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JPH0531732B2 - - Google Patents
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JPH0531732B2 - - Google Patents

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Publication number
JPH0531732B2
JPH0531732B2 JP60049950A JP4995085A JPH0531732B2 JP H0531732 B2 JPH0531732 B2 JP H0531732B2 JP 60049950 A JP60049950 A JP 60049950A JP 4995085 A JP4995085 A JP 4995085A JP H0531732 B2 JPH0531732 B2 JP H0531732B2
Authority
JP
Japan
Prior art keywords
light
measured
detection element
spectroscopic means
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60049950A
Other languages
Japanese (ja)
Other versions
JPS61209339A (en
Inventor
Isao Hishikari
Takao Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Corp filed Critical Chino Corp
Priority to JP4995085A priority Critical patent/JPS61209339A/en
Publication of JPS61209339A publication Critical patent/JPS61209339A/en
Publication of JPH0531732B2 publication Critical patent/JPH0531732B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、被測定対象の性状を光学的に測定
する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to an apparatus for optically measuring the properties of an object to be measured.

[従来の技術] 従来、光を利用して、被測定対象の厚み、水
分、色あい等を測定する装置が知られている。た
とえば、水分を吸収する波長帯の光と、水分を吸
収しない波長帯の光との比率から、水分率等の被
測定対象の性状を測定している。
[Prior Art] Conventionally, devices are known that use light to measure the thickness, moisture content, color tone, etc. of an object to be measured. For example, the properties of the object to be measured, such as moisture content, are measured from the ratio of light in a wavelength band that absorbs moisture to light in a wavelength band that does not absorb moisture.

[この発明が解決しようとする問題点] しかしながら、被測定対象に着色物やその他の
物が混入すると、第2図で示すように、分光特性
に傾きを生じる場合がある。このため、測定波長
の両側に2つの比較波長帯を設け、この比較波長
帯の2つの成分の平均を用いて比率をとる方法が
考えられる。
[Problems to be Solved by the Invention] However, if colored substances or other substances are mixed into the object to be measured, the spectral characteristics may be tilted as shown in FIG. For this reason, a method can be considered in which two comparison wavelength bands are provided on both sides of the measurement wavelength and the ratio is calculated using the average of the two components of the comparison wavelength bands.

ところが、このように、測定波長、比較波長を
増加させて行くと、必要波長の数に応じたフイル
タ、検出素子を必要とし、また、演算要素も多く
なり、複雑、高価なものとなる問題点があつた。
However, as the number of measurement wavelengths and comparison wavelengths increases, filters and detection elements corresponding to the number of required wavelengths are required, and the number of calculation elements increases, making the device complex and expensive. It was hot.

この発明の目的は、以上の点に鑑み、比較波長
の2つの成分を同時に得るようにし、測定系の簡
素化、高精度化を図つた光学的測定装置を提供す
ることである。
In view of the above points, it is an object of the present invention to provide an optical measurement device that can simultaneously obtain two components of a comparison wavelength, and that has a simplified measurement system and improved accuracy.

[問題点を解決するための手段] この発明は、被測定対象からの透過光または反
射光のうち測定波長帯の成分の第1の信号と、被
測定対象からの透過光または反射光のうち測定波
長帯の両側の2つの比較波長帯の2つの成分を含
む第2の信号との比率から被測定対象の性状を測
定するようにした光学的測定装置である。
[Means for Solving the Problems] The present invention provides a first signal of a component in the measurement wavelength band of the transmitted light or reflected light from the object to be measured, and a signal of the component of the transmitted light or reflected light from the object to be measured. This is an optical measuring device that measures the properties of an object to be measured from the ratio of a measurement wavelength band to a second signal containing two components in two comparison wavelength bands on both sides.

[実施例] 第1図は、この発明の一実施例を示す構成説明
図である。
[Embodiment] FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention.

図において、1は、投光用の光源で、この光源
1の光は、投光レンズ2で被測定対象3に投光さ
れ、その透過光または反射光は集光レンズ4で集
光され、モータMにより回転する回転セクタ5に
設けられた第2図の測定波長λ2を通過させるフイ
ルタ51、測定波長λ2の両側の2つの比較波長
λ1,λ3をともに通過させるフイルタ52を介して
検出素子6に入射する。この検出素子6の検出信
号は増幅器7により増幅され、測定波長帯の測定
波長λ2の成分に対応した第1の信号e1、および比
較波長帯の比較波長λ1,λ3の両方の成分を含む第
2の信号e2が、回転セクタ5に設けられた同期信
号発生器9の同期信号により、第1、第2のサン
プルホールド回路81,82にホールドされる。
そして、割算回路10により第1、第2のサンプ
ルホールド回路81,82の第1、第2の信号
e1,e2の比率e1/e2をとり、被測定対象3の水分
率その他の性状の測定信号e0を取り出すことがで
きる。これら、サンプルホールド回路81,8
2、割算回路10の機能をメモリを含むマイクロ
コンピユータ、パーソナルコンピユータ等の演算
手段により実現してもよい。
In the figure, 1 is a light source for projecting light, the light from this light source 1 is projected onto the object to be measured 3 by a projecting lens 2, and its transmitted light or reflected light is condensed by a condensing lens 4. Through a filter 51 provided in the rotary sector 5 rotated by the motor M , which allows the measurement wavelength λ 2 shown in FIG. and enters the detection element 6. The detection signal of this detection element 6 is amplified by an amplifier 7, and a first signal e 1 corresponding to a component of the measurement wavelength λ 2 in the measurement wavelength band and components of both comparison wavelengths λ 1 and λ 3 of the comparison wavelength band are generated. A second signal e 2 containing . . .
Then, the first and second signals of the first and second sample and hold circuits 81 and 82 are divided by the division circuit 10.
By taking the ratio e 1 /e 2 of e 1 and e 2 , a measurement signal e 0 of the moisture content and other properties of the object to be measured 3 can be extracted. These sample and hold circuits 81, 8
2. The function of the division circuit 10 may be realized by a calculation means such as a microcomputer or a personal computer including a memory.

