JPS63875B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a bubble memory tester for testing bubble memory.

Background of the Technology There are two types of bubble memory testers that test bubble memory: general-purpose ones and single-purpose ones. A versatile tester can test any target model by developing software, and test conditions can be changed freely. As shown in FIG. 1, in a single-function bubble tester whose target models are limited, the control section 13 is activated from the keyboard 11 via the input analysis section 12, and the test sequence data section 21 specifies the input data. The current value of the bubble driver 18 is set via the fixed power supply 37 in accordance with the fixed sequence, and the timing generator 20 is activated according to the write and read conditions from the write/read data section 19 and a predetermined data pattern from the data pattern generator 22. The bubble driver 18 is driven through the bubble memory 30 to write data into the test bubble memory 30. The data read out from the bubble memory 30 is detected by the bubble detection section 23, compared with the written data pattern by the comparison and judgment section 24, and the result is outputted by a display device or a printing machine.

Conventional technology and problems However, although the general-purpose bubble memory tester mentioned above has a high degree of freedom in changing the target model and test conditions, it is not easy to develop software, which requires several months of time and There is a problem in that it takes a long time to start up when used in a computer, and it is also expensive. In addition, bubble memory testers that can test only limited models have the problem that test conditions cannot be changed.

Purpose of the Invention The purpose of the present invention is to limit the target models and fix the test sequence in view of the above-mentioned problems with the conventional apparatus, but to make it possible to change test condition data for each test. Based on this concept, the object is to obtain a bubble memory tester that is suitable for manufacturing sites, has a significantly short start-up time, is inexpensive to manufacture, and can be used for experiments or characteristic measurements.

Structure of the Invention The present invention includes a keyboard for inputting operation mode designation and test conditions, a first input analysis section that receives output from the keyboard, and, in the test mode, activation by the output from the first input analysis section. a test sequence data section controlled by the output of the control section, a test condition storage section that receives initial setting data from the test sequence data section, a write/read data section, a data pattern generator, and the test conditions. a storage section, a timing generator that receives signals from the write/read data section and the data pattern generator and a start signal from the control section, a program power supply set by the signal from the test condition storage section, and a timing generator that receives signals from the write/read data section and the data pattern generator; A bubble driver that receives a current pulse of a set current value and is driven by the output from the timing generator to drive the test bubble memory, and a data display that is activated by the output of the first input analysis section in the data display mode. a control section, a second input analysis section that sends test condition change data from the keyboard to the test condition storage section according to a signal from the data display control section, a bubble detection section that receives the output of the test bubble memory, and the bubble. A comparison/judgment unit that compares and judges the output of the detection unit and the output of the data pattern generator and returns the output to the control unit, the control unit, the data display control unit, the test condition storage unit, and the output of the comparison/judgment unit. It is equipped with a video random access memory control section that receives the received data and displays it on a display device, and a printer interface that receives the output from the control section and the comparison/judgment section and drives the printing machine, thereby making it possible to change test conditions for each test. A special bubble memory tester will be provided for limited edition models.

Embodiment of the Invention A block circuit diagram of a bubble memory tester as an embodiment of the invention is shown in FIG. This bubble memory tester includes a keyboard 11, a first input analysis section 12, a control section 13, and a data display control section 1.
4. Second input analysis section 15, test condition storage section 1
6, program power supply 17, bubble driver 18,
write/read data section 19, timing generator 20, test sequence data section 21, data pattern generator 22, bubble detection section 23,
Comparison/judgment section 24, printer interface 25,
It is equipped with a video random access memory (V-RAM) control section, a printing machine 27, and a display device 28.

The operation of this bubble memory tester will be explained below. The input from the keyboard 11 is first analyzed by the input analysis section 12, and when a test is to be performed, the control section 13 is activated. The control unit 13 stores the initial setting data in the test sequence data unit 21 in the test condition storage unit 1.
6. Send the data to the write/read data section 19 and data pattern generator 22, and initialize the timing generator 20 and program power supply 17. After that, the control unit 13 sends a start signal to the timing generator 20, and the timing generator 20 sends a drive pulse to the bubble driver 18.
A current pulse having a certain current value set in advance by the program power supply 17 is applied to the bubble memory 30 to drive it.

