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JPH0221725B2 - - Google Patents
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JPH0221725B2 - - Google Patents

Info

Publication number
JPH0221725B2
JPH0221725B2 JP58233181A JP23318183A JPH0221725B2 JP H0221725 B2 JPH0221725 B2 JP H0221725B2 JP 58233181 A JP58233181 A JP 58233181A JP 23318183 A JP23318183 A JP 23318183A JP H0221725 B2 JPH0221725 B2 JP H0221725B2
Authority
JP
Japan
Prior art keywords
tile
slider
rails
sensor
height
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58233181A
Other languages
Japanese (ja)
Other versions
JPS60125514A (en
Inventor
Kazuaki Okado
Tomohiro Nito
Hiroshi Sakurai
Yasunori Tange
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Systems Co Ltd filed Critical Fuji Electric Systems Co Ltd
Priority to JP23318183A priority Critical patent/JPS60125514A/en
Publication of JPS60125514A publication Critical patent/JPS60125514A/en
Publication of JPH0221725B2 publication Critical patent/JPH0221725B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/207Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は瓦の形状を正確に測定することができ
る瓦形状測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a tile shape measuring device that can accurately measure the shape of tiles.

(従来技術) 従来、瓦の形状測定はノギスやダイアルゲージ
等を用いて手作業により行なわれていたが、瓦の
複雑な曲面形状を正確に測定することは困難であ
り、しかも、測定に長時間を要するものであつ
た。
(Prior art) Traditionally, the shape of roof tiles has been measured manually using calipers, dial gauges, etc., but it is difficult to accurately measure the complex curved shapes of roof tiles, and it takes a long time to measure. It was time consuming.

(発明の目的) 本発明は、測定される瓦をセツトする基準台の
両側に平行に設置されたレール上に該レールと直
交するスライダを摺動自在に取付け、該スライダ
には瓦の中央部及び端部の上面高さを連続的に検
出するセンサーと、瓦の端部に位置して下側から
瓦の重なり面高さを連続的に検出するセンサーと
を設けたことを特徴とする第1の発明と、測定さ
れる瓦をセツトする基準台の両側に平行に設置さ
れたレール上に該レールと直交するスライダを摺
動自在に取付け、該スライダには瓦の中央部及び
端部の上面高さを連続的に検出するセンサーと、
瓦の端部に位置して下側から瓦の重なり面高さを
連続的に検出するセンサーとを設け、さらに該レ
ール上にはY座標検出機構付きの瓦外形状測定具
を搭載したX座標検出機構付きの第2スライダを
前記スライダと平行に取付けたことを特徴とする
第2の発明とよりなるものである。
(Object of the Invention) The present invention has a slider that is slidably attached to the rails that are perpendicular to the rails on the rails that are installed in parallel on both sides of the reference stand on which the tile to be measured is set, and that the slider is attached to the central part of the tile. and a sensor that continuously detects the height of the top surface of the edge, and a sensor that is located at the edge of the tile and continuously detects the height of the overlapped surface of the tile from below. According to the invention of No. 1, a slider is slidably mounted perpendicular to the rails on rails installed parallel to both sides of a reference stand on which the tile to be measured is set, and the slider is provided with sliders that are attached to the center and end portions of the tile. A sensor that continuously detects the top height,
A sensor is installed at the end of the tile and continuously detects the height of the overlapping surface of the tile from below, and an X-coordinate sensor is mounted on the rail to measure the outside shape of the tile with a Y-coordinate detection mechanism. This invention is characterized in that a second slider with a detection mechanism is attached parallel to the slider.

(実施例) 以下に本発明を図示の実施例について詳細に説
明する。
(Embodiments) The present invention will be described in detail below with reference to illustrated embodiments.

