JPS647335B2 - - Google Patents
Info
- Publication number
- JPS647335B2 JPS647335B2 JP3562181A JP3562181A JPS647335B2 JP S647335 B2 JPS647335 B2 JP S647335B2 JP 3562181 A JP3562181 A JP 3562181A JP 3562181 A JP3562181 A JP 3562181A JP S647335 B2 JPS647335 B2 JP S647335B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- grains
- grain
- rice
- rice grains
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/3416—Sorting according to other particular properties according to radiation transmissivity, e.g. for light, x-rays, particle radiation
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Combined Means For Separation Of Solids (AREA)
Description
【発明の詳細な説明】
産業上の利用分野
本発明は籾米・玄米、白米等の米粒に発生する
亀裂(胴割)を検出して、その粒数計数する米粒
の亀裂検出装置の改良に係る。[Detailed Description of the Invention] Industrial Application Field The present invention relates to an improvement of a crack detection device for rice grains that detects cracks (body cracks) that occur in rice grains such as unhulled rice, brown rice, and white rice, and counts the number of grains. .
従来の技術
従来の米粒中の亀裂粒の検出は多孔板の透光窓
上に米粒を列べ、これに下方から投光して透光模
様を目側計数して亀裂米の粒数または比率を算出
する原始的な手段が用いられ、作業が煩わしく雑
作であつた。Conventional technology The conventional method for detecting cracked grains in rice grains is to arrange the rice grains on a translucent window of a perforated plate, shine light onto the window from below, and count the translucent pattern on the eye side to determine the number or ratio of cracked rice grains. A primitive means of calculating was used, and the work was cumbersome and sloppy.
また、カプセルに対してランプより投光し、そ
の反射光線を受光素子で受光することにより、カ
プセルの形状の変形や汚れ等を検知するものが特
開昭55−39001号公報として提案されているが、
このものはカプセルからの反射光線を利用するも
のであるため、その内部の異常を検知することが
できず、また、総数と異常品の個数を知るもので
もなかつた。 In addition, Japanese Patent Application Laid-Open No. 55-39001 proposes a device that detects deformation of the shape of the capsule, dirt, etc. by projecting light from a lamp onto the capsule and receiving the reflected light beam with a light-receiving element. but,
Because this device uses reflected light from the capsule, it cannot detect abnormalities inside the capsule, nor can it tell the total number of items and the number of abnormal items.
発明が解決すべき課題
本発明は、米粒内部に存在する亀裂を検知する
ことができると共に、亀裂粒数及び総粒数を高精
度で計数することが可能な米粒の亀裂粒検出装置
を提供することを目的とするものである。Problems to be Solved by the Invention The present invention provides a rice grain crack detection device that is capable of detecting cracks existing inside rice grains and counting the number of cracks and the total number of grains with high precision. The purpose is to
課題を解決するための手段
本発明の米粒の亀裂粒検出装置は、板体に開口
した透光窓を挾んで前記板体の一側に光源を、他
側に複数の受光素子を配置し、前記受光素子は前
記透光窓の中心の前後両側にその光軸がそれぞれ
向けられると共に、それら受光量の差と基準限界
値とを比較して亀裂粒を検知する亀裂粒検出回路
と総粒数用検出回路とに連絡され、前記亀裂粒検
出回路を胴割粒用カウンター回路に結合すると共
に前記総粒数用検出回路を総粒数用カウンター回
路に結合したことを特徴とする構成を有する。Means for Solving the Problems The apparatus for detecting cracks in rice grains of the present invention includes a light source placed on one side of the plate and a plurality of light-receiving elements placed on the other side of the plate, sandwiching a transparent window opened in the plate. The light-receiving element has its optical axis directed to both front and back sides of the center of the transparent window, and also includes a crack grain detection circuit that detects crack grains by comparing the difference in the amount of light received with a reference limit value, and a total number of grains. The cracked grain detection circuit is connected to a split grain counter circuit, and the total grain number detection circuit is connected to a total grain number counter circuit.
