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JPH0467888B2 - - Google Patents
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JPH0467888B2 - - Google Patents

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Publication number
JPH0467888B2
JPH0467888B2 JP60223259A JP22325985A JPH0467888B2 JP H0467888 B2 JPH0467888 B2 JP H0467888B2 JP 60223259 A JP60223259 A JP 60223259A JP 22325985 A JP22325985 A JP 22325985A JP H0467888 B2 JPH0467888 B2 JP H0467888B2
Authority
JP
Japan
Prior art keywords
video signal
voltage difference
voltage
comparator
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60223259A
Other languages
Japanese (ja)
Other versions
JPS6282306A (en
Inventor
Hiroaki Kuwano
Shinichiro Taniguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IHI Corp
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Ishikawajima Harima Heavy Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd, Ishikawajima Harima Heavy Industries Co Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP22325985A priority Critical patent/JPS6282306A/en
Publication of JPS6282306A publication Critical patent/JPS6282306A/en
Publication of JPH0467888B2 publication Critical patent/JPH0467888B2/ja
Granted legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、高温の金属塊の幅方向位置を検出す
る際に検出器の視野中を水や水蒸気等の外乱が遮
つた場合でも、良好な精度で金属塊の幅端位置を
検出し得るようにした、金属塊の幅方向位置検出
方法及びその装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention can detect the position of a hot metal lump in the width direction even if disturbances such as water or steam block the field of view of the detector. The present invention relates to a method and apparatus for detecting the widthwise position of a metal lump, which enables the width end position of the metal lump to be detected with high precision.

[従来の技術] 圧延又は連続加工では、製品歩留りを向上する
うえで精密な板幅管理が望まれる。特に熱間圧延
の場合は、圧延機で水平圧下すると圧延材に幅広
がりが生じるが、これを放置したまま圧延を繰返
すと、製品板幅が設定値よりも極めて大きいもの
となり、後工程のサイドトリミング等で切捨てる
部分が増大し、歩留りの低下を招来する。
[Prior Art] In rolling or continuous processing, precise sheet width control is desired in order to improve product yield. Particularly in the case of hot rolling, horizontal rolling in a rolling mill causes the rolled material to widen in width, but if this is left as is and rolling is repeated, the width of the product will be much larger than the set value, resulting in side The portion to be cut off due to trimming or the like increases, resulting in a decrease in yield.

一方、シングルスタンドにおけるリバース圧
延、連続スタンドにおける先後端部通過時等の無
張力圧延においては、蛇行が生じ易いため、圧延
材の蛇行量を検出して、左右のロールギヤツプの
調整を行う必要がある。ところが、従来の圧延荷
重差に基づいて蛇行を検出して制御する方式で
は、圧延材の端折れによる端部2枚噛みや先後端
の不規則形状部の圧延時に発生する圧延荷重差等
を蛇行現象と判断し、圧下レベル調整を狂わし、
かえつて圧延作業を中断させる、等の致命的な欠
陥があつた。
On the other hand, meandering tends to occur in reverse rolling on a single stand and in tensionless rolling when passing the leading and trailing ends on a continuous stand, so it is necessary to detect the amount of meandering in the rolled material and adjust the left and right roll gaps. . However, with the conventional method of detecting and controlling meandering based on the difference in rolling load, it is possible to detect and control meandering based on the difference in rolling load that occurs when two pieces of the rolled material are bent due to end bending or when rolling irregularly shaped parts at the leading and trailing ends. It was determined that this was a phenomenon, and the reduction level adjustment was disrupted.
On the contrary, there were fatal defects that caused the rolling operation to be interrupted.

そこで、最近では、熱間圧延材、連鋳材等の加
熱金属塊の板幅或いは蛇行等を高精度で制御する
ことが望まれ、その基になる板幅或いは蛇行等の
検出手段として光学的幅方向位置検出器が開発さ
れている。この装置は第4図に示す原理に基づい
ている。
Therefore, in recent years, it has become desirable to control the plate width or meandering of heated metal ingots such as hot-rolled materials and continuously cast materials with high precision, and optical methods are being used as a means of detecting the plate width or meandering, etc. A widthwise position detector has been developed. This device is based on the principle shown in FIG.

