JPH0520690B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a material testing machine for testing various properties of materials and a data processing device thereof.

B. Conventional technology For example, as shown in Fig. 2, there has been a material testing machine (main body) 1 that actually collects various data.
0 and a data processing device 20 that analyzes the collected data are connected via a transmission line L. Both the material testing machine 10 and the data processing device 20 have computer systems equipped with central processing units CPU11, 21 such as microprocessors, and data are exchanged via transmission interface circuits 14, 24.
Load and strain (displacement) data obtained from the load cell 15 and extensometer 16 during the test are sent in real time from the material testing machine 10 to the data processing device 20 for analysis.

C. Problems to be Solved by the Invention In such a conventional material testing machine system, the transmission interval for transmitting measurement data in real time is extremely large compared to the sampling period for collecting data on the material testing machine 10 side. That is, although data can be collected at short intervals of, for example, 2.5 ms on the material testing machine 10 side, the transmission interval to the data processing device 20 is as long as, for example, 50 ms because it takes time to exchange the transmission protocol.

For this reason, even if a large amount of data can be collected by the material testing machine through detailed sampling, a small portion of it will be scattered (in the above example, with a density of 1/20 by simple calculation) by the data processing device 20. detailed analysis is not possible.

If the CPU 21 on the data processing device 20 side directly controls the measuring instruments on the material testing machine side, such as the load cell, without waiting for the CPU on the material testing machine 10 side, the CPU 2
1 determines the data sampling period, sampling can be performed at a short period corresponding to the instruction cycle. However, if data is collected at short intervals corresponding to the command cycle, analysis processing cannot be performed in real time. Since this cannot be known, the test is only terminated, for example, when a rupture occurs. If the data is collected coarsely, analysis processing can be performed in real time, and in the above example, it is possible to end the process at the upper yield point, but detailed analysis is still not possible.

A technical problem of the present invention is to perform analysis in real time in a data processing device in parallel with testing using a material testing machine, and also to be able to perform more detailed analysis as necessary.

D Means for Solving the Problems Explaining with reference to FIG. 1, which is a diagram corresponding to claims, the material testing machine 100 according to the present invention includes a transmission means 101 that sends collected data to a data processing device.
and a data collection means 10 that collects data at a sampling period shorter than the transmission interval of the transmission means 101.
3, and a storage means 102 for sequentially storing data collected by the data collection means 103.

Further, the data processing device 200 according to the present invention includes:
A first analysis means 201 receives collected data sent from the material testing machine 100 at predetermined transmission intervals in parallel with the test and performs a rough analysis;
The second analysis means 202 performs a detailed analysis of the data collected and stored in the storage means 102 of 0 and transmitted after the test is completed.

E. Effect During the test, the transmission means 101 of the material testing machine 100 sends only a predetermined number of pieces of data out of the data collected by the data collection means 103 to the data processing device 200 in parallel with the test. In response to this, the data processing device 200 starts the first analysis means 2.
01 performs analysis in real time.

On the other hand, in the material testing machine 100, data collected by the data collection means 103 at a sampling period shorter than the transmission interval of the transmission means 101 is stored in the storage means 102. Therefore, data processing device 2
00, if necessary, after the test is finished, a more detailed analysis can be performed by the second analysis means 202 using the data stored in the storage means 102. An embodiment of the invention will be described.

FIG. 2 is a block diagram schematically showing a material testing machine system comprising a material testing machine and a data processing device according to this embodiment. In the same figure, the material testing machine 10 and the data processing device 20 both have a CPU 1.
1, 21 and read-only fixed memory ROM
12, 22 and rewritable variable memory RAM
It is composed of a computer system equipped with 13 and 23. These also include transmission interface circuits 14 and 24, through which data is exchanged via a transmission line L.