1は測定される瓦50をセツトする定盤のよう
な平滑面を有する基準台、2,2′は基準台1の
両側に平行に設けられた一対のレール、3は車輪
4をもつてレール2,2′上に摺動自在に取付け
られたレール2,2′と直交するスライダである。
スライダ3には瓦の中央部及び端部の上面高さを
連続的に検出するセンサー5,5と、瓦の端部に
位置して下側から瓦の重なり面高さを連続的に検
出するセンサー6とが保持具7,8により位置調
節自在に設けられている。各センサー5,6は内
蔵スプリングにより下方に突出する検出ロツド
9,10を有し、その先端には瓦50の上面及び
下面にそれぞれ接触する検出ローラー11,12
が設けられている。センサー5のうちの1個及び
センサー6は第3図に示されるように瓦の端部に
位置し、瓦の重なり面高さを検出する。センサー
6の検出ローラー12が瓦50の重なり面51に
接し、上面高さ検出用のセンサー5の検出ローラ
ー11が瓦50の端部上面52に接するよう双方
のセンサー5,6の検出ロツド9,10間にスプ
リング13が張設されている。14はスライダ3
の一側方にレール2と平行に取付けられたラツク
であり、15はラツク14と噛合するピニオンを
備えたラツク送り用のモーターであつて、このモ
ーター15を回転させればスライダ3はレール
2,2′上を摺動することとなる。また、レール
2,2′上にはスライダ3と平行に第2スライダ
16が車輪17をもつて摺動自在に取付けられて
いる。この第2スライダ16の位置はレール2′
の下部側方に取付けられたX座標検出機構18に
より電気的に読み取ることができる。さらに、第
2スライダ16上には瓦外形状測定具19が摺動
自在に塔載されており、その第2スライダ16上
の位置は第2スライダ16に内蔵されたY座標検
出機構20により電気的に読み取ることができ
る。瓦外形状測定具19は瓦50の外周面と接す
る測定棒21を上下動可能に支持している。な
お、22,23はスライダ3と第2スライダ16
に突設された係合部材であり、測定棒21を持ち
上げたうえ第2スライダ16を係合部材22,2
3が接触するまでスライダ3の方向に接近させれ
ば、スライダ3と第2スライダ16とを一体とし
てレール2,2′上を摺動させることができる。
以上に述べたセンサー5、センサー6、X座標検
出機構18、Y座標検出機構20は第4図に示す
ようにそれぞれデイジタル式の表示装置24に接
続されてその測定値を読み取ることができるほ
か、各測定値をマイクロコンピユータを利用した
演算処理部25へ入力し、プリンタ26あるいは
CRT27に出力させて測定システムを構成する
こともできる。
Reference numeral 1 denotes a reference base having a smooth surface such as a surface plate on which the tile 50 to be measured is set, 2 and 2' a pair of rails provided in parallel on both sides of the reference base 1, and 3 a rail with wheels 4. This is a slider that is orthogonal to the rails 2, 2' that are slidably mounted on the rails 2, 2'.
The slider 3 has sensors 5, 5 that continuously detect the top surface height of the center and ends of the tile, and sensors 5, 5 that are located at the ends of the tile and continuously detect the height of the overlapping surface of the tiles from the bottom. A sensor 6 is provided whose position can be adjusted freely by holders 7 and 8. Each sensor 5, 6 has a detection rod 9, 10 that protrudes downward by a built-in spring, and at its tip there is a detection roller 11, 12 that contacts the upper and lower surfaces of the tile 50, respectively.
is provided. One of the sensors 5 and sensor 6 are located at the end of the tile as shown in FIG. 3 and detect the overlap height of the tile. The detection rods 9, A spring 13 is stretched between 10 and 10. 14 is slider 3
A rack is mounted on one side parallel to the rail 2, and 15 is a rack feeding motor equipped with a pinion that meshes with the rack 14. When this motor 15 is rotated, the slider 3 moves along the rail 2. , 2'. Further, a second slider 16 is slidably mounted on the rails 2, 2' in parallel with the slider 3 with wheels 17. The position of this second slider 16 is on rail 2'.
It can be electrically read by an X coordinate detection mechanism 18 attached to the lower side of the. Further, a tile outer shape measuring tool 19 is slidably mounted on the second slider 16, and its position on the second slider 16 is electrically determined by a Y coordinate detection mechanism 20 built into the second slider 16. can be read accurately. The tile outer shape measuring tool 19 supports a measuring rod 21 that is in contact with the outer peripheral surface of the tile 50 so as to be movable up and down. Note that 22 and 23 are the slider 3 and the second slider 16.
This is an engaging member protruding from the measuring rod 21, and then the second slider 16 is inserted into the engaging members 22, 2.
If the slider 3 and the second slider 16 are moved toward the slider 3 until they come into contact with each other, the slider 3 and the second slider 16 can be slid together on the rails 2 and 2'.
The sensor 5, the sensor 6, the X coordinate detection mechanism 18, and the Y coordinate detection mechanism 20 described above are each connected to a digital display device 24 as shown in FIG. 4, so that the measured values can be read. Each measured value is input to the arithmetic processing unit 25 using a microcomputer, and then input to the printer 26 or
It is also possible to configure a measurement system by outputting it to the CRT 27.

