JPH0443465B2 - - Google Patents

Description

[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to a time division switching system, more specifically,
The present invention relates to a device for transmitting and receiving test signals between a time-division communication path and a communication path testing device in order to test the time-division communication path of a time-division switching system.

(Conventional technology) For example, "D70" published by Japan Telecommunications Mutual Aid Association
D70 Automatic Switchboard [II], pages 69 to 81 (1981) describes the speech path (SP) bus control device for the D70 automatic switchboard. Conventionally, communication path test equipment applied to such SP bus control equipment is connected to a highway switch network with a time division, space division, or time division communication path (TST) configuration via a time division connector device (TDC). There is a method to do so.

In this conventional device configuration, the time-division connector device and communication path test device each insert a test data signal into a time-division forward highway from a time-division exchange type digital synchronization terminal device, and It is divided into a functional section that extracts the data signal and a functional section that inserts the test data signal into the time-divided backward highway to the digital synchronous terminal equipment and extracts the test data signal from this. As used herein, the term "forward highway" refers to a highway on the ingress side of a time division switch network, such as a TST switch, and the term "backward highway" refers to a highway on the egress side to a time division switch network, such as a TST switch.

For example, insertion and extraction of test data signals in the forward highway can be performed using various forward highway digital interface devices, forward test signal insertion TDC selection circuits, forward network decoder circuits, forward test highway selection circuits, and mode decoder circuits. This is done from the maintenance switch and test mode deployment circuits using forward-side circuitry.

Insertion and extraction of test data signals on the backward highway can be performed using various devices such as a backward highway digital interface device, a backward test signal insertion TDC selection circuit, a backward network decoder circuit, a backward test highway selection circuit, and a mode decoder circuit. This is done from the maintenance switch and test mode deployment circuits using the same backward side circuitry.

In this conventional example, there are four modes: a normal mode in which the line under test is not pulled in, an offline test mode in which the standby side is tested, an online test mode in which the active side is tested, and an outgoing test mode in which the line is opened, etc. mode can be taken. In these modes, a call path test is performed using each associated circuit element.

(Problem to be solved by the invention) However, not all of these test modes are always related to circuit elements in each part of the device, but usually some of the forward and backward side elements are related. I'm just doing it. Therefore, the device configuration is complex compared to the device's functions, and there are many circuit elements, and a large amount of cables are installed for signal transmission and reception between the two devices.As a result, the entire device takes up a lot of space and is compact. There was a drawback that it was not possible to realize a suitable device.

The present invention solves these drawbacks of the prior art,
It is an object of the present invention to provide a test signal transmitting/receiving device for a time-division communication path with a compact configuration.

(Means for Solving the Problems) In order to solve the above-mentioned problems, the present invention provides a communication path testing means for testing a time-division communication path including a plurality of forward highways and backward highways, and In the test signal transmission/reception device for a time-division communication path, the communication path test means should insert test data among a plurality of forward highways and backward highways. The first selection information for selecting a highway, the second selection information for selecting a highway from which test data is to be extracted, and the test data are sent to the time division connector means, and the time division connector means transmits the first selection information for selecting a highway, the second selection information for selecting a highway from which test data is to be extracted, and the test data. After receiving the selection information and test data of 1.
selection insertion means for selecting a highway according to the selection information and inserting test data therein; receiving second selection information from the communication route testing means, selecting a highway according to the second selection information; and selective extraction means for extracting test data from the test data and sending it to the communication path testing means.

(Function) According to the present invention, in the time division connector means of the time division communication path, insertion of the test data received from the communication path testing means into the time division communication path is performed by inserting the first selection information from the communication path testing means. Then, either the forward highway or the backward highway is selected and executed accordingly. Further, the test data is extracted to the communication path testing means by receiving second selection information from the communication path testing means and selecting either the forward highway or the backward highway in accordance with the second selection information.

(Embodiment) Next, an embodiment of a test signal transmitting/receiving device for a time-division channel according to the present invention will be described in detail with reference to the accompanying drawings.

With reference to FIGS. 1A and 1B, certain embodiments of the present invention are advantageously applied to, for example, time-sharing telephone switching systems, with time-sharing connector devices.
Consists of TDC and communication path test equipment SPTE. In this embodiment, the communication path testing device SPTE can accommodate 16 time-sharing connector devices TDC. Both devices are connected by a cable that transmits signals as shown.