The material testing machine 10 of this embodiment is used to test load-displacement characteristics, etc., and includes a load cell 15 for measuring the load applied to the sample, and an extensometer 16 for measuring the deformation occurring in the sample. and an AD converter 17 that converts the analog output of each measuring device into a digital signal. On the other hand, the data processing device 20 includes a keyboard 25,
It is equipped with a CRT 26 and an X-Y plotter 27, and the operator can issue various commands to the material testing machine 10 and view data analysis results on the data processing device 20 side.

The procedure will be explained in detail below using the flowchart shown in FIG. This means that each CPU 11, 21
Program instructions stored in fixed memories 12 and 22 in advance are transferred to variable memory 1 as needed.
This is realized by sequentially executing the data while accessing the data on 3 and 23.

FIG. 3a shows a time interrupt processing procedure during a test in the material testing machine 10. In the figure, when the timing of sampling, which is repeated every predetermined period ts (for example, 2.5 ms), arrives, each measurement data is collected (step S101). Here, data on the load from the load cell 15 and the displacement from the extensometer 16 are taken in.

Next, the loop counter provided in the variable memory 13
The count values of KK and JJ are incremented by "1" (step S102). If the value of KK does not reach n (step S103) and the value of JJ does not reach 〓 (step S105), this round of processing ends.

When the value of KK reaches n (step S103), the collected data as a pair of load and displacement is sent to the data processing device 20 as transmission data in a predetermined format, and the counter KK is cleared (step S103).
S104). This data is expressed as data Dj.

As a result, as shown in FIG. 4, for example, out of the collected data di (indicated by black circles), data is picked up at a rate of 1 in n (indicated by white circles).
Dj is sent to the data processing device 20. The transmission interval is n·ts.

On the other hand, when the value of the counter JJ reaches 〓 (step S105), the collected data is stored in the variable memory 13 until the value of the counter M indicating the number of data stored in the variable memory 13 exceeds m (step S106). Store it in the measured data area (step S107), and
Increment the value by 1 (step
S108).

As a result, samples are taken at a period of ts during the period from time t ₁ after the start of the test 〓・ts to the time after m・ts (this corresponds to, for example, between S ₁ and S ₂ in Figure 4). All m pieces of data are sequentially stored in the measurement data area. This situation is shown in FIG. dxi
(i=1 to m) indicates a pair of load and displacement data.

On the other hand, the data processing device 20 receives data Dj from the material testing machine 10 as shown in FIG. 3b.
An interrupt occurs due to the transmission of , and the following interrupt processing program is executed.

First, the transmitted data DJ is stored in the variable memory 23.
The received data is stored in a predetermined area (step S201), and analyzed along with the already received data (step S202). As mentioned above, the transmission interval of data Dj is n·ts, and this analysis is performed with relatively rough accuracy.

In this way, the acquisition and analysis of the transmission data Dj continues, but for example, as a result of the analysis, the upper yield point A
(See Figure 4) is detected and it is determined that the test has ended (Step S203), after issuing an instruction to the material testing machine 10 to stop the execution of the program shown in Figure 3a and end the test. (Step S204), and issues an instruction to send out the data stored in the measurement data area (Step S205). This command causes an interrupt to the CPU 11 of the material testing machine 10, and as shown in FIG. 3c, all data dxi (i=1 to m) stored in the measurement data area are sent out (step S151).

The data processing device 20 takes in these data (step S206) and analyzes them (step S207).
These data are collected at a short sampling period ts, and a more detailed analysis can be performed on the characteristics between t ₁ and t ₂ specified in advance.

In this way, while testing is performed using the material testing machine 10, a rough analysis can be performed in real time using the data processing device 20, and more detailed analysis can be performed on necessary portions after the test is completed.

In the above embodiment, the transmission interface circuit 14 connects the variable memory 13 to the transmission means 101.
corresponds to the storage means 102, and the CPU 11 corresponds to the data collection means. Further, the CPU 21 constitutes first and second analysis means 201 and 202.