すなわち、圧延材1の下方から投光器2により
圧延材1を投光し、上方、つまり圧延材1の表面
方向部位に設けた受光器3によつて圧延材1に遮
蔽されない部分の受光量を測定し、板幅を検出す
るものである。受光器3には、光電素子(フオト
ダイオード)を利用したもの、テレビカメラ式撮
像管を利用したもの等があるが、以下、光電素子
を利用したものについて説明する。テレビカメラ
式撮像管を用いた場合も原理的には変らない。光
電素子4は投光器2と平行に、複数個、直線状に
配列され(個数単位として一般に「ビツト」を用
いる)、レンズ5を通して集光した像の受光量に
比例した電気信号6を発する。この受光量を所定
の変換器により一定レベルでスレツシユホールド
することにより、電気信号をオン、オフ2種類の
同期信号7に変換する。1ビツト当りの集光距離
はレンズ5の集光角度2α(又は集光範囲L)及び
被測定物としての圧延材1とレンズ5との間の距
離Hによつて定まるので、全光電素子数をNビツ
トとすると、板幅Wは次式で求めることができ
る。
That is, the rolled material 1 is illuminated by a light emitter 2 from below the rolled material 1, and the amount of light received in the portion not shielded by the rolled material 1 is measured by the light receiver 3 provided above, that is, in the surface direction of the rolled material 1. This is to detect the board width. The light receiver 3 includes one using a photoelectric element (photodiode), one using a television camera type image pickup tube, etc., and the one using a photoelectric element will be explained below. The principle remains the same even when a television camera type image pickup tube is used. A plurality of photoelectric elements 4 are arranged in a straight line in parallel with the light projector 2 (a "bit" is generally used as a unit of number), and emit an electric signal 6 proportional to the amount of light received from the image focused through the lens 5. By thresholding the amount of received light at a constant level using a predetermined converter, the electrical signal is converted into two types of synchronization signals 7, on and off. Since the focusing distance per 1 bit is determined by the focusing angle 2α (or focusing range L) of the lens 5 and the distance H between the rolled material 1 as the object to be measured and the lens 5, the total number of photoelectric elements is Assuming that W is N bits, the plate width W can be determined by the following formula.

W=L×{N−(N1+N2)}/N =2H tanα×{N−(N1+N2)}/N
……() 而して、このような板幅検出手段を圧延材等の
蛇行検出に適用することも考えられ、既に一部で
は実施されているが、特に熱間圧延では圧延材自
体が800℃前後の高温であるため、第4図に示す
投光器2を廃して圧延材自体の光を検知する方式
が有効である。この場合の原理を第5図により説
明すると、圧延材1の左右両側、すなわち、ワー
クサイドとドライブサイドの夫夫に受光器8,9
を設け、該受光器8,9により圧延材1の光を検
知するようにする。検知時には、受光素子10,
11の各ビツトごとに集光が行われ、各ビツトご
とに集光された光の強さに比例する電圧が発生す
る。例えば、受光素子10で検出された電圧と受
光素子10の各ビツトとの関係を図示すると第6
図に示すようになり、電圧差が発生し始めた位置
が圧延材1のワークサイド側端部として検知され
る。なお、第6図を映像信号と称する。第6図に
おいて、tsは夫々の受光素子10,11の全ビツ
トの走査に要する走査周期、Vは圧延材幅端光量
差を表わす電圧である。
W=L×{N-(N 1 +N 2 )}/N = 2H tanα×{N-(N 1 +N 2 )}/N
...() Therefore, it is possible to apply such a strip width detection means to detect meandering in rolled materials, etc., and this has already been done in some cases, but especially in hot rolling, when the rolled material itself Since the temperature is around .degree. C., it is effective to eliminate the light projector 2 shown in FIG. 4 and detect the light from the rolled material itself. The principle in this case will be explained with reference to FIG.
are provided, and the light from the rolled material 1 is detected by the light receivers 8 and 9. At the time of detection, the light receiving element 10,
Light is focused for each of the 11 bits, and a voltage proportional to the intensity of the focused light is generated for each bit. For example, if the relationship between the voltage detected by the light receiving element 10 and each bit of the light receiving element 10 is illustrated, the sixth
As shown in the figure, the position where the voltage difference begins to occur is detected as the work side end of the rolled material 1. Note that FIG. 6 is referred to as a video signal. In FIG. 6, ts is a scanning period required to scan all the bits of each of the light receiving elements 10 and 11, and V is a voltage representing the difference in light amount at the width end of the rolled material.