The time division connector device TDC consists of eight time division multiplex forward highways FHW0 to FHW7 and a duplex time division digital switch network.
TDNWO and TDNW1, and eight time division multiplexed backward highways BHW0 to BHW7
This is a device that interfaces with the communication path test equipment SPTE.

Forward highways FHW0 to FHW7 are time-division multiplexed highways from the digital synchronization terminal equipment in the time-division switching system, and are time-division multiplexed highways from the digital synchronization terminal equipment in the time-division switching system.
This is the entrance highway that forms the input highway for TDNW1. The time-division digital switch networks TDNW0 and TDNW1 are time-division digital switch networks with a time-division, space-division, and time-division talk path (TST) configuration, with dual connections on the active (ACT) side and standby (SBY) side. has been made into Backward Highway
BHW0 to BHW7 are time-division multiplexed highways to the digital synchronization terminal equipment, and are time-division multiplexed highways to the time-division digital switch networks TDNW0 and
This is an exit highway that forms the output highway for TDNW1.

For each of these highways, one frame consists of 128 time slots in this embodiment,
One time slot consists of 8 bits in series. Therefore, one frame has 1024 bits.

The time division connector device TDC has a receiving circuit REC,
Transmission circuit SND, interface circuit CD and
CR, network selection circuit NSEL, test signal insertion circuit INS, and test highway selection circuit
It consists of SEL0 and a test mode control circuit CTL. The receiving circuit REC is the forward highway FHW0~ from the digital synchronous terminal equipment.
This is a circuit that receives FHW7 and is provided for forward highway support. The transmitting circuit SND is
A transmitting circuit that transmits backward highways BHW0 to BHW7 to the digital synchronous terminal equipment,
It is set up to accommodate backward highways.

Interface circuits CD and CR are circuits that interface with networks TDNW0 and TDNW1, and are provided for each switch network. The network selection circuit NSEL is
This is a selection circuit that selects network TDNW0 or TDNW1, and is provided for each set of switch networks.

The test signal insertion circuit INS is a communication path testing device.
This is a circuit that inserts various insertion test data signals CIDT from SPTE into the highway under test, and as shown in the figure, it is provided in the forward highway and the backward highway on the active and standby sides, respectively.

The test highway selection circuit SEL0 receives the selection signals CDSE and MODE DEC from the speech path test equipment SPTE.
Depending on the conditions, the highway to be tested is selected from among the forward highway, the standby side backward highway, or the active side backward highway, and the extracted test data signal CDDT is extracted from the highway and sent to the communication path test equipment SPTE. This is a circuit that outputs.

The test mode control circuit CTL is a circuit that selects the highway under test and timing according to the test mode, that is, selects the insertion circuit INS into which the insertion test data signal CIDT should be inserted, and the network decoder circuit DEC0 and the mode Consists of decoder MODE DEC. The network decoder circuit DEC0 selects the insertion circuit INS into which the insertion test data signal CIDT is to be inserted in response to the test signal insertion circuit selection signal CISE from the communication path test equipment SPTE, and also determines the insertion timing using the timing designation signal CIEN. This is a circuit that selects a highway to insert a test signal by specifying . The mode decoder MODE DEC selects a test mode according to the mode designation signal MODE from the communication path test equipment SPTE, which designates the test mode, and selects one of the test signal insertion circuits INS to detect the highway. This is a circuit that switches between

On the other hand, the communication path testing device SPTE accesses any time slot of the multiplexed highway of the time-division communication path, inserts and extracts signals from the time-division connector device TDC, and thereby controls the communication path system. It has functions such as reproducing failures of various devices and checking after failure recovery. In this embodiment, it interfaces between up to 16 time-sharing connector devices TDC and the maintenance device, and connects the maintenance device interface circuit INF and the test mode deployment circuit.
CTL FF, common highway digital interface device CDIE, maintenance switch MSW,
Consists of test signal insertion TDC selection circuit DEC1.