By the way, in the above-mentioned example, the starting point (when ts time has elapsed since the start of the test) and the end point (mts time from the starting point) of the period for storing data in the measurement data area of the variable memory 13 are fixed. It cannot be set arbitrarily depending on the content of the test. For this reason, when detecting the upper yield point, for example, if the range between the start point and the end point deviates from the upper yield point A as shown in T' shown in FIG. 6, detailed analysis around the upper yield point cannot be performed.

FIG. 7 shows an example in which such inconveniences are eliminated. This figure is a flowchart showing the processing procedure during a test in the material testing machine 10.

The processing in steps S101 to S108 is performed in the same way as in FIG. 3a, but if the number of data dxi stored in the measurement data area exceeds m (step
S106), data could not be stored in FIG. 3a, but in this embodiment, data is stored in the following manner.

It is checked whether the end flag is set in a predetermined area of the variable memory 13, and (step
S111), if the end flag is not set, the data dxi (i>m) at that time is displayed in the measurement data area.
is stored (step S107). Since the measurement data area only has storage space for m sets of data, data is rewritten in order of oldest data, that is, from data dx ₁ to new data. This situation is shown in FIG. Next, the value of the counter M is incremented by "1" (step S108).

Next, compare the magnitude of the load data Li imported this time with the previous load data Li _-1 (step
S109). When Li becomes smaller than Li _-1 , it is determined that the upper yield point A has been reached and an end flag is set (step S110).

In this way, if the upper yield point is not detected during the first m storage periods T', the storage periods are sequentially shifted, and data storage is immediately terminated after the upper yield point is detected (Li < Li _-1 ). . After the upper yield point is detected, data storage may be continued and may be terminated, for example, when the upper yield point is located near the center of the storage period. In addition, the capacity of the measurement data area was limited to m sets of collected data, and the oldest data was rewritten to new data in order.However, by allocating more capacity, new data dxi(i>
m) may be added.

The material testing machine for measuring load-displacement characteristics has been described above, taking as an example the case where the test is conducted with a particular focus on detecting the upper yield point. However, the present invention is not limited to this, and the present invention is not limited to this. The same effect can be obtained by applying it to various material testing machine systems, including viscometers such as .

G Effects of the Invention According to the present invention, in a material testing system in which a material testing machine and a data processing device are coupled via a transmission line, data can be analyzed in real time in parallel with testing, and More detailed analysis can be performed on the necessary parts.

[Brief explanation of the drawing]

FIG. 1 is a complaint correspondence diagram. Figures 2 to 5
The figures show one embodiment of the present invention; Fig. 2 is a block diagram showing the configuration of a material testing machine system;
Figures a, b, and c are flowcharts showing the operation.
The figure is a load-displacement characteristic diagram, and FIG. 5 is a memory map showing the measurement data area of the variable memory. 6th
Figures to Figures 8 are diagrams showing modified examples, and the fourth
FIG. 3a and FIG. 5 correspond to FIG. 10... Material testing machine, 11, 21... CPU,
12, 13, 22, 23...Memory, 14, 24
...Transmission interface circuit, 20...Data processing device, L...Transmission line.

Claims (1)

[Scope of Claims] 1. In a material testing machine that transmits data collected during a test to a data processing device, there is a transmission means for sending data to the collected data processing device, and a data processing device that transmits data at a sampling period shorter than the transmission interval of the transmission means. and a storage means for sequentially storing the data collected by the data collection means, and the transmission means stores only a predetermined number of pieces of data among the data collected by the data collection means. A material testing machine characterized by sending data to a data processing device in parallel with testing. 2 In the data processing device of the material testing machine, which receives and analyzes collected data from the material testing machine, in parallel with the test, it receives the collected data sent from the material testing machine at predetermined transmission intervals and performs a rough analysis. and a second analysis means that performs a detailed analysis using the data collected and stored in the storage means of the material testing machine at a sampling period shorter than the transmission interval during the test and transmitted after the test is completed. A data processing device for a material testing machine characterized by: