JPH0414742B2 - - Google Patents
Info
- Publication number
- JPH0414742B2 JPH0414742B2 JP94585A JP94585A JPH0414742B2 JP H0414742 B2 JPH0414742 B2 JP H0414742B2 JP 94585 A JP94585 A JP 94585A JP 94585 A JP94585 A JP 94585A JP H0414742 B2 JPH0414742 B2 JP H0414742B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- peaks
- peak
- group
- gaseous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003595 spectral effect Effects 0.000 claims description 13
- 238000010521 absorption reaction Methods 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 9
- 238000001514 detection method Methods 0.000 description 9
- 238000011002 quantification Methods 0.000 description 9
- 238000002835 absorbance Methods 0.000 description 8
- 238000000862 absorption spectrum Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- 230000001066 destructive effect Effects 0.000 description 3
- 230000031700 light absorption Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 238000000137 annealing Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 240000006829 Ficus sundaica Species 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 238000001479 atomic absorption spectroscopy Methods 0.000 description 1
- 238000000889 atomisation Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000004817 gas chromatography Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000011896 sensitive detection Methods 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/74—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
(産業上の利用分野)
本発明は新規なSの定量方法及び該方法を利用
したその場での高感度な検知定量が可能なSモニ
ターに関する。
本発明はSを用いる半導体製造品及び製造装
置、廃棄物処理装置等、例えばZns、Cds、
ZnSxSe1-x等の化合物半導体のエビ成長装置
(CVD炉、LPE炉等)、高圧HB炉、アニーリング
炉、S圧アニーリング炉、MBE装置、MOCVD
装置等にS検出定量高感度モニターとして利用し
たり、あるいは、Sを含有する合金やセラミツク
ス、ガラス等の溶解炉等に利用することができ
る。
(従来の技術)
従来、Sを検出する場合に、非破壊で、系を乱
さず、その場でガス状Sを検知定量する方法は殆
んど知られておらず、Sの検出は破壊検知が主で
ある。ガス状物質の非破壊検出・定量法として
は、ガスクロマトグラフイーが考えられるが、
測定系内に試料を導くまでに、導入管壁に付着
し、正確な定量ができない、系内からのサンプ
リングを要するため系を乱してしまう、という本
質的な問題点があるため不適であり、実用されて
いない。また、原子吸光分析は、原子状態の試料
について厳密に測定できるが、試料を2000°C以上
の高温状態とする必要があり、原子化温度以下の
検知定量は原理的に不可能であるに加え、用いう
るホロカソードランプがない。
(発明が解決しようとする手段)
本発明は上記した現状に鑑みてなされたもの
で、非破壊で、系をみださず、その場でガス状S
の高感度検知・定量が可能な方法及び該方法を利
用した高感度モニターの提供を目的とするもので
ある。
(問題点を解決しようとする手段)
すなわち、本発明はガス状Sに、波長263nm、
265.5nm、268nm、270.5nm、273nm、276nm、
279nm、282nmに山部(以下山ピークという)を
有する第群ピークのうちの少なくとも1つ及び
波長264.5nm、267nm、269.5nm、272nm、
275nm、278nm、281nmに谷部(以下谷ピークと
いう)を有する第群ピークのうちの少なくとも
1つのスペクトル線を、入射し、上記ガス状Sに
よる上記入射スペクトル線の吸収を測定し、各光
強度のピーク高さからSの検知・定量を行う方法
および炉またはヒータ付容器の光の進行方向に窓
部を設け、一方の窓部に波長263nm、265.5nm、
268nm、270.5nm、273nm、276nm、279nm、
282nmの山ピークを有する第群ピークのうちの
少なくとも1つ及び波長264.5nm、267nm、
269.5nm、272nm、275nm、278nm、281nmの谷
ピークを有する第群ピークのうちの少なくとも
1つのスペクトル線発光部、他方の窓にはヒータ
付容器内のガス状Sを通過した前記スペクトル線
の光強度のピーク高さからSを検知定量する受
光、測光部を接続してなる、Sモニターである。
以下に本発明につき詳細に説明する。
本発明者らは、ガス状S(ガス状ではS2、S4、
S6、S8等になると考えられているが、特定されて
いない。)の吸光スペクトルを詳細に研究の結果、
第1図に示すように、波長263nm、265.5nm、
268nm、270.5nm、273nm、276nm、279nm及び
282nmに第群の吸光の山ピーク、そして波長
264.5nm、267nm、269.5nm、272nm、275nm、
278nm及び281nmに第群の吸光の谷ピークを有
することを発見した。そしてこのような第群及
