JPH0260985B2 - - Google Patents
Info
- Publication number
- JPH0260985B2 JPH0260985B2 JP56082278A JP8227881A JPH0260985B2 JP H0260985 B2 JPH0260985 B2 JP H0260985B2 JP 56082278 A JP56082278 A JP 56082278A JP 8227881 A JP8227881 A JP 8227881A JP H0260985 B2 JPH0260985 B2 JP H0260985B2
- Authority
- JP
- Japan
- Prior art keywords
- electro
- voltage
- measuring device
- voltage measuring
- linbo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000013078 crystal Substances 0.000 claims description 30
- 229910013641 LiNbO 3 Inorganic materials 0.000 claims description 16
- 230000005684 electric field Effects 0.000 claims description 8
- 238000005259 measurement Methods 0.000 description 10
- 230000000694 effects Effects 0.000 description 9
- 230000003287 optical effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000013307 optical fiber Substances 0.000 description 5
- UCHOFYCGAZVYGZ-UHFFFAOYSA-N gold lead Chemical compound [Au].[Pb] UCHOFYCGAZVYGZ-UHFFFAOYSA-N 0.000 description 3
- 230000001788 irregular Effects 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000005693 optoelectronics Effects 0.000 description 2
- 230000006903 response to temperature Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000012780 transparent material Substances 0.000 description 2
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000005674 electromagnetic induction Effects 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/03—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on ceramics or electro-optical crystals, e.g. exhibiting Pockels effect or Kerr effect
- G02F1/0305—Constructional arrangements
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
Description
【発明の詳細な説明】
本発明は電気光学効果を用いた電圧測定装置に
関するものであり、温度特性の優れた高精度測定
が可能な電圧測定装置を提供することを目的とす
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a voltage measuring device using an electro-optical effect, and an object of the present invention is to provide a voltage measuring device capable of highly accurate measurement with excellent temperature characteristics.
LiNbO3等の電気光学結晶の電気光学効果を利
用して高圧送電線などの電圧を光学的に測定する
電圧測定装置は、絶縁性や電磁誘導ノイズの点で
すぐれており、抵抗分圧法やコンデンサ分圧法な
どによる電気的測定法に比較して多くの長所を有
している。 Voltage measurement devices that optically measure the voltage of high-voltage power transmission lines using the electro-optic effect of electro-optic crystals such as LiNbO 3 have excellent insulation properties and electromagnetic induction noise, and are compatible with resistive voltage division methods and capacitors. It has many advantages compared to electrical measurement methods such as the partial pressure method.
第１図は電気光学効果を利用した電圧測定装置
の従来例であり、Ｚ方向に垂直に切断した
LiNbO3単結晶１に対して、ｚ軸に平行な方向に
レーザ光２を通し、ｘ軸方向に電極３，３′によ
り電界を印加し、これを1/4波長板６とともに偏
光子４と検光子５との間に置くことにより電圧測
定装置を構成している。同装置に偏向子４側より
入射したレーザ光２の出力強度は電気光学効果を
有するLiNbO3単結晶１に印加される印加電圧Ｖ
により変化し、この出力強度変化から印加電圧Ｖ
を検知することができる。 Figure 1 shows a conventional example of a voltage measuring device that uses the electro-optic effect, and is cut perpendicular to the Z direction.
A laser beam 2 is passed through a LiNbO 3 single crystal 1 in a direction parallel to the z-axis, an electric field is applied in the x-axis direction by electrodes 3 and 3', and this is applied to a quarter-wave plate 6 and a polarizer 4. By placing it between the analyzer 5 and the analyzer 5, a voltage measuring device is constructed. The output intensity of the laser beam 2 entering the device from the polarizer 4 side is determined by the applied voltage V applied to the LiNbO 3 single crystal 1 having an electro-optic effect.
From this change in output intensity, the applied voltage V
can be detected.
