JPH0552677B2 - - Google Patents
Info
- Publication number
- JPH0552677B2 JPH0552677B2 JP4365584A JP4365584A JPH0552677B2 JP H0552677 B2 JPH0552677 B2 JP H0552677B2 JP 4365584 A JP4365584 A JP 4365584A JP 4365584 A JP4365584 A JP 4365584A JP H0552677 B2 JPH0552677 B2 JP H0552677B2
- Authority
- JP
- Japan
- Prior art keywords
- refractive index
- layer
- mesa
- semiconductor
- active layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims description 33
- 230000003287 optical effect Effects 0.000 description 9
- 238000005253 cladding Methods 0.000 description 7
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 125000005842 heteroatom Chemical group 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/223—Buried stripe structure
- H01S5/2232—Buried stripe structure with inner confining structure between the active layer and the lower electrode
- H01S5/2234—Buried stripe structure with inner confining structure between the active layer and the lower electrode having a structured substrate surface
- H01S5/2235—Buried stripe structure with inner confining structure between the active layer and the lower electrode having a structured substrate surface with a protrusion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/223—Buried stripe structure
- H01S5/2237—Buried stripe structure with a non-planar active layer
Landscapes
- Semiconductor Lasers (AREA)
Description
【発明の詳細な説明】
(技術分野)
本発明の半導体レーザは安定な単一横モード発
振する高出力な半導体レーザに関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The semiconductor laser of the present invention relates to a high-output semiconductor laser that oscillates in a stable single transverse mode.
(従来技術とその問題点)
半導体レーザにおいて、安定な単一横モード発
振し、高出力であることは光通信や光情報処理用
光源として重要である。現在、半導体レーザには
埋め込み構造(BH構造と以下略す)と呼ばれる
活性層が活性層より屈折率が小さい半導体層中に
埋め込まれた構造がよく採用されている。しかし
埋め込まれた活性層幅が2μm以上になると容易
に横高次モードが発振してしまう。また低注入レ
ベルで単一横モード発振しても高出力動作させる
ためにキヤリアを高注入すると単一横モード発振
が維持できないという問題があつた。(Prior art and its problems) Semiconductor lasers are important for stable single transverse mode oscillation and high output as light sources for optical communications and optical information processing. Currently, semiconductor lasers often employ a structure called a buried structure (hereinafter abbreviated as BH structure) in which an active layer is embedded in a semiconductor layer whose refractive index is lower than that of the active layer. However, when the width of the buried active layer exceeds 2 μm, the transverse higher-order mode easily oscillates. Furthermore, even if single transverse mode oscillation occurs at a low injection level, there is a problem in that single transverse mode oscillation cannot be maintained if a high carrier is injected to achieve high output operation.
(発明の目的)
本発明の目的は、上記の問題点を除き、安定な
単一横モードで発振する高出力な半導体レーザを
提供することにある。(Object of the Invention) An object of the present invention is to provide a high-output semiconductor laser that oscillates in a stable single transverse mode, eliminating the above-mentioned problems.
(発明の構成)
本発明の半導体レーザの構成は、活性層より屈
折率が小さなメサストライプ状の第1の半導体層
の少なくとも両側面を前記第1の半導体層より屈
折率が小さな第2の半導体層により、はさみ込ん
だ構造を有するメサを備え、かつ前記メサ上部及
びメサの両側にわたつて屈曲した活性層を含むダ
ブルヘテロ構造を有することを特徴とする。(Structure of the Invention) The structure of the semiconductor laser of the present invention is such that at least both sides of a first semiconductor layer in a mesa stripe shape having a refractive index smaller than that of the active layer are covered with a second semiconductor layer having a smaller refractive index than the first semiconductor layer. It is characterized in that it has a double heterostructure including a mesa having a sandwiched structure and an active layer bent above the mesa and on both sides of the mesa.
(発明の作用効果)
本発明の構成によれば、メサ上部の活性層は1
つの光の導波路を形成する。さらにメサ上部の光
の導波路を形成する活性層はその内部においても
メサを形成している半導体層の屈折率が中央で大
きくなつているために等価的に中央部の屈折率が
高くなつている。この事より、メサ幅で決まる光
の導波路幅を広くし光導波断面積を大きくして高
出力化をはかつたときにおいても、単一横モード
を維持することができる。(Operations and Effects of the Invention) According to the configuration of the present invention, the active layer above the mesa is 1
form two optical waveguides. Furthermore, inside the active layer that forms the optical waveguide at the top of the mesa, the refractive index of the semiconductor layer that forms the mesa increases at the center, so the refractive index at the center is equivalently high. There is. This makes it possible to maintain a single transverse mode even when the optical waveguide width determined by the mesa width is widened and the optical waveguide cross section is increased to increase output.
