空排気によつて
Vなる力が矢印方向に働くとき、Vは横方向(水
平方向)力F2と上方向力F1とに分解される。
図示の装置を用いた実験において、F2≫F1で
あることが確認されているが、かかる力関係が成
立するため第4図に示す如きウエハの切削が可能
である。
(3) Prior Art and Problems Wafer cutting in the prior art will be explained with reference to the cross-sectional view in FIG. The tip 7 of the cup wheel 6 cuts the wafer by about 200 μm, for example. At this time, a portion of the wafer 12 indicated by 12' is crushed, and the surface 12 is formed flat to a degree close to a mirror finish. The portion indicated by 8 in the figure is a cup that holds the tooth tips 7, and the cup wheel 6 is connected to the spindle 2 via a shaft 9. The dash-dotted line indicates the center line of the cup wheel. Returning to FIG. 1, when a force V acts in the direction of the arrow due to evacuation, V is decomposed into a lateral (horizontal) force F2 and an upward force F1.
In experiments using the illustrated apparatus, it has been confirmed that F2>>F1, and since such a force relationship holds, it is possible to cut a wafer as shown in FIG. 4.

上記したカツプホイールの長期にわたる使用
(ウエハの切削)があると、切削に際し使用する
研摩液のチヤツクテーブル11内へのしみ込みが
あり、また、ウエハ12とチヤツクテーブル11
の接触によるチヤツクテーブル11の外縁部分の
磨耗または脱落があり、それが原因となつて、チ
ヤツクテーブル11の外周が変形し、ウエハが割
れたり欠けたりすること、および、チヤツクテー
ブルの外縁部分にはプラスチツクが含浸させてあ
るにもかかわらず、真空漏れ(バキユームリー
ク)があり、ウエハの吸着が十分でなくなる例が
経験された。これら障害中で、ウエハの割れまた
は欠けは、当該ウエハに対して既にウエハプロセ
スが終了しているのであるから、その損失は大で
ある。
When the above-mentioned cup wheel is used for a long period of time (wafer cutting), the polishing liquid used during cutting may seep into the chuck table 11, and the wafer 12 and chuck table 11 may be damaged.
The outer edge of the chuck table 11 may be worn or fall off due to contact with the outer edge of the chuck table 11, which may cause the outer periphery of the chuck table 11 to deform and crack or chip the wafer. Even though the parts were impregnated with plastic, there was a vacuum leak (vacuum leak), and there were cases where the wafer suction was not sufficient. Among these failures, if the wafer is cracked or chipped, the loss is significant because the wafer process has already been completed for the wafer.

(4) 発明の目的 本発明は上記従来の問題点に鑑み、ウエハに対
する吸着力が十分であり、ウエハに対する損傷を
与えることなく、またそれ自体の磨耗または欠落
のないチヤツクテーブルを具備した真空吸着固定
装置を提供するにある。
(4) Purpose of the Invention In view of the above-mentioned conventional problems, the present invention provides a vacuum equipped with a chuck table that has sufficient suction power to wafers, does not damage the wafers, and does not wear or break itself. To provide a suction fixing device.

(5) 発明の構成 そしてこの目的は本発明によれば、空気を通さ
ない強度の高い金属またはセラミツク材料の外周
部でその周囲を密接に囲んだチヤツクテーブルを
用意し、この外周部がチヤツクテーブルおよび装
置の上方テーブルと係合する構成とした真空吸着
手段を提供することによつて達成される。
(5) Structure of the Invention According to the present invention, a chuck table is provided whose periphery is closely surrounded by an outer periphery of a high-strength metal or ceramic material that does not allow air to pass through, and this outer periphery is made of a chuck table. This is accomplished by providing a vacuum suction means configured to engage the pick table and the upper table of the device.

(6) 発明の実施例 以下本発明の実施例を図面によつて詳述する。(6) Examples of the invention Embodiments of the present invention will be described in detail below with reference to the drawings.

第5図に本発明にかかる真空吸着固定装置が断
面で示され、この装置30は、チヤツクテーブル
21を除く他の部分は第3図に示された従来の装
置と同様であるので、既に示した部分と同じ部分
は同一符号を付して示し、また各部の構成、機能
は従来装置の場合と全く同様であるのでその詳細
な説明は省略する。
FIG. 5 shows a cross section of the vacuum suction fixing device according to the present invention. This device 30 is similar to the conventional device shown in FIG. 3 except for the chuck table 21, so The same parts as those shown are indicated by the same reference numerals, and the configuration and function of each part is completely the same as that of the conventional device, so a detailed explanation thereof will be omitted.