しかしながら本構成の電圧測定装置に対し種々
の測定実験を行つた結果、LiNbO3単結晶１の温
度変化に対し光出力はステツプ状の不規則な変化
を示すことが判明し、このままでは電圧測定装置
として安定に動作しないことが明らかになつた。 However, as a result of performing various measurement experiments on the voltage measuring device with this configuration, it was found that the optical output showed irregular steps in response to temperature changes in the LiNbO 3 single crystal 1. It became clear that it did not work stably.
第２図は、この第１図の電圧測定装置において
LiNbO3単結晶１の温度（横軸）を変化させたと
きの光出力（縦軸）の変化の状態を示している。
同図より先に述べたように温度変化に対し、光出
力はステツプ状の不規則な変化を示しており、本
装置が周囲温度の変動のため光出力に誤差が生じ
ることがわかる。 Figure 2 shows the voltage measuring device shown in Figure 1.
It shows how the optical output (vertical axis) changes when the temperature (horizontal axis) of the LiNbO 3 single crystal 1 is changed.
As mentioned earlier in the figure, the optical output shows irregular step-like changes in response to temperature changes, indicating that errors occur in the optical output of this device due to fluctuations in ambient temperature.
このような現象が生じる原因は必ずしも明らか
ではないが、焦電効果によるものと考えられる。
すなわち焦電効果とは、昭温度変化により
LiNbO3結晶等のＺ面に電荷が発生する現象であ
り、前記電荷のために測定電界以外の電界が
LiNbO3単結晶に生じることになり、電圧測定の
誤差が生じることになる。 Although the cause of this phenomenon is not necessarily clear, it is thought to be due to the pyroelectric effect.
In other words, the pyroelectric effect is caused by changes in temperature.
This is a phenomenon in which a charge is generated on the Z plane of a LiNbO 3 crystal, etc., and due to the charge, an electric field other than the measured electric field is
This will occur in the LiNbO 3 single crystal, resulting in an error in voltage measurement.
本発明は上記従来の欠点を除去した新規な構成
の電圧測定装置、すなわち電気光学効果を応用し
た温度変動により出力変動の生じない高精度な電
圧測定装置を提供するものである。 The present invention provides a voltage measuring device with a novel configuration that eliminates the above-mentioned conventional drawbacks, that is, a highly accurate voltage measuring device that does not cause output fluctuations due to temperature fluctuations by applying the electro-optical effect.
第３図は本発明の一実施例における電圧測定装
置の構成を示すものであり、従来例と同一箇所に
は同一番号を付してある。 FIG. 3 shows the configuration of a voltage measuring device according to an embodiment of the present invention, and the same parts as in the conventional example are given the same numbers.
同装置の特徴はLiNbO3単結晶１（結晶方向は
第１図と同じ）のＺ面に透明電極７，７′を設け、
これらの透明電極７と７′を金リード線８により
相互に電気的に接続していることである。 The feature of this device is that transparent electrodes 7, 7' are provided on the Z plane of LiNbO 3 single crystal 1 (crystal direction is the same as in Fig. 1).
These transparent electrodes 7 and 7' are electrically connected to each other by a gold lead wire 8.
上記互互いに短絡させた電極７，７′を
LiNbO3単結晶に取り付けることにより、従来大
きな欠点となつていた温度変化による光出力の不
規則な変化を完全に取り除くことが可能であるこ
とを本発明者は見い出した。 The above-mentioned electrodes 7 and 7' which are short-circuited to each other are
The present inventors have discovered that by attaching it to a LiNbO 3 single crystal, it is possible to completely eliminate irregular changes in light output due to temperature changes, which has been a major drawback in the past.
すなわち、本実施例のようにLiNbO3単結晶の
Ｚ面に設けた電極７，７′を電気的に接続するこ
とにより、温度変動によつてLiNbO3単結晶のＺ
面に発生した電荷を互いに打ち消し合うことがで
き、前記電荷による測定誤差の原因となる電界の
発生を防止できることになる。 That is, by electrically connecting the electrodes 7 and 7' provided on the Z plane of the LiNbO 3 single crystal as in this embodiment, the Z of the LiNbO 3 single crystal is
The charges generated on the surface can cancel each other out, and it is possible to prevent the generation of an electric field that causes measurement errors due to the charges.
