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JPH035564B2 - - Google Patents
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JPH035564B2 - - Google Patents

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Publication number
JPH035564B2
JPH035564B2 JP3225281A JP3225281A JPH035564B2 JP H035564 B2 JPH035564 B2 JP H035564B2 JP 3225281 A JP3225281 A JP 3225281A JP 3225281 A JP3225281 A JP 3225281A JP H035564 B2 JPH035564 B2 JP H035564B2
Authority
JP
Japan
Prior art keywords
thin film
insulating thin
mask
film
liquid crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3225281A
Other languages
Japanese (ja)
Other versions
JPS57147616A (en
Inventor
Akira Sawada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Watch Co Ltd
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Priority to JP3225281A priority Critical patent/JPS57147616A/en
Publication of JPS57147616A publication Critical patent/JPS57147616A/en
Publication of JPH035564B2 publication Critical patent/JPH035564B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133345Insulating layers

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Liquid Crystal (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

本発明は液晶セル用基板の作成方法に係わり、
特に絶縁性薄膜形成工程の合理化された液晶セル
用基板の作成方法に関する。液晶がその電気光学
効果を利用することによつて表示デバイスとなし
得ることはよく知られており、通常は第1図のよ
うな基本構成の液晶セルが用いられる。即ち液晶
セルは、互いに約10μmの間隙を保ち、ほぼ半行
に配置された一対のガラス基板1,1′とその間
に充填された液晶層4と、液晶の流出を防止し、
かつ液晶層4の厚みを一定に保持するために液晶
層4の周囲に設けられた封止部3とからなつてい
る。そしてガラス基板1,1′の液晶層4に接す
る表面上には、液晶層4に電気的信号を加えるた
めの透明導電膜2,2′が表示したいパターンに
応じて設けられており、それは封止部3の外側ま
で延在してリード端子部を形成している。しか
し、種々の理由により、透明導電膜2,2′と液
晶層4とが直接接触する構造では実用的液晶セル
とはなり難い。一つは電圧印加時に透明導電膜表
面で好ましくない電気化学反応が起り、液晶セル
の劣化を早める。もう一つはTN型液晶など多く
の場合、界面力によつて液晶セル内の液晶の配列
状態を制御する必要があり、ラビング、斜め蒸着
等の表面処理を行なわなければならない。しか
し、ガラス基板面及び透明導電膜面が混在する第
1図の様な表面では、表面の凹凸、あるいは材質
の違いのため均一な表面処理が難しく、液晶セル
の外観不良を招く。(これを配向不良という。)こ
れらの難点を解決するため、実用的な液晶セルは
第2図a,bに示される構造をとつている。即
ち、ガラス基板1,1′の透明導電膜2,2′のあ
る面上を絶縁性薄膜6,6′で被覆して用いてい
る。ここで用いられる絶縁性薄膜6,6′として
は、酸化ケイ素、酸化チタン、酸化セリウムなど
の酸化物及びフツ化マグネシウムなどのフツ化物
を含む無機絶縁膜があり、一般的には酸化ケイ素
が用いられている。この絶縁性薄膜6,6′は基
板全面にではなく、液晶層4と接触する部分にだ
け形成されるのが望ましく、透明導電膜2,2′
間の内部接続部5及び外部端子部2a,2a′には
絶縁性薄膜6,6′が付着していては不都合であ
り、また、封止部3の強度を高めるためには封止
部3に相当する部分も絶縁性薄膜6,6′が付い
ていない方が好ましい。しかしながら現実的には
液晶層4と接触する部分にだけ絶縁性薄膜6,
6′を形成することは難しく、往々にして液晶セ
ル内の封止部3近辺に絶縁性薄膜6,6′の未形
成部が生じ、そこに配向不良が見られることがあ
る。 本発明ではこれらを防止し、かつ確かな封止部
3の強度を得るために、第3図の様に絶縁性薄膜
6′が封止部3の巾の1/3〜1/2の領域まで喰い込
んで形成される様に考慮してある。実際に絶縁性
薄膜を形成する場合、あらかじめ絶縁性薄膜を付
けたくない部分をマスクし、残りの部分に絶縁性
薄膜を形成する方法が工程も他の方法に比較して
短かく一般的に用いられているが、絶縁性薄膜が
マスクの上にも形成されることになるので、これ
をいかに除去するか、またマスクと絶縁性薄膜と
の化学的反応を起さない様に考えてマスクの材料
を選定することが必要である。 この様な考えに基づいて従来いくつかの方法が
試みられている。その一つはマスクとして半田な
どの低融点合金を用いる方法である。マスクの形
成法としては真空蒸着あるいはペースト状のハン
ダをスクリーン印刷することで行なわれている
が、スクリーン印刷は絶縁性薄膜と化学的に安定
化を計るためにはペースト状から加熱により安定
したハンダにすることが必要であり、通常200〜
300℃で処理されるが、この時基板がガラスであ
る為に、ハンダはガラス基板上で球状化してしま
い、マスクとしての用をなさなくなつてしまう。
又、前者の真空蒸着法による場合、化学的には安
定で、この上に絶縁性薄膜を形成することが出来
るが、このハンダのマスクを除去する時は電気炉
中で、250℃ほどに加熱して行なわれるが、ハン
ダはスタリーン印刷の場合と同様、球状化しよう
と作用する。この時、ハンダのマスクの上には絶
縁性薄膜があるので実際には球状化しないが、こ
の薄膜が多孔質なものであるので、この孔に向つ
て球状化しようと集束する。そして、マスクの材
料であるハンダは、この孔を通して外部に蒸発し
て最終的には無くなる。この為、ハンダのマスク
を除去するのに2〜3時間もかかり、また、ハン
ダから発生する有毒ガスの処理もたいへんであ
る。さらに重大な欠点は、ハンダのマスクがなく
なつたガラス基板上には、その上に形成されてい
る絶縁性薄膜がハンダの蒸発とともに垂れ下が
り、ついにはガラス基板と密着してしまう。この
あとで、絶縁性薄膜を500℃で焼成する時には完
全にガラス基板と接着してしまい、そのあとで除
去しようとしてもほとんど除去出来なくなつてお
り、マスクの材料としては不適当である。その他
の方法としては解重合性の高分子を用いる方法が
ある。これはスクリーン印刷などによりマスク形
成を行なうが、この方法も安全なものではなく、
絶縁性薄膜を形成したあとマスク上の絶縁性薄膜
が全ては除去できず、機械的な剥離処理が必要と
なる。また、この高分子のマスクは溶剤にトルエ
ンを使用しているので揮撥然が強く、スクリーン
印刷の作業時間が短かく、すぐ目づまりを生じ、
実用上使用に耐えない。この様に従来知られてい
る方法ではマスク上の絶縁性薄膜が除去しきれな
いとか、除去出来るにしても機械的な除去方法を
必要とし、工程数が増えたり、除去のための作業
時間が増すために実際にはあまり行なわれていな
い。従来例でもそうであるし、一般的にも考えら
れていることであるが、高分子によるマスク形成
の場合、前記のような問題点の生じるのは下記の
理由による。その膜厚は酸化ケイ素などの絶縁性
薄膜の膜厚(普通、800〜2000Åが最適値であ
る。)と同程度の薄いマスク厚とし、第7図に示
す様な高分子のマスクを剥離したあとの状態で突
起の高さBを出来るだけ小さく、理想としては絶
縁性薄膜の膜厚Aと同じになる様にしたいと考え
ているので、一般にマスクの膜厚は4000Å〜1μ
m、厚くても5μmくらいで行なわれている。こ
の様に高分子のマスクを絶縁性薄膜と同程度の膜
厚にすることはスピンナー法、真空蒸着法等によ
り可能であるが、これに高分子のマスクをした状
態は第4図に示してあるが、前記した様に、高分
子のマスク7が、加熱により分解したり、消滅し
たりしてもその上部に形成されている絶縁性薄膜
6は少しも破壊されることなく、逆にガラス基板
1に近すぎるために高分子等のマスク7が分解、
消滅するとともにガラス基板1と、絶縁性薄膜6
が密着し、ついには接着状態となり、当初の目的
からすると何の用もなさないマスクとなつてしま
う。これはスクリーン印刷法によるものでもほぼ
同様であり、第5図に示す様に一般的に高分子等
のマスク7の膜厚は1〜5μmで絶縁性薄膜6の
5〜50倍となつている。これは前記した第7図の
突起の高さBがあまり高くならない様に考えたか
らであるが、この方法でも絶縁性薄膜6を高分子
等のマスク7の分解、消滅だけの力では破壊する
ことは難しく、後処理として機械的な方法で絶縁
性薄膜6を除去してやらなければならず、これで
も部分的には除去しきれないものも出てきてしま
う。そして、除去、剥離したあとで第7図の突起
の高さBを測定したところ4000〜10000Åであつ
た。 本発明の目的はこれら従来の欠点をなくし、高
分子等によるマスク上の絶縁性薄膜が簡単に除去
でき、かつ、前記突起の高さBが絶縁性薄膜の膜
厚Aと同程度になるような実用的に価値のある方
法を提供することにある。 以下、図により詳しく説明する。第6図、第8
図a,b,cが本発明のものであり、第6図の高
分子等のマスク7を膜厚で形成したものの上に絶
縁性薄膜6を形成させた状態、第8図は本発明の
製造工程を示し、第3図には封止部近辺の絶縁性
薄膜6′の形成のための高分子等のマスク形成の
範囲を示す。 第8図により説明すると、本発明は最初に図a
に示すように少なくともその一部に透明導電膜2
が設けられているガラス板の表面、及び前記透明
導電膜2の一部に、図bに示すように少なくとも
一層以上の絶縁性薄膜6を形成するに際し、前記
絶縁性薄膜6の形成を望まない部分をあらかじめ
高分子等のマスク7によりマスクを形成する。 マスク7として使用したのは次に示す東京応化
工業(株)製の有機高分子化合物(OLI−S2)であ
る。即ち、主剤としてエポキシ樹脂 を用い、これに反応促進材として2−ヒドロキシ
プロピルメタクリレート単重合体 CH2=C(CH3)COOCH2CH(OH)CH3や、
2−ヒドロキシエチルメタクリレート単重合体
The present invention relates to a method for producing a substrate for a liquid crystal cell,
