JPH0259944B2 - - Google Patents
Info
- Publication number
- JPH0259944B2 JPH0259944B2 JP58143341A JP14334183A JPH0259944B2 JP H0259944 B2 JPH0259944 B2 JP H0259944B2 JP 58143341 A JP58143341 A JP 58143341A JP 14334183 A JP14334183 A JP 14334183A JP H0259944 B2 JPH0259944 B2 JP H0259944B2
- Authority
- JP
- Japan
- Prior art keywords
- line
- test piece
- tracking device
- marked
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
- G01N2203/0647—Image analysis
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
【発明の詳細な説明】
本発明は標線を附したゴム、合成樹脂等の試験
片の引張試験に際し、該試験片のチヤツキングの
位置が横方向及び縦方向にずれてもみかけ上補正
し、試験後の標線の中心位置を常に正確に捕捉
し、高精度の測定を行うことが出来るように成し
た引張試験等に於ける標線追跡方法に関するもの
である。DETAILED DESCRIPTION OF THE INVENTION The present invention corrects the apparent deviation of the chucking position of the test piece in the horizontal and vertical directions when performing a tensile test on a marked test piece of rubber, synthetic resin, etc. The present invention relates to a method for tracking a marked line in tensile tests, etc., which enables accurate measurement of the center position of the marked line after testing.
以下に図示の実施例に基きその内容について説
明する。 The contents will be explained below based on the illustrated embodiment.
第1図には標線追跡装置の全体概略図を示して
あり、1はゴム、合成樹脂等から成る試験片で適
宜位置に所定距離lをもつて上部標線2及び下部
標線3を布置してある。 Fig. 1 shows an overall schematic diagram of the marked line tracking device, in which 1 is a test piece made of rubber, synthetic resin, etc., and an upper marked line 2 and a lower marked line 3 are placed at appropriate positions with a predetermined distance l. It has been done.
4は上部クランプで試験片1の上側部5を挟持
している。この上部クランプ4はロードセル6に
取り付けてあり、固定側クランプでもある。7は
下部クランプで試験片1の下側部8を挟持してお
り、この下部クランプ7は螺杆9により矢標T方
向に移行せしめられる移動側クランプでもある。 Reference numeral 4 is an upper clamp that clamps the upper side portion 5 of the test piece 1. This upper clamp 4 is attached to the load cell 6 and also serves as a stationary side clamp. A lower clamp 7 holds the lower side 8 of the test piece 1, and this lower clamp 7 is also a movable clamp that is moved in the direction of arrow T by a screw rod 9.
10は螺杆9と連繋したギヤヘツドでモーター
11により作動し該螺杆9を矢標T方向に移行せ
しめて試験片1の引張り試験を行うものである。 Reference numeral 10 denotes a gear head connected to the screw rod 9, which is operated by a motor 11 to move the screw rod 9 in the direction of arrow T to perform a tensile test on the test piece 1.
12は上部標線追跡装置で螺杆13に装着して
あり該螺杆13の回転により上下方向に移動する
べくなしてある。 Reference numeral 12 denotes an upper marking line tracking device which is attached to a screw rod 13 and is configured to move vertically as the screw rod 13 rotates.
14は下部標線追跡装置で螺杆15に装着して
あり該螺杆15の回転により上下方向に移動すべ
くなしてある。 Reference numeral 14 denotes a lower marking line tracking device which is attached to a screw rod 15 and is configured to move vertically as the screw rod 15 rotates.