実施例
第1図中、符号10は箱形機枠で、該機枠10
内の上側に振動装置11を備えた送米樋12を緩
傾斜状に装架し、その供給側の受入部13の上部
に供給ホツパー14を装架すると共に、排出側の
樋端を機枠壁部の開口部から外部に突出し、送米
樋12の樋底部の板体9に設けた透光窓1の上下
位置に光量検出部15の白熱電球などから成る光
源7と一対のフオートダイオードなどから成る受
光素子5,6を対向支架して配設し、各受光素子
5,6を機枠10上部の亀裂粒子検出回路16に
関連的に、かつ電気的に連結する。17は検出回
路16に設けた表示器である。Embodiment In FIG. 1, reference numeral 10 is a box-shaped machine frame, and the machine frame 10
A rice feeding gutter 12 equipped with a vibrating device 11 is mounted on the upper side of the rice feeding gutter 12 in a gently inclined manner, and a supply hopper 14 is mounted on the upper part of the receiving part 13 on the feeding side, and the end of the gutter on the discharge side is connected to the machine frame wall. A light source 7 consisting of an incandescent bulb or the like and a pair of photo diodes of a light amount detection section 15 are installed above and below a transparent window 1 which protrudes from the opening of the rice feeding gutter 12 and is provided on the plate 9 at the bottom of the gutter 12. The light-receiving elements 5 and 6 are supported and disposed opposite to each other, and each light-receiving element 5 and 6 is connected electrically to a crack particle detection circuit 16 on the upper part of the machine frame 10. 17 is a display provided in the detection circuit 16.
そして、供給ホツパー14から流下し送米樋1
2に設けたスリツト状の透光窓1に達した米粒2
は微振動(振幅1粍程度)する状態においてその
前後両偏部3,4に対して光源7から照射すると
共に、その透過光線を両受光素子5,6がそれぞ
れ受光してその光量差を亀裂粒用検出回路16に
設定した基準限界値と比較して米粒亀裂の有無を
検出し、その亀裂米粒、無亀裂米粒(異状粒子を
除く)の各粒数または比率をそれぞれ演算して表
示器17に表示される。 Then, the rice flows down from the supply hopper 14 to the rice feeding gutter 1.
Rice grains 2 that have reached the slit-shaped transparent window 1 provided in 2
The light source 7 irradiates both the front and rear polarized parts 3 and 4 in a state of slight vibration (amplitude of about 1 mm), and the transmitted light is received by both the light receiving elements 5 and 6, respectively, and the difference in light amount is detected. The presence or absence of cracks in the rice grains is detected by comparing it with the reference limit value set in the grain detection circuit 16, and the number or ratio of cracked rice grains and non-cracked rice grains (excluding abnormal grains) is calculated and displayed on the display 17. will be displayed.
第2図は前記透光窓1上に位置して下方から照
射された米粒を示し、その各図a,b,cにおい
て中央の縦状点線(太線)は透光窓1のスリツ
ト、楕円形の閉曲線(点線)は籾米内の米粒2、
また、米粒2中に記した縦状点線(細線)は亀裂
面Pをそれぞれ表わす。また、図aにおいて、A
及びBは前記各受光素子5,6が対向するそれぞ
れの視点位置で、亀裂面のない整粒子の場合、こ
の視点位置によつて受光される米粒2の両偏部3
4の光量(明度)は共に等しく、その光量差が基
準限界値(電圧)内になる。図bの米粒2′はそ
の亀裂面Pが透光窓1の左側にあり、ために透光
窓1から射入した粒子内の透過光線は前記亀裂面
Pで散乱してその粒体左側部の光量が低下してこ
の光量差が基準限界値外となる。図Cの米粒2″
は上記米粒2′と反対の明暗影面を生じ、その光
量差が基準限界値外となつて、この粒子も亀裂粒
として識別される。 Figure 2 shows a rice grain located above the transparent window 1 and irradiated from below. The closed curve (dotted line) is rice grain 2 in unhulled rice,
Further, vertical dotted lines (thin lines) drawn in the rice grains 2 each represent a crack surface P. Also, in figure a, A
and B are respective viewpoint positions where the light receiving elements 5 and 6 face each other, and in the case of regular grains without crack surfaces, both polarized portions 3 of the rice grain 2 are received by this viewpoint position.
The light amounts (brightness) of the four cases are the same, and the difference in light amount is within the reference limit value (voltage). In the rice grain 2' in Figure b, the crack surface P is on the left side of the transparent window 1, so the transmitted light inside the grain that enters through the transparent window 1 is scattered by the crack surface P, and the grain is on the left side of the grain. The amount of light decreases, and this difference in amount of light falls outside the reference limit value. Figure C rice grain 2″
produces a bright and dark surface opposite to that of the rice grain 2', and the difference in light amount is outside the reference limit value, so that this grain is also identified as a crack grain.
