JPH0423721B2 - - Google Patents
Info
- Publication number
- JPH0423721B2 JPH0423721B2 JP59077214A JP7721484A JPH0423721B2 JP H0423721 B2 JPH0423721 B2 JP H0423721B2 JP 59077214 A JP59077214 A JP 59077214A JP 7721484 A JP7721484 A JP 7721484A JP H0423721 B2 JPH0423721 B2 JP H0423721B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- voltage
- metal lump
- receiving element
- address
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
- G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Geophysics And Detection Of Objects (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、熱間圧延設備や連鋳設備等における
金属塊の幅方向位置検出方法及びその装置に関す
るものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method and apparatus for detecting the position in the width direction of a metal ingot in hot rolling equipment, continuous casting equipment, etc.
圧延又は連鋳加工では、製品歩留りを向上する
うえで精密な板幅管理が望まれる。特に熱間圧延
の場合は、圧延機で水平圧下するために圧延材に
幅広がりが生じるが、これを放置したまま圧延を
繰返すと、製品板幅が設定値よりも極めて大きい
ものとなり、後工程のサイドトリミング等で切捨
てる部分が増大し、歩留りの低下を招来する。
In rolling or continuous casting processing, precise sheet width control is desired in order to improve product yield. In particular, in the case of hot rolling, the width of the rolled material widens due to the horizontal reduction in the rolling mill, but if rolling is repeated without this, the width of the product sheet will be much larger than the set value, and the later process The portion to be cut away due to side trimming, etc. increases, resulting in a decrease in yield.
一方、シングルスタンドにおけるリバース圧
延、連続スタンドにおける先後端部通過時等の無
張力圧延においては、蛇行が生じ易いため、圧延
材の蛇行量を検出して、左右のロールギヤツプの
調整を行う必要がある。ところが、従来の圧延荷
重差に基づいて蛇行を検出して制御する方式で
は、圧延材の端折れによる端部2枚噛みや先後端
の不規則状部の圧延時に発生する圧延荷重差等を
蛇行現象と判断し、圧下レベル調整を狂わし、か
えつて圧延作業を中断させる、等の致命的な欠陥
があつた。 On the other hand, meandering tends to occur in reverse rolling on a single stand and in tensionless rolling when passing the leading and trailing ends on a continuous stand, so it is necessary to detect the amount of meandering in the rolled material and adjust the left and right roll gaps. . However, with the conventional method of detecting and controlling meandering based on the difference in rolling load, the difference in rolling load that occurs when rolling two sheets at the end due to end bending of the rolled material or irregularly shaped parts at the leading and trailing ends, etc. This was determined to be a fatal defect, causing the rolling reduction level adjustment to be disrupted and the rolling operation to be interrupted.
そこで、最近では、熱間圧延材が、連鋳材等の
加熱金属塊の板幅或いは蛇行等を高精度で制御す
ることが望まれ、その基になる板幅或いは蛇行等
の検出手段として光学的方向位置検出器が開発さ
れている。この装置は第1図に示す原理に基づい
ている。 Therefore, in recent years, it has become desirable to control the width or meandering of heated metal ingots such as continuous cast materials with high precision, and as a means of detecting the width or meandering of hot-rolled materials, optical A target position detector has been developed. This device is based on the principle shown in FIG.