図示の実施例において、多孔質材料(例えばセ
ラミツク)で形成したチヤツクテーブル21の周
縁は、強度の高い、かつ、十分に密で空気を通さ
ない金属で作られた外周部20で囲む。外周部2
0はチヤツクテーブル21ときわめて密に隣接す
るよう形成する。外周部20の材料は上記の条件
を満たすものであればよく、空気を通さないセラ
ミツクも使用可能である。同図から理解され得る
如く、チヤツクテーブル21と外周部20との密
接性を保証するため、外周部20の下方部分は上
方テーブル18とかみ合い、またその中央部分は
内方に段差を形成しこの段差部分がチヤツクテー
ブル21の下方部分とかみ合う構成とする。ま
た、チヤツクテーブル21の上に置かれるウエハ
は、その外周が外周部20の上表面のほぼ中央に
のるよう外周部の寸法を前以て設定する。
In the illustrated embodiment, the periphery of the chuck table 21, which is formed of a porous material (e.g. ceramic), is surrounded by an outer periphery 20 made of a strong, sufficiently dense and airtight metal. Outer periphery 2
0 is formed so as to be very closely adjacent to the chuck table 21. The material for the outer circumferential portion 20 may be any material that satisfies the above conditions, and it is also possible to use ceramics that do not allow air to pass through. As can be understood from the figure, in order to ensure close contact between the chuck table 21 and the outer peripheral part 20, the lower part of the outer peripheral part 20 engages with the upper table 18, and the central part thereof forms a step inward. This stepped portion is configured to engage with the lower portion of the chuck table 21. Further, the dimensions of the outer periphery of the wafer to be placed on the chuck table 21 are set in advance so that the outer periphery of the wafer rests on approximately the center of the upper surface of the outer periphery 20.

上記の如き外周部20を設けることにより、排
気ダクト15から排気するとき、チヤツクテーブ
ル21は真空室19によつて吸着され、またチヤ
ツクテーブル21は多孔性であるので、ウエハ1
2はチヤツクテーブル21に向け吸着され固定さ
れる。ウエハ12、チヤツクテーブル21、外周
部20の上記した構成により、研摩液がチヤツク
テーブルにしみ込むことは減少され、ウエハの外
縁は固い外周部20の表面上にのつているから、
チヤツクテーブルの磨耗、脱落はほとんど発生す
ることなく、ウエハは常に平坦なチヤツクテーブ
ル21上に平に配置され、吸着力はウエハ全体に
対し均一に働き、ウエハの割れ、欠落の危険は著
しく減少せしめられた。
By providing the outer peripheral portion 20 as described above, the chuck table 21 is attracted by the vacuum chamber 19 when exhausting from the exhaust duct 15, and since the chuck table 21 is porous, the wafer 1
2 is attracted and fixed toward the chuck table 21. The above-described configuration of the wafer 12, chuck table 21, and outer circumferential portion 20 reduces the possibility of polishing liquid seeping into the chuck table, and the outer edge of the wafer rests on the hard surface of the outer circumferential portion 20.
The chuck table rarely wears or falls off, the wafer is always placed flat on the flat chuck table 21, and the suction force acts uniformly on the entire wafer, so there is no significant risk of cracking or chipping of the wafer. decreased.

また、外周部の構造は段差2つを構成するだけ
であり、材料も金属またはセラミツクであるの
で、製作上従来技術における場合に比べ特に難し
い問題はない。
In addition, since the structure of the outer peripheral portion consists of only two steps and the material is metal or ceramic, there are no particularly difficult problems in manufacturing compared to the case of the prior art.

