JPH0797437B2 - Material testing machine - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a material testing machine for testing various properties of materials.

B. Conventional Technology Conventionally, as a tester of this type, as shown in FIG. 2, for example, a material testing machine (main body) 10 that actually collects various data and a data processing that analyzes the collected data. A device having a configuration in which the device 20 and the device 20 are coupled via a transmission line L is used. The measuring device 10 and the data processing device 20 are both a central processing unit (CPU) 1 such as a so-called microprocessor.
It has a computer system including 1, 21 and exchanges data via the transmission interface circuits 14, 24. In parallel with the test, the data such as load and strain obtained from the load cell 15 and the extensometer 16 on the measuring device 10 side is sent to the data processing device 20 in real time for analysis.

C. Problem to be Solved by the Invention In such a conventional material testing machine, the format of the transmission data when sending the measurement data from the measuring device 10 to the data processing device 20 in real time was fixed. FIG. 4 (a) shows an example of the information data section II.
Is obtained from the load data obtained from the load cell 15, the first and second strain data obtained from the first and second extensometers 16A and 16B, the pulse encoder 17 and the stroke counter 18 that counts its output pulses. Stroke data of the crosshead to be generated, and other data (for example, data indicating the state of the measuring device 10 such as whether the crosshead is moving up or down). The format of the measurement data transmitted from the measuring device 10 to the data processing device 20 in parallel with the test is always fixed in FIG. 4 (a).

On the other hand, the data transmission interval T is the transmission procedure probability time t ₁
Also, it is fixed to a certain value which is limited as T> t ₁ + t ₂ by the required transmission time t ₂ which is determined according to the length (number of bytes) of the transmission data.

Therefore, depending on the type of test, it may be desired to acquire and analyze the data at a shorter time interval for specific data, in other words, at a higher density per unit time. Depending on the type, all the data in the above format, including data that is not always necessary, are always sent at the same fixed time intervals.

A technical object of the present invention is to enable necessary data to be transmitted at an appropriate density according to the type of test when transmitting the measurement data collected by the measuring device during the test to the data processing device in real time. It is in.

D. Means for Solving the Problem Explaining with reference to FIG. 1 which is a claim correspondence diagram, the present invention includes a measuring device 100 and a data processing device 200, and the measuring device 100 side collects various data at a predetermined sampling cycle. At the same time as the sampling, the data processing device 20 collects the collected data at a predetermined time interval in a format with a constant data length.
It is applied to the material testing machine that transmits to 0. And
According to the designated test mode from the storage means 101 for storing various data collected at a predetermined sampling period, the mode setting means 300 for designating the test mode, and the various data stored in the storage means 101. The above technical problems are solved by providing the data extracting means 102 for extracting the data of different types by the number that can be stored in the data length, and the transmitting means 103 for transmitting the extracted data to the data sled device 200. Solve.

Although the mode setting unit 300 is connected to the data processing device 200 for the sake of convenience in the drawing, the actual arrangement is not limited to this.

E. Action Various data collected at a predetermined sampling cycle are sequentially stored, and from these stored data, the number of types of data corresponding to the specified test mode is extracted and stored in a fixed data length. It is sent to the data processing device at a predetermined time interval in a format of a constant data length. Even though the data length, and therefore the total amount of data contained in one transmission data (packet), is fixed, the proportion of each measurement data that constitutes it is not fixed, and only certain types of data are selectively transmitted. It is also possible to do so. In that case, for example, when two types of data are sent compared to the case of sending four types of data, the data capacity per one type is doubled, so that the data is sampled at half short intervals. You can collect data.

F. Embodiment One embodiment of the present invention will be described with reference to FIGS.

FIG. 2 is a block diagram showing a schematic configuration of the material testing machine of this embodiment. In the figure, the measuring device 10 and the data processing device 20 are both CPUs 11 and 21, read-only fixed memories (ROM) 12 and 22, and rewritable variable memory (RA).
M) consists of a computer system with 13,23. These also include transmission interface circuits 14 and 24, and exchange of data is performed via the transmission line L.