すなわち、圧延材1の下方から投光器2により
圧延材1を投光し、上方、つまり圧延材1の表面
方向部位に設けた受光器3によつて圧延材1に遮
蔽されない部分の受光量を測定し、板幅を検出す
るものである。受光器3には、光電素子(フオト
ダイオード)を利用したもの、テレビカメラ式撮
像管を利用したもの等があるが、以下、光電素子
を利用したものについて説明する。テレビカメラ
式撮像管を用いた場合も原理的には変らない。光
電素子5は投光器2と平行に、複数個、直線状に
配列し(個数単位として一般に「ビツト」を用い
る)、レンズ6を通して集光した像の受光量に比
例した電気信号7を発する。この受光量を所定の
変換器により一定レベルでスレツシユホールドす
ることにより、電気信号をオン、オフ2種類の同
期信号8に変換する。1ビツト当りの集光距離は
レンズ6の集光角度2α(又は集光範囲L)及び被
測定物としての圧延材1とレンズ6との間の距離
Hによつて定まるので、全光電素子数をNビツト
とすると、板幅Wは次式で求めることができる。 That is, the rolled material 1 is illuminated by a light emitter 2 from below the rolled material 1, and the amount of light received in the portion not shielded by the rolled material 1 is measured by the light receiver 3 provided above, that is, in the surface direction of the rolled material 1. This is used to detect the board width. The light receiver 3 includes one using a photoelectric element (photodiode), one using a television camera type image pickup tube, etc., and the one using a photoelectric element will be explained below. The principle remains the same even when a television camera type image pickup tube is used. A plurality of photoelectric elements 5 are arranged in a straight line in parallel with the light projector 2 (a "bit" is generally used as a unit of number), and emit an electric signal 7 proportional to the amount of light received from an image focused through a lens 6. By thresholding the amount of received light at a constant level using a predetermined converter, the electric signal is converted into two types of synchronization signals 8: on and off. Since the focusing distance per 1 bit is determined by the focusing angle 2α (or focusing range L) of the lens 6 and the distance H between the rolled material 1 as the object to be measured and the lens 6, the total number of photoelectric elements is Assuming that W is N bits, the plate width W can be determined by the following formula.
W=L×{N−(N1+N2)}/N
=2Htanα×{N−(N1+N2)}/N…… ()
而して、このような板幅検出手段を圧延材等の
蛇行検出に適用することも考えられ、既に一部で
は実施されているが、特に熱間圧延では圧延自体
が800℃前後の高温であるため、第1図に示す投
光器2を廃して圧延自体の光を検知する方式が有
効である。この場合の原理を第2図により説明す
ると、圧延材1の左右両側、すなわち、ワークサ
イドとドライブサイドの夫夫に受光器9,10を
設け、該受光器9,10により圧延材1の光を検
知するようにする。検知時には、受光素子11,
12の各ビツトごとに集光が行われ、各ビツトご
とに集光された光の強さに比例する電圧が発生す
る。例えば、受光素子11で検出された電圧と受
光素子11の各ビツトとの関係を図示すると第3
図に示すようになり、電圧差が発生し始めた位置
が圧延材1のワークサイド側端部として検知され
る。なお、第3図を映像信号と称する。第3図に
おいて、tsは夫々の受光素子11,12の全ビツ
トの走査に要する走査周期、Vは圧延材幅端光量
を表わす電圧である。 W=L×{N-(N 1 +N 2 )}/N = 2Htanα×{N-(N 1 +N 2 )}/N... () Therefore, such a strip width detection means can be used for rolling material It is also possible to apply it to meandering detection such as the A method that detects its own light is effective. The principle in this case will be explained with reference to FIG. to be detected. At the time of detection, the light receiving element 11,
Light is focused for each of the 12 bits, and a voltage proportional to the intensity of the focused light is generated for each bit. For example, if the relationship between the voltage detected by the light receiving element 11 and each bit of the light receiving element 11 is illustrated, the third
As shown in the figure, the position where the voltage difference begins to occur is detected as the work side end of the rolled material 1. Note that FIG. 3 is referred to as a video signal. In FIG. 3, ts is the scanning period required to scan all the bits of each of the light receiving elements 11 and 12, and V is the voltage representing the amount of light at the width end of the rolled material.