なお電極はInO2，SnO2等の導電性透明材料、
あるいは光の半透明膜であるAu，Ag，Al等より
なるハーフミラーを用いてもよい。 The electrodes are made of conductive transparent materials such as InO 2 and SnO 2 .
Alternatively, a half mirror made of Au, Ag, Al, etc., which is a semitransparent film for light, may be used.
また、第３図の実施例は、電極を金リード線で
短絡したものであるが、第４図の他の実施例に示
す様に導電性透明物質９で結晶の側面をおおう構
成であつてもよい。この場合、電圧印加用電極３
（結晶の下面にもある）とこの導電性透明物質９
との間の絶縁性が保たれるように相互の間隔を適
当に離す必要がある。 Further, in the embodiment shown in FIG. 3, the electrodes are short-circuited with gold lead wires, but as shown in another embodiment shown in FIG. Good too. In this case, the voltage application electrode 3
(also on the bottom surface of the crystal) and this conductive transparent material 9
It is necessary to keep an appropriate distance between them so that the insulation between them is maintained.
さらに、被測定部に置かれた電気光学結晶に対
し、レーザ装置等の光源より直接光ビームを導く
構成の代りに、光フアイバなどの光伝搬体を介し
て光源より電気光学結晶に光を導く遠隔測定が可
能な電圧測定装置においても、本発明は当然適用
可能である。 Furthermore, instead of a configuration in which a light beam is directly guided from a light source such as a laser device to the electro-optic crystal placed on the part to be measured, light is guided from the light source to the electro-optic crystal via a light propagation medium such as an optical fiber. The present invention is naturally applicable to voltage measuring devices that can perform remote measurements.
第５図はこのような光フアイバを応用した電圧
測定装置の詳細を示した実施例である。同装置
は、光源１０から光フアイバ１１を通じ高圧電線
１２の近傍に置いたロツドレンズ１３、偏向プリ
ズム１４、偏光分離プリズム１５、両端のＺ面に
設けられた透明電極１６，１６′が電気的に接続
されたLiNbO3単結晶１７、1/4波長板１８を通
したあと、互いに直交する偏波成分を２本の光フ
アイバ１９，２０により受光部２１に導びき信号
処理することにより高圧電線１２の電圧を検知す
るものである。この場合高圧電線１２と大地２２
間に発生する空間電界Ｅを電気光学効果を有する
LiNbO3単結晶に作用させることにより、出力光
量に変化を生じさせ、電圧測定を行なうものであ
る。 FIG. 5 shows an embodiment showing details of a voltage measuring device using such an optical fiber. In this device, a rod lens 13 placed near a high-voltage electric wire 12, a deflection prism 14, a polarization separation prism 15, and transparent electrodes 16 and 16' provided on the Z plane at both ends are electrically connected through an optical fiber 11 from a light source 10. After passing through the LiNbO 3 single crystal 17 and the quarter-wave plate 18, the mutually orthogonal polarized components are guided to the light receiving section 21 by two optical fibers 19 and 20 and subjected to signal processing. It detects voltage. In this case, the high voltage electric wire 12 and the ground 22
The spatial electric field E generated between
By acting on the LiNbO 3 single crystal, the amount of output light is changed and the voltage is measured.
なお、同図において1/4波長板１８は光学バイ
アス用のものであり、結晶の複屈折そのものを利
用する場合は必ずしも必要ない。 Note that the 1/4 wavelength plate 18 in the figure is for optical bias, and is not necessarily necessary when the birefringence of the crystal itself is utilized.
本発明にかかる電圧測定装置は温度変動に対す
る光出力の安定化に大きな効果を有するものであ
り、ここで取り上げた電圧測定装置のみならず、
光変調装置に適用した場合においても同様の効果
が期待できる。また第３図に示す様なＺ方向に光
を通し、ｘ方向に電界を印加する結晶配置は光源
としてレーザ光のみならず発光ダイオードなどの
発光スペクトルの広い光源を用いても有効に動作
するためにレーザ光源特有のノイズを避けること
ができ、また装置の低価格化の点でも有利であ
る。 The voltage measuring device according to the present invention has a great effect on stabilizing optical output against temperature fluctuations, and is not limited to the voltage measuring device mentioned here.