び第群の山と谷のピークは温度300°C程度のS
の分子の状況のスペクトルで得られるという知見
をも得て、ガス状Sの吸収による上記各々の吸光
ピークを利用することにより、ガス状Sを高感度
でかつその場でさえ検出・定量を可能としたもの
である。
こゝで谷ピークがこの検出・定量に利用できる
理由は次のとおりである。第6図において、m
はバツクグラウンドの光の透過を示しており、吸
収等がなければmが測定される。それに対し、
光の吸収があれば吸光分aだけ光の光量が吸収
されiの値となつて測定されることになる。光
の吸収等はSの分子の構造にかかわつているもの
とみられ、光の吸収はSとSのボンデイング等の
振動などにエネルギー吸収されているためと推定
されるのでバツククラウンドの光透過量Imに対
する光吸収量IaがSの濃度変化に対し、あらかじ
め検量線が作成されていれば、Iiを測定すること
によつて、つまり谷のピークをImに対して測定
することによつてSに定量することができる。実
際には、上記第群ピークのうちの少なくとも1
つと第群ピークのうちの少なくとも1つのスペ
クトル線を同時に入射し、発光部にある分光器を
用い別々に測定してその平均をとるので単一のス
ペクトル線を用いる場合より他物質との分離がよ
り確実となり、しかもS定量の精度が向上する。
本発明は第2図に示すように、炉、ヒータ付セ
ルあるいは筒部1に窓2を取り付け、発光部3に
おいて上記第群ピーク及び第群ピークのスペ
クトル線を発光させ、この光を窓2から入射し、
受光部4において光強度のピーク高さを測定する
ことにより、炉またはセル中のSを検知定量する
ものである。このSの検知、定量は、上記第群
ピーク及び第群ピークのピーク吸収がS濃度に
比例することから求める。ピーク吸収とS濃度の
関係は
D=log1/T(%) ……(1)
D∝C ……(2)
上記(1),(2)式で表される。ここでTはピークで
の吸光度(%)、CはSの濃度である。
上記第及び群ピークのスペクトル発光源と
しては、ホロカソードランプを用い、第及び
群ピークを中心したフイルターを各々設けたもの
が使用できる。また該フイルターは受光部に設け
ることもできる。
さらに検出結果をコンピユータ処理し、その結
果を表示するようにできる。このようにすれば、
ほぼ実時間でSを定量検出できるので、その場で
のSの検知定量とSの投入量S圧コントロール等
を制御しうる高感度Sモニターを実現できる。
(実施例)
第3図aは本発明の実施例で用いた装置の概略
図であつて、1はセル、2は窓、3は発光部、4
は受光部、5は加熱手段をあらわす。なお第3図
bはこの装置の温度分布を示すグラフである。
セル1内にSを置き加熱手段5によりセル1内
の温度を298℃に一定にして保持したときのスペ
クトルを第4図に示す。第群ピークすなわち波
長263nm、265.5nm、268nm、270.5nm、273nm、
276nm、279nm及び282nmを最大のピーク山とし
た吸収スペクトル及び第群ピークすなわち波長
264.5nm、267nm、269.5nm、272nm、275nm、
278nm及び281nmを谷のピークとした吸収スペク
トルが明瞭に測定された。
一方、Sの投入量と、吸光度の間には、一般的
に第5図に示す関係があることを詳細な実験によ
り確認した。ここでガス状Sが存在するとき検知
される光強度をI、ガス状Sがないときの光強度
をIoとすると、吸光度T(%)は次式(3)で与えら
れる。
T=I/Io×100 ……(3)
したがつて、前記の(1)および(2)式により吸光度か
らSを定量できる。なおA点は、温度tにおける
飽和点をあらわしており、
蒸気圧=(logPt(mmHg)=6750/t+11.32)によ
り規定される。
第5図の関係は第群及び第群の夫々の山と
谷の吸収スペクトルについて成立するので、いず
れのピークの測定によつてもS量を求めることが
できる。検出は0.01ppmオーダーまで可能であ
る。
しかし、本発明にしたがい、上記の第及び第
群の山と谷の少なくとも1つづつのスペクトル
線の組合せを用いこれらを同時に検知し、各々の
ピーク高さから同時に定量して平均すると、S検
知・定量精度は一層向上した。すなわち、この場
合は前記(1),(3)式にかえて、下記(a)〜(c)の評価手
段による。なお,は夫々の平均値を、n=
1,2…8は上記8種類のピークについての、
夫々の測定を表す。
(a) D=log1/T(%)、
(%)=1i=o
〓ni=1
Ii/Ioi×100 n=1,2,…8
(b) =1i=o
〓ni=1
log1/Ti(%)、
Ti(%)=Ii/Ioi×100 n=1,2,…8
(c) D=log1/To(%),
(Industrial Application Field) The present invention relates to a novel method for quantifying S, and an S monitor capable of highly sensitive detection and quantification on the spot using the method. The present invention relates to semiconductor manufacturing products, manufacturing equipment, waste processing equipment, etc. that use S, such as Zns, Cds,
Growth equipment for compound semiconductors such as ZnSxSe 1-x (CVD furnace, LPE furnace, etc.), high pressure HB furnace, annealing furnace, S pressure annealing furnace, MBE equipment, MOCVD
It can be used as a high-sensitivity monitor for detecting and quantifying S in equipment, or can be used in melting furnaces for S-containing alloys, ceramics, glasses, etc. (Prior art) Conventionally, when detecting S, there is almost no known method for detecting and quantifying gaseous S on the spot in a non-destructive manner without disturbing the system. is the main thing. Gas chromatography can be considered as a non-destructive detection/quantification method for gaseous substances.
