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JPH0473093B2 - - Google Patents
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JPH0473093B2 - - Google Patents

Info

Publication number
JPH0473093B2
JPH0473093B2 JP59112127A JP11212784A JPH0473093B2 JP H0473093 B2 JPH0473093 B2 JP H0473093B2 JP 59112127 A JP59112127 A JP 59112127A JP 11212784 A JP11212784 A JP 11212784A JP H0473093 B2 JPH0473093 B2 JP H0473093B2
Authority
JP
Japan
Prior art keywords
graphite tube
temperature
tube
sample
heating current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59112127A
Other languages
Japanese (ja)
Other versions
JPS60253850A (en
Inventor
Kikuo Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP11212784A priority Critical patent/JPS60253850A/en
Publication of JPS60253850A publication Critical patent/JPS60253850A/en
Publication of JPH0473093B2 publication Critical patent/JPH0473093B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/74Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Geology (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 イ 産業の利用分野 本発明はフレームレス原子吸光分析装置に関
し、特に試料原子化炉のグラフアイトチユーブ消
耗監視装置に関する。
DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a frameless atomic absorption spectrometer, and more particularly to a graphite tube consumption monitoring device for a sample nuclearization reactor.

ロ 従来技術 フレームレス原子吸光分析用試料原子化炉はグ
ラフアイトチユーブで、管軸方向に光を通し、チ
ユーブ内に滴下した試料溶液をチユーブ自体に通
電して加熱するようになつている。こゝで通電は
次のようなスケジユールで行われる。第1段では
小電流を流して試料を乾燥し、第2段の試料灰化
段階では中電流を流して試料を稍強熱灰化させ、
最終段の試料原子化段階では大電流を流して炉温
を最高値まで上げ、その昇温の過程で試料を原子
化させる。
B. Prior art A sample atomization reactor for flameless atomic absorption spectrometry is a graphite tube, in which light is passed in the tube axis direction, and the sample solution dropped into the tube is heated by passing electricity through the tube itself. Here, energization is performed according to the following schedule. In the first stage, a small current is applied to dry the sample, and in the second stage, a medium current is applied to incinerate the sample at a slightly high temperature.
In the final sample atomization stage, a large current is applied to raise the furnace temperature to its maximum temperature, and the sample is atomized in the process of increasing temperature.

所で原子吸光分析に使用するグラフアイトチユ
ーブ原子化炉は使用を繰返している間に次第に消
耗して電気抵抗が変化して来るため炉温が変り測
定感度や測定結果の再現性に影響が現れる。この
点はクラフアイトチユーブからの熱輻射の量とチ
ユーブ温度との関係を利用した定温度制御方式の
採用により、かなり改善されたが、グラフアイト
チユーブの消耗が進むと表面状態の変化により熱
輻射量と炉温との関係が異つて来る等の原因で、
測定感度、測定の再現性等の低下は避けられな
い。また自動分析で長時間にわたり同一グラフア
イトチユーブで何回も分析を行つていると、チユ
ーブの消耗が進み、遂にはグラフアイトチユーブ
の破損に迄至ることがあり、このようになると、
単にチユーブの破損だけに止まらず、試料注入器
の損傷、貴重な試料の損失、予定していた分析結
果が得られなくなると云つた事態がつながつてし
まう。
The graphite tube nuclear reactor used for atomic absorption spectrometry gradually wears out during repeated use and its electrical resistance changes, which changes the furnace temperature and affects measurement sensitivity and reproducibility of measurement results. . This point has been considerably improved by adopting a constant temperature control method that utilizes the relationship between the amount of thermal radiation from the graphite tube and the tube temperature, but as the graphite tube wears out, the surface condition changes and the thermal radiation increases. Due to reasons such as the relationship between the amount and furnace temperature being different,
Deterioration in measurement sensitivity, measurement reproducibility, etc. is unavoidable. In addition, if automatic analysis is performed over and over again using the same graphite tube over a long period of time, the tube will wear out and may eventually break.
In addition to simply damaging the tube, this can lead to damage to the sample injector, loss of valuable samples, and failure to obtain the expected analytical results.

従つてグラフアイトチユーブの消耗状態は常に
監視し、グラフアイトチユーブの状態管理が必要
であり、従来はそのための方法として、 (1) 目視により感覚的に消耗状態を監視する。
Therefore, it is necessary to constantly monitor the state of wear and tear on the graphite tube and manage the state of the graphite tube. Conventionally, methods for this purpose include: (1) Monitoring the state of wear and tear visually and intuitively.

