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JPH051413B2 - - Google Patents
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JPH051413B2 - - Google Patents

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Publication number
JPH051413B2
JPH051413B2 JP58096551A JP9655183A JPH051413B2 JP H051413 B2 JPH051413 B2 JP H051413B2 JP 58096551 A JP58096551 A JP 58096551A JP 9655183 A JP9655183 A JP 9655183A JP H051413 B2 JPH051413 B2 JP H051413B2
Authority
JP
Japan
Prior art keywords
absorbance
sample
ratio
maximum
sample atomization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58096551A
Other languages
Japanese (ja)
Other versions
JPS59220631A (en
Inventor
Kikuo Sasaki
Kenji Kawasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP9655183A priority Critical patent/JPS59220631A/en
Publication of JPS59220631A publication Critical patent/JPS59220631A/en
Publication of JPH051413B2 publication Critical patent/JPH051413B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103Atomic absorption analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 (イ) 産業上の利用分野 本発明は火炎等によつて試料を原子化する方式
の原子吸光分析装置における試料原子化部と分光
光学系との相対的位置関係を調節する装置に関す
る。
[Detailed Description of the Invention] (a) Field of Industrial Application The present invention is directed to the relative positional relationship between the sample atomization section and the spectroscopic optical system in an atomic absorption spectrometer that atomizes the sample using flame or the like. Relating to a regulating device.

(ロ) 従来技術 原子吸光分析は試料を火炎或は試料原子化炉等
を用い高温で原子化し、原子化された試料雰囲気
中を光を通して、原子化された試料成分元素によ
る特定波長の光の吸収を測定するものであるが、
試料が原子化されている空間における試料成分元
素の濃度分布は均一でなく、濃度分布にも温度分
布にもゆらぎがあるから吸収の測定には相当のノ
イズが含まれている。従つて分析に当つては、な
るべく感度良好でかつS/N比が大であるような
試料原子化部と分光光学系との位置関係を探して
測定を行う必要がある。即ち感度を上げるために
は試料原子化部で試料成分の元素濃度がなるべく
高くしかも光の通過パスが長くなるように、試料
原子化部に光を通すのがよく、ノイズを小さくす
るには試料原子化部において濃度及び温度のゆら
ぎが小さく安定している領域を光が通るようにす
る。このような試料原子化部と分光光学系の位置
関係の調整は従来、オペレータが吸光度の測定値
を記録させながら、手動的に試料原子化部の位置
を動かして感度及びS/N比が測定上最も好まし
いと思われる位置関係を探すという方法によつて
いた。しかしこのような手動的に位置調整は主観
的要素が大きく、それだけにオペレータが神経を
使うもので、相当の熟練を要し、また時間のかゝ
るものであつた。
(b) Prior art In atomic absorption spectrometry, a sample is atomized at high temperature using a flame or a sample atomization reactor, and then light is passed through the atmosphere of the atomized sample to emit light of a specific wavelength by the atomized sample component elements. Although it measures absorption,
The concentration distribution of the sample component elements in the space where the sample is atomized is not uniform, and there are fluctuations in both the concentration distribution and the temperature distribution, so absorption measurements contain considerable noise. Therefore, during analysis, it is necessary to find a positional relationship between the sample atomization part and the spectroscopic optical system that provides as good sensitivity as possible and a large S/N ratio. In other words, in order to increase sensitivity, it is best to pass light through the sample atomization section so that the elemental concentration of the sample components is as high as possible in the sample atomization section and the passage path of the light is long. In the atomization section, light is allowed to pass through a region where fluctuations in concentration and temperature are small and stable. Conventionally, to adjust the positional relationship between the sample atomization unit and the spectroscopic optical system, an operator manually moves the position of the sample atomization unit while recording the measured absorbance value, and measures the sensitivity and S/N ratio. The method used was to find the positional relationship that seemed to be the most favorable. However, such manual position adjustment has a large number of subjective elements, requires the operator's attention, requires considerable skill, and is time-consuming.

(ハ) 目 的 本発明は上述した試料原子化部と分光光学系と
の位置関係の調整を自動化することを目的とす
る。
(c) Purpose The present invention aims to automate the adjustment of the positional relationship between the sample atomization section and the spectroscopic optical system described above.

