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JPH0213964B2 - - Google Patents
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JPH0213964B2 - - Google Patents

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Publication number
JPH0213964B2
JPH0213964B2 JP58221605A JP22160583A JPH0213964B2 JP H0213964 B2 JPH0213964 B2 JP H0213964B2 JP 58221605 A JP58221605 A JP 58221605A JP 22160583 A JP22160583 A JP 22160583A JP H0213964 B2 JPH0213964 B2 JP H0213964B2
Authority
JP
Japan
Prior art keywords
potential
terminal
power supply
contact
type transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58221605A
Other languages
Japanese (ja)
Other versions
JPS60114023A (en
Inventor
Fumiaki Tsukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP58221605A priority Critical patent/JPS60114023A/en
Publication of JPS60114023A publication Critical patent/JPS60114023A/en
Publication of JPH0213964B2 publication Critical patent/JPH0213964B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356Bistable circuits
    • H03K3/356008Bistable circuits ensuring a predetermined initial state when the supply voltage has been applied; storing the actual state when the supply voltage fails

Description

【発明の詳細な説明】 本発明は相補形絶縁ゲート電界効果トランジス
タを用いた集積回路に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to integrated circuits using complementary insulated gate field effect transistors.

マイクロコンピユータや電卓等の機能を持つ
LSI内に電源を投入した時に自動的にLSI内部を
一定の初期状態に設定する機能が設けられてい
る。
Has functions such as a microcomputer and a calculator
A function is provided to automatically set the inside of the LSI to a certain initial state when power is turned on.

しかし、一方使用電圧の広領域化や使用中の電
源ダウン等に対応できることも要求されており、
今使用されている初期設定機能では不十分となつ
てきている。
However, on the other hand, it is also required to be able to use a wider range of voltages and to be able to cope with power failures during use.
The default settings currently in use are becoming insufficient.

第1図に従来の集積回路構成の一例を示す。 FIG. 1 shows an example of a conventional integrated circuit configuration.

第2図は各端子の出力波形を示す。なお、以下
の動作説明は端子VDDに電源としてプラス電源を
用いた場合について説明するものであり、マイナ
ス電源でも適用可能な事は明らかである。
FIG. 2 shows the output waveforms of each terminal. Note that the following explanation of the operation is for the case where a positive power source is used as the power source for the terminal V DD , but it is clear that the operation can also be applied to a negative power source.

電源端子VDDに電源が投入されない状態では電
源端子VDD,VSS及び接点1,2,3の電位V1
V2,V3は常にVSS(例えば接地)のレベルにある
とする。この状態より電源端子VDDに任意の電位
VCなる電源電圧が印加されるとLSI内で電源端子
VDDの電位は、電源の内部抵抗と端子VDDの寄生
容量の時定数で任意の電位VCに向かつて立ち上
がる。第2図のTAで示される電源端子VDDが任意
の電位VCに立ち上がつていく過度状態時に各接
点の電位レベルは電源端子VDDの電位がP形トラ
ンジスタM1,M4,M6及びN形トランジスM
2,M3,M5,M7のしきい値電圧VAに上が
るまで電源端子VDDと電源端子VSS側に対してつ
いている負荷容量の分割比で決まる。従つて、接
点1には電源端子VDD側に対し、寄生容量を充分
無視できる大容量C1を又接点2には電源端子VSS
側に対し寄生容量を充分無視できる大容量C2
接続しておけば接点1は上記しきい値電圧VA
近傍に又接点2は電圧VSSの近傍になつている。
When power is not applied to the power supply terminal V DD , the potentials of the power supply terminals V DD , V SS and contacts 1, 2, and 3 are V 1 ,
It is assumed that V 2 and V 3 are always at the level of V SS (eg, ground). From this state, any potential can be applied to the power supply terminal V DD .
When a power supply voltage of V C is applied, the power supply terminal inside the LSI
The potential of V DD rises toward an arbitrary potential V C with the time constant of the internal resistance of the power supply and the parasitic capacitance of the terminal V DD . In a transient state where the power supply terminal V DD rises to an arbitrary potential V C as shown by T A in FIG. N type transistor M
2, M3, M5, M7 threshold voltage V A is determined by the division ratio of the load capacitance attached to the power supply terminal V DD and power supply terminal V SS side. Therefore, contact 1 is connected to the power supply terminal V DD with a large capacitance C 1 that can sufficiently ignore parasitic capacitance, and contact 2 is connected to the power supply terminal V SS
If a large capacitor C 2 is connected to the side so that the parasitic capacitance can be sufficiently ignored, the contact 1 will be in the vicinity of the threshold voltage V A and the contact 2 will be in the vicinity of the voltage V SS .