In particular, the present invention relates to a method for manufacturing a substrate for a liquid crystal cell in which an insulating thin film forming process is streamlined. It is well known that liquid crystal can be used as a display device by utilizing its electro-optic effect, and a liquid crystal cell having the basic configuration as shown in FIG. 1 is usually used. That is, a liquid crystal cell consists of a pair of glass substrates 1 and 1' arranged approximately half a row apart from each other with a gap of about 10 μm, a liquid crystal layer 4 filled between them, and a liquid crystal layer 4 to prevent the liquid crystal from flowing out.
It also includes a sealing part 3 provided around the liquid crystal layer 4 in order to keep the thickness of the liquid crystal layer 4 constant. Transparent conductive films 2, 2' for applying electrical signals to the liquid crystal layer 4 are provided on the surfaces of the glass substrates 1, 1' in contact with the liquid crystal layer 4, depending on the pattern desired to be displayed. It extends to the outside of the stop portion 3 to form a lead terminal portion. However, for various reasons, a structure in which the transparent conductive films 2, 2' and the liquid crystal layer 4 are in direct contact with each other is difficult to provide a practical liquid crystal cell. One is that an undesirable electrochemical reaction occurs on the surface of the transparent conductive film when voltage is applied, which accelerates the deterioration of the liquid crystal cell. The other is that in many cases, such as TN type liquid crystals, it is necessary to control the arrangement of liquid crystals within the liquid crystal cell using interfacial forces, which requires surface treatments such as rubbing and oblique vapor deposition. However, on a surface as shown in FIG. 1 where a glass substrate surface and a transparent conductive film surface coexist, uniform surface treatment is difficult due to surface irregularities or differences in materials, resulting in poor appearance of the liquid crystal cell. (This is called alignment failure.) In order to solve these difficulties, a practical liquid crystal cell has the structure shown in FIGS. 2a and 2b. That is, the surfaces of the glass substrates 1, 1' on which the transparent conductive films 2, 2' are located are coated with insulating thin films 6, 6'. The insulating thin films 6, 6' used here include inorganic insulating films containing oxides such as silicon oxide, titanium oxide, and cerium oxide, and fluorides such as magnesium fluoride, and silicon oxide is generally used. It is being It is desirable that the insulating thin films 6, 6' be formed not on the entire surface of the substrate, but only on the parts that contact the liquid crystal layer 4, and the transparent conductive films 2, 2'
It would be inconvenient if the insulating thin films 6, 6' were attached to the internal connection part 5 and the external terminal parts 2a, 2a' between them. It is also preferable that the portions corresponding to the insulating thin films 6, 6' are not attached. However, in reality, the insulating thin film 6 is applied only to the part that contacts the liquid crystal layer 4.
It is difficult to form the insulating thin films 6, 6' in the liquid crystal cell in the vicinity of the sealing part 3, and an alignment defect may be observed there. In the present invention, in order to prevent these problems and obtain reliable strength of the sealing part 3, an insulating thin film 6' is provided in an area of 1/3 to 1/2 of the width of the sealing part 3, as shown in FIG. It is designed so that it is formed by digging into it. When actually forming an insulating thin film, the method of masking the areas where you do not want to apply the insulating thin film in advance and forming the insulating thin film on the remaining areas is generally used because the process is shorter than other methods. However, since an insulating thin film will also be formed on the mask, we need to consider how to remove this and prevent chemical reactions between the mask and the insulating thin film when forming the mask. It is necessary to select the material. Several methods have been tried in the past based on this idea. One method is to use a low melting point alloy such as solder as a mask. Masks are formed by vacuum evaporation or screen printing of paste-like solder, but screen printing uses a paste-like solder that is stabilized by heating in order to chemically stabilize the insulating thin film. Usually 200~
It is processed at 300°C, but since the substrate is glass at this time, the solder becomes spherical on the glass substrate, rendering it useless as a mask.