16は螺杆13を回転せしめるためのモーター
でモーター制御器17にコントロールされて回転
方向及び回転量が決められるものである。18は
螺杆15を回転せしめるためのモーターでモータ
ー制御器19にコントロールされて回転方向及び
回転量が決められるものである。20はエンコー
ダで螺杆13に装着してあり、該螺杆13の移動
を検出し、結果的に試験片1の上部標線2の移動
を検出するものである。21はエンコーダで螺杆
15に装着してあり、該螺杆15の移動を検出
し、結果的に試験片1の下部標線3の移動を検出
するものである。前記、上部標線追跡装置12及
び下部標線追跡装置14からは夫々照射光L1及
びL2がスポツト状に上部標線2及び下部標線3
に向けて照射され、その反射光L10,L20を受光す
べく成してある。 Reference numeral 16 is a motor for rotating the screw rod 13, and is controlled by a motor controller 17 to determine the direction and amount of rotation. Reference numeral 18 denotes a motor for rotating the screw rod 15, and is controlled by a motor controller 19 to determine the direction and amount of rotation. Reference numeral 20 denotes an encoder which is attached to the screw rod 13 and detects the movement of the screw rod 13 and, as a result, the movement of the upper marking line 2 of the test piece 1. Reference numeral 21 denotes an encoder which is attached to the screw rod 15 and detects the movement of the screw rod 15 and, as a result, the movement of the lower marking line 3 of the test piece 1. The irradiated lights L 1 and L 2 are emitted from the upper gauge line tracking device 12 and the lower gauge line tracking device 14 in a spot shape to the upper gauge line 2 and the lower gauge line 3, respectively.
It is designed to receive the reflected light L 10 and L 20 .
反射光L10を受光した上部標線追跡装置12は
光電変換してその電気信号P1を差動増幅器22
に入力すべく成してある。 The upper line tracking device 12 that receives the reflected light L 10 performs photoelectric conversion and sends the electrical signal P 1 to the differential amplifier 22 .
It is designed to be input into the .
又反射光L20を受光した下部標線追跡装置14
は光電変換してその電気信号P2を差動増幅器2
3に入力すべく成してある。 Also, the lower marking line tracking device 14 that received the reflected light L 20
converts photoelectrically and sends the electrical signal P2 to differential amplifier 2.
It is designed to be input into 3.
24はマイクロコンピユーター装置でエンコー
ダー20,21からの信号をI/Oポート24A
で受けて試験片1の伸びを算出し、表示器25に
デジタル又はアナログ表示をする。26又は27
はオア回路でマイクロコンピユーター装置24の
I/Oポート24Aを通して初期条件信号と差動
増幅器22及び23からの信号を夫々入力すべく
成してあり、上部標線追跡装置12及び下部標線
追跡装置14を上部標線2及び下部標線3の移動
に従つて追跡すべく成してある。28はCPUで
ある。 24 is a microcomputer device that sends signals from encoders 20 and 21 to I/O port 24A.
, the elongation of the test piece 1 is calculated and displayed on the display 25 in digital or analog form. 26 or 27
is an OR circuit configured to input the initial condition signal and the signals from the differential amplifiers 22 and 23, respectively, through the I/O port 24A of the microcomputer device 24. 14 to be tracked according to the movement of the upper marked line 2 and the lower marked line 3. 28 is a CPU.
而して、第1図に示した標線追跡装置に於いて
は、試験片1の上部標線2及び下部標線3を常に
捕捉すべく上部標線追跡装置12及び下部標線追
跡装置14が夫々上下方向に移動するものであ
る。 In the marked line tracking device shown in FIG. move in the vertical direction, respectively.
次に試験片1の標線間隔を測定する以前の位置
の設定について説明する。 Next, the setting of the position before measuring the gauge line interval of the test piece 1 will be explained.
試験片1を上部クランプ4及び下部クランプ7
により挟持した後、上部標線追跡装置12からの
照射光L1をスポツト状にして試験片1に於ける
上部標線2の近傍位置例へばP1(第2図示)に照
射しておく。 The test piece 1 is placed between the upper clamp 4 and the lower clamp 7.
After the sample is clamped by the upper marker line tracking device 12, the irradiation light L1 from the upper marker line tracking device 12 is made into a spot shape and is irradiated to an example position P1 (shown in the second figure) near the upper marker line 2 on the test piece 1.