次に第3図において、特許請求の範囲第2項の
ものは、前記透光窓1上に載置した米粒の透光検
出部Qに近接して配置したレンズ18,19をグ
ラスフアイバー20,21を介して受光素子5,
6に連絡したものであり、通常、米粒の前後両偏
部の間隔が短小であるため、直接に両受光素子枠
を米粒に近接的に臨設することが困難不便である
のに対し、本構成はグラスフアイバーを介在させ
ることにより、両受光素子の間隙を自由に設ける
ことができる効果がある。 Next, in FIG. 3, in the second claim, lenses 18 and 19 arranged close to the light-transmitting detection part Q of the rice grain placed on the light-transmitting window 1 are connected to glass fibers 20, 21 to the light receiving element 5,
6, and since the distance between the front and rear polarized parts of the rice grain is usually short and small, it is difficult and inconvenient to directly install both light receiving element frames in close proximity to the rice grain. By interposing the glass fiber, the gap between both light receiving elements can be freely provided.
また、特許請求の範囲第3項のものは、前記透
光窓1の下部に近接して光源7にレンズ22を介
して連通したグラスフアイバーの先端面を臨設す
る構成にしたので、光源を直接レンズだけでの介
入で配置すると、光源と透光窓との間に必要な間
隔を設けて装置全体の高さが高くなり不便である
のに対し、本構成はグラスフアイバーにより光線
を屈曲できるから、光源の位置を自由に設定でき
装置全体を合理化できる効果がある。 Furthermore, in the third aspect of the present invention, the tip of the glass fiber is provided adjacent to the lower part of the transparent window 1 and communicates with the light source 7 through the lens 22, so that the light source can be directly connected. If the arrangement was done using only a lens, the required distance between the light source and the light-transmitting window would increase the overall height of the device, which would be inconvenient, but this configuration uses glass fibers to bend the light rays. This has the effect of allowing the position of the light source to be set freely and streamlining the entire device.
特許請求の範囲第4項のものは、第1図におい
て前記透光窓1を傾架した送米樋12の樋底に開
口する構成にしたから、試料の米粒を送米樋12
を介して連続的に透光窓1に供給でき、その検出
作業を促進して検出能率を向上できる効果があ
る。 According to the fourth aspect of the present invention, since the transparent window 1 is opened at the bottom of the rice feeding gutter 12 which is tilted in FIG.
can be continuously supplied to the light-transmitting window 1 through the light-transmitting window 1, which has the effect of facilitating the detection work and improving the detection efficiency.
次に、第4図及び第5図において、特許請求の
範囲第5項のものは、前記受光素子5,6と光源
7間で前記両受光素子5,6に対向する所定位置
において、没入部24とこの没入部24に開口し
た透光窓1を多数縦列状に移動用板体25に配設
し、前記縦列した透光窓1…が順次所定位置を通
過するよう板体24が走行する軌道26A,26
Bを設ける構成にしたもので、その駆動装置27
を起動することにより前記各透光窓1…に供給さ
れた米粒が連続的に、かつ正確に所定位置に達し
てその検出作業を促進すると共に、各粒子が一定
の姿勢に位置してその検出精度を高揚できる等の
効果がある。 Next, in FIGS. 4 and 5, according to claim 5, a recessed portion is provided between the light receiving elements 5, 6 and the light source 7 at a predetermined position facing both the light receiving elements 5, 6. 24 and a large number of transparent windows 1 opened in the recessed portion 24 are arranged in a column on a moving plate 25, and the plate 24 runs so that the vertically arranged transparent windows 1 sequentially pass through predetermined positions. Orbit 26A, 26
B, the drive device 27
By activating the rice grains supplied to each of the translucent windows 1, the rice grains continuously and accurately reach a predetermined position to facilitate the detection operation, and each grain is positioned in a fixed posture to facilitate its detection. This has the effect of increasing accuracy.
