JPH0313167B2 - - Google Patents
Info
- Publication number
- JPH0313167B2 JPH0313167B2 JP58047724A JP4772483A JPH0313167B2 JP H0313167 B2 JPH0313167 B2 JP H0313167B2 JP 58047724 A JP58047724 A JP 58047724A JP 4772483 A JP4772483 A JP 4772483A JP H0313167 B2 JPH0313167 B2 JP H0313167B2
- Authority
- JP
- Japan
- Prior art keywords
- production plate
- melt
- thin layer
- manufacturing
- production
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004519 manufacturing process Methods 0.000 claims description 63
- 238000000034 method Methods 0.000 claims description 29
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 21
- 229910052710 silicon Inorganic materials 0.000 claims description 21
- 239000010703 silicon Substances 0.000 claims description 21
- 239000000155 melt Substances 0.000 claims description 17
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims description 16
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 13
- 239000000243 solution Substances 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 9
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims description 7
- 229910017604 nitric acid Inorganic materials 0.000 claims description 7
- 239000007864 aqueous solution Substances 0.000 claims description 6
- 239000011148 porous material Substances 0.000 claims description 5
- 235000012431 wafers Nutrition 0.000 description 24
- 229920001296 polysiloxane Polymers 0.000 description 14
- 239000013078 crystal Substances 0.000 description 7
- 101150006573 PAN1 gene Proteins 0.000 description 6
- 238000002844 melting Methods 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 238000005266 casting Methods 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- QZPSXPBJTPJTSZ-UHFFFAOYSA-N aqua regia Chemical compound Cl.O[N+]([O-])=O QZPSXPBJTPJTSZ-UHFFFAOYSA-N 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Silicon Compounds (AREA)
- Photovoltaic Devices (AREA)
Description
【発明の詳細な説明】
本発明は太陽電池その他の光電変換素子等に用
いられている多結晶シリコンウエハの製造方法に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing polycrystalline silicon wafers used in solar cells and other photoelectric conversion elements.
従来から多結晶シリコンウエハは各種の方法に
よつて製造されており、最も一般的にはシリコン
母材により一たん所定形状のインゴツトを鋳造
し、これをスライスすることによつてウエハを得
るようにしているが、これではスライス作業に大
変な時間をかけなければならないだけでなく、イ
ンゴツトの約50%がスライス時のロスとなつてし
まうため、製品コスト高につき大量生産も不可能
である。 Conventionally, polycrystalline silicon wafers have been manufactured by various methods, and the most common method is to cast an ingot in a predetermined shape from a silicon base material and then obtain the wafer by slicing the ingot. However, not only does the slicing process take a lot of time, but also about 50% of the ingot is lost during slicing, making mass production impossible due to high product costs.
そこでスライスによらない方法としてリボン法
とキヤステイング法(鋳造法)が既に実施されて
いるが、リボン法は例えば回転ドラムの周面に溶
融シリコンを噴当させ、当該周面にリボン状のウ
エハを形成するものであり、同法によるときは実
際上リボン幅が数mm程度のものしか製造すること
ができず、大形の太陽電池素材等が得られない難
点がある。 Therefore, the ribbon method and casting method (casting method) have already been implemented as methods that do not involve slicing, but in the ribbon method, for example, molten silicon is sprayed onto the peripheral surface of a rotating drum, and a ribbon-shaped wafer is placed on the peripheral surface of the drum. When using this method, it is actually possible to manufacture ribbons with a width of only a few mm, which has the disadvantage that large-sized solar cell materials cannot be obtained.
また上記キヤステイング法と呼ばれているもの
は、シリコン母材を加熱して融液となし、これを
製品ウエハの寸法に応じた鋳型に流し込み、さら
に当該型の可動部分により融液を押圧成型して固
化させるものであるが、同法によるときは、一度
に所定形状のウエハが得られ、量産性の点で望ま
しい結果が期待できるものゝ、上記のように融液
は四方から押えつけられることになる。 In addition, in the above-mentioned casting method, the silicon base material is heated to form a melt, which is poured into a mold according to the dimensions of the product wafer, and then the melt is pressed and molded by the movable parts of the mold. However, when this method is used, wafers of a predetermined shape can be obtained at once, and desirable results can be expected in terms of mass production.As mentioned above, the melt is pressed down from all sides. It turns out.