(ニ) 構 成 本発明原子吸光分析装置は、吸光度値が比較的
大なるときは、S/N比を優先してS/N比最大
となる状態を検索し、吸光度値が小さく充分な感
度が得難いときは、感度を優先して吸光度値が最
大になる状態を検索するようにし、S/N比優先
か感度優先かの切換えを自動化したもので、試料
原子化部を移動させる機構と、この機構を駆動す
ると共に、試料原子化部の位置を検出し記憶する
制御装置を有し、かつこの制御装置に、試料原子
化部を移動させながら試料原子化部の位置のデー
タと光吸収のデータとノイズのデータとをサンプ
リングして記憶し、この記憶に基いてS/N比の
最大値と、それに対応する位置および吸光度デー
タの最大値とその位置を検索し、S/N比最大に
対応する吸光度が、吸光度最大値の1/k以上な
らS/N比最大になる位置、1/k以下なら吸光
度データ最大に対応する位置を試料原子化部の最
適位置を判定し、試料原子化部をその位置に駆動
する制御動作プログラムを設定したことを特徴と
する。
(D) Configuration When the absorbance value is relatively large, the atomic absorption spectrometer of the present invention gives priority to the S/N ratio and searches for the state where the S/N ratio is maximum, and when the absorbance value is small and the sensitivity is sufficient. When this is difficult to obtain, priority is given to sensitivity and the state where the absorbance value is maximized is searched, and the switching between giving priority to S/N ratio and sensitivity is automated. It has a control device that not only drives this mechanism but also detects and stores the position of the sample atomization section, and this control device is provided with data on the position of the sample atomization section and information on the light absorption while moving the sample atomization section. The data and the noise data are sampled and stored, and based on this storage, the maximum value of the S/N ratio and the corresponding position, and the maximum value of the absorbance data and its position are searched, and the maximum value of the S/N ratio is searched. If the corresponding absorbance is 1/k or more of the maximum absorbance value, the position where the S/N ratio is maximized is determined, and if it is 1/k or less, the position corresponding to the maximum absorbance data is determined as the optimal position of the sample atomization unit, and sample atomization is performed. The invention is characterized in that a control operation program is set to drive the part to that position.

(ホ) 実施例 第1図は試料原子化部の移動機構の移動のベク
トル成分を示し、Fは試料原子化用火炎であり、
この実施例では移動のベクトル成分は上下方向移
動Vと左右方向移動Hと垂直軸廻りの回転Tの三
つであり、これらの移動は夫々制御装置によつて
制御される。第2図は本発明の実施例の全体構成
を示すブロツク図である。1は光源、Fは上述し
た試料原子化部の炎、2は分光器で3は測光素子
である。試料原子化部Fは左右方向移動機構Dh、
上下方向移動機構Dv、垂直軸廻りの回転機構Dt
によつて移動せしめられ、これらの機構は制御装
置Cによつて駆動される。測光素子3の出力はプ
リアンプ4を経て吸光度変換器5に入力され吸光
度の信号となる。吸光度の信号は第3図に示すよ
うにノイズを含んでいるので平均化回路6でノイ
ズ成分が除去されメモリMに記憶せしめられる。
吸光度信号は更にハイパスフイルタ7にも入力さ
れ、同フイルタによつて直流成分がカツトされ、
ノイズだけが抽出され、実効値変換回路8で2乗
平均が求められる。このデータはノイズに関する
データでメモリMに記憶せしめられる。メモリM
には制御装置Cから試料原子化部Fの位置のデー
タh,v,tが送られて来て、これらも記憶せし
められる。
(E) Example Figure 1 shows the vector component of the movement of the movement mechanism of the sample atomization section, F is the flame for sample atomization,
In this embodiment, the vector components of the movement are the vertical movement V, the horizontal movement H, and the rotation T about the vertical axis, and these movements are each controlled by a control device. FIG. 2 is a block diagram showing the overall configuration of an embodiment of the present invention. 1 is a light source, F is the flame of the sample atomization section mentioned above, 2 is a spectrometer, and 3 is a photometric element. The sample atomization section F has a left and right movement mechanism Dh,
Vertical movement mechanism Dv, rotation mechanism around the vertical axis Dt
These mechanisms are driven by a control device C. The output of the photometric element 3 is input to an absorbance converter 5 via a preamplifier 4 and becomes an absorbance signal. Since the absorbance signal contains noise as shown in FIG. 3, the noise component is removed by the averaging circuit 6 and the signal is stored in the memory M.
The absorbance signal is further input to a high-pass filter 7, which cuts out the DC component.
Only the noise is extracted, and the root mean square value is determined by the effective value conversion circuit 8. This data is data related to noise and is stored in the memory M. Memory M
Data h, v, and t regarding the position of the sample atomization section F are sent from the control device C, and these data are also stored.

