Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPH0358139B2 - - Google Patents
[go: Go Back, main page]

JPH0358139B2 - - Google Patents

Info

Publication number
JPH0358139B2
JPH0358139B2 JP59213899A JP21389984A JPH0358139B2 JP H0358139 B2 JPH0358139 B2 JP H0358139B2 JP 59213899 A JP59213899 A JP 59213899A JP 21389984 A JP21389984 A JP 21389984A JP H0358139 B2 JPH0358139 B2 JP H0358139B2
Authority
JP
Japan
Prior art keywords
particle
electrode
particles
electric field
electrodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59213899A
Other languages
Japanese (ja)
Other versions
JPS6193545A (en
Inventor
Hiroshi Takeuchi
Kazuo Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59213899A priority Critical patent/JPS6193545A/en
Publication of JPS6193545A publication Critical patent/JPS6193545A/en
Publication of JPH0358139B2 publication Critical patent/JPH0358139B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/22Electrostatic deflection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Description

【発明の詳細な説明】 〔発明の属する技術分野〕 本発明は中性粒子質量エネルギー分析器あるい
は荷電粒子エネルギー分析器などの粒子分析器に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of the Invention] The present invention relates to a particle analyzer such as a neutral particle mass energy analyzer or a charged particle energy analyzer.

〔従来技術とその問題点〕[Prior art and its problems]

第1図および第2図は、従来の粒子分析器で、
1は真空容器であり、この真空容器1の側壁には
中性粒子ビーム2の入射口である入射ポート3が
設けられている。真空容器1の内部には、上記中
性粒子の軌道に対応させて荷電交換セル4、磁極
5a,5b、電極6a,6b、粒子検出器7がそ
れぞれ収容されている。荷電交換セル4は、内部
に中性粒子をイオン化させる荷電交換ガスPを収
容するとともに、粒子ビームの入射端側および出
射端側にそれぞれ上記粒子ビームを絞るとともに
平行ビームに整形するアパーチヤを兼ねたコリメ
ータ8,9を設けたものとなつている。前記磁極
5a,5bは第1図中上下方向を長手方向とする
長方形の磁極面10a,10bを所定間隙をあけ
て対向配置して設けられ、磁極5a,5bの基端
に巻装されたコイル11a,11bへの通電によ
つて、第1図中紙面に直交する方向の磁場を生成
する。また、前記電極6a,6bは第1図中上方
から下方へその幅が拡大する台形状の板体からな
り、前記磁極面10a,10b間の所定間隔より
も広い間隔をあけて上記磁極面10a,10bと
平行に対向配置されている。そして、一方の電極
6bは他方の電極6aに対して負電位に保たれ、
これによつて、上記電極6a,6b間には前記磁
場と同一方向の電場が形成される。なお、図中1
3は、真空容器1内のガスQを排気する図示しな
いポンプに通じる排気口である。
Figures 1 and 2 show a conventional particle analyzer;
Reference numeral 1 denotes a vacuum container, and an entrance port 3, which is an entrance for the neutral particle beam 2, is provided on the side wall of the vacuum container 1. Inside the vacuum container 1, a charge exchange cell 4, magnetic poles 5a, 5b, electrodes 6a, 6b, and a particle detector 7 are accommodated, respectively, corresponding to the orbits of the neutral particles. The charge exchange cell 4 contains therein a charge exchange gas P that ionizes neutral particles, and also serves as an aperture that narrows the particle beam and shapes it into a parallel beam on the incident end side and the exit end side of the particle beam, respectively. Collimators 8 and 9 are provided. The magnetic poles 5a, 5b are provided with rectangular magnetic pole surfaces 10a, 10b whose longitudinal direction is the vertical direction in FIG. By energizing 11a and 11b, a magnetic field in a direction perpendicular to the plane of the paper in FIG. 1 is generated. Further, the electrodes 6a and 6b are made of trapezoidal plates whose width increases from the top to the bottom in FIG. , 10b and facing each other in parallel. Then, one electrode 6b is kept at a negative potential with respect to the other electrode 6a,
As a result, an electric field in the same direction as the magnetic field is formed between the electrodes 6a and 6b. In addition, 1 in the figure
3 is an exhaust port communicating with a pump (not shown) that exhausts the gas Q inside the vacuum container 1.

