JPH0569189B2 - - Google Patents
Info
- Publication number
- JPH0569189B2 JPH0569189B2 JP60142065A JP14206585A JPH0569189B2 JP H0569189 B2 JPH0569189 B2 JP H0569189B2 JP 60142065 A JP60142065 A JP 60142065A JP 14206585 A JP14206585 A JP 14206585A JP H0569189 B2 JPH0569189 B2 JP H0569189B2
- Authority
- JP
- Japan
- Prior art keywords
- dead center
- elevating
- pair
- lifting
- roof guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003028 elevating effect Effects 0.000 claims description 72
- 238000005259 measurement Methods 0.000 claims description 22
- 210000001015 abdomen Anatomy 0.000 claims description 5
- 230000006835 compression Effects 0.000 description 4
- 238000007906 compression Methods 0.000 description 4
- 230000001105 regulatory effect Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Manipulator (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はICの電気的特性を測定するICハンド
ラの測定部に係り、特にリードが環状に湾曲した
新しい形状のICに適用することができるICハン
ドラの測定部に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a measurement section of an IC handler that measures the electrical characteristics of an IC, and is particularly applicable to a new shape of an IC with an annularly curved lead. Concerning the measurement section of the IC handler.
従来のICは第5図a示のようにリード8aの
先端が切り放し状態になつているDILP型のもの
が主流であつた。このDILP型のIC5aはプリン
ト基板(図示せず)にスルーホールを穿孔し、自
動機にてリード8aをスルーホールに挿通し、ス
ルーホールにリード8aを半田付けし、余分のリ
ード先端を切断していた。ところがリード8aの
先端が切り放し状態になつていて曲がり易いため
自動化工程でスルーホールにリード8aを自動挿
入する際、リード先端が曲がつて挿入できないこ
とがあつた。またスルーホールにリード8aを挿
通するのであるからプリント基板の実装は片面し
た行われず、電装部品の実装密度が低いという問
題点もあつた。
The mainstream of conventional ICs has been the DILP type in which the ends of the leads 8a are cut off as shown in FIG. 5a. This DILP type IC 5a is made by drilling a through hole in a printed circuit board (not shown), inserting the lead 8a into the through hole using an automatic machine, soldering the lead 8a to the through hole, and cutting off the excess lead tip. was. However, since the tip of the lead 8a is cut off and easily bent, when the lead 8a is automatically inserted into a through hole in an automated process, the tip of the lead is sometimes bent and cannot be inserted. Furthermore, since the leads 8a are inserted through the through-holes, the printed circuit board cannot be mounted on one side, resulting in the problem that the mounting density of electrical components is low.
そこで登場したのが第5図bに示すIC5で、
PLCC型ICと呼ばれるものであり、リード8の先
端が環状に湾曲してIC本体内に埋設されている
ものである。かかる形状のIC5はスルーホール
を用いず、プリント基板(図示せず)の表面に直
接半田付けされるためプリント基板の実装密度は
従来の倍となるものである。 Then, IC5, shown in Figure 5b, appeared.
This is called a PLCC type IC, and the tip of the lead 8 is curved into an annular shape and is embedded within the IC body. Since the IC 5 having such a shape is directly soldered to the surface of a printed circuit board (not shown) without using a through hole, the mounting density of the printed circuit board is twice that of the conventional one.
しかしながら従来のICハンドラの測定部は
DILP型IC5aの電気的特性の測定に適合した構
造であつたため、DILP型IC5aとはその形状を
全く異にするPLCC型IC5の電気的特性の測定に
適用することができない。
However, the measuring section of conventional IC handlers
Since the structure was suitable for measuring the electrical characteristics of the DILP type IC 5a, it cannot be applied to the measurement of the electrical characteristics of the PLCC type IC 5, which has a completely different shape from the DILP type IC 5a.
そこで、本発明はリードが環状に湾曲した形状
のPLCC型ICに適用できるICハンドラの測定部を
提供するため、第1図示のようにIC供給・排出
位置である上死点、途中の中段点、IC測定位置
直上の下死点の3停止点間を昇降し、下面にIC
5のガイド溝29を有する昇降屋根ガイド部1及
び当該昇降屋根ガイド部1の昇降手段Aと、上死
点と中段点間をこの昇降屋根ガイド部1と連動し
て昇降する昇降ブロツク30及び当該昇降ブロツ
ク30の連動手段Bと、この昇降ブロツク30に
設けられて中段点での下降停止時と上昇開始時に
それぞれ開、閉され、昇降中及び上死点では閉状
態を保つてIC5を支え、開状態ではIC5の支え
を解放する一対の可動レール部2及び当該可動レ
ール部2の開閉手段Cと、昇降屋根ガイド部1に
上下動自在に設けられ、上死点でのIC供給以前
に下動しガイド溝29より突出してIC5の停止
位置を決定し、上死点でのIC排出時に上動しガ
イド溝29より没入してIC5をフリーにするス
トツパ3及び当該ストツパ3の上下動手段Dと、
中段点と下死点間を昇降屋根ガイド部1と連動し
て昇降しIC5の腹4を支持する棒状のIC支持部
6及び当該IC支持部6の連動手段Eと、IC測定
位置に設けられ下死点でのIC停止時にIC5のリ
ード8が係合してIC5の電気的特性を測定し、
下死点よりのIC上昇によりIC5のリード8が離
脱する測定用接点9を備えたソケツト7とよりな
る構成としたものである。
Therefore, in order to provide a measurement unit of an IC handler that can be applied to a PLCC type IC whose lead is curved in an annular shape, the present invention is designed to , move up and down between the three stopping points of the bottom dead center directly above the IC measurement position, and place the IC on the bottom surface.