次に、第6図の電気回路について説明する。亀
裂粒用センサー部28に設けた両受光素子5,6
は各増幅器29,29を介して亀裂粒用検出回路
30の差動増幅器31に連結され、該増幅器31
の出力側アナログスイツチ32を介して複数個の
比較器33,34にそれぞれ連結され、またその
出力側はOR回路35を介して胴割粒用カウンタ
ー回路36に連結される。また、一側に設けた受
光素子6の出力側の分岐路37は粒選別用検出回
路38の各比較器39,40及び総粒数用検出回
路42の比較器48にそれぞれ連結され、前記比
較器39,40の出力側はそれぞれAND回路4
1A,41B及びインバーターを介して総粒数用
検出回路42に設けたAND回路49にそれぞれ
連結される。43,44は前記検出回路30に設
けた比較器33,34に連絡する亀裂粒用設定
器、45,46は前記検出回路38に設けた比較
器39,40に連絡する粒選別用設定器、また亀
裂粒側の回路に設けたOR回路35の出力側の分
岐路47はインバーターを介して粒選別用側の回
路に設けたAND回路41A,41Bにそれぞれ
連結されると共に、AND回路41A,41Bの
入力側は総粒数用検出回路42に設けたアナログ
スイツチ回路50と前記比較器48を結ぶ導線に
連結され、該スイツチ回路50の出力側は前記
AND回路49を介して総粒数用カウンター回路
51に連結され、前記各カウンター回路36,5
1は共に比率用計器52に連結してある。また、
第7図の電気回路は前記第4図及び第5図に示す
移沈用板体24の粒数用通孔R…を照射する発光
ダイオード53と、受光するフオートセンサー5
4を設けて、そのフオートセンサー54の出力側
を増幅器55を介して前記アナログスイツチ回路
50に連結してある。なお、56は前記検出回路
42の比較器48に連絡する粒子検出用設定器で
ある。 Next, the electric circuit shown in FIG. 6 will be explained. Both light receiving elements 5 and 6 provided in the crack grain sensor section 28
is connected to the differential amplifier 31 of the crack grain detection circuit 30 via each amplifier 29, 29, and the amplifier 31
It is connected to a plurality of comparators 33 and 34 through an analog switch 32 on its output side, respectively, and its output side is connected through an OR circuit 35 to a counter circuit 36 for grain splitting. Further, the branch path 37 on the output side of the light receiving element 6 provided on one side is connected to each comparator 39, 40 of the particle sorting detection circuit 38 and the comparator 48 of the total particle number detection circuit 42, and The output sides of the circuits 39 and 40 are connected to the AND circuit 4, respectively.
1A, 41B and an AND circuit 49 provided in the total particle number detection circuit 42 via an inverter. 43, 44 are crack grain setting devices connected to the comparators 33, 34 provided in the detection circuit 30; 45, 46 are grain sorting settings devices connected to the comparators 39, 40 provided in the detection circuit 38; Further, the branch path 47 on the output side of the OR circuit 35 provided in the circuit on the crack grain side is connected via an inverter to AND circuits 41A and 41B provided in the circuit on the grain sorting side, respectively, and the AND circuits 41A and 41B The input side of the switch circuit 50 is connected to a conductor connecting the analog switch circuit 50 provided in the total particle number detection circuit 42 and the comparator 48, and the output side of the switch circuit 50 is connected to the
It is connected to a total particle number counter circuit 51 via an AND circuit 49, and each of the counter circuits 36, 5
1 are both connected to a ratio meter 52. Also,
The electric circuit shown in FIG. 7 includes a light emitting diode 53 that illuminates the grain number through hole R of the sedimentation plate 24 shown in FIGS. 4 and 5, and a photo sensor 5 that receives light.
4 is provided, and the output side of the foot sensor 54 is connected to the analog switch circuit 50 via an amplifier 55. Note that 56 is a particle detection setting device connected to the comparator 48 of the detection circuit 42.
