JPH0114741B2 - - Google Patents
Info
- Publication number
- JPH0114741B2 JPH0114741B2 JP54003245A JP324579A JPH0114741B2 JP H0114741 B2 JPH0114741 B2 JP H0114741B2 JP 54003245 A JP54003245 A JP 54003245A JP 324579 A JP324579 A JP 324579A JP H0114741 B2 JPH0114741 B2 JP H0114741B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- sine wave
- frequency
- circuit
- generating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Dc Digital Transmission (AREA)
Description
【発明の詳細な説明】
本発明はデータ回線の品質を表わすエレメント
誤りを、帯域及び簡易性の観点から有利な正弦波
を使用して測定するエレメント誤り測定装置に関
し、特に符号化伝送速度を任意に可変できるエレ
メント誤り測定装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an element error measuring device that measures element errors representing the quality of a data line using a sine wave, which is advantageous in terms of bandwidth and simplicity. The present invention relates to an element error measuring device that can be varied.
従来のこの種エレメント誤り測定装置を、その
構成及び各部のタイムチヤートを示す第1図及び
第2図を参照して説明する。正弦波発振器2から
出力される正弦波信号aは被測定対象回線である
通信回線1を通る際、振幅および位相の歪を受け
て波形整形回路3に入力する。波形整形回路3で
は歪を受けた正弦波信号bから予め定めた立上り
側(+側)のスライスレベルS+及び立下り側
(−側)のスライスレベルS-で立上り及び立下る
矩形波信号cを発生し、排他的論理和回路5の一
入力とする。このとき得られる矩形波信号cは、
歪を受けた正弦波信号bが、波形整形される際に
立上り側あるいは立下り側のスライスレベルS+
あるいはS-に満たないときには前の状態を保持
する(A部)。一方、矩形波発振器4は波形整形
回路3で得られた矩形波cの、例えば立上りを同
期検出点Dとして位相が制御され、正弦波発振器
2と同一周波数を有する矩形波である基準波形信
号fと、この基準波形信号fの2倍の周波数をも
つ標本化信号gを発生する。排他的論理和回路5
では波形整形された信号cと基準波形信号fとで
排他的論理和をとつて比較を行ない、結果を示す
信号dを論理積回路6に入力する。論理積回路6
では排他的論理和5による比較結果信号dと標本
化信号gとの論理積をとり照合し、照合した結果
をエレメント誤りeとして出力,検出する。 A conventional element error measuring device of this type will be explained with reference to FIGS. 1 and 2 showing its configuration and time charts of each part. When the sine wave signal a output from the sine wave oscillator 2 passes through the communication line 1, which is the line to be measured, it is input to the waveform shaping circuit 3 after being subjected to amplitude and phase distortion. The waveform shaping circuit 3 generates a rectangular wave signal c that rises and falls from the distorted sine wave signal b at a predetermined rising side (+ side) slice level S + and falling side (- side) slice level S - . is generated and used as one input of the exclusive OR circuit 5. The rectangular wave signal c obtained at this time is
When the distorted sine wave signal b is waveform-shaped, the rising or falling side slice level S +
Or, if S - is not reached, the previous state is maintained (Part A). On the other hand, the rectangular wave oscillator 4 has a reference waveform signal f, which is a rectangular wave having the same frequency as the sine wave oscillator 2, whose phase is controlled by using, for example, the rising edge of the rectangular wave c obtained by the waveform shaping circuit 3 as a synchronization detection point D. Then, a sampling signal g having twice the frequency of this reference waveform signal f is generated. Exclusive OR circuit 5
Then, the waveform-shaped signal c and the reference waveform signal f are subjected to an exclusive OR and compared, and a signal d indicating the result is input to the AND circuit 6. AND circuit 6
Then, the comparison result signal d based on the exclusive OR 5 and the sampling signal g are ANDed and compared, and the result of the comparison is output and detected as an element error e.
以上のような従来のエレメント誤り測定装置で
は、符号伝送速度が正弦波信号の周波数の2倍
(標本化信号の周波数と等しい)と固定であるた
め例えば正弦波信号の周波数を2000Hzとすれば、
符号列が1,0の繰り返しで符号伝送速度は4000
ビツト/秒となる。したがつて符号伝送速度を上
げてエレメント誤りの検出能力を向上させるため
には正弦波信号の周波数をその度に高くしなけれ
ばならなかつた。 In the conventional element error measuring device as described above, the code transmission rate is fixed at twice the frequency of the sine wave signal (equal to the frequency of the sampled signal), so for example, if the frequency of the sine wave signal is 2000 Hz,
The code string repeats 1 and 0, and the code transmission rate is 4000.