The maintenance equipment interface circuit INF is a circuit that interfaces with the maintenance equipment of the time-sharing telephone exchange system to which this device is applied, for example, through a bus from the central processing system, and is a circuit that interfaces with the maintenance equipment of the time-sharing telephone exchange system to which this device is applied, and is a circuit that interfaces with the maintenance equipment of the time-sharing telephone exchange system to which this device is applied, and is a circuit that interfaces with the maintenance equipment of the time-sharing telephone exchange system to which this device is applied. Test information such as connector device TDC number, highway number, time slot number and test mode is received in the form of data words from the central control system of the system.

Maintenance switch MSW inserts test data signal
The test information, including the CIDT, is also received in the form of data words from the system's central control system, and is also received from the common highway digital interface equipment.
The CDIE is a switch circuit that transmits test result information, including extracted test data signals, to the central control system in the form of data words.

The test mode expansion circuit CTL FF consists of a group of flip-flops into which the received test information is set, and expands various test information including the signals CDSE, CISE, MODE, etc. to the time division connector device in which the highway under test is accommodated. This is a circuit that distributes control signals to the TDC and controls each part of it.

The common highway digital interface device CDIE is a time-sharing connector device selection circuit under test.
Consists of SEL1 and digital interface circuit DI. The selection circuit SEL1 selects the time division connector device to be tested from among up to 16 time division connector devices TDC, extracts the extracted test data signal CDDT at an arbitrary time slot, and sends it to the interface circuit INF through the maintenance switch MSW. This is a selection circuit for output. Further, the insertion test data signal CIDT is sent from the maintenance switch MSW to the insertion circuit INS through the digital interface circuit DI.

The digital interface circuit DI connects the maintenance switch MSW to the time-sharing connector device TDC.
This is a switching circuit that switches transmission and reception of the insertion test data signal CIDT into the test data signal CIDT and the extraction test data signal CDDT therefrom according to the set state of the test mode development circuit CTLFF. That is, the test data signal CIDT inserted into the time division highway is transmitted from the maintenance switch MSW to the time division connector device TDC, and the test data signal extracted from the time division highway is
The CDDT is separated from the time-sharing connector device TDC to the maintenance switch MSW, respectively, by a digital interface circuit DI.

The test signal insertion TDC selection circuit DEC1 is a selection circuit that selects a time division connector device to be tested from among a maximum of 16 time division connector devices TDC. This selection is made by the time division connector number set in the test mode deployment circuit CTL FF.

There are four types of test modes in this device: normal state (mode 0), offline test mode, online test mode, and encounter test mode.

First, the normal state is a state in which the communication path system equipment is in normal operation and the common highway digital interface equipment CDIE does not pull in the line under test.

Offline test mode is a test mode for communication line equipment that is in standby or failure status, and is performed by specifying this mode and instructions from the standby (SBY) side switch network TDNW from the communication line common control unit. Then, one time slot is drawn from the highway of the standby communication path in the current operating state, the forward insertion test data signal FIDT is inserted at the forward highway FHW, and the backward extraction test data signal BDDT is extracted from the backward highway BHW. .
In this case, the forward extraction test data signal FDDT of the forward highway FHW is not extracted, and the backward insertion test data signal BIDT of the backward highway BHW is not inserted.

Online exam mode is active (ACT)
This is a system network test mode, and there are modes 1 and 2. In these modes, the forward highway can be set for any one time slot.
It is possible to extract the signal FDDT from the FHW transmission side and insert the signal BIDT into the backward highway BHW. Also, forward highway FHW
Inserts the signal to the exchange side and connects the network.
Backward Highway via TDNW
It can be extracted from the exchange side using BHW.

The meeting test mode is a mode applied to a meeting test for opening a line, and can draw in two types of time slots: a time slot under test and a time slot for meetings. In this mode,
Signal from transmission side on forward highway FHW
Extraction of FDDT and backward highway
It is possible to insert signal BIDT on the transmission line side with BHW. Note that the insertion of the signal FIDT to the exchange side at the forward highway FHW and the extraction of the signal BDDT at the backward highway BHW are not performed in this embodiment.

When testing a time-division communication path, the communication path test equipment SPTE sends control signals indicating test information such as the number of the time-division connector TDC to be tested, the highway number, the time slot number, and the test mode to the maintenance equipment. This is sent from the test mode deployment circuit CTL through the interface circuit INF.
Set to FF. Therefore, the test mode deployment circuit
Control signals necessary for the test are sent from the CTL FF to the time division connector device TDC that accommodates the highway under test, and the time division communication path is tested.