したがつて、前記透光窓1の米粒2の両偏部
3,4の明暗影を受光した受光素子5,6の光量
の検出信号は増幅されて胴割粒用検出回路30に
入力され、該検出回路30においてその差動増幅
器31でその光量差を検出すると共に、その検出
信号はアナログスイツチ32に入力される。また
一方では、前記総粒数用検出回路42側の比較器
48によつて発する粒子の検出(確認)信号はア
ナログスイツチ回路50に入力されると共に、そ
のスイツチ信号によつてアナログスイツチ32は
その都度閉成し、前記差動増幅器31の検出信号
は各比較器33,34に入力されて該比較器3
3,34に連結された設定器43,44に設定さ
れた基準限界値(基準電圧−または+)と比較さ
れ、その比較信号はOR回路35を介して胴割粒
用カウンター回路36に入力されて胴割粒数を計
数して表示器17に表示する。また、前記受光素
子6側の分岐出力は粒選別用検出回路38の各比
較器39,40に入力され、各比較器39,40
に連結された設定器45,46に所定された未熟
粒・玄米の明暗度(電圧)と比較されてその比較
信号はAND回路41A,41Bに入力され、該
各回路41A,41Bにおいて前記検出回路30
のOR回路35からインバーターを通した分岐出
力との一致信号によつて胴割米を除去した高明度
の玄米および高明度の玄米および高明度の未熟粒
を識別すると共に、その検出信号はインバーター
を介して総粒数用カウンター回路51に設けた
AND回路49に入力され、該回路49によつて
未熟粒と玄米は総粒数から除外される。また、総
粒数側の回路に設けた比較器48は、該回路49
に連絡する粒子を識別するための粒子検出用設定
器56からの入力と比較してその検出信号をアナ
ログスイツチ回路50を介してAND回路49に
入力し、該回路49で前記粒選別用側のAND回
路41A,41Bからインバーターを介して入力
する信号と相互に比較され、その一致信号が総粒
数用カウンター回路51に入力されて玄米および
未熟粒を除外した米粒総数が表示器17に表示さ
れ、また各カウンタ回路36,51の分岐出力は
それぞれ比率用計器52に入力され、該計器52
によつてその比率が演算されて表示器17に表示
される。 Therefore, the light intensity detection signals of the light receiving elements 5 and 6 which have received light and dark shadows of both the polarized parts 3 and 4 of the rice grain 2 in the transparent window 1 are amplified and inputted to the split grain detection circuit 30, In the detection circuit 30, the difference in light amount is detected by the differential amplifier 31, and the detection signal is input to the analog switch 32. On the other hand, the particle detection (confirmation) signal generated by the comparator 48 on the side of the total particle number detection circuit 42 is input to the analog switch circuit 50, and the switch signal causes the analog switch 32 to The detection signal of the differential amplifier 31 is input to each comparator 33, 34, and the differential amplifier 31 is closed each time.
It is compared with a reference limit value (reference voltage - or +) set in setting devices 43 and 44 connected to 3 and 34, and the comparison signal is inputted to a shell splitting counter circuit 36 via an OR circuit 35. The number of shell-split grains is counted and displayed on the display 17. Further, the branched output from the light receiving element 6 side is inputted to each comparator 39, 40 of the particle sorting detection circuit 38, and each comparator 39, 40
The comparison signal is compared with the brightness (voltage) of immature grains/brown rice specified by setting devices 45, 46 connected to 30
High-bright brown rice from which split rice has been removed, high-bright brown rice, and high-bright immature grains are identified based on a signal that matches the branch output from the OR circuit 35 of the inverter. provided in the total grain number counter circuit 51 through
This is input to an AND circuit 49, which excludes immature grains and brown rice from the total number of grains. In addition, the comparator 48 provided in the circuit on the side of the total number of grains is connected to the circuit 49.
The detection signal is compared with the input from the particle detection setting device 56 for identifying the particles communicating with the particle selection device 56, and the detection signal is inputted to the AND circuit 49 via the analog switch circuit 50. The signals inputted from the AND circuits 41A and 41B via the inverter are compared with each other, and the matching signal is inputted to the total grain counter circuit 51, and the total number of rice grains excluding brown rice and immature grains is displayed on the display 17. , and the branch outputs of the counter circuits 36 and 51 are respectively input to a ratio meter 52.
The ratio is calculated and displayed on the display 17.
発明の効果
本発明によると、複数の受光素子の受光量の差
を基準限界値と比較するため、外部の明るさに無
関係に米粒内部に存在する亀裂を検知することが
でき、亀裂粒数と総粒数とを高精度で計数するこ
とが可能である。Effects of the Invention According to the present invention, since the difference in the amount of light received by a plurality of light receiving elements is compared with a reference limit value, cracks existing inside rice grains can be detected regardless of external brightness, and the number of cracked grains can be detected. It is possible to count the total number of grains with high precision.
