JPH0535375B2 - - Google Patents
Info
- Publication number
- JPH0535375B2 JPH0535375B2 JP22878683A JP22878683A JPH0535375B2 JP H0535375 B2 JPH0535375 B2 JP H0535375B2 JP 22878683 A JP22878683 A JP 22878683A JP 22878683 A JP22878683 A JP 22878683A JP H0535375 B2 JPH0535375 B2 JP H0535375B2
- Authority
- JP
- Japan
- Prior art keywords
- bending
- test piece
- fulcrum
- jig
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 44
- 238000005452 bending Methods 0.000 claims description 34
- 238000004154 testing of material Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 2
- 239000000919 ceramic Substances 0.000 description 5
- 239000003779 heat-resistant material Substances 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000012669 compression test Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000013003 hot bending Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/022—Environment of the test
- G01N2203/0222—Temperature
- G01N2203/0226—High temperature; Heating means
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
【発明の詳細な説明】
(イ) 産業上の利用分野
この発明は、セラミツクスなどの試験片を高温
材料試験する高温材料試験装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a high temperature material testing device for testing a high temperature material test piece of ceramics or the like.
(ロ) 従来技術
たとえば、セラミツクスを高温曲げ試験するに
は、高温炉内で試験片を支持台に設けた曲げ支点
治具の一対と支点間にかけ渡す。そして、高温炉
によつて試験片を加熱すればよい。これと同時
に、試験片に曲げ荷重を加えると、曲げ支点およ
び支点治具がその反力を受け、試験片は曲げ支点
間で変形する。したがつて、試験片を高温曲げ試
験することができる。(B) Prior Art For example, to perform a high-temperature bending test on ceramics, a test piece is passed between a pair of bending fulcrum jigs provided on a support stand and the fulcrum in a high-temperature furnace. Then, the test piece may be heated in a high-temperature furnace. At the same time, when a bending load is applied to the test piece, the bending support and the fulcrum jig receive the reaction force, and the test piece deforms between the bending supports. The specimens can therefore be subjected to hot bending tests.
この種の試験装置において、高温炉によつて試
験片を加熱すると、試験片だけでなく、曲げ支点
治具および支持台も加熱される。したがつて、こ
れをセラミツクスなどの耐熱材料によつて加工す
る必要がある。従来は、耐熱材料によつて曲げ支
点治具と支持台を加工し、一体成型していた。し
かしながら、セラミツクスなどの耐熱材料は加工
性が悪い。このため、一対の曲げ支点を有する支
点治具とその支持台を一体成型するのは容易では
なく、製造コストが高いという問題があつた。さ
らに、試験片に曲げ荷重が加えられたとき、曲げ
支点および支点治具がその反力を受けるため、特
にこの曲げ支点および支点治具が損傷しやすい。
曲げ支点および支点治具が損傷すると、曲げ支
点、支点治具および支持台全体を交換せねばなら
ない。このため、維持コストが高いという欠点も
あつた。 In this type of testing apparatus, when a test piece is heated in a high-temperature furnace, not only the test piece but also the bending fulcrum jig and support are heated. Therefore, it is necessary to process this using a heat-resistant material such as ceramics. Conventionally, the bending fulcrum jig and support base were made of heat-resistant material and integrally molded. However, heat-resistant materials such as ceramics have poor workability. For this reason, it is not easy to integrally mold a fulcrum jig having a pair of bending fulcrums and its support base, resulting in a problem of high manufacturing cost. Further, when a bending load is applied to the test piece, the bending fulcrum and the fulcrum jig receive the reaction force, so the bending fulcrum and the fulcrum jig are particularly susceptible to damage.
If the bending fulcrum and fulcrum jig are damaged, the entire bending fulcrum, fulcrum jig, and support must be replaced. For this reason, it also had the disadvantage of high maintenance costs.
(ハ) 目的
したがつて、この発明は、試験片を曲げ支点治
具などの試験片保持治具上に保持し、高温炉によ
つて試験片を加熱し、試験片に曲げ荷重などの試
験荷重を加える高温材料試験装置において、試験
片保持治具および支持台の加工を容易にし、製造
コストを低くするとともに、試験片保持治具が損
傷したときその保持治具だけを交換し、維持コス
トを低くすることを目的としてなされたものであ
る。(C) Purpose Therefore, the present invention involves holding a test piece on a test piece holding jig such as a bending fulcrum jig, heating the test piece in a high-temperature furnace, and subjecting the test piece to tests such as bending loads. In high-temperature material testing equipment that applies loads, it is easy to process the specimen holding jig and support base, reducing manufacturing costs, and reducing maintenance costs by allowing only the holding jig to be replaced when it is damaged. This was done with the aim of lowering the
(ニ) 構成
この発明は、一対の曲げ支点を有する支点治具
などの試験片保持治具とその支持台を互いに分離
させ、保持治具を支持台に取り外し可能に組み合
わせたことを特徴とするものである。(d) Configuration This invention is characterized in that a test specimen holding jig such as a fulcrum jig having a pair of bending supports and its support stand are separated from each other, and the holding jig is removably combined with the support stand. It is something.
