JPH0124669Y2 - - Google Patents
Info
- Publication number
- JPH0124669Y2 JPH0124669Y2 JP5651984U JP5651984U JPH0124669Y2 JP H0124669 Y2 JPH0124669 Y2 JP H0124669Y2 JP 5651984 U JP5651984 U JP 5651984U JP 5651984 U JP5651984 U JP 5651984U JP H0124669 Y2 JPH0124669 Y2 JP H0124669Y2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- emitting
- wafers
- light receiving
- receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 235000012431 wafers Nutrition 0.000 description 50
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004308 accommodation Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Packaging For Recording Disks (AREA)
- Warehouses Or Storage Devices (AREA)
Description
【考案の詳細な説明】
本考案はキヤリヤカセツト(以下カセツトと称
す)内に収容したウエハの枚数を計測するための
ウエハカウンタに関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wafer counter for counting the number of wafers accommodated in a carrier cassette (hereinafter referred to as cassette).
従来のウエハカウンタ装置、例えば出願番号58
−20144、58.12.29は第7図に示すように駆動モ
ータにより上下する長方形の2枚の平板3b′が並
設されており、該平板3b′の空間部をa〜a′の方
向に水平に往復移動する光センサ受発光装置を設
け平板3b′の上にウエハ7を収容したカセツト8
を載置し、上記のセンサ受発光部1′を移動する
ことにより、カセツト8内に収容したウエハ7の
カウント作業を行なうものである。 Conventional wafer counter device, e.g. Application No. 58
-20144, 58.12.29, as shown in Figure 7, two rectangular flat plates 3b' that are moved up and down by a drive motor are installed side by side, and the space of the flat plates 3b' is horizontally moved in the direction of a to a'. A cassette 8 containing the wafers 7 is mounted on a flat plate 3b' with an optical sensor light receiving and emitting device that moves back and forth.
The wafers 7 housed in the cassette 8 are counted by placing the wafers 7 in the cassette 8 and moving the sensor receiving/emitting section 1'.
しかし、この装置ではセンサ受発光部が1個で
あり、キヤリヤの直下、前記平板の空間部a〜
a′を往復移動するため、カウントの速度アツプは
制限される。 However, in this device, there is only one sensor receiving/emitting section, and the space a~ of the flat plate directly below the carrier.
Since a' is moved back and forth, the speed up of counting is limited.
本考案はセンサ受発光部を各ウエハ収容溝に対
応して設けることにより、センサ受発光部を移動
することなく、ウエハのカウントができるように
してカウント時間を短縮することを目的としたも
のである。 The purpose of this invention is to shorten the counting time by providing a sensor receiving/emitting section corresponding to each wafer storage groove so that wafers can be counted without moving the sensor receiving/emitting section. be.
本考案は複数のセンサ受発光部1(以下受発光
部と称す)を等間隔かつ一列に配設し、該受発光
部を挾んで両側に互に対応するウエハ収容溝を有
する部材を並設するとともに、両側のウエハ収容
溝の底面を含む面と受発光部との間に空間部12
を設け、受発光部と上記の部材とを固着すること
により、受発光部の往復運動を不要となし、カセ
ツト内ウエハのカウント速度をアツプすることが
出来るようにした。 The present invention involves arranging a plurality of sensor light emitting/receiving sections 1 (hereinafter referred to as "receiving/emitting sections") in a line at regular intervals, and placing members having mutually corresponding wafer storage grooves on both sides sandwiching the sensor light emitting/receiving sections. At the same time, a space 12 is formed between the surface including the bottom surface of the wafer storage groove on both sides and the light receiving/emitting section.
By fixing the light receiving/emitting section and the above-mentioned member, it is possible to eliminate the need for reciprocating movement of the light receiving/emitting section and increase the counting speed of wafers in the cassette.
