JPH0534774B2 - - Google Patents
Info
- Publication number
- JPH0534774B2 JPH0534774B2 JP58227873A JP22787383A JPH0534774B2 JP H0534774 B2 JPH0534774 B2 JP H0534774B2 JP 58227873 A JP58227873 A JP 58227873A JP 22787383 A JP22787383 A JP 22787383A JP H0534774 B2 JPH0534774 B2 JP H0534774B2
- Authority
- JP
- Japan
- Prior art keywords
- particle
- neutral
- energy
- particles
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 claims description 88
- 230000004888 barrier function Effects 0.000 claims description 6
- 230000007935 neutral effect Effects 0.000 description 25
- 230000005684 electric field Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000002238 attenuated effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、荷電粒子または中性粒子の質量また
はエネルギを偏向場使つて分析する粒子分析器に
関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a particle analyzer that analyzes the mass or energy of charged or neutral particles using a deflection field.
従来より、荷電粒子や中性粒子の質量またはエ
ネルギを分析する粒子分析器として、粒子ビーム
を電場または磁場等の偏向場中に入射させ、各粒
子の偏向量を検出して、上記の物理量分析を行な
うようにしたものが知られている。このような粒
子分析器、たとえば一例としてH,Dなどの中性
粒子の質量とエネルギとを分析する中性粒子質量
エネルギ分析器は、通常第1図および第2図に示
すように構成されている。すなわち、同図におい
て、1は真空容器であり、この真空容器1の側壁
には中性粒子ビーム2の入射口である入射ポート
3が設けられている。真空容器1の内部には、上
記中性粒子の軌道に対応させて荷電交換セル4、
磁極5a,5b、電極6a,6b、粒子検出器7
がそれぞれ収容されている。荷電交換セル4は、
内部に中性粒子をイオン化させる荷電交換ガスP
を収納するとともに、粒子ビームの入射端側およ
び出射端側に位置する壁に、上記粒子ビームを絞
るとともに平行するコリメータを兼ねたアパーチ
ヤ8,9を設けている。前記磁極5a,5bは、
第1図中上下方向を長手方向とする長方形の磁極
面10a,10bを有し、これら磁極面10a,
10bは所定間隔を介して対向配置されている。
これら磁極5a,5bは、各々に巻装されたコイ
ル11a,11bへの通電によつて、第1図中紙
面と直行する方向の磁場を生成する。また、前記
電極6a,6bは、第1図中上方から下方へ、そ
の幅が拡大する台形状の板体からなり、前記磁極
面、10a,10b間の間隔よりも広い間隔をあ
けて上記磁極面10a,10bと平行に対向配置
され、前記磁場の方向と同一方向の電場を生成す
る。なお、図中12は、真空容器1内のガスQを
排気する図示しないポンプに通じる排気口であ
る。
Traditionally, particle analyzers have been used to analyze the mass or energy of charged particles and neutral particles by injecting a particle beam into a deflection field such as an electric field or a magnetic field, detecting the amount of deflection of each particle, and performing the above-mentioned physical quantity analysis. There are known devices that do this. Such a particle analyzer, for example, a neutral particle mass energy analyzer that analyzes the mass and energy of neutral particles such as H and D, is usually configured as shown in FIGS. 1 and 2. There is. That is, in the figure, 1 is a vacuum container, and an entrance port 3, which is an entrance for a neutral particle beam 2, is provided on the side wall of this vacuum container 1. Inside the vacuum container 1, there are charge exchange cells 4, corresponding to the orbits of the neutral particles,
Magnetic poles 5a, 5b, electrodes 6a, 6b, particle detector 7
are accommodated in each. The charge exchange cell 4 is
Charge exchange gas P that ionizes neutral particles inside
Apertures 8 and 9 are provided on the walls located at the incident end and the exit end of the particle beam to narrow down the particle beam and also serve as parallel collimators. The magnetic poles 5a and 5b are
It has rectangular magnetic pole faces 10a, 10b whose longitudinal direction is the vertical direction in FIG.
10b are arranged opposite to each other with a predetermined interval therebetween.