又、下部標線追跡装置14からの照射光L2を
スポツト状にして下部標線3の近傍位置例へば
Q1に照射しておく。尚上部標線追跡装置12と
下部標線追跡装置14の光学系は同じである。而
して、CPU28からの初期条件指令によりI/
Oポート24A、オア回路26,27、モーター
制御器17,19、モーター16,18、螺杆1
3,15が作動し上部標線追跡装置12下部標線
追跡装置14夫々標線2,3を追跡すべく移動し
照射光L1を点P2上にスポツトせしめ又照射光L2
は点Q2上にスポツトせしめるものである。 Also, if the irradiation light L2 from the lower marked line tracking device 14 is made into a spot shape and moved to an example of a position near the lower marked line 3,
Irradiate Q 1 . The optical systems of the upper marker line tracking device 12 and the lower marker line tracking device 14 are the same. Accordingly, the I/
O port 24A, OR circuit 26, 27, motor controller 17, 19, motor 16, 18, screw rod 1
3 and 15 are activated, the upper marker line tracking device 12 and the lower marker line tracking device 14 move to track the marker lines 2 and 3, respectively, and spot the irradiation light L 1 on the point P 2 , and the irradiation light L 2
is placed on point Q2 .
試験片の横方向のみかけ補正について。(第3
図乃至第11図)
29は上部標線追跡装置12内に設けた集光レ
ンズ系で光源30からの光を照射光L1としてス
ポツト状に上部標線2に照射せしめてある。(第
2図上R1で示す環状部)
31は反射光L10を集光するレンズ系で反射鏡
32の前方に配置してある。受光ブロツク34に
は上部標線2の像が写るようになつている。この
反射鏡32はサーボモーター33により適宜偏角
回動せしめられるように成してある。34は反射
鏡32による反射光を受光するために適宜配置し
た受光ブロツクで金属製の枠体内に受光部として
の光フアイバー35と受光素子36とを組み合わ
せた光電変換器A及びBを横方向に配設してあ
る。(第6図参照)又受光部として他の受光器を
採用してもよい。 Regarding the correction of the appearance of the specimen in the lateral direction. (3rd
11) Reference numeral 29 denotes a condensing lens system provided in the upper marked line tracing device 12, and irradiates the upper marked line 2 with light from a light source 30 in a spot-like manner as irradiation light L1 . (An annular portion indicated by R 1 in the upper part of FIG. 2) 31 is a lens system for condensing the reflected light L 10 and is arranged in front of the reflecting mirror 32 . The image of the upper gauge line 2 is reflected on the light receiving block 34. This reflecting mirror 32 is configured to be rotated by a servo motor 33 as appropriate. Reference numeral 34 denotes a light receiving block appropriately arranged to receive the light reflected by the reflecting mirror 32, and photoelectric converters A and B, which are a combination of an optical fiber 35 as a light receiving part and a light receiving element 36, are placed in a metal frame in the horizontal direction. It is arranged. (See FIG. 6) Also, other light receivers may be employed as the light receiver.
而して、上部標線2の横方向の反射光を捕捉す
ることが出来る。 Thus, it is possible to capture the reflected light in the lateral direction of the upper gauge line 2.
光電変換器A及びBと同様の光電変換器C及び
Dは縦方向に配設してあり、上部標線2の縦方向
の反射光を捕捉するものである。 Photoelectric converters C and D, which are similar to photoelectric converters A and B, are arranged in the vertical direction and capture the vertically reflected light of the upper gauge line 2.
37は差動増幅器で光電変換器A及びBの出力
信号の差を検出しその差が零になるようにサーボ
モーター33を作動し反射鏡32を偏角回動すべ
く成してある。 A differential amplifier 37 detects the difference between the output signals of the photoelectric converters A and B, and operates the servo motor 33 to rotate the reflecting mirror 32 by an angle of deviation so that the difference becomes zero.
尚、下部標線追跡装置14も上部標線追跡装置
12と同様の構成であつて同様に作動するので説
明は省略した。 Note that the lower marked line tracking device 14 has the same configuration as the upper marked line tracking device 12 and operates in the same manner, so a description thereof will be omitted.
次に上部標線2の横方向のみかけ補正の作動態
様について説明する。 Next, the operation mode of the horizontal direction correction of the upper gauge line 2 will be explained.