It is unsuitable because it has the inherent problem that it adheres to the wall of the introduction tube before the sample is introduced into the measurement system, making accurate quantification impossible, and that it disturbs the system because it requires sampling from within the system. , has not been put into practice. In addition, although atomic absorption spectrometry can accurately measure samples in the atomic state, it requires the sample to be heated to a high temperature of 2000°C or higher, and detection and quantification at temperatures below the atomization temperature is theoretically impossible. , there are no hollow cathode lamps available. (Means to be Solved by the Invention) The present invention has been made in view of the above-mentioned current situation, and is non-destructive, does not leak out the system, and is capable of producing gaseous Sulfur on the spot.
The purpose of the present invention is to provide a method capable of detecting and quantifying with high sensitivity, and a highly sensitive monitor using the method. (Means for solving the problem) That is, the present invention provides gaseous S with a wavelength of 263 nm,
265.5nm, 268nm, 270.5nm, 273nm, 276nm,
At least one of the group peaks having peaks at 279nm and 282nm (hereinafter referred to as peaks) and wavelengths of 264.5nm, 267nm, 269.5nm, 272nm,
At least one spectral line of the group peak having valleys (hereinafter referred to as valley peaks) at 275 nm, 278 nm, and 281 nm is incident, and the absorption of the incident spectral line by the gaseous S is measured, and each light intensity is measured. Method for detecting and quantifying S from the peak height of
268nm, 270.5nm, 273nm, 276nm, 279nm,
At least one of the group peaks having a peak of 282 nm and a wavelength of 264.5 nm, 267 nm,
At least one spectral line light-emitting part of the first group of peaks having valley peaks of 269.5 nm, 272 nm, 275 nm, 278 nm, and 281 nm, and the other window contains light of the spectral line that has passed through the gaseous S in the heater-equipped container. This is an S monitor that is connected to a light receiving and photometric unit that detects and quantifies S based on the height of the peak intensity. The present invention will be explained in detail below. The present inventors have discovered that gaseous S (in gaseous form S 2 , S 4 ,
It is thought that it will be S 6 , S 8, etc., but it has not been identified. ) As a result of detailed research on the absorption spectra of
As shown in Figure 1, the wavelengths are 263nm, 265.5nm,
268nm, 270.5nm, 273nm, 276nm, 279nm and
The absorption peak of the first group is at 282nm, and the wavelength
264.5nm, 267nm, 269.5nm, 272nm, 275nm,
It was discovered that there is a group of absorbance trough peaks at 278 nm and 281 nm. The peaks and valleys of the first and second groups are S at a temperature of about 300°C.