次に接点1と接点2はP形トランジスタM1と
N形トランジスタM3で構成されるインバータと
P形トランジスタM4とN形トランジスタM5に
よつて構成されるインバータでフリツプフロツプ
を構成している為、電源端子VDDが電位VAより高
い電位になると上記2つのインバータは完全に動
作可能となる。この時接点1の電位レベルV1
VA近傍に接点2の電位レベルV2は電位VSS近傍に
あるので、接点1の電位V1は電源端子VDDの電位
に接点2は電源端子VSSの電位で安定しその結果
集積回路内部の状態記憶回路の初期セツト出力を
発生する接点3は電源端子VDD側の電位に変化し
安定する。これは、電源端子VSSに印加される電
圧が早く立ち上がつてもゆつくり立ち上がつても
必ず接点1の電位V1は端子VDD側に、接点2の電
位V2はVSS側に、接点3の電位V3はVDD側に安定
する。これによりLSIの電源立ち上がり時に内部
回路を必ずある一定の初期状態とすることがで
き、又、接点3の電位V3がVSSレベルにならない
かぎり、この状態を解除できない。続いて接点3
の電位V3が端子VDDの電位VCに安定したことによ
り第2図TBの期間入力信号I1にクロツク信号が発
生する。つまりVSSレベルよりVCレベルに変化す
る。この信号I1は回路内部の発振回路のクロツク
でも、あるいは回路外部からの入力信号でもよ
い。この信号により、N形トランジスタM2がオ
ン状態になり接点1の電位V1は強制的に端子VSS
のレベルにする。(ただしこの時N形トランジス
タM2のオン抵抗をP形トランジスタM1のオン
抵抗にくらべ充分小さくなるよう設計しておく必
要がある。) これにより接点2の電位V2は、今までP形ト
ランジスタM4がオフ、N形トランジスタM5が
オン状態であつたものが逆にP形トランジスタM
4がオン、N形トランジスタM5がオフ状態にな
りV1レベルよりVCレベルに変化する。
Next, contacts 1 and 2 are power supply terminals because they constitute a flip-flop with an inverter made up of a P-type transistor M1 and an N-type transistor M3, and an inverter made up of a P-type transistor M4 and an N-type transistor M5. When V DD becomes higher than the potential V A , the two inverters become fully operational. At this time, the potential level V 1 of contact 1 is
Since the potential level V2 of contact 2 is near V A and near the potential V SS , the potential V 1 of contact 1 is stabilized at the potential of power supply terminal V DD and contact 2 is stabilized at the potential of power supply terminal V SS , and as a result, the integrated circuit Contact 3, which generates the initial set output of the internal state memory circuit, changes to the potential on the power supply terminal VDD side and becomes stable. This means that whether the voltage applied to the power supply terminal V SS rises quickly or slowly, the potential V 1 of contact 1 is always on the terminal V DD side, and the potential V 2 of contact 2 is always on the V SS side. At this time, the potential V 3 of the contact 3 becomes stable on the V DD side. This ensures that the internal circuit is in a certain initial state when the LSI power is turned on, and this state cannot be released unless the potential V 3 of the contact 3 reaches the V SS level. Next, contact 3
As the potential V 3 of the terminal V 3 becomes stable to the potential V C of the terminal V DD , a clock signal is generated in the input signal I 1 during the period T B of FIG. In other words, the voltage changes from the V SS level to the V C level. This signal I1 may be a clock of an oscillation circuit inside the circuit or an input signal from outside the circuit. This signal turns on the N-type transistor M2, and the potential V 1 of contact 1 is forced to the terminal V SS
level. (However, at this time, it is necessary to design the on-resistance of the N-type transistor M2 to be sufficiently smaller than the on-resistance of the P-type transistor M1.) As a result, the potential V 2 of the contact point 2 is lower than that of the P-type transistor M4. is off, and the N-type transistor M5 was on, whereas the P-type transistor M5 was on.
4 is turned on, N-type transistor M5 is turned off, and the level changes from the V 1 level to the V C level.

さらに接点2の電位V2がVCレベルになつた為
今までP形トランジスタM1がオン、N形トラン
ジスタM3がオフになつていたのが、P形トラン
ジスタM1がオフ、N形トランジスタM3がオン
になる。
Furthermore, since the potential V 2 of contact 2 has reached the V C level, the P-type transistor M1 was turned on and the N-type transistor M3 was turned off, but now the P-type transistor M1 is turned off and the N-type transistor M3 is turned off. is turned on.