サーボモーター33、反射鏡32を介して光電
変換器A及びBに等しい光量が入射するように各
機器が作動して停止する。(第9図参照)
而して、試験片1が矢標F方向にずれていても
見かけ試験片1が真ん中に正しくチヤツキングさ
れたこととなり横方向の見かけ補正が成される。 Each device operates and stops so that the same amount of light enters the photoelectric converters A and B via the servo motor 33 and the reflecting mirror 32. (See FIG. 9) Therefore, even if the test piece 1 is shifted in the direction of the arrow F, the apparent test piece 1 is chucked correctly in the center, and the apparent correction in the lateral direction is achieved.
尚、下部標線3の見かけ補正は上部標線2の見
かけ補正と同じなので説明は省略する。 Note that the apparent correction of the lower marked line 3 is the same as the apparent correction of the upper marked line 2, so a description thereof will be omitted.
◎試験片の縦方向のみかけ補正について。(第1
2図乃至第17図)
前記した光フアイバー35及び受光素子36と
から成る光電変換器Cと光電変換器Dとは縦方向
に重積配置してある。(第7図参照)これら光電
変換器C及び光電変換器Dも上部標線追跡装置1
2と下部標線追跡装置14とに夫々設けてあり同
じ構成であるので上部標線追跡装置12を例にと
つて説明する。◎About the vertical appearance correction of the test piece. (1st
2 to 17) The photoelectric converter C and the photoelectric converter D, which are composed of the optical fiber 35 and the light receiving element 36 described above, are stacked vertically. (See Figure 7) These photoelectric converters C and photoelectric converters D are also connected to the upper gauge line tracking device 1.
2 and the lower marked line tracking device 14 and have the same configuration, the upper marked line tracking device 12 will be explained as an example.
而してこの光電変換器C及び光電変換器Dは上
部標線2の縦方向の反射光を捕捉することが出来
る。 The photoelectric converter C and the photoelectric converter D can capture the vertically reflected light of the upper gauge line 2.
この上部標線2の縦方向のみかけ補正の作動態
様は下記の如くである。 The operating mode of the vertical direction appearance correction of the upper gauge line 2 is as follows.
今、試験片1の矢標G方向(第13図参照)に
ずれて上部クランプ5と下部クランプ7との間に
挟持したとする。 Now, assume that the test piece 1 is shifted in the direction of arrow G (see FIG. 13) and held between the upper clamp 5 and the lower clamp 7.
然る時、上部標線2の反射光L10は反射鏡32
により反射されて受光ブロツク34の光電変換器
Cに入射せしめられる。(第7図、第12図、第
16図、第17図参照)
従つて、光電変換器Cと光電変換器Dとの間に
出力信号の不平衡が生じる。この生じた光電変換
器CとDの信号を差動増幅器22を介してオア回
路27(OR回路)に入力しその差を零にすべく
モーター制御器17、モーター16、螺杆13を
介して上部標線追跡装置12を移動せしめ、光電
変換器Cと光電変換器Dとに等しい光量が入射す
るように成して停止する。(第14図、第15図
参照)
従つて、見かけ上試験片1が真ん中に正しくチ
ヤツキングされたこととなり上部標線2の縦方向
の見かけ補正がなされる。 At that time, the reflected light L 10 from the upper gauge line 2 is reflected by the reflecting mirror 32.
The light is reflected by the light receiving block 34 and is incident on the photoelectric converter C of the light receiving block 34. (See FIGS. 7, 12, 16, and 17) Therefore, an imbalance of output signals occurs between the photoelectric converter C and the photoelectric converter D. The generated signals from the photoelectric converters C and D are input to an OR circuit 27 (OR circuit) via a differential amplifier 22, and in order to make the difference zero, the signals are sent to the upper part via a motor controller 17, a motor 16, and a screw rod 13. The marker tracking device 12 is moved so that the same amount of light is incident on the photoelectric converters C and D, and then stopped. (See FIGS. 14 and 15) Therefore, it appears that the test piece 1 is chucked correctly in the middle, and the vertical direction of the upper gauge line 2 is apparently corrected.