このため同法では鋳型の上下面と側面が上記融
液の固化に際し、シリコン結晶粒(グレイン)の
成長を抑制してしまうことゝなり、固化製品の前
記各面と接する部分近傍が、非常に細かい結晶粒
となつて大きな結晶粒が得られず、太陽電池用シ
リコンウエハ等にあつて望ましいとされている大
結晶粒生成の要請を満足させることができないた
め、当該ウエハによつて得られた太陽電池の光電
変換効率も2〜3%と極度に悪くなつてしまう欠
陥をもつている。 For this reason, in this method, the upper and lower surfaces and side surfaces of the mold suppress the growth of silicon crystal grains (grains) when the melt solidifies, and the areas near the parts of the solidified product that contact the above-mentioned surfaces are extremely The crystal grains become fine and large crystal grains cannot be obtained, and the requirement for large crystal grain generation, which is considered desirable for silicon wafers for solar cells, etc., cannot be satisfied. The photovoltaic conversion efficiency of solar cells is also extremely poor at 2 to 3%.
そこで、本出願人は、上記諸法の欠陥を大幅に
改善することができる多結晶シリコンウエハの製
造方法として、既に、シリコン母材を溶融し、こ
の融液を、石英又はカーボンで形成され、かつ回
転状態にある製造皿上に滴下し、遠心力を有効利
用することにより所望拡径状態の融液薄層を形成
し、同層の固化後、これを製造皿から剥離する方
法(スピン法)を提案した。 Therefore, the present applicant has already developed a method for manufacturing polycrystalline silicon wafers that can significantly improve the defects of the above methods, by melting a silicon base material and using this melt to create polycrystalline silicon wafers made of quartz or carbon. A thin layer of molten liquid with a desired expanded diameter is formed by dripping onto a rotating production plate, effectively utilizing centrifugal force, and after the layer solidifies, this is peeled off from the production plate (spin method). ) was proposed.
このスピン法は、多くの優れた特徴をもつてい
るが、上記の固化した融液薄層の剥離に際し、同
層は製造皿に瘉着していることから、剥離作業の
際に破損してしまい易く、同作業が極めて煩雑で
熟練を要求されることとなり、このことが大量生
産の隘路となつていた。 This spin method has many excellent features, but when the thin layer of solidified melt mentioned above is peeled off, the layer adheres to the production plate, so it may be damaged during the peeling process. It is easy to store, and the work is extremely complicated and requires skill, which has become a bottleneck in mass production.
また、上記瘉着現象は、融液温度が高ければ高
いほど強固となることから、剥離のことを考慮し
てあまり同温度を高くすることができず、この結
果、太陽電池用ウエハ等にあつて、高温にすれば
大結晶粒が生成され、特性向上上望ましいことが
わかつていながらそれが実現できないのである。 In addition, the above-mentioned adhesion phenomenon becomes stronger as the temperature of the melt increases, so it is not possible to raise the temperature too high in consideration of peeling, and as a result, it is difficult to handle wafers for solar cells, etc. However, even though it is known that raising the temperature to high temperatures produces large crystal grains, which is desirable in terms of improving properties, this cannot be achieved.
この発明は、かゝる現状に鑑み創案されたもの
であつて、その目的とするところは、製造が容易
であり、しかも太陽電池用ウエハ等にあつて望ま
しいとされる大結晶粒のウエハを生成すること
が、支障なくできる量産可能な多結晶シリコンウ
エハの製造方法を提供しようとするものである。 The present invention was devised in view of the current situation, and its purpose is to provide a wafer with large crystal grains that is easy to manufacture and is desirable for wafers for solar cells, etc. The present invention aims to provide a method for manufacturing polycrystalline silicon wafers that can be mass-produced without any problems.
かゝる目的を達成するため、この発明にあつて
は、所望雰囲気内にあつて、ターンテーブルを用
いるなどして製造皿を回転させ、この製造皿上に
おけるシリコン母材の融液を、当該回転による遠
心力によつて、拡径方向へ流動させることによ
り、当該融液による所望径の融液薄層を形成し、
これを固化した後、同薄層を製造皿より剥離する
多結晶シリコンウエハの製造方法において、上記
製造皿を多孔質材で形成し、同製造皿上面で融液
薄層が固化した後、当該製造皿を腐蝕性溶液を付
与し、製造皿上面へ浸出する同溶液により固化し
た上記融液薄層の製造皿との瘉着面を溶解して同
薄層を製造皿から剥離することにより多結晶シリ
コンウエハを製造しようとするものである。 In order to achieve such an object, in the present invention, a production plate is rotated using a turntable or the like in a desired atmosphere, and the melt of the silicon base material on the production plate is By causing the melt to flow in the direction of diameter expansion due to the centrifugal force caused by rotation, a thin layer of the melt with a desired diameter is formed by the melt,
In a method for manufacturing a polycrystalline silicon wafer in which the thin layer is peeled off from a production plate after solidifying the melt, the production plate is formed of a porous material, and after the thin layer of melt is solidified on the upper surface of the production plate, the thin layer is peeled off from the production plate. A corrosive solution is applied to the production plate, and the thin layer of the melt solidified by the solution leached onto the upper surface of the production plate is dissolved on the surface of the production plate, and the thin layer is peeled off from the production plate. The aim is to manufacture crystalline silicon wafers.
以下、添付図面にもとづき、この発明を詳細に
説明する。 Hereinafter, the present invention will be described in detail based on the accompanying drawings.
第1図は、製造皿1のウエハ形成平面である上
面1aに所望拡径状態の固化したシリコンシート
2が形成されている状態である。 FIG. 1 shows a state in which a solidified silicon sheet 2 with a desired enlarged diameter is formed on the upper surface 1a of the manufacturing tray 1, which is the wafer forming plane.
このようなシリコンシート2を形成するには第
2図のように、坩堝4にシリコン母材を投入し
て、これを溶融用熱源5により加熱融解し、当該
融液を坩堝4の転動によつて漏斗7へ放流し、
こゝで一たん漏斗7に受承されて、さらにその流
出口7′から、図中点線で示すように当該融液を
上面1aの略中心部に滴下する。 To form such a silicon sheet 2, as shown in FIG. Then, discharge into funnel 7,
Once received by the funnel 7, the melt is dropped from the outlet 7' onto the approximate center of the upper surface 1a, as shown by the dotted line in the figure.
そしてこの際ターンテーブル機構8は予め回転
させておくのがよいが、同時回転でも、滴下完了
後融液が固化しないうちに回転を開始させてもよ
く、当該回転による遠心力によつて融液は拡径方
向へ流動する。 At this time, it is preferable to rotate the turntable mechanism 8 in advance, but the rotation may be started simultaneously or after the dropping is completed before the melt solidifies, and the centrifugal force caused by the rotation causes the melt to flows in the direction of diameter expansion.
ここで製造皿1としては、多孔質材でシリコン
との反応性が少ないカーボン(C)等で形成さ
れ、かつ各種寸法の円形、四角形等所望形状のウ
エハ形成平面1aをもつたものが用意され、これ
を任意選択して用いるが、上記の融液供給量が充
分であれば、拡径流動の融液はウエハ形成平面1
aの全面にわたり、その外周縁まで拡径され、余
剰供給の融液は当該外周縁から遠心力により放出
され、この結果上面1aの形状に見合つた融液薄
層が形成され、これを自然放冷か適宜の冷却手段
によつて固化し、第1図に示すように、多結晶シ
リコンウエハが製造皿1の上面1aに形成され
る。 Here, the production plate 1 is made of a porous material such as carbon (C), which has little reactivity with silicon, and has a wafer forming plane 1a of a desired shape such as a circle or a square of various dimensions. , this is optionally used, but if the above-mentioned melt supply amount is sufficient, the diameter-expanding flow melt will flow onto the wafer forming plane 1.
The diameter is expanded over the entire surface of 1a to the outer periphery, and the surplus melt is released from the outer periphery by centrifugal force. As a result, a thin layer of melt that matches the shape of the upper surface 1a is formed, and this is released naturally. It is solidified by cooling or an appropriate cooling means, and a polycrystalline silicon wafer is formed on the upper surface 1a of the production plate 1, as shown in FIG.
尚、上記シリコン母材としては金属級シリコ
ン、半導体級高純度シリコンなどを用いるように
し、同母材は、坩堝4の外周側に配設された電気
ヒータ等による溶融用熱源5によつて、当該シリ
コンの溶融温度1420℃を考慮して加熱することに
より、これを溶融し得るようになつており、当該
熱源5としては図示例のように電熱源であると
か、高周波加熱装置によることができ、もちろん
適時当該加熱を停止したり、加熱条件を制御可能
にしておくことが望ましい。 The silicon base material used is metallic grade silicon, semiconductor grade high purity silicon, etc., and the base material is melted by a heat source 5 for melting such as an electric heater disposed on the outer periphery of the crucible 4. It is possible to melt the silicon by heating it in consideration of the melting temperature of 1420°C, and the heat source 5 can be an electric heat source as shown in the illustrated example or a high-frequency heating device. Of course, it is desirable to be able to stop the heating at appropriate times and to be able to control the heating conditions.