しかして、このように構成された中性粒子質量
エネルギ分析器において、入射ポート3から真空
容器1内に導入された中性粒子ビーム2は、荷電
交換セル4内を通過することによつて、荷電交換
ガスPと荷電交換されてイオン化され、荷電粒子
ビーム14となる。このとき、荷電粒子ビーム1
4は荷電交換セル4の両端に設けられたアパーチ
ヤを兼用するコリメータ8,9によつて、所定の
太さ、形状の平行ビームに整形される。
In the neutral particle mass energy analyzer configured in this way, the neutral particle beam 2 introduced into the vacuum vessel 1 from the entrance port 3 passes through the charge exchange cell 4, thereby The charges are exchanged with the charge exchange gas P and ionized, resulting in a charged particle beam 14. At this time, charged particle beam 1
4 is shaped into a parallel beam of a predetermined thickness and shape by collimators 8 and 9, which are provided at both ends of the charge exchange cell 4 and also serve as apertures.

荷電交換セル4を通過した荷電粒子ビーム16
の各粒子は、磁極5a,5bで生成された磁場中
に導入されることによつて、粒子の運動方向およ
び磁場方向と直交する方向の力を受け、円形軌道
を辿つて180°偏向される。このとき各粒子の運動
半径は、各粒子の運動エネルギによつて決定され
る。したがつて、180°偏向された各粒子は、磁場
の端部において、運動エネルギに応じた位置から
次段の電場中に導入される。電場中を移動する各
荷電粒子は、電極6bに向かう方向に吸引され偏
向される。このときの各粒子の偏向量は、各粒子
の質量によつて決定される。
Charged particle beam 16 passing through charge exchange cell 4
By being introduced into the magnetic field generated by the magnetic poles 5a and 5b, each particle receives a force in a direction perpendicular to the direction of movement of the particle and the direction of the magnetic field, and is deflected by 180° following a circular trajectory. . At this time, the radius of motion of each particle is determined by the kinetic energy of each particle. Therefore, each particle deflected by 180° is introduced into the electric field of the next stage at a position corresponding to its kinetic energy at the end of the magnetic field. Each charged particle moving in the electric field is attracted and deflected in the direction toward the electrode 6b. The amount of deflection of each particle at this time is determined by the mass of each particle.

かくして、各粒子は、粒子検出器7における各
粒子の質量とエネルギとによつて決まる二次元的
位置にそれぞれ入射され、各粒子の質量およびエ
ネルギーが測定される。
In this way, each particle is incident on the particle detector 7 at a two-dimensional position determined by the mass and energy of each particle, and the mass and energy of each particle are measured.

ところで、この種の分析器では、質量分析用電
極6a,6bは磁極に接近して設置される。ま
た、同一粒子種用の検出器の取付位置をそろえ、
組立の便を図るため、低エネルギー領域ほど電極
と検出器の距離を短くする。検出器はふつう接地
した導体容器に納められ、磁極と真空容器も接地
されるので、第3図に示すように、質量分析用電
極6bと磁極5b、検出器7との間に不整電場が
発生し、これが被分析粒子の軌道に悪影響を及ぼ
す。すなわち、粒子の入射部Rでは、接近してい
る磁極5bのために電場が電極間から漏れ出す。
粒子の出射部Sでも、同極に接地電位にある検出
器7のために電場が漏れ出す。このように、電場
の存在する領域が広がるので、粒子が過度に偏向
されたり、低エネルギーの粒子の場合は電極6b
に衝突したりして、分析器設計上の問題点となつ
た。また第3図の粒子14b,14cのように電
極6bより上方にまで偏向される粒子は、電極と
検出器間に発生する強い電場の影響を受け、さら
に大きく偏向され、粒子14cのように逆行する
ものも生じるという問題点もあつた。
By the way, in this type of analyzer, the mass spectrometry electrodes 6a, 6b are installed close to the magnetic poles. In addition, align the mounting positions of detectors for the same particle type,
To facilitate assembly, the distance between the electrode and the detector is made shorter for lower energy regions. The detector is usually housed in a grounded conductive container, and the magnetic pole and vacuum container are also grounded, so an asymmetric electric field is generated between the mass spectrometry electrode 6b, the magnetic pole 5b, and the detector 7, as shown in Figure 3. However, this adversely affects the trajectory of the particles to be analyzed. That is, at the particle incidence part R, an electric field leaks from between the electrodes due to the magnetic poles 5b approaching each other.
Also at the particle emission part S, an electric field leaks out due to the detector 7 being at the same polarity and at ground potential. In this way, the area where the electric field exists expands, so if the particles are excessively deflected or have low energy, the electrode 6b
This caused a problem in the design of the analyzer. Particles that are deflected above the electrode 6b, such as particles 14b and 14c in FIG. There was also the problem that some people were forced to do so.