このように構成されたものにより瓦50の上面
及び重なり面51の形状を測定するには、瓦50
をその長さ方向が基準台1の両側に平行に設けら
れたレール2,2′と平行となるよう基準台1上
に枕60を介在させてセツトし、レール2,2′
と直交するスライダ3上に垂設された瓦50の上
面高さを連続的に検出するセンサー5,5と、瓦
の端部に位置して下側から瓦の重なり面高さを連
続的に検出するセンサー6とを、瓦50の中央部
上面、端部上面、重なり面51にそれぞれ接触さ
せた後に、レール2,2′上に摺動自在に取付け
られたスライダ3をモーター15により瓦50の
右端位置から左端位置まで一X向に一定速度で移
動させる。この移動中、各センサー5,6は移動
径路上の瓦50の上面及び重なり面51の高さを
連続的に測定するので、一定時間間隔であるいは
モーター15の回転と同期させて各センサー5,
6の測定値を演算処理部25へ読み込むことによ
り、瓦50の曲面形状を例えば1mm間隔で測定す
ることができる。このほか、レール2,2′上に
取付けられたX座標検出機構18付きの第2スラ
イダ16を前述の如く係合部材22,23をもつ
てスライダ3と一体化させ、スライダ3のX座標
を第2スライダ16のX座標検出機構18を利用
して読み取ることもできる。これらの測定値は測
定者が表示装置24から読み取ることができるほ
か、数値の形式でプリンタ26からプリントアウ
トさせることもでき、また、CRT27に適当な
グラフ表示をさせることもできる。従つて、従来
正確に測定することができなかつた瓦50の上面
及び重なり面51の形状を短時間に正確に測定す
ることができる。次に、瓦の外形状を測定するに
は、スライダ3をレール2,2′の右端まで移動
させた後にレール2,2′上に取付けられたX座
標検出機構18付きの第2スライダ16及びその
上に塔載されたY座標検出機構20付きの瓦外形
状測定具19を手動により移動させ、第1図に示
すA,B,C,D,E,F,Gの各端面に瓦外形
状測定具19の測定棒21を接触させ、これらの
各端面のX座標あるいはY座標を測定する。これ
らの測定値は前記と同様に演算処理部25に読み
込まれ、例えばAとEの測定値から瓦50の長さ
が、DとGの測定値から瓦50の幅が、BとGの
測定値から瓦50の働き幅が、EとFの測定値か
ら瓦50の機長さが、AとCの測定値から瓦50
の頭切込み長さが、CとFの測定値から瓦50の
働き長さがそれぞれ算出され、数値化してプリン
タ26あるいはCRT27に表示され、従つて、
本発明によれば従来正確に測定することができな
かつた瓦50の外形状をも短時間に正確に測定す
ることができる。なお、外形状の測定は瓦の上面
及び重なり面の形状測定に先立つて行なうことが
好ましく、本発明の装置は共通のレール2,2′
上にスライダ3と第2スライダ16とを取付けた
ものであるから、これら2種類の測定を連続的に
行なうにも便利である。
In order to measure the shape of the upper surface and overlapping surface 51 of the tile 50 with the above-described configuration, the tile 50
is set on the reference stand 1 with a pillow 60 interposed so that its length direction is parallel to the rails 2, 2' provided parallel to both sides of the reference stand 1, and the rails 2, 2'
Sensors 5, 5 continuously detect the top surface height of the tile 50 vertically installed on the slider 3 perpendicular to the slider 3, and sensors 5, 5 located at the end of the tile continuously detect the height of the overlapping surface of the tiles from the bottom side. After the sensors 6 to be detected are brought into contact with the top surface of the center, the top surface of the ends, and the overlapping surface 51 of the tile 50, the motor 15 moves the slider 3, which is slidably mounted on the rails 2 and 2', to the tile 50. from the right end position to the left end position in one X direction at a constant speed. During this movement, each sensor 5, 6 continuously measures the height of the top surface and overlapping surface 51 of the tile 50 on the moving path, so each sensor 5,