ところで、一般的には圧延材の種類によつて温
度が異なるため、第5図に示す受光器8,9へ入
る光量に温度による差が生じる。すなわち、温度
の高い圧延材で走査時間tsを大きくすると、受光
素子10,11への入光時間が長くなり、圧延材
から発せられるローラーテーブル等に反射した弱
い光も多量に受光素子10,11に受光される結
果、第7図のイに示すように、電圧Vが圧延材1
から離れた位置で急激に立上り、幅端部の検出精
度が悪化する。又逆に走査時間tsが短かすぎる
と、受光素子10,11の各ビツトへの入光時間
が短くなり、光が十分に受光素子10,11に受
光されない結果、第7図のロに示すように電圧V
のレベルが低下し、板幅端部検出の信号が基準と
なるスレツシユホールド電圧VLに達せず、検出
が不可能となる虞れがある。従つて、走査時間ts
を自動的にコントロールし、受光素子10,11
に受光される光量を常に一定に保持し、電圧Vを
第7図のハに示すように調節することが必要とな
る。
Incidentally, since the temperature generally varies depending on the type of rolled material, a difference occurs in the amount of light entering the light receivers 8 and 9 shown in FIG. 5 depending on the temperature. That is, when the scanning time ts is increased for a hot rolled material, the time for light to enter the light receiving elements 10, 11 becomes longer, and a large amount of weak light emitted from the rolled material and reflected on the roller table etc. is also transmitted to the light receiving elements 10, 11. As a result of the light being received by the rolled material 1, the voltage V increases as shown in FIG.
It rises sharply at a position far from , deteriorating the detection accuracy at the width end. Conversely, if the scanning time ts is too short, the time for light to enter each bit of the light-receiving elements 10, 11 becomes short, and as a result, the light is not sufficiently received by the light-receiving elements 10, 11, as shown in FIG. so that the voltage V
There is a possibility that the level of the plate width end detection signal will not reach the reference threshold voltage VL , and detection will become impossible. Therefore, the scanning time ts
automatically controls the light receiving elements 10, 11.
It is necessary to maintain the amount of light received at all times constant and to adjust the voltage V as shown in FIG. 7C.

そこで、本願発明者は、例えば特願昭59−
77214号明細書に示すように、加熱された金属塊
の発する光を受光する受光素子群とレンズとより
構成された検出器により金属塊幅端位置を検出す
る際に、受光素子を金属塊の中央側より幅端方向
へ走査し、該走査により得られた映像信号中、予
め設定されたレベルの電圧を発生する受光素子近
傍の受光素子が受けている光量から走査周期を決
定し、前記検出器の受光素子を金属塊の中央側よ
り幅方向へ、決定された走査周期により走査を行
ない、予め設定されたレベルの電圧を発生する受
光素子の番地を求めて金属塊の幅方向位置を正確
に検出する方法及びその装置について提案を行つ
た。
Therefore, the inventor of the present application, for example,
As shown in the specification of No. 77214, when detecting the width end position of a metal lump using a detector composed of a light receiving element group and a lens that receive light emitted from a heated metal lump, the light receiving element is The scanning period is determined from the amount of light received by a light-receiving element near a light-receiving element that generates a voltage at a preset level in the video signal obtained by scanning from the center side toward the width edge, and the detection The light-receiving element of the device is scanned from the center of the metal mass in the width direction at a determined scanning period, and the address of the light-receiving element that generates a voltage at a preset level is determined to accurately position the metal mass in the width direction. We proposed a method and device for detecting this.

[発明が解決しようとする問題点] しかしながら、上述の金属塊の幅方向位置検出
方法及びその装置にあつては、検出器の視野中を
水蒸気、水、酸化スケール等の外乱により遮られ
ると、正確に金属塊の幅端位置を検出することが
できないという問題がある。
[Problems to be Solved by the Invention] However, in the above-described method and device for detecting the position in the width direction of a metal lump, if the field of view of the detector is blocked by a disturbance such as water vapor, water, or oxide scale, There is a problem that the width end position of the metal lump cannot be detected accurately.

本発明は、上記実情に鑑み、金属塊の幅端位置
を外乱の影響を受けずに正確に検出し得るように
することを目的としてなしたものである。
The present invention has been made in view of the above-mentioned circumstances, and has an object of making it possible to accurately detect the width end position of a metal lump without being affected by disturbances.