In addition, when using the former vacuum evaporation method, it is chemically stable and an insulating thin film can be formed on it, but when removing this solder mask, it must be heated to about 250℃ in an electric furnace. However, the solder tends to become spheroidized as in Stareen printing. At this time, since there is an insulating thin film on the solder mask, the solder does not actually become spherical, but since this thin film is porous, it focuses toward the hole in an attempt to become spherical. The solder, which is the material of the mask, evaporates to the outside through these holes and is finally lost. For this reason, it takes two to three hours to remove the solder mask, and it is also very difficult to dispose of the toxic gas generated from the solder. A more serious drawback is that when the solder mask is removed from the glass substrate, the insulating thin film formed thereon sags as the solder evaporates, and eventually comes into close contact with the glass substrate. After this, when the insulating thin film is fired at 500°C, it completely adheres to the glass substrate, and even if you try to remove it afterwards, it is almost impossible to remove, making it unsuitable as a mask material. Another method is to use a depolymerizable polymer. This method uses screen printing to form a mask, but this method is also not safe;
After forming the insulating thin film, it is not possible to remove all of the insulating thin film on the mask, and a mechanical peeling process is required. In addition, this polymer mask uses toluene as a solvent, so it is highly volatile, and the screen printing process takes a short time, resulting in clogging.
Not suitable for practical use. In this way, conventionally known methods cannot completely remove the insulating thin film on the mask, or even if it can be removed, a mechanical removal method is required, which increases the number of steps and takes time to remove. Not much is actually done to increase the number of people. This is also the case in the prior art and is generally considered to be the case, but in the case of mask formation using polymers, the above-mentioned problems occur for the following reasons. The film thickness was made as thin as the thickness of an insulating thin film such as silicon oxide (usually 800 to 2000 Å is the optimal value), and the polymer mask was peeled off as shown in Figure 7. In the later state, we want the height B of the protrusion to be as small as possible, ideally to be the same as the thickness A of the insulating thin film, so the thickness of the mask is generally 4000 Å to 1 μ.
The thickness is about 5 μm at most. In this way, it is possible to make a polymer mask as thick as the insulating thin film using the spinner method, vacuum evaporation method, etc., but the state in which the polymer mask is applied is shown in Figure 4. However, as mentioned above, even if the polymer mask 7 decomposes or disappears due to heating, the insulating thin film 6 formed on top of it will not be destroyed at all, and on the contrary, the glass mask 7 will not be destroyed at all. Mask 7 made of polymer etc. decomposes because it is too close to substrate 1.
As it disappears, the glass substrate 1 and the insulating thin film 6
The masks become stuck together and eventually become glued together, making the mask useless considering its original purpose. This is almost the same even when using the screen printing method, and as shown in Figure 5, the film thickness of the mask 7 made of polymer or the like is generally 1 to 5 μm, which is 5 to 50 times that of the insulating thin film 6. . This is because the height B of the protrusion shown in FIG. 7 mentioned above was considered not to be too high, but even with this method, the insulating thin film 6 cannot be destroyed by the force of decomposing or disappearing the mask 7 made of polymer or the like. It is difficult to remove the insulating thin film 6 by a mechanical method as a post-processing, and even with this, some parts may not be completely removed. After removal and peeling, the height B of the protrusions in FIG. 7 was measured and found to be 4,000 to 10,000 Å. The purpose of the present invention is to eliminate these conventional drawbacks, to make it possible to easily remove the insulating thin film on the mask made of polymers, etc., and to make the height B of the protrusion approximately the same as the thickness A of the insulating thin film. The aim is to provide a method that is of practical value. This will be explained in detail below with reference to the drawings. Figures 6 and 8
Figures a, b, and c are of the present invention, and Figure 6 is a state in which an insulating thin film 6 is formed on a mask 7 made of polymer or the like with a film thickness, and Figure 8 is a state of the present invention. The manufacturing process is shown, and FIG. 3 shows the range of forming a mask made of polymer or the like for forming the insulating thin film 6' near the sealing part. To explain with reference to FIG. 8, the present invention first begins in FIG.
As shown in FIG.
As shown in FIG. A mask is formed in advance using a mask 7 made of polymer or the like. The mask 7 used was the following organic polymer compound (OLI-S2) manufactured by Tokyo Ohka Kogyo Co., Ltd. That is, epoxy resin is used as the main ingredient. 2-hydroxypropyl methacrylate monopolymer CH2 =C( CH3 ) COOCH2CH (OH) CH3 ,
2-hydroxyethyl methacrylate monopolymer