an elevating roof guide section 1 having a guide groove 29 of 5; an elevating means A for the elevating roof guide section 1; an elevating block 30 that moves up and down between the top dead center and the middle point in conjunction with the elevating roof guide section 1; The interlocking means B of the lifting block 30 is provided in the lifting block 30, and is opened and closed when the lowering stops at the middle point and when the rising starts, respectively, and is maintained in the closed state during the lifting and lowering and at the top dead center to support the IC5, In the open state, a pair of movable rail sections 2 that release the support of the IC 5, an opening/closing means C for the movable rail sections 2, and an elevating roof guide section 1 are provided so as to be movable up and down. A stopper 3 that protrudes from the guide groove 29 to determine the stop position of the IC 5, moves upward when ejecting the IC at the top dead center, and retracts from the guide groove 29 to free the IC 5, and a vertical movement means D for the stopper 3. and,
A rod-shaped IC support part 6 that moves up and down in conjunction with the elevating roof guide part 1 between the middle point and the bottom dead center and supports the belly 4 of the IC 5, an interlocking means E of the IC support part 6, and a linking means E provided at the IC measurement position. When the IC stops at the bottom dead center, lead 8 of IC5 engages and measures the electrical characteristics of IC5,
The socket 7 is equipped with a measuring contact 9 from which the lead 8 of the IC 5 is detached when the IC rises from the bottom dead center.
〔作用〕
IC5の電気的特性の測定に際し、昇降屋根ガ
イド部1と一対の可動レール部2は上死点にあ
り、一対の可動レール部2は閉じた状態にある。
また、ストツパ3はガイド溝29より突出した状
態にある。[Operation] When measuring the electrical characteristics of the IC 5, the elevating roof guide portion 1 and the pair of movable rail portions 2 are at the top dead center, and the pair of movable rail portions 2 are in a closed state.
Further, the stopper 3 is in a state of protruding from the guide groove 29.
このような状態でIC5が測定部15に供給さ
れると、当該IC5は昇降屋根ガイド部1のガイ
ド溝29と一対の可動レール部2との間で一対の
可動レール部2上を滑走してきてストツパ3に衝
突し停止する(第1図参照)。 When the IC 5 is supplied to the measuring section 15 in this state, the IC 5 slides on the pair of movable rail sections 2 between the guide groove 29 of the elevating roof guide section 1 and the pair of movable rail sections 2. It collides with the stopper 3 and stops (see Figure 1).
次いで昇降屋根ガイド部1を昇降手段Aにより
上死点から中段点まで下降させ停止させると、昇
降ブロツク30及びこれに設けた一対の可動レー
ル部2もガイド溝29との間でIC5を挟持した
まま(第3図a及び第4図a参照)、連動手段B
により連動して上死点より中段点まで下降し停止
する。 Next, when the elevating roof guide part 1 is lowered from the top dead center to the middle point by the elevating means A and stopped, the elevating block 30 and the pair of movable rail parts 2 provided thereon also sandwich the IC 5 with the guide groove 29. (see Figures 3a and 4a), interlocking means B
Interlockingly, it descends from top dead center to the middle point and stops.
このとき、IC支持部6はIC5の腹4に当接し
てIC5を支持し、昇降屋根ガイド部1のガイド
溝29との間でIC5を挟持する一方、一対の可
動レール部2を開閉手段Cによつて開く(第3図
a及び第4図b参照)。しかる後、昇降屋根ガイ
ド部1を昇降手段Aにより中段点より下死点まで
下降させ停止させると、IC支持部6もガイド溝
29との間でIC5を挟持したまま連動手段Eに
より連動して下死点まで下降し停止する(第3図
b及び第4図c参照)。下死点で停止したところ
でIC5のリード8はソケツト7の測定用接点9
と係合する(第3図b及び第4図c参照)。次い
でIC5のリード8に測定用接点9を通して通電
して電気的特性の測定を行う。 At this time, the IC support part 6 supports the IC5 by contacting the belly 4 of the IC5, and holds the IC5 between the guide groove 29 of the elevating roof guide part 1, while the opening/closing means C of the pair of movable rail parts 2 (see Figures 3a and 4b). Thereafter, when the elevating roof guide part 1 is lowered from the middle point to the bottom dead center by the elevating means A and stopped, the IC support part 6 is also interlocked by the interlocking means E while holding the IC 5 between it and the guide groove 29. It descends to the bottom dead center and stops (see Figures 3b and 4c). When it stops at the bottom dead center, lead 8 of IC5 connects to measurement contact 9 of socket 7.