Therefore, first, the test mode signal MODE is sent from the test mode development control circuit CTL FF to the mode decoder MODE DEC of the test mode control circuit CTL of the time division connector device TDC, and the mode decoder
Combined with MODE DEC. Highway switching control is performed based on this composite result. Also,
Test mode deployment circuit CTL for communication path test equipment SPTE
The number of the time division connector device TDC under test from FF is set to the test signal insertion TDC selection circuit DEC1,
The time-sharing connector device under test TDC is selected.

Next, the operation of inserting and extracting test signals into and from the time-sharing connector device TDC will be explained. The test data signal CIDT to be inserted is sent from the maintenance device to the maintenance switch through the interface circuit INF.
MSW is set. Insertion test data signal
Test mode deployment circuit to insert CIDT
The digital interface circuit DI is switched to the test data signal insertion state by the selection signal CISE from CTL FF. Note that the insertion test data signal CIDT consists of a forward insertion test data signal FIDT and a backward insertion test data signal BIDT, as will be described later.

Further, the insertion highway selection signal CISE corresponding to the highway number set in the test mode development circuit CTL FF is transferred to the network decoder circuit DEC0 of the time division connector device TDC, and the test signal insertion circuit INS is selected. In addition, the network decoder circuit DEC0 of the time-sharing connector device TDC is expanded by the test signal insertion TDC selection circuit DEC1 according to the TDC number under test at the timing corresponding to the time slot number set in the test mode expansion circuit CTL FF. The signal CIEN is output. This activates the network decoder circuit DEC0, and selects the insertion circuit INS into which the insertion test data signal CIDT is to be inserted, that is, the time-division highway under test.

Along with this, in order to extract the extracted test data signal CDDT, the test mode expansion circuit CTL FF is
A selection signal CDSE corresponding to the same TDC number is sent to the test highway selection circuit SEL0 to select the highway from which the extraction test data signal CDDT is to be extracted.
Further, in order to extract the extracted test data signal CDDT, the digital interface circuit DI is switched to the test data signal extraction state by the selection signal CISE from the test mode development circuit CTL FF. As a result, the extracted test data signal CDDT is transferred to the highway under test selection circuit SEL0 and the under test
Extracted by TDC selection circuit SEL1 and sent to maintenance switch MSW through digital interface circuit DI
is set to . This is later read into the central processing system through the interface circuit INF.

Note that the extraction test data signal CDDT is the forward extraction test data signal FDDT, as described later.
and backward word extraction test data signal BDDT
Consisting of

These forward extraction test data signals
FDDT and backward extraction test data signal
BDDT is the forward insertion test data signal FIDT
and the backward insertion test data signal BIDT, which are transmitted and received between the common highway digital interface device CDIE and the time division connector device TDC.

For example, when online mode is designated, the standby side insertion circuit INS is selected to insert the forward insertion test data signal FIDT.
In addition, in order to extract the backward word extraction test data signal BDDT on the standby side, the test highway selection circuit SEL0 selects the forward extraction test data signal FDDT, the backward word extraction test data signal BDDT on the standby side, and the backward word extraction test data signal BDDT on the active side. Backward word extraction test data signal on standby side
Select BDDT.

When online mode 1 is designated, the standby side and active side insertion circuits INS are selected for insertion of the forward insertion test data signal FIDT. At the same time, in order to extract the backward word extraction test data signal BDDT on the active side, the test highway selection circuit SEL0 selects the backward word extraction test data signal BDDT on the active side.
Select.

When online mode 2 is specified, the test highway selection circuit SEL0 selects the forward extraction test data signal FDDT for extracting the forward extraction test data signal FDDT, and selects the backward extraction test data signal FDDT for inserting the backward insertion test data signal BIDT. Insertion circuit INS is selected.

When the encounter test mode is designated, the same highway switching as in online mode designation 2 is performed by the mode decoder MODE DEC.

The forward extraction test data signal FDDT is extracted as follows. The TDC number and highway number are set in the test mode expansion circuit CTLFF, and the time division connector device TDC and highway are selected by the drop highway selection signal CDSE from now on. Test highway selection circuit SEL0 of selected time-sharing connector device TDC
Then, the signal CDSE is ANDed with the composite result in the mode decoder MODE DEC. As a result, one forward highway FHW is selected for extracting the forward extraction test data signal FDDT. Along with this, communication path testing equipment
The time-sharing connector device TDC to be tested is selected by the TDC selection circuit SEL1 of SPTE, and is accommodated in the maintenance switch MSW through the digital interface circuit DI.