By using the above-mentioned absorption peaks caused by the absorption of gaseous S, it is possible to detect and quantify gaseous S with high sensitivity even on the spot. That is. The reason why the valley peak can be used for this detection and quantification is as follows. In Figure 6, m
indicates the transmission of background light, and if there is no absorption etc., m is measured. For it,
If light is absorbed, the amount of light is absorbed by the absorption amount a, and the value of i is measured. The absorption of light seems to be related to the structure of the S molecule, and it is presumed that the absorption of light is due to energy being absorbed by vibrations such as bonding between S and S, so the amount of light transmitted in the background is If a calibration curve has been created in advance, the light absorption amount Ia for Im can be adjusted to S by measuring Ii, that is, by measuring the peak of the valley with respect to Im. Can be quantified. In fact, at least one of the above group peaks
Since at least one spectral line of the first and second group peaks is simultaneously incident, measured separately using a spectrometer in the light emitting part, and then averaged, separation from other substances is easier than when using a single spectral line. It becomes more reliable and the precision of S quantification improves. As shown in FIG. 2, the present invention involves attaching a window 2 to a furnace, a cell with a heater, or a cylindrical portion 1, causing a light emitting portion 3 to emit spectrum lines of the above-mentioned group peaks and group peaks, and transmitting this light to the window 2. incident from
By measuring the peak height of light intensity in the light receiving section 4, S in the furnace or cell is detected and quantified. The detection and quantification of S is determined from the fact that the peak absorption of the above group peak and group peak is proportional to the S concentration. The relationship between peak absorption and S concentration is expressed by the equations (1) and (2) above: D=log1/T (%) (1) D∝C (2). Here, T is the absorbance at the peak (%), and C is the concentration of S. As the spectral emission source for the above-mentioned 1st and group peaks, a hollow cathode lamp can be used, which is provided with a filter centered on the 1st and group peaks, respectively. Further, the filter can also be provided in the light receiving section. Furthermore, the detection results can be processed by a computer and the results can be displayed. If you do this,
Since it is possible to quantitatively detect S in almost real time, it is possible to realize a highly sensitive S monitor that can detect and quantify S on the spot and control the amount of S input, S pressure, etc. (Example) FIG. 3a is a schematic diagram of an apparatus used in an example of the present invention, in which 1 is a cell, 2 is a window, 3 is a light emitting part, and 4 is a schematic diagram of a device used in an example of the present invention.
5 represents a light receiving section, and 5 represents a heating means. Note that FIG. 3b is a graph showing the temperature distribution of this device. FIG. 4 shows the spectrum obtained when S was placed in the cell 1 and the temperature inside the cell 1 was kept constant at 298° C. by the heating means 5. Group peaks: wavelengths 263nm, 265.5nm, 268nm, 270.5nm, 273nm,
Absorption spectrum with maximum peaks at 276nm, 279nm and 282nm and group peak, i.e. wavelength
264.5nm, 267nm, 269.5nm, 272nm, 275nm,