〔発明の目的〕[Purpose of the invention]

本発明は、このような問題点に基づきなされた
ものであり、その目的とするところは、電極と磁
極との間、電極と検出器との間で生じる不整電場
を抑制することにより、被分析粒子の軌道が簡単
に把握でき、かつ、これまで測定不可能だつた低
エネルギー粒子も測定可能にして、広範囲のエネ
ルギー領域で分析が行える粒子分析器を提供する
ことにある。
The present invention was made based on these problems, and its purpose is to suppress the asymmetric electric field generated between the electrode and the magnetic pole, and between the electrode and the detector, thereby improving the analyte. To provide a particle analyzer that allows particle trajectories to be easily grasped, makes it possible to measure low-energy particles that have hitherto been impossible to measure, and allows analysis to be performed in a wide range of energy ranges.

〔発明の概要〕[Summary of the invention]

本発明は、質量分析用電極の入出射部に補助電
極を置き、質量分析用電極のフリンジ場を抑制し
たりするよう構成した粒子分析器である。
The present invention is a particle analyzer configured such that an auxiliary electrode is placed at the entrance/exit part of the mass spectrometry electrode to suppress the fringe field of the mass spectrometry electrode.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、質量分析用電極と磁極との
間、同電極と検出器との間に発生する不整電場を
抑制しているので、被分析粒子の軌道の過度の偏
向で低エネルギー粒子が電極間で電極に衝突する
のを防止することができる。従つて不整電場を考
慮する必要のない簡便な分析器の設計が可能とな
り、かつ、分析可能なエネルギー範囲が広がると
いう効果を奏する。
According to the present invention, since the asymmetric electric field generated between the mass spectrometry electrode and the magnetic pole and between the same electrode and the detector is suppressed, excessive deflection of the trajectory of the particle to be analyzed can cause low-energy particles to Collision between the electrodes can be prevented. Therefore, it is possible to design a simple analyzer that does not require consideration of an irregular electric field, and the energy range that can be analyzed is expanded.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の詳細を図示の実施例に基づき説
明する。
Hereinafter, details of the present invention will be explained based on illustrated embodiments.

第4図および第5図は、本発明を中性粒子質量
エネルギー分析器に適用した一実施例を示すもの
で、第1図および第2図と同一部分は同一符号で
示している。従つて、重複する部分の詳しい説明
は省くことにする。
4 and 5 show an embodiment in which the present invention is applied to a neutral particle mass energy analyzer, and the same parts as in FIGS. 1 and 2 are designated by the same reference numerals. Therefore, a detailed explanation of the overlapping parts will be omitted.

この実施例が前述した従来例と異なる点は、電
極6a,6bの入出射部に新たに補助電極16,
17a,17bを設置した点にある。第6図に、
電極の詳細を示す。質量分析用電極6a,6bの
粒子入射側Rに設置された補助電極16は質量分
析用電極6a,6bから漏れ出す電場を抑制し、
同様に質量分析用電極6a,6bの粒子出射側S
に設置された補助電極17a,17bは同電極か
ら漏れ出す電場を抑制し、ともに電場領域の拡大
を防止している。このように、電場領域を質量分
析用電極の間に閉じ込めることによつて、被分析
粒子の過度の偏向を防ぐことができる。また補助
電極17bは、検出器7と質量分析用電極6b間
に発生する電場を抑制し、この間を通りぬける粒
子14b,14cが過度の偏向を受けるのを防止
している。
The difference between this embodiment and the conventional example described above is that an auxiliary electrode 16, a new auxiliary electrode, and a
It is at the point where 17a and 17b were installed. In Figure 6,
Details of the electrodes are shown. The auxiliary electrode 16 installed on the particle incidence side R of the mass spectrometry electrodes 6a, 6b suppresses the electric field leaking from the mass spectrometry electrodes 6a, 6b,
Similarly, the particle exit side S of the mass spectrometry electrodes 6a, 6b
The auxiliary electrodes 17a and 17b installed in the auxiliary electrodes 17a and 17b suppress the electric field leaking from the electrodes, and both prevent the electric field area from expanding. By confining the electric field region between the mass spectrometry electrodes in this way, excessive deflection of the particles to be analyzed can be prevented. Further, the auxiliary electrode 17b suppresses the electric field generated between the detector 7 and the mass spectrometry electrode 6b, and prevents the particles 14b and 14c passing therebetween from being excessively deflected.