Similar effects can be expected when applied to a light modulation device. In addition, the crystal arrangement that passes light in the Z direction and applies an electric field in the x direction, as shown in Figure 3, works effectively not only with laser light but also with light sources with a wide emission spectrum such as light emitting diodes, such as light emitting diodes. It is possible to avoid the noise peculiar to a laser light source, and it is also advantageous in terms of reducing the cost of the device.
また材料的には、ここでとりあげたLiNbO3単
結晶に限るものではなく、例えばLiTaO3，Sr0.25
Ba0.75Nb2O6などの焦電効果を有する電気光学結
晶に対しても、Ｚ面に設けた導電膜を電気的に接
続することにより得られる効果は同様である。さ
らに高圧電線近傍の空間電界を測定する場合、電
圧印加用電極は必ずしも必要としない。 In addition, the material is not limited to the LiNbO 3 single crystal mentioned here; for example, LiTaO 3 , Sr 0.25
The same effect can be obtained by electrically connecting a conductive film provided on the Z plane to an electro-optic crystal having a pyroelectric effect such as Ba 0.75 Nb 2 O 6 . Furthermore, when measuring a spatial electric field near a high-voltage electric wire, a voltage applying electrode is not necessarily required.
以上説明したように本発明の電圧測定装置は、
温度変動による従来不可能であつた測定誤差を防
止できるもので工業的利用価値が大きい。 As explained above, the voltage measuring device of the present invention has
It can prevent measurement errors caused by temperature fluctuations, which was previously impossible, and has great industrial value.
第１図は従来の電圧測定装置の構成図、第２図
は同装置における温度と光出力との関係を示す
図、第３図は本発明の実施例にかかる電圧測定装
置の構成図、第４図は本発明の他の実施例にかか
る電圧測定装置の構成図、第５図は本発明のさら
に他の実施例における電圧測定装置の構成図であ
る。
１，１７……LiNbO3単結晶、２……レーザ光
線、３，３′……測定用印加電極、４……偏光子、
５……検光子、６，１８……1/4波長板、７，
７′，９，１６，１６′……透明電極、８……金リ
ード線、１０……光源、１１，１９，２０……光
フアイバ、１２……高圧送電線、１３……ロツド
レンズ、１４……偏光プリズム、１５……偏光分
離プリズム。
FIG. 1 is a configuration diagram of a conventional voltage measurement device, FIG. 2 is a diagram showing the relationship between temperature and light output in the same device, and FIG. 3 is a configuration diagram of a voltage measurement device according to an embodiment of the present invention. FIG. 4 is a block diagram of a voltage measuring device according to another embodiment of the present invention, and FIG. 5 is a block diagram of a voltage measuring device according to still another embodiment of the present invention. 1, 17... LiNbO 3 single crystal, 2... Laser beam, 3, 3'... Measurement application electrode, 4... Polarizer,
5...Analyzer, 6,18...1/4 wavelength plate, 7,
7', 9, 16, 16'... Transparent electrode, 8... Gold lead wire, 10... Light source, 11, 19, 20... Optical fiber, 12... High voltage power transmission line, 13... Rod lens, 14... ...Polarization prism, 15...Polarization separation prism.
Claims (1)
平行な方向に前記結晶の一方のＺ面から他方のＺ
面に光を通過させる手段と、前記電気光学結晶を
通過する光の量を検知する手段とを有する電圧測
定装置において、被測定電界を前記結晶のＸ軸に
平行な方向に印加するとともに、前記電気光学結
晶の一方および他方のＺ面に第１、第２の導電性
膜を設け、前記第１、第２の導電性膜を電気的に
接続したことを特徴とする電圧測定装置。 ２ 電気光学結晶がLiNbO3であることを特徴と
する特許請求の範囲第１項記載の電圧測定装置。[Scope of Claims] 1. An electro-optic crystal, and an electro-optic crystal that extends from one Z-plane of the crystal to the other Z-plane in a direction parallel to the Z-axis of the electro-optic crystal.