(ホ) 実施例
以下、この発明の実施例を図面について説明す
る。(E) Embodiments Hereinafter, embodiments of the present invention will be described with reference to the drawings.
図において、試験片TPは高温炉１内に収容さ
れている。この装置はポンチ２によつて５つの試
験片TPに曲げ荷重を加え、各試験片TPを連続的
に曲げ試験するようにしたもので、５つの支持台
３に設けられた５つの曲げ支点治具４を有する。
各支点治具４はそれぞれ一対の曲げ支点５をも
ち、各試験片TPは各支点治具４の曲げ支点５間
にかけ渡され、保持されている。第２図に示すよ
うに、曲げ支点治具４と支持台３は互いに分離さ
れ、支点治具４は支持台３の溝６に取り外し可能
に嵌め込まれ、組み合わされている。各支持台３
も互いに分離され、順次隣接し、接触するよう配
列されている。各支点治具４も互いに分離されて
いる。 In the figure, the test piece TP is housed in a high temperature furnace 1. This device applies a bending load to five test pieces TP using a punch 2, and performs a continuous bending test on each test piece TP. It has tool 4.
Each fulcrum jig 4 has a pair of bending fulcrums 5, and each test piece TP is stretched across and held between the bending fulcrums 5 of each fulcrum jig 4. As shown in FIG. 2, the bending fulcrum jig 4 and the support base 3 are separated from each other, and the fulcrum jig 4 is removably fitted into the groove 6 of the support base 3 and assembled. Each support stand 3
are also separated from each other and arranged so as to be sequentially adjacent and in contact with each other. Each fulcrum jig 4 is also separated from each other.
ポンチ２はピン７によつて負荷ロツド８に連結
され、負荷ロツド８はロードセル９を介してクロ
スヘツド１０に連結され、支持されている。各支
持台３は移動台１１の保持具１２によつて保持さ
れ、断熱材１３によつて横方向に移動可能に案内
されている。さらに、ハンドル１４を有する送り
ねじ１５が横方向に配置され、移動台１１にねじ
合わされ、テーブル１６に軸支されている。 The punch 2 is connected to a load rod 8 by a pin 7, and the load rod 8 is connected to and supported by a crosshead 10 via a load cell 9. Each support stand 3 is held by a holder 12 of a movable stand 11, and is guided by a heat insulating material 13 so as to be movable laterally. Further, a feed screw 15 having a handle 14 is disposed laterally, screwed onto the movable table 11, and pivotally supported on the table 16.
前記のように構成された装置において、試験片
TPは高温炉１によつて予め定められた設定温度
まで加熱される。その後、クロスヘツド１０が下
降し、ポンチ２は負荷ロツド８、ロードセル９お
よびクロスヘツド１０と一体的に下降する。した
がつて、ポンチ２が試験片TPに接触し、試験片
TPに曲げ荷重が加えられる。曲げ支点５および
支点治具４は曲げ荷重の反力を受け、試験片TP
は曲げ支点５間で変形する。したがつて、試験片
TPを高温曲げ試験することができる。 In the apparatus configured as described above, the test piece
The TP is heated by the high temperature furnace 1 to a predetermined set temperature. Thereafter, the crosshead 10 is lowered, and the punch 2 is lowered together with the load rod 8, load cell 9, and crosshead 10. Therefore, punch 2 comes into contact with the test piece TP, and the test piece
A bending load is applied to the TP. The bending fulcrum 5 and the fulcrum jig 4 receive the reaction force of the bending load, and the test piece TP
deforms between the bending supports 5. Therefore, the test piece
TP can be subjected to high temperature bending tests.
試験片TPの試験が完了した後、ハンドル１４
によつて送りねじ１５を回転操作すると、そのね
じ送り作用によつて移動台１１が移動する。各支
点治具４は支持台３、保持具１２および移動台１
１と一体的に移動する。したがつて、各試験片
TPを順次交互にポンチ２の位置に送ることがで
き、連続的に曲げ試験することができる。 After the test of the specimen TP is completed, the handle 14
When the feed screw 15 is rotated by the screw, the moving table 11 is moved by the screw feeding action. Each fulcrum jig 4 includes a support base 3, a holder 12, and a moving base 1.
Moves in unison with 1. Therefore, each specimen
The TP can be sent to the punch 2 position one after another, and the bending test can be performed continuously.