つまり、回転セクタ5の分光手段としてフイル
タ51は、第3図Aで示すような波長λ2の単一の
ピークの透過率特性をもち、フイルタ52は、第
3図Bで示すように、波長λ1,λ3のダブルピーク
の透過率特性をもつ。このフイルタ52を用いる
ことにより、第2図の測定波長λ2の両側の比較波
長λ1,λ3の成分の和に相当するものが得られ、結
局、傾きに起因する比較波長λ1成分の増加分と比
較波長λ3の減少分とは相殺され、常に正しい測定
が可能となる。
That is, the filter 51 as a spectroscopic means of the rotating sector 5 has a transmittance characteristic of a single peak at wavelength λ 2 as shown in FIG. 3A, and the filter 52 has a transmittance characteristic of a single peak at wavelength It has a double peak transmittance characteristic of λ 1 and λ 3 . By using this filter 52, a value corresponding to the sum of the components of the comparison wavelengths λ 1 and λ 3 on both sides of the measurement wavelength λ 2 in FIG. 2 can be obtained. The increase cancels out the decrease in the comparison wavelength λ 3 , making accurate measurement possible at all times.

第4図は、他の実施例を示す構成説明図で、光
源1の光は、光フアイバー11により被測定対象
3に投光され、その反射光は再び光フアイバー1
1により伝送され、ハーフミラー12により分離
され、ハーフミラー12を反射した光は、測定波
長λ2を透過させるフイルタ51を介して検出素子
61に入射し、ハーフミラー12を透過した光は
比較波長λ1,λ3の両方を透過させるフイルタ52
を介して検出素子62に入射し、検出素子61,
62の出力e1,e2は測定手段13で比率がとら
れ、測定信号e0を取り出すことができる。
FIG. 4 is a configuration explanatory diagram showing another embodiment, in which the light from the light source 1 is projected onto the object to be measured 3 through the optical fiber 11, and the reflected light is reflected back into the optical fiber 1.
1, separated by a half mirror 12, and reflected by the half mirror 12, enters the detection element 61 via a filter 51 that transmits the measurement wavelength λ 2 , and the light transmitted through the half mirror 12 has a comparison wavelength. Filter 52 that transmits both λ 1 and λ 3
is incident on the detection element 62 via the detection element 61,
The outputs e 1 and e 2 of 62 are ratioed by the measuring means 13, and a measurement signal e 0 can be taken out.

第5図は、他の実施例を示し、被測定対象3か
らの光は、分光手段としての分光ミラー14によ
り分離され、分光ミラー14は波長λ1,λ3の両方
の光を透過させて検出素子62に入射させ、分光
ミラー14を反射した光は、波長λ1,λ3を除いた
光なので、波長λ2の光を透過するフイルタ51を
介して検出素子61に入射する。これら検出素子
61,62の出力e1,e2の比を測定手段13でと
り、測定出力e0が取り出せる。
FIG. 5 shows another embodiment, in which the light from the object to be measured 3 is separated by a spectroscopic mirror 14 as a spectroscopic means, and the spectroscopic mirror 14 transmits light of both wavelengths λ 1 and λ 3 . The light that is incident on the detection element 62 and reflected by the spectroscopic mirror 14 is light with wavelengths λ 1 and λ 3 excluded, and therefore enters the detection element 61 via the filter 51 that transmits the light with the wavelength λ 2 . The ratio of the outputs e 1 and e 2 of these detection elements 61 and 62 is taken by the measuring means 13, and a measured output e 0 can be obtained.