(see Figures 3b and 4c). Next, the lead 8 of the IC 5 is energized through the measurement contact 9 to measure the electrical characteristics.
測定が完了したら、昇降屋根ガイド部1を昇降
手段Aにより下死点より中段点まで上昇させ停止
させると、IC支持部6もガイド溝29との間で
IC5を挟持したまま連動手段Eにより連動して
中段点まで上昇し停止する。次いで一対の可動レ
ール部2を開閉手段Cによつて閉じてIC5を支
える。この動作が完了したら昇降屋根ガイド部1
を昇降手段Aにより中段点より上死点まで上昇さ
せ停止させると、昇降ブロツク30及び一対の可
動レール部2もガイド溝29との間でIC5を挟
持したまま中段点より上死点まで上昇し停止す
る。しかる後、ストツパ3を上下動手段Dにより
上動すると、ストツパ3がガイド溝29より引き
込み、IC5をフリーにする。フリーになつたIC
5は自重で一対の可動レール部2より滑落して排
出されることになる。 When the measurement is completed, when the elevating roof guide part 1 is raised from the bottom dead center to the middle point by the elevating means A and stopped, the IC support part 6 also moves between the guide groove 29 and the elevating roof guide part 1.
While holding the IC5, it is moved up to the middle point by the interlocking means E and stopped. Next, the pair of movable rail parts 2 are closed by the opening/closing means C to support the IC 5. Once this operation is completed, lift the roof guide part 1.
When the lift block 30 and the pair of movable rails 2 are lifted from the middle point to the top dead center by the lifting means A and stopped, the lifting block 30 and the pair of movable rails 2 also rise from the middle point to the top dead center while holding the IC 5 between them and the guide groove 29. Stop. Thereafter, when the stopper 3 is moved upward by the vertical movement means D, the stopper 3 is pulled in from the guide groove 29, thereby freeing the IC5. IC that became free
5 slides down from the pair of movable rail parts 2 due to its own weight and is discharged.
第1図は本発明測定部の一実施例を示す正断面
図、第2図は第1図の本発明測定部の一実施例を
適用したICハンドラの正面図である。
FIG. 1 is a front sectional view showing an embodiment of the measuring section of the present invention, and FIG. 2 is a front view of an IC handler to which the embodiment of the measuring section of the present invention shown in FIG. 1 is applied.
まず、ICハンドラについて説明する。 First, we will explain the IC handler.
第2図において11はローダで、第5図b示の
IC5を充填したマガジン21が積載されている。
12はこのローダ11よりマガジン21を1本ず
つ傾動アーム22に供給するIC供給装置で、傾
動アーム22を傾動することによりマガジン21
内のIC5を供給シユート14に滑落させるもの
である。13は供給シユート14に滑落したIC
5を個別化する個別化装置で、個別化されたIC
5は本発明に係る測定部15に供給される。16
はテストステーシヨン、17は操作部、23はベ
ースである。 In Fig. 2, 11 is a loader, as shown in Fig. 5b.
A magazine 21 filled with IC5 is loaded.
Reference numeral 12 denotes an IC supply device that supplies the magazines 21 one by one from the loader 11 to the tilting arm 22. By tilting the tilting arm 22, the magazines 21 are
The IC 5 inside is slid down into the supply chute 14. 13 is the IC that slipped into the supply chute 14
This is an individualization device that individualizes 5, and individualized IC.
5 is supplied to the measuring section 15 according to the present invention. 16
17 is a test station, 17 is an operating section, and 23 is a base.
測定部15は供給されたIC5の電気的特性を
測定する。測定後のIC5は分類シユート19に
排出され、特性別に分類されて所定のアンローダ
18に滑入し、空のマガジン21に収納される。
なお、20は架台である。 The measurement unit 15 measures the electrical characteristics of the supplied IC 5. After the measurement, the ICs 5 are discharged into a sorting chute 19, classified according to their characteristics, slid into a predetermined unloader 18, and stored in an empty magazine 21.
Note that 20 is a pedestal.
次にこのようなICハンドラにおいて供給シユ
ート14と分類シュート19との間に配設される
本発明測定部15の一実施例の構成を第1図によ
り詳述する。 Next, the configuration of an embodiment of the measuring section 15 of the present invention disposed between the supply chute 14 and the sorting chute 19 in such an IC handler will be described in detail with reference to FIG.
第1図において1はIC供給・排出位置である
上死点、途中の中段点、IC測定位置直上の下死
点の3停止点間を昇降する昇降屋根ガイド部で、
下面にはIC5の背部の形状に合つたガイド溝2
9を設けてある。ベース23を貫通する一対の昇
降軸27の下端部は昇降屋根ガイド部1に連結さ
れ、その上端部は昇降軸連結バー28で連結され
ている。この連結バー28には昇降用副シリンダ
25が取着され、この副シリンダ25はベース2
3に立設した昇降用主シリンダ24とカツプリン
グ26で接続されている。この主、副シリンダ2
4,25と一対の昇降軸27と連結バー28等は
屋根ガイド部1の昇降手段Aを構成している。 In Fig. 1, 1 is an elevating roof guide section that moves up and down between three stopping points: top dead center which is the IC supply/discharge position, midway point, and bottom dead center directly above the IC measurement position.