【式】を混合している。 この反応促進剤は、後述する如くエポキシ樹脂
で構成されたマスク7を仮焼成したときに、マス
ク7が完全には硬化せずに半硬化の状態を保つよ
うに作用する。これによりマスク7は後述する溶
液によつて膨潤・剥離しやすくなる。 更にマスク7には後述するスクリーン印刷に適
するよう希釈剤としてメチルカルビトール、ブチ
ルカルビトール、エチルカルビトールアセテー
ト、エチレングリコールモノブチルエーテル、エ
チレングリコールモノエチルエーテルアセテー
ト、テレビネオールを入れてゲル状にしている。
このマスク7は前記絶縁性薄膜6の形成を望まな
い部分に形成されるが、特に、第3図に示す様に
封止部3では液晶層側から封止部3の巾の1/3〜
1/2の領域までに至る如く絶縁性薄膜6′が形成さ
れるようにマスク7が形成されている。こうする
ことにより、今まで見られた封止部3の内周囲の
配向不良がなくなり、封止部3のシーリング強度
も充分得られることが確かめられた。この様に形
成されるマスク7は前述した様に、従来例では比
較的薄い膜厚(4000Å〜5μm)で行なわれてい
たが、本発明ではこれら今までの常識を破つて第
6図に示す様に極端に厚い膜のマスク7を形成し
た。 これが本発明の大きな特徴であるが、この膜厚
は10〜100μmが選ばれ、この上に形成される絶
縁性薄膜6の膜厚(800〜2000Å)に対し、50〜
1000倍の値となる。この範囲中でも特に、50〜
100μmのマスク7の膜厚が良い結果をもたらし
ている。この様に膜厚を厚くすると、第7図の突
起の高さBが心配になるが、実際には逆であり、
第6図の様に絶縁性薄膜6のうち、ガラス基板1
の上の絶縁性薄膜6c、マスク7の上の絶縁性薄
膜6aは正規の膜厚を示すが、マスク7の側面の
絶縁性薄膜6bは極端に薄く(200〜500Å)なつ
ており、この時点で絶縁性薄膜6bは破壊されや
すい状態になつている。マスク7の膜厚を厚くす
るために、従来のスクリーン印刷の様に感光性乳
剤でマスク7用のパターンを形成するのではな
く、感光性のフイルムを用いてマスク7用のパタ
ーンを形成した。 一般にスクリーンのメツシユを粗くすることに
より厚い膜の形成が可能となり、これでも良い
が、メツシユが粗くなるとともにスクリーン印刷
されたマスク7の転写性に正確さが失なわれる。
また、メツシユが粗くなることにより、マスク7
の粘度が小さいとスクリーン印刷する前ににじみ
出てしまい用をなさないこともある。スクリーン
印刷されたマスク7はこのあと、140〜180℃で15
〜30分加熱、硬化させる。これはマスク7の上に
形成される絶縁性薄膜6と化学的に反応を起さな
いためである。 従来例のハンダのマスクや、解重合性高分子の
マスクなどでは、絶縁性薄膜が酸化ケイ素より構
成されている場合には相性が悪く、マスクの両側
に化学反応が起つた不完全な絶縁性薄膜が形成さ
れる。加熱、硬化されたマスク7が付いたガラス
基板1上には、次に酸化ケイ素などの絶縁性薄膜
6を第6図や第8図で示す様に形成させる。 本発明の実施例では、ガラス基板1を絶縁性薄
膜6の液中に浸漬するデイツピング方式が採用さ
れたが、他の方法によつてももちろんさしつかえ
ない。形成された絶縁性薄膜6は一般的に考えら
れていた様な第6図の破線で示す形態はとらず、
むしろ逆にマスク側面6bが著しく薄くなり、破
壊しやすい形態となつた。 この絶縁性薄膜6に対しては、次いで140〜180
℃で15〜30分間仮焼成が行なわれる。これは絶縁
性薄膜6を準安定状態にするとともに、絶縁性薄
膜6の下にあるマスク7が高温により燃焼し炭化
したりせず化学的性質を保つている様にするため
である。というのは後工程での溶剤処理によりマ
スク7は溶解するが、絶縁性薄膜6は溶解しない
という条件が必要だからである。従つて仮焼成条
件については、温度が低すぎたり、時間が短かす
ぎたりすると絶縁性薄膜6が溶けていまい、逆に
温度が高すぎたり、時間が長すぎたりするとマス
ク7が必要以上に固化したり、場合によつては燃
焼してしまつたりして溶解しにくくなつたり、溶
解しなかつたりすることになるために、注意を要
する。この仮焼成のあとは、塩化メチレンあるい
はトリクレン溶液中に浸漬する。浸漬時間の制約
はないが、普通は5〜30分で作業を終了させてい
る。この時、第6図で示す薄い絶縁性薄膜6bの
様な所からマスク7に塩化メチレンあるいはトリ
クレンの溶剤が浸透し、マスク7を膨潤する。こ
の膨潤効果については、トリクレンの方が塩化メ
チレンより大きい。ここでマスク7を膨潤させた
あと、トリクロロエタン溶液中に浸漬し、超音波
洗浄を行なう。超音波の振動衝撃波で膨潤したマ
スク7は、基板1から剥離される。この剥離の
時、マスク7の上にある絶縁性薄膜6はマスク7
とともに剥離・除去されてしまう。この工程につ
いても、第4図や第5図で示す様なマスク7の形
成方法では著しい困難が伴なうことは云うまでも
ない。今まで述べてきた膨潤及び剥離における溶
剤は、全て塩素系(Cl系)のものであるが、これ
はマスク7を膨潤及び剥離を目的とするのは勿論
であるが、同時に絶縁性薄膜6自体を溶解しない
という条件も満たすものである。一例としてあげ
れば、仮焼成の絶縁性薄膜6は水中あるいは薄い
アルカリ洗剤中に浸漬しておくことによつて溶
解・剥離してしまう弱さを有しているのである。
完全にマスク7と該マスク7の上の絶縁性薄膜6
とを剥離・除去したあとの基板1は、連続焼成炉
などにより本焼成される。焼成温度は最高温部と
して450〜520℃で15〜30分間処理される。焼成後
はアルカリ、塩酸、中性洗剤等の一般的洗浄を行
なう。この様にして得られた絶縁性薄膜6付きの
ガラス基板1は、第7図の様になつている。 ここで従来例で記述した突起の高さBは絶縁性
薄膜の膜厚Aを1000Åとした時に1000〜3000Åと
ほとんど絶縁性薄膜の膜厚Aに近い値を示し、封
止部3がこの上を通つても、その封止部3の厚さ
が10μmであることからほとんど無視出来るもの
であつた。この突起の高さBが従来例より低いの
は、やはりマスク7の厚さ(いいかえれば、マス
クの容量)による絶縁性薄膜6の形成のしかたの
違いによるものといえる。 この様に本発明による一実施例として説明して
きたが、この方法において、別の実施例では第9
図の様にガラス基板1上に酸化ケイ素などの絶縁
性薄膜8を施しておく方法がある。この第一層目
の絶縁性薄膜8はガラス基板1全面に付けられて
いて、この上に透明導電膜が設けられ、さらに前
記したマスク7が形成され、第二相目の絶縁性薄
膜6が形成される。ここでガラス基板1上の第一
層目の絶縁性薄膜8とマスク7形成後の第二層目
の絶縁性薄膜6は同材質でもよく、一般的には生
産工程上から同材質のことが多い。マスク7と第
一層目の絶縁性薄膜8との密着力はマスク7とガ
ラス基板1の密着力より弱く、その為にマスク7
が剥離しやすく、本発明のガラス基板の作成方法
に大きな効果をもたらしている。 しかしながら、第一層目の絶縁性薄膜8と第二
層目の絶縁性薄膜6、及び第一層目の絶縁性薄膜
8と第一層目の絶縁性薄膜8上にある透明導電膜
2の密着力も前記ガラス基板1と絶縁性薄膜6の
密着力に比較して若干弱くなつていて、従来例で
は2〜5%NaOH水溶液などを使用して前記マ
スク7を剥離除去しようとすると、第一層目の絶
縁性薄膜8上にある透明導電膜2上の第二層目の
絶縁性薄膜6が剥離されてしまうことがみられ
た。マスク7の剥離除去の溶剤としては、マスク
7を確実に剥離でき、かつ絶縁性薄膜6の剥離を
生じさせないのが理想である。前記した様に本発
明ではマスク7の膨潤及び剥離除去のための溶剤
としてトリクレン、塩化メチレン、トリクロロエ
タンなどの塩素系の溶剤を用いた。実施例として
は前記した様に、マスク7の膨潤にトリクレンあ
るいは塩化メチレンを用い、剥離・除去はトリク
ロロエタンを用いて超音波洗浄した。剥離時間は
3〜5分、長くても10分ほどであつた。この結
果、マスク7は確実に剥離されるが、第一層目の
絶縁性薄膜8上にある透明導電膜2上の第二層目
の絶縁性薄膜6は少しも剥離されることなく、完
壁な絶縁層を維持しており、第8図a,b,cに
示すガラス基板1上に絶縁性薄膜6を施す方法の
場合と同じ結果が得られた。 以上、本発明について詳しく述べてきたが、エ
ポキシ樹脂を主剤とし、2−ヒドロキシプロピル
メタクリレート単重合体や、2−ヒドロキシエチ
ルメタクリレート単重合体の反応促進剤を混合す
るとともに、メチルカルビトール等の希釈剤でゲ
ル状にした水酸基を有する有機化合物の高分子マ
スクを使用して、マスクの膜厚を従来のものより
大巾に厚くし、かつ極端に膜厚を厚くしたことに
より、その上に形成された絶縁性薄膜のマスク上
への付着を薄く、浸透されやすい状態とした。そ
して、絶縁性薄膜を仮焼成し、塩化メチレン等に
浸漬してマスクを膨潤し、さらにトリクロロエタ
ン溶液中にて超音波洗浄によつてマスクとマスク
上の絶縁性薄膜を剥離・除去し、かつマスクを施
こさなかつた部分の絶縁性薄膜は剥離されること
なく、絶縁層を保持しているのが特徴である。ま
た、この様にして出来たガラス基板上の絶縁性薄
膜の剥離面は、その端部の突起の高さが小さく実
用的な面で大きな効果のあることが特徴である。 こうして作られたガラス基板1は、このあと斜
め蒸着法、ラビング法などにより配向処理され、
二板のガラスとして重ね合せられ、液晶が注入さ
れ、封口され液晶セルとなるが、その時には前記
した封止部に喰い込んで絶縁性薄膜が形成されて
いるので封止部内周囲での配向性がそこなわれる
こともなく、良好な配向が得られる。