(構成の詳細な説明)
以下図面を用いて詳細に説明する。第1図は本
発明の半導体レーザの断面模式図(第1図b)と
屈折率分布(第1図a)を示したものである。メ
サ100には、活性層4より屈折率が高い第1の半
導体層30が第1の半導体層30より屈折率が小
さい第2の半導体層20によりはさみ込まれた構
造を有している。メサ100に沿つて活性層4が
第1のクラツド層3を介して位置する。この時活
性層4は折れ曲つた形状を有し、メサ上部の活性
層は光の導波路を形成している。さらにメサ上部
の活性層内部において中央部Aと端部Bには等価
的に屈折率差が形成されている。Aの部分の活性
層の等価的な屈折率はメサに含まれる第1の半導
体層屈折率が第2の半導体層の屈折率より大きい
ためBの部分の活性層の等価的な屈折率より大き
くなる。その屈折率の様子を第1図aに示した。
すなわち第1図のイ−ロの横方向の等価的な屈折
率分布である。中央部の屈折率と端部の屈折率差
は通常BHと比較して十分小さく、光はW1の幅
で導波されると共に中央部の屈折率が高くなつて
いるために、W1の幅を広くしても単一横姿態が
維持される。簡単に言えば活性層が形成する光導
波路がラージオプテイカルキヤビテイ構造を等価
的にそなえているのである。第2図は本発明の半
導体レーザの変形の例であるが、メサ上部の活性
層4より屈折率が小さく第1の半導体層30より
屈折率の大きな第1のクラツド層40と活性層4
より屈折率が小さく第2のクラツド層5より屈折
率が大きい導波路層50にはさみ込まれたダブル
ヘテロ横造を有するものである。(Detailed description of the configuration) A detailed description will be given below using the drawings. FIG. 1 shows a schematic cross-sectional view (FIG. 1b) and a refractive index distribution (FIG. 1a) of the semiconductor laser of the present invention. The mesa 100 has a structure in which a first semiconductor layer 30 having a higher refractive index than the active layer 4 is sandwiched between second semiconductor layers 20 having a lower refractive index than the first semiconductor layer 30. An active layer 4 is located along the mesa 100 with the first cladding layer 3 interposed therebetween. At this time, the active layer 4 has a bent shape, and the active layer above the mesa forms an optical waveguide. Furthermore, an equivalent refractive index difference is formed between the center portion A and the end portions B inside the active layer in the upper part of the mesa. The equivalent refractive index of the active layer in part A is larger than the equivalent refractive index of the active layer in part B because the refractive index of the first semiconductor layer included in the mesa is larger than the refractive index of the second semiconductor layer. Become. The state of the refractive index is shown in Figure 1a.
That is, it is an equivalent refractive index distribution in the lateral direction of E-L in FIG. The difference in refractive index between the central part and the end part is usually sufficiently small compared to BH, and the light is guided with a width of W 1 and the refractive index of the central part is high. Even if the width is increased, the single horizontal position is maintained. Simply put, the optical waveguide formed by the active layer has an equivalent radio optical cavity structure. FIG. 2 shows an example of a modification of the semiconductor laser of the present invention, in which a first cladding layer 40 and an active layer 4 having a smaller refractive index than the active layer 4 on the upper mesa and a larger refractive index than the first semiconductor layer 30 are shown in FIG.
It has a double hetero horizontal structure sandwiched between waveguide layers 50 which have a smaller refractive index and a larger refractive index than the second cladding layer 5.
