JPH0153762B2 - - Google Patents
Info
- Publication number
- JPH0153762B2 JPH0153762B2 JP21375282A JP21375282A JPH0153762B2 JP H0153762 B2 JPH0153762 B2 JP H0153762B2 JP 21375282 A JP21375282 A JP 21375282A JP 21375282 A JP21375282 A JP 21375282A JP H0153762 B2 JPH0153762 B2 JP H0153762B2
- Authority
- JP
- Japan
- Prior art keywords
- chalcogen
- light
- chalcogen compound
- optical waveguide
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 25
- 150000001786 chalcogen compounds Chemical class 0.000 claims description 24
- 239000010409 thin film Substances 0.000 claims description 17
- 229910052798 chalcogen Inorganic materials 0.000 claims description 11
- 150000001787 chalcogens Chemical class 0.000 claims description 11
- 239000000758 substrate Substances 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 5
- 229910052733 gallium Inorganic materials 0.000 claims description 3
- 229910052711 selenium Inorganic materials 0.000 claims description 3
- 239000005357 flat glass Substances 0.000 claims description 2
- 239000011521 glass Substances 0.000 description 8
- 239000010408 film Substances 0.000 description 6
- 238000004061 bleaching Methods 0.000 description 5
- 230000001678 irradiating effect Effects 0.000 description 4
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000007738 vacuum evaporation Methods 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 239000003708 ampul Substances 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/13—Integrated optical circuits characterised by the manufacturing method
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Optical Integrated Circuits (AREA)
- Glass Compositions (AREA)
Description
本発明は光伝送システムの構成要素である光分
岐・光結合回路素子等として優れた新規な光導波
路に関する。
従来のこの種光導波路としては、オプテイカル
フアイバーを組合せたもの或いはガラス基板面に
真空蒸着、スパツタリング等の手段により、周囲
よりも高光屈折率を有する光通過ガラス部分を設
けた光導波路が知られている。しかし前者は高い
組立精度を要する上に機械的振動に弱く、後者は
光通過ガラス部と基板ガラスとの境界面の面精度
が悪く、光の散乱損失が大きいという欠点を有し
ている。
本願発明の目的は前記した欠点を解消した光導
波路を提供することにあり、その要旨はモル%で
Se65〜97%,Ga3〜35%を有する組成からなるカ
ルコゲン化合物に局部的に光を照射し、該照射部
分と非照射部分との間に光屈折率差を持たせたこ
とを特徴とするカルコゲン光導波路にある。
本願発明に用いられるカルコゲン化合物は特願
昭57―170653号として先に出願したもので、本カ
ルコゲン化合物を240℃以下の温度下で光照射す
ると結晶化して可視光透過率が減少し(ダークニ
ング現象という)、ダークニングしたものを240℃
以上に加熱するとガラス化して可視光透過率が増
大して元の状態に戻る(ブリーチング現象とい
う)という性質を有する物質である。
本願発明者等は本カルコゲン化合物の物性につ
いてさらに研究の結果、前記ダークニング時には
ブリーチング時に較べ光屈折率が大きいことを見
つけ、局部的にダークニングを起させることによ
つて光導波路が容易に製作出来ることを発明し、
ここに開示するものである。
本願発明に用いるカルコゲン化合物を240℃以
下の温度に加熱した状態で光を照射すると、化合
物のSeとGaの配合比率によつて第1表の通りダ
ークニング状態での光屈折率が増大する。
光導波路としての屈折率差は大きい程好ましい
が、Δnが0.003あれば実用に耐える。また本カル
コゲン化合物はブリーチング時またはダークニン
グ時において、可視領域の波長の光をかなり吸収
するが、波長800nm近辺の近赤外線に対しては吸
収が少いので近赤外光の光導波路に適している。
The present invention relates to a novel optical waveguide that is excellent as an optical branching/coupling circuit element, etc., which is a component of an optical transmission system. Conventional optical waveguides of this type include those in which optical fibers are combined, or optical waveguides in which a light-transmitting glass portion having a higher optical refractive index than the surrounding area is provided on the surface of a glass substrate by means such as vacuum evaporation or sputtering. ing. However, the former requires high assembly precision and is susceptible to mechanical vibration, while the latter has the disadvantage that the surface precision of the interface between the light-transmitting glass portion and the substrate glass is poor and the scattering loss of light is large. The purpose of the present invention is to provide an optical waveguide that eliminates the above-mentioned drawbacks, and its gist is
A chalcogen characterized by locally irradiating a chalcogen compound having a composition of 65 to 97% Se and 3 to 35% Ga to create a difference in optical refractive index between the irradiated part and the non-irradiated part. Located in the optical waveguide. The chalcogen compound used in the present invention was previously filed as Japanese Patent Application No. 170653/1986. When this chalcogen compound is irradiated with light at a temperature below 240°C, it crystallizes and its visible light transmittance decreases (darkening). phenomenon), the darkened product is heated to 240℃.