[問題点を解決するための手段] 本発明は、加熱された金属塊の発する光を受光
する受光素子群とレンズとから成る検出器により
金属塊の幅端位置を検出する際に、受光素子を金
属塊の幅方向へ走査して得られた1ビツトごとの
映像信号の電圧差を演算すると共に、1ビツトご
とに映像信号を予め定められたスレツシユホール
ド電圧と比較し、その差に符号変化が起こつた時
点の番地を記憶しておき、現時点の映像信号の電
圧差と一時点前の映像信号の電圧差とを比較演算
して数時点内でその時点の映像信号の電圧差の差
と一時点前の映像信号の電圧差の差の正負の符号
に変化が生じた場合には、前記記憶していた受光
素子の番地を棄却し、前記その時点の映像信号の
電圧差の差と一時点前の映像信号の電圧差の差の
正負の符号に変化が生じない場合には映像信号電
圧が予め定められたスレツシユホールド電圧より
も低くなつた時点の前記記憶していた受光素子の
番地を金属塊の幅端位置と認定する構成を備えて
いる。
[Means for Solving the Problems] The present invention provides a method for detecting the width end position of a metal lump using a detector consisting of a lens and a group of light receiving elements that receive light emitted from a heated metal lump. The voltage difference between the video signals for each bit obtained by scanning the metal block in the width direction is calculated, the video signal is compared for each bit with a predetermined threshold voltage, and the sign of the difference is determined. The address at the time when the change occurred is memorized, and the voltage difference between the current video signal and the voltage difference between the video signals at one point before is compared and calculated, and the difference in the voltage difference between the video signals at that point within several points is determined. If there is a change in the positive or negative sign of the voltage difference between the video signal and the video signal at one point before, the stored address of the light receiving element is discarded and the voltage difference between the video signal and the video signal at that point changes. If there is no change in the positive or negative sign of the difference in voltage between the video signals one time before, the light receiving element at the time when the video signal voltage became lower than a predetermined threshold voltage. It has a configuration that recognizes the address as the width end position of the metal block.

[作用] 従つて、本発明では受光素子は金属塊の幅方向
へ走査されて1ビツトごとに映像信号の電圧とス
レツシユホールド電圧との比較演算が行なわれ、
且つ、1ビツトごとの映像信号の電圧差が演算さ
れ、現時点の映像信号の電圧差の差と一時点前の
映像信号の電圧差の正負の符号に変化が生じた場
合には、その時点の番地は金属塊の幅端位置とは
されず、前記電圧差の正負の符号に変化が生じな
い場合には、その時点の映像信号の電圧が予め設
定されたスレツシユホールド電圧よりも低くなつ
た番地が金属塊の幅端位置とされる。
[Function] Accordingly, in the present invention, the light receiving element is scanned in the width direction of the metal lump, and a comparison calculation is made between the voltage of the video signal and the threshold voltage for each bit.
In addition, the voltage difference of the video signal for each bit is calculated, and if the sign of the difference between the voltage difference of the video signal at the current time and the voltage difference of the video signal at a point before changes in sign, the voltage difference at that point is calculated. The address is not set to the width end position of the metal block, and if there is no change in the positive or negative sign of the voltage difference, the voltage of the video signal at that point is lower than the preset threshold voltage. The address is the width end position of the metal block.

[実施例] 以下、本発明の実施例を添付図面を参照しつつ
説明する。
[Examples] Examples of the present invention will be described below with reference to the accompanying drawings.

先ず、本発明の原理を第2図及び第3図により
説明すると、第2図に示す映像信号は水蒸気、
水、酸化スケール等の外乱の影響を受けていない
もの、第3図に示す映像信号は外乱の影響を受け
ているものであり、何れも例えばフオトダイオー
ドを使用した光電素子を圧延材1の幅方向に所定
の走査周期で走査し、得られたものである。な
お、走査の仕方、走査周期の調節の仕方は特願昭
58−238540号明細書、特願昭59−77214号明細書
等に開示してあるので説明は省略する。
First, the principle of the present invention will be explained with reference to FIGS. 2 and 3. The video signal shown in FIG.
The video signal shown in FIG. 3 is unaffected by disturbances such as water and oxide scale, and the video signal shown in FIG. 3 is affected by disturbances. It was obtained by scanning in the direction at a predetermined scanning period. In addition, the method of scanning and how to adjust the scanning period are explained in the patent application.
Since it is disclosed in the specification of No. 58-238540, the specification of Japanese Patent Application No. 59-77214, etc., the explanation will be omitted.

今、第2図において、映像信号を圧延材1の中
央から幅方向へ走査するとして、予む設定された
スレツシユホールド電圧VLと各番地の電圧を順
次比較してゆき、VLより小さくなつた電圧VE
与える受光素子の番地NEを板幅端と判定する。
Now, in Fig. 2, assuming that the video signal is scanned from the center of the rolled material 1 in the width direction, the preset threshold voltage V L and the voltage at each address are sequentially compared, and it is determined that the voltage at each address is smaller than V L. The address N E of the light-receiving element that gives the reduced voltage V E is determined to be the edge of the plate width.