The backward word extraction test data signal BDDT is similarly extracted as follows. The TDC number and highway number are set in the test mode deployment circuit CTL FF, and the time division connector device is activated by the upcoming drop highway selection signal CDSE.
TDC and highway are selected. In the test highway selection circuit SEL0 of the selected time-sharing connector device TDC, the signal CDSE and the mode decoder
It is ANDed with the composite result in MODE DEC. As a result, one backward highway BHW is selected for extracting the backward extraction test data signal BDDT. Along with this, the TDC selection circuit under test SEL1 of the speech path test equipment SPTE
The time-sharing connector device under test TDC is selected in
This is accommodated in the maintenance switch MSW through the digital interface circuit DI.

The forward insertion test data signal FIDT is inserted as follows. Test mode deployment circuit
The TDC number and highway number are set in CTL FF, and the time division connector device TDC and highway are selected by the insert highway selection signal CISE from now on. At the same time, the insertion time slot is designated by the insert enable signal CIEN. The forward insertion test data signal FIDT is input from the maintenance switch MSW to the insertion circuit INS of each time division connector device TDC through the digital interface circuit DI. This is the test mode condition and network decoder
It is inserted into the forward highway FHW according to the AND condition with the insertion enable signal from DEC0.

The insertion enable signal sent from the network decoder circuit DEC0 is the test mode deployment circuit.
The insertion highway is specified by the highway number from CTL FF, and the signal CIEN is output from the test signal insertion TDC selection circuit DEC1. The test signal insertion TDC selection circuit DEC1 is from the test mode deployment circuit CTL FF.
Upon receiving the TDC number and time slot number, it sends the signal CIEN to the time division connector device under test TDC at the time position of the designated time slot.

To insert the backward word insertion test data signal BIDT, the TDC number and highway number are set in the test mode development circuit CTL FF, and the time division connector device TDC and the highway are selected by the insert highway selection signal CISE. Along with this, insert enable signal
CIEN specifies the insertion time slot.
The subsequent control operation is similar to the insertion operation of the forward insertion test data signal BIDT described above.

By the way, for comparison, Figure 2A and Figure 2B
The figure shows an example of a test signal transmitting/receiving device according to the prior art. As you can see, the time-sharing connector device
TDC and communication path test equipment SPTE insert test data signal FIDT into forward highway FHW.
Insert and also extract test data signal from this
Insert the insertion test data signal BIDT into the part that extracts FDDT and the backward highway BHW,
It is also divided into a part for extracting the extracted test data signal BDDT. These parts are indicated by the reference numerals "F" for the forward side and "B" for the backward side in addition to the reference numerals of the corresponding elements shown in FIGS. 1A and 1B, respectively. is shown. The other parts are constructed in substantially the same manner as the corresponding parts of the embodiments of the present invention described above.

For example, insertion of the insertion test data signal FIDT into the forward highway on the active side is performed by the forward highway digital interface device.
FDIE, forward test signal insertion TDC selection circuit
FDEC1, forward network decoder circuit
It is performed from the maintenance switch MSW and test mode deployment circuit CTL FF using FDEC0 and mode decoder MODE DEC. Similarly, the extraction test data signal FDDT from the active side forward highway is extracted using the forward highway digital interface device FDIE, the forward test highway selection circuit FSEL0, and the mode decoder MODE DEC using the maintenance switch.
MSW and test mode deployment circuit CTL FF.

Insertion of the insertion test data signal BIDT and extraction of the extraction test data signal BDDT on the backward highway are performed by the backward highway digital interface device BDIE, the backward test signal insertion TDC selection circuit BDEC1, the backward network decoder circuit BDEC0, and the backward test signal insertion TDC selection circuit BDEC1. It is performed from the maintenance switch MSW and the test mode expansion circuit CTL FF using the highway selection circuit BSEL0 and the mode decoder MODE DEC.