(2) 消耗状態や寿命とは関係なく、一定回数使用
したら廃棄する。
(2) Dispose of the product after a certain number of uses, regardless of wear and tear or lifespan.

等の方法が採用されていた。しかし(1)の方法は人
間の勘に頼るので分析条件(電流値等)を変更す
べき程度にチユーブの消耗が進んでいても、その
まゝ使用を続けるとか、チユーブ交換の時期を逸
して前記したような事態に立至つてしまうと云う
ようなことがあつた。また(2)の方法はグラフアイ
トチユーブの浪費につながり、好ましい方法とは
云えない。
methods were used. However, method (1) relies on human intuition, so even if the tube wears out to the extent that the analysis conditions (current value, etc.) should be changed, it may be necessary to continue using it or to miss the time to replace the tube. There have been cases where the situation described above has arisen. Furthermore, method (2) leads to waste of graphite tubes and cannot be said to be a preferable method.

ハ 目的 本発明は試料原子化用グラフアイトチユーブの
消耗状態を自動的に監視することによつて上述し
た問題点の解消を計るものである。
C. Purpose The present invention aims to solve the above-mentioned problems by automatically monitoring the state of wear of a graphite tube for sample atomization.

ニ 構成 前述した定温度制御を行つている場合、温度が
一定なのでグラフアイトチユーブの加熱電流とチ
ユーブの消耗程度との間には一定の関係がある。
即ち消耗が進むに従いチユーブの電気抵抗が増大
するので、一定温度にするための加熱電流は少く
てすむようになる。このことを利用して加熱電流
検出器の出力が或るレベル以下になつたら、警告
手段を作動させるようにした。
D. Configuration When the constant temperature control described above is performed, since the temperature is constant, there is a certain relationship between the heating current of the graphite tube and the degree of wear of the tube.
That is, as the tube wears out, the electrical resistance of the tube increases, so less heating current is required to maintain a constant temperature. Utilizing this fact, the warning means is activated when the output of the heating current detector falls below a certain level.

ホ 実施例 第1図は本発明の一実施例を示す。GTが試料
原子化炉のグラフアイトチユーブで降圧トランス
Tの2次側に接続されている。グラフアイトチユ
ーブGTへの電力供給量はトライアツクTAの点
弧位相角の制御によつて調節される。DTはフオ
トダイオードで、グラフアイトチユーブGTから
の熱輻射を受けて信号を出す。その信号はアンプ
SA1で増幅され、SA1の出力Vsがコントロー
ルアンプCAに入力される。SA1の出力Vsとグ
ラフアイトチユーブGTの温度との関係は予め調
べておいて温度プログラマTPに入力してある。
温度プログラマTPは予め設定されたスケジユー
ルに従い夫々の段階における温度信号をコントロ
ールアンプCAに基準レベル信号Vrとして出力す
る。コントロールアンプCAは上記VsとVrとの
差の信号を増幅してパルスジエネレータPGに送
り、PGは上記入力信号に応じたタイミングでパ
ルスを発生してトライアツクTAの制御端子に印
加し、TAの点弧位相を制御して、グラフアイト
チユーブGTが温度プログラマTPによつて指定
された温度になるよう同チユーブへの電力供給量
が制御される。第2図は交流電源の一サイクル
と、その間におけるパルスジエネレータPGの出
力パルスVpの位相関係を示し、位相角θが制御
されて斜線を入れた導通期間の面積つまり供給電
気量が制御される。
E. Embodiment FIG. 1 shows an embodiment of the present invention. GT is connected to the secondary side of the step-down transformer T by the graphite tube of the sample reactor. The amount of power supplied to the graphite tube GT is adjusted by controlling the firing phase angle of the triac TA. DT is a photodiode that receives thermal radiation from the graphite tube GT and outputs a signal. That signal is an amplifier
It is amplified by SA1, and the output Vs of SA1 is input to the control amplifier CA. The relationship between the output Vs of SA1 and the temperature of the graphite tube GT has been investigated in advance and input into the temperature programmer TP.
The temperature programmer TP outputs the temperature signal at each stage to the control amplifier CA as a reference level signal Vr according to a preset schedule. The control amplifier CA amplifies the signal of the difference between the above Vs and Vr and sends it to the pulse generator PG, which generates a pulse at a timing according to the above input signal and applies it to the control terminal of the triac TA. By controlling the ignition phase, the amount of power supplied to the graphite tube GT is controlled so that the graphite tube GT reaches the temperature specified by the temperature programmer TP. Figure 2 shows one cycle of the AC power supply and the phase relationship of the output pulse Vp of the pulse generator PG during that cycle, and the phase angle θ is controlled to control the area of the conduction period indicated by diagonal lines, that is, the amount of electricity supplied. .