[Formula] is mixed. This reaction accelerator acts so that when the mask 7 made of epoxy resin is pre-baked as described later, the mask 7 is not completely cured but remains in a semi-cured state. As a result, the mask 7 is easily swollen and peeled off by the solution described below. Furthermore, mask 7 was made into a gel by adding methyl carbitol, butyl carbitol, ethyl carbitol acetate, ethylene glycol monobutyl ether, ethylene glycol monoethyl ether acetate, and televisionneol as diluents to make it suitable for screen printing, which will be described later. There is.
This mask 7 is formed in a part where the formation of the insulating thin film 6 is not desired, but especially in the sealing part 3, as shown in FIG.
A mask 7 is formed so that the insulating thin film 6' is formed over 1/2 of the area. By doing this, it was confirmed that the defective orientation of the inner periphery of the sealing part 3 that had been observed up to now was eliminated and that sufficient sealing strength of the sealing part 3 was obtained. As mentioned above, the mask 7 formed in this manner has been formed with a relatively thin film thickness (4000 Å to 5 μm) in the conventional example, but in the present invention, the film is shown in FIG. In this way, the mask 7 of an extremely thick film was formed. This is a major feature of the present invention; the film thickness is selected to be 10 to 100 μm, and the thickness of the insulating thin film 6 formed thereon (800 to 2000 Å) is 50 to 100 μm.
The value will be 1000 times higher. Especially within this range, from 50 to
The film thickness of the mask 7 of 100 μm gives good results. When the film thickness is increased in this way, the height B of the protrusion in Figure 7 becomes a concern, but in reality it is the opposite.
As shown in FIG. 6, among the insulating thin films 6, the glass substrate 1
The insulating thin film 6c on the mask 7 and the insulating thin film 6a on the mask 7 have normal film thicknesses, but the insulating thin film 6b on the sides of the mask 7 is extremely thin (200 to 500 Å), and at this point The insulating thin film 6b is now in a state where it is easily destroyed. In order to increase the film thickness of the mask 7, the pattern for the mask 7 was formed using a photosensitive film instead of forming the pattern for the mask 7 using a photosensitive emulsion as in conventional screen printing. Generally, a thick film can be formed by making the mesh of the screen rougher, and this is fine, but as the mesh becomes rougher, the transferability of the screen-printed mask 7 becomes less accurate.
In addition, due to the rough mesh, the mask 7
If the viscosity is low, it may bleed out before screen printing, rendering it useless. After this, the screen-printed mask 7 was heated at 140-180℃ for 15 minutes.
Heat and cure for ~30 minutes. This is because no chemical reaction occurs with the insulating thin film 6 formed on the mask 7. Conventional solder masks and depolymerizable polymer masks are not compatible when the insulating thin film is made of silicon oxide, and chemical reactions occur on both sides of the mask, resulting in incomplete insulation. A thin film is formed. On the glass substrate 1 with the heated and hardened mask 7 attached, an insulating thin film 6 of silicon oxide or the like is then formed as shown in FIGS. 6 and 8. In the embodiment of the present invention, a dipping method was adopted in which the glass substrate 1 is immersed in the liquid of the insulating thin film 6, but other methods may of course be used. The formed insulating thin film 6 did not take the form shown by the broken line in FIG. 6 as was generally thought;
On the contrary, the side surface 6b of the mask became extremely thin and easily destroyed. Next, for this insulating thin film 6, 140 to 180
