JPH0314769B2 - - Google Patents
Info
- Publication number
- JPH0314769B2 JPH0314769B2 JP5659283A JP5659283A JPH0314769B2 JP H0314769 B2 JPH0314769 B2 JP H0314769B2 JP 5659283 A JP5659283 A JP 5659283A JP 5659283 A JP5659283 A JP 5659283A JP H0314769 B2 JPH0314769 B2 JP H0314769B2
- Authority
- JP
- Japan
- Prior art keywords
- dish
- hole
- melt
- wafer
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 235000012431 wafers Nutrition 0.000 claims description 58
- 238000004519 manufacturing process Methods 0.000 claims description 32
- 239000000155 melt Substances 0.000 claims description 22
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 16
- 229910052710 silicon Inorganic materials 0.000 claims description 16
- 239000010703 silicon Substances 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 11
- 238000000465 moulding Methods 0.000 claims description 11
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 description 24
- 238000005266 casting Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 238000002844 melting Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005485 electric heating Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Silicon Compounds (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
本発明は太陽電池その他の光電変換素子等に用
いられている重積式製造皿に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a stacked manufacturing tray used for solar cells and other photoelectric conversion elements.
従来から多結晶シリコンウエハは各種の方法に
よつて製造されており、最も一般的にはシリコン
母材により一たん所定形状のインゴツトを鋳造
し、これをスライスすることによつてウエハを得
るようにしているが、これではスライス作業に大
変な時間をかけなければならないだけでなく、イ
ンゴツトの約50%がスライス時のロスとなつてし
まうため、製品がコスト高につき大量生産も不可
能である。 Conventionally, polycrystalline silicon wafers have been manufactured by various methods, and the most common method is to cast an ingot in a predetermined shape from a silicon base material and then obtain the wafer by slicing the ingot. However, not only does the slicing process take a lot of time, but about 50% of the ingot is lost during slicing, making the product expensive and impossible to mass produce.
そこでスライスによらない方法としてリボン法
とキヤステイング法(鋳造法)が既に実施されて
いるが、リボン法は例えば回転ドラムの周面に溶
融シリコンを噴当させ、当該周面にリボン状のウ
エハを形成するものであり、同法によるときは実
際上リボン幅が数mm程度のものしか製造すること
ができず、大形の太陽電池素材等が得られない難
点がある。 Therefore, the ribbon method and casting method (casting method) have already been implemented as methods that do not involve slicing, but in the ribbon method, for example, molten silicon is sprayed onto the peripheral surface of a rotating drum, and a ribbon-shaped wafer is placed on the peripheral surface of the drum. When using this method, it is actually possible to manufacture ribbons with a width of only a few mm, which has the disadvantage that large-sized solar cell materials cannot be obtained.
また上記キヤステイング法と呼ばれているもの
は、シリコン母材を加熱して融液となし、これを
製品ウエハの寸法に応じた鋳型に流し込み、さら
に当該型の可動部分により融液を押圧成型して固
化させるものであるが、同法によるときは、一度
に所定形状のウエハが得られ、量産性の点で望ま
しい結果が期待できるものゝ、上記のように融液
は四方から押えつけられることになる。 In addition, in the above-mentioned casting method, the silicon base material is heated to form a melt, which is poured into a mold according to the dimensions of the product wafer, and then the melt is pressed and molded by the movable parts of the mold. However, when this method is used, wafers of a predetermined shape can be obtained at once, and desirable results can be expected in terms of mass production.As mentioned above, the melt is pressed down from all sides. It turns out.