ここにあげた例では、補助電極はすべて接地さ
れているが、分析器の使用条件により検出器や磁
極に電位が与えられる場合もあるので、必要に応
じて、補助電極に電位を与え、その効果が最大と
なる条件で使用して良い。その場合、補助電極の
数も必要に応じて選ぶことができる。
In the example given here, all the auxiliary electrodes are grounded, but depending on the usage conditions of the analyzer, a potential may be applied to the detector or the magnetic pole, so if necessary, apply a potential to the auxiliary electrodes and It may be used under conditions that maximize its effectiveness. In that case, the number of auxiliary electrodes can also be selected as required.

なお、以上は主として中性粒子の質量エネルギ
ー分析器について本発明を適用した場合を例示し
たが、荷電交換セル4を単にコリメータに置換す
ることにより、荷電粒子分析器にも適用可能であ
る。この時、負イオンや電子の場合は、印加する
磁場や電場の向きが逆になることは言うまでもな
い。
Although the present invention has been mainly applied to a neutral particle mass energy analyzer, it can also be applied to a charged particle analyzer by simply replacing the charge exchange cell 4 with a collimator. At this time, it goes without saying that in the case of negative ions or electrons, the direction of the applied magnetic field or electric field is reversed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の中性粒子質量エネルギー分析器
を概略的に示す断面図、第2図は同器を第1図に
おけるA−A線に沿つて切断し矢印方向に見た断
面図、第3図は質量分析用電極のフリンジ場を説
明する説明図、第4図は本発明の一実施例に係る
中性粒子質量エネルギー分析器を概略的に示す断
面図、第5図は同器を第4図におけるB−B線に
沿つて切断し矢印方向に見た断面図、第6図は同
器の電極配置を概略的に示す説明図である。 1……真空容器、2……中性粒子ビーム、3…
…入射ポート、4……荷電交換セル、5a,5b
……磁極、6a,6b……質量分析用電極、7…
…粒子検出器、8,9……コリメータ、10a,
10b……磁極面、11a,11b……コイル、
12……電極支持材、13……排気口、14,1
4a,14b,14c……荷電粒子ビーム、15
……電気力線、16,17a,17b……補助電
極、P……荷電交換ガス、Q……被排気ガス、R
……粒子入射部、S……粒子出射部。
Fig. 1 is a cross-sectional view schematically showing a conventional neutral particle mass energy analyzer, Fig. 2 is a cross-sectional view of the same device taken along line A-A in Fig. 1 and viewed in the direction of the arrow; Figure 3 is an explanatory diagram for explaining the fringe field of the electrode for mass spectrometry, Figure 4 is a cross-sectional view schematically showing a neutral particle mass energy analyzer according to an embodiment of the present invention, and Figure 5 is a diagram illustrating the same. FIG. 4 is a sectional view taken along the line BB and seen in the direction of the arrow, and FIG. 6 is an explanatory diagram schematically showing the electrode arrangement of the device. 1... Vacuum vessel, 2... Neutral particle beam, 3...
...Injection port, 4...Charge exchange cell, 5a, 5b
...Magnetic pole, 6a, 6b...Mass spectrometry electrode, 7...
...Particle detector, 8,9...Collimator, 10a,
10b...Magnetic pole surface, 11a, 11b...Coil,
12... Electrode support material, 13... Exhaust port, 14,1
4a, 14b, 14c...Charged particle beam, 15
...Electric force lines, 16, 17a, 17b...Auxiliary electrode, P...Charge exchange gas, Q...Exhaust gas, R
...Particle entrance section, S...Particle exit section.