第1図で鎖線で囲んだ部分が本発明に係るグラ
フアイトチユーブの消耗程度検出回路である。ト
ランスTの1次側には電流検出コイルCTが鎖交
させてあり、同コイルの出力はアンプSA2を介
してコンパレータCP1とCP2とに印加されてい
る。CP1,CP2には夫々ポテンシヨメータによ
つて基準レベルVT1及びVT2が印加されてい
る。これらの基準レベルのうちVT1はグラフア
イトチユーブの通電スケジユールの適宜段階例え
ば第1段の乾燥段階での加熱電流の第1の下限値
に対応するアンプSA2の出力に合わせてあり、
VT2は同様にして第2の下限値に合せて設定し
てあり、VT2>VT1の関係である。温度プロ
グラマTPは通電スケジユールの第1段階でコン
パレータCP1,CP2の出力をチエツクするよう
になつている。CP1,CP2はアンプSA2の出
力が基準レベルVT1,VT2より低くなつたら
信号を出力する。上述したようにVT2>VT1
で、グラフアイトチユーブは消耗するに従い加熱
電流が低下して来るから、消耗が進むとまずCP
2の方が先に信号を出し、温度プログラマTPは
この信号を検出したらブザー等の警告手段DPを
作動させてオペレータにチユーブGTを変換すべ
きことを告げる。更に消耗が進むとコンパレータ
CP1も信号を出すようになり、TPはこの信号を
検知したときは分析動作を停止する。このような
二段構えになつているのは、無人で自動分析を行
う場合に備えたものであるが、オペレータがいる
場合でも、警告がなされても何等かの都合で直ち
にグラフアイトチユーブGTの交換ができないよ
うな場合に、なおしばらくは分析を続行できるた
めの備えにもなる。
The part surrounded by a chain line in FIG. 1 is a graphite tube wear degree detection circuit according to the present invention. A current detection coil CT is linked to the primary side of the transformer T, and the output of the coil is applied to comparators CP1 and CP2 via an amplifier SA2. Reference levels VT1 and VT2 are applied to CP1 and CP2 by potentiometers, respectively. Among these reference levels, VT1 is set in accordance with the output of amplifier SA2 corresponding to the first lower limit value of the heating current at an appropriate stage of the energization schedule of the graphite tube, for example, the first drying stage.
VT2 is similarly set to match the second lower limit value, and the relationship is VT2>VT1. The temperature programmer TP is designed to check the outputs of the comparators CP1 and CP2 in the first stage of the energization schedule. CP1 and CP2 output signals when the output of amplifier SA2 becomes lower than reference levels VT1 and VT2. As mentioned above, VT2>VT1
As the graphite tube wears out, the heating current decreases, so as the graphite tube wears out, the CP
2 issues a signal first, and when the temperature programmer TP detects this signal, it activates a warning means DP such as a buzzer to notify the operator that the tube GT should be converted. If the wear progresses further, the comparator
CP1 also begins to emit a signal, and when TP detects this signal, it stops the analysis operation. This two-stage system is in preparation for unattended automatic analysis, but even if an operator is present, the Graphite Tube GT may be immediately activated for some reason even if a warning is issued. It also provides preparation for continuing analysis for a while in the event that replacement is not possible.