第4図は制御装置Cの試料原子化部位置調整動
作のフローチヤートである。この動作は試料原子
化部に試料を導入し、試料原子化部を位置走査の
始点に移動させ(イ)、まず試料原子化部を垂直
軸の廻りに回転させて吸光度の値が最大となる方
向を検出してその方向に試料原子化部Fの向きを
セツトし(ロ,ハ,ニ)、次に左右移動機構Dh、
上下移動機構Dvを駆動する(ヘ)。この駆動は左
右方向に移動範囲の一端から他端まで駆動し、上
下方向の位置を一段下げて左右方向にもとの位置
に戻し、又一段下げると云う動作の繰返しでジグ
ザグ移動により位置走査を行うものである。この
間位置のデータをサンプリング(イ)し、同時に
吸光度信号の平均値即ち平均化回路6の出力であ
る吸光度データ及び実効値回路8の出力であるノ
イズのデータもサンプリング(チ)して、夫々メ
モリの対応アドレスに格納する。この動作は
(ホ)の判定動作がYESになる迄行われ、判定動
作(ホ)がYESになつたらDh,Dvを停止させ、
メモリMのデータを読出してS/N比最大即ち回
路6の出力と回路8の出力の比が最大となる位置
h,vのデータを索出し(ヌ)、その位置におけ
る吸光度のデータと吸光度最大の値とを比較し
(ル)、位置h,vにおける吸光度が最大値の1/
k以上であれば(判定(オ)がYES)、Dh,Dv
を駆動して試料原子化部Fを上記h,vの位置に
セツト(ワ)して動作を終る。即ちS/N比最高
のときの吸光度が吸光度の最大値の1/k以上で
あれば最大値よりもS/N比最高の方を選択し、
1/k以下であれば吸光度最大の方を選択するわ
けである。判定(オ)がNOのときは吸光度値が
最大になる位置を検出(カ)して、その位置へ試
料原子化部を駆動(ヨ)して動作を終る。
FIG. 4 is a flowchart of the sample atomization section position adjustment operation of the control device C. This operation involves introducing the sample into the sample atomization section, moving the sample atomization section to the starting point of position scanning (a), and first rotating the sample atomization section around the vertical axis until the absorbance value is maximized. Detect the direction and set the orientation of the sample atomization unit F in that direction (B, C, D), then move the left and right movement mechanism Dh,
Drive the vertical movement mechanism Dv (F). This drive is performed by driving from one end of the movement range in the left-right direction to the other end, lowering the vertical position by one step, returning to the original position in the left-right direction, and repeating this operation to scan the position by zigzag movement. It is something to do. During this time, the position data is sampled (A), and at the same time, the average value of the absorbance signal, that is, the absorbance data that is the output of the averaging circuit 6, and the noise data that is the output of the effective value circuit 8 are also sampled (H), and the data are stored in the memory. Store in the corresponding address. This operation is performed until the judgment operation (E) becomes YES, and when the judgment operation (E) becomes YES, Dh and Dv are stopped,
Read the data in the memory M, find out the data at positions h and v where the S/N ratio is maximum, that is, the ratio of the output of circuit 6 and the output of circuit 8 is maximum (nu), and calculate the absorbance data and the maximum absorbance at that position. The absorbance at positions h and v is 1/ of the maximum value.
If k or more (judgment (o) is YES), Dh, Dv
is driven to set the sample atomization section F at the positions h and v above, and the operation is completed. That is, if the absorbance at the highest S/N ratio is 1/k or more of the maximum value of absorbance, select the one with the highest S/N ratio rather than the maximum value,
If it is 1/k or less, the one with the maximum absorbance is selected. If the judgment (e) is NO, the position where the absorbance value is maximum is detected (f), the sample atomization unit is driven to that position (y), and the operation ends.

