JPH0577243B2 - - Google Patents
Info
- Publication number
- JPH0577243B2 JPH0577243B2 JP62024985A JP2498587A JPH0577243B2 JP H0577243 B2 JPH0577243 B2 JP H0577243B2 JP 62024985 A JP62024985 A JP 62024985A JP 2498587 A JP2498587 A JP 2498587A JP H0577243 B2 JPH0577243 B2 JP H0577243B2
- Authority
- JP
- Japan
- Prior art keywords
- width
- value
- differential coefficient
- circuit
- convex
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M17/00—Testing of vehicles
- G01M17/007—Wheeled or endless-tracked vehicles
- G01M17/02—Tyres
- G01M17/027—Tyres using light, e.g. infrared, ultraviolet or holographic techniques
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Description
【発明の詳細な説明】
(産業上の利用分野)
この発明は、タイヤ側壁の凹凸検査装置に関す
るものであり、自動車用空気入りタイヤのカーカ
スを構成するタイヤコードの接合部の重なりに過
不足が生じたりすることによつてタイヤ側壁に生
じる微小な凹凸を検出し、その程度によつて合否
を判定するために利用される。[Detailed Description of the Invention] (Industrial Application Field) This invention relates to a tire sidewall unevenness inspection device, which detects excess or deficiency in the overlapping of the joints of tire cords constituting the carcass of a pneumatic automobile tire. It is used to detect minute irregularities that occur on the tire sidewall due to unevenness, and to determine pass/fail based on the degree of the irregularities.
(従来の技術)
タイヤ側壁の凹凸検出装置として、特開昭56−
122931号公報に、内圧のかけられたタイヤのサイ
ドウオール部の表面に静電容量型センサを非接触
的に近接して設け、上記タイヤをその回転軸の回
りに回転し静電容量型センサとサイドウオール部
表面との相対的距離の変動に応じた検出信号を発
信し、この検出信号をA/D変換器でデジタル化
し、検出信号が所定の時間内に一定値以上の立上
り変化および一定値以上の立下り変化をした場合
にこれを異常と判断するようにしたものが開示さ
れている。(Prior art) As a device for detecting irregularities on tire sidewalls,
No. 122931 discloses that a capacitive sensor is provided close to the sidewall surface of a tire under internal pressure in a non-contact manner, and the tire is rotated around its axis of rotation to form a capacitive sensor. A detection signal corresponding to a change in the relative distance to the sidewall surface is transmitted, this detection signal is digitized by an A/D converter, and the detection signal is detected to have a rise change of more than a certain value or a constant value within a predetermined time. A device has been disclosed in which, when the above-mentioned falling change occurs, this is determined to be abnormal.
また、特開昭58−200140号公報には、上記の静
電容量型センサの代りに光学式非接触変位検出器
を設けてタイヤ側壁の凹凸に対応する電圧信号を
発信し、これをデジタル化し、上記電圧信号中の
微小凹凸に対応する範囲の波長域をあらかじめ設
定されている短時間だけ遅延させ、原信号と遅延
信号との差をあらかじめ設定されている許容値と
比較することにより、タイヤ側壁の長い周期の凹
凸の影響を消去し、短周期の凹凸のみを正確に検
出するようにしたものが開示されている。 Furthermore, in Japanese Patent Application Laid-Open No. 58-200140, an optical non-contact displacement detector is provided in place of the capacitive sensor described above, and a voltage signal corresponding to the unevenness of the tire sidewall is transmitted, and this is digitized. By delaying the wavelength range corresponding to minute irregularities in the voltage signal by a preset short time and comparing the difference between the original signal and the delayed signal with a preset tolerance value, the tire A device has been disclosed in which the influence of long period irregularities on the side wall is eliminated and only short period irregularities are accurately detected.
(発明が解決しようとする問題点)
特開昭56−122931号公報に開示された装置は、
静電容量型センサを使用するものであるから、タ
イヤ側壁配置されている文字の凸成分に欠陥の凹
成分が重なると、これらが平均化され、そのため
上記の凹成分が欠陥として検出されないという問
題があつた。また、特定の傾斜角度の立上りから
立下りまでの時間軸の長さが所定の範囲内のもの
を欠陥とするので、例えば凸部の頂部が平坦であ
るために欠陥にする必要がない場合にも、これが
欠陥として判断されたり、上記所定の範囲からは
み出る程度に大きい広がりの凸部や単なる段差が
欠陥にならなかつたりするという問題があつた。(Problems to be solved by the invention) The device disclosed in Japanese Patent Application Laid-Open No. 122931/1983 is
Because it uses a capacitive sensor, if the concave component of a defect overlaps with the convex component of the letters placed on the tire sidewall, they are averaged out, and the problem is that the concave component is not detected as a defect. It was hot. Also, since the length of the time axis from the rise to the fall of a specific inclination angle is within a predetermined range, it is considered a defect, so for example, if the top of a convex part is flat and there is no need to make it a defect, However, there have been problems in that this may be determined as a defect, or a convex portion that is large enough to extend beyond the above-mentioned predetermined range or a simple step may not be considered a defect.