上記動作により、入力信号I1がある一定時間後
再びVCレベルよりVSSレベルに変化しても、接点
1の電位はVSSレベル、接点2の電位V2はVCレベ
ルで安定し、接点3の電位V3もVCレベルからVSS
レベルに変化し安定する。こうしてLSI内部の論
理回路に接点の電位V3が電位VCとなつていた初
期状態が解除されLSIは初期状態から、外部から
の命令を受け実行できるようになる。
Due to the above operation, even if the input signal I 1 changes from the V C level to the V SS level again after a certain period of time, the potential at contact 1 remains stable at the V SS level, and the potential V 2 at contact 2 remains at the V C level. The potential V 3 of contact 3 also changes from V C level to V SS
The level changes and stabilizes. In this way, the initial state in which the potential V 3 of the contact in the logic circuit inside the LSI is at the potential VC is released, and the LSI becomes able to receive and execute instructions from the outside from the initial state.

現在、上記動作以外にLSIが動作中に電源端子
VDDの電位がある電位VBまで低下し、再びVCにも
どつた場合、LSIの誤動作を押さえる為、再び初
期状態が要求されており、特にVB>VAとする要
求が強い。VB>VAの場合、従来回路では第2図
の期間TCの如くVSSVSSの電位がVCよりVBに変化
し、さらにVBよりVCになつた時単に接点2の電
位V2がVCよりVBにさらにVBよりVCに変化するだ
けでLSI内部が初期状態にならない欠点がある。
これは電位VB>電位VAの為、現回路は正常に動
作しており、単に電源端子VSSが正常動作可能電
圧内で変化したにすぎないからである。
Currently, in addition to the above operations, the power supply terminal is
When the potential of V DD drops to a certain potential V B and returns to V C again, an initial state is required to prevent the LSI from malfunctioning, and there is a particularly strong requirement that V B > V A. In the case of V B > V A , in the conventional circuit, the potential of V SS V SS changes from V C to V B as shown in period T C in Fig. 2, and when it changes from V B to V C , the potential of contact 2 is simply changed. There is a drawback that the inside of the LSI does not return to its initial state simply by changing the potential V 2 from V C to V B and from V B to V C.
This is because the current circuit is operating normally because the potential V B >the potential V A , and the power supply terminal V SS has simply changed within the voltage that allows normal operation.

本発明の目的は上記欠点を除去した集積回路を
提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an integrated circuit which eliminates the above-mentioned drawbacks.

本発明による集積回路は、電源電圧が印加され
る第1および第2の端子と、これら端子間への電
源電圧が立ち上がり第1の電圧レベルを越えたと
きに第1の安定状態となるフリツプフロツプと、
このフリツプフロツプの状態制御端子と前記第1
の端子との間に接続された第1のトランジスタと
を有し、前記フリツプフロツプが前記第1の安定
状態となつた後に前記第1のトランジスタを導通
させることにより前記フリツプフロツプを前記第
1の安定状態から第2の安定状態に変化させ、さ
らに、前記フリツプフロツプの状態制御端子と前
記第2の端子との間に第2のトランジスタを設
け、前記電源電圧がその規定の電圧レベルと前記
第1の電圧レベルとの間に設定された第2の電圧
レベルまで低下したときに前記第2のトランジス
タを導通させて前記フリツプフロツプを前記第2
の安定状態から前記第1の安定状態に変化させる
ことを特徴とする。
An integrated circuit according to the present invention includes first and second terminals to which a power supply voltage is applied, and a flip-flop that enters a first stable state when the power supply voltage between these terminals rises and exceeds a first voltage level. ,
The state control terminal of this flip-flop and the first
a first transistor connected between a terminal of the flip-flop and a terminal of the flip-flop, and bringing the flip-flop into the first stable state by making the first transistor conductive after the flip-flop reaches the first stable state. further, a second transistor is provided between the state control terminal of the flip-flop and the second terminal, and the power supply voltage is set to a predetermined voltage level and the first voltage. When the voltage drops to a second voltage level set between the flip-flop and the
The stable state is changed from the stable state to the first stable state.

本発明の一実施例を図面と共に詳細に説明す
る。
An embodiment of the present invention will be described in detail with reference to the drawings.

