JPH0430539B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application This invention relates to a high-temperature continuous material testing device that continuously tests test pieces for high-temperature materials.

(B) Prior Art In order to continuously test high-temperature materials, a plurality of test pieces may be supported on a support stand in a high-temperature furnace, and this support stand may be movably guided by an appropriate guide mechanism. Then, by moving the support stand by a distance corresponding to the pitch of the test piece using a suitable operating mechanism,
Each specimen can be sent to the testing position in sequence, allowing continuous high temperature material testing. Conventionally, in this type of testing apparatus, a guide mechanism and an operating mechanism for a support stand have been provided in a high-temperature furnace. However, this type of guide mechanism and operation mechanism has a complicated shape and is not easy to process. on the other hand,
As is well known, heat-resistant materials such as ceramics have poor workability. Therefore, heat-resistant materials cannot be used for the guide mechanism and operating mechanism of the support base. For this reason, especially when testing materials in an ultra-high temperature atmosphere, the guide mechanism and operating mechanism of the support base undergo thermal expansion, which affects the test results. There is also a limit to the heat resistance strength of the guide mechanism and operating mechanism, making it impractical to conduct ultra-high temperature tests.

(c) Purpose Therefore, it is an object of the present invention to provide a high-temperature continuous material testing device that allows continuous material testing of specimens even in an ultra-high temperature atmosphere, allows easy processing of component parts, and allows precise testing. purpose.

(d) Configuration According to the present invention, a support stand for test pieces is housed in a high-temperature furnace, a plurality of test pieces are supported on the support stand, and each of the test pieces is arranged along a horizontal straight line. , in the material testing apparatus, the support stand is linearly moved in the arrangement direction of the test pieces by a distance corresponding to the arrangement pitch, and each of the test pieces is sequentially sent to a test position; A through groove is formed extending in the direction in which the pieces are arranged, the support base is made to protrude from the through groove to a lower part of the high temperature furnace, and a heat insulating plate longer than the through groove is provided at the protruding portion, and A guide mechanism that seals between the through groove and the support base, guides the support base so as to be linearly movable in the arrangement direction of the test pieces, and is composed of a separate member from the support base, and a guide mechanism that is composed of a separate member from the support base and the support base The present invention is characterized in that an operating mechanism for linearly moving the table in the direction in which the test pieces are arranged is provided below the heat insulating plate.

(E) Embodiments Hereinafter, embodiments of the present invention will be described with reference to the drawings.

In the figure, a test piece 1 is placed on a support stand 3 in a high-temperature furnace 2.
supported above. In this example, three test specimens 1 are supported on a support stand 3. When testing a material, a compressive or bending load is applied to the specimen 1 by the loading rod 4. The load rod 4 is connected to a crosshead 6 via a load cell 5.

The support stand 3 penetrates the cram surface of the high temperature furnace 2 and projects to the outside. In this embodiment, a through groove 7 having a width slightly larger than the thickness of the support base 3 is formed on the bottom surface of the high temperature furnace 2, and the support base 3 is slidably inserted into the through groove 7. penetrate through,
It protrudes below. Furthermore, the space between the through groove 7 and the support stand 3 is sealed by a heat insulating plate 8 fixed to the support stand 3 so that outside air does not flow into the high temperature furnace 2 through the through groove 7 . The heat insulating plate 8 is longer than the through groove 7, and can seal between the through groove 7 and the support stand 3 regardless of movement of the support stand 3.

The support stand 3 is movably guided by a guide mechanism provided outside the high temperature furnace 2 . The guide mechanism consists of a slide base 9 slidably guided by a substrate 10, and the support base 3 is fixed to this slide base 9.

Note that the slide base 9 is a separate member from the support base 3, and its heat resistance is not considered.

The support stand 3 is operated by an operation mechanism provided outside the high temperature furnace 2 so as to move by a distance corresponding to the pitch of the test piece 1. The operating mechanism consists of a feed screw 11 arranged parallel to the sliding direction of the slide base 9. The feed screw 11 has a feed handle 12 at one end, is rotatably supported by the base plate 10, and is screwed to the slide base 9. There is. The slide base 9 has a scale 13 representing the feed amount of the support base 3, and the substrate 10 has an index 14 for reading the scale 13 of the slide base 9. Scale 13 is
They are attached at intervals corresponding to the pitch of test piece 1.