ところで、第3図に示すように、例えば圧延材
1にスケール12が載つてその部分から受光素子
へ入光する光量が減少した場合、対応する受光素
子の映像信号の電圧が降下する。この状態で、圧
延材1の幅端位置を第2図で説明した方法で求め
ると、スケール12の載つた部分を幅端位置とし
て求めてしまうので、検出に大きなエラーが生じ
ることになる。
By the way, as shown in FIG. 3, for example, when a scale 12 is placed on the rolled material 1 and the amount of light entering the light receiving element from that part decreases, the voltage of the video signal of the corresponding light receiving element decreases. In this state, if the width end position of the rolled material 1 is determined by the method explained in FIG. 2, the width end position will be determined as the part on which the scale 12 is placed, resulting in a large error in detection.

本発明では、これを防止するために、各番地と
その1番地手前の映像信号の電圧差、すなわち
ΔVi+1=Vi−Vi+1を順次求めてゆき、得られた
ΔVi+1の各時点ごとの符号変化を調べ、符号変化
が生じた場合、その時点で得られている映像信号
中のスレツシユホールドより小さい電圧を与える
番地を棄却する。すなわち、第3図において、i
=k+1の時点で ΔVk+1=Vk−Vi+1>0 を求め、又Vk+1<VLであるので、番地Nk+1を幅
端位置と判定する。しかし、次のi=k+2時点
目では、 ΔVk+2=Vk+1−Vk+2<0 となり、符号が正から負へ変化する。第3図を見
ても分るように、このような符号変化は幅端位置
及び幅端位置よりも外側では決して起こらない。
なぜなら、受光素子群を有する検出器は、第7図
のハに示すように幅端位置近傍で映像信号の電圧
が減少し、幅端位置から2〜3ビツト外側では電
圧が零になるよう絞りを適正に調整してあるう
え、幅端位置の外側での反射光の強さは金属塊の
発する光の強さの数十分の一〜数百分の一と非常
に弱く、検出されることはあまりないからであ
る。
In the present invention, in order to prevent this, the voltage difference between the video signal at each address and the one before it, that is, ΔV i+1 =V i −V i+1 , is sequentially determined, and the obtained ΔV i+ 1 , and if a sign change occurs, the address that gives a voltage smaller than the threshold in the video signal obtained at that time is discarded. That is, in FIG. 3, i
=k+1, ΔV k+1 =V k −V i+1 >0 is obtained, and since V k+1 <V L , address N k+1 is determined to be the width end position. However, at the next i=k+2 time point, ΔV k+2 =V k+1 −V k+2 <0, and the sign changes from positive to negative. As can be seen from FIG. 3, such a sign change never occurs at the width end position or outside the width end position.
This is because a detector with a group of light-receiving elements is apertured so that the voltage of the video signal decreases near the width end position, and the voltage becomes zero 2 to 3 bits outside the width end position, as shown in Figure 7C. is adjusted appropriately, and the intensity of the reflected light outside the width end position is very weak, ranging from a few tenths to a few hundredths of the intensity of the light emitted by the metal block, so it can be detected. That's because there aren't many.

従つて、この符号変化を検出してそれが生じた
場合には、それまでに得ているVk+1<VLである
番地Nk+1を棄却する。こうすることによつて、
スケール等の外乱の影響を受けずに精度良く受光
素子上の圧延材幅端位置に相当する番地を求める
ことができる。第2図、第3図では、走査方向を
圧延材1の中央から幅端方向へ走査する場合を示
しているが、逆に幅端から中央方向へ走査する場
合も同様に適用できる。この場合には、先の電圧
差の符号変化は負から正となると共に、スレツシ
ユホールド電圧VLよりも始めて大きくなつた時
点の番地が幅端位置である。従つて、どちらの方
向から走査するにしても、映像信号とスレツシユ
ホールド電圧とを比較し、これに符号変化が生じ
た時点の映像信号の番地を求めれば良い。
Therefore, when this sign change is detected and occurs, the address N k +1 that has been obtained so far where V k+1 <V L is discarded. By doing this,
The address corresponding to the width end position of the rolled material on the light receiving element can be determined with high precision without being affected by disturbances such as scale. Although FIGS. 2 and 3 show the case where the scanning direction is scanned from the center of the rolled material 1 toward the width end, the same applies to the case where the scanning direction is scanned from the width end toward the center. In this case, the sign of the voltage difference changes from negative to positive, and the address at which the voltage difference first becomes larger than the threshold voltage V L is the width end position. Therefore, regardless of which direction scanning is performed, it is sufficient to compare the video signal and the threshold voltage and find the address of the video signal at the time when a sign change occurs.