又、試験片1が矢標H方向(第13図参照)に
ずれてチヤツキングされた時は上部標線2の反射
光L10は反射鏡32を介して受光ブロツク34に
於ける光電変換器D側に入射せしめられる。(第
7図、第10図、第17図参照)
従つて、この場合も前記同様に作動し上部標線
追跡装置12を移動せしめ、光電変換器Cと光電
変換器Dとに等しい光量が入射するように成して
停止する。(第14図、第15図参照)この状態
においては、上部標線2の縦方向の見かけ補正が
なされたこととなる。 Furthermore, when the test piece 1 is chucked with a deviation in the direction of the arrow H (see FIG. 13), the reflected light L10 from the upper marker line 2 is transmitted to the photoelectric converter D in the light receiving block 34 via the reflecting mirror 32. It is forced to enter the side. (See FIGS. 7, 10, and 17.) Therefore, in this case as well, the operation is similar to that described above, and the upper marking line tracking device 12 is moved, so that the same amount of light is incident on the photoelectric converters C and the photoelectric converters D. Then stop. (See FIGS. 14 and 15) In this state, the vertical appearance of the upper gauge line 2 has been corrected.
尚、下部標線3の縦方向の補正に関しては下部
標線追跡装置14が上部標線追跡装置12と同様
な作動をするので、その説明は省略した。 Regarding the vertical correction of the lower marked line 3, since the lower marked line tracing device 14 operates in the same manner as the upper marked line tracking device 12, a description thereof will be omitted.
次に叙上の構成より成る本発明の全体の作用に
ついて説明する。 Next, the overall operation of the present invention constructed as described above will be explained.
第18図に示す如き上部標線2及び下部標線3
を有する試験片1を上部クランプ4と下部クラン
プ7との間に挟持する。 Upper gauge line 2 and lower gauge line 3 as shown in Figure 18
The test piece 1 having the following properties is held between the upper clamp 4 and the lower clamp 7.
然る時、上部標線追跡装置12は上部標線2の
横方向及び縦方向の見かけ補正を光電変換器A,
B,C,Dで行う如く作動する一方下部標線追跡
装置14も下部標線3の横方向及び縦方向の見か
け補正を光電変換器A,B,C,Dで行う。 At that time, the upper gauge line tracking device 12 performs apparent correction of the upper gauge line 2 in the horizontal and vertical directions using photoelectric converters A,
The lower marking line tracking device 14 also performs the horizontal and vertical apparent correction of the lower marking line 3 using photoelectric converters A, B, C, and D.
而して、上部標線2及び下部標線3は夫々みか
け補正されたこととなる。このような見かけ補正
は引張試験中でも常に行われており、常にマーク
像(上部標線2、下部標線3)は受フアイバー3
5の中心に結象されるものである。 Thus, the upper marked line 2 and the lower marked line 3 are each subjected to apparent correction. Such apparent correction is always performed during the tensile test, and the mark image (upper marked line 2, lower marked line 3) is always aligned with the receiving fiber 3.
It is visualized at the center of 5.
このように試験片1の横方向位置及び縦方向位
置のみかけ補正が終了した後、モーター11、ギ
ヤヘツド10、螺杆9、下部クランプ7等を介し
て試験片1を矢標T方向に引つ張ると第19図に
示す如く試験片1は伸長されて変形し上部標線2
及び下部標線3間の距離はl+△l=l′となると
同時に上部標線2及び下部標線3の形も変形せし
められる。(第21図参照)
この上部標線2と下部標線3との伸張距離l″は
上部標線追跡装置12と下部標線追跡装置14と
により測定され表示器25に表示される。この上
部標線2及び下部標線3の変形態様が、第21図
に示す如く常にその位置を自動補正され適確に光
フアイバー35の中心位置にマーク像を結びなが
ら引つ張られる。 After completing the apparent correction of the horizontal and vertical positions of the test piece 1, the test piece 1 is pulled in the direction of arrow T via the motor 11, gear head 10, screw rod 9, lower clamp 7, etc. As shown in FIG.