(実施例)
以下実施例を用いて説明する。本発明のレーザ
は次のようにして作製した。第3図は本発明の半
導体レーザの作製工程図であり、p形GaAs基板
1上に第1の半導体層30となるp形のAl0.2
Ga0.8As層を1μm有機金属分解法(以下MOCVD
法と略す)により成長し、第3図aのように
SiO2のストライプマスク200を形成した後に
MOCVD炉反応管内部で気相エツチングし(第
3図b)、その後に第2の半導体層20となるn
形のAl0.3Ga0.7As層を成長し第3図cの形状を作
製した。その後にSiO2を除去し(第3図d)、エ
ツチング処理をしたのち再度MOCVD法により
第1のクラツド層3となるp形のAl0.2Ga0.8As層
を0.3μm活性層4となるノンドープのGaAs層
0.1μm、第2のクラツド層5となるAl0.3Ga0.8As
層を2μm成長し第3図eの本発明のレーザ構造
を作製した。実際はその上にGaAsキヤツプ層を
成長している。この際において第2の半導体層2
0は半導体基板1と導電性が異なるためメサの中
央部以外にはp−n−p−n構造が形成され、活
性層の発光領域のみに電流が注入される特徴を有
する。以上、本発明の半導体レーザは、安定な単
一横モードで発振する高出力な半導体レーザであ
る。(Example) The following will be explained using examples. The laser of the present invention was manufactured as follows. FIG. 3 is a manufacturing process diagram of the semiconductor laser of the present invention, in which p-type Al 0.2 which becomes the first semiconductor layer 30 is placed on the p-type GaAs substrate 1.
The Ga 0.8 As layer was deposited using a 1 μm organometallic decomposition method (hereinafter referred to as MOCVD).
(abbreviated as law), as shown in Figure 3 a.
After forming the SiO 2 stripe mask 200
Gas phase etching is performed inside the MOCVD reactor tube (Fig. 3b), and then the n
An Al 0.3 Ga 0.7 As layer was grown to produce the shape shown in Figure 3c. Thereafter, SiO 2 was removed (Fig. 3d), and after etching treatment, a p-type Al 0.2 Ga 0.8 As layer, which would become the first cladding layer 3, was deposited with a thickness of 0.3 μm using the MOCVD method. GaAs layer
0.1 μm, Al 0.3 Ga 0.8 As, which becomes the second cladding layer 5
A layer of 2 .mu.m thick was grown to produce the laser structure of the present invention shown in FIG. 3e. In reality, a GaAs cap layer is grown on top of it. At this time, the second semiconductor layer 2
0 has a different conductivity from the semiconductor substrate 1, so a pn-pn structure is formed in areas other than the center of the mesa, and current is injected only into the light emitting region of the active layer. As described above, the semiconductor laser of the present invention is a high-output semiconductor laser that oscillates in a stable single transverse mode.
第1図a,bは本発明の半導体レーザの断面模
式図と屈折率分布を示すものであり第2図は本発
明レーザの変形の一例、第3図a〜eは作製工程
図である。
図中1は半導体基板、3及び40は第1のクラ
ツド層、4は活性層、5は第2のクラツド層、2
0……は第2の半導体層、30は第1の半導体
層、100はメサ、50は導波路層、200は
SiO2ストライプである。
FIGS. 1a and 1b show a schematic cross-sectional view and refractive index distribution of the semiconductor laser of the present invention, FIG. 2 is an example of a modification of the laser of the present invention, and FIGS. 3a to 3e are manufacturing process diagrams. In the figure, 1 is a semiconductor substrate, 3 and 40 are first cladding layers, 4 is an active layer, 5 is a second cladding layer, 2
0... is the second semiconductor layer, 30 is the first semiconductor layer, 100 is the mesa, 50 is the waveguide layer, 200 is the
SiO 2 stripes.
Claims (1)
の第1の半導体層の両側面を前記第1の半導体層
より屈折率が小さな第2の半導体層によりはさみ
込んだ構造を有するメサを備え、かつ前記メサ上
部及びメサの両側にわたつて屈曲した活性層を含
むダブルヘテロ構造を有する事を特徴とする半導
体レーザ。1. A mesa having a structure in which both sides of a mesa-stripe-shaped first semiconductor layer having a refractive index lower than that of the active layer are sandwiched between second semiconductor layers having a lower refractive index than the first semiconductor layer, and A semiconductor laser characterized by having a double heterostructure including an active layer bent over the top of a mesa and on both sides of the mesa.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4365584A JPS60187083A (en) | 1984-03-07 | 1984-03-07 | Semiconductor laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4365584A JPS60187083A (en) | 1984-03-07 | 1984-03-07 | Semiconductor laser |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60187083A JPS60187083A (en) | 1985-09-24 |
| JPH0552677B2 true JPH0552677B2 (en) | 1993-08-06 |
Family
ID=12669876
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4365584A Granted JPS60187083A (en) | 1984-03-07 | 1984-03-07 | Semiconductor laser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60187083A (en) |
-
1984
- 1984-03-07 JP JP4365584A patent/JPS60187083A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60187083A (en) | 1985-09-24 |
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