このため同法では鋳型の上下面と側面が上記融
液の固化に際し、シリコン結晶粒(グレイン)の
成長を抑制してしまうことゝなり、固化製品の前
記各面と接する部分近傍が、非常に細かい結晶粒
となつて大きな結晶粒が得られず、太陽電池用シ
リコンウエハ等にあつて望ましいとされている大
結晶粒生成の要請を満足させることができないた
め、当該ウエハによつて得られた太陽電池の光電
変換効率も2〜3%と極度に悪くなつてしまう欠
陥をもつている。 For this reason, in this method, the upper and lower surfaces and side surfaces of the mold suppress the growth of silicon crystal grains (grains) when the melt solidifies, and the areas near the parts of the solidified product that contact the above-mentioned surfaces are extremely The crystal grains become fine and large crystal grains cannot be obtained, and the requirement for large crystal grain generation, which is considered desirable for silicon wafers for solar cells, etc., cannot be satisfied. The photovoltaic conversion efficiency of solar cells is also extremely poor at 2 to 3%.
そこで、本願人は、上記諸法の欠陥を大幅に改
善することができる多結晶シリコンウエハの製造
方法として既に、シリコン母材を溶融し、この融
液を石英又はカーボンで形成され、かつ回転状態
にある製造皿上に滴下するなどし、遠心力を有効
利用することにより所望拡径状態の融液薄層を形
成し、同層の固化後、このシリコンシートを製造
皿から剥離する方法(以下、スピン法という。)
を提案した。 Therefore, the applicant has already developed a method for manufacturing polycrystalline silicon wafers that can significantly improve the defects of the above methods by melting a silicon base material, and using this melt to form a polycrystalline silicon wafer made of quartz or carbon and in a rotating state. A method of forming a thin layer of melt with a desired diameter expansion state by effectively utilizing centrifugal force, and then peeling off this silicone sheet from the production plate after solidifying the same layer (hereinafter referred to as a method) , called the spin method).
proposed.
このスピン法は、多くの優れた特徴をもつてい
るが、前記一回の製造工程で製造されるウエハの
枚数に限度があり、この結果回転設備の稼動効率
が悪いので製品もコスト高になるという問題を有
していた。 Although this spin method has many excellent features, there is a limit to the number of wafers that can be manufactured in one manufacturing process, and as a result, the operating efficiency of the rotating equipment is poor, resulting in high product costs. There was a problem.
すなわち、現用のスピン法に関しても、本願人
は第1図に示すように、一枚の製造皿1を用意
し、同皿1の上面には、平面十字状のウエハ形成
凹溝2を形成し、その底面をウエハ形成平面3と
なし、同凹溝2の端末側には、四角形状のウエハ
形成部4を4個形成するようにし、さらに第3図
の如く中央部に通孔6が開設されてなる蓋体5を
上記製造皿1第4図の通り被嵌し、この蓋体5と
製造皿1とにより囲繞されるウエハ成形空間に、
上記通孔6から前記融液を注入充填することによ
り、融液薄層7を形成することを提案している。
しかしこれでも一回の製造工程では、1枚の製品
だけではないものの、上記の如く4枚程度のシリ
コンウエハしか得られず、量産という点から満足
すべきものとなつていない。 That is, regarding the currently used spin method, as shown in FIG. The bottom surface of the groove 2 is used as a wafer forming plane 3, and four rectangular wafer forming parts 4 are formed on the terminal side of the groove 2, and a through hole 6 is provided in the center as shown in FIG. The resulting lid 5 is fitted over the manufacturing tray 1 as shown in FIG. 4, and the wafer molding space surrounded by the lid 5 and the manufacturing tray 1 is
It is proposed that the melt thin layer 7 be formed by injecting and filling the melt through the through hole 6.
However, even with this method, only about four silicon wafers, not just one product, can be obtained in one manufacturing process, as described above, which is not satisfactory from the point of view of mass production.
この発明は、かかる現状に鑑み創案されたもの
で、その目的とするところは、適切なる重装構成
とすることにより、一度の製造工程で多数のシリ
コンウエハを形成できるようにし、以つて製造設
備の稼動効率を大幅に向上でき、その結果、同ウ
エハのコストダウンを実現できる重積式製造皿を
提供しようとするものである。 This invention was devised in view of the current situation, and its purpose is to make it possible to form a large number of silicon wafers in one manufacturing process by using an appropriate heavy-duty structure, and thereby to improve manufacturing equipment. The present invention aims to provide a stacked manufacturing tray that can significantly improve the operating efficiency of wafers and, as a result, reduce the cost of wafers.