Bits per second. Therefore, in order to increase the code transmission speed and improve the ability to detect element errors, it is necessary to increase the frequency of the sine wave signal each time.
又、エレメント誤り検出の規準となる標本信号
は正弦波信号の周波数で定まつてしまうため通信
回線の瞬断による誤り検出が不可能になる恐れが
あつた。例えば第2図中、排他的論理回路5の出
力のBは瞬断を検出しているにも拘らず、標本化
信号gとのタイミングが一致しないためエレメン
ト誤りeの信号としては出力されない。 Furthermore, since the sample signal that serves as a standard for element error detection is determined by the frequency of the sine wave signal, there is a possibility that error detection due to a momentary interruption of the communication line may become impossible. For example, in FIG. 2, even though the output B of the exclusive logic circuit 5 has detected a momentary interruption, it is not outputted as a signal of element error e because the timing does not match with the sampling signal g.
本発明の目的は、上記欠点を除去した任意の符
号伝送速度に対するエレメント誤り測定を容易に
行なうことが可能で、且つ瞬断等の影響によるエ
レメント誤りをも充分に検出することができるエ
レメント誤り測定装置を提供することにある。 An object of the present invention is to provide element error measurement that eliminates the above-mentioned drawbacks, makes it possible to easily perform element error measurement for any code transmission rate, and that also sufficiently detects element errors caused by the effects of instantaneous interruptions, etc. The goal is to provide equipment.
上記目的を達成するために本発明ではエレメン
ト誤りを検出するに用いる標本化信号を可変にす
る構成をとつている。 In order to achieve the above object, the present invention is configured to make the sampling signal used for detecting element errors variable.
以下図面を参照して本発明の一実施例を説明す
る。第3図は本発明の一実施例を示すブロツク図
で、第1図と同一参照番号は同じ機能をもつブロ
ツク及び信号を示す。本実施例では矩形波発振器
4と論理積回路6の間に標本化信号gの周期を可
変とするために逓倍回路7を設けている。ここで
矩形波発振器4での位相制御は1サイクル毎に行
ない、同期検出点がない場合には位相の制御を行
なわないが、これに限らず位相の制御は任意のサ
イクルで行なつても良い。 An embodiment of the present invention will be described below with reference to the drawings. FIG. 3 is a block diagram showing one embodiment of the present invention, in which the same reference numerals as in FIG. 1 indicate blocks and signals having the same functions. In this embodiment, a multiplier circuit 7 is provided between the rectangular wave oscillator 4 and the AND circuit 6 in order to make the period of the sampling signal g variable. Here, phase control in the square wave oscillator 4 is performed every cycle, and if there is no synchronization detection point, phase control is not performed, but the phase control is not limited to this and may be performed in any cycle. .
基準波形信号に同期した標本化信号gは逓倍
回路7で符号伝送速度に応じた、例えば正弦波信
号aの6倍の周波数をもつ標本化信号hに変換さ
れる。排他的論理和回路5では波形整形信号cと
基準信号との比較を行ない、論理積回路6にお
いて標本化信号gを逓倍して得られる標本化信号
hにより比較結果信号dの照合を行ない、エレメ
ント誤りeを検出する。このとき標本化信号hの
周期は任意に可変であるので瞬断によるエラーB
をも充分に検出可能となる。 The sampling signal g synchronized with the reference waveform signal is converted by the multiplier circuit 7 into a sampling signal h having a frequency that is, for example, six times that of the sine wave signal a, in accordance with the code transmission rate. The exclusive OR circuit 5 compares the waveform shaped signal c with the reference signal, and the AND circuit 6 compares the comparison result signal d with the sampling signal h obtained by multiplying the sampling signal g. Detect error e. At this time, since the period of the sampling signal h is arbitrarily variable, an error B due to momentary interruption
can also be detected sufficiently.
上述の実施例によれば正弦波信号の周波数の6
倍の符号伝送速度で符号列として1,1,1,
0,0,0の繰り返しのエレメント誤りを測定で
きる。この符号伝送速度は標本化信号の周波数で
定まり、この周波数が正弦波信号のn倍の周波数
とすればn倍の符号伝送速度に対するエレメント
誤りを測定できる。例えば正弦波信号を2100Hzと
し、標本化周波数を正弦波信号の20倍とすれば符
号列が、1,1,1,1,1,1,1,1,1,
1,0,0,0,0,0,0,0,0,0,0の
繰り返しで符号伝送速度は42Kビツト/秒にする
ことができる。 According to the embodiment described above, the frequency of the sinusoidal signal is 6
1, 1, 1, as a code string at twice the code transmission speed
Element errors of repeating 0, 0, 0 can be measured. This code transmission rate is determined by the frequency of the sampling signal, and if this frequency is n times the frequency of the sine wave signal, it is possible to measure element errors for a code transmission rate that is n times higher. For example, if the sine wave signal is 2100Hz and the sampling frequency is 20 times that of the sine wave signal, the code string will be 1, 1, 1, 1, 1, 1, 1, 1, 1,
By repeating 1, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, the code transmission rate can be increased to 42K bits/second.