ところで、一般的には圧延材の種類によつて温
度が異なるため、第2図に示す受光器9,10へ
入る光量に温度による差が生じる。すなわち、温
度の高い圧延材で走査周期tsを大きくすると、受
光素子11,12の入光時間が長くなり、圧延材
から発せられるローラーテーブル等に反射した弱
い光も多量に受光素子11,12に受光される結
果、第4図のイに示すように、電圧Vが圧延材1
から離れた位置で急激に立上がり、幅端部の検出
精度が悪化する。又逆に走査周期がts短かすぎる
と、受光素子11,12の各ビツトへの入光時間
が短かくなり、光が十分に受光素子11,12に
受光されない結果、第4図のロに示すように電圧
Vのレベルが低下し、板幅端部検出の信号が板端
位置を判定するための基準となるスレツシユレベ
ル電圧VLに達せず、検出が不可能となる虞れが
ある。従つて、走査周期tsを自動的にコントロー
ルし、受光素子11,12に受光される光量を常
に一定に保持し、電圧Vを第4図のハに示すよう
に調節することが必要となる。 Incidentally, since the temperature generally varies depending on the type of rolled material, a difference occurs in the amount of light entering the light receivers 9 and 10 shown in FIG. 2 depending on the temperature. In other words, when the scanning period t s is increased for a hot rolled material, the light receiving time of the light receiving elements 11 and 12 becomes longer, and a large amount of weak light emitted from the rolled material and reflected on the roller table etc. is also transmitted to the light receiving elements 11 and 12. As a result of the light being received by the rolled material 1, the voltage V increases as shown in FIG.
It rises suddenly at a position far away from , deteriorating the detection accuracy at the width end. On the other hand, if the scanning period is too short, the time for light to enter each bit of the light receiving elements 11 and 12 will be shortened, and as a result, the light will not be sufficiently received by the light receiving elements 11 and 12, as shown in FIG. As shown in the figure, the level of the voltage V decreases, and the signal for detecting the edge of the strip does not reach the threshold level voltage V L , which is the reference for determining the edge position of the strip, and there is a risk that detection will become impossible. be. Therefore, it is necessary to automatically control the scanning period ts , to keep the amount of light received by the light receiving elements 11 and 12 constant, and to adjust the voltage V as shown in Fig. 4C. .
本発明は、高温の金属塊の幅方向位置を検出す
る際に、走査周期を金属塊の温度に対応した最適
な時間になるようにし、金属塊の幅方向位置を正
確に検出することにより上述の問題点を解決すべ
くなしたものである。
According to the present invention, when detecting the widthwise position of a hot metal lump, the scanning period is set to an optimal time corresponding to the temperature of the metal lump, and the widthwise position of the metal lump is accurately detected. This was done to solve the problem.
本発明においては、加熱された金属塊の発する
光を受光する受光素子群とレンズとを備え、該受
光素子を金属塊中央側より幅端方向へ走査し得る
ようにした検出器と、該検出器で検出された金属
塊の映像信号電圧と予め設定されたレベルの電圧
とを比較し、映像信号の電圧が設定されたレベル
の電圧以上になつたら信号を出力する比較器と、
該比較器よりの信号を受けたらそのときの前記検
出器の受光素子を番地を記憶する記憶回路と、該
記憶回路より送られて来た番地と前記設定された
レベルの電圧の発生する受光素子の番地の近傍の
番地との差を求める減算回路と、該減算回路で求
められた受光素子の番地の差と走査開始によりカ
ウントされるクロツクパルスのカウント数を比較
してクロツクパルスのカウント数が減算回路から
送られて来た受光素子の番地の差より大きくなつ
たら所定のスイツチを閉じる指令を与える比較器
と、スイツチが閉じたら金属塊の映像信号電圧を
ホールドするサンプルホールド回路を設けてい
る。
In the present invention, there is provided a detector comprising a group of light receiving elements and a lens for receiving light emitted from a heated metal lump, and capable of scanning the light receiving elements from the center side of the metal lump in the width direction; a comparator that compares the video signal voltage of the metal block detected by the device with a voltage at a preset level, and outputs a signal when the voltage of the video signal exceeds the voltage at the set level;
a memory circuit that stores the address of the light-receiving element of the detector at that time when a signal from the comparator is received, and a light-receiving element that generates the address sent from the memory circuit and a voltage of the set level; a subtraction circuit that calculates the difference between the address of the address and a neighboring address, and a subtraction circuit that compares the difference between the address of the light receiving element calculated by the subtraction circuit and the number of clock pulses counted at the start of scanning, and calculates the number of clock pulses counted. A comparator provides a command to close a predetermined switch when the difference is greater than the difference between the addresses of the light-receiving elements sent from the sensor, and a sample-hold circuit that holds the video signal voltage of the metal lump when the switch is closed.