Temporary calcination is performed at ℃ for 15 to 30 minutes. This is to bring the insulating thin film 6 into a metastable state and to ensure that the mask 7 under the insulating thin film 6 does not burn and carbonize due to high temperatures and maintains its chemical properties. This is because it is necessary that the mask 7 is dissolved by the solvent treatment in the subsequent process, but the insulating thin film 6 is not dissolved. Therefore, regarding the pre-firing conditions, if the temperature is too low or the time is too short, the insulating thin film 6 will not melt, whereas if the temperature is too high or the time is too long, the mask 7 will be formed more than necessary. Care must be taken because it may solidify or in some cases burn, making it difficult to dissolve or not dissolving at all. After this calcining, it is immersed in a methylene chloride or trichlene solution. There are no restrictions on soaking time, but the work is usually completed in 5 to 30 minutes. At this time, a solvent such as methylene chloride or trichlene permeates into the mask 7 from places such as the thin insulating thin film 6b shown in FIG. 6, causing the mask 7 to swell. This swelling effect is greater for trichlene than for methylene chloride. After the mask 7 is swollen, it is immersed in a trichloroethane solution and subjected to ultrasonic cleaning. The mask 7 swollen by the ultrasonic vibration shock wave is peeled off from the substrate 1. During this peeling, the insulating thin film 6 on the mask 7 is removed from the mask 7.
It will be peeled off and removed along with it. Needless to say, this step also involves significant difficulties in the method of forming the mask 7 as shown in FIGS. 4 and 5. All of the solvents for swelling and peeling described so far are chlorine-based (Cl-based), which is used not only for the purpose of swelling and peeling off the mask 7, but also for the purpose of swelling and peeling the insulating thin film 6 itself. It also satisfies the condition that it does not dissolve. For example, the pre-fired insulating thin film 6 has a weakness that it will dissolve and peel off if it is immersed in water or a dilute alkaline detergent.
The mask 7 and the insulating thin film 6 on the mask 7 are completely covered.
The substrate 1 after peeling and removal is subjected to main firing in a continuous firing furnace or the like. The firing temperature is 450 to 520°C, which is the highest temperature, for 15 to 30 minutes. After firing, perform general cleaning with alkali, hydrochloric acid, neutral detergent, etc. The glass substrate 1 with the insulating thin film 6 thus obtained is as shown in FIG. Here, when the thickness A of the insulating thin film is 1000 Å, the height B of the protrusion described in the conventional example shows a value of 1000 to 3000 Å, which is almost close to the thickness A of the insulating thin film, and the sealing portion 3 is above this value. Even if it passed through, it was almost negligible because the thickness of the sealing part 3 was 10 μm. The reason why the height B of this protrusion is lower than that of the conventional example can be said to be due to the difference in the method of forming the insulating thin film 6 depending on the thickness of the mask 7 (in other words, the capacitance of the mask). This has been described as one embodiment according to the present invention, but in this method, another embodiment may be used.
As shown in the figure, there is a method in which an insulating thin film 8 of silicon oxide or the like is applied on a glass substrate 1. This first layer of insulating thin film 8 is applied to the entire surface of glass substrate 1, a transparent conductive film is provided on this, the above-mentioned mask 7 is further formed, and second layer of insulating thin film 6 is applied. It is formed. Here, the first insulating thin film 8 on the glass substrate 1 and the second insulating thin film 6 after forming the mask 7 may be made of the same material, and it is generally preferred that they are made of the same material from the production process. many. The adhesion between the mask 7 and the first insulating thin film 8 is weaker than the adhesion between the mask 7 and the glass substrate 1.