なお第2図で切換スイツチSwは通常測定の場
合図示のように接点A側に接触させてあるが、接
点E側に切換えて行う測定は、測光出力を吸光度
変換器5に通さない測定で、炎Fを使つた発光分
析、炎を用いずグラフアイト炉のような試料原子
化炉を用いる吸光分析において、グラフアイト炉
の位置合せ(グラフアイト炉は細い孔が貫通して
いて、光をこの孔を通過させて測定を行う)等で
ある。
In Fig. 2, the changeover switch Sw is brought into contact with the contact A side as shown in the figure for normal measurements, but measurements performed by switching to the contact E side are measurements in which the photometric output is not passed through the absorbance converter 5. In optical emission analysis using flame F and absorption analysis using a sample reactor such as a graphite reactor without using a flame, the positioning of the graphite reactor (a graphite reactor has a thin hole passing through it, (measurement is performed by passing through the hole), etc.

(ヘ) 効 果 従来のように測定出力の表示をメータとか記録
計で見ながら試料原子化部の位置調整を行うとメ
ータ等の応答が遅い上炎のゆらぎ等によるノイズ
でメータとか記録計の指示は常に動揺しており、
感度最大の点は比較的見着けやすいがS/N比最
高の位置は大へん見定め難いのである。しかも常
にS/N比最高の位置に調整すればよいとは限ら
ず、S/N比が高くても測定出力そのものが小さ
過ぎるときは感度不足で有効桁数の多い測定はで
きないので、測定出力とS/N比との関係で、
S/N比最高と感度最大とを使い分ける必要があ
るが、オペレータが個人の判断でこの使い分けを
行うことは大へん神経を使うことであり、測定者
が異る測定間の比較を同一基準で行うことも困難
となる。しかし本発明によれば位置調整のスター
ト操作だけで自動的にそのような位置が求まり設
定される。また同じ元素の測定でも試料の物理的
性質の差異によつて例えば試料原子化部への吸入
量が異り、炎中での温度分布が変つて分析最適位
置が異り、また他元素の共存等化学的特性の異い
によつては炎の燃焼条件を変えた方が良いのであ
り、この場合は当然に分析最適位置も異つて来る
が、オートサンプラーを用いて分析する際等手動
で位置調整を行つていると余りにも繁雑で到底
一々位置調整を行つていることはできず、色々な
試料、色々な燃焼条件に対して最大公約数的な一
つの位置に設定しておく他なかつたのであるが、
本発明によればこのような場合でも各試料につき
夫々最適位置で分析を行うことができ、分析の精
度向上、能率向上を得ることができる。
(F) Effect If you adjust the position of the sample atomization section while viewing the measurement output display on a meter or recorder as in the past, the response of the meter will be slow and the meter or recorder will be affected by noise caused by fluctuations in the flame. The instructions are always agitated;
The point of maximum sensitivity is relatively easy to find, but the position of maximum S/N ratio is very difficult to find. Moreover, it is not always advisable to adjust to the position with the highest S/N ratio; even if the S/N ratio is high, if the measurement output itself is too small, the sensitivity will be insufficient and measurement with a large number of effective digits will not be possible. In relation to the S/N ratio,
It is necessary to use the highest S/N ratio and the highest sensitivity, but it takes a lot of nerve for operators to make this distinction based on their personal judgment, and it is difficult for operators to compare different measurements using the same standard. It is also difficult to do so. However, according to the present invention, such a position is automatically determined and set simply by the position adjustment start operation. In addition, even when measuring the same element, differences in the physical properties of the sample may cause, for example, the amount of suction into the sample atomization section to vary, the temperature distribution in the flame may change, the optimum position for analysis may vary, or the coexistence of other elements may cause differences in the sample's physical properties. Depending on the difference in isochemical characteristics, it is better to change the combustion conditions of the flame, and in this case, the optimal analysis position will naturally differ, but when analyzing using an autosampler, it is better to change the flame combustion conditions manually. The adjustments were so complicated that it was impossible to adjust the position one by one, so we had no choice but to set the position to the greatest common divisor for various samples and various combustion conditions. However,
According to the present invention, even in such a case, each sample can be analyzed at its optimum position, and the accuracy and efficiency of analysis can be improved.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の一実施例を示し、第1図は試料
原子化部移動のベクトル成分を示す斜視図、第2
図は装置全体を示すブロツク図、第3図は吸光度
信号のグラフ、第4図は制御装置の動作を示すフ
ローチヤートである。 F…試料原子化を行う炎、1…光源、3…測光
素子、Dh,Dv,Dt…試料原子化部移動機構。
The drawings show one embodiment of the present invention, and FIG. 1 is a perspective view showing vector components of movement of the sample atomization part, and FIG.
FIG. 3 is a block diagram showing the entire apparatus, FIG. 3 is a graph of the absorbance signal, and FIG. 4 is a flowchart showing the operation of the control device. F...flame for sample atomization, 1...light source, 3...photometric element, Dh, Dv, Dt...sample atomization section movement mechanism.

Claims (1)

【特許請求の範囲】[Claims] 1 試料原子化部を移動させる移動機構と、同機
構を駆動すると共に試料原子化部を移動させなが
ら吸光度のデータ及びノイズのデータをサンプリ
ングして記憶させ、これらの記憶に基づいて、
S/N比の最大値を検出し、そのS/N比に対応
している吸光度のデータが、吸光度の最大値の
1/kより大なるときはS/N比最大に対応する
位置、1/kより小なるときは吸光度最大に対応
する位置を試料原子化部の最適位置と判定し、上
記S/N比最大或いは吸光度値最大に対応する位
置のデータに応じてその位置に試料原子化部を移
動させる動作プログラムを有する制御装置を備え
た原子吸光分析装置。
1. A moving mechanism for moving the sample atomization unit, and sampling and storing absorbance data and noise data while driving the mechanism and moving the sample atomization unit, and based on these memories,
When the maximum value of the S/N ratio is detected and the absorbance data corresponding to the S/N ratio is greater than 1/k of the maximum value of the absorbance, the position corresponding to the maximum S/N ratio, 1 /k, the position corresponding to the maximum absorbance is determined to be the optimal position of the sample atomization section, and the sample atomization is performed at that position according to the data of the position corresponding to the maximum S/N ratio or maximum absorbance value. An atomic absorption spectrometer equipped with a control device having an operation program for moving parts.
JP9655183A 1983-05-30 1983-05-30 Atomic absorption spectrometer Granted JPS59220631A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9655183A JPS59220631A (en) 1983-05-30 1983-05-30 Atomic absorption spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9655183A JPS59220631A (en) 1983-05-30 1983-05-30 Atomic absorption spectrometer

Publications (2)

Publication Number Publication Date
JPS59220631A JPS59220631A (en) 1984-12-12
JPH051413B2 true JPH051413B2 (en) 1993-01-08

Family

ID=14168212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9655183A Granted JPS59220631A (en) 1983-05-30 1983-05-30 Atomic absorption spectrometer

Country Status (1)

Country Link
JP (1) JPS59220631A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63145948A (en) * 1986-12-09 1988-06-18 Shimadzu Corp Atomic absorption spectrochemical analyzer
JPH07119689B2 (en) * 1988-03-26 1995-12-20 株式会社島津製作所 Flame atomic absorption spectrometer
JPH0711484B2 (en) * 1988-12-27 1995-02-08 株式会社島津製作所 Atomic absorption spectrophotometer
JPH04274736A (en) * 1991-02-28 1992-09-30 Shimadzu Corp Atomic absorption spectrophotometer
CN103592243A (en) * 2013-11-15 2014-02-19 上海仪电分析仪器有限公司 Automatic position correcting device for atomizer

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5619648Y2 (en) * 1976-08-17 1981-05-11
JPS53114285U (en) * 1977-02-18 1978-09-11
JPS57110449U (en) * 1980-12-25 1982-07-08

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