従つて前記検出器により金属塊を中央側より幅
端方向へ走査し、該走査により得られた映像信号
の略中間レベルの電圧を発生する受光素子近傍の
受光素子が受けている光量から走査周期を決定
し、前記検出器により金属塊を中央側より幅端方
向へ、前記走査により決定された走査周期により
走査を行ない、略中間レベルの電圧を発生する受
光素子の番地を求めて金属塊の幅端位置を検出す
ることができる。 Therefore, the detector scans the metal block from the center side toward the width edges, and the scanning period is calculated based on the amount of light received by the light receiving element near the light receiving element that generates a voltage approximately at the middle level of the video signal obtained by the scanning. is determined, and the metal lump is scanned by the detector from the center side toward the width edge at the scanning period determined by the scanning, and the address of the light receiving element that generates a voltage at approximately the intermediate level is determined. The width end position can be detected.
以下、本発明の実施例を図面を参照しつつ説明
する。
Embodiments of the present invention will be described below with reference to the drawings.
先ず、走査時間(走査周期)の決め方について
第5図イ,ロ、第6図イ,ロにより説明すると、
素子数Nビツトの検出器で所定の走査時間により
圧延材の中央側より幅端側へ向けて走査を行い、
圧延材延の幅方向位置を検出した場合に、スレツ
シユレベル電圧VLの信号が得られた素子の番地
をNC番地とすると、それよりもNT番地手前の電
圧VTを検出し、この電圧VTの大きさから走査時
間を決定する。例えば、第5図イのような光量の
少ない映像信号の場合板端での信号は減衰し、第
5図ロに示すようにNT番地手前の電圧VTは低く
なるので、走査時間を長くし、第6図イのような
光量の多い映像信号の場合、板端での信号の立ち
上がりは急峻で、第6図ロに示すようにNT番地
手前の電圧VTは高くなるので走査時間を短くす
る。 First, how to determine the scanning time (scanning period) will be explained with reference to Fig. 5 A and B and Fig. 6 A and B.
A detector with N-bit elements scans the rolled material from the center to the width end for a predetermined scanning time,
When the width direction position of the rolled material is detected, if the address of the element from which the signal of the threshold level voltage V L was obtained is the N C address, then the voltage V T at the N T address before it is detected, The scanning time is determined from the magnitude of this voltage V T . For example, in the case of a video signal with a small amount of light as shown in Figure 5 (a), the signal at the edge of the plate is attenuated, and as shown in Figure 5 (b), the voltage V T before address N T becomes low, so the scanning time is lengthened. However, in the case of a video signal with a large amount of light as shown in Figure 6 (a), the rise of the signal at the edge of the board is steep, and as shown in Figure 6 (b), the voltage V T before the N T address becomes high, so the scanning time decreases. shorten.
次に、圧延材の幅方向位置の演算タイミングを
第7図により説明すると、検出開始点Aから最初
の1走査周期目においては、スレツシユレベル電
圧VLの得られたNC番地の検出を行ない、2走査
周期目においては、1走査周期目のNC番地より
NT番地手前の電圧VTをサンプルホールドすると
共に2走査周期目のスレツシユレベル電圧VLの
得られたNC番地を再記憶し、3走査周期目は2
走査周期目で得られたNT番地の電圧VTに対応す
るよう検出器がコントロールされ、圧延材の幅端
位置が演算されてその結果Bが出力され、4走査
周期目は、2走査周期目のNC番地よりNT番地手
前の電圧VTをサンプルホールドすると共に4走
査周期目のスレツシユレベル電圧VLの得られた
NC番地を再記憶し、5走査周期目は4走査周期
目で得られたNT番地の電圧VTに対応するよう検
出器がコントロールされ、圧延材の幅端位置が演
算されてその結果Bが出力され、以下同様に偶数
番地目では、その前の走査周期目のNC番地より
NT番地手前の電圧VTをサンプルホールドすると
共に当該走査周期目のスレツシユレベル電圧VL
の得られたNC番地を再記憶し、奇数走査周期目
では前の走査周期目で得られたNT番地の電圧VT
に対応するよう検出器がコントロールされ、圧延
材の幅端位置が演算されてその結果が出力され
る。而して、このように走査周期を適正にコント
ロールしたうえで、スレツシユレベル電圧VLの
位置を圧延材の幅端部と判断する。 Next, to explain the calculation timing of the width direction position of the rolled material using FIG. 7, in the first scanning cycle from the detection start point A, the detection of the N C address where the threshold level voltage V L is obtained is performed. In the second scanning period, from the N C address of the first scanning period.