次に第1図を参照しつつ中央側から幅端方向へ
走査する場合について本発明の具体例につき説明
する。
Next, with reference to FIG. 1, a specific example of the present invention will be described regarding scanning from the center side to the width end direction.

図中Aは上述の既出願明細書に開示したよう検
出器の光電素子を圧延材幅方向へ走査させること
により得られた映像信号、13はクロツクパルス
Cの1パルスごとに現在走査中の番地の受光素子
で得られた映像信号の電圧Vi+1とシフトレジスタ
14から送られて来た1番地手前の受光素子で得
られた映像信号の電圧Viとを比較演算する比較
器、15は比較器13から送られて来た電圧差
ΔVi+1=Vi+1−Viとシフトレジスタ16から送ら
れて来た一時点前の電圧差ΔVi=Vi−Vi-1とを比
較演算する比較器、17は比較器15の演算結果
の符号を判別する符号判別回路、18は映像信号
Aの電圧Vi+1とスレツシユホールド電圧VLとを
比較する比較器、19は比較器18で比較された
スレツシユホールド電圧VLより小さい電圧を与
える映像信号の番地を記憶し且つ符号判別回路1
7からのクリアパルスCEが入力されると記憶し
ている番地を棄却する記憶回路、20はクロツク
パルスCの数をカウントしその数を番地として記
憶回路19に送るカウンタである。
In the figure, A is a video signal obtained by scanning the photoelectric element of the detector in the width direction of the rolled material as disclosed in the above-mentioned specification, and 13 is the image signal of the address currently being scanned for each pulse of the clock pulse C. A comparator 15 is a comparator that compares and calculates the voltage V i+1 of the video signal obtained by the light receiving element and the voltage V i of the video signal obtained by the light receiving element at the first address sent from the shift register 14. The voltage difference ΔV i+1 =V i+1 −V i sent from the comparator 13 and the voltage difference ΔV i =V i −V i-1 at the previous point sent from the shift register 16. 17 is a sign determination circuit that determines the sign of the calculation result of the comparator 15. 18 is a comparator that compares the voltage V i+1 of the video signal A and the threshold voltage V L. 19 stores the address of the video signal that gives a voltage smaller than the threshold voltage V L compared by the comparator 18, and the sign discriminator circuit 1
A memory circuit 20 discards the stored address when the clear pulse CE from 7 is input, and a counter 20 counts the number of clock pulses C and sends the number to the memory circuit 19 as an address.

圧延材幅端位置の検出に際しては、圧延材の映
像信号Aの電圧Vi+1及びシフトレジスタ14に記
憶されていた1番地手前の映像信号の電圧Vがク
ロツクパルスCの1パルスごとに比較器13に送
られ、両者の差がΔVi+1=Vi−Vi+1として比較演
算され、電圧差ΔVi+1が比較器13から比較器1
5及びシフトレジスタ16へ出力される。又シフ
トレジスタ14ではクロツクパルスCの1パルス
ごとに映像信号Aの値が更改される。
When detecting the width end position of the rolled material, the voltage V i+1 of the video signal A of the rolled material and the voltage V of the video signal before the address 1 stored in the shift register 14 are detected by the comparator every pulse of the clock pulse C. 13, the difference between them is compared and calculated as ΔV i+1 =V i −V i+1 , and the voltage difference ΔV i+1 is sent from comparator 13 to comparator 1
5 and the shift register 16. Further, in the shift register 14, the value of the video signal A is updated every pulse of the clock pulse C.

比較器13から出力された電圧差ΔVi+1は比較
器13において、シフトレジスタ16に記憶され
ていた一時点前の電圧差ΔViとΔVi−ΔVi+1によ
り比較演算され、その信号は符号判別回路17に
出力され、該符号判別器17で比較器15からの
出力の正負が判別される。
The voltage difference ΔV i+1 output from the comparator 13 is compared in the comparator 13 with the voltage difference ΔV i at a point before stored in the shift register 16 and ΔV i −ΔV i+1 , and the signal is is output to the sign discriminator 17, and the sign discriminator 17 discriminates whether the output from the comparator 15 is positive or negative.