この目的を達成するため、この発明にあつて
は、所望雰囲気内にあつて、回転するウエハ形成
平面上にシリコン母材の融液を供給し、当該回転
による遠心力によつて、拡径方向へ流動させるこ
とにより、当該融液による所望大の融液薄層を形
成し、これを固化するようにした多結晶シリコン
ウエハの製造用に供される製造皿であつて、二層
以上重積の皿本体と最上位に重積される蓋体とで
構成され、同各皿本体の上面には凹溝を形成し
て、その底面を前記ウエハ形成平面とし、かつ同
皿本体のうち上積用の皿本体には、その略中央部
に貫通孔を蓋体には、その略中央部に流入通孔を
夫々連通状態となるよう開設し、同蓋体と各皿体
とで所要層数だけ形成されたウエハ成形空間をそ
の上位における上記貫通孔、流入通口に夫々開口
させるよう構成し前記融液薄層を所要数同時に形
成するようにしたものである。 In order to achieve this object, in the present invention, a melt of a silicon base material is supplied onto a rotating wafer forming plane in a desired atmosphere, and the centrifugal force generated by the rotation is applied in the direction of diameter expansion. A manufacturing dish used for manufacturing polycrystalline silicon wafers, in which a thin layer of melt of a desired size is formed by the melt and solidified by flowing the melt into It consists of a dish body and a lid stacked on top, and a concave groove is formed on the top surface of each dish body, the bottom surface of which serves as the wafer forming plane, and the uppermost part of the dish body The main body of the dish is provided with a through hole approximately in the center thereof, and the lid body is provided with an inflow hole approximately in the center thereof so as to communicate with each other, and the required number of layers is formed between the lid body and each plate body. The wafer molding space formed in the wafer molding space is opened to the through hole and the inlet port above the wafer molding space, respectively, so that a required number of the melt thin layers can be simultaneously formed.
以下、添付図面に示す実施例にもとづき、この
発明を詳細に説明すれば、第5図に示すように、
三層に重積されてなる皿本体10,20,30と
最上段に載置される蓋体Bとにより本発明による
製造皿Aは構成され、これらの部材は、シリコン
との反応性が少ない石英(SiO2)かカーボンC
等で形成されている。 Hereinafter, the present invention will be described in detail based on the embodiments shown in the accompanying drawings. As shown in FIG.
The manufacturing dish A according to the present invention is constituted by the dish bodies 10, 20, and 30 stacked in three layers and the lid body B placed on the top layer, and these members have little reactivity with silicon. Quartz (SiO 2 ) or carbon C
It is formed by etc.
最上位に配置される皿本体10は、第6図と第
7図とにより明示されるように、その上面16に
平面十字状の凹溝11を形成し、その底面をウエ
ハ形成平面12とし、かつ同溝11の端末側に、
図示の実施例では四角形状のウエハ形成部13が
4個形成されている。そして、これら各ウエハ形
成部13を連通している連結部14は、同形成部
13よりも細幅に形成され、両部13,14の連
続部位には、括れ部15が形成されており、前記
第1図のものと同等である。 As clearly shown in FIGS. 6 and 7, the dish main body 10 placed at the top has a cross-shaped groove 11 formed on its top surface 16, and its bottom surface is a wafer forming plane 12. And on the terminal side of the same groove 11,
In the illustrated embodiment, four rectangular wafer forming portions 13 are formed. The connecting portion 14 connecting each of these wafer forming portions 13 is formed narrower than the forming portion 13, and a constricted portion 15 is formed at a continuous portion of both portions 13 and 14. It is equivalent to that shown in FIG. 1 above.