The output read from the bubble memory 30 is detected by the bubble detection section 23 and compared with the written data pattern by the comparison and judgment section 24, and the result is sent to the control section 13. The control unit 13 is V-
Display is instructed to the RAM control unit 26 and printer interface 25, and the results are output to the display device 28 and printing machine 27. If the result is good, the control section 13 advances the sequence data, reads out the next test condition from the test condition storage section 16, etc., sets it to the program power supply 17 and timing generator 20, starts it, and drives the bubble memory 30.
The test sequence proceeds in this manner, and when the entire sequence is completed, the control section 13 outputs the determination results to the display device 28 and the printing machine 27.

This bubble memory tester is only for one model, so
Sequence data, write/read data, data pattern data, etc. are fixed data.
The test conditions that determine the current value and timing of each gate can be changed, and critical conditions for the bubble memory under test can be found.

When changing the test conditions, the instruction is input from the keyboard 11 and the data display control section 14 is activated via the input analysis section 12. The data display control section 14 connects the input from the keyboard 11 to the input analysis section 15, sends test condition data to the V-RAM control section 26, and displays it on the display device. The input analysis unit 15 continues to wait for an input from the keyboard 11, and when there is an input to change the test conditions, changes the memory of the condition data for that part. After the change is completed, the input line from the keyboard 11 is returned to the input analysis section 12 again. After the test ends, input from the keyboard 11 of the input analysis section 12 becomes valid, so the conditions can be changed for each test.

In this example, the test conditions are the display device 28.
Data can be changed by moving the cursor and inputting data using the keyboard, and it is also possible to perform tests under the same conditions continuously, making it suitable as a tester used at manufacturing sites and for experiments. Here, the test conditions are the current value and phase value of each function gate and coil driver. In addition, the bubble memory tester of this example has a preparation period (startup time) of 5
You can expect it to take about a day.

Effects of the Invention According to the present invention, it is possible to obtain a bubble memory tester that is suitable for manufacturing sites, has a significantly short start-up time, is inexpensive to manufacture, and can be used for experiments or characteristic measurements.

[Brief explanation of the drawing]

FIG. 1 is a block circuit diagram showing a conventionally used single-function bubble memory tester, and FIG. 2 is a block circuit diagram showing the configuration of a bubble memory tester as an embodiment of the present invention. 11...keyboard, 12...first input analysis section,
13...control unit, 14...data display control unit, 15...
Second input analysis section, 16...Test condition storage section, 17
...Program power supply, 18...Bubble driver, 19
...Write read data section, 20...Timing generator, 21...Test sequence data section, 22
...Data pattern generator, 23...Bubble detection section, 24...Comparison/judgment section, 25...Printer interface, 26...V-RAM control section, 27...Printing machine, 28...Display device, 30...Test bubble memory,
37...Fixed power supply.

Claims (1)

[Claims] 1. A keyboard for specifying the operation mode and inputting test conditions, a first input analysis section that receives output from the keyboard, a control section that is activated by the output from the first input analysis section in the case of test mode, and the control section. a test sequence data section controlled by the output of the test sequence data section, a test condition storage section that receives initial setting data from the test sequence data section, a write read data section, and a data pattern generator, the test condition storage section, and the write read data. A timing generator that receives signals from the data pattern generator and the start signal from the control section, a program power supply set by the signal from the test condition storage section, and a current having a current value set in the program power supply. a bubble driver that receives pulses and is driven by the output from the timing generator to drive the test bubble memory; a data display control unit that is activated by the output of the first input analysis unit in the data display mode; a second input analysis section that sends test condition change data to the test condition storage section by a signal from the data display control section; a bubble detection section that receives the output of the test bubble memory; the output of the bubble detection section and the data; A comparison/judgment section that compares and judges the outputs of the pattern generator and returns the output to the control section, the control section, the data display control section, the test condition storage section, and the outputs of the comparison/judgment section that are received and displayed on a display device. It is equipped with a video random access memory control section that controls the operation of the printer, and a printer interface that receives the output from the control section and the comparison/judgment section and drives the printing press, making it possible to change the test conditions for each test. Bubble memory tester.