ヘ 効果 本発明は試料原子化炉の定温制御系を利用して
原子化炉の消耗状態を監視するようにしたので、
原子化炉交換時期の選択に主観が入らず、また定
期的に交換する場合のような浪費も起らず、劣化
した炉を使つて信頼性の低い測定が行われてしま
つたり、或は装置の破損、試料の損失と云つた失
敗も防止される。特に本発明においては、上述し
たようにグラフアイトチユーブの劣化の状態を比
較的初期と、後期の2段階に検出し、比較的初期
の劣化の検出によつて警告を行い、後期の劣化の
検出で分析動作を停止するようにしたので、分析
を行つている間、いつ分析動作が停止になるかわ
からないと云う不安なしに、警告があるまで安心
して同じ試料原子化炉を使い続け、その後はオペ
レータの都合と判断で炉の交換を行うか、なおし
ばらく分析を続けてその後炉の交換を行うかの選
択が可能となり、しかも無理に一つの炉を使い続
けて、炉を破損してしまう心配もなくなるのであ
る。
F. Effect The present invention monitors the consumption state of the reactor by using the constant temperature control system of the sample reactor.
There is no subjectivity involved in choosing when to replace the nuclear reactor, there is no waste as would occur when replacing the reactor periodically, and unreliable measurements are performed using a deteriorated reactor. Failures such as equipment damage and sample loss are also prevented. In particular, in the present invention, as described above, the state of deterioration of the graphite tube is detected at two stages, a relatively early stage and a late stage, and a warning is issued based on the detection of relatively early stage deterioration, and the state of late stage deterioration is detected. Since the analysis operation is stopped during analysis, there is no need to worry about not knowing when the analysis operation will stop, and you can continue to use the same sample reactor with peace of mind until a warning is given, and then continue using the same sample reactor. The operator can now choose to replace the furnace at his own discretion or continue analysis for a while and then replace the furnace, and there is no need to worry about damaging the furnace by forcing him to continue using one furnace. It will also disappear.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例装置の回路図、第2
図は導通位相角制御を説明するグラフである。 GT……試料原子化炉のグラフアイトチユー
ブ、DT……フオトダイオード、TP……温度プ
ログラマ、DP……警告装置、PG……パルスジエ
ネレータ、CP1,CP2……コンパレータ。
Fig. 1 is a circuit diagram of a device according to an embodiment of the present invention;
The figure is a graph explaining conduction phase angle control. GT...graphite tube of sample reactor, DT...photodiode, TP...temperature programmer, DP...warning device, PG...pulse generator, CP1, CP2...comparators.

Claims (1)

【特許請求の範囲】[Claims] 1 試料原子化炉のグラフアイトチユーブの温度
を検出し、グラフアイトチユーブの加熱電流を調
節してグラフアイトチユーブの温度を複数の段階
に制御する定温制御系を備えると共に、上記一つ
の温度段階において、上記加熱電流を検出して、
これを予め設定されている上下二つの基準レベル
と比較する手段を設け、上記加熱電流が上記二つ
の基準レベルのうち高い方のレベル以下になつた
ことを検知して警告手段を作動せしめ、更に上記
二つの基準レベルのうち低い方のレベル以下にな
つたことを検知したときは分析動作を停止させる
グラフアイトチユーブ消耗監視系を設けたことを
特徴とする原子吸光分析装置。
1. A constant temperature control system that detects the temperature of the graphite tube of the sample reactor, adjusts the heating current of the graphite tube, and controls the temperature of the graphite tube in multiple stages; , detecting the heating current,
A means for comparing this with two preset upper and lower reference levels is provided, and a warning means is activated upon detecting that the heating current has fallen below the higher of the two reference levels; An atomic absorption spectrometer characterized in that it is equipped with a graphite tube consumption monitoring system that stops the analysis operation when it detects that the temperature has fallen below the lower of the two reference levels.
JP11212784A 1984-05-30 1984-05-30 Atomic absorption spectrometer Granted JPS60253850A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11212784A JPS60253850A (en) 1984-05-30 1984-05-30 Atomic absorption spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11212784A JPS60253850A (en) 1984-05-30 1984-05-30 Atomic absorption spectrometer

Publications (2)

Publication Number Publication Date
JPS60253850A JPS60253850A (en) 1985-12-14
JPH0473093B2 true JPH0473093B2 (en) 1992-11-19

Family

ID=14578869

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11212784A Granted JPS60253850A (en) 1984-05-30 1984-05-30 Atomic absorption spectrometer

Country Status (1)

Country Link
JP (1) JPS60253850A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087141B2 (en) * 1987-06-16 1996-01-29 株式会社島津製作所 Sample atomizer heating device
JPH07117488B2 (en) * 1991-02-28 1995-12-18 株式会社島津製作所 Atomic absorption spectrophotometer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204439A (en) * 1981-06-12 1982-12-15 Hitachi Ltd Electric power supplying device
JPS5885143A (en) * 1981-11-14 1983-05-21 Shimadzu Corp Heating control device for atomic absorption spectrometry

Also Published As

Publication number Publication date
JPS60253850A (en) 1985-12-14

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