There is a guide groove 2 on the bottom surface that matches the shape of the back of IC5.
9 is provided. The lower end portions of a pair of elevating shafts 27 passing through the base 23 are connected to the elevating roof guide portion 1, and the upper end portions thereof are connected by an elevating shaft connecting bar 28. An elevating sub cylinder 25 is attached to this connecting bar 28, and this sub cylinder 25 is attached to the base 2.
It is connected by a coupling ring 26 to a main cylinder 24 for elevating and lowering which is installed upright at 3. This main and sub cylinder 2
4, 25, a pair of elevating shafts 27, a connecting bar 28, etc. constitute elevating means A of the roof guide portion 1.
30は上死点と中段点間を昇降屋根ガイド部1
と連動して昇降する昇降ブロツクで、ベース23
の下方に配設されている。ベース23を貫通する
一対の昇降シヤフト34の下端部はこの昇降ブロ
ツク30に連結され、その上端部はシヤフト連結
バー35で連結されている。この連結バー35は
これに螺着された高さ調整ボルト36で上記昇降
手段Aの昇降軸連結バー28に支えられている。
また、ベース23と昇降ブロツク30との間には
一対の昇降シヤフト34に嵌め込んだ圧縮ばね4
1が介装され、一対の昇降シヤフト34には移動
量規制リング37が取付けられている。一対の昇
降シヤフト34と連結バー35と高さ調整ボルト
36と移動量規制リング37と圧縮ばね41等
は、昇降屋根ガイド部1と連動して昇降ブロツク
30を上死点と中段点間で昇降させるための連動
手段Bを構成している。移動量規制リング37
は、ベース23に当接して中段点で連動を中断す
る役目を果たすものである。 30 is the elevating roof guide part 1 between the top dead center and the middle point.
Base 23 is a lifting block that moves up and down in conjunction with the
It is located below. The lower ends of a pair of lifting shafts 34 passing through the base 23 are connected to the lifting block 30, and the upper ends thereof are connected by a shaft connecting bar 35. This connecting bar 35 is supported by the lifting shaft connecting bar 28 of the lifting means A by a height adjustment bolt 36 screwed thereon.
Further, between the base 23 and the lifting block 30, there is a compression spring 4 fitted into a pair of lifting shafts 34.
1 is interposed therebetween, and a movement amount regulating ring 37 is attached to the pair of elevating shafts 34. A pair of elevating shafts 34, a connecting bar 35, a height adjustment bolt 36, a movement restriction ring 37, a compression spring 41, etc. work together with the elevating roof guide section 1 to move the elevating block 30 up and down between the top dead center and the middle point. It constitutes an interlocking means B for causing this. Movement amount regulation ring 37
serves to contact the base 23 and interrupt the interlocking at the middle point.
2は中段点での下降停止時と上昇開始時にそれ
ぞれ開閉される一対の可動レール部で、昇降中及
び上死点では閉状態を保つてIC5を支え、開状
態ではIC5の支えを解放するものである。この
一対の可動レール部2は、昇降屋根ガイド部1の
通孔33に挿通した一対の揺動アーム31の下端
に設けられ、この一対の揺動アーム31の基端は
昇降ブロツク30に枢支されている。一対の揺動
アーム31は昇降ブロツク30に取付けた開閉用
シリンダ32とリンク機構42で連結されてお
り、これによつて一対の可動レール部2は開閉で
きるようになつている。一対の揺動アーム31と
開閉用シリンダ32とリンク機構42等は一対の
可動レール部2の開閉手段Cを構成している。 Reference numeral 2 designates a pair of movable rails that are opened and closed when the descent stops at the middle point and when the ascent begins. They remain closed and support the IC5 during ascent and descent and at the top dead center, and release the support of the IC5 in the open state. It is. The pair of movable rail parts 2 are provided at the lower ends of a pair of swinging arms 31 inserted through the through holes 33 of the elevating roof guide part 1, and the base ends of the pair of swinging arms 31 are pivoted to the elevating block 30. has been done. The pair of swing arms 31 are connected to an opening/closing cylinder 32 attached to the lifting block 30 by a link mechanism 42, so that the pair of movable rail sections 2 can be opened and closed. The pair of swing arms 31, the opening/closing cylinder 32, the link mechanism 42, etc. constitute an opening/closing means C for the pair of movable rail sections 2.
3は昇降屋根ガイド部1の通孔38に上下動自
在に設けられたストツパで、上死点でのIC供給
以前に下動しガイド溝29より突出してIC5の
停止位置を決定し、上死点でのIC排出時に上動
しガイド溝29より没入してIC5をフリーにす
るためのものである。39は屋根ガイド部1の上
面に設けられたストツパ3の上下動手段、例えば
ストツパ駆動シリンダである。 Reference numeral 3 denotes a stopper that is movable up and down in the through hole 38 of the elevating roof guide section 1, and moves downward before the IC is supplied at the top dead center, protrudes from the guide groove 29, and determines the stop position of the IC 5, and stops the IC 5 at the top dead center. When the IC is ejected at a point, it moves upward and sinks into the guide groove 29 to free the IC 5. Reference numeral 39 denotes means for vertically moving the stopper 3 provided on the upper surface of the roof guide portion 1, such as a stopper driving cylinder.