そして上記ターンテーブル機構8は、その回転
軸9が固設されている回収受皿10に、製造皿1
を載置し、同軸9を回転中心として回収受皿10
と製造皿1は同期して回動される。 The turntable mechanism 8 is mounted on a production tray 10 to a collection tray 10 to which the rotating shaft 9 is fixed.
is placed on the collection tray 10 with the coaxial 9 as the center of rotation.
and the production plate 1 are rotated synchronously.
このようにして製造皿1の上面1aに所望拡径
のシリコンシート2が形成された後、該製造皿1
を回収受皿10から取り外し、例えば第3図に示
すような浸漬手段により腐蝕性容液3を同皿1に
付与する。 After the silicone sheet 2 with the desired enlarged diameter is formed on the upper surface 1a of the manufacturing pan 1 in this way, the manufacturing pan 1
is removed from the collecting tray 10, and a corrosive liquid 3 is applied to the tray 1 by, for example, dipping means as shown in FIG.
この場合、もちろん製造皿1の上面1aに形成
されたシリコンシート2自体が腐蝕性溶液3に浸
漬されてしまうことのない状態とすべきである。 In this case, of course, the silicone sheet 2 formed on the upper surface 1a of the production plate 1 should not be immersed in the corrosive solution 3.
上記のシリコンシート2に対する腐蝕性溶液3
としては、特に好適なのは、弗酸と硝酸との混合
水溶液であり、この際は、該腐蝕性溶液3が過度
にシリコンシート2を腐蝕するようなものである
と、シリコンシート2の特性や品質が低下するの
で望ましくなく、従つて、王水の場合は、過度に
シリコンシート2を溶解してしまうので好ましく
ない。 Corrosive solution 3 for the above silicone sheet 2
A particularly suitable aqueous solution of hydrofluoric acid and nitric acid is a mixed aqueous solution of hydrofluoric acid and nitric acid.In this case, if the corrosive solution 3 corrodes the silicone sheet 2 excessively, the characteristics and quality of the silicone sheet 2 may be affected. This is undesirable because it lowers the water content, and therefore, aqua regia is undesirable because it dissolves the silicone sheet 2 excessively.
第3図の実施例では、製造皿1を腐蝕性溶液3
の収納された容器A内に投入するようにしてお
り、これにより製造皿1は多孔質材で形成されて
いることから、腐蝕性溶液3が製造皿1の連続孔
による毛管現象により吸入されて、製造皿1の上
面1aにおける全域から浸出し、シリコンシート
2の製造皿1に対する瘉着面2aを溶解する。 In the embodiment of FIG.
Since the production pan 1 is made of a porous material, the corrosive solution 3 is inhaled by capillary action through the continuous pores of the production pan 1. , it oozes out from the entire area on the upper surface 1a of the production pan 1 and dissolves the surface 2a of the silicone sheet 2 that is attached to the production pan 1.
かくして、所要時間経過すると、シリコンシー
ト2の瘉着面2aが製造皿1の上面1aから上記
溶解により完全に剥離可能となるに至り、作業者
の手動又は機械によりシリコンシート2を持ち上
げ、洗浄を行つた後、製品仕上げを施こすことに
より多結晶シリコンウエハが得られる。 Thus, after the required time has elapsed, the adhesive surface 2a of the silicone sheet 2 can be completely peeled off from the upper surface 1a of the production plate 1 due to the above-mentioned melting, and the worker lifts the silicone sheet 2 manually or by machine and cleans it. After this, a polycrystalline silicon wafer is obtained by applying product finishing.
ここで本発明に係る具体例を示せば、50体積%
の弗酸水溶液と、35体積%の硝酸水溶液を1:5
の容積比で混合して腐蝕性溶液となし、この混合
水溶液に製造皿を約半分位の高さまで浸漬した。 Here, to show a specific example according to the present invention, 50% by volume
1:5 hydrofluoric acid aqueous solution and 35% by volume nitric acid aqueous solution
A corrosive solution was prepared by mixing in a volume ratio of 1, and a production plate was immersed in this mixed aqueous solution to about half its height.
