JPH021268B2 - - Google Patents
Info
- Publication number
- JPH021268B2 JPH021268B2 JP56211971A JP21197181A JPH021268B2 JP H021268 B2 JPH021268 B2 JP H021268B2 JP 56211971 A JP56211971 A JP 56211971A JP 21197181 A JP21197181 A JP 21197181A JP H021268 B2 JPH021268 B2 JP H021268B2
- Authority
- JP
- Japan
- Prior art keywords
- electric field
- optical element
- measured
- field
- dielectric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
- G01R29/0885—Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
Description
【発明の詳細な説明】
この発明は、電気光学効果を有する光学素子を
用いて電界を測定する交流電界測定装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an alternating current electric field measuring device that measures an electric field using an optical element having an electro-optical effect.
第1図には、電気光学効果を有する光学素子と
してポツケルス素子を用いて電界を測定する原理
図を示している。図において、1は光源、2は偏
光子、3はポツケルス素子の単体、4は検光子、
5は受光器、6は電界の方向、7は光、8a,8
bはそれぞれ電界を発生させる高電圧電極、接地
電極を示す。上記両電極8a,8b間の被測定場
9には媒体(真空の場合も含む)が満たされてい
る。 FIG. 1 shows a principle diagram of measuring an electric field using a Pockels element as an optical element having an electro-optic effect. In the figure, 1 is a light source, 2 is a polarizer, 3 is a single Pockels element, 4 is an analyzer,
5 is the light receiver, 6 is the direction of the electric field, 7 is the light, 8a, 8
b indicates a high voltage electrode and a ground electrode that generate an electric field, respectively. The field 9 to be measured between the electrodes 8a and 8b is filled with a medium (including a vacuum).
以上の構成において、光源1から出た光7は、
偏光子2、ポツケルス素子3、検光子4を通つて
受光器5に入る。 In the above configuration, the light 7 emitted from the light source 1 is
The light passes through a polarizer 2, a Pockels element 3, and an analyzer 4 and enters a light receiver 5.
ポツケルス素子3は、電界6の強さに比例して
通過する光7の回転角度を変化させる性質を有し
ているので、筐体の外側から光を被測定場9内に
通過させて、両電極8a,8b間の電界の測定を
ポツケルス素子3には非接触、かつ電気的に絶縁
した状態で測定可能ならしめるものである。とこ
ろが、被測定場の電界が交流電界であれば、被測
定場の誘電率とポツケルス素子の誘電率とが異な
る場合には被測定場内の電界が、ポツケルス素子
の挿入によつて歪んで、正確な電界の測定ができ
ないという欠点があつた。 Since the Pockels element 3 has the property of changing the rotation angle of the light 7 passing therethrough in proportion to the strength of the electric field 6, it allows the light to pass from the outside of the housing into the field 9 to be measured. The electric field between the electrodes 8a and 8b can be measured without contacting the Pockels element 3 and in an electrically insulated state. However, if the electric field in the field to be measured is an alternating electric field, and the permittivity of the field to be measured is different from the permittivity of the Pockels element, the electric field in the field to be measured will be distorted by the insertion of the Pockels element, making it difficult to accurately The drawback was that it was not possible to measure electric fields.
この発明は、以上のような従来のものの欠点を
解消するためになされたもので、光学素子との組
み合せの誘電率を被測定場内の媒体の誘電率に近
付ける誘電体を被測定場内に設けて、被測定場の
電界の歪みを減じて電界の測定を行なう交流電界
測定装置を提供しようとするものである。 This invention was made in order to eliminate the above-mentioned drawbacks of the conventional devices, and includes providing a dielectric material in the field to be measured that brings the dielectric constant of the combination with the optical element close to the permittivity of the medium in the field to be measured. The present invention aims to provide an alternating current electric field measuring device that measures an electric field by reducing distortion of the electric field in a field to be measured.