また、特開昭58−200140号公報に開示された装
置は、欠陥部分の幅(時間軸の長さ)が必ずしも
一定でないにもかかわらず、遅延時間が設定によ
り常に一定になるので、欠陥部分とノイズとの差
が小さくなり、欠陥でないものを欠陥と誤つて判
定するという問題があつた。また、複数個の凸部
または凹部が存在する場合、個々の凸部または凹
部はそれ程大きくなくても、ある程度集中的に存
在する場合は外観が不良になるが、従来はこれを
欠陥として検出することができなかつた。 Furthermore, in the device disclosed in Japanese Patent Application Laid-open No. 58-200140, although the width (length of time axis) of the defective part is not necessarily constant, the delay time is always constant depending on the setting. There was a problem in that the difference between the defect and the noise became small, causing non-defects to be mistakenly determined to be defects. Additionally, when multiple protrusions or depressions exist, even if the individual protrusions or depressions are not very large, if they are concentrated to some extent, the appearance becomes poor, but conventionally, this is detected as a defect. I couldn't do it.
この発明は、光学式変位検出器を用いることに
より、人間の目視による判断に近い検出を可能に
し、仮りに前後の傾斜が急角度であつても頂部が
平坦な凸部や底部が平坦な凹部は、これを欠陥と
判定せず、所定の切返し幅内にある凸部の高さお
よび間隔の深さ並びにその欠陥を欠陥判断の要素
にしたものである。 By using an optical displacement detector, this invention enables detection similar to human visual judgment, and even if the front and rear slopes are steep, it is possible to detect convex parts with flat tops and recesses with flat bottoms. In this method, this is not determined as a defect, but the height of the convex portion within a predetermined cut width, the depth of the interval, and the defect are used as elements for determining the defect.
(問題点を解決するための手段)
第1図において、1は所定圧力の空気が充填さ
れたタイヤであり、このタイヤ1は、タイヤ回転
装置(図示されていない)によつてタイヤ中心軸
の回りにに回転されるようになつている。このタ
イヤ1の上方および下方に、タイヤ1の側壁に光
線を投射し、反射光を受光して側壁からの距離を
連続的に検出し、電圧の強弱に変換する光学式変
位検出器2を設ける。上記の光学式変位検出器
2,2の出力側に切換手段3を介して上記光学式
変位検出器の出力信号をデジタル化するA/D変
換器4を比較し、このA/D変換器4の出力側に
その出力信号を微分し、得られた微係数が正の微
係数設定値以上の部分、負の微係数設定値以下の
部分およびこれらの中間部分に3区分するための
微分比較回路5と、上記正の微係数設定値以上の
部分と負の微係数設定値以下の部分との間に挟ま
れた中間部分の時間軸長すなわち切返し幅をあら
かじめ設定されている切返し幅設定値と比較して
上記切返し幅が切返し幅設定値以下の凸部および
凹部をそれぞれ取出すための凸部用識別回路6A
および凹部用識別回路6Bと、上記の切返し幅が
設定値以下の凸部および凹部についてそれぞれの
ピーク部分の時間軸座標を算出し、この時間軸座
標を中心としてその前後に設けた所定の判定幅を
超えない範囲で正の微係数設定値以上の部分の開
始時から負の微係数設定値以下の部分の終了時ま
でを凸部の幅とする凸部用ゲート設定回路7Aお
よび上記の判定幅を超えない範囲で負の微係数設
定値以下の部分の開始時から正の微係数設定値以
上の部分の終了時までを凹部の幅とする凹部用ゲ
ート設定回路7Bと、上記A/D変換器4の出力
から上記判定幅内の変位信号を取出し、凸部およ
び凹部のそれぞれの前後両端からそのピーク部分
までの高さを平均し、この平均値が許容値を超え
る複数個の凸部または凹部の時間軸方向間隔が限
界値以内の場合にこれを欠陥と判定する凸部間隔
判定回路8Aおよび凹部間隔判定回路8Bとを順
に接続する。(Means for solving the problem) In FIG. 1, 1 is a tire filled with air at a predetermined pressure. It is designed to rotate around. Above and below this tire 1, an optical displacement detector 2 is provided which projects a light beam onto the side wall of the tire 1, receives the reflected light, continuously detects the distance from the side wall, and converts it into a voltage strength. . An A/D converter 4 for digitizing the output signal of the optical displacement detector is connected to the output side of the optical displacement detectors 2, 2 via a switching means 3. A differential comparison circuit that differentiates the output signal on the output side of the circuit and divides the obtained differential coefficient into three parts: a part above the positive differential coefficient set value, a part below the negative differential coefficient set value, and a part in between. 5, and the time axis length of the intermediate portion sandwiched between the part above the positive differential coefficient setting value and the part below the negative differential coefficient setting value, that is, the turning width, is set to the preset turning width setting value. Convex portion identification circuit 6A for comparing and extracting convex portions and concave portions having the above-mentioned reversing widths equal to or less than the reversing width setting value.
