Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6360375B2 - - Google Patents
[go: Go Back, main page]

JPS6360375B2 - - Google Patents

Info

Publication number
JPS6360375B2
JPS6360375B2 JP55020501A JP2050180A JPS6360375B2 JP S6360375 B2 JPS6360375 B2 JP S6360375B2 JP 55020501 A JP55020501 A JP 55020501A JP 2050180 A JP2050180 A JP 2050180A JP S6360375 B2 JPS6360375 B2 JP S6360375B2
Authority
JP
Japan
Prior art keywords
oxygen
sample
exposure
coating film
pgma
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55020501A
Other languages
Japanese (ja)
Other versions
JPS56117235A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2050180A priority Critical patent/JPS56117235A/en
Publication of JPS56117235A publication Critical patent/JPS56117235A/en
Publication of JPS6360375B2 publication Critical patent/JPS6360375B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Description

【発明の詳細な説明】 本発明は、パターン形成方法に関する。より詳
しくはポリグリシジルメタクリレート(以下
PGMAと略す)を用いたパターン形成方法に関
する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a pattern forming method. For more details, refer to polyglycidyl methacrylate (below)
This invention relates to a pattern forming method using PGMA (abbreviated as PGMA).

PGMAは、例えばカラー撮像管用カラーフイ
ルターの製造プロセスにおいて染料によるフイル
ターの混色を防止する目的で設けられている保護
膜などに用いられている。PGMAは、塗布後加
熱することにより耐水性を示す様になるので保護
膜として良好な性質を示す。そして遠紫外光
(Deep UV、200〜300nm)照射によりポジレジ
ストとしての特性を示すので、これを利用してボ
ンデイングパツド部分などの保護膜の不要部分の
みを取り除くことができる。
PGMA is used, for example, in a protective film provided for the purpose of preventing color mixing of the filter due to dye in the manufacturing process of color filters for color image pickup tubes. PGMA exhibits good properties as a protective film because it becomes water resistant when heated after coating. When irradiated with deep UV light (200 to 300 nm), it exhibits the properties of a positive resist, and this can be used to remove only unnecessary portions of the protective film, such as bonding pads.

従来、レジストの露光方法として、マスクとレ
ジストを密着する方法を採用していたが、露光部
のレジストが完全には取り切れないという問題点
を含んでいた。その原因を検討した結果、空気中
の酸素の影響であることが実験的に明らかになつ
た。第1図にその様子を示す。PGMAのメチル
セロソルブアセテート溶液を回転塗布法によりSi
ウエハ上に約0.7μmの厚みで塗布し、200℃1時
間空気中でベークすることにより、PGMAを熱
架橋させ強固な膜とさせ試料とした。この膜に
3kWのXeランプを光源とし、水フイルタを介し、
熱線を除去した状態の遠紫外光を用いて露光し、
ついでメチルエチルケトン・エタノール(5:
2)の混合液で現像した。この場合の膜厚と露光
量との関係を示すものが第1図の曲線2である。
これは試料が純窒素にさらされる条件において露
光したものである。この様に、酸素が存在しない
条件下においては露光量が多くなるとネガ的性質
が生じ、現像によつて除去できない塗膜が残る。
これは、光により生じたネガ的性質を示す活性
種、おそらくラジカルと思われる活性種に起因す
るものと考えられる。
Conventionally, as a resist exposure method, a method in which a mask and a resist are brought into close contact has been adopted, but this method has had the problem that the resist in exposed areas cannot be completely removed. As a result of investigating the cause, it was experimentally revealed that it was the effect of oxygen in the air. Figure 1 shows the situation. Si was coated with PGMA methyl cellosolve acetate solution by spin coating method.
It was coated on a wafer to a thickness of about 0.7 μm and baked in air at 200° C. for 1 hour to thermally crosslink the PGMA and form a strong film, which was then used as a sample. to this membrane
A 3kW Xe lamp is used as the light source, and the light is passed through a water filter.
Exposure using far ultraviolet light with heat rays removed,
Then methyl ethyl ketone/ethanol (5:
Developed with the mixed solution of 2). Curve 2 in FIG. 1 shows the relationship between film thickness and exposure amount in this case.
This was done under conditions where the sample was exposed to pure nitrogen. Thus, under conditions in the absence of oxygen, higher exposures result in negative properties, leaving a coating that cannot be removed by development.
This is considered to be due to active species exhibiting negative properties caused by light, possibly radicals.

酸素を含まないふん囲気下で露光しても、ある
極めて限られた露光量の範囲においては膜厚を0
とすることができる。しかしながら工業的にはあ
る大きさの試料が必要であり、このような試料を
照射するときは試料の中央部と周辺部で露光量が
異なつてくる。また塗膜の厚み、基板の状態、露
光部の面積などの差によつて実際にある部分がう
ける露光量は多少の差が生じる。また作業上の時
間的余裕も必要である。それ故上記の極めて限ら
た露光量の範囲で塗膜を照射しても、塗膜のすべ
ての面がこの露光量で照射されていないのでごく
わずかの部分は塗膜が残り、いわゆる抜け不良と
いわれる状態となる。
Even if exposed in an oxygen-free atmosphere, the film thickness may be reduced to 0 within a very limited range of exposure.
It can be done. However, industrially, a sample of a certain size is required, and when such a sample is irradiated, the amount of exposure differs between the center and the periphery of the sample. Further, the amount of exposure that a certain part actually receives varies to some extent due to differences in the thickness of the coating film, the condition of the substrate, the area of the exposed area, etc. It is also necessary to have sufficient time for the work. Therefore, even if the paint film is irradiated within the extremely limited exposure range mentioned above, not all surfaces of the paint film will be irradiated with this exposure amount, so a very small portion of the paint film will remain, which is called a failure to remove the paint. It becomes a state of being exposed.