The voltage V T before the N T address is sampled and held, and the N C address where the threshold level voltage V L of the second scanning period was obtained is stored again.
The detector is controlled to correspond to the voltage V T at address N T obtained in the 4th scanning cycle, the width end position of the rolled material is calculated, and the result B is output, and in the 4th scanning cycle, the 2nd scanning cycle The voltage V T at the N T address before the N C address of the second scan is sampled and held, and the threshold level voltage V L of the fourth scanning period is obtained.
The N C address is memorized again, and in the 5th scanning cycle, the detector is controlled so as to correspond to the voltage V T at the N T address obtained in the 4th scanning cycle, and the width end position of the rolled material is calculated. B is output, and in the same way, at even-numbered addresses, from the N C address of the previous scanning period.
Sample and hold the voltage V T before the N T address, and set the threshold level voltage V L of the corresponding scanning cycle.
The obtained N C address is stored again, and in the odd scan period, the voltage V T at the N T address obtained in the previous scan period is stored.
The detector is controlled to correspond to this, the width end position of the rolled material is calculated, and the result is output. After appropriately controlling the scanning period in this way, the position of the threshold level voltage V L is determined to be the width end of the rolled material.
なお、上記のような走査を行う際、走査方向は
圧延材の中心側から幅端方向であるがこれは次の
理由による。すなわち、第8図ロに示すような圧
延材1の走査を行うと、映像信号は例えば第8図
イのようになるが、水滴等の外光を反射させてそ
の入光によつて第8図イのX、Yのようなレベル
変化が生じた場合、圧延材1の幅端側から中央側
へ走査すると、最初のレベル変化Xを板端部と判
断してしまう虞れがある。しかし、中央側から幅
端部へ走査すると、上述のような外乱の影響を除
去できる。 Note that when performing the above scanning, the scanning direction is from the center side to the width end direction of the rolled material for the following reason. That is, when the rolled material 1 is scanned as shown in FIG. 8B, the video signal becomes, for example, as shown in FIG. When a level change such as X and Y in Figure A occurs, when scanning from the width end side to the center side of the rolled material 1, there is a risk that the first level change X will be determined to be at the plate end. However, by scanning from the center side to the width ends, the influence of the above-mentioned disturbance can be removed.
次に、本発明の具体例を第9図により説明す
る。 Next, a specific example of the present invention will be explained with reference to FIG.
図中21は図示していない検出器で検出された
圧延材映像信号電圧Vと設定されたスレツシユレ
ベル電圧VLとを比較し、V≧VLの場合に信号を
出力する比較器、22は比較器21からの信号に
よりその時のクロツクパルスのカウント数NC
(NC番地)を記憶する記憶回路、23は検出器か
らのイネーブル信号VIにより記憶回路22に記
憶されているクロツクパルスのカウント数NCが
移行され記憶される記憶回路、24は記憶回路2
3からのクロツクパルスのカウント数NCと設定
器25で設定されたカウント数NTを減算する減
算回路、26は減算回路24から送られて来た
NC番地よりNT番地手前のカウント数NC−NTとカ
ウンタ27から送られて来たカウント数とを比較
しカウンタ27でのカウント数がカウント数NC
−NTより大きくなつたときに信号を出力し得る
ようにした比較器、28は比較器26よりの指令
信号により閉じるスイツチ、29はスイツチ28
が閉じたらそのときの圧延材映像信号の電圧VT
をホールドするサンプルホールド回路、30はゲ
イン、31は電圧信号をそれに対応する周波数の
パルスに変換するV/F変換回路、32は31の
出力パルスをカウントするカウンタ、33はスタ
ートパルス発生回路である。 In the figure, 21 is a comparator that compares the rolled material video signal voltage V detected by a detector (not shown) with a set threshold level voltage V L and outputs a signal when V≧V L ; is the number of clock pulses counted at that time according to the signal from the comparator 21.