この結果、約15分乃至20分後には、製造皿と瘉
着したシリコンシートを該製造皿から分離させる
ことができ、このように得られたシリコンシート
の剥離面が、支障を来す如き溶解状態とはなつて
いないことを確認した。 As a result, after about 15 to 20 minutes, the silicone sheet adhering to the production plate can be separated from the production plate, and the peeled surface of the silicone sheet obtained in this way can prevent any dissolution that may cause problems. We confirmed that the situation has not changed.
尚、上記剥離に要する時間を短縮しようとする
場合には、弗酸と硝酸との混合比を、例えば2:
5とするなど弗酸の割合を適宜に大きくしてやれ
ばよい。 In addition, when trying to shorten the time required for the above-mentioned peeling, the mixing ratio of hydrofluoric acid and nitric acid should be changed, for example, to 2:
The proportion of hydrofluoric acid may be increased as appropriate, such as 5.
上記の通り本発明によれば、従来のインゴツト
スライス法やリボン法の難点が解消されるのは勿
論、既応キヤステイング法のように鋳型の各面に
よる制限を受けることなく、製造皿に載置された
まま固化され、この固化に際し、瘉着したシリコ
ンシートを、製造皿の連続孔より吸引されて上面
全域から浸出する腐蝕性溶液で全面均一に溶解
し、極めて容易に、しかも破損することなく製造
皿より剥離することができる。 As described above, according to the present invention, the difficulties of the conventional ingot slicing method and ribbon method are of course solved, and the production plate is not limited by the various sides of the mold unlike the existing casting method. The silicone sheet solidifies as it is placed, and during this solidification, the adhered silicone sheet is suctioned through the continuous holes in the production plate and dissolved uniformly over the entire surface by a corrosive solution that oozes out from the entire top surface, making it extremely easy to break. It can be peeled off from the production plate without any problem.
またこの発明によれば、シリコンシートの瘉着
面を確実に溶解できることから、シリコン母材の
溶融温度を上げて瘉着度が大きくなつても容易に
剥離できるので、太陽電池用シリコンウエハ等に
あつて望ましいとされている大結晶粒のシリコン
ウエハを充分な高温条件下にて容易に形成するこ
とができる。 In addition, according to this invention, since the bonded surface of the silicon sheet can be reliably melted, it can be easily peeled off even if the melting temperature of the silicon base material is raised and the degree of bonding increases. Silicon wafers with large crystal grains, which are considered desirable, can be easily formed under sufficiently high temperature conditions.
またさらに、この発明によれば、シリコンシー
トと製造皿との分離作業が極めて容易でありしか
も製造皿は再利用が可能であるため、量産に好適
であり、シリコンウエハのコストを低減すること
ができる。 Furthermore, according to the present invention, it is extremely easy to separate the silicon sheet and the production plate, and the production plate can be reused, making it suitable for mass production and reducing the cost of silicon wafers. can.
図面は、この発明に係る製造方法の一実施例を
示す工程図であつて、第1図はシリコンシートと
製造皿とが瘉着した状態を示す側面説明図、第2
図は、本出願人が先に提案した多結晶シリコンウ
エハの製造方法を実施するために用いられる設備
の一部を切欠した斜視説明図、第3図は製造皿を
腐蝕性溶液に浸漬した状態を示す縦断側面説明
図、第4図はシリコンシートと製造皿とが分離し
た状態を示す同説明図である。
1……製造皿、1a……製造皿の上面(ウエハ
形成平面)、2……シリコンシート、2a……瘉
着面、3……腐蝕性溶液。
The drawings are process diagrams showing one embodiment of the manufacturing method according to the present invention.
The figure is a partially cutaway explanatory perspective view of the equipment used to carry out the method for manufacturing polycrystalline silicon wafers previously proposed by the applicant, and Figure 3 shows a state in which the manufacturing dish is immersed in a corrosive solution. FIG. 4 is an explanatory view showing a state in which the silicone sheet and the production tray are separated. DESCRIPTION OF SYMBOLS 1... Production plate, 1a... Upper surface of production plate (wafer forming plane), 2... Silicon sheet, 2a... Bonding surface, 3... Corrosive solution.