The material testing machine of the present embodiment is for carrying out a tensile / compression characteristic test and the like, and the measuring device 10 comprises a load cell 15 for measuring a load acting on the sample, and first and second elongations for measuring deformation occurring in the sample. 16A and 16B in total, a pulse encoder 17 and a stroke counter 18 for detecting the stroke of the crosshead, and an AD converter 19 for converting the analog output of each of these measuring instruments into a digital signal. On the other hand, the data processing device 20 includes a keyboard 25, a CRT 26, and an XY plotter 27. The operator issues various commands to the measuring device 10 from the data processing device 20 side, and The data analysis result can be viewed on the data processing device 20.

Here, the data processing device 20 is provided with a mode setting switch 29 (29A, 29B, 29C) through the input / output circuit 28. Depending on which one is turned on, the standard, high speed or peeling test can be performed. Two modes can be set alternatively. Information about which mode is set is given to the measuring device 10 via the transmission line L. This mode specifies the format of the data to be sent from the measuring device 10 to the data processing device 20 in real time.In the measuring device 10, a packet with a constant data length is created in the format according to the set mode, Transmission interface circuit 14
Send out through.

The procedure will be described in detail below with reference to the flowchart of FIG. This is because the CPUs 11 and 21 have fixed memories 12 and 2, respectively.
It is realized by sequentially executing the instructions in the program stored in advance in 2 while accessing the data in the variable memories 13 and 23 as necessary.

FIG. 3A shows a processing procedure during the test in the measuring device 10. In the figure, when the sampling timing repeated at a predetermined cycle (for example, 2.5 ms) comes, each measurement data is collected (step S101).
Here, each data such as the load by the load cell 15, the first and second strains by the extensometers 16A and 16B, and the crosshead stroke value by the pulse encoder 17 are read and sequentially stored in the measurement data area provided in the variable memory 13. To be done.

Next, determine the currently set mode (step
S102). As will be described later, when the mode is set by the mode setting switch 29 on the data processing device 20 side, the information is sent to the measuring device 10. Upon receiving this, the measuring device 10 stores this information in the mode area provided in the variable memory 13. Therefore, the mode is determined by reading the contents.

As a result of the determination, if A, that is, the normal mode is set, the value of the counter N provided in the variable memory 13 is checked (step S103), and if it has not reached "20", it is incremented by "1" (step S104). ). Next, similarly, the value of the counter I provided in the variable memory 13 is incremented by "1" (step S105), and if I has not reached "20" (step S106), the above processing is repeated.

Now, when the value of N reaches "20", 20 pieces of data such as load, strain, stroke value and the like obtained by 20 times of collection are accumulated in the measurement data area. Therefore, the 20th data among them is set as the transmission data in the output register of the transmission interface circuit 14 (step S107).

Here, the transmission data is created as a packet having a format as shown in FIG. The packet comprises a header part I and an information data part II. The header part I includes information indicating the type of mode, and the data processing device 20 receiving this can confirm which mode the data follows. on the other hand,
The information data section II includes data such as load, first and second strains, stroke values and the like.

After that, the counter N is cleared (step S108), and the value of the counter I is incremented by "1" (step S10).
Five). As a result, the value of I also becomes "20" (step S
106), after clearing this (step S109), the data set in step S107 is transmitted (step S109).
S110).

On the other hand, if B, that is, the high-speed mode is set (step S102), the same processing as in the A mode is repeated until the value of the counter N reaches "10" (steps S111 and S104). When the value reaches "10", the data of the 10th load and the 1st strain of the 10 sets of data accumulated in the measurement data area are set in the output register (step
S107). Therefore, since the step S107 is passed twice while the value of I becomes "20", a packet including two sets of data of the load and the first strain is created as shown in FIG. It is transmitted in S110.

Next, if C, that is, the peeling test mode is set (step S102), only the fifth load data is set in the output register every time the value of N becomes "5" (step S112) (step S107). ). Therefore, since step S107 is passed four times while the value of I becomes "20", a packet including the load data for four times is created as shown in FIG. 4 (c) and sent out in step S110. .