These magnetic poles 5a and 5b generate a magnetic field in a direction perpendicular to the plane of the paper in FIG. 1 by energizing the coils 11a and 11b wound around them. Further, the electrodes 6a, 6b are made of trapezoidal plates whose width increases from the top to the bottom in FIG. They are arranged opposite to each other in parallel with the surfaces 10a and 10b, and generate an electric field in the same direction as the magnetic field. Note that 12 in the figure is an exhaust port leading to a pump (not shown) that exhausts the gas Q inside the vacuum container 1.
しかして、このように構成された中性粒子質量
エネルギ分析器において入射ポート3から真空容
器1内に導入された中性ビーム2は、荷電交換セ
ル4内を通過することによつて、荷電交換ガスP
と荷電交換されて、イオン化され、荷電粒子ビー
ム13となる。このとき、荷電粒子ビーム13
は、荷電交換セル4の両端に設けられたアパーチ
ヤ8,9によつて、所定の太さ、形状に整形され
るとともに、平行ビームに交換される。 In the neutral particle mass energy analyzer configured as described above, the neutral beam 2 introduced into the vacuum vessel 1 from the entrance port 3 undergoes charge exchange by passing through the charge exchange cell 4. Gas P
The charges are exchanged and ionized to form a charged particle beam 13. At this time, the charged particle beam 13
is shaped into a predetermined thickness and shape by apertures 8 and 9 provided at both ends of the charge exchange cell 4, and is exchanged into a parallel beam.
荷電交換セル4を通過した荷電粒子ビーム13
の各粒子は、磁極5a,5bで生成された磁場中
に導入されることによつて、粒子の運動方向およ
び磁場方向と直交する方向の力を受け、円形軌道
を辿つて180°偏向される。このとき、各粒子の運
動半径は、各粒子の運動エネルギによつて決定さ
れる。したがつて、180°偏向された各粒子は、各
粒子か出射される磁場の端部において、エネルギ
に応じた位置で直線上に分布する。 Charged particle beam 13 passing through charge exchange cell 4
By being introduced into the magnetic field generated by the magnetic poles 5a and 5b, each particle receives a force in a direction perpendicular to the direction of movement of the particle and the direction of the magnetic field, and is deflected by 180° following a circular trajectory. . At this time, the radius of motion of each particle is determined by the kinetic energy of each particle. Therefore, each particle deflected by 180° is distributed on a straight line at a position corresponding to the energy at the end of the magnetic field from which each particle is emitted.
磁場を通過した各荷電粒子は、電極6a,6b
で生成される電場中に導入されることによつて、
さらに電場の方向に偏向される。このときの各粒
子の偏向量は、各粒子の質量によつて決定され
る。 Each charged particle that has passed through the magnetic field is transferred to the electrodes 6a and 6b.
By being introduced into the electric field generated by
It is further deflected in the direction of the electric field. The amount of deflection of each particle at this time is determined by the mass of each particle.
かくして、各粒子は、粒子検出器7における各
粒子の質量とエネルギとによつて決まる二次元的
位置に、それぞれ入射され、ここに各粒子の質量
およびエネルギが検出される。 In this way, each particle is incident on the particle detector 7 at a two-dimensional position determined by the mass and energy of each particle, and the mass and energy of each particle are detected here.
ところで、このような中性粒子質量エネルギ分
析器は、入射ポート3から入射された中性粒子ビ
ーム2を荷電交換セル4の入射側に設けられたア
パーチヤ8の所定の太さに整形している。このた
め、荷電交換セル4に入りきらなかつた粒子は、
真空容器1内に迷走粒子14として散乱される。
このような迷走粒子14は、エネルギが比較的低
い場合には、そのまま排気口12から外部へ排気
されるが、エネルギが高い場合には、散乱の過程
で粒子検出器7に衝突し、偽信号を生じさせると
いう問題があつた。 Incidentally, in such a neutral particle mass energy analyzer, the neutral particle beam 2 entering from the entrance port 3 is shaped into a predetermined thickness of the aperture 8 provided on the entrance side of the charge exchange cell 4. . For this reason, particles that could not enter the charge exchange cell 4 are
The stray particles 14 are scattered within the vacuum container 1 .