この皿本体10の上面16に積層される第2層
目の皿本体20も第1層目の皿本体10と同じく
第8図と第9図の通りその上面26に平面十字状
の凹溝21を形成し、その底面をウエハ形成平面
22とし、かつ同溝21の端末側に、四角形状の
ウエハ形成部23が4個形成され、各ウエハ形成
部23を連通している連結部24は、同形成部2
3よりも細幅に形成され、両部23,24の連続
部位には、括れ部25が形成されている。 As shown in FIGS. 8 and 9, the second layer of the dish body 20 stacked on the top surface 16 of the dish body 10 also has a cross-shaped concave groove 21 in its top surface 26, as shown in FIGS. 8 and 9. , whose bottom surface is a wafer forming plane 22 , and four rectangular wafer forming parts 23 are formed on the terminal side of the groove 21 , and a connecting part 24 connecting each wafer forming part 23 is as follows: Same formation part 2
3, and a constricted portion 25 is formed at a continuous portion of both portions 23 and 24.
しかし当該皿本体20にあつては、その略中央
部において上下に貫通する貫通孔27が開設され
ており、かつ同貫通孔27の上端部周縁には堰部
28が膨出形成され、凹溝21内に注入された融
液が同貫通孔27から流下してしまわないよう前
記上面26と同一高さに形成されている。またさ
らに、同皿20の底面29は、前記皿本体10の
上面16と密着するよう平滑に形成されている。 However, in the case of the dish main body 20, a through hole 27 that penetrates vertically is opened in the approximate center thereof, and a weir portion 28 is formed to bulge at the upper end periphery of the through hole 27, and a concave groove is formed. It is formed at the same height as the upper surface 26 to prevent the melt injected into the through hole 27 from flowing down. Furthermore, the bottom surface 29 of the dish 20 is formed to be smooth so as to be in close contact with the top surface 16 of the dish body 10.
この皿本体20の上面26に積層される第3層
目の皿本体30もまた、第1層目、第2層目の皿
本体10,20と同様、第10図と第11図に示
すように、その上面36に平面十字状の凹溝31
を形成し、その底面をウエハ形成平面32とし、
かつ同溝31の端末側に、四角形状のウエハ形成
部33が4個形成され、そして、これら各ウエハ
形成部33を連通している連結部34は、同形成
部33よりも細幅に形成され、両部33,34の
連続部位には、括れ部35が形成されている。そ
して同皿30の略中央部には、前記皿本体20と
同じく同皿30を上下に貫通する貫通孔37が開
設されているが、同貫通孔37は、前記堰部28
の外周径よりも大口径に形成されており、また同
貫通孔37の上端部周縁には、前記皿本体20と
同じく堰部38が膨出形成されて、凹溝31内に
注入された融液が、同貫通孔37から流出しない
よう前記上面36と同一高さに形成されていると
共に、同皿30の底面39は、前記皿本体20の
上面26と密着するよう平滑になつている。 The third layer of the plate body 30 stacked on the upper surface 26 of the plate body 20 is also similar to the first and second layer plate bodies 10 and 20, as shown in FIGS. 10 and 11. A concave groove 31 in the shape of a plane cross is formed on the upper surface 36.
, with its bottom surface serving as a wafer forming plane 32,
In addition, four rectangular wafer forming portions 33 are formed on the terminal side of the groove 31, and a connecting portion 34 connecting each of these wafer forming portions 33 is formed narrower than the forming portion 33. A constricted portion 35 is formed at a continuous portion of both portions 33 and 34. A through hole 37 that vertically passes through the plate 30 like the plate main body 20 is formed in the approximate center of the plate 30.
The diameter of the through hole 37 is larger than the outer circumferential diameter of the through hole 37, and a bulge 38 is formed on the upper edge of the through hole 37 in the same manner as the dish body 20, so that the melt injected into the groove 31 can be removed. The tray 30 is formed at the same height as the top surface 36 so that the liquid does not flow out from the through hole 37, and the bottom surface 39 of the tray 30 is smooth so as to come into close contact with the top surface 26 of the tray body 20.