is easily peeled off, which has a great effect on the method for producing a glass substrate of the present invention. However, the first insulating thin film 8 and the second insulating thin film 6, and the first insulating thin film 8 and the transparent conductive film 2 on the first insulating thin film 8, The adhesion force is also slightly weaker than the adhesion force between the glass substrate 1 and the insulating thin film 6, and in the conventional example, when trying to peel off and remove the mask 7 using a 2 to 5% NaOH aqueous solution, the first It was observed that the second insulating thin film 6 on the transparent conductive film 2 on the second insulating thin film 8 was peeled off. Ideally, the solvent for removing the mask 7 should be one that can reliably remove the mask 7 and not cause the insulating thin film 6 to peel off. As described above, in the present invention, a chlorine-based solvent such as trichlene, methylene chloride, or trichloroethane is used as a solvent for swelling and peeling off the mask 7. In the example, as described above, trichlene or methylene chloride was used to swell the mask 7, and trichloroethane was used for peeling and removal by ultrasonic cleaning. The peeling time was 3 to 5 minutes, and about 10 minutes at most. As a result, the mask 7 is reliably peeled off, but the second insulating thin film 6 on the transparent conductive film 2 on the first insulating thin film 8 is not completely peeled off. A solid insulating layer was maintained, and the same results as in the method of forming an insulating thin film 6 on the glass substrate 1 shown in FIGS. 8a, b, and c were obtained. The present invention has been described in detail above, and the main ingredient is an epoxy resin, mixed with a reaction accelerator such as a 2-hydroxypropyl methacrylate monopolymer or a 2-hydroxyethyl methacrylate monopolymer, and a diluent such as methyl carbitol. By using a polymer mask made of an organic compound with hydroxyl groups that has been gelled with an agent, the film thickness of the mask is made much thicker than conventional ones, and by making the film extremely thick, The resulting insulating thin film was thinly attached to the mask, making it easy to penetrate. Then, the insulating thin film is calcined, the mask is swollen by dipping in methylene chloride, etc., and the mask and the insulating thin film on the mask are peeled off and removed by ultrasonic cleaning in a trichloroethane solution, and the mask is The insulating thin film in the areas where it was not applied retains its insulating layer without being peeled off. Furthermore, the peeled surface of the insulating thin film on the glass substrate produced in this manner is characterized by the small height of the protrusion at the end, which is highly effective from a practical standpoint. The glass substrate 1 thus produced is then subjected to an orientation treatment using an oblique vapor deposition method, a rubbing method, etc.
They are stacked together as two sheets of glass, liquid crystal is injected, and sealed to form a liquid crystal cell. At that time, an insulating thin film is formed by biting into the sealing part, so the orientation inside and around the sealing part is difficult. Good alignment can be obtained without any damage.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は液晶セルの基本的構成を示す断面図、
第2図aおよびbは実用的な液晶セルの構成を示
す平面図と断面図、第3図は本発明の一実施例を
示す液晶セルの平面図、第4図、第5図は従来の
マスクの断面図、第6図は本発明の実施例に係る
マスクの断面図、第7図は第6図のマスクを剥離
した状態を説明する断面図、第8図a,b,cは
本発明のマスク形成工程を示す工程図、第9図は
本発明のマスクの他の実施例を示す断面図であ
る。 1,1′……ガラス基板、2,2′……透明導電
膜、3……封止部、4……液晶層、6,6′,8
……絶縁性薄膜、7……マスク、A……絶縁性薄
膜の膜厚、B……突起の高さ。
Figure 1 is a sectional view showing the basic structure of a liquid crystal cell.
FIGS. 2a and 2b are a plan view and a sectional view showing the configuration of a practical liquid crystal cell, FIG. 3 is a plan view of a liquid crystal cell showing an embodiment of the present invention, and FIGS. 6 is a sectional view of a mask according to an embodiment of the present invention, FIG. 7 is a sectional view illustrating a state in which the mask of FIG. 6 is peeled off, and FIGS. FIG. 9 is a process diagram showing the mask forming process of the invention, and a sectional view showing another embodiment of the mask of the invention. 1, 1'... Glass substrate, 2, 2'... Transparent conductive film, 3... Sealing part, 4... Liquid crystal layer, 6, 6', 8
... Insulating thin film, 7... Mask, A... Thickness of insulating thin film, B... Height of protrusion.