Claims (1)

【特許請求の範囲】 1 粒子を磁場によつて偏向させたのち、磁場と
同一方向もしくは逆方向の向きをもつ電場を通過
させ、この通過後の粒子を検出器で検出して上記
粒子の質量とエネルギーとを分析する粒子分析器
において、前記電場を発生する電極の周囲に発生
して前記粒子の軌道を乱す不正電場を抑制する補
助電極を具備してなることを特徴とする粒子分析
器。 2 前記補助電極は、前記電場を発生する電極と
前記磁場を発生する磁極との間に設けられている
ことを特徴とする特許請求の範囲第1項記載の粒
子分析器。 3 前記補助電極は、前記電場を発生する電極と
前記粒子を検出する検出器との間に設けられてい
ることを特徴とする特許請求の範囲第1項記載の
粒子分析器。
[Claims] 1. After the particles are deflected by a magnetic field, an electric field having the same direction or the opposite direction as the magnetic field is passed through the particles, and the particles after this passage are detected by a detector to determine the mass of the particles. 1. A particle analyzer for analyzing particles and energy, characterized in that the particle analyzer is equipped with an auxiliary electrode for suppressing an irregular electric field that is generated around the electrode that generates the electric field and disturbs the trajectory of the particles. 2. The particle analyzer according to claim 1, wherein the auxiliary electrode is provided between the electrode that generates the electric field and the magnetic pole that generates the magnetic field. 3. The particle analyzer according to claim 1, wherein the auxiliary electrode is provided between the electrode that generates the electric field and the detector that detects the particles.
JP59213899A 1984-10-12 1984-10-12 Particle analyzer Granted JPS6193545A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59213899A JPS6193545A (en) 1984-10-12 1984-10-12 Particle analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59213899A JPS6193545A (en) 1984-10-12 1984-10-12 Particle analyzer

Publications (2)

Publication Number Publication Date
JPS6193545A JPS6193545A (en) 1986-05-12
JPH0358139B2 true JPH0358139B2 (en) 1991-09-04

Family

ID=16646858

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59213899A Granted JPS6193545A (en) 1984-10-12 1984-10-12 Particle analyzer

Country Status (1)

Country Link
JP (1) JPS6193545A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8912580D0 (en) * 1989-06-01 1989-07-19 Vg Instr Group Charged particle energy analyzer and mass spectrometer incorporating it

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5823157A (en) * 1981-07-31 1983-02-10 Shimadzu Corp Mass spectrograph

Also Published As

Publication number Publication date
JPS6193545A (en) 1986-05-12

Similar Documents

Publication Publication Date Title
US4072862A (en) Time-of-flight mass spectrometer
US20090314934A1 (en) Mass spectrometer
JPS5917500B2 (en) Neutral particle detection device
JP7555428B2 (en) Apparatus and method for high performance charged particle detection - Patents.com
US4959544A (en) Energy analyzer
US6624410B1 (en) Cycloidal mass spectrometer
JPH0358139B2 (en)
JP7466762B2 (en) A shunt magnetic sector for a mass spectrometer.
CN119132924A (en) Neutral atom detection device suitable for a wide energy range
JPH0534773B2 (en)
US3387131A (en) Dual orbit mass spectrometer for analyzing ions in the mass range of 1 to 100
JPH0534772B2 (en)
JPH0534774B2 (en)
US4134013A (en) Mass spectrometers
JPH0230050A (en) Mass spectrograph
US5107110A (en) Simultaneous detection type mass spectrometer
US6818887B2 (en) Reflector for a time-of-flight mass spectrometer
JPS6240148A (en) Ion detector
JPS5833643Y2 (en) Ion beam current detection device in mass spectrometer
JPS60189150A (en) Ion source for mass spectrometer
JPH0572701B2 (en)
Tomková et al. Some aspects of measurements with a 127° cylindrical analyzer
GB2191334A (en) Mass spectrometer
Voultsidou AN ION-OPTICS SIMULATION STUDY OF A TANDEM 45 PARALLEL PLATE SPECTROMETER
JPS6256885A (en) Radiation detector

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees
<