更に本発明によれば、通信回線の出力が波形整
形される際に立上り側(+側)あるいは立下り側
(−側)のスライスレベルに満たないときは、波
形整形出力は前の状態を保持し、符号伝送速度に
応じたエレメント誤りが検出されるので通信回線
の瞬断時間を測定することもできる。 Furthermore, according to the present invention, when the output of the communication line is waveform-shaped and does not reach the slice level on the rising side (+ side) or the falling side (- side), the waveform-shaped output maintains the previous state. However, since element errors corresponding to the code transmission rate are detected, it is also possible to measure the instantaneous interruption time of the communication line.
以上説明したように本発明は正弦波信号の周波
数を変更することなく、標本化周波数を所望の符
号伝送速度に対応する周波数に設定しているため
任意の符号伝送速度に対するエレメント誤りを極
めて容易に測定できると共に通信回線の瞬断等に
よるエレメント誤りをも測定できると言う顕著な
効果を奏する。 As explained above, the present invention sets the sampling frequency to the frequency corresponding to the desired code transmission rate without changing the frequency of the sine wave signal, so element errors for arbitrary code transmission rates can be extremely easily prevented. It has the remarkable effect of being able to measure element errors caused by instantaneous interruptions in communication lines, etc.
第1図及び第2図は従来のエレメント誤り測定
装置のブロツク図及び第1図における各部の信号
のタイムチヤート、第3図及び第4図は本発明の
一実施例のエレメント誤り測定装置のブロツク図
及び第3図における各部の信号のタイムチヤート
である。
1……通信回線、2……正弦波発振器、3……
波形整形回路、4……矩形波発振器、5……排他
的論理和回路、6……論理積回路、7……逓倍回
路。
1 and 2 are block diagrams of a conventional element error measuring device and time charts of signals of various parts in FIG. 1, and FIG. 3 and 4 are block diagrams of an element error measuring device according to an embodiment of the present invention. 4 is a time chart of signals of various parts in the figure and FIG. 3. 1...Communication line, 2...Sine wave oscillator, 3...
Waveform shaping circuit, 4... Rectangular wave oscillator, 5... Exclusive OR circuit, 6... AND circuit, 7... Multiplier circuit.
Claims (1)
の通信回線で歪を受けた正弦波信号を所定のレベ
ルでスライス、整形した整形信号を発生する手段
とこの整形信号と同期し前記正弦波信号と同一周
波数を有する基準信号を発生する手段と、この基
準信号と前記整形信号とを比較して両者が一致し
ない信号成分を取り出す手段と、所望の周波数を
もつ標本化信号を周波数可変に発生する手段と、
この標本化信号と前記信号成分との論理積をとる
ことにより標本化信号毎のエレメント誤りを検出
する論理積回路とを備えて成ることを特徴とする
エレメント誤り測定装置。1 means for sending a sine wave signal to a communication line; means for generating a shaped signal by slicing and shaping the sine wave signal distorted by the communication line at a predetermined level; and means for generating a shaped signal in synchronization with the shaped signal. means for generating a reference signal having the same frequency as , means for comparing the reference signal and the shaped signal and extracting signal components that do not match, and generating a sampling signal having a desired frequency in a frequency variable manner. means and
An element error measuring device comprising: an AND circuit that detects an element error for each sampled signal by performing a logical product of the sampled signal and the signal component.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP324579A JPS5595442A (en) | 1979-01-11 | 1979-01-11 | Element error measurement instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP324579A JPS5595442A (en) | 1979-01-11 | 1979-01-11 | Element error measurement instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5595442A JPS5595442A (en) | 1980-07-19 |
| JPH0114741B2 true JPH0114741B2 (en) | 1989-03-14 |
Family
ID=11552064
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP324579A Granted JPS5595442A (en) | 1979-01-11 | 1979-01-11 | Element error measurement instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5595442A (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5746257B2 (en) * | 1972-11-20 | 1982-10-02 | ||
| JPS5326792B2 (en) * | 1973-01-18 | 1978-08-04 | ||
| JPS5298571A (en) * | 1976-02-14 | 1977-08-18 | Nippon Telegr & Teleph Corp <Ntt> | Jitter measuring apparatus |
-
1979
- 1979-01-11 JP JP324579A patent/JPS5595442A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5595442A (en) | 1980-07-19 |
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