When such stray particles 14 have relatively low energy, they are exhausted to the outside from the exhaust port 12 as they are, but when their energy is high, they collide with the particle detector 7 during the scattering process, causing false signals. There was a problem in that it caused
また、このような問題は、図示しない中性粒子
源から真空容器1内に、光が入射され、この光が
前記アパーチヤに反射されて散乱し、迷光とな
る。場合にも生ずる。 Further, such a problem occurs when light enters the vacuum vessel 1 from a neutral particle source (not shown), and this light is reflected by the aperture and scattered, becoming stray light. It also occurs in cases.
このため、従来のこの種の粒子分析器では、必
然的に上記迷走粒子、迷光に起因したノイズが多
く、測定の信頼性に欠けるという問題があつた。 For this reason, conventional particle analyzers of this type inevitably have a problem in that there is a lot of noise caused by the stray particles and stray light, resulting in a lack of measurement reliability.
本発明は、このような事情に基づきなされたも
のであり、その目的とするところは、真空容器で
生ずる迷走粒子、迷光のエネルギを吸収し、これ
によるノイズ発生を防止することによつて、信頼
性の高い粒子質量または粒子エネルギの分析が行
える粒子分析器を提供することにある。
The present invention was developed based on the above circumstances, and its purpose is to absorb the energy of stray particles and stray light generated in a vacuum container, and to prevent noise generation due to this, thereby improving reliability. An object of the present invention is to provide a particle analyzer capable of analyzing particle mass or particle energy with high accuracy.
本発明は、粒子ビームの真空容器内部への導入
口である入射ポートから上記真空容器内部に収容
されたアパーチヤに至る前記粒子ビームの通路の
周囲に、迷走粒子および迷光のエネルギを吸収す
るための障壁を設けたことを特徴としている。
The present invention provides a system for absorbing the energy of stray particles and stray light around the path of the particle beam from an entrance port, which is an introduction port for the particle beam into the vacuum vessel, to an aperture housed inside the vacuum vessel. It is characterized by the fact that it has a barrier.
本発明によれば、入射ポートからアパーチヤに
至る粒子ビームの通路の周囲に障壁を設けている
ので、アパーチヤに衝突して散乱する迷走粒子や
迷光は、さらに障壁に衝突することによつて、そ
のエネルギが消費される。このため、これら迷走
粒子や迷光が粒子検出器に影響を及ぼすことがな
く、この結果、分析性能の向上化を図ることがで
きる。また、障壁といつた簡単な要素を付加する
だけで上述した効果が得られるので全体の複雑化
を招くようなこともない。
According to the present invention, since a barrier is provided around the path of the particle beam from the input port to the aperture, stray particles and stray light that collide with the aperture and are scattered are further prevented from colliding with the barrier. Energy is consumed. Therefore, these stray particles and stray light do not affect the particle detector, and as a result, analysis performance can be improved. Furthermore, since the above-mentioned effects can be obtained by simply adding a simple element such as a barrier, there is no need to complicate the entire system.
以下、本発明の詳細を図示の実施例に基づき説
明する。
Hereinafter, details of the present invention will be explained based on illustrated embodiments.
第3図は、本発明を中性粒子質量エネルギ分析
器に適用した一実施例を示すもので、第1図と同
一部分は同一符号で示している。したがつて重複
する部分の詳しい説明は省くことにする。 FIG. 3 shows an embodiment in which the present invention is applied to a neutral particle mass energy analyzer, and the same parts as in FIG. 1 are designated by the same reference numerals. Therefore, a detailed explanation of the overlapping parts will be omitted.
この実施例が従来の分析器と異なる点は、真空
容器1内の入射ポート3と荷電交換セル4との間
の中性粒子ビーム2の通路を覆うように筒状体2
0を設けたことにある。なお、上記筒状体20の
周壁には、上記筒上体20内部のガスを真空容器
1内を介して外部へ排気するための孔21,22
が設けられている。 This embodiment differs from conventional analyzers in that a cylindrical body 2 is provided to cover the passage of the neutral particle beam 2 between the entrance port 3 in the vacuum vessel 1 and the charge exchange cell 4.
The reason is that 0 is set. The peripheral wall of the cylindrical body 20 is provided with holes 21 and 22 for exhausting the gas inside the cylindrical body 20 to the outside through the vacuum container 1.
is provided.