On the other hand, in the data processing device 20, as shown in FIG. 3B, the mode input by the mode setting switch 29 is taken in (step S201), and the information is sent to the measuring device 10 (step S202).

Thereafter, the measurement device 10 waits for the transmission of the measurement data (step S203), and if the data is transmitted, the sent data is stored in the RAM 23 in a predetermined area (step S204) and the analysis process is performed (step S205). . Similarly, until the test ends (step S206), the data sequentially sent from the measuring device 10 is analyzed in real time.

As described above, in the normal mode (A), the data sent from the measuring device 10 to the data processing device 20 in real time in parallel with the test includes all the data of the load, the first and second strains, and the stroke value. , But they are sampled at coarse intervals similar to the transmission interval T.

On the other hand, in the high speed mode (B), only the load and the first strain, the data sampled at the interval of T / 2 is sent, so that a more detailed analysis can be performed.

Further, in the peeling test mode (C), only the load data, the data obtained by sampling the fine pitch of T / 4 is sent.

Thus, even if the data length and the transmission interval of the transmission data are fixed, the required data can be transmitted to the data processing device 20 at an appropriate density according to the type of test.

In the above embodiment, the variable memory 13 is used as a storage means and CP
U11 is the data extraction means, and the transmission interface circuit 14
Respectively correspond to the transmission means.

The mode setting switch 29 corresponds to the mode setting means 300.

In the above example, the value of N is "2" in each mode.
Every time it becomes 0 "," 10 "or" 5 ", the 20th, 10th and 5th of the measurement data area, that is, the latest sampling data is set as the transmission data. Not limited, for example accumulated
You may calculate and transmit the average value of 20, 10 or 5 data. Further, it is also possible to set the specific data as transmission data each time the data is sampled, and send them all at the transmission timing.

In addition, select one of the three modes with the mode setting switch 29
The predetermined mode may be set by, for example, an input operation from the keyboard 25, and the types thereof are not limited to three. Furthermore, mode setting means 300
Need not be provided in the data processing device 20. Although the above embodiment assumes a case where the operator centrally manages the data processing device 20 side, a similar switch or the like may be provided on the measuring device 10 side.

Furthermore, the present invention is not limited to the above material testing machine, including a viscometer such as a capillary rheometer,
In particular, the same effect can be obtained by applying it to various material testing machines that collect two or more kinds of data on the measuring device side and transmit the data to the data processing device side.

G. Effect of the Invention According to the present invention, in a material testing system that transmits measured data collected on the measuring device side to a data processing device in real time during a test, even if the transmission data length and the transmission interval are fixed, the test Depending on the type of data, all data may be coarse in some cases, and in some cases finer density for specific data, and the necessary data may be transmitted in appropriate density for analysis. .

[Brief description of drawings]

FIG. 1 is a claim correspondence diagram. 2 to 4 show an embodiment of the present invention.
The figure is a block diagram showing the configuration of the material testing machine, FIGS. 3 (a) and 3 (b) are flowcharts showing the operation, and FIGS. 4 (a), 4 (b) and 4 (c) are diagrams showing the format of transmission data. Is. 10: Measuring device, 11, 21: CPU 12, 13, 22, 23: Memory 14, 24: Transmission interface circuit 20: Data processing device, 29: Mode setting switch L: Transmission line

Claims (1)

[Claims] 1. A measuring device and a data processing device are provided, wherein various data is sampled at a predetermined sampling period on the measuring device side, and at the same time, the sampled data is processed at a predetermined time interval in a format of a constant data length. In a material testing machine that transmits data to an apparatus, storage means for storing various data collected at a predetermined sampling period, mode setting means for designating a test mode, and various data stored in the storage means. A data extracting means for extracting the number of types of data corresponding to the designated test mode from the data length that can be accommodated in the data length, and a transmitting means for sending the extracted data to the data processing device. Characteristic material testing machine.