An absorption spectrum with valley peaks at 278 nm and 281 nm was clearly measured. On the other hand, it was confirmed through detailed experiments that there is generally a relationship shown in FIG. 5 between the amount of S added and the absorbance. Here, if the light intensity detected when gaseous S is present is I, and the light intensity when gaseous S is not present is Io, the absorbance T (%) is given by the following equation (3). T=I/Io×100 (3) Therefore, S can be quantified from the absorbance using equations (1) and (2) above. Note that point A represents the saturation point at temperature t, and is defined by vapor pressure = (logPt (mmHg) = 6750/t + 11.32). Since the relationship shown in FIG. 5 holds true for the absorption spectra of the peaks and valleys of each group, the amount of S can be determined by measuring any of the peaks. Detection is possible down to the order of 0.01ppm. However, according to the present invention, by simultaneously detecting these by using a combination of spectral lines of at least one of the above-mentioned peaks and troughs, and by simultaneously quantifying and averaging from the height of each peak, the S detection and Quantitative accuracy was further improved. That is, in this case, the following evaluation means (a) to (c) are used instead of the above equations (1) and (3). In addition, is the respective average value, n=
1, 2...8 are for the above eight types of peaks,
represents each measurement. (a) D=log1/T(%), (%)= 1i=o 〓 ni=1 I i /Io i ×100 n=1, 2,...8 (b) = 1i=o 〓 ni=1 log1 /T i (%), T i (%) = I i /Io i ×100 n = 1, 2,...8 (c) D = log1/To (%),
【式】
n=1,2,…8
このような評価はコンピユータ等演算装置によ
れば容易かつ迅速であり、実時間でS量を表示で
きるので、系の制御ができる。
(発明の効果)
本発明の効果は次のとおりである。
1 ガス状Sの吸収による上記第群ピーク
(山)第群ピーク(谷)のスペクトルを利用
することにより、ガス状Sの高感度の検知・定
量がその場で可能となつた。
2 上記第群ピーク及び第群ピークのスペク
トルのピーク高から同時に定量を行なうため、
他物質から明確に分離して検知精度が向上し、
またSの定量精度が大巾に向上する。
3 本発明の高感度SモニターはS量のその場検
知・定量が可能であり、さらにコンピユータ等
演算装置と組合すことにより、各スペクトルの
吸光度から実時間でS量を検知定量し、該演算
装置の出力信号によりS投入量、S圧等をその
場で制御することができる。[Formula] n=1, 2,...8 Such evaluation is easy and quick using an arithmetic device such as a computer, and since the amount of S can be displayed in real time, the system can be controlled. (Effects of the invention) The effects of the invention are as follows. 1. By utilizing the spectrum of the above-mentioned first group peak (peak) and second group peak (trough) due to the absorption of gaseous S, it has become possible to detect and quantify gaseous S with high sensitivity on the spot. 2. In order to perform simultaneous quantification from the peak height of the spectra of the above-mentioned group peak and group peak,
Clear separation from other substances improves detection accuracy.
Furthermore, the accuracy of S quantitative determination is greatly improved. 3. The high-sensitivity S monitor of the present invention is capable of on-the-spot detection and quantification of the amount of S, and when combined with a calculation device such as a computer, the amount of S can be detected and quantified in real time from the absorbance of each spectrum, and the amount of S can be detected and quantified on the spot. The S input amount, S pressure, etc. can be controlled on the spot based on the output signal of the device.
第1図はガス状Sの吸光スペクトルである。第
2図は本発明方法及びモニターの概略を示す模式
図である。第3図aは本発明の実施例で用いた装
置の概略図であり、第3図bは第3図a装置にお
ける温度分布を示すグラフである。第4図は本発
明の実施例で得られた波長と吸光度の関係を示す
グラフ、第5図はS量と吸光度の関係を示すグラ
フである。第6図は谷ピークがSの検知・定量に
利用できる理由を示すための吸光スペクトルの模
式図である。
FIG. 1 shows the absorption spectrum of gaseous S. FIG. 2 is a schematic diagram showing the outline of the method and monitor of the present invention. FIG. 3a is a schematic diagram of the apparatus used in the embodiment of the present invention, and FIG. 3b is a graph showing the temperature distribution in the apparatus of FIG. 3a. FIG. 4 is a graph showing the relationship between wavelength and absorbance obtained in an example of the present invention, and FIG. 5 is a graph showing the relationship between S amount and absorbance. FIG. 6 is a schematic diagram of an absorption spectrum to show why the valley peak can be used for detecting and quantifying S.