7はIC測定位置に設けられたソケツトで、下
死点でのIC停止時にIC5のリード8が湾曲部1
0に係合してIC5の電気的特性を測定し、下死
点よりのIC5の上昇によりIC5のリード8が湾
曲部10より離脱する測定用接点9を備えてい
る。6は中段点と下死点間を昇降屋根ガイド部1
と連動して昇降しIC5の腹4を支持する棒状の
IC支持部である。このIC支持部6はソケツト7
の中央の孔に上下動自在に挿通して設けられてお
り、IC支持部6とソケツト7との間には当該IC
支持部6に嵌め込んだ支持部昇降ばね40が介装
されている。この昇降ばね40は昇降屋根ガイド
部1と連動してIC支持部6を中段点と下死点間
で昇降させるための連動手段Eとなつている。 7 is a socket provided at the IC measurement position, and when the IC stops at the bottom dead center, the lead 8 of the IC 5 is connected to the curved part 1.
0 to measure the electrical characteristics of the IC 5, and the lead 8 of the IC 5 separates from the curved portion 10 when the IC 5 rises from the bottom dead center. 6 is the elevating roof guide part 1 between the middle point and the bottom dead center.
A rod-shaped rod that moves up and down in conjunction with the
This is the IC support part. This IC support part 6 is the socket 7
The IC is inserted into a hole in the center of the IC so that it can move vertically.
A support part lifting spring 40 fitted into the support part 6 is interposed. This elevating spring 40 works in conjunction with the elevating roof guide portion 1 to serve as interlocking means E for elevating and lowering the IC support portion 6 between the middle point and the bottom dead center.
以下、本発明測定部の一実施例の作用を説明す
る。 Hereinafter, the operation of one embodiment of the measuring section of the present invention will be explained.
IC5の電気的特性の測定に際し、昇降屋根ガ
イド部1と一対の可動レール部2は上死点にあ
り、一対の可動レール部2は閉じた状態にある。
また、ストツパ3はガイド溝29より突出した状
態にある。 When measuring the electrical characteristics of the IC 5, the elevating roof guide section 1 and the pair of movable rail sections 2 are at the top dead center, and the pair of movable rail sections 2 are in a closed state.
Further, the stopper 3 is in a state of protruding from the guide groove 29.
このような状態でIC5が測定部15に供給シ
ユート14により供給されると、当該IC5は昇
降屋根ガイド部1のガイド溝29と一対の可動レ
ール部2との間で一対の可動レール部2上を滑走
してきてストツパ3に衝突し停止する(第1図参
照)。 When the IC 5 is supplied to the measurement section 15 by the supply chute 14 in this state, the IC 5 is placed between the guide groove 29 of the elevating roof guide section 1 and the pair of movable rail sections 2 on the pair of movable rail sections 2. The vehicle slides down, collides with stopper 3, and stops (see Figure 1).
次いで昇降用副シリンダ25又は昇降用主シリ
ンダ24が作動し、これによつて連結バー28及
び一対の昇降軸27を経て昇降屋根ガイド部1
が、上死点から中段点まで下降し停止する。これ
と同時に連結バー28に高さ調整ボルト36で支
えられた連結バー35及び一対の昇降シヤフト3
4を経て昇降ブロツク30とこれに一対の揺動ア
ーム31を介して設けられた一対の可動レール部
2も、ガイド溝29との間でIC5を挟持したま
ま(第3図a及び第4図a参照)、上死点から中
段点まで下降し停止する。この場合、圧縮ばね4
1は伸長して行き、そのばね力によつて高さ調整
ボルト36は連結バー28に当接した状態を保
ち、連動動作を達成する。 Next, the elevating sub-cylinder 25 or the elevating main cylinder 24 operates, whereby the elevating roof guide portion 1 is moved through the connecting bar 28 and the pair of elevating shafts 27.
The machine descends from top dead center to the middle point and stops. At the same time, the connecting bar 35 supported by the height adjustment bolt 36 on the connecting bar 28 and the pair of lifting shafts 3
4, the lifting block 30 and a pair of movable rail parts 2 provided thereon via a pair of swinging arms 31 also hold the IC 5 between the guide groove 29 (Fig. 3a and Fig. 4). (see a), descends from top dead center to the middle point and stops. In this case, compression spring 4
1 expands, and its spring force keeps the height adjustment bolt 36 in contact with the connection bar 28, achieving interlocking action.