本考案を実施例により説明すると、第1図に示
すように複数の受発光部1を等間隔かつ一列に配
設し、該受発光部1を挾んで上下に対応する部材
としてテフロン又はダイフロン製の側板3aを設
ける。又センサ増幅器を内蔵した函体4と側板3
aとの間にアルミ板5を介在させ、ウエハ収容溝
2の底面11を含む面と受発光部1の頭部との間
に空間部12を設けて受発光部1及び側板3a並
びに函体4等を互に固着する。さらに上記側板3
aに対応する部材として側板3a′を設け、両側板
3a,3a′にチヤツク機能を設ける。 To explain the present invention with reference to an embodiment, as shown in FIG. 1, a plurality of light receiving and emitting sections 1 are arranged in a line at regular intervals, and members made of Teflon or Diflon are used to sandwich the light receiving and emitting sections 1 and correspond to the upper and lower sides. A side plate 3a is provided. Also, a case 4 and a side plate 3 containing a built-in sensor amplifier.
a, and a space 12 is provided between the surface including the bottom surface 11 of the wafer accommodating groove 2 and the head of the light emitting/receiving section 1. Fix the 4th class to each other. Furthermore, the side plate 3
A side plate 3a' is provided as a member corresponding to a, and a chuck function is provided on both side plates 3a, 3a'.
今、第5図に示すようにキヤリヤ8内に収容さ
れたウエハ7を移し換え用つき上げ装置によりつ
き上げ、つき上げたウエハ7を第1図に示すウエ
ハカウンタの両側3a及び3a′を作動させ、ウエ
ハ収容溝2に収容し把持する。ウエハを両側板3
a,3a′により把持、即ちチヤツクすると、同時
にチヤツクされたウエハに対し、側板3aに設け
た受発光部1より光をグループ別に順次発光す
る。発光方法は隣接するウエハとの光の干渉を避
けるため、第6図に示すようにグループ別に分け
たスキヤンニング方式とする。(第6図参照…受
発光部が25ケ設けられた場合の例)発光されると
ウエハ溝2に収容されるウエハ7の有無により受
発光部1への受光量が変化する。この変化の状況
を受発光部1が増幅器および接続コード6を介し
て接続した識別装置(図示省略−公知のもの)に
より判別することにより、ウエハ収容溝2ごとの
ウエハ収容の有無及び枚数を計測することが出来
る。 Now, as shown in FIG. 5, the wafer 7 housed in the carrier 8 is lifted up by the transfer lifting device, and the lifted wafer 7 is operated on both sides 3a and 3a' of the wafer counter shown in FIG. Then, the wafer is stored in the wafer storage groove 2 and held. Place the wafer on both side plates 3
When the wafers are gripped or chucked by the wafers a and 3a', the light emitting/receiving section 1 provided on the side plate 3a sequentially emits light into groups for the simultaneously chucked wafers. In order to avoid light interference with adjacent wafers, the light emitting method is a scanning method in which the wafers are divided into groups as shown in FIG. (See FIG. 6...Example when 25 light receiving/emitting sections are provided) When light is emitted, the amount of light received by the light receiving/emitting section 1 changes depending on the presence or absence of the wafer 7 accommodated in the wafer groove 2. By determining the status of this change using an identification device (not shown - known device) connected to the light receiving/emitting unit 1 via an amplifier and a connection cord 6, the presence or absence and number of wafers stored in each wafer storage groove 2 are measured. You can.