It is a substance that has the property of vitrifying when heated to a higher level, increasing its visible light transmittance, and returning to its original state (referred to as a bleaching phenomenon). As a result of further research on the physical properties of the present chalcogen compound, the inventors of the present application found that the optical refractive index was higher during the darkening than during the bleaching, and by causing local darkening, it was possible to easily form an optical waveguide. Invent something that can be manufactured,
It is disclosed here. When the chalcogen compound used in the present invention is heated to a temperature of 240° C. or lower and irradiated with light, the optical refractive index in the darkening state increases as shown in Table 1, depending on the compounding ratio of Se and Ga in the compound. The larger the difference in refractive index is, the better it is for an optical waveguide, but if Δn is 0.003, it is practical. In addition, this chalcogen compound absorbs a considerable amount of light in the visible wavelength range during bleaching or darkening, but it absorbs little near-infrared light with a wavelength of around 800 nm, making it suitable for near-infrared light optical waveguides. ing.
【表】
本発明の光導波路の形状は問わないが、ダーク
ニングさせるための光はカルコゲン化合物の表層
からあまり深くには到達しないので、カルコゲン
化合物は基体面上に薄膜状に形成したものが望ま
しい。また光を照射してダークニングさせる関係
から基体は光を通す板ガラスが望ましく、またカ
ルコゲン膜々厚コントロールが膜付着強度等の点
からカルコゲン膜は蒸着膜であることが好まし
い。またカルコゲン化合物は湿気に合うと劣化し
やすいので、表面コーテイングすることが望まし
く、コーテイング膜としてはパラキシリレン
[Table] The shape of the optical waveguide of the present invention does not matter, but since the light for darkening does not reach too deep from the surface layer of the chalcogen compound, it is preferable that the chalcogen compound be formed in the form of a thin film on the substrate surface. . In addition, the substrate is preferably a light-transmitting plate glass in order to cause darkening by irradiation with light, and the chalcogen film is preferably a vapor-deposited film from the viewpoint of controlling the thickness of the chalcogen film and adhesion strength. In addition, since chalcogen compounds tend to deteriorate when exposed to moisture, it is desirable to coat the surface with paraxylylene.
【式】を1.5μm
厚ぐらいに真空蒸着したものが光透過率、耐熱
性、膜強度、耐水性などの点から特に好ましい。
ダークニングさせる光の波長は300〜800nmの
範囲がよく、800nmよりも長波長の光ではダーク
ニングに長時間を要し、また300nmよりもも短波
長の光ではダークニングを起さない。またダーク
ニング時間短縮の点から、またダークニング状態
での結晶粒を微細化し、境界面での散乱を防ぐ点
からも光は強力なものが好ましく、光照射によつ
てカルコゲン化合物の温度が240℃以上に過熱さ
れるのを防ぐためにも赤外域の波長の光を含まな
い単色光源、例えばHe―Neレーザー、Arレー
ザーなどは特に好ましい。
本発明に用いるカルコゲン化合物は240℃以下
であれば高温である程光照射によるダークニング
時間が短縮できる。
しかし240℃を越えると瞬時にブリーチングが
起るので240℃以下でダークニングさせる必要が
あり、安全をみて200〜230℃でダークニングさせ
ることが好ましい。
本発明に用いるカルコゲン化合物中には不純物
として不本意ながら混入する成分以外に、Al,
Si,P,S,Ge,As,In,Sn,Sb,Te又はTl
から選ばれた1種ないし2種以上の元素が10mol
%以下までなら含まれても本発明のカルコゲン光
導波路の性能に悪影響を与えることはない。
実施例 1
Ga粉末、Se粉末(それぞれ99.999%純度)を
原子百分率において0:100,3:97,5:95,
10:90,20:80,30:70,35:65,40:60の割合
で混合し、各混合物を石英アンプルに封入し、真
空状態においてこれを1100℃、10時間加熱融解し
た後、急冷して成分比の異なる5種のGa―Se化
合物を得た。
次いでこれを取り出し粉砕して得られる5種の
粉末を順次蒸着源とし、真空蒸着装置でガラス基
板上にそれぞれ成分比の異なるGa―Seカルコゲ
ン化合物薄膜を形成させた。この時の蒸着条件は
基板温度:30℃、蒸着レート:50A/分、真空
度:2×10-5torrであり得られたGa―Seカルコ
ゲン化合物薄膜の厚味は5000Aであつた。更にこ
れら薄膜が堆積したガラス基板を別の真空蒸着装
置に移し、基板温度を25〜30℃に維持した上、1
×10-3torrの真空度でパラキシリレンを蒸着源と
し、当該薄膜上にパラキシリレンの保護膜を被覆
させた。この時のパラキシリレンの厚味は約
1.5μmであつた。
上記の様に調整した成分比の異なる8種類の
Ga―Seカルコゲン化合物薄膜の屈折率変化を調
べたものが第1図であり、当該薄膜の屈折率が約
3.6〜2.7と変化している。
次いで上記8種類の成分比のGa―Seカルコゲ
ン化合物薄膜につき、キセノンランプ(強度