屋根ガイド部1と可動レール部2が中段点で停
止したとき、IC支持部6はIC5の腹4に当接し
て昇降ばね40を撓ませた状態でIC5を支持し、
昇降屋根ガイド部1のガイド溝29との間でIC
5を挟持する一方、開閉用シリンダ32が作動
し、これによつてリンク機構42を経て一対の揺
動アーム31を開き、一対の可動レール部2を開
く(第3図a及び第4図b参照)。しかる後、昇
降用主シリンダ24または昇降用副シリンダ25
が作動し、これによつて連結バー28及び一対の
昇降軸27を経て昇降屋根ガイド部1が、中段点
より下死点まで下降し停止する。これと同時に
IC支持部6もIC5の腹4に当接しガイド溝29
との間でIC5を挟持したまま、昇降ばね40に
ばね力に抗して中段点より下死点まで下降し停止
する(第3図b及び第4図c参照)。 When the roof guide part 1 and the movable rail part 2 stop at the middle point, the IC support part 6 contacts the belly 4 of the IC 5 and supports the IC 5 while bending the lifting spring 40.
IC between the guide groove 29 of the elevating roof guide part 1
5, the opening/closing cylinder 32 operates, thereby opening the pair of swinging arms 31 via the link mechanism 42 and opening the pair of movable rail sections 2 (Figs. 3a and 4b). reference). After that, the main cylinder for elevating 24 or the sub cylinder for elevating 25
As a result, the elevating roof guide portion 1 descends from the middle point to the bottom dead center via the connecting bar 28 and the pair of elevating shafts 27 and stops. At the same time as this
The IC support part 6 also comes into contact with the belly 4 of the IC 5, and the guide groove 29
While holding the IC 5 between them, the IC 5 moves down from the middle point to the bottom dead center against the spring force of the lifting spring 40 and stops (see Figures 3b and 4c).
この場合、中段点で移動量規制リング37がベ
ース23に当たつているため、連結バー28に高
さ調整ボルト36で支えられた連結バー35、一
対の昇降シヤフト34、昇降ブロツク30、一対
の揺動アーム31及び一対の可動レール部2等
は、中段点と下死点間で昇降することはない。 In this case, since the movement amount regulating ring 37 hits the base 23 at the middle point, the connecting bar 35 supported by the height adjustment bolt 36 on the connecting bar 28, the pair of lifting shafts 34, the lifting block 30, the pair of lifting blocks 30, The swing arm 31, the pair of movable rail parts 2, etc. do not move up or down between the middle point and the bottom dead center.
昇降屋根ガイド部1とIC支持部6が下死点で
停止したところで、IC5のリード8はソケツト
7の測定用接点9の湾曲部10と係合する(第3
図b及び第4図c参照)。次いでIC5のリード8
に測定用接点9を通して通電して電気的特性の測
定を行う。 When the elevating roof guide part 1 and the IC support part 6 stop at the bottom dead center, the lead 8 of the IC 5 engages with the curved part 10 of the measurement contact 9 of the socket 7 (the third
(see Figure b and Figure 4c). Then lead 8 of IC5
The electrical characteristics are measured by supplying current through the measurement contact 9.
測定が完了すると、昇降用主シリンダ24また
は昇降用副シリンダ25が逆方向に作動し、これ
によつて昇降屋根ガイド部1を下死点より中段点
まで上昇させ停止させると、IC支持部6も昇降
ばね40のばね力によつて下死点より上昇して
IC5をソケツト7から離脱させた後、IC支持部
6をガイド溝29との間でIC5を挟持したまま、
中段点まで上昇し停止する(第3図a及び第4図
a参照)。次いで開閉用シリンダ32が逆方向に
作動して一対の可動レール部2をリンク機構42
を介して閉じ、IC5を支える(第3図a及び第
4図a参照)。 When the measurement is completed, the elevating main cylinder 24 or the elevating sub-cylinder 25 operates in the opposite direction, thereby raising the elevating roof guide section 1 from the bottom dead center to the middle point and stopping it. is also raised from the bottom dead center by the spring force of the lifting spring 40.
After removing the IC5 from the socket 7, while holding the IC5 between the IC support part 6 and the guide groove 29,
It rises to the middle point and stops (see Figures 3a and 4a). Next, the opening/closing cylinder 32 operates in the opposite direction to move the pair of movable rail sections 2 to the link mechanism 42.
, and supports the IC5 (see Figures 3a and 4a).
この動作が完了すると昇降用副シリンダ25ま
たは昇降用主シリンダ24を逆方向に作動し、こ
れによつて昇降屋根ガイド部1を中段点より上死
点まで上昇させ停止させると、昇降ブロツク3
0、一対の揺動アーム31及び一対の可動レール
部2もガイド溝29との間でIC5を挟持したま
ま、中段点より上死点まで上昇し停止する。 When this operation is completed, the elevating sub-cylinder 25 or the elevating main cylinder 24 is operated in the opposite direction, thereby raising the elevating roof guide section 1 from the middle point to the top dead center and stopping it.
0, the pair of swing arms 31 and the pair of movable rail parts 2 also rise from the middle point to the top dead center and stop while holding the IC 5 between them and the guide groove 29.