この装置を使用することにより、受発光部の移
動が不必要となるばかりでなく、側板3a及び3
a′によりウエハがチヤツクされることにより、第
3図に示すようにチヤツクされたウエハ7の周縁
部端面11と受発光部1の頭部との距離lが常に
一定となり又ウエハ7と測板3a,3a′は完全に
係合、各ウエハは平行かつ等間隔となるので、従
来のウエハカウンタを使用する場合のウエハアラ
イナー装置及び押し上げ板によるウエハの突き上
げが不要となり、カウント作業のスピードのアツ
プが図れる。(出願番号58−201044ウエハカウン
タ参照)
第4図はウエハ溝を有する部材として他の実施
例を示すもので複数の受発光部1を等間隔かつ一
列に設け、その両側に互に対応するウエハ収容溝
2を有する上記部材として、昇降装置に連結され
上下動が可能なテフロン又はダイフロン製の平板
3bを並設する。 By using this device, not only does it become unnecessary to move the light receiving and emitting parts, but also the side plates 3a and 3
As the wafer is chucked by a', the distance l between the peripheral end face 11 of the chucked wafer 7 and the head of the light receiving/emitting section 1 is always constant, as shown in FIG. 3a and 3a' are completely engaged, and each wafer is parallel and equally spaced, so there is no need to push up the wafers using a wafer aligner or push-up plate when using a conventional wafer counter, increasing the speed of counting work. can be achieved. (Refer to Application No. 58-201044 Wafer Counter) Fig. 4 shows another embodiment of the member having a wafer groove, in which a plurality of light receiving and emitting parts 1 are provided in a row at equal intervals, and wafers corresponding to each other are placed on both sides of the member. As the above-mentioned member having the housing groove 2, a flat plate 3b made of Teflon or Diflon, which is connected to a lifting device and can move up and down, is arranged in parallel.
又、上記受発光部1とセンサ増幅器を内蔵した
函体4と平板3bとを固着する。 Further, the case 4 containing the light receiving/emitting section 1 and the sensor amplifier is fixed to the flat plate 3b.
次に第5図に示すように搬送台9により運ばれ
て来たウエハキヤリヤ8の直下に本考案によるウ
エハカウンタを配置し、キヤリヤ8内のウエハ7
を平板3bにより軽くつき上げる。これによりキ
ヤリヤ8内のウエハ収容溝2に傾いて収容されて
いたウエハ7は第7図及び第9図に示すのと同じ
ように矯正され、カセツト内に収容されたウエハ
のオリエンテーシヨンフラツト部10が測板3b
のウエハ収容溝2の底部に完全に密着し、その直
下に設けた受発光部1の頭部にある受発光面との
距離lがいづれのウエハ7も略同じとなる。 Next, as shown in FIG.
is lightly pushed up using the flat plate 3b. As a result, the wafers 7, which had been accommodated in the wafer accommodation groove 2 in the carrier 8 at an angle, are straightened in the same way as shown in FIGS. 7 and 9, and the orientation flat of the wafers accommodated in the cassette is Part 10 is the measuring plate 3b
The wafers 7 are completely in close contact with the bottom of the wafer accommodating groove 2, and the distance l from the light receiving/emitting surface at the head of the light receiving/emitting section 1 provided directly below the wafer 7 is approximately the same.
次に受発光部1より第1図の実施例と同様な方
法により、グループ別に順次発光することにより
識別装置を通してキヤリヤ内に収容されているウ
エハをカウントすることが出来る。 Next, the light emitting/receiving section 1 sequentially emits light for each group in the same manner as in the embodiment shown in FIG. 1, so that the wafers accommodated in the carrier can be counted through the identification device.
本実施例は従来の装置(出願番号58−201044)
に比しカウント速度のアツプが図れるとともに従
来の装置の一部改造により製作が可能である。 This example is a conventional device (application number 58-201044)
The counting speed can be increased compared to the conventional device, and it can be manufactured by partially modifying the conventional device.
本考案は上述の通りにしたので、前記従来の装
置のように、センサ受発光部を移動する操作とそ
の時間を要せず、単にウエハ収容溝にウエハを収
容した状態で直ちにカウントすることができウエ
ハのカウント時間を短縮することができる。又ウ
エハ収容溝の底面を含む面と受発光部との間に空
間部を設けたので、受発光部からの光をウエハの
周縁部で反射してそれを受発光部で感知すること
が出来るとともに、受発光部の移動を伴なわない
ので測定精度を高めることが出来る。 Since the present invention is as described above, it is possible to count wafers immediately after storing them in the wafer storage groove, without requiring the operation and time required to move the sensor light receiving and emitting part unlike the conventional device. The time required to count wafers can be reduced. Furthermore, since a space is provided between the surface including the bottom surface of the wafer storage groove and the light emitting/receiving section, the light from the light receiving/emitting section can be reflected by the periphery of the wafer and can be sensed by the light receiving/emitting section. At the same time, the measurement accuracy can be improved because there is no movement of the light receiving and emitting parts.