一方、映像信号Aの電圧Vi+1はスレツシユホー
ルド電圧VLと比較器18で時々刻々と比較され
て記憶回路19へ送られているが、Nk番地でVL
>Vk+1となるので、このときNk番地の値は記憶
回路19へ残る。而して、このままではNk番地
を圧延材幅端部と認識してしまうことになるが、
比較器15の出力が負になつた場合は先の符号判
別回路17よりクリアパルスCEが記憶回路19
へ送られて来、番地Nkが棄却される。斯かる操
作によつて圧延材1の真の幅位置を表わす受光素
子の番地NEが記憶回路19に残る。又シフトレ
ジスタ16では、クロツクパルスCの1パルスご
とに電圧差の値が更改される。
On the other hand, the voltage V i+1 of the video signal A is constantly compared with the threshold voltage V L by the comparator 18 and sent to the storage circuit 19 .
>V k+1 , so the value at address N k remains in the storage circuit 19 at this time. Therefore, if this continues, the N k address will be recognized as the width end of the rolled material, but
When the output of the comparator 15 becomes negative, a clear pulse CE is sent to the storage circuit 19 from the sign discrimination circuit 17.
address Nk is rejected. Through this operation, the address N E of the light receiving element representing the true width position of the rolled material 1 remains in the memory circuit 19. In the shift register 16, the value of the voltage difference is updated every pulse of the clock pulse C.

上述のようにして、検出器の視野中が部分的に
水蒸気や水等に遮られたり、圧延材に水や酸化ス
ケール等が残つても正確に圧延材の幅端部が求め
られる。
As described above, even if the field of view of the detector is partially blocked by steam, water, etc., or even if water, oxide scale, etc. remain on the rolled material, the width end portion of the rolled material can be accurately determined.

なお、本発明の実施例においては、圧延材幅端
部の位置を検出する場合について説明したが、圧
延材に限らず高温の金属塊ならいかなる金属に対
しても適用可能なこと、本発明装置はコンピユー
タにより構成することもできるし、或いは電子回
路等のハードウエアで構成することもできるこ
と、その他、本発明の要旨を逸脱しない範囲内で
種々変更を加え得ること、等は勿論である。
In the embodiments of the present invention, a case has been described in which the position of the width end of a rolled material is detected, but the present invention is applicable not only to rolled materials but also to any high-temperature metal lump. It goes without saying that it can be constructed by a computer or by hardware such as an electronic circuit, and that various changes can be made without departing from the gist of the present invention.

[発明の効果] 本発明の金属塊の幅方向位置検出方法及びその
装置によれば、水蒸気、水、酸化スケール等、加
熱金属塊の端部位置を光学式検出器で測定する際
に咲けることのできない外乱の影響を除去し、精
度の高い測定が可能となるという優れた効果を奏
し得る。
[Effects of the Invention] According to the method and device for detecting the position in the width direction of a metal lump of the present invention, moisture, water, oxide scale, etc. can be detected when measuring the end position of a heated metal lump with an optical detector. This has the excellent effect of eliminating the influence of unavoidable disturbances and enabling highly accurate measurements.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の金属塊の幅方向位置検出方法
及びその装置を具体化した例の説明図、第2図及
び第3図は本発明の金属塊の幅方向位置検出方法
及びその装置の原理の説明図、第4図は金属塊等
の材料の幅方向位置を検出する原理の説明図、第
5図は加熱された金属塊の幅方向位置を検出する
原理の説明図、第6図は第5図で示す幅方向位置
検出の場合に幅端部に生じる光量差を表わす信号
と走査時間との関係を示すグラフ、第7図は加熱
された金属塊の幅端部を検出する場合に走査時間
の変更による出力信号の変化を示す説明図であ
る。 図中13は比較器、14はシフトレジスタ、1
5は比較器、16はシフトレジスタ、17は符号
判別回路、18は比較器、19は記憶回路、20
はカウンタを示す。
FIG. 1 is an explanatory diagram of an example embodying the method and device for detecting the position in the width direction of a metal lump according to the present invention, and FIGS. An explanatory diagram of the principle, Fig. 4 is an explanatory diagram of the principle of detecting the widthwise position of a material such as a metal lump, Fig. 5 is an explanatory diagram of the principle of detecting the widthwise position of a heated metal lump, Fig. 6 5 is a graph showing the relationship between the signal representing the difference in light amount occurring at the width edge and the scanning time in the case of width direction position detection, and FIG. FIG. 3 is an explanatory diagram showing changes in output signals due to changes in scanning time. In the figure, 13 is a comparator, 14 is a shift register, 1
5 is a comparator, 16 is a shift register, 17 is a sign discrimination circuit, 18 is a comparator, 19 is a storage circuit, 20
indicates a counter.