以下、この発明の一実施例を図によつて説明す
る。第2図、第3図において、12は複合光学素
子で、被測定場9の交流電界内に設けられる。こ
の複合光学素子12は、中央部にポツケルス素子
を光学素子10として用い、電界に直角な方向の
両側からポツケルス素子からなる光学素子10と
は誘電率の異なる誘電率10,11で挾持した構
造になつている。ここで、ポツケルス素子10の
誘電率をεn(単位を略す。以下同じ)、厚さをd1、
電界方向の断面積をS、誘電体11の誘電率を
εt、厚さをd2、電界方向の断面積をS(この実施
例では、ポツケルス素子と同じになる。)、被測定
場9の媒体の誘電率をεsとすると、ポツケルス素
子10の静電容量CnはCn=εn・S/d1、誘電体
11の静電容量Ctは、両側分を合わせてCt=εt・
S/2d2となる。したがつて、ポツケルス素子1
0の上下両側に誘電体11を一体的に積層した複
合光学素子12の静電容量CpはCp=εn・εtS/
(εt・d1+2εn・d2)となる。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings. In FIGS. 2 and 3, reference numeral 12 denotes a composite optical element, which is provided within the alternating current electric field of the field 9 to be measured. This composite optical element 12 has a structure in which a Pockels element is used as the optical element 10 in the center, and it is sandwiched from both sides in the direction perpendicular to the electric field by dielectric constants 10 and 11, which have different dielectric constants from the optical element 10 made of the Pockels element. It's summery. Here, the dielectric constant of the Pockels element 10 is εn (unit is omitted; the same applies hereinafter), the thickness is d 1 ,
The cross-sectional area in the electric field direction is S, the dielectric constant of the dielectric 11 is εt, the thickness is d 2 , the cross-sectional area in the electric field direction is S (in this example, it is the same as the Pockels element), and the field to be measured 9 is When the dielectric constant of the medium is εs, the capacitance Cn of the Pockels element 10 is Cn=εn・S/d 1 , and the capacitance Ct of the dielectric 11 on both sides is Ct=εt・
It becomes S/2d 2 . Therefore, Pockels element 1
The capacitance Cp of the composite optical element 12 in which the dielectric material 11 is integrally laminated on both the upper and lower sides of 0 is Cp=εn・εtS/
(εt・d 1 +2εn・d 2 ).
一方、この複合光学素子12と同じ体積の体積
の被測定場9の静電容量CはC=εsS/(d1+
2d2)となる。複合光学素子12が被測定場9の
電界に影響を与えないようにするためには、上記
CpとCとを等しくすればよいので、εs(εtd1+
2εnd2)=εn・εt(d1+2d2)の関係式を成立させね
ばならない。したがつて、誘電体11の厚さd2は
d2=εt(εs−εn)d1/2εn(εt−εs)であればよ
い
ことになる。 On the other hand, the capacitance C of the field to be measured 9 having the same volume as this composite optical element 12 is C=εsS/(d 1 +
2d 2 ). In order to prevent the composite optical element 12 from affecting the electric field of the field to be measured 9, the above-mentioned
Since it is sufficient to make Cp and C equal, εs(εtd 1 +
2εnd 2 )=εn·εt(d 1 +2d 2 ) must be established. Therefore, the thickness d 2 of the dielectric 11 is
It is sufficient if d 2 =εt(εs−εn)d 1 /2εn(εt−εs).
上記d2の値は上記CpとCとを等しくする値で
あるが、Cpの値がCの値にわずかでも近付けば
電界の歪みが改善されるものである。 The value of d 2 is a value that makes Cp and C equal to each other, but if the value of Cp approaches the value of C even slightly, the distortion of the electric field is improved.
なお、以上の実施例では、ポツケルス素子と誘
電体とを積層した複合光学素子を示したが、第4
図に示されるこの発明の別の他の実施例のように
誘電体11の中にポツケルス素子10を埋設すれ
ば、積層した場合の側端部の電界の歪みを防ぐこ
とができるので、より正確な電界の測定が可能と
なる。 In addition, in the above embodiment, a composite optical element in which a Pockels element and a dielectric were laminated was shown, but the fourth embodiment
By embedding the Pockels element 10 in the dielectric 11 as in another embodiment of the present invention shown in the figure, it is possible to prevent distortion of the electric field at the side edges when stacked, making it more accurate. This makes it possible to measure electric fields.