第6図は、他の実施例を示し、光源1の光は、
測定波長λ2を透過するフイルタ51、比較波長
λ1,λ3を透過するフイルタ52を有する回転セク
タ5を介して被測定対象3に投光され、その透過
光または反射光は検出素子6により検出され、測
定手段13により前述と同様な比率演算がなさ
れ、被測定対象3の性状の測定が行われる。
FIG. 6 shows another embodiment, in which the light from the light source 1 is
Light is projected onto the object to be measured 3 through a rotating sector 5 having a filter 51 that transmits the measurement wavelength λ 2 and a filter 52 that transmits the comparison wavelengths λ 1 and λ 3 , and the transmitted light or reflected light is detected by the detection element 6 . Detected, the measuring means 13 performs the same ratio calculation as described above, and the properties of the object to be measured 3 are measured.

[発明の効果] 以上述べたように、この発明は、2つの比較波
長をともに通過させるフイルタ、ミラー等の分光
手段を用いて得られた2つの比較波長を含む信号
を用いて比率演算を行つているので、装置が簡単
で、しかも高精度の光学測定が可能となる。
[Effects of the Invention] As described above, the present invention performs a ratio calculation using a signal containing two comparison wavelengths obtained using a spectroscopic means such as a filter or mirror that allows both comparison wavelengths to pass through. This makes it possible to use a simple device and perform highly accurate optical measurements.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図、第3図、第4図、第5図、第
6図は、この発明の一実施例を示す説明図であ
る。 1…光源、2…投光レンズ、3…被測定対象、
4…集光レンズ、5…回転セクタ、51,52…
フイルタ、6,61,62…検出素子、7…増幅
器、81,82…サンプルホールド回路、9…同
期信号発生器、10…割算器、11…光フアイバ
ー、12…ハーフミラー、13…測定手段、14
…分光ミラー。
FIG. 1, FIG. 2, FIG. 3, FIG. 4, FIG. 5, and FIG. 6 are explanatory diagrams showing one embodiment of the present invention. 1... Light source, 2... Light projection lens, 3... Target to be measured,
4... Condensing lens, 5... Rotating sector, 51, 52...
Filter, 6, 61, 62...detection element, 7...amplifier, 81, 82...sample hold circuit, 9...synchronous signal generator, 10...divider, 11...optical fiber, 12...half mirror, 13...measuring means , 14
...Spectral mirror.

Claims (1)

【特許請求の範囲】 1 被測定対象からの透過光または反射光のうち
測定波長帯の成分の光を透過する第1の分光手段
と、被測定対象からの透過光または反射光のうち
測定波長帯の両側の2つの比較波長帯の2つの成
分の両方の光を同時に透過する第2の分光手段
と、これら第1の分光手段を透過した光と第2の
分光手段を透過した光とを交互に分離して検出素
子に導く手段と、この検出素子の検出信号のうち
第1の分光手段を透過した成分に対応する第1の
信号と第2の分光手段を透過した成分に対応する
第2の信号との比に基き被測定対象の性状を測定
するする測定手段とを備えた光学的測定装置。 2 前記交互に分離して検出素子に導く手段とし
て、第1の分光手段、第2の分光手段を設けた回
転セクタ、または被測定対象からの光を分離する
ミラーを用いたことを特徴とする特許請求の範囲
第1項記載の光学的測定装置。
[Claims] 1. A first spectroscopic means that transmits light of a component in a measurement wavelength band among transmitted light or reflected light from an object to be measured; a second spectroscopic means that simultaneously transmits both light of two components in two comparison wavelength bands on both sides of the band; means for alternately separating and guiding the signals to the detection element; a first signal corresponding to a component transmitted through the first spectroscopic means and a first signal corresponding to a component transmitted through the second spectroscopic means of the detection signal of the detection element; 1. An optical measuring device comprising: measuring means for measuring the properties of an object to be measured based on the ratio between the two signals. 2. The means for alternately separating and guiding the light to the detection element is characterized in that a rotating sector provided with a first spectroscopic means and a second spectroscopic means, or a mirror for separating light from the object to be measured is used. An optical measuring device according to claim 1.
JP4995085A 1985-03-13 1985-03-13 Optical measuring apparatus Granted JPS61209339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4995085A JPS61209339A (en) 1985-03-13 1985-03-13 Optical measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4995085A JPS61209339A (en) 1985-03-13 1985-03-13 Optical measuring apparatus

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP15486486A Division JPS6211128A (en) 1986-07-01 1986-07-01 Optical measuring apparatus

Publications (2)

Publication Number Publication Date
JPS61209339A JPS61209339A (en) 1986-09-17
JPH0531732B2 true JPH0531732B2 (en) 1993-05-13

Family

ID=12845309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4995085A Granted JPS61209339A (en) 1985-03-13 1985-03-13 Optical measuring apparatus

Country Status (1)

Country Link
JP (1) JPS61209339A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0743302A (en) * 1993-07-30 1995-02-14 Anatsuku:Kk Coloring degree measuring method and measuring apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1490214A (en) * 1974-07-02 1977-10-26 Fordath Ltd Apparatus for mixing foundry materials
JPS5425436A (en) * 1977-07-27 1979-02-26 Shin Kobe Electric Machinery Lead storage battery

Also Published As

Publication number Publication date
JPS61209339A (en) 1986-09-17

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