(N C address); 23 is a memory circuit in which the clock pulse count N C stored in the memory circuit 22 is transferred and stored by the enable signal V I from the detector; 24 is a memory circuit 2;
26 is sent from the subtraction circuit 24 .
Compare the count number N C before N T address from N C address with the count number sent from counter 27, and the count number at counter 27 is the count number N C
A comparator capable of outputting a signal when the signal becomes larger than -N T ; 28 is a switch that closes in response to a command signal from the comparator 26; 29 is a switch 28;
When V T closes, the voltage of the rolled material video signal at that time V T
30 is a gain, 31 is a V/F conversion circuit that converts the voltage signal into a pulse of the corresponding frequency, 32 is a counter that counts the output pulses of 31, and 33 is a start pulse generation circuit. .
スタートパルスにより全てのカウンタ27,3
2はクリアされ、同時に初期電圧VOに対応する
周波数のクロツクパルスのカウントがカウンタ3
2により開始される。又、圧延材の発する光によ
つて検出器の受光素子に生ずる映像信号電圧Vを
各ビツトごとに比較器21に出力し、該比較器で
V−VLが比較、演算される。而して、V≧VLと
なつた時に、比較器21から記憶回路22に信号
が出力され、そのときのクロツクパルスのカウン
ト数NCが記憶回路22に記憶される。 All counters 27 and 3 are activated by the start pulse.
2 is cleared, and at the same time the count of clock pulses with a frequency corresponding to the initial voltage V O is counted by counter 3.
Started by 2. Further, the video signal voltage V generated in the light receiving element of the detector by the light emitted from the rolled material is outputted to the comparator 21 for each bit, and the comparator compares and calculates V-V L. When V≧V L , a signal is output from the comparator 21 to the memory circuit 22, and the count number N C of clock pulses at that time is stored in the memory circuit 22.
検出器からイネーブル信号が発生すると、カウ
ント数NCは記憶回路23に移行されると共に減
算回路24でNC−NTが演算され、サンプルホー
ルド回路29が待機の状態になる。 When an enable signal is generated from the detector, the count number N C is transferred to the storage circuit 23, and at the same time, N C -N T is calculated in the subtraction circuit 24, and the sample and hold circuit 29 is placed in a standby state.
クロツクパルスが検出器の受光素子の数だけ数
え終つたら再度スタートパルスが発生し、クロツ
クパルスのカウント数が比較器26でNC−NTと
比較され、クロツクパルスのカウント数がNC−
NTより大きくなると、比較器26からの出力信
号がスイツチ28を閉じ、そのときの映像信号の
電圧VTがスレツシユレベル電圧VLに対応する受
光素子のNC番地よりNT番地手前の映像信号とし
てサンプルホールド回路29に保持される。又同
時にこの走査周期におけるスレツシユレベル電圧
VLに対応するカウント数NCが前述と同様にして
求められ、記憶回路22に記憶される。 When the clock pulse has finished counting the number of light-receiving elements of the detector, a start pulse is generated again, and the comparator 26 compares the clock pulse count with N C -NT , and the clock pulse count becomes N C -.
When it becomes larger than N T , the output signal from the comparator 26 closes the switch 28, and the voltage V T of the video signal at that time is at the address N T before the address N C of the light receiving element corresponding to the threshold level voltage V L. It is held in the sample hold circuit 29 as a video signal. At the same time, the threshold level voltage in this scanning period
The count number N C corresponding to V L is obtained in the same manner as described above and stored in the memory circuit 22.
更に、検出器からイネーブル信号VIが発生し、
再度スタートパルスが発生し、切り替えスイツチ
34が切り替わつて電圧VTに対応する周波数の
クロツクパルスのカウントが開始される。 Furthermore, an enable signal V I is generated from the detector,
A start pulse is generated again, the changeover switch 34 is switched, and counting of clock pulses with a frequency corresponding to the voltage V T is started.