このような構成であると、入射ポート3から上
記筒状体20の内部に入射した中性粒子2の一部
または光は、前記筒状体20の内部で反射散乱
し、やがてそのエネルギが減衰する。そして、上
記筒状体20の内部に浮遊する中性粒子は真空容
器1〜排気口12を介して外部へ排気される。 With such a configuration, a part of the neutral particles 2 or light that enters the inside of the cylindrical body 20 from the input port 3 is reflected and scattered inside the cylindrical body 20, and the energy thereof is eventually attenuated. do. The neutral particles floating inside the cylindrical body 20 are exhausted to the outside through the vacuum container 1 to the exhaust port 12.
したがつて、迷走粒子や迷光が、高エネルギ状
態のまま粒子検出器7に衝突することがないの
で、ノイズが少なく、信頼性の高い中性粒子質量
エネルギ分析が行える。しかも、この場合、入射
ポート3と荷電交換セル4との間に筒状体20を
設けるだけという、いたつて簡単な構成のみで上
述の効果が得られるので、分析器全体の複雑化を
招くことがなく、結局、前述した効果が得られ
る。 Therefore, stray particles and stray light do not collide with the particle detector 7 in a high-energy state, so that highly reliable neutral particle mass energy analysis can be performed with less noise. Moreover, in this case, the above-mentioned effect can be obtained with only a simple configuration in which the cylindrical body 20 is provided between the entrance port 3 and the charge exchange cell 4, so the overall analyzer does not become complicated. As a result, the above-mentioned effect can be obtained.
なお、本発明は上記実施例に限定されるもので
はない。たとえば、迷走粒子および迷光の障壁と
して、筒状体20を用いず、第4図に示す如く、
入射ポート3側を大径、荷電交換セル4側を小径
とする複数の環状体25を、中性粒子ビーム2の
通路を囲繞するように、中性粒子ビーム2の進行
方向に複数設けるようにしてもよい。 Note that the present invention is not limited to the above embodiments. For example, as shown in FIG. 4, without using the cylindrical body 20 as a barrier for stray particles and stray light,
A plurality of annular bodies 25 having a large diameter on the side of the entrance port 3 and a small diameter on the side of the charge exchange cell 4 are provided in the traveling direction of the neutral particle beam 2 so as to surround the passage of the neutral particle beam 2. It's okay.
このようにすれば、入射ポート3と荷電交換セ
ル4との間の空間と真空容器1の内部との通気性
が高いので、環状体25の内面でエネルギを消勢
された浮遊粒子を効率良く、真空容器1外部へ排
気することができる。 In this way, the air permeability between the space between the input port 3 and the charge exchange cell 4 and the inside of the vacuum container 1 is high, so that the suspended particles whose energy has been deactivated on the inner surface of the annular body 25 can be efficiently removed. , can be exhausted to the outside of the vacuum container 1.
また、第5図に示す如く、入射ポート3と荷電
交換セル4との間に筒状体30を設け、この筒状
体30の内外を遮断し、上記筒状体30内部のガ
スを入射ポート3に設けた排気口31から排気さ
せるようにしてもよい。 Further, as shown in FIG. 5, a cylindrical body 30 is provided between the input port 3 and the charge exchange cell 4, and the inside and outside of this cylindrical body 30 are shut off, so that the gas inside the cylindrical body 30 is transferred to the input port. Alternatively, the air may be exhausted from an exhaust port 31 provided at 3.
この場合には、荷電交換セル4から流出するガ
スの約半分を、筒状体30〜入射ポート3〜排気
口31の経路で排気することができ、真空容器1
内部に余分な粒子を殆んど流入させることがな
い。したがつて、粒子検出器7の近傍の圧力を安
定化させることができ、より信頼性の高い分析が
可能となる。 In this case, approximately half of the gas flowing out from the charge exchange cell 4 can be exhausted through the path from the cylindrical body 30 to the input port 3 to the exhaust port 31, and the vacuum vessel 1
Almost no extra particles are allowed to flow into the interior. Therefore, the pressure near the particle detector 7 can be stabilized, allowing more reliable analysis.