The distance between the upper gauge line 2 and the lower gauge line 3 becomes l+Δl=l', and at the same time, the shapes of the upper gauge line 2 and the lower gauge line 3 are also deformed. (See FIG. 21) The extension distance l'' between the upper marked line 2 and the lower marked line 3 is measured by the upper marked line tracking device 12 and the lower marked line tracking device 14, and is displayed on the display 25. The deformation of the marked line 2 and the lower marked line 3 is always automatically corrected as shown in FIG. 21, and the mark image is accurately connected to the center position of the optical fiber 35 while being stretched.
従つて、マーク像の変形形状に左右されずに常
に引張り方向(縦方向の成分)の中心位置(1/2
位置)を捕捉するため、正しい標線間距離を測定
することが出来る。 Therefore, the center position (1/2
position), it is possible to measure the correct distance between the marked lines.
而して、本発明は叙上の如き構成及び作用を有
するものであり、特に試験片に於ける標線の横方
向及び縦方向のずれをみかけ補正しながら引張り
試験を行なわしめたので試験片をわざわざ動かし
てその位置補正をする必要なく簡単に精度の高い
測定を行うことが出来る。又、受光ブロツク内に
光フアイバー等の受光部を十字状に配設したので
横方向及び縦方向の変位分解成分を夫々高精度を
もつて検出でき、特に横方向の変位成分のみを利
用して試験片のチヤツキング位置ズレの自動補正
をも可能とし、又常にサンプルの横幅の中心補正
を行つているので常に正しい標線間距離を測定す
ることが出来る等の効果がある。 Therefore, the present invention has the configuration and operation as described above, and in particular, the tensile test was conducted while apparently correcting the deviation of the marking line in the horizontal and vertical directions on the test piece. It is possible to easily perform highly accurate measurements without having to go through the trouble of moving and correcting the position. In addition, since the light-receiving parts such as optical fibers are arranged in a cross shape within the light-receiving block, the horizontal and vertical displacement components can be detected with high precision. It is also possible to automatically correct the chucking positional deviation of the test piece, and since the center of the width of the sample is always corrected, it is possible to always measure the correct distance between gauge lines.
第1図は本発明の全体の概略説明図、第2図は
同じく試験片の要部の正面図、第3図は上部標線
追跡装置と上部標線との関係を示す平面図で試験
片が横方向にずれ動いた場合を示してある。第4
図は試験片の横方向へのずれ動きを説明するため
の図、第5図は受光ブロツクの正面図、第6図は
受光ブロツクの横断平面図、第7図は受光ブロツ
クの縦断側面図、第8図は反射鏡と光電変換器
A,Bとの関係を示す説明図、第9図乃至第11
図は受光ブロツクに於ける光電変換器A,Bと入
光状態を示す正面図、第12図は上部標線追跡装
置と上部標線との関係を示す平面図で試験片が縦
方向にずれ動いた場合を示してある。第13図は
試験片の縦方向のずれ動きを説明するための図、
第14図は第15図の拡大正面図、第15図乃至
第16図は受光ブロツクに於ける光電変換器C,
Dと入光状態を示す正面図、第17図は縦方向の
マーク像を映す反射鏡と光電変換器C,Dを有す
る受光ブロツクとの関係を示す斜視図、第18図
は引つ張り試験前の試験片の正面図、第19図は
引つ張り試験後の試験片の正面図である。第20
図は引つ張り試験前の上部標線による反射光が光
電変換器A,B,C,Dに等しく入光している状
態を示す正面図、第21図は引つ張り試験中の上
部標線による反射光が光電変換器A,B,C,D
に等しく入光している状態を示す正面図である。
1……試験片、2……上部標線、12……上部
標線追跡装置、14……下部標線追跡装置、34
……受光ブロツク、A,B,C,D……光電変換
器。
FIG. 1 is an overall schematic explanatory diagram of the present invention, FIG. 2 is a front view of the main parts of the test piece, and FIG. 3 is a plan view showing the relationship between the upper gauge line tracking device and the upper gauge line of the test piece. The case is shown in which the figure shifts in the lateral direction. Fourth
The figures are diagrams for explaining the displacement movement of the test piece in the lateral direction, Fig. 5 is a front view of the light receiving block, Fig. 6 is a cross-sectional plan view of the light receiving block, and Fig. 7 is a vertical cross-sectional side view of the light receiving block. FIG. 8 is an explanatory diagram showing the relationship between the reflecting mirror and photoelectric converters A and B, and FIGS. 9 to 11
The figure is a front view showing the photoelectric converters A and B in the light-receiving block and the light incident state, and Figure 12 is a plan view showing the relationship between the upper mark line tracking device and the upper mark line, and the test piece is shifted in the vertical direction. It shows what happens when it moves. Fig. 13 is a diagram for explaining the vertical displacement movement of the test piece.