Claims (1)

【特許請求の範囲】 1 加熱された金属塊の発する光を受光する受光
素子群とレンズとから成る検出器により金属塊の
幅端位置を検出する際に、受光素子を金属塊の幅
方向へ走査して得られた1ビツトごとの映像信号
電圧と予め定められたスレツシユホールド電圧と
を比較し、これに符号変化が生じた時点での映像
信号の番地を記録すると共に、1ビツトごとに現
時点の映像信号と1時点前の映像信号との電圧差
を演算し、その電圧差に符号変化が生じた場合は
前記記憶されていた番地を棄却することを特徴と
する金属塊の幅方向位置検出方法。 2 加熱された金属塊の発する光を受光する受光
素子群とレンズとから成る金属塊を幅方向へ走査
し得るようにした検出器と、検出された所定番地
の映像信号と一番地前の映像信号の電圧差を比較
演算する比較器と、該比較器から送られて来た現
時点の映像信号の電圧差と一時点前の映像信号の
電圧差を比較演算する比較器と、現時点の映像信
号の電圧差と一時点前の映像信号の電圧差の正負
の符号を判別し符号が変化した場合には、クリア
パルスを出す符号判別回路と、前記各時点の映像
信号の電圧と予め設定されたスレツシユホールド
電圧との差を比較演算する比較器と、該比較器の
出力に符号変化が起つたときにはその時点の受光
素子の番地を記憶し前記符号判別回路からクリア
パルスが送られて来た場合には前記記憶している
受光素子の番地を棄却する記憶回路を設けたこと
を特徴とする金属塊の幅方向位置検出装置。
[Claims] 1. When detecting the width end position of a metal lump using a detector consisting of a group of light receiving elements and a lens that receive light emitted from a heated metal lump, the light receiving element is moved in the width direction of the metal lump. The video signal voltage for each bit obtained by scanning is compared with a predetermined threshold voltage, and the address of the video signal at the time when a sign change occurs is recorded. A position in the width direction of a metal block, characterized in that the voltage difference between the current video signal and the video signal one time before is calculated, and if a sign change occurs in the voltage difference, the stored address is discarded. Detection method. 2. A detector capable of scanning the metal lump in the width direction, consisting of a light receiving element group and a lens that receive light emitted from the heated metal lump, and a video signal of the detected predetermined location and an image of the nearest location. A comparator that compares and calculates the voltage difference between signals, a comparator that compares and calculates the voltage difference between the current video signal sent from the comparator and the voltage difference between the video signal at a point before, and the current video signal. A sign discrimination circuit that determines the positive or negative sign of the voltage difference between the voltage difference between the voltage difference of A comparator that compares and calculates the difference with the threshold voltage, and when a sign change occurs in the output of the comparator, the address of the light receiving element at that time is memorized and a clear pulse is sent from the sign discrimination circuit. A device for detecting a position in the width direction of a metal lump, further comprising a memory circuit for discarding the stored address of the light-receiving element.
JP22325985A 1985-10-07 1985-10-07 Method and device for detecting breadthwise position of metallic ingot Granted JPS6282306A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22325985A JPS6282306A (en) 1985-10-07 1985-10-07 Method and device for detecting breadthwise position of metallic ingot

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22325985A JPS6282306A (en) 1985-10-07 1985-10-07 Method and device for detecting breadthwise position of metallic ingot

Publications (2)

Publication Number Publication Date
JPS6282306A JPS6282306A (en) 1987-04-15
JPH0467888B2 true JPH0467888B2 (en) 1992-10-29

Family

ID=16795297

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22325985A Granted JPS6282306A (en) 1985-10-07 1985-10-07 Method and device for detecting breadthwise position of metallic ingot

Country Status (1)

Country Link
JP (1) JPS6282306A (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5335569A (en) * 1976-09-14 1978-04-03 Asahi Glass Co Ltd Method of measuring outer diameter of transparent substance
JPS57146103A (en) * 1981-03-05 1982-09-09 Fujitsu Ltd Measuring system for size

Also Published As

Publication number Publication date
JPS6282306A (en) 1987-04-15

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