In this test apparatus, a test piece 1 is heated in a high temperature furnace 2 to a predetermined set temperature. To apply a test load to the test piece 1, it is sufficient to lower the crosshead 6 and bring the load rod 4 into contact with the test piece 1. Load rod 4 applies a compressive or bending load to test specimen 1. The reaction force is supported by the support stand 3. The load cell 5 detects the test load applied to the test piece 1. Therefore, the test piece 1 can be subjected to a high temperature material test.
It is also possible to raise the crosshead 6 and apply a tensile load to the specimen 1 by means of the loading rod 4.

In order to perform a material test on each test piece 1 continuously, the feed screw 11 may be rotated by the handle 12 after the test on a particular test piece 1 is completed. The slide base 9 moves by the screw feeding action of the feed screw 11 and slides along the substrate 10.
The support stand 3 moves integrally with the slide base 9 and slides along the through groove 7 of the high temperature furnace 2.
Therefore, when the feed screw 11 is rotated until each scale 13 on the slide base 9 matches the index 14 on the board 10, each test piece 1 is sequentially moved to the load rod 4.
position and can be sent to a testing position. Therefore, each test piece 1 can be tested successively. Further, when the first test piece 1 is heated by the high-temperature furnace 2, the other test pieces 1 are also heated at the same time, so there is no need to heat the test piece 1 again for each test.

In this test device, the support stand 3 itself has a simple shape and can be made of a heat-resistant material such as ceramic. The same applies to the load rod 4, which has a simple shape and can be made of heat-resistant material. Therefore, there is no risk of thermal expansion of the support base 3 and the load rod 4. The heat resistance strength can also be made sufficiently large, and the test piece 1 can be subjected to material tests without any trouble even in an ultra-high temperature atmosphere. The slide base 9, the substrate 10, and the feed screw 11 are separate members from the support base 3 and are provided outside the high-temperature furnace 2, so there is no need to use heat-resistant materials, and materials with good workability are used. can do.

Although this embodiment has been described in which the support base 3 is moved by the screw feeding action of the feed screw 11, other operating mechanisms may also be used. In addition to the slide base 10, various types of guide mechanisms for the support stand 3 can be considered.

(f) Effects Since the high temperature continuous material testing apparatus of the present invention is configured as described above, it has the following effects.
That is, since the through groove is formed on the bottom surface of the high temperature furnace and the space between the through groove and the support is sealed by the heat insulating plate, the dissipation of heat from the high temperature furnace is extremely small. Furthermore, when the support base is moved along the through groove, the heat insulating plate also moves together with the support base, but since the heat insulating plate is longer than the through groove, the space between the through groove and the support base is always sealed, and the atmosphere of the high temperature furnace is can be kept. Furthermore, when creating an ultra-high temperature atmosphere in a high-temperature furnace,
The support base can be formed of a heat-resistant material to prevent thermal expansion of the support base. The support table only needs to have a shape that can support the test piece, and since it has a simple shape, it is easy to form even if it is made of a heat-resistant material with poor workability. As for the guide mechanism and the operating mechanism, these can be provided as separate members from the support base and below the heat insulating plate, so that the influence of heat from the high temperature furnace is almost nil. Therefore, these do not need to be processed using a heat-resistant material, but can be processed using other materials with good workability, and the test piece can be precisely positioned. In this way, material testing of test pieces can be performed continuously even in an ultra-high temperature atmosphere, and component parts can be easily processed and precise tests can be performed.

[Brief explanation of drawings]

FIG. 1 is a sectional view showing an embodiment of the present invention, and FIG. 2 is a sectional view taken along the line -- in FIG. 1... Test piece, 2... High temperature furnace, 3... Support stand,
9...slide base, 10...board, 11...
Feed screw, 12...handle.

Claims (1)

[Claims] 1. A support stand for the test piece is housed in a high-temperature furnace, a plurality of test pieces are supported on the support stand, each of the test pieces is arranged along a horizontal straight line, and the support stand is placed in the direction of the test piece. In the material testing device, the test pieces are linearly moved in the arrangement direction by a distance corresponding to the arrangement pitch, and each of the test pieces is sequentially sent to a test position. the support stand protrudes downward from the high-temperature furnace from the through groove, a heat insulating plate longer than the through groove is provided at the protruding portion, and the heat insulating plate creates a connection between the through groove and the support stand. Seal and
A guide mechanism that guides the support stand so as to be linearly movable in the direction in which the test pieces are arranged and is made up of a member separate from the support stand; and a guide mechanism that is made up of a separate member from the support stand and moves the support stand linearly in the direction in which the test pieces are arranged. A high-temperature continuous material testing device characterized in that an operating mechanism for this is provided below the heat insulating plate.