その結果、供給シユート14と分類シユート1
9との間に昇降屋根ガイド部1と一対の可動レー
ル部2が位置せしめられ正確に接続される。この
接続が完了すると、ストツパ駆動シリンダ39が
作動してストツパ3を上動させ、ガイド溝29よ
り引き込ませてIC5をフリーにする。フリーに
なつたIC5は自重で一対の可動レール部2より
滑落して分類シユート19に排出されることにな
る。 As a result, supply chute 14 and classification chute 1
The elevating roof guide portion 1 and the pair of movable rail portions 2 are positioned and accurately connected between the movable rail portion 9 and the elevating roof guide portion 1. When this connection is completed, the stopper drive cylinder 39 is operated to move the stopper 3 upwardly and retract it from the guide groove 29, thereby freeing the IC5. The free IC 5 slides down from the pair of movable rails 2 due to its own weight and is discharged into the sorting chute 19.
なお、本発明における昇降手段A、連動手段
B、開閉手段C、上下動手段D及び連動手段Eは
実施例の構造に限定されず、例えばIC支持部6
の連動手段Eは第1図の仮想線で示すようにばね
駆動に代えてシリンダ駆動としてもよい。 Note that the elevating means A, the interlocking means B, the opening/closing means C, the vertical movement means D, and the interlocking means E in the present invention are not limited to the structures of the embodiments, and for example, the IC support part 6
The interlocking means E may be driven by a cylinder instead of being driven by a spring, as shown by the imaginary line in FIG.
上述のように本発明によれば、IC供給・排出
位置である上死点と途中の中段点との間では、昇
降屋根ガイド部1と一対の可動レール部2の間で
IC5を挟持して昇降させ、途中の中段点とIC測
定位置直上の下死点との間では、一対の可動レー
ル部2を開状態に保持すると共に昇降屋根ガイド
部1と棒状のIC支持部6の間でIC5を挟持して
昇降させ、IC測定位置のソケツト7の測定用接
点9にIC5のリード8を係合しあるいはこれよ
り離脱できるようにしたので、たとえリード8が
IC5の四辺に設けられていても一対の可動レー
ル部2が邪魔になることはなく、ソケツト7に
IC5を自由に脱着でき、IC5の電気的特性の測
定を行うことができ、新しい形状のPLCC型ICに
も適用することができる。
As described above, according to the present invention, between the top dead center which is the IC supply/discharge position and the middle point on the way, there is a gap between the elevating roof guide part 1 and the pair of movable rail parts 2.
The IC 5 is lifted and lowered while being clamped, and between the middle point on the way and the bottom dead center directly above the IC measurement position, a pair of movable rail sections 2 are held in an open state, and the elevating roof guide section 1 and a rod-shaped IC support section are held open. The IC 5 is held between the terminals 6 and 6 and raised and lowered, and the lead 8 of the IC 5 can be engaged with or detached from the measurement contact 9 of the socket 7 at the IC measurement position.
Even though they are installed on the four sides of IC5, the pair of movable rails 2 do not get in the way and can be easily attached to socket 7.
The IC5 can be freely attached and detached, the electrical characteristics of the IC5 can be measured, and it can also be applied to new shapes of PLCC type ICs.
第1図は本発明測定部の一実施例を示す正断面
図、第2図は第1図の本発明測定部の一実施例を
適用したICハンドラの正面図、第3図a,bは
それぞれ本発明におけるソケツトにICを装着す
る前の状態及び装着時の状態を示す断面図、第4
図a〜cはそれぞれ同じくソケツトへのICの装
着を開始する前の状態、装着直前の状態及び装着
時の状態を示す斜視図、第5図a,bはそれぞれ
従来のDILP型ICの斜視図及び新しく登場した
PLCC型ICを下方より見た斜視図である。
1……昇降屋根ガイド部、2……可動レール
部、3……ストツパ、4……腹、5……IC、6
……IC支持部、7……ソケツト、8……リード、
9……測定用接点、10……湾曲部、15……測
定部、24……昇降用主シリンダ、25……昇降
用副シリンダ、26……カツプリング、27……
昇降軸、28……昇降軸連結バー、29……ガイ
ド溝、30……昇降ブロツク、31……揺動アー
ム、32……開閉用シリンダ、34……昇降シヤ
フト、35……シヤフト連結バー、36……高さ
調整ボルト、37……移動量規制リング、39…
…ストツパ駆動シリンダ、40……支持部昇降ば
ね、41……圧縮ばね、42……リンク機構、A
……昇降屋根ガイド部1の昇降手段、B……昇降
ブロツク30の連動手段、C……可動レール部2
の開閉手段、D……ストツパ3の上下動手段、E
……IC支持部6の連動手段。
FIG. 1 is a front sectional view showing an embodiment of the measuring section of the present invention, FIG. 2 is a front view of an IC handler to which the embodiment of the measuring section of the present invention of FIG. 1 is applied, and FIGS. 3 a and b are FIG. 4 is a cross-sectional view showing a state before and when an IC is mounted on the socket according to the present invention, respectively;
Figures a to c are perspective views showing the state before the IC is installed in the socket, the state immediately before installation, and the state during installation, respectively, and Figures 5a and 5b are perspective views of a conventional DILP type IC, respectively. and newly appeared
FIG. 2 is a perspective view of the PLCC type IC seen from below. 1... Lifting roof guide section, 2... Movable rail section, 3... Stopper, 4... Belt, 5... IC, 6
...IC support part, 7...socket, 8...lead,
9... Measuring contact, 10... Curved part, 15... Measuring part, 24... Main cylinder for lifting, 25... Sub cylinder for lifting, 26... Coupling, 27...