Claims (1)
268nm、270.5nm、273nm、276nm、279nm、
282nmの山ピークを有する第群ピークのうちの
少なくとも1つ及び波長264.5nm、267nm、
269.5nm、272nm、275nm、278nm、281nmの谷
ピークを有する第群ピークのうちの少なくとも
一つのスペクトル線を、入射し、上記ガス状Sに
よる上記入射スペクトル線の吸収を測定し、前記
スペクトル線の光強度のピーク高さからSの検
知・定量を行う方法。 2 炉またはヒータ付容器の光の進行方向に窓部
を設け、一方の窓部に波長263nm、265.5nm、
268nm、270.5nm、273nm、276nm、279nm、
282nmの山ピークを有する第群ピークのうちの
少なくとも1つ及び波長264.5nm、267nm、
269.5nm、272nm、275nm、278nm、281nmの谷
ピークを有する第群ピークのうちの少なくとも
1つのスペクトル線発光部、他方の窓にはヒータ
付容器内のガス状Sを通過した前記スペクトル線
の光強度のピーク高さからSを検知定量する受
光、測光部を接続してなる、Sモニター。 3 光強度のピーク高さからSを検知・定量し、
それによりS投入量コントロール・S圧コントロ
ールを実時間で制御する特許請求の範囲第2項記
載のSモニター。 4 発光部がホロカソードランプからなる特許請
求の範囲第2項記載のSモニター。 5 発光部または受光部が第群ピークおよび第
群ピークを中心とするフイルタを有する特許請
求の範囲第2項記載のSモニター。[Claims] 1 Gaseous S has wavelengths of 263 nm, 265.5 nm,
268nm, 270.5nm, 273nm, 276nm, 279nm,
At least one of the group peaks having a peak of 282 nm and a wavelength of 264.5 nm, 267 nm,
At least one spectral line of the first group peaks having valley peaks of 269.5 nm, 272 nm, 275 nm, 278 nm, and 281 nm is incident, absorption of the incident spectral line by the gaseous S is measured, and the absorption of the incident spectral line by the gaseous S is measured. A method for detecting and quantifying S based on the peak height of light intensity. 2. A window is provided in the direction of light propagation of the furnace or container with a heater, and one window has wavelengths of 263 nm, 265.5 nm,
268nm, 270.5nm, 273nm, 276nm, 279nm,
At least one of the group peaks having a peak of 282 nm and a wavelength of 264.5 nm, 267 nm,
At least one spectral line light-emitting part of the first group of peaks having valley peaks of 269.5 nm, 272 nm, 275 nm, 278 nm, and 281 nm, and the other window contains light of the spectral line that has passed through the gaseous S in the heater-equipped container. The S monitor consists of a light receiving and photometering unit that detects and quantifies S based on the intensity peak height. 3 Detect and quantify S from the peak height of light intensity,
The S monitor according to claim 2, which controls S input amount control and S pressure control in real time. 4. The S monitor according to claim 2, wherein the light emitting section comprises a hollow cathode lamp. 5. The S monitor according to claim 2, wherein the light-emitting section or the light-receiving section has a filter centered on a group peak and a filter centered on the group peak.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP94585A JPS61160045A (en) | 1985-01-09 | 1985-01-09 | S detection/quantification method and S monitor |
| US06/816,843 US4733084A (en) | 1985-01-09 | 1986-01-07 | Method of detection and quantitative determination of sulfur and sulfur monitor using the method |
| DE8686100248T DE3682592D1 (en) | 1985-01-09 | 1986-01-09 | METHOD FOR DETECTING AND QUANTATIVE DETERMINATION OF SULFUR AND SULFUR MONITOR USING THIS METHOD. |
| EP86100248A EP0187675B1 (en) | 1985-01-09 | 1986-01-09 | Method of detection and quantitative determination of sulfur and sulfur monitor using the method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP94585A JPS61160045A (en) | 1985-01-09 | 1985-01-09 | S detection/quantification method and S monitor |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11515790A Division JPH0315739A (en) | 1990-05-02 | 1990-05-02 | S detection/quantification method and S monitor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61160045A JPS61160045A (en) | 1986-07-19 |
| JPH0414742B2 true JPH0414742B2 (en) | 1992-03-13 |
Family
ID=11487810
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP94585A Granted JPS61160045A (en) | 1985-01-09 | 1985-01-09 | S detection/quantification method and S monitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61160045A (en) |
-
1985
- 1985-01-09 JP JP94585A patent/JPS61160045A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61160045A (en) | 1986-07-19 |
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