また、第5図に示される別の他の実施例のよう
に、光学素子10と誘電体11とが別体で、間に
媒体が満たされている場合でも、光学素子10に
よる電界の歪みを減少できる。 Furthermore, even if the optical element 10 and the dielectric 11 are separate bodies and a medium is filled in between them, as in another embodiment shown in FIG. Can be reduced.
以上述べたようにこの発明によれば、交流電界
測定装置において、光学素子との組み合せの誘電
率を被測定場内の媒体の誘電率に近付ける誘電体
を上記被測定場内に設けているので、光学素子に
よる上記被測定場内の電界の歪みを減少させてよ
り正確な交流電界の測定ができる効果がある。 As described above, according to the present invention, in the alternating current electric field measuring device, a dielectric material is provided in the field to be measured that brings the dielectric constant of the combination with the optical element close to the permittivity of the medium in the field to be measured. This has the effect of reducing the distortion of the electric field in the field to be measured due to the element, thereby enabling more accurate measurement of the alternating current electric field.
第1図は、電界測定の従来例を示す略斜視図、
第2図はこの発明の一実施例を示す原理図、第3
図は、第2図に用いる光学素子の斜視図、第4図
は、この発明の他の実施例に用いる光学素子の斜
視図、第5図はこの発明の別の他の実施例を示す
斜視図である。
図において、9は被測定場、10は光学素子、
11は誘電体を示す。なお、図中、同一符号は同
一、または相当部分を示す。
FIG. 1 is a schematic perspective view showing a conventional example of electric field measurement;
Fig. 2 is a principle diagram showing one embodiment of this invention;
The figures are a perspective view of an optical element used in FIG. 2, FIG. 4 is a perspective view of an optical element used in another embodiment of the invention, and FIG. 5 is a perspective view showing another embodiment of the invention. It is a diagram. In the figure, 9 is a field to be measured, 10 is an optical element,
11 indicates a dielectric material. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.
Claims (1)
電気光学効果を有した光学素子によつて電界を測
定する交流電界測定装置において、上記光学素子
との組み合せの誘電率を上記媒体の誘電率に近付
ける誘電体を、上記被測定場内に設けたことを特
徴とする交流電界測定装置。 2 誘電体は光学素子を電界に直角な方向の両側
から挾むように一体的に設けられていることを特
徴とする特許請求の範囲第1項記載の交流電界測
定装置。 3 光学素子は誘電体内部に埋設されていること
を特徴とする特許請求の範囲第1項記載の交流電
界測定装置。[Scope of Claims] 1. In an alternating current electric field measuring device that measures an electric field by an optical element having an electro-optic effect provided in a field medium to be measured (including a vacuum), the dielectric constant of the combination with the optical element is An alternating current electric field measuring device, characterized in that a dielectric material that brings the dielectric constant close to that of the medium is provided in the field to be measured. 2. The alternating current electric field measuring device according to claim 1, wherein the dielectric body is integrally provided so as to sandwich the optical element from both sides in a direction perpendicular to the electric field. 3. The alternating current electric field measuring device according to claim 1, wherein the optical element is embedded within the dielectric material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56211971A JPS58113764A (en) | 1981-12-26 | 1981-12-26 | Alternating current electric field measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56211971A JPS58113764A (en) | 1981-12-26 | 1981-12-26 | Alternating current electric field measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58113764A JPS58113764A (en) | 1983-07-06 |
| JPH021268B2 true JPH021268B2 (en) | 1990-01-10 |
Family
ID=16614738
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56211971A Granted JPS58113764A (en) | 1981-12-26 | 1981-12-26 | Alternating current electric field measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58113764A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2656428B1 (en) * | 1989-12-26 | 1992-03-27 | Commissariat Energie Atomique | ELECTRIC FIELD SENSOR WITH POCKELS EFFECT. |
| FR2661003B2 (en) * | 1989-12-26 | 1992-06-12 | Commissariat Energie Atomique | ELECTRIC FIELD SENSOR WITH POCKELS EFFECT. |
-
1981
- 1981-12-26 JP JP56211971A patent/JPS58113764A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58113764A (en) | 1983-07-06 |
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