In a voltage measuring device having means for passing light through a surface and means for detecting the amount of light passing through the electro-optic crystal, an electric field to be measured is applied in a direction parallel to the X-axis of the crystal, and 1. A voltage measuring device, characterized in that first and second conductive films are provided on one and the other Z plane of an electro-optic crystal, and the first and second conductive films are electrically connected. 2. The voltage measuring device according to claim 1, wherein the electro-optic crystal is LiNbO 3 .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56082278A JPS57196166A (en) | 1981-05-28 | 1981-05-28 | Voltage measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56082278A JPS57196166A (en) | 1981-05-28 | 1981-05-28 | Voltage measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57196166A JPS57196166A (en) | 1982-12-02 |
| JPH0260985B2 true JPH0260985B2 (en) | 1990-12-18 |
Family
ID=13770029
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56082278A Granted JPS57196166A (en) | 1981-05-28 | 1981-05-28 | Voltage measurement device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57196166A (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60257325A (en) * | 1984-06-05 | 1985-12-19 | Yokogawa Hokushin Electric Corp | Photovoltage sensor |
| GB2209609B (en) * | 1987-09-09 | 1991-06-26 | Ferranti Plc | Optical modulators |
| JPH01182824A (en) * | 1988-01-14 | 1989-07-20 | Ngk Insulators Ltd | Optical element |
| JP2550730B2 (en) * | 1989-12-29 | 1996-11-06 | 富士通株式会社 | Optical waveguide device and manufacturing method thereof |
| EP1441242B1 (en) * | 2001-11-01 | 2013-03-13 | Mitsubishi Electric Corporation | Waveplate, wavelength filter and wavelength monitor |
| EP2479581A1 (en) * | 2011-01-21 | 2012-07-25 | PowerSense A/S | An AC or DC power transmission system and a method of measuring a voltage |
| CN110703467A (en) * | 2019-10-15 | 2020-01-17 | 中国电力科学研究院有限公司 | Crystal heat dissipation structure for temperature drift suppression of electro-optic modulator and manufacturing method |
-
1981
- 1981-05-28 JP JP56082278A patent/JPS57196166A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57196166A (en) | 1982-12-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4465969A (en) | Voltage and electric field measuring device using light | |
| US4563093A (en) | Voltage and electric field measuring device using light | |
| US4933629A (en) | Method and apparatus for optically measuring electric and magnetic quantities having an optical sensing head exhibiting the Pockel's and Faraday effects | |
| KR0153277B1 (en) | Wide bandwidth fiber optic accelerometer | |
| US6285182B1 (en) | Electro-optic voltage sensor | |
| JPH0260985B2 (en) | ||
| JPH01182824A (en) | Optical element | |
| JP3489701B2 (en) | Electric signal measuring device | |
| JP3235301B2 (en) | Light voltage sensor | |
| JPH09211035A (en) | Electric field measurement device | |
| JP3114104B2 (en) | Electric field sensor device using electro-optic effect | |
| JP7843514B2 (en) | current measuring device | |
| JP2509692B2 (en) | Optical measuring device | |
| JPH0237545B2 (en) | HIKARINYORUDENKAI * JIKAISOKUTEIKI | |
| KR860000389B1 (en) | Electric field detector | |
| SU1737361A1 (en) | Device for measuring parameters of signal reflected from input of microwave component | |
| JPS62198769A (en) | Fiber optic voltage sensor | |
| JPS58196463A (en) | Optical electric field measuring device | |
| JP2648431B2 (en) | Optical temperature sensor | |
| GB2100018A (en) | Fibre optics measuring device | |
| JPS5811867A (en) | Voltage and temperature detector using light | |
| JPS5935156A (en) | Optical current transformer | |
| SU1327014A1 (en) | Optronic device for measuring intensity of electric field and voltage | |
| JPS6070328A (en) | Pressure measuring device | |
| JPS61165665A (en) | Apparatus for detecting voltage electric field |