By reading the measured values of No. 6 into the arithmetic processing unit 25, the curved shape of the tile 50 can be measured at intervals of, for example, 1 mm. In addition, the second slider 16 with the X-coordinate detection mechanism 18 mounted on the rails 2, 2' is integrated with the slider 3 using the engaging members 22, 23 as described above, so that the X-coordinate of the slider 3 can be detected. It can also be read using the X coordinate detection mechanism 18 of the second slider 16. These measured values can be read by the measurer from the display device 24, and can also be printed out in numerical form from the printer 26, or can be displayed in an appropriate graph on the CRT 27. Therefore, the shape of the upper surface and overlapping surface 51 of the roof tile 50, which could not be measured accurately in the past, can be accurately measured in a short time. Next, to measure the outer shape of the tile, move the slider 3 to the right end of the rails 2, 2', and then move the second slider 16 with the X coordinate detection mechanism 18 mounted on the rails 2, 2'. The tile outer shape measuring tool 19 with the Y coordinate detection mechanism 20 mounted on the tile is manually moved to measure the tile outer shape on each end face of A, B, C, D, E, F, and G shown in FIG. The measuring rod 21 of the shape measuring tool 19 is brought into contact with the shape measuring tool 19 to measure the X coordinate or Y coordinate of each of these end faces. These measured values are read into the arithmetic processing unit 25 in the same way as above, and for example, the length of the tile 50 is determined from the measured values of A and E, the width of the tile 50 is determined from the measured values of D and G, and the width of the tile 50 is determined from the measured values of B and G. The working width of tile 50 is determined from the value, the machine length of tile 50 is determined from the measured values of E and F, and the working width of tile 50 is determined from the measured values of A and C.
The working length of the tile 50 is calculated from the measured values of C and F, and is digitized and displayed on the printer 26 or CRT 27, and therefore,
According to the present invention, the outer shape of the roof tile 50, which could not be measured accurately in the past, can be accurately measured in a short time. Note that it is preferable to measure the external shape prior to measuring the shape of the top surface and overlapping surface of the tiles.
Since the slider 3 and the second slider 16 are mounted on the top, it is convenient to perform these two types of measurements continuously.