なお、以上の例は荷電交換セル4を備えた中性
粒子質量エネルギ分析器に本発明を適用した例で
あるが、コリメータを兼ねたアパーチヤだけを備
えた荷電粒子質量エネルギ分析器にも本発明を適
用することができる。また、真空容器内に磁場の
みを形成した粒子エネルギ分析器や真空容器内に
電場のみを形成した粒子質量分析器にも本発明を
適用できることはいうまでもない。 Although the above example is an example in which the present invention is applied to a neutral particle mass energy analyzer equipped with a charge exchange cell 4, the present invention can also be applied to a charged particle mass energy analyzer equipped only with an aperture that also serves as a collimator. can be applied. It goes without saying that the present invention can also be applied to a particle energy analyzer in which only a magnetic field is formed in a vacuum container and a particle mass analyzer in which only an electric field is formed in a vacuum container.
第1図は従来の中性粒子質量エネルギ分析器を
示す概略的な断面図、第2図は上記中性粒子質量
エネルギ分析器を第1図におけるA−A線に沿つ
て切断し矢印方向から見た図、第3図は本発明の
一実施例に係る中性粒子質量エネルギ分析器を示
す概略的な断面図、第4図および第5図は本発明
の他の実施例に係る中性粒子質量エネルギ分析器
をそれぞれ示す断面図である。
1……真空容器、2……中性粒子ビーム、3…
…入射ポート、4……荷電交換セル、5a,5b
……磁極、6a,6b……電極、7……粒子検出
器、8,9……アパーチヤ、11a,11b……
コイル、12,31……排気口、13……荷電粒
子ビーム、14……迷走粒子、20,30……筒
状体、25……環状体、P……荷電交換ガス。
Figure 1 is a schematic cross-sectional view showing a conventional neutral particle mass energy analyzer, and Figure 2 is a cross-sectional view of the neutral particle mass energy analyzer taken along line A-A in Figure 1 and viewed from the direction of the arrow. 3 is a schematic sectional view showing a neutral particle mass energy analyzer according to one embodiment of the present invention, and FIGS. 4 and 5 are schematic cross-sectional views showing a neutral particle mass energy analyzer according to another embodiment of the present invention FIG. 1 is a cross-sectional view of a particle mass energy analyzer. 1... Vacuum vessel, 2... Neutral particle beam, 3...
...Injection port, 4...Charge exchange cell, 5a, 5b
...Magnetic pole, 6a, 6b... Electrode, 7... Particle detector, 8, 9... Aperture, 11a, 11b...
Coil, 12, 31... Exhaust port, 13... Charged particle beam, 14... Stray particles, 20, 30... Cylindrical body, 25... Annular body, P... Charge exchange gas.
Claims (1)
チヤを設け、上記アパーチヤで上記粒子偏向場へ
向けて進行する粒子ビームを絞るようにした粒子
分析器において、前記入射ポートから前記アパー
チヤに至る前記粒子ビームの通路の周囲に障壁を
設けてなることを特徴とする粒子分析器。 2 前記アパーチヤは、荷電粒子交換セルの壁と
兼用されたものでなることを特徴とする特許請求
の範囲第1項記載の粒子分析器。[Claims] 1. In a particle analyzer in which an aperture is provided between a particle entrance port and a particle deflection field, and the aperture narrows down a particle beam traveling toward the particle deflection field, A particle analyzer, characterized in that a barrier is provided around the path of the particle beam to the aperture. 2. The particle analyzer according to claim 1, wherein the aperture also serves as a wall of a charged particle exchange cell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58227873A JPS60121661A (en) | 1983-12-02 | 1983-12-02 | Particle analyser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58227873A JPS60121661A (en) | 1983-12-02 | 1983-12-02 | Particle analyser |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60121661A JPS60121661A (en) | 1985-06-29 |
| JPH0534774B2 true JPH0534774B2 (en) | 1993-05-24 |
Family
ID=16867680
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58227873A Granted JPS60121661A (en) | 1983-12-02 | 1983-12-02 | Particle analyser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60121661A (en) |
-
1983
- 1983-12-02 JP JP58227873A patent/JPS60121661A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60121661A (en) | 1985-06-29 |
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