Claims (1)

【特許請求の範囲】 1 その一部に透明導電膜が設けられているガラ
ス基板の表面及び前記透明導電膜上の一部に、少
なくとも一層以上の絶縁性薄膜を形成して成る液
晶セル用基板の作成方法において、前記絶縁性薄
膜の形成を望まない部分には予め該絶縁性薄膜の
膜厚の50〜1000倍の厚さを有するマスクを形成
し、その後から前記ガラス基板全面に前記絶縁性
薄膜を形成し、さらに該絶縁性薄膜を仮焼成し、
次いで、前記マスクと該マスク上の前記絶縁性薄
膜を剥離・除去した後、残された絶縁性薄膜を本
焼成することを特徴とする液晶セル用基板の作成
方法。 2 その一部に透明導電膜が設けられているガラ
ス基板の表面及び前記導電膜上の一部に、少なく
とも一層以上の絶縁性薄膜を形成して成る液晶セ
ル用基板の作成方法において、前記ガラス基板上
にあらかじめ酸化ケイ素等による第一層目の絶縁
性薄膜を形成し、該第一層目の絶縁性薄膜上に前
記透明導電膜を形成すると共に、第二層目の絶縁
性薄膜の形成を望まない部分には予め該第二層目
の絶縁性薄膜の膜厚の50〜1000倍の厚さを有する
マスクを形成し、その後から前記ガラス基板全面
に前記第二層目の絶縁性薄膜を形成し、さらに該
第二層目の絶縁性薄膜を仮焼成し、次いで前記マ
スクと該マスク上の前記第二層目の絶縁性薄膜を
剥離・除去した後、残された第二層目の絶縁性薄
膜を本焼成することを特徴とする液晶セル用基板
の作成方法。
[Scope of Claims] 1. A liquid crystal cell substrate comprising at least one insulating thin film formed on the surface of a glass substrate on which a transparent conductive film is provided and on a part of the transparent conductive film. In the manufacturing method, a mask having a thickness of 50 to 1000 times the thickness of the insulating thin film is formed in advance on the part where the insulating thin film is not desired to be formed, and then the insulating film is coated on the entire surface of the glass substrate. forming a thin film, further calcining the insulating thin film,
Next, after peeling off and removing the mask and the insulating thin film on the mask, the remaining insulating thin film is subjected to main baking. 2. A method for producing a substrate for a liquid crystal cell comprising forming at least one or more insulating thin film on the surface of a glass substrate partially provided with a transparent conductive film and on a part of the conductive film. Forming a first insulating thin film of silicon oxide or the like on the substrate in advance, forming the transparent conductive film on the first insulating thin film, and forming a second insulating thin film. A mask having a thickness of 50 to 1000 times the thickness of the second layer insulating thin film is formed in advance on the areas where the second layer of insulating thin film is not desired, and then the second layer of the insulating thin film is coated on the entire surface of the glass substrate. After forming the second layer of insulating thin film and pre-baking the second layer of insulating thin film, and then peeling off and removing the mask and the second layer of insulating thin film on the mask, the remaining second layer 1. A method for producing a substrate for a liquid crystal cell, which comprises performing main firing of an insulating thin film.
JP3225281A 1981-03-06 1981-03-06 Formation of substrate for liquid crystal cell Granted JPS57147616A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3225281A JPS57147616A (en) 1981-03-06 1981-03-06 Formation of substrate for liquid crystal cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3225281A JPS57147616A (en) 1981-03-06 1981-03-06 Formation of substrate for liquid crystal cell

Publications (2)

Publication Number Publication Date
JPS57147616A JPS57147616A (en) 1982-09-11
JPH035564B2 true JPH035564B2 (en) 1991-01-25

Family

ID=12353818

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3225281A Granted JPS57147616A (en) 1981-03-06 1981-03-06 Formation of substrate for liquid crystal cell

Country Status (1)

Country Link
JP (1) JPS57147616A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6177032A (en) * 1984-09-25 1986-04-19 Seikosha Co Ltd Production of liquid crystal panel substrate
JP2011081179A (en) * 2009-10-07 2011-04-21 Lg Display Co Ltd Method for forming liquid crystal alignment layer

Also Published As

Publication number Publication date
JPS57147616A (en) 1982-09-11

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