蓋体Bは、各皿本体10,20,30と略同外
形に形成され、第12図と第13図とに示すよう
に、その略中央部には上下に貫通する流入通孔4
1が最上位である皿本体30に形成された堰部3
8の外周径よりも大口径に形成され、また、この
蓋体Bの底面40は、上記皿本体30の上面36
と密着するよう平滑に形成されている。 The lid body B is formed to have approximately the same external shape as each of the dish bodies 10, 20, and 30, and as shown in FIGS. 12 and 13, the lid body B has an inlet passage hole 4 that penetrates vertically in the approximately central portion thereof.
Weir part 3 formed in dish main body 30 where 1 is the top
The bottom surface 40 of the lid body B is formed to have a larger diameter than the outer circumferential diameter of the tray body 30.
It is formed smoothly so that it comes into close contact with the
このように構成された各皿本体10,20,3
0と蓋体Bとを組構して重積式製造皿Aを形成す
るには、第5図に示すように、先ず皿本体10を
図示しないターンテーブル上に載置し、字に同皿
本体10の上面16に第2層目たる皿本体20を
重積載置し、さらに同皿本体20の上面26に第
3層目たる皿本体30を重積載置し、最後に同皿
本体30の上面に蓋体Bを重積載置すればよく、
この場合、上記皿本体20の貫通孔27と皿本体
30の貫通孔37および、蓋体Bの流入通孔41
は同心となるように配設される。それ故、上記組
構状態では、皿本体10の凹溝11と皿本体20
の底面29とにより画成される第1段目のウエハ
成形空間Sが形成されるとともに、同皿本体20
の凹溝21と皿本体30の底面39とにより画成
される第2段目のウエハ成形空間S′が形成され、
さらに、同皿本体30の凹溝31と蓋体Bの底面
40とにより画成される第3段目のウエハ成形空
間S″が形成されると共に、この場合、第1段目
のウエハ成形空間Sは皿本体20の貫通孔27と
連通し、同孔27と第2段目のウエハ成形空間
S′とは皿本体30の貫通孔37と連通し、かつ同
孔37と第3段目のウエハ成形空間S″とは、蓋
体Cの通孔41と連通するように構成される。 Each plate main body 10, 20, 3 configured in this way
0 and the lid body B to form the stacked manufacturing tray A, as shown in FIG. The second layer of plate bodies 20 is stacked on the top surface 16 of the main body 10, and then the third layer of plate bodies 30 is stacked on the top surface 26 of the plate body 20, and finally the plate bodies 30 are stacked on top of each other. It is sufficient to stack the lid B on the top surface,
In this case, the through hole 27 of the dish main body 20, the through hole 37 of the dish main body 30, and the inflow hole 41 of the lid B
are arranged concentrically. Therefore, in the above assembled state, the concave groove 11 of the dish body 10 and the dish body 20
A first stage wafer molding space S defined by the bottom surface 29 of the plate body 20 is formed.
A second stage wafer molding space S' defined by the concave groove 21 and the bottom surface 39 of the dish main body 30 is formed,
Furthermore, a third stage wafer molding space S'' defined by the groove 31 of the dish body 30 and the bottom surface 40 of the lid body B is formed, and in this case, a first stage wafer molding space S'' is formed. S communicates with the through hole 27 of the dish main body 20, and the hole 27 and the second stage wafer forming space
S' is configured to communicate with the through hole 37 of the dish body 30, and the hole 37 and the third stage wafer forming space S'' are configured to communicate with the through hole 41 of the lid C.