第3図に実施例の回路構成を、第4図にその各
端子の出力波形を示す。
FIG. 3 shows the circuit configuration of the embodiment, and FIG. 4 shows the output waveforms of each terminal.

第3図において電源電圧シフト回路Aは入力は
電源端子VDD及びVSSで出力信号I2は電源端子
VDDがVDなる電位以下では端子VSSのレベルにVD
なる電位以上では端子VDDのレベルになる回路を
構成している。(このときVD≧VBである。)さら
に接点1′にP形トランジスタM1と並列に出力
信号I2にゲートを接続したP形トランジスタM
8及びN形トランジスタM3と並列に入力端子I
1′にゲートを接続したN形トランジスタM2を
接続する。すなわち本実施例は第1図の回路にト
ランジスタM8と電圧シフト回路Aを付加して構
成される。セツト出力は接点3′から得られる。
In Fig. 3, the input of the power supply voltage shift circuit A is the power supply terminals V DD and V SS , and the output signal I2 is the power supply terminal.
When V DD is below the potential of V D , V D
The circuit forms a circuit that reaches the level of terminal V DD at a potential higher than . (At this time, V D ≧ V B. ) Furthermore, a P-type transistor M whose gate is connected to the output signal I2 in parallel with the P-type transistor M1 at the contact 1'.
8 and input terminal I in parallel with N-type transistor M3.
An N-type transistor M2 whose gate is connected to 1' is connected. That is, this embodiment is constructed by adding a transistor M8 and a voltage shift circuit A to the circuit shown in FIG. The set output is obtained from contact 3'.

この構成により、第4図の期間TA′の如く電源
端子VDDに電位VCなる電源を印加した時及び第4
図の期間TB′の如く入力端子I1′にクロツク信号を
入力した時は、第1図の従来回路とまつたく同様
の動作が行なわれる。
With this configuration, when a power supply having a potential V C is applied to the power supply terminal V DD as in the period T A ' in FIG.
When a clock signal is input to the input terminal I 1 ' during period T B ' in the figure, the operation is exactly the same as that of the conventional circuit shown in FIG. 1.

次に、第4図の期間TC′では初めに電源端子
VDDは電位VCになつている。又出力信号I2、節
点2′の電位V2′も電位VCに接点1′,3′の電位
は端子VSS電位になつている。そして、電源端子
VDDが電位VCより電位VDまで低下すると出力信号
I2、節点2の電位V2′も同様に電位VDになる。
さらに電源端子VDDが電位VD以下になると信号I
2は端子VSSの電位まで変化し安定する。つまり
電源端子VDDが電位VDより電位VBに変化すると回
路Aの出力信号I2が端子VSSの電位に変化する
為それまでオフ状態であつたP形トランジスタM
8がオン状態になる。この時接点2′の電位V2′は
以前電源端子VDDと同電位にあるので、N形トラ
ンジスタM3がオン状態であるがP形トランジス
タM8のオン抵抗をN形トランジスタM3のオン
抵抗をり充分小さくなるよう設計する事により接
点1′の電位V1′は強制的に電位VSSより電位VB
傍に変化する。さらに接点1′が端子VSSの電位よ
り電位VB近傍に変化する事により接点1′にゲー
トにつながれているP形トランジスタM4はオン
状態からオフ状態に又N形トランジスタM5はオ
フ状態からオン状態になり接点2′の電位V2′は電
位VBより端子VSSの電位になる。これにより、N
形トランジスタM3がオン状態よりオフ状態に、
P形トランジスタM1がオフ状態からオン状態に
なり、接点1′の電位V1′は電位VB近傍より電位
VBになる。さらに接点3′は接点2′が電位VB
り端子VSSの電位に変化した為端子VSSの電位より
電位VBに変化する。
Next, in period T C ′ in Fig. 4, the power supply terminal
V DD is at potential V C. Further, the potential V 2 ' of the output signal I2 and the node 2 ' is also the potential V C , and the potential of the contacts 1' and 3' is the terminal V SS potential. And the power terminal
When V DD drops from the potential V C to the potential V D , the output signal I2 and the potential V 2 ' at the node 2 similarly become the potential V D.
Furthermore, when the power supply terminal V DD becomes lower than the potential V D , the signal I
2 changes to the potential of terminal V SS and becomes stable. In other words, when the power supply terminal V DD changes from the potential V D to the potential V B , the output signal I2 of the circuit A changes to the potential of the terminal V SS , so that the P-type transistor M, which was in the off state until then, changes to the potential V B.
8 is turned on. At this time, the potential V 2 ' of the contact 2' was previously at the same potential as the power supply terminal V DD , so the N-type transistor M3 is in the on state, but the on-resistance of the P-type transistor M8 is set to be the on-resistance of the N-type transistor M3. By designing the contact point 1' to be sufficiently small, the potential V 1 ' of the contact 1' is forcibly changed from the potential V SS to the vicinity of the potential V B. Further, as the potential of the contact 1' changes from the potential of the terminal V SS to the vicinity of the potential V B , the P-type transistor M4 whose gate is connected to the contact 1' changes from the on state to the off state, and the N-type transistor M5 changes from the off state to the on state. In this state, the potential V 2 ' of the contact 2' becomes the potential of the terminal V SS rather than the potential V B. This results in N
type transistor M3 changes from the on state to the off state,
The P-type transistor M1 changes from the off state to the on state, and the potential V 1 ' at contact 1' becomes lower than the potential near the potential V B.
Becomes V B. Furthermore, since the potential of the contact 2' has changed from the potential V B to the potential of the terminal V SS , the potential of the contact 3' changes from the potential of the terminal V SS to the potential V B.