(発明の効果) 本発明は以上の説明からも明らかなように、瓦
の上面及び重なり面の形状や瓦の外形状を短時間
に正確に測定することができるもので、従来の瓦
形状測定上の問題点を解消した瓦形状測定装置と
して業界に寄与するところ極めて大である。
(Effects of the Invention) As is clear from the above description, the present invention is capable of accurately measuring the shape of the top surface and overlapping surface of a tile and the outer shape of a tile in a short time, and is capable of measuring the shape of a tile in a short time. This tile shape measuring device that solves the above problems will greatly contribute to the industry.

【図面の簡単な説明】[Brief explanation of drawings]

図面はいずれも本発明の実施例を示すもので、
第1図は一部切欠平面図、第2図は一部切欠正面
図、第3図は要部の一部切欠側面図、第4図は表
示装置に接続させた測定システム全体の構成を示
す正面図である。 1……基準台、2,2′……レール、3……ス
ライダ、5……センサー、6……センサー、16
……第2スライダ、18……X座標検出機構、1
9……瓦外形状測定具、20……Y座標検出機
構。
All drawings show embodiments of the present invention.
Fig. 1 shows a partially cutaway plan view, Fig. 2 shows a partially cutaway front view, Fig. 3 shows a partially cutaway side view of main parts, and Fig. 4 shows the overall configuration of the measurement system connected to a display device. It is a front view. 1...Reference stand, 2, 2'...Rail, 3...Slider, 5...Sensor, 6...Sensor, 16
...Second slider, 18...X coordinate detection mechanism, 1
9...Tile outer shape measuring tool, 20...Y coordinate detection mechanism.

Claims (1)

【特許請求の範囲】 1 測定される瓦をセツトする基準台1の両側に
平行に設置されたレール2,2上に該レール2,
2と直交するスライダ3を摺動自在に取付け、該
スライダ3には瓦の中央部及び端部の上面高さを
連続的に検出するセンサー5,5と、瓦の端部に
位置して下側から瓦の重なり面高さを連続的に検
出するセンサー6とを設けたことを特徴とする瓦
形状測定装置。 2 測定される瓦をセツトする基準台1の両側に
平行に設置されたレール2,2上に該レール2,
2と直交するスライダ3を摺動自在に取付け、該
スライダ3には瓦の中央部及び端部の上面高さを
連続的に検出するセンサー5と、瓦の端部に位置
して下側から瓦の重なり面高さを連続的に検出す
るセンサー6とを設け、さらに該レール2,2上
にはY座標検出機構20付きの瓦外形状測定具1
9を搭載したX座標検出機構18付きの第2スラ
イダ16を前記スライダ3と平行に取付けたこと
を特徴とする瓦形状測定装置。
[Claims] 1. On rails 2, 2 installed in parallel on both sides of a reference stand 1 on which tiles to be measured are set, the rails 2,
A slider 3 perpendicular to tile 2 is slidably mounted, and the slider 3 has sensors 5, 5 that continuously detect the upper surface height of the center and end portions of the tile, and sensors 5, 5 located at the end of the tile and located at the bottom. A tile shape measuring device characterized by being provided with a sensor 6 that continuously detects the height of the overlapping surface of tiles from the side. 2. On the rails 2, 2 installed parallel to both sides of the reference stand 1 on which the tile to be measured is set,
A slider 3 perpendicular to the roof tile 2 is slidably mounted, and the slider 3 is equipped with a sensor 5 that continuously detects the upper surface height of the center and ends of the tile, and a sensor 5 located at the end of the tile from below. A sensor 6 that continuously detects the height of the overlapping surface of tiles is provided, and a tile outer shape measuring tool 1 with a Y coordinate detection mechanism 20 is provided on the rails 2, 2.
A tile shape measuring device characterized in that a second slider 16 equipped with an X-coordinate detection mechanism 18 equipped with a second slider 16 is mounted parallel to the slider 3.
JP23318183A 1983-12-09 1983-12-09 Tile shape measuring device Granted JPS60125514A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23318183A JPS60125514A (en) 1983-12-09 1983-12-09 Tile shape measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23318183A JPS60125514A (en) 1983-12-09 1983-12-09 Tile shape measuring device

Publications (2)

Publication Number Publication Date
JPS60125514A JPS60125514A (en) 1985-07-04
JPH0221725B2 true JPH0221725B2 (en) 1990-05-16

Family

ID=16950999

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23318183A Granted JPS60125514A (en) 1983-12-09 1983-12-09 Tile shape measuring device

Country Status (1)

Country Link
JP (1) JPS60125514A (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS528851A (en) * 1975-07-10 1977-01-24 Iwao Sakakibara Method for detecting the distortion of tile
JPS57125309A (en) * 1981-01-28 1982-08-04 Toyo Electric Mfg Co Ltd Coordinate reading method

Also Published As

Publication number Publication date
JPS60125514A (en) 1985-07-04

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