次に、第14図によつて上記実施例に係る製造
皿Aによる同ウエハの製造工程を説明すると、先
ず、図示しないターンテーブルを回転させて、こ
れに載置した同皿Aを所要速度で回転させつつ、
蓋体Bの流入通孔41よりシリコン母材融液を注
入すればよいが、この際図示例では坩堝50にシ
リコン母材を投入して、これを溶融用熱源(図示
せず)により加熱融解し、当該融液を坩堝50の
転動によつて漏斗51へ放流し、さらにその流出
口52から、図中点線で示すように当該融液を上
記通孔41の偏心位置から滴下するのがよい。 Next, the process of manufacturing the same wafer using the manufacturing plate A according to the above embodiment will be explained with reference to FIG. While rotating,
The silicon base material melt may be injected through the inflow hole 41 of the lid B, but at this time, in the illustrated example, the silicon base material is put into the crucible 50 and is heated and melted by a melting heat source (not shown). Then, the melt is discharged into the funnel 51 by the rolling of the crucible 50, and further, the melt is dripped from the eccentric position of the through hole 41 from the outlet 52 as shown by the dotted line in the figure. good.
こうして流入通口41から融液が供給されゝ
ば、各ウエハ成形空間S,S′,S″に融液が注入さ
れることゝなり、該融液は、回転する製造皿Aの
遠心力によつて各連結部14,24,34から各
ウエハ形成部13,23,33、へと各ウエハ形
成平面12,22,32上を拡径流動して、すべ
ての同形成部13,23,33、が融液により充
填された融液薄層Dが形成されこの後、これを冷
却し固化させることによつて、各皿本体10,2
0,30に4枚づつ、計12枚のウエハを同時に形
成することができる。尚、このウエハは、ウエハ
形成部13,23,33と連結部14,24,3
4との境界に設けた括れ部15,25,35に対
応する箇所を利用して折ることにより、四角形の
製品ウエハに分割される。 If the melt is supplied from the inflow port 41 in this way, the melt will be injected into each wafer forming space S, S', S'', and the melt will be affected by the centrifugal force of the rotating production plate A. Therefore, the diameter expands and flows on each wafer forming plane 12, 22, 32 from each connecting part 14, 24, 34 to each wafer forming part 13, 23, 33, and all the same forming parts 13, 23, 33 A thin melt layer D filled with the melt is formed, and by cooling and solidifying this, each dish body 10, 2 is formed.
A total of 12 wafers, 4 wafers at 0 and 30, can be formed simultaneously. Note that this wafer has wafer forming parts 13, 23, 33 and connecting parts 14, 24, 3.
By folding the wafer at locations corresponding to the constricted portions 15, 25, and 35 provided at the boundary with the wafer 4, the product wafer is divided into rectangular product wafers.
また上記シリコン母材としては金属級シリコ
ン、半導体級高純度シリコンなどを用いるように
し、同母材は坩堝50の外周側に配設された電気
ヒータ等による溶融用熱源によつて、当該シリコ
ンの溶融温度1420℃を考慮して加熱することによ
り、これを溶融し得るようにしてあり、当該熱源
としては、電熱線、高周波加熱装置などによるこ
とができ、もちろん適時当該加熱を停止したり、
加熱条件を制御可能にしておくことが望ましい。 The silicon base material is made of metal grade silicon, semiconductor grade high purity silicon, etc. It is possible to melt this by heating with the melting temperature of 1420°C in mind, and the heat source can be an electric heating wire, a high frequency heating device, etc. Of course, the heating can be stopped at an appropriate time,
It is desirable to be able to control the heating conditions.
このようにして得られた製品ウエハは、その表
裏面及びその外周面が、各皿本体10,20,3
0の凹溝11,21,31と各皿本体20,30
及び蓋体Bの底面29,39、40とで囲繞され
ているので、一般に同薄層Dが冷却固化する際、
その自由表面に小突起による凹凸が発生するが、
これが上記各底面29,39,40により抑制さ
れてしまうので、平滑な面を有するウエハが形成
できる。また、前記ウエハ形成部13,23,3
3以外で形成される融液薄層Dの残余部分は製造
皿Aから剥離された後、再度溶融して使用され
る。 The product wafer obtained in this way has its front and back surfaces and its outer peripheral surface
0 grooves 11, 21, 31 and each plate body 20, 30
and the bottom surfaces 29, 39, and 40 of the lid body B, so generally when the same thin layer D cools and solidifies,
Although irregularities occur on the free surface due to small protrusions,
Since this is suppressed by the bottom surfaces 29, 39, and 40, a wafer having a smooth surface can be formed. Further, the wafer forming portions 13, 23, 3
The remaining portion of the thin melt layer D formed by materials other than 3 is peeled off from the production plate A, and then melted again and used.