第1図は本考案の実施例の斜視図、第2図は第
1図の−線部断面図、第3図は第2図の−
線部断面図、第4図は他の実施例の要部斜視
図、第5図は第4図の使用状態を示す正面図、第
6図は各センサ受光部の作動状態を示す線図、第
7図は従来のウエハカウンタの使用状態を示す斜
視図、第8図は第7図の−線部断面図、第9
図は第8図の−線部断面図である。
1……センサ受発光部、2……ウエハ収容溝、
11……ウエハ収容溝2の底面を含む面、12…
…空間部、3a……センサ受発光部を固着した測
板、3a′……3aに対応する側板、3b……上下
動可能な平板。
Fig. 1 is a perspective view of an embodiment of the present invention, Fig. 2 is a sectional view taken along the - line in Fig. 1, and Fig. 3 is a - line sectional view in Fig. 2.
4 is a perspective view of a main part of another embodiment, FIG. 5 is a front view showing the usage state of FIG. 4, and FIG. 6 is a line diagram showing the operating state of each sensor light receiving section. FIG. 7 is a perspective view showing a conventional wafer counter in use, FIG. 8 is a cross-sectional view taken along the line - - in FIG.
The figure is a sectional view taken along the line -- in FIG. 8. 1...Sensor light receiving and emitting section, 2...Wafer storage groove,
11...A surface including the bottom surface of the wafer storage groove 2, 12...
. . . Space portion, 3a . . . Measurement plate to which the sensor receiving/emitting part is fixed, 3a' . . . Side plate corresponding to 3a, 3b .
Claims (1)
配設し、該センサ受発光部1を挾んで両側に互
に対応するウエハ収容溝2を有する部材を並設
するとともに、該ウエハ収容溝2の底面11を
含む面とセンサ受発光部1の頭部との間に空間
部12を設けたことを特徴とするウエハカウン
タ。 2 ウエハ収容溝を有する部材が互に対抗する一
対の可動側板3a,3a′であることを特徴とす
る実用新案登録請求の範囲第1項記載のウエハ
カウンタ。 3 ウエハ収容溝2を有する部材が上下動が可能
な平板3bであることを特徴とする実用新案登
録請求の範囲第1項記載のウエハカウンタ。[Claims for Utility Model Registration] 1. A plurality of sensor receiving and emitting sections 1 are arranged in a line at regular intervals, and members having mutually corresponding wafer accommodating grooves 2 on both sides of the sensor receiving and emitting sections 1 are lined up. A wafer counter characterized in that a space 12 is provided between the surface including the bottom surface 11 of the wafer storage groove 2 and the head of the sensor receiving/emitting section 1. 2. The wafer counter according to claim 1, wherein the members having wafer storage grooves are a pair of movable side plates 3a, 3a' facing each other. 3. The wafer counter according to claim 1, wherein the member having the wafer storage groove 2 is a flat plate 3b that can be moved up and down.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5651984U JPS60170869U (en) | 1984-04-17 | 1984-04-17 | wafer counter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5651984U JPS60170869U (en) | 1984-04-17 | 1984-04-17 | wafer counter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60170869U JPS60170869U (en) | 1985-11-12 |
| JPH0124669Y2 true JPH0124669Y2 (en) | 1989-07-26 |
Family
ID=30580189
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5651984U Granted JPS60170869U (en) | 1984-04-17 | 1984-04-17 | wafer counter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60170869U (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06105746B2 (en) * | 1986-07-03 | 1994-12-21 | 東京エレクトロン相模株式会社 | Wafer counter and wafer counting method |
| JPH0611070B2 (en) * | 1987-02-13 | 1994-02-09 | 東京エレクトロン株式会社 | Wafer counter |
-
1984
- 1984-04-17 JP JP5651984U patent/JPS60170869U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60170869U (en) | 1985-11-12 |
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