次に電源端子VDDが電位VBより電位VCに戻つた
場合、電源端子VDDが電位VD以上になると信号I
2が端子VSSの電位より電源端子VDDと同電位に
変化しP形トランジスタM8がオン状態よりオフ
状態になる。そして接点2′の電位V2′はN形ト
ランジスタM5により端子VSSの電位を接点1は
P形トランジスタM1より電源端子VDDの電位を
供給されるので接点1′,3′の電位V1′,V3′は電
位VCに、接点2′の電位V2′は端子VSSの電位に
なる。これは第4図の期間TA′の電源投入時と同
一状態でありLSI内部論理回路を一定の初期状態
にできる。
Next, when the power supply terminal V DD returns from the potential V B to the potential V C , when the power supply terminal V DD becomes higher than the potential V D , the signal I
2 changes from the potential of the terminal VSS to the same potential as the power supply terminal VDD , and the P-type transistor M8 changes from the on state to the off state. The potential V2' of the contact 2' is supplied with the potential of the terminal VSS by the N-type transistor M5, and the potential of the power supply terminal VDD is supplied to the contact 1 with the potential of the power supply terminal VDD from the P-type transistor M1, so the potential of the contacts 1' and 3' is V1 '. , V 3 ' become the potential V C , and the potential V2' of the contact 2' becomes the potential of the terminal V SS . This is the same state as when the power is turned on during period T A ' in FIG. 4, and the LSI internal logic circuit can be brought to a certain initial state.

つまり本発明の第3図の回路は電源端子VDD
電位が電位VD以下(LSI使用時に)低下した場
合、LSI内部論理回路初期状態に復帰させること
ができる。
In other words, the circuit shown in FIG. 3 of the present invention can return the LSI internal logic circuit to its initial state when the potential of the power supply terminal V DD drops below the potential V D (when the LSI is used).

第3図の電圧シフト回路Aの具体的構成例を第
5図を参照して説明する。
A specific example of the configuration of the voltage shift circuit A shown in FIG. 3 will be explained with reference to FIG. 5.

端子VDDと電圧出力端子NV0との間にドレイン
とゲートを接続した、すなわちダイオード接続し
たi個のN形トランジスタMN1,MN2…MNiを
直列接続する。このi個の直列接続されたトラン
ジスタの総計の閾値は上述の電位VDとなるよう
になされている。また節点NV0と端子VSSの間に
はゲートとドレインが各々接続されたj個のP形
トランジスタMP1,MP2…MPjが直列に接続さ
れている。このj個のトランジスタのしきい値の
総計は上記電位VDとなるようになされている。
この直列回路は端子VDDが電位VD以上になると節
点NV0の電位が端子VDD方向に変化し、バツフア
としての2段のインバータINV1,INV2を介して
端子VDDレベルの出力I2として取り出される。こ
のときP形トランジスタMP1〜MPjはオフして
いる。他方端子VDDの電位がVDより小さいときは
P形トランジスタMP1〜MPjがオンし、節点NV0
は端子VSSの電位へと変化する。よつて出力I2
VSSのレベルとなる。
i N-type transistors MN1 , MN2 , . The total threshold value of the i transistors connected in series is set to the above-mentioned potential V D. Further, j P-type transistors MP 1 , MP 2 , . . . MPj, each having a gate and a drain connected to each other, are connected in series between the node NV 0 and the terminal V SS . The total threshold value of these j transistors is set to be the above-mentioned potential V D.
In this series circuit, when the terminal V DD becomes higher than the potential V D , the potential of the node NV 0 changes in the direction of the terminal V DD , and the output I at the terminal V DD level is output via the two-stage inverters INV 1 and INV 2 as a buffer. It is retrieved as 2 . At this time, P-type transistors MP 1 to MPj are off. When the potential of the other terminal V DD is lower than V D , the P-type transistors MP 1 to MPj are turned on, and the node N V0
changes to the potential of terminal V SS . Therefore, the output I 2 is
V SS level.