本発明は、上記問題を解決すること、すなわち
所望のパターン通りにパターンを形成することを
目的とする。
The present invention aims to solve the above problem, that is, to form a pattern according to a desired pattern.

本発明の特徴は、基板上にポリグリシジルメタ
クリレートの塗膜を形成する工程と、上記塗膜に
酸素を含む雰囲気中で所定のパターンを有する遠
紫外光照射する工程と、現像によつて塗膜の遠紫
外光照射部分を除去する工程とよりなるパターン
形成方法にある。
The features of the present invention include a step of forming a coating film of polyglycidyl methacrylate on a substrate, a step of irradiating the coating film with deep ultraviolet light having a predetermined pattern in an oxygen-containing atmosphere, and a step of developing the coating film. The pattern forming method includes the step of removing the far-ultraviolet irradiated portion of the pattern.

本発明のパターン形成方法は、酸素を含むふん
囲気中、例えば空気中で露光することを特徴とす
る。第1図の曲線1は、試料が純酸素にさらされ
る条件で露光したものである。このように酸素の
存在下では、光によつて生じたネガ的性質を示す
活性種が酸素により失活するためと考えられる。
それ故マスクと試料を密着させずマスクと試料の
間に空気が充分存在する条件により露光するこ
と、例えば50μmのスペースを取り露光すること
によつて、従来のPGMAの抜け不良は改善され
た。この時のPGMAレジストの解像度は約20μm
である。マスクと試料との間隔は20μm以上が望
ましい。一方、スペースが大きくなるとレジスト
の解像度が悪くなるため実用的には50μm程度が
限度と思われる。
The pattern forming method of the present invention is characterized in that exposure is performed in an atmosphere containing oxygen, for example, in air. Curve 1 in FIG. 1 was obtained when the sample was exposed to pure oxygen. This is thought to be because, in the presence of oxygen, active species exhibiting negative properties generated by light are deactivated by oxygen.
Therefore, by exposing the mask and sample under conditions where there is sufficient air between the mask and the sample without bringing them into close contact, for example, by leaving a space of 50 μm, the problem of the conventional PGMA coming out problem has been improved. The resolution of the PGMA resist at this time is approximately 20 μm.
It is. The distance between the mask and the sample is preferably 20 μm or more. On the other hand, as the space becomes larger, the resolution of the resist deteriorates, so the practical limit seems to be about 50 μm.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明と従来例との差を説明するた
めの説明図である。
FIG. 1 is an explanatory diagram for explaining the difference between the present invention and a conventional example.

Claims (1)

【特許請求の範囲】[Claims] 1 基板上にポリグリシジルメタクリレートの塗
膜を形成する工程と、上記塗膜に酸素を含む雰囲
気中で所定のパターンを有する遠紫外光照射する
工程と、現像によつて塗膜の遠紫外光照射部分を
除去する工程とよりなるパターン形成方法。
1 A step of forming a coating film of polyglycidyl methacrylate on a substrate, a step of irradiating the coating film with deep ultraviolet light having a predetermined pattern in an oxygen-containing atmosphere, and irradiating the coating film with far ultraviolet light through development. A pattern forming method consisting of a step of removing a portion.
JP2050180A 1980-02-22 1980-02-22 Pattern forming method Granted JPS56117235A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2050180A JPS56117235A (en) 1980-02-22 1980-02-22 Pattern forming method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2050180A JPS56117235A (en) 1980-02-22 1980-02-22 Pattern forming method

Publications (2)

Publication Number Publication Date
JPS56117235A JPS56117235A (en) 1981-09-14
JPS6360375B2 true JPS6360375B2 (en) 1988-11-24

Family

ID=12028902

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2050180A Granted JPS56117235A (en) 1980-02-22 1980-02-22 Pattern forming method

Country Status (1)

Country Link
JP (1) JPS56117235A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0447574U (en) * 1990-08-24 1992-04-22

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0447574U (en) * 1990-08-24 1992-04-22

Also Published As

Publication number Publication date
JPS56117235A (en) 1981-09-14

Similar Documents

Publication Publication Date Title
US5178989A (en) Pattern forming and transferring processes
US4590149A (en) Method for fine pattern formation on a photoresist
JP5033891B2 (en) Method for producing pellicle film
US6087076A (en) Method of manufacturing semiconductor devices by performing coating, heating, exposing and developing in a low-oxygen or oxygen free controlled environment
US4704347A (en) Method of manufacturing a semiconductor device, in which a photolacquer mask is formed by means of a two-layer lacquer system.
JPH0572747A (en) Pattern formation method
US2191939A (en) Photoengraving
EP0021719A2 (en) Method for producing negative resist images, and resist images
JPS6360375B2 (en)
JPS59124134A (en) Method of forming resist mask
JPH09260257A (en) Projection exposure apparatus preventing lens contamination and semiconductor device manufacturing process using the same
JPS6278550A (en) Developing method for radiation sensitive film
JPH0290170A (en) Pattern forming method
CN114787710B (en) Method for device fabrication
JPS62215267A (en) Reduction in cloth contamination by color
JPH03146954A (en) Resist pattern forming method
JPS6116521A (en) Removing process of resist film
JPS6058442B2 (en) Color filter manufacturing method
JPS6148704B2 (en)
JP2956732B2 (en) Method for manufacturing color filter of solid-state imaging device
JPS63237527A (en) Resist peeling method
JPH02281932A (en) Manufacture of stamper for optical memory
JPH01307757A (en) Exposure method
Hibbs et al. Use of Carbonized Photoresist for Optical Mask Repair
JPH05275316A (en) Formation of resist pattern