図面は本発明の実施例図である。第1図は本装
置の側断面図、第2図は米粒の明暗影面の説明
図、第3図はそのセンサー部の別実施例の側面
図、第4図はその移動用板体の一部拡大断面図、
第5図は移動用板体の一部平面図、第6図、第7
図は共にその電気回路図である。
1……透光窓、2,2′,2″……米粒、3……
前偏部、4……後偏部、5……受光素子、6……
受光素子、7……光源、8……間隙、9……板
体、10……機枠、11……振動装置、12……
送米樋、13……受入部、14……供給ホツパ
ー、15……光量検出部、16……亀裂粒用検出
回路、17……表示器、18……レンズ、19…
…レンズ、20……グラスフアイバー、21……
グラスフアイバー、22……レンズ、23……グ
ラスフアイバー、24……没入部、25……移動
用は板体、26A,26B……軌道、27……駆
動装置、28……亀裂粒用センサー部、29……
増幅器、30……検出回路、31……差動増幅
器、32……アナログスイツチ、33……比較
器、34……比較器、35……OR回路、36…
…胴割粒用カウンター回路、37……分岐路、3
8……粒選別用検出回路、39……比較器、40
……比較器、41A,41B……AND回路、4
2……総粒数用検出回路、43……設定器、44
……設定器、45……設定器、46……設定器、
47…分岐路、48……比較器、49……AND
回路、50……アナログスイツチ回路、51……
総粒数用カウンター回路、52……比率用計器、
53……発行ダイオード、54……フオートセン
サー、55……増幅器、56……粒子検出用設定
器、A,B……視点位置、P……亀裂面、Q……
透光検出部、R……粒数用通孔。
The drawings are illustrations of embodiments of the present invention. Fig. 1 is a side sectional view of this device, Fig. 2 is an explanatory diagram of the bright and dark surfaces of rice grains, Fig. 3 is a side view of another embodiment of the sensor section, and Fig. 4 is an illustration of the moving plate. Enlarged sectional view,
Figure 5 is a partial plan view of the moving plate, Figures 6 and 7.
Both figures are electrical circuit diagrams. 1...transparent window, 2,2',2''...rice grain, 3...
Front polarized part, 4... Rear polarized part, 5... Light receiving element, 6...
Light receiving element, 7... Light source, 8... Gap, 9... Plate, 10... Machine frame, 11... Vibration device, 12...
Rice feeding gutter, 13... Receiving section, 14... Supply hopper, 15... Light amount detection section, 16... Crack grain detection circuit, 17... Display unit, 18... Lens, 19...
...Lens, 20...Glass fiber, 21...
Glass fiber, 22... Lens, 23... Glass fiber, 24... Recessed part, 25... Plate for movement, 26A, 26B... Orbit, 27... Drive device, 28... Crack particle sensor part , 29...
Amplifier, 30...Detection circuit, 31...Differential amplifier, 32...Analog switch, 33...Comparator, 34...Comparator, 35...OR circuit, 36...
...Counter circuit for shell-split grain, 37... Branch path, 3
8... Grain sorting detection circuit, 39... Comparator, 40
...Comparator, 41A, 41B...AND circuit, 4
2... Total particle number detection circuit, 43... Setting device, 44
... Setting device, 45 ... Setting device, 46 ... Setting device,
47...branch path, 48...comparator, 49...AND
Circuit, 50...Analog switch circuit, 51...
Counter circuit for total number of grains, 52...meter for ratio,
53...Issuing diode, 54...Foot sensor, 55...Amplifier, 56...Particle detection setting device, A, B...Viewpoint position, P...Crack surface, Q...
Translucent detection part, R...through hole for particle number.