With this configuration, the four modes mentioned above are possible,
Each channel test can be performed. However, these circuit elements are not always involved in all of these test modes; typically only some of the forward and backward side elements are involved. Therefore,
Compared to the functionality of the device, the device configuration is complex, has many circuit elements, and requires a large amount of cables for transmitting and receiving signals between devices.As a result, the device takes up a lot of space, making it difficult to realize a compact device. Ta.

However, as described above, according to the embodiment of the present invention,
Time-division connector device for test signals of time-division communication channels
Extraction from TDC to communication path testing equipment SPTE is performed by selecting either the forward highway or the backward highway. Insertion of the test signal from the time division connector device TDC into the time division communication path is performed by selecting either the forward highway or the backward highway for the test signal received from the communication path test device SPTE.

Therefore, the following effects can be expected. First, the circuitry involved in transmitting and receiving test data of the time-sharing connector device TDC is simplified. Along with this, the amount of cables used to transmit and receive signals has decreased,
Therefore, the installation space may be small. Furthermore, the configurations of the signal transmitting/receiving circuit and digital interface circuit of the speech path testing device SPTE are simplified. For these reasons, the entire device is constructed compactly.

(Effects of the Invention) As described above, according to the present invention, the test signal of the time-division communication path is extracted by selecting either the forward highway or the backward highway, and the test signal for the time-division communication path is extracted by selecting either the forward highway or the backward highway. Signal insertion is performed by selecting either the forward highway or the backward highway.

Therefore, the circuits involved in transmitting and receiving test data of the time-sharing connector device are simplified, the amount of cables for transmitting and receiving signals is reduced, and therefore the space required for them is also reduced. Furthermore, the configurations of the signal transmitting/receiving circuit and the digital interface circuit of the communication path testing device are simplified, and the entire device is configured compactly.

[Brief explanation of the drawing]

FIG. 1 is a diagram showing the arrangement of FIGS. 1A and 1B, and FIGS. 1A and 1B are diagrams showing a specific implementation in which the time-division communication path test signal transmitting and receiving apparatus according to the present invention is applied to a time-division telephone switching system. A system configuration diagram showing an example; FIG. 2 is a diagram showing the arrangement of FIGS. 2A and 2B; FIGS. 2A and 2B are a configuration example of a test signal transmitting and receiving device for a time-division channel according to the prior art. It is a system block diagram. Explanation of symbols of main parts, CDIE...Common Highway Digital Interface Equipment, CTL...
...Test mode control circuit, CTL FF...Test mode expansion circuit, DEC0...Network decoder circuit, DEC1...Test signal insertion TDC selection circuit, DI
...Digital interface circuit, INF...Maintenance equipment interface circuit, INS...Test signal insertion circuit, MODE DEC...Mode decoder,
MSW...Maintenance switch, NSEL...Network selection circuit, SEL0...Test highway selection circuit,
SEL1...TDC selection circuit under test, SPTE...communication path test equipment, TDC...time division connector device.

Claims (1)

[Scope of Claims] 1. A plurality of ingress highways are branched and connected from a periodic terminal station on one side to a duplex time division switch network in a protection system and a working system, respectively, and the duplex A test signal for a time-division communication path for testing each time-division communication path in which a plurality of protection and working outbound highways are switchably integrated and connected from a time-division network to a periodic terminal station on the other side. A transmitting/receiving device, the device comprising: channel testing means for transmitting and receiving test data to and from the time-division channel; and time-division connector means for connecting the channel testing means to the time-division channel; The connector means connects either the ingress highway to the backup system, the ingress highway to the active system, or the exit highway after the backup system and the active system are integrated in the duplicated time division switch network. selective insertion means for selectively inserting test data; selection and extraction means for selecting one of the highways and extracting data; the communication route testing means includes first selection information for selecting a highway into which the test data should be inserted by the selection and insertion means; , a second highway for selecting a highway from which data should be extracted by the selection extraction means;
A test signal transmitting/receiving device for a time division communication path, characterized in that the test signal transmitting/receiving device includes a selection information sending means for sending selection information to the time division connector means. 2. The device according to claim 1, wherein a plurality of the time division connector means are connected to the communication path test means, and the communication path test means includes selection means for selecting the plurality of time division connector means. The selection means sends first selection information to the selection insertion means included in the selected time division connector means, and sends first selection information to the selection extraction means included in the selected time division connector means. A test signal transmitting/receiving device characterized by transmitting second selection information and receiving test data.