以下、上記のシーケンスが繰り返されるが、検
出器の受光素子の走査周期は圧延材幅端部検出時
には電圧VTに応じて制御され、スレツシユレベ
ル電圧VLの位置が圧延材歩幅端部と判断される。
このVLの値は調整によつて適宜変更できること
は言うまでもない。 Thereafter, the above sequence is repeated, but the scanning period of the light receiving element of the detector is controlled according to the voltage V T when detecting the edge of the width of the rolled material, and the position of the threshold level voltage V L coincides with the edge of the stride of the rolled material. be judged.
It goes without saying that the value of V L can be changed as appropriate by adjustment.
なお、本発明の実施例においては圧延材の幅端
部の位置を検出する場合について説明したが、圧
延材に限らず高温の金属塊ならいかなる金属塊に
対しても適用可能なこと、その他、本発明の要旨
を逸脱しない範囲内で種々変更を加え得ること、
等は勿論である。 In the embodiments of the present invention, the case where the position of the width end of the rolled material is detected has been described, but the present invention is applicable not only to rolled materials but also to any high-temperature metal lump. that various changes may be made without departing from the gist of the present invention;
Of course, etc.
本発明の金属塊の幅方向位置検出方法及びその
装置によれば、圧延材板端の適正な映像信号を得
ることが可能になるので金属塊の幅端部位置を正
確に検出することができる。
According to the method and apparatus for detecting the widthwise position of a metal lump of the present invention, it is possible to obtain an appropriate video signal of the edge of the rolled material plate, so that the position of the width end of the metal lump can be accurately detected. .
第1図は金属塊等の材料の幅方向位置を検出す
る原理の説明図、第2図は加熱された金属塊の幅
方向位置を検出する原理の説明図、第3図は第2
図で示す幅方向位置検出の場合に幅端部に生じる
光量差を表わす信号と走査時間との関係を示すグ
ラフ、第4図は加熱された金属塊の幅端部を検出
する場合に走査時間の変更による出力信号の変化
を示す説明図、第5図イは光量が少ない場合の本
発明における映像信号の説明図、第5図ロは第5
図イの映像信号の場合にサンプルホールドされた
所定の番地の信号電圧の説明図、第6図イは光量
が多い場合の本発明における映像信号の説明図、
第6図ロは第6図イの映像信号の場合にサンプル
ホールドされた所定の番地の電圧の説明図、第7
図は本発明において金属塊の走査を行う場合の演
算タイミングの説明図、第8図イ,ロは本発明に
おいて検出器の走査方向を圧延材中央側から幅端
方向とする理由の説明図、第9図は本発明を具体
化した一実施例の説明図である。
図中21は比較器、22,23は記憶回路、2
4は減算回路、26は比較器、27はカウンタ、
28はスイツチ、29はサプルホールド回路、3
1はV/F変換回路、32はカウンタ、33はス
タートパルス発生回路を示す。
Fig. 1 is an explanatory diagram of the principle of detecting the widthwise position of a material such as a metal lump, Fig. 2 is an explanatory diagram of the principle of detecting the widthwise position of a heated metal lump, and Fig. 3 is an explanatory diagram of the principle of detecting the widthwise position of a material such as a metal lump.
The graph shown in the figure shows the relationship between the signal representing the difference in light amount that occurs at the width edge and the scanning time in the case of width direction position detection. 5A is an explanatory diagram showing the change in the output signal due to a change in the amount of light. FIG.
An explanatory diagram of the signal voltage at a predetermined address sampled and held in the case of the video signal in Figure A, Figure 6A is an explanatory diagram of the video signal in the present invention when the amount of light is large,
Figure 6B is an explanatory diagram of the voltage at a predetermined address sampled and held in the case of the video signal in Figure 6A;
The figure is an explanatory diagram of the calculation timing when scanning a metal lump in the present invention, and Figures 8A and 8B are explanatory diagrams of the reason why the scanning direction of the detector is from the center side of the rolled material to the width end direction in the present invention, FIG. 9 is an explanatory diagram of an embodiment embodying the present invention. In the figure, 21 is a comparator, 22 and 23 are storage circuits, and 2
4 is a subtraction circuit, 26 is a comparator, 27 is a counter,
28 is a switch, 29 is a supply hold circuit, 3
1 is a V/F conversion circuit, 32 is a counter, and 33 is a start pulse generation circuit.