尚、上記実施例では、製造皿Aを三層構造とし
た場合を例にとり説明したが、もちろんこの発明
にあつてはこれに限定されず、二層以上で構成す
ればよい。 In the above-mentioned embodiments, the production plate A has been described as having a three-layer structure, but the present invention is of course not limited to this, and may be formed of two or more layers.
上記のとおり、この発明によれば、従来のイン
ゴツトスライス法やリボン法の難点が解消される
のは勿論、既応キヤステイング法のように鋳型の
各面により押えつけられることがなく、しかも一
度の製造工程で複数の製品を製造できるので、設
備の稼動効率が大幅に向上し、製品のコストダウ
ンを実現することができる。 As mentioned above, according to the present invention, the problems of the conventional ingot slicing method and ribbon method are of course solved, and the material is not pressed down by the sides of the mold unlike the existing casting method. Since multiple products can be manufactured in a single manufacturing process, equipment operating efficiency can be greatly improved and product costs can be reduced.
第1図は、本願人が既に提案した製造皿の平面
説明図、第2図は同皿の縦断説明図、第3図は同
皿に被嵌される蓋体の平面図、第4図は同蓋体と
同皿とを組構した状態を示す縦断説明図、第5図
はこの発明に係る重積式製造皿を示す縦断説明
図、第6図は同皿の第1層目に係る皿本体の平面
説明図、第7図は同皿の縦断説明図、第8図は同
第2層目に係る皿本体の平面説明図、第9図は同
皿の縦断説明図、第10図は同第3層目に係る皿
本体の平面説明図、第11図は同皿の縦断説明
図、第12図は蓋体の平面説明図、第13図は同
蓋体の縦断説明図、第14図は各皿本体に形成さ
れたウエハ成形空間に融液を注入している状態を
示す縦断説明図、第15図は第14図XV円内拡
大縦断説明図である。
A……重積式製造皿、B……蓋体、D……融液
薄層、S,S′,S″……ウエハ成形空間、10,2
0,30……皿本体、11,21,31……凹
溝、27,37……貫通孔、41……流入通孔。
Fig. 1 is an explanatory plan view of a manufacturing tray already proposed by the applicant, Fig. 2 is an explanatory longitudinal cross-sectional view of the same plate, Fig. 3 is a plan view of a lid fitted onto the plate, and Fig. 4 is an explanatory plan view of the manufacturing plate already proposed by the applicant. FIG. 5 is a vertical cross-sectional view showing the assembled state of the lid and the plate, FIG. 5 is a vertical cross-sectional view showing the stacked production plate according to the present invention, and FIG. FIG. 7 is an explanatory plan view of the dish body, FIG. 8 is an explanatory plan view of the dish body related to the second layer, FIG. 9 is an explanatory longitudinal view of the dish, and FIG. 11 is an explanatory plan view of the dish body related to the third layer, FIG. 11 is an explanatory longitudinal view of the dish, FIG. FIG. 14 is a longitudinal sectional view showing a state in which melt is being injected into the wafer molding space formed in each dish body, and FIG. 15 is an enlarged vertical sectional view within the circle of FIG. 14. A... stacking type production plate, B... lid, D... melt thin layer, S, S', S''... wafer molding space, 10, 2
0, 30... Dish body, 11, 21, 31... Concave groove, 27, 37... Through hole, 41... Inflow hole.