(7) 発明の効果 以上、詳細に説明したように、本発明にかかる
真空吸着固定装置においては、チヤツクテーブル
をそれと密接する金属またはセラミツク製の外周
部で囲むことによつて、チヤツクテーブルの磨耗
が防止されるだけでなく、チヤツクテーブルが常
に平坦に完全な状態で保たれるのでウエハの割れ
等の損傷が回避され、半導体装置の製造歩留りの
向上に効果大である。なお、上記においてはウエ
ハの切削を例にとつて説明したが、本発明の適用
範囲はそれに限定されるものではなく、ウエハ以
外の基板に対する加工に用いる装置にも及ぶもの
である。
(7) Effects of the Invention As explained above in detail, in the vacuum suction fixing device according to the present invention, the chuck table is surrounded by an outer peripheral part made of metal or ceramic that is in close contact with the chuck table. In addition to preventing wear of the chuck table, the chuck table is always kept flat and perfect, thereby avoiding damage such as cracking of the wafer, which is highly effective in improving the manufacturing yield of semiconductor devices. Note that although the above description has been made by taking wafer cutting as an example, the scope of application of the present invention is not limited thereto, and extends to apparatuses used for processing substrates other than wafers.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はウエハの切削装置の概略断面図、第2
図は第1図の装置と共に用いられるターンテーブ
ルの平面図、第3図は従来の真空吸着固定装置の
概略断面図、第4図はウエハの切削を示す概略断
面図、第5図は本発明にかかる真空吸着固定手段
の断面図である。 1…ターンテーブル、2…スピンドル、3…モ
ータ、4…駆動手段、5…台、6…カツプホイー
ル、7…歯先、8…カツプ、9…軸、10,30
…真空吸着固定装置、11,21…チヤツクテー
ブル、12…ウエハ、13…プラスチツクカバ
ー、14…密封用プラスチツク、15…排気ダク
ト、16…下方テーブル、17…固定手段、18
…上方テーブル、19…真空室、20…外周部。
Figure 1 is a schematic cross-sectional view of the wafer cutting device, Figure 2
The figure is a plan view of a turntable used with the device shown in Figure 1, Figure 3 is a schematic sectional view of a conventional vacuum suction fixing device, Figure 4 is a schematic sectional view showing cutting of a wafer, and Figure 5 is a schematic sectional view of the present invention. It is a sectional view of the vacuum adsorption fixing means concerning this. DESCRIPTION OF SYMBOLS 1... Turntable, 2... Spindle, 3... Motor, 4... Driving means, 5... Stand, 6... Cup wheel, 7... Tooth tip, 8... Cup, 9... Shaft, 10, 30
... Vacuum suction fixing device, 11, 21... Chack table, 12... Wafer, 13... Plastic cover, 14... Sealing plastic, 15... Exhaust duct, 16... Lower table, 17... Fixing means, 18
...Upper table, 19...Vacuum chamber, 20...Outer periphery.

Claims (1)

【特許請求の範囲】[Claims] 1 一体に固定された上方テーブルと下方テーブ
ルによつて上方テーブルに設けた真空室を排気す
る構成とし、上方テーブル上に設けた多孔質のチ
ヤツクテーブル上に被処理基板を吸着固定する真
空吸着固定手段において、前記チヤツクテーブル
は外周部で囲まれ、該外周部は空気を通し難い材
料で作られたものであり、外周部の下方部分は上
方テーブルとかみ合い係合をなし、外周部中央部
分は内方に段差を形成し、この段差部分がチヤツ
クテーブルの下方部分とかみ合つて係合する構成
としたことを特徴とする真空吸着固定装置。
1 A vacuum chamber provided on the upper table is evacuated by an upper table and a lower table fixed together, and a vacuum suction system is used to suction and fix the substrate to be processed onto a porous chuck table provided on the upper table. In the fixing means, the chuck table is surrounded by an outer periphery, the outer periphery is made of a material that is difficult to pass through air, a lower portion of the outer periphery is in meshing engagement with the upper table, and a central portion of the outer periphery is A vacuum suction fixing device characterized in that the portion has a step formed inwardly, and the step portion is configured to mesh with and engage with a lower portion of the chuck table.
JP57113141A 1982-06-30 1982-06-30 Vacuum attracting and fixing means Granted JPS594045A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57113141A JPS594045A (en) 1982-06-30 1982-06-30 Vacuum attracting and fixing means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57113141A JPS594045A (en) 1982-06-30 1982-06-30 Vacuum attracting and fixing means

Publications (2)

Publication Number Publication Date
JPS594045A JPS594045A (en) 1984-01-10
JPS634938B2 true JPS634938B2 (en) 1988-02-01

Family

ID=14604600

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57113141A Granted JPS594045A (en) 1982-06-30 1982-06-30 Vacuum attracting and fixing means

Country Status (1)

Country Link
JP (1) JPS594045A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014028418A (en) * 2012-07-31 2014-02-13 Mitsuboshi Diamond Industrial Co Ltd Method of manufacturing suction table and the suction table

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107414552B (en) * 2017-08-22 2019-01-01 大连理工大学 A kind of adjustable suction jig for Milling Process carbon fibre composite

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5813034B2 (en) * 1977-01-20 1983-03-11 株式会社東芝 semiconductor radiation detector
JPS5390871A (en) * 1977-01-21 1978-08-10 Toyo Dengu Seisakushiyo Kk Device for chucking semiconductor wafer
JPS5833705Y2 (en) * 1980-05-23 1983-07-28 株式会社 デイスコ Adsorption fixing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014028418A (en) * 2012-07-31 2014-02-13 Mitsuboshi Diamond Industrial Co Ltd Method of manufacturing suction table and the suction table

Also Published As

Publication number Publication date
JPS594045A (en) 1984-01-10

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