Claims (1)
側に光源を、他側に複数の受光素子を配置し、前
記受光素子は前記透光窓の中心の前後両側にその
光軸がそれぞれ向けられると共に、それら受光量
の差と基準限界値とを比較して亀裂粒を検知する
亀裂粒検出回路と総粒数用検出回路とに連絡さ
れ、前記亀裂粒検出回路を胴割粒用カウンター回
路に結合すると共に前記総粒数用検出回路を総粒
数用カウンター回路に結合したことを特徴とする
米粒の亀裂粒検出装置。 2 前記透光窓上に近接して設けたレンズに、受
光素子に連通したグラスフアイバーの先端面を臨
設した特許請求の範囲第1項記載の米粒の亀裂粒
検出装置。 3 前記透光窓の下部に近接して設けたレンズ
に、光源に連通したグラスフアイバーの先端面を
臨設した特許請求の範囲第1項記載の米粒の亀裂
粒検出装置。 4 前記透光窓を傾架した樋底に開口した特許請
求の範囲第1項記載の米粒の亀裂粒検出装置。 5 前記透光窓が板体に多数縦列状に形成された
没入部の底部に開口され、前記縦列した透光窓が
順次受光素子と光源との間を通過するよう前記板
体が軌道上を走行するようにした特許請求の範囲
第1項記載の米粒の亀裂粒検出装置。 6 前記板体が前記透光窓に対応して粒数用通孔
を有し、前記粒数用通孔を挾んで第2の光源と第
2の受光素子とを設け、該第2の受光素子が該第
2の光源からの光を感知したとき前記受光素子の
受光量の差と基準限界とを比較する電気回路を設
けた特許請求の範囲第1項記載の米粒の亀裂粒検
出装置。 7 前記亀裂粒検出回路を所定明暗度以上の検出
米粒を未熟粒として米粒数から除外する粒選別用
検出回路に連結した特許請求の範囲第1項記載ま
たは第6項記載の米粒の亀裂粒検出装置。 8 前記亀裂粒検出回路を所定明暗度以下の検出
米粒を玄米粒として米粒数から除外する粒選別用
検出回路に連結した特許請求の範囲第1項または
第6項または第7項記載の米粒の亀裂粒検出装
置。[Scope of Claims] 1. A light source is arranged on one side of the plate and a plurality of light receiving elements are arranged on the other side, sandwiching a transparent window opened in the plate, and the light receiving element is located at the center of the transparent window. The optical axes are directed to both the front and rear sides, and are connected to a crack grain detection circuit that detects crack grains by comparing the difference in the amount of received light with a reference limit value, and a detection circuit for the total number of grains. A rice grain crack grain detection device characterized in that a detection circuit is coupled to a counter circuit for split grains, and the detection circuit for the total number of grains is coupled to a counter circuit for the total number of grains. 2. The apparatus for detecting cracks in rice grains according to claim 1, wherein a lens provided close to the light-transmitting window has a tip end face of a glass fiber communicating with a light-receiving element. 3. The apparatus for detecting cracks in rice grains according to claim 1, wherein a lens provided close to the lower part of the transparent window has a tip end face of a glass fiber communicating with a light source. 4. The apparatus for detecting cracks in rice grains according to claim 1, wherein the transparent window is opened at the bottom of a tilted gutter. 5. The light transmitting windows are opened at the bottom of a recessed portion formed in a plurality of columns in the plate body, and the plate body moves on a trajectory such that the vertically arranged light transmitting windows sequentially pass between the light receiving element and the light source. The apparatus for detecting cracks in rice grains according to claim 1, which is configured to travel. 6. The plate has a particle number through hole corresponding to the transparent window, and a second light source and a second light receiving element are provided sandwiching the particle number hole, and the second light receiving element 2. The apparatus for detecting cracks in rice grains according to claim 1, further comprising an electric circuit for comparing the difference in the amount of light received by the light receiving element with a reference limit when the element senses the light from the second light source. 7. Detection of cracked grains in rice grains according to claim 1 or 6, wherein the cracked grain detection circuit is connected to a grain sorting detection circuit that excludes detected rice grains with a predetermined brightness or higher from the number of rice grains as immature grains. Device. 8. Rice grains according to claim 1, 6, or 7, in which the cracked grain detection circuit is connected to a grain sorting detection circuit that excludes detected rice grains with a brightness below a predetermined brightness from the number of rice grains as brown rice grains. Crack particle detection device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3562181A JPS57148206A (en) | 1981-03-10 | 1981-03-10 | Device for checking cracked rice grain |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3562181A JPS57148206A (en) | 1981-03-10 | 1981-03-10 | Device for checking cracked rice grain |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57148206A JPS57148206A (en) | 1982-09-13 |
| JPS647335B2 true JPS647335B2 (en) | 1989-02-08 |
Family
ID=12446922
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3562181A Granted JPS57148206A (en) | 1981-03-10 | 1981-03-10 | Device for checking cracked rice grain |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57148206A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07921Y2 (en) * | 1988-02-05 | 1995-01-11 | 株式会社ケット科学研究所 | Rice grain condition detector |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5539001A (en) * | 1978-09-13 | 1980-03-18 | Hayashi Yakuhin Kikai Kk | Defective capsule detector |
-
1981
- 1981-03-10 JP JP3562181A patent/JPS57148206A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57148206A (en) | 1982-09-13 |
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