Fig. 14 is an enlarged front view of Fig. 15, and Figs. 15 and 16 show the photoelectric converter C in the light receiving block.
FIG. 17 is a perspective view showing the relationship between a reflecting mirror that reflects a mark image in the vertical direction and a light receiving block having photoelectric converters C and D, and FIG. 18 is a tensile test. FIG. 19 is a front view of the test piece after the tensile test. 20th
The figure is a front view showing the state in which the reflected light from the upper gauge line enters photoelectric converters A, B, C, and D equally before the tensile test, and Figure 21 shows the upper gauge line during the tensile test. The light reflected by the line is transmitted to photoelectric converters A, B, C, and D.
FIG. DESCRIPTION OF SYMBOLS 1... Test piece, 2... Upper marked line, 12... Upper marked line tracking device, 14... Lower marked line tracking device, 34
...Photodetector block, A, B, C, D...Photoelectric converter.
Claims (1)
ずれを見かけ補正する段階と該試験片の縦方向の
チヤツキングずれを見かけ補正する段階とを、受
光ブロツク内に十字状に配設した光フアイバー等
を受光部により行い、前記両方の見かけ補正を行
いながら引つ張り試験を行う段階とから成る引張
試験等に於ける標線追跡方法。 2 特許請求の範囲第1項の記載に於いて、横方
向及び縦方向の見かけ補正を上部標線と下部標線
とで夫々独立して各々行うようにした引張試験等
に於ける標線追跡方法。[Scope of Claims] 1. The step of apparently correcting the chucking deviation in the horizontal direction of a specimen with marked lines and the step of apparently correcting the chucking deviation in the vertical direction of the test piece are arranged in a cross shape within the light receiving block. A method for tracking a marked line in a tensile test, etc., which comprises the step of performing a tensile test by using a light receiving unit to conduct an optical fiber or the like arranged on the optical fiber, and performing a tensile test while performing both of the above-mentioned apparent corrections. 2. In the statement of claim 1, the marking line tracing in a tensile test, etc., in which the apparent correction in the horizontal and vertical directions is performed independently for the upper marked line and the lower marked line, respectively. Method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14334183A JPS6033028A (en) | 1983-08-04 | 1983-08-04 | Tracing method of bench mark in tensile test or the like |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14334183A JPS6033028A (en) | 1983-08-04 | 1983-08-04 | Tracing method of bench mark in tensile test or the like |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6033028A JPS6033028A (en) | 1985-02-20 |
| JPH0259944B2 true JPH0259944B2 (en) | 1990-12-13 |
Family
ID=15336531
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14334183A Granted JPS6033028A (en) | 1983-08-04 | 1983-08-04 | Tracing method of bench mark in tensile test or the like |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6033028A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0739936B2 (en) * | 1985-05-23 | 1995-05-01 | 株式会社島津製作所 | Test piece elongation measuring device |
| JPH0627685B2 (en) * | 1986-11-27 | 1994-04-13 | 株式会社東洋精機製作所 | A method for tracking the marked line of a colored sample in a tensile test, etc. |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5213436A (en) * | 1975-07-24 | 1977-02-01 | Toppan Printing Co Ltd | Production method for metal mesh plate |
| JPS57184948A (en) * | 1981-05-11 | 1982-11-13 | Yokohama Rubber Co Ltd:The | Creep testing device |
-
1983
- 1983-08-04 JP JP14334183A patent/JPS6033028A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6033028A (en) | 1985-02-20 |
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