Elevating shaft, 28... Elevating shaft connection bar, 29... Guide groove, 30... Elevating block, 31... Swinging arm, 32... Opening/closing cylinder, 34... Elevating shaft, 35... Shaft connecting bar, 36...Height adjustment bolt, 37...Movement regulating ring, 39...
...stopper drive cylinder, 40...support part lifting spring, 41...compression spring, 42...link mechanism, A
...Elevating means for the elevating roof guide section 1, B...Interlocking means for the elevating block 30, C...Movable rail section 2
opening/closing means, D... means for vertically moving the stopper 3, E
... Interlocking means for the IC support section 6.
Claims (1)
段点、IC測定位置直上の下死点の3停止点間を
昇降し、下面にIC5のガイド溝29を有する昇
降屋根ガイド部1及び当該昇降屋根ガイド部1の
昇降手段Aと、上死点と中段点間をこの昇降屋根
ガイド部1と連動して昇降する昇降ブロツク30
及び当該昇降ブロツク30の連動手段Bと、この
昇降ブロツク30に設けられて中段点での下降停
止時と上昇開始時にそれぞれ開、閉され、昇降中
及び上死点では閉状態を保つてIC5を支え、開
状態ではIC5の支えを解放する一対の可動レー
ル部2及び当該可動レール部2の開閉手段Cと、
昇降屋根ガイド部1に上下動自在に設けられ、上
死点でのIC供給以前に下動しガイド溝29より
突出してIC5の停止位置を決定し、上死点での
IC排出時に上動しガイド溝29より没入してIC
5をフリーにするストツパ3及び当該ストツパ3
の上下動手段Dと、中段点と下死点間を昇降屋根
ガイド部1と連動して昇降しIC5の腹4を支持
する棒状のIC支持部6及び当該IC支持部6の連
動手段Eと、IC測定位置に設けられ下死点での
IC停止時にIC5のリード8が係合してIC5の電
気的特性を測定し、下死点よりのIC上昇により
IC5のリード8が離脱する測定用接点9を備え
たソケツト7とよりなるICハンドラの測定部。1. The elevating roof guide part 1 that moves up and down between three stopping points: the top dead center which is the IC supply/discharge position, the midway point, and the bottom dead center directly above the IC measurement position, and has an IC5 guide groove 29 on the lower surface, and the corresponding elevating roof guide part 1. The lifting means A of the lifting roof guide part 1 and the lifting block 30 that moves up and down between the top dead center and the middle point in conjunction with the lifting roof guide part 1.
Interlocking means B of the lifting block 30, which is provided in the lifting block 30, opens and closes when stopping the descent at the middle point and when starting the ascent, respectively, and keeps the IC5 in the closed state during the ascent and descent and at the top dead center. A pair of movable rail parts 2 that support and release the support of the IC 5 in the open state, and an opening/closing means C for the movable rail parts 2;
It is provided in the elevating roof guide part 1 so as to be able to move up and down, and moves downward and protrudes from the guide groove 29 to determine the stopping position of the IC 5 before supplying the IC at the top dead center.
When the IC is ejected, the IC moves upward and retracts from the guide groove 29.
Stopper 3 that makes 5 free and the stopper 3
A vertical movement means D, a rod-shaped IC support part 6 that moves up and down in conjunction with the elevating roof guide part 1 between the middle point and the bottom dead center and supports the belly 4 of the IC 5, and an interlocking means E of the IC support part 6. , installed at the IC measurement position and at bottom dead center
When the IC stops, lead 8 of IC5 engages to measure the electrical characteristics of IC5, and when the IC rises from the bottom dead center,
A measuring section of an IC handler consisting of a socket 7 equipped with a measuring contact 9 from which a lead 8 of an IC 5 is detached.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60142065A JPS622172A (en) | 1985-06-28 | 1985-06-28 | IC handler measurement section |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60142065A JPS622172A (en) | 1985-06-28 | 1985-06-28 | IC handler measurement section |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS622172A JPS622172A (en) | 1987-01-08 |
| JPH0569189B2 true JPH0569189B2 (en) | 1993-09-30 |
Family
ID=15306613
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60142065A Granted JPS622172A (en) | 1985-06-28 | 1985-06-28 | IC handler measurement section |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS622172A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0246157U (en) * | 1988-09-22 | 1990-03-29 | ||
| JP2552184Y2 (en) * | 1990-02-13 | 1997-10-27 | 株式会社アドバンテスト | Contactor for laser diode socket |
| JP2550120Y2 (en) * | 1990-02-19 | 1997-10-08 | 株式会社アドバンテスト | IC connection device for IC testing |
| JPH08220189A (en) * | 1995-02-14 | 1996-08-30 | Advantest Corp | Contact structure of handler for IC test equipment |
-
1985
- 1985-06-28 JP JP60142065A patent/JPS622172A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS622172A (en) | 1987-01-08 |
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