and recess identification circuit 6B, calculates the time-axis coordinates of the respective peak portions of the convex portions and recesses whose turning width is less than the set value, and determines a predetermined judgment width set before and after the time-axis coordinates as the center. The gate setting circuit 7A for the convex portion has the width of the convex portion defined as the width of the convex portion from the start of the portion equal to or higher than the positive differential coefficient setting value to the end of the portion equal to or less than the negative differential coefficient set value within a range not exceeding , and the above judgment width a recess gate setting circuit 7B whose width is defined as the width of the recess from the start of the part below the negative differential coefficient setting value to the end of the part above the positive differential coefficient setting value within a range not exceeding , and the A/D conversion described above. The displacement signal within the above determination range is extracted from the output of the device 4, and the heights from both the front and rear ends of each of the convex portions and concave portions to the peak portion are averaged, and the heights of multiple convex portions or A convex part interval determination circuit 8A and a concave part interval determination circuit 8B, which determine a defective part when the interval in the time axis direction of the concave parts is within a limit value, are connected in this order.
(作用)
タイヤ1の上面または下面の凹凸が光学式変位
検出器2からの距離の相違として検出され、これ
が電圧信号(第3図参照)としてA/D変換器4
に送られ、所定の微小時間間隔でデジタル化さ
れ、このデジタル化された検出信号が微分比較路
5に入力され、微分され(第4図参照)、その微
係数があらかじめ設定されている正の微係数設定
値以上の部分、負の微係数設定値以下の部分およ
びこれらの中間の部分に3区分される。例えば、
正の微係数設定値以上の部分の負、微係数設定値
以下の部分、および中間部分に対応してそれぞれ
+1、−1および0の3値が与えられ、上記の微
分出力が三値化される(第5図参照)。(Function) Irregularities on the upper or lower surface of the tire 1 are detected as a difference in distance from the optical displacement detector 2, and this is sent to the A/D converter 4 as a voltage signal (see FIG. 3).
This digitized detection signal is input to the differential comparison path 5 and differentiated (see Figure 4), and its differential coefficient is a preset positive value. It is divided into three parts: a part above the differential coefficient set value, a part below the negative differential coefficient set value, and a part between these. for example,
Three values, +1, -1, and 0, are given to the negative part above the positive differential coefficient setting value, the part below the differential coefficient setting value, and the intermediate part, respectively, and the above differential output is ternarized. (See Figure 5).
上記微分比較回路5から出力される三値化信号
が+1から0を経て−1に変る部分は、凸部を示
すと共に、その凸部の両側の斜面が微係数設定値
で定まる所定の傾斜角度以上の急角度に傾斜して
いることを示し、上記三値化信号が−1から0を
経て+1に変る部分は、反対の凹部を示す。すな
わち、タイヤ1の側壁の多数の凸部と凹部の中で
両側の傾斜面が特に急角度の凸部と凹部が上記の
微分比較路5によつて取出される。 The portion where the ternary signal outputted from the differential comparison circuit 5 changes from +1 to 0 to -1 indicates a convex portion, and the slopes on both sides of the convex portion have a predetermined inclination angle determined by the differential coefficient setting value. The part where the ternary signal changes from -1 to +1 through 0 indicates the opposite concave part. That is, among the many protrusions and recesses on the side wall of the tire 1, the protrusions and recesses whose slopes on both sides are particularly steep are extracted by the differential comparison path 5.