100mw/cm2)を照射しつつ210℃に加熱した。
この照射および加熱により当該薄膜は、その透
過色が橙色から黒褐色に変化することが認められ
た。この現象はカルコゲン材料によく見られるダ
ークニング(darkening)である。
同時に得られる薄膜の屈折率も変化する。上記
8種類のGa―Seカルコゲン化合物薄膜の光・熱
処理前後の屈折率変化を第1表に示す。
さらに、ブリーチング状態にある8種類の成分
比のGa―Seカルコゲン化合物薄膜のうち、
Ga0.1Se0.9の組成よりなりパラキシリレンを積層
したカルコゲンガラス薄膜サンプルを第2図に示
すように室温下でHe―Neレーザー光線(λ=
6328Å)をレンズで絞り(スポツト径100μ)微
小領域にピントを合わせ、任意の光回路パターン
状に照射すると、この微小領域においてダークニ
ングによる結晶化現象が現われ、この微小領域の
屈折率が光を受けていない部分の屈折率に比べ、
第1表で示した様な変化幅で増大した。このよう
な操作を行なうことにより容易に任意の光回路パ
ターン導波路を形成できることもわかる。
以上から本願発明のカルコゲン光導波路は単に
光を照射するだけで自由自在なパターンの光導波
路となり、かつ従来の真空蒸着法等と較べて境界
面精度の良いしたがつて光散乱損失の少い光導波
路であることが判る。[Formula] is particularly preferably vacuum-deposited to a thickness of about 1.5 μm from the viewpoint of light transmittance, heat resistance, film strength, water resistance, etc. The wavelength of light for darkening is preferably in the range of 300 to 800 nm; light with a wavelength longer than 800 nm takes a long time to darken, and light with a wavelength shorter than 300 nm does not cause darkening. In addition, from the viewpoint of shortening the darkening time, refining the crystal grains in the darkening state, and preventing scattering at the interface, it is preferable that the light be strong. In order to prevent overheating above .degree. C., monochromatic light sources that do not include light in the infrared wavelength range, such as He--Ne lasers and Ar lasers, are particularly preferred. When the chalcogen compound used in the present invention is heated to 240° C. or lower, the darkening time due to light irradiation can be shortened as the temperature increases. However, if the temperature exceeds 240°C, bleaching occurs instantaneously, so it is necessary to darken at a temperature below 240°C, and for safety reasons, it is preferable to darken at a temperature of 200 to 230°C. In addition to components that are unintentionally mixed in as impurities in the chalcogen compound used in the present invention, Al,
Si, P, S, Ge, As, In, Sn, Sb, Te or Tl
10mol of one or more elements selected from
% or less will not adversely affect the performance of the chalcogen optical waveguide of the present invention. Example 1 Ga powder and Se powder (each with a purity of 99.999%) were mixed in atomic percentages of 0:100, 3:97, 5:95,
Mix at a ratio of 10:90, 20:80, 30:70, 35:65, 40:60, seal each mixture in a quartz ampoule, heat and melt in vacuum at 1100℃ for 10 hours, and then rapidly cool. Five types of Ga-Se compounds with different component ratios were obtained. Next, this was taken out and pulverized, and five types of powder obtained were sequentially used as vapor deposition sources to form Ga--Se chalcogen compound thin films with different component ratios on glass substrates using a vacuum vapor deposition apparatus. The deposition conditions at this time were: substrate temperature: 30°C, deposition rate: 50A/min, degree of vacuum: 2×10 -5 torr, and the thickness of the obtained Ga-Se chalcogen compound thin film was 5000A. Furthermore, the glass substrate on which these thin films were deposited was transferred to another vacuum evaporation apparatus, the substrate temperature was maintained at 25 to 30°C, and 1
Paraxylylene was used as a deposition source at a vacuum level of ×10 -3 torr, and a protective film of paraxylylene was coated on the thin film. The thickness of paraxylylene at this time is approximately
It was 1.5 μm. 8 types with different component ratios adjusted as above.