電圧シフト回路Aの他の例を第6図に示す。こ
の例では第5図のP形トランジスタMP1〜MPj
を抵抗Rにおき代えたものであり、基本的な動作
は第5図の例と同様である。
Another example of the voltage shift circuit A is shown in FIG. In this example, the P-type transistors MP 1 to MPj shown in FIG.
is replaced with a resistor R, and the basic operation is the same as the example shown in FIG.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来回路の一例を示す回路図、第2図
はその動作波形を示す図、第3図は本発明の一実
施例を示す図、第4図はその動作波形を示す図、
第5図および第6図は電圧シフト回路の具体例を
示す回路図である。 M1,M4,M6……P型トランジスタ、M
2,M3,M5,M7……N型トランジスタ、C
1,C2……容量。
FIG. 1 is a circuit diagram showing an example of a conventional circuit, FIG. 2 is a diagram showing its operating waveforms, FIG. 3 is a diagram showing an embodiment of the present invention, and FIG. 4 is a diagram showing its operating waveforms.
FIGS. 5 and 6 are circuit diagrams showing specific examples of voltage shift circuits. M1, M4, M6...P-type transistor, M
2, M3, M5, M7...N-type transistor, C
1, C2...Capacity.

【特許請求の範囲】[Claims]

1 第1および第2の相補型インバータと、前記
第1の相補型インバータの出力と前記第2の相補
型インバータの入力との間に接続された一導電型
の第1電界効果トランジスタと、前記第2の相補
型インバータの入力と電源端子との間に接続され
た反対等電型の第2電界効果トランジスタと、出
力端子と、前記第2の相補型インバータの出力と
前記出力端子との間に接続された前記一導電型の
第3電界効果トランジスタと、前記出力端子と基
準端子との間に接続されゲートが前記第2の相補
型インバータの入力に接続された前記反対導電型
の第4電界効果トランジスタと、前記第1の相補
型インバータの入力および前記第2電界効果トラ
ンジスタのゲートに接続されたリセツト端子と、
前記第1および第3電界効果トランジスタのゲー
トに接続されたセツト端子とを備えることを特徴
とするダイナミツク型フリツプフロツプ。
1 first and second complementary inverters; a first field effect transistor of one conductivity type connected between the output of the first complementary inverter and the input of the second complementary inverter; a second field effect transistor of opposite isoelectric type connected between the input of the second complementary inverter and the power supply terminal, the output terminal, and the output terminal of the second complementary inverter and the output terminal; the fourth field effect transistor of the opposite conductivity type, the fourth field effect transistor being connected between the output terminal and the reference terminal and having a gate connected to the input of the second complementary inverter; a field effect transistor; a reset terminal connected to the input of the first complementary inverter and the gate of the second field effect transistor;
and a set terminal connected to the gates of the first and third field effect transistors.

JP58221605A 1983-11-25 1983-11-25 Integrated circuit Granted JPS60114023A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58221605A JPS60114023A (en) 1983-11-25 1983-11-25 Integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58221605A JPS60114023A (en) 1983-11-25 1983-11-25 Integrated circuit

Publications (2)

Publication Number Publication Date
JPS60114023A JPS60114023A (en) 1985-06-20
JPH0213964B2 true JPH0213964B2 (en) 1990-04-05

Family

ID=16769374

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58221605A Granted JPS60114023A (en) 1983-11-25 1983-11-25 Integrated circuit

Country Status (1)

Country Link
JP (1) JPS60114023A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0517468U (en) * 1991-08-02 1993-03-05 サンデン株式会社 Cool storage device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62203520U (en) * 1986-06-17 1987-12-25

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0517468U (en) * 1991-08-02 1993-03-05 サンデン株式会社 Cool storage device

Also Published As

Publication number Publication date
JPS60114023A (en) 1985-06-20

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