Claims (1)
素子群とレンズとより構成された検出器により金
属塊幅端位置を検出する際に、受光素子を金属塊
の中央側より幅端方向へ走査し、該走査により得
られた映像信号中、予め設定されたレベルの電圧
を発生する受光素子近傍の受光素子が受けている
光量から走査周期を決定し、前記検出器の受光素
子を金属塊の中央側より幅方向へ、決定された走
査周期により走査を行ない、予め設定されたレベ
ルの電圧を発生する受光素子の番地を求めて金属
塊の幅端位置を検出することを特徴とする金属塊
の幅方向位置検出方法。 2 加熱された金属塊の発する光を受光する受光
素子群とレンズとにより構成され金属塊中央側よ
り幅端方向へ走査し得るようにした検出手段と、
該検出手段で検出された金属塊の映像信号電圧と
予め設定されたレベルの電圧とを比較し、映像信
号電圧が設定されたレベルの電圧以上になつたら
信号を出力する比較手段と、該比較手段からの信
号を受けたときの前記検出手段の受光素子の番地
を記憶する記憶手段と、該記憶手段から送られて
来た番地と前記設定されたレベルの電圧の発生す
る受光素子の番地の近傍の番地との差を求める減
算手段と、該減算手段で求められた値と走査開始
によりカウントされるクロツクパルスのカウント
数とを比較して、クロツクパルスのカウント数が
減算手段から送られて来た値以上になつたら所定
のスイツチに閉じる指令を与える比較手段と、ス
イツチが閉じたら金属塊の映像信号電圧をホール
ドするサンプルホールド手段と、そのホールドさ
れた電圧をもとに走査周期を変更する手段とを設
けたことを特徴とする金属塊の幅方向位置検出装
置。[Scope of Claims] 1. When detecting the width end position of a metal lump using a detector composed of a light-receiving element group and a lens that receive light emitted from a heated metal lump, the light-receiving element is placed on the center side of the metal lump. The scanning period is determined from the amount of light received by a light-receiving element near the light-receiving element that generates a voltage at a preset level in the video signal obtained by scanning, and The width end position of the metal lump is detected by scanning the light receiving element from the center side of the metal lump in the width direction at a determined scanning period to find the address of the light receiving element that generates a voltage at a preset level. A method for detecting the position in the width direction of a metal lump. 2. A detection means configured by a lens and a light-receiving element group that receives light emitted from the heated metal lump, and capable of scanning from the center side of the metal lump toward the width end;
Comparing means for comparing the video signal voltage of the metal lump detected by the detection means with a voltage at a preset level, and outputting a signal when the video signal voltage exceeds the voltage at the set level; storage means for storing the address of the light-receiving element of the detection means when receiving the signal from the means; and a storage means for storing the address sent from the storage means and the address of the light-receiving element generating the voltage at the set level. A subtracting means for calculating the difference from a neighboring address compares the value obtained by the subtracting means with the clock pulse count counted at the start of scanning, and the clock pulse count is sent from the subtracting means. Comparing means for giving a command to close a predetermined switch when the voltage exceeds a value, sample-holding means for holding the video signal voltage of the metal lump when the switch is closed, and means for changing the scanning period based on the held voltage. A device for detecting a position in the width direction of a metal lump.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59077214A JPS60220802A (en) | 1984-04-17 | 1984-04-17 | Method and device for detecting position in width direction of metal lump |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59077214A JPS60220802A (en) | 1984-04-17 | 1984-04-17 | Method and device for detecting position in width direction of metal lump |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60220802A JPS60220802A (en) | 1985-11-05 |
| JPH0423721B2 true JPH0423721B2 (en) | 1992-04-23 |
Family
ID=13627582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59077214A Granted JPS60220802A (en) | 1984-04-17 | 1984-04-17 | Method and device for detecting position in width direction of metal lump |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60220802A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5966194B2 (en) * | 2011-11-02 | 2016-08-10 | 株式会社明電舎 | Rotating machine gap measuring device |
-
1984
- 1984-04-17 JP JP59077214A patent/JPS60220802A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60220802A (en) | 1985-11-05 |
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