Claims (1)
おけるシリコン母材の融液を、当該回転による遠
心力によつて、拡径方向へ流動させることによ
り、当該融液による所望径の融液薄層を形成し、
これを固化した後、同薄層を製造皿より剥離する
多結晶シリコンウエハの製造方法において、上記
製造皿を多孔質材で形成し、同製造皿上面での融
液薄層固化後に、当該製造皿に腐蝕性溶液を付与
し、製造皿上面へ浸出する同溶液により、固化し
た上記融液薄層の製造皿との瘉着面を溶解して同
薄層を製造皿から剥離するようにしたことを特徴
とする多結晶シリコンウエハの製造方法。 2 腐蝕性溶液は、弗酸と硝酸との混合水溶液で
ある特許請求の範囲第1項記載の多結晶シリコン
ウエハの製造方法。 3 弗酸と硝酸との容積混合比は、50体積%弗酸
1に対し、35体積%硝酸が5である特許請求の範
囲第2項記載の多結晶シリコンウエハの製造方
法。[Claims] 1. In a desired atmosphere, the melt of the silicon base material on the rotating production plate is caused to flow in the direction of diameter expansion due to the centrifugal force caused by the rotation. Forming a thin layer of melt with a desired diameter,
In a method for manufacturing a polycrystalline silicon wafer in which the thin layer is peeled off from a production plate after solidifying the melt, the production plate is formed of a porous material, and after solidifying a thin layer of melt on the upper surface of the production plate, the production plate is A corrosive solution was applied to the plate, and the solution that oozed out onto the top surface of the production plate dissolved the surface of the solidified melt thin layer that was attached to the production plate, so that the thin layer was peeled off from the production plate. A method for manufacturing a polycrystalline silicon wafer, characterized by: 2. The method for manufacturing a polycrystalline silicon wafer according to claim 1, wherein the corrosive solution is a mixed aqueous solution of hydrofluoric acid and nitric acid. 3. The method for manufacturing a polycrystalline silicon wafer according to claim 2, wherein the volume mixing ratio of hydrofluoric acid and nitric acid is 1 part of 50 volume % hydrofluoric acid to 5 parts of 35 volume % nitric acid.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58047724A JPS59174513A (en) | 1983-03-22 | 1983-03-22 | Manufacture of polycrystalline silicon wafer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58047724A JPS59174513A (en) | 1983-03-22 | 1983-03-22 | Manufacture of polycrystalline silicon wafer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59174513A JPS59174513A (en) | 1984-10-03 |
| JPH0313167B2 true JPH0313167B2 (en) | 1991-02-21 |
Family
ID=12783271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58047724A Granted JPS59174513A (en) | 1983-03-22 | 1983-03-22 | Manufacture of polycrystalline silicon wafer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59174513A (en) |
-
1983
- 1983-03-22 JP JP58047724A patent/JPS59174513A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59174513A (en) | 1984-10-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4561486A (en) | Method for fabricating polycrystalline silicon wafer | |
| JP3656821B2 (en) | Polycrystalline silicon sheet manufacturing apparatus and manufacturing method | |
| WO2009104049A1 (en) | Silicon substrate, method and equipment for making the silicon substrate | |
| JP3206540B2 (en) | Laminated crucible for producing silicon ingot and method for producing the same | |
| JPH04342409A (en) | Process and use of silicon wafers for the production of metal wafers | |
| JPH0313167B2 (en) | ||
| US4519764A (en) | Apparatus for fabricating polycrystalline silicon wafer | |
| JPH0142339Y2 (en) | ||
| JPH0314768B2 (en) | ||
| JPH0314765B2 (en) | ||
| JPH0314767B2 (en) | ||
| JPS58162029A (en) | Preparation of polycrystalline silicon wafer | |
| JPS58162035A (en) | Preparation of polycrystalline silicon wafer | |
| JPH038578B2 (en) | ||
| JPS59182216A (en) | Dish for producing polycrystal silicon wafer | |
| JPS59181013A (en) | Manufacture of polycrystalline silicon wafer | |
| JPS58162028A (en) | Preparation of polycrystallne silicon wafer | |
| JPH049370B2 (en) | ||
| JP4562459B2 (en) | Casting apparatus, method for casting polycrystalline silicon ingot using the same, polycrystalline silicon ingot, polycrystalline silicon substrate, and solar cell element | |
| JPH0322907Y2 (en) | ||
| JP4863635B2 (en) | Casting method of polycrystalline silicon ingot | |
| JPH0476926B2 (en) | ||
| JPH0311214Y2 (en) | ||
| JP2001048697A (en) | Melting method of powdery silicon | |
| JPS5886781A (en) | Manufacture of polycrystalline silicon wafer |