Claims (1)
平面上にシリコン母材の融液を供給し、当該回転
による遠心力によつて、拡径方向へ流動させるこ
とにより、当該融液による所望大の融液薄層を形
成し、これを固化するようにした多結晶シリコン
ウエハの製造用に供される製造皿であつて、二層
以上重積の皿本体と最上位に重積される蓋体とで
構成され、同各皿本体の上面には凹溝を形成し
て、その底面を前記ウエハ形成平面とし、かつ同
皿本体のうち上積用の皿本体には、その略中央部
に貫通孔を蓋体には、その略中央部に流入通孔を
夫々連通状態となるよう開設し同蓋体と各皿本体
とで所要層数だけ形成されたウエハ成形空間を、
その上位における上記貫通孔、流入通口に夫々開
口させるようにしたことを特徴とする重積式製造
皿。 2 蓋体の流入通孔は、皿本体の貫通孔と同心で
大口径に形成され、かつ複数の貫通孔を具備する
際には、上位の皿本体に向け貫通孔が大口径とな
るよう形成されている特許請求の範囲第1項記載
の重積式製造皿。 3 貫通孔の上端周縁部は、皿本体の上面と同一
高さである特許請求の範囲第1項又は第2項いず
れか記載の重積式製造皿。[Claims] 1. In a desired atmosphere, a melt of silicon base material is supplied onto a rotating wafer forming plane, and the centrifugal force generated by the rotation causes the melt to flow in the direction of diameter expansion. This is a manufacturing pan used for manufacturing polycrystalline silicon wafers, in which a thin layer of melt of a desired size is formed by the melt, and this is solidified. A concave groove is formed on the upper surface of each of the dish bodies, and the bottom surface thereof serves as the wafer forming plane, and the dish body for stacking among the dish bodies is A through hole is provided in the approximately central portion of the lid body, and an inlet passage hole is provided approximately in the central portion of the lid body so as to communicate with each other, and a wafer molding space formed by the required number of layers is formed between the lid body and each dish body. ,
A stacked production plate characterized in that the above-mentioned through hole and inflow port are respectively opened in the upper part of the plate. 2. The inflow hole in the lid body is formed to have a large diameter and is concentric with the through hole in the dish body, and when having multiple through holes, the through hole should be formed so that it has a large diameter toward the upper dish body. 1. A stackable manufacturing pan according to claim 1. 3. The stacked manufacturing dish according to claim 1 or 2, wherein the upper end peripheral edge of the through hole is at the same height as the upper surface of the dish main body.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5659283A JPS59182219A (en) | 1983-03-31 | 1983-03-31 | Stacked dish for preparation of wafer |
| AU26132/84A AU578240B2 (en) | 1983-03-30 | 1984-03-27 | Polycrystalline silicon wafers and fabrication tray |
| EP84302211A EP0124284B1 (en) | 1983-03-30 | 1984-03-30 | Method of fabricating polycrystalline silicon wafer and fabrication tray used therefor |
| DE8484302211T DE3466901D1 (en) | 1983-03-30 | 1984-03-30 | Method of fabricating polycrystalline silicon wafer and fabrication tray used therefor |
| US06/926,131 US4820145A (en) | 1983-03-30 | 1986-11-03 | Polycrystalline silicon wafer tray |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5659283A JPS59182219A (en) | 1983-03-31 | 1983-03-31 | Stacked dish for preparation of wafer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59182219A JPS59182219A (en) | 1984-10-17 |
| JPH0314769B2 true JPH0314769B2 (en) | 1991-02-27 |
Family
ID=13031462
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5659283A Granted JPS59182219A (en) | 1983-03-30 | 1983-03-31 | Stacked dish for preparation of wafer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59182219A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61214422A (en) * | 1985-03-20 | 1986-09-24 | Hoxan Corp | Forming method for polycrystalline silicon layer on semiconductor wafer |
-
1983
- 1983-03-31 JP JP5659283A patent/JPS59182219A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59182219A (en) | 1984-10-17 |
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