Figure 1 shows an investigation of the refractive index change of a Ga-Se chalcogen compound thin film, and the refractive index of the thin film is approximately
It is changing from 3.6 to 2.7. Next, the Ga-Se chalcogen compound thin film with the above eight component ratios was heated with a xenon lamp (intensity
It was heated to 210° C. while irradiating with 100 mw/cm 2 ). It was observed that the transmitted color of the thin film changed from orange to blackish brown due to this irradiation and heating. This phenomenon is darkening, which is common in chalcogen materials. At the same time, the refractive index of the thin film obtained also changes. Table 1 shows the changes in the refractive index of the eight types of Ga--Se chalcogen compound thin films before and after light and heat treatment. Furthermore, among the Ga-Se chalcogen compound thin films with eight different component ratios in the bleaching state,
A chalcogen glass thin film sample with a composition of Ga0.1Se0.9 and laminated with paraxylylene was exposed to a He-Ne laser beam (λ=
6328Å) is focused on a minute area with an aperture (spot diameter of 100μ) and irradiated onto an arbitrary optical circuit pattern, a crystallization phenomenon due to darkening appears in this minute area, and the refractive index of this minute area changes the light. Compared to the refractive index of the unaffected part,
It increased with the range of change shown in Table 1. It can also be seen that by performing such operations, any optical circuit pattern waveguide can be easily formed. From the above, the chalcogen optical waveguide of the present invention can be formed into an optical waveguide with a freely patterned pattern by simply irradiating it with light, and has better boundary surface precision than conventional vacuum evaporation methods, so it is an optical waveguide with less light scattering loss. It turns out that it is a wave path.
第1図は本願発明に用いるカルコゲン化合物の
Se:Gaの含有比率を変化させた場合の屈折率変
化を示したグラフ。第2図は基板上に形成したカ
ルコゲン薄膜に光を照射して本発明の導波路を形
成する方法を表した図で、1:カルコゲン化合物
薄膜層、2:パラキシリレン保護膜、3:ガラス
基板、4:レーザービーム、5:集光レンズ、
6:集光スポツトである。
Figure 1 shows the chalcogen compound used in the present invention.
A graph showing changes in refractive index when changing the content ratio of Se:Ga. FIG. 2 is a diagram showing a method of forming a waveguide of the present invention by irradiating light onto a chalcogen thin film formed on a substrate, in which 1: chalcogen compound thin film layer, 2: paraxylylene protective film, 3: glass substrate, 4: Laser beam, 5: Condensing lens,
6: It is a light condensing spot.
Claims (1)
成からなるカルコゲン化合物に局部的に、波長が
300〜800nmの光を240℃以下の温度のもとで照射
し、該照射部分と非照射部分との間に光屈折率差
を持たせたことを特徴とするカルコゲン光導波
路。 2 前記カルコゲン化合物が、基体面上に薄膜状
に形成されたカルコゲン化合物である特許請求の
範囲第1項記載のカルコゲン光導波路。 3 前記カルコゲン化合物が板ガラス面上に薄膜
状に蒸着されたカルコゲン化合物である特許請求
の範囲第2項記載のカルコゲン光導波路。[Claims] A chalcogen compound having a composition of 65 to 97% Se and 3 to 35% Ga at 1 mol% has a wavelength that changes locally.
1. A chalcogen optical waveguide, characterized in that it is irradiated with light of 300 to 800 nm at a temperature of 240° C. or lower to create a difference in optical refractive index between the irradiated portion and the non-irradiated portion. 2. The chalcogen optical waveguide according to claim 1, wherein the chalcogen compound is a chalcogen compound formed in the form of a thin film on a substrate surface. 3. The chalcogen optical waveguide according to claim 2, wherein the chalcogen compound is a chalcogen compound deposited in the form of a thin film on a plate glass surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21375282A JPS59104608A (en) | 1982-12-06 | 1982-12-06 | Chalcogen optical waveguide |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21375282A JPS59104608A (en) | 1982-12-06 | 1982-12-06 | Chalcogen optical waveguide |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59104608A JPS59104608A (en) | 1984-06-16 |
| JPH0153762B2 true JPH0153762B2 (en) | 1989-11-15 |
Family
ID=16644433
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21375282A Granted JPS59104608A (en) | 1982-12-06 | 1982-12-06 | Chalcogen optical waveguide |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59104608A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9511871D0 (en) * | 1995-06-12 | 1995-08-09 | Secr Defence | Microstructures in chalcogen-containing glasses |
| US6928224B2 (en) * | 2001-03-09 | 2005-08-09 | Corning Incorporated | Laser-induced crystallization of transparent glass-ceramics |
-
1982
- 1982-12-06 JP JP21375282A patent/JPS59104608A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59104608A (en) | 1984-06-16 |
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