この装置は、曲げ支点治具４と支持台３が互い
に分離され、各支点治具４も互いに分離されてい
るため、セラミツクスなどの耐熱材料で各支点治
具４を加工するのは比較的容易である。支持台３
を加工するのも比較的容易である。したがつて、
製造コストが低い。さらに、曲げ支点５および支
点治具４が曲げ荷重の反力を受け、損傷すると、
その支点治具４を支持台３から取り外すことがで
きる。したがつて、新しい支点治具４を支持台３
に組み合わせ、損傷した支点治具だけを交換する
ことができる。支点治具４および支持台３全体を
交換する必要はない。したがつて、維持コストも
低い。 In this device, the bending fulcrum jig 4 and the support stand 3 are separated from each other, and each fulcrum jig 4 is also separated from each other, so it is relatively easy to process each fulcrum jig 4 using a heat-resistant material such as ceramics. It is. Support stand 3
It is also relatively easy to process. Therefore,
Manufacturing costs are low. Furthermore, if the bending fulcrum 5 and the fulcrum jig 4 are damaged due to the reaction force of the bending load,
The fulcrum jig 4 can be removed from the support base 3. Therefore, a new fulcrum jig 4 is installed on the support base 3.
In combination, only the damaged fulcrum jig can be replaced. There is no need to replace the entire fulcrum jig 4 and support base 3. Therefore, maintenance costs are also low.
なお、この実施例では試験片TPを高温曲げ試
験する試験装置について説明したが、この発明は
試験片を高温圧縮試験する試験装置に適用するこ
とも可能である。この場合は、支点治具４に代え
て試験片TPを接触させる圧盤を使用し、これを
支持台３に取り外し可能に組み合わせる。そし
て、試験片に圧縮荷重を加え、その反力を圧盤に
受けさせればよい。その他の高温材料試験装置に
適用することも可能である。 In this example, a test apparatus for performing a high-temperature bending test on a test piece TP has been described, but the present invention can also be applied to a test apparatus for performing a high-temperature compression test on a test piece. In this case, instead of the fulcrum jig 4, a platen with which the test piece TP comes into contact is used, and this platen is removably assembled to the support stand 3. Then, a compressive load is applied to the test piece, and the reaction force is applied to the platen. It is also possible to apply to other high temperature material testing equipment.
(ヘ) 効果
以上説明したように、この発明は、高温材料試
験装置において、曲げ支点治具などの試験片保持
治具とその支持台を互いに分離させ、試験片保持
治具を支持台に取り外し可能に組み合わせたか
ら、保持治具および支持台の加工を容易にし、製
造コストを低くすることができる。さらに、試験
片保持治具が損傷したとき、それだけを交換する
ことができ、維持コストを低くすることができ、
所期の目的を達成することができるものである。(f) Effects As explained above, the present invention provides a high-temperature material testing device in which a test piece holding jig such as a bending fulcrum jig and its support stand are separated from each other, and the test piece holding jig is removed from the support stand. Since they can be combined together, the holding jig and support can be easily processed and manufacturing costs can be reduced. Furthermore, when the specimen holding jig is damaged, only it can be replaced, reducing maintenance costs.
It is possible to achieve the intended purpose.
第１図はこの発明の一実施例を示す断面図、第
２図は第１図の−線断面図である。
１……高温炉、３……支持台、４……支点治
具、５……曲げ支点。
FIG. 1 is a sectional view showing an embodiment of the present invention, and FIG. 2 is a sectional view taken along the line -- in FIG. 1... High temperature furnace, 3... Support stand, 4... Fulcrum jig, 5... Bending fulcrum.
Claims (1)
持治具上に保持し、前記試験片に曲げ荷重などの
試験荷重を加え、その反力を前記保持治具に受け
させ、高温材料試験するようにした装置におい
て、前記保持治具と前記支持台を互いに分離さ
せ、前記保持治具を前記支持台に取り外し可能に
組み合わせたことを特徴とする高温材料試験装
置。1. A test piece is held on a test piece holding jig provided on a support stand in a high-temperature furnace, a test load such as a bending load is applied to the test piece, and the reaction force is received by the holding jig, and the high-temperature material is A high-temperature material testing apparatus characterized in that the holding jig and the support stand are separated from each other, and the holding jig is removably combined with the support stand.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22878683A JPS60120231A (en) | 1983-12-02 | 1983-12-02 | Testing apparatus for high temperature material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22878683A JPS60120231A (en) | 1983-12-02 | 1983-12-02 | Testing apparatus for high temperature material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60120231A JPS60120231A (en) | 1985-06-27 |
| JPH0535375B2 true JPH0535375B2 (en) | 1993-05-26 |
Family
ID=16881820
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22878683A Granted JPS60120231A (en) | 1983-12-02 | 1983-12-02 | Testing apparatus for high temperature material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60120231A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014195304A1 (en) * | 2013-06-03 | 2014-12-11 | Danmarks Tekniske Universitet | A testing apparatus and a method of operating the same |
| CN104535354A (en) * | 2015-01-15 | 2015-04-22 | 中国兵器工业集团第五三研究所 | Constant bending strain environment test device |
| CN105092387B (en) * | 2015-08-10 | 2017-11-28 | 北京航空航天大学 | A kind of monocrystalline silicon small-size test piece mechanical behavior under high temperature original position stretching test system and method |
-
1983
- 1983-12-02 JP JP22878683A patent/JPS60120231A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60120231A (en) | 1985-06-27 |
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