この微分比較回路5の出力信号中、正の微係数
設定値以上の部分から負の微係数設定値以下の部
分に変る途中の中間部分は、凸部を示す三値化信
号の0値の部分を示し、この0値の部分の時間軸
の長さt1、t2は、凸部の傾斜角度が所定限度を超
えた位置よりも上方部分の幅(タイヤ回転方向に
沿つて測定した長さ)、すなわち切返し幅を表わ
しており、この切返し部が凸部用識別回路6Aに
おいて切返し幅設定値と比較され、設定値以下の
もののみが取出される。すなわち、両側の傾斜面
が急角度の凸部中、切返し幅の狭いもの、換言す
れば頂部の狭く鋭い凸部のみが取出され、両側の
傾斜面が急であつても頂部が広く平坦なものは除
かれる。同様にして、凸部用識別回路6Bにおい
ては、凹部の両側の傾斜面が急角度であり、しか
も切返し幅が狭く底部の鋭い凹部のみが取出され
る。 In the output signal of the differential comparison circuit 5, the intermediate portion where the portion changes from the portion above the positive differential coefficient setting value to the portion below the negative differential coefficient setting value is a 0-value portion of the ternary signal indicating a convex portion. The lengths of the time axis t 1 and t 2 of this 0-value portion are the width of the portion above the position where the inclination angle of the convex portion exceeds a predetermined limit (the length measured along the tire rotation direction). ), that is, it represents the turning width, and this turning portion is compared with the turning width setting value in the convex portion identification circuit 6A, and only those whose turning width is less than the setting value are taken out. In other words, in a convex part with steep slopes on both sides, the turning width is narrow, in other words, only the narrow and sharp convex part at the top is taken out, and even if the slopes on both sides are steep, the top is wide and flat. is excluded. Similarly, in the convex part identification circuit 6B, only the concave part with steep slopes on both sides of the concave part and a narrow turning width and a sharp bottom is extracted.
凸部用ゲート設定回路7Aでは、凸部用識別回
路の出力信号の凸部の切返し幅と、A/D変換器
4の出力信号とから凸部のピーク位置の時間軸座
標が求められ、更にピーク位置の前後に所定の設
定幅(第6図のM参照)が設けられ、この判定幅
を超えない範囲で三値化信号の0から1への立上
り点と−1から0への立上り点相互間の時間軸上
の間隔lをもつゲート信号が出力される(第7図
参照)この場合、A/D変換器4の出力信号中、
上記切返し幅設定値の内側に含まれる信号の個
数、すなわちサンプル数は極めて少ないので、
A/D変換器4の出力信号(変位信号)の比較に
よるピーク位置の算出は極めて容易に、短時間に
行なわれる。凹部用ゲート設定回路7Bにおいて
も、同様にピークの存在する時間軸座標を中心と
して前後に設けた判定幅を超えない範囲で三値化
信号の0から−1への立上り点と1から0への立
上り点相互間の時間軸上の間隔lをもつゲート信
号が出力される。 In the convex part gate setting circuit 7A, the time axis coordinate of the peak position of the convex part is determined from the convex part switching width of the output signal of the convex part identification circuit and the output signal of the A/D converter 4, and further A predetermined setting width (see M in Figure 6) is provided before and after the peak position, and the rising point from 0 to 1 and the rising point from -1 to 0 of the ternary signal is determined within a range that does not exceed this judgment width. Gate signals with an interval l on the time axis are output (see FIG. 7). In this case, in the output signal of the A/D converter 4,
Since the number of signals included within the above switching width setting value, that is, the number of samples, is extremely small,
Calculating the peak position by comparing the output signals (displacement signals) of the A/D converter 4 can be performed very easily and in a short time. Similarly, in the concave gate setting circuit 7B, the rising point of the ternary signal from 0 to -1 and the transition from 1 to 0 within a range that does not exceed the judgment width set before and after the time axis coordinate where the peak exists. A gate signal having an interval l on the time axis between the rising points of is output.
次いで、凸部間隔判定回路8Aでは、上記判定
幅l内の凸波形が抽出され(第8図参照)、その
前端からピークまでの高さおよび後端からピーク
までの高さがそれぞれ算出され、その平均値が求
められ、この平均値が許容値と比較とれ、更に許
容値を超える凸部相互の間隔が限界値と比較され
て合否が判定される。凹部間隔判定回路8Bで
は、同様にして凹部の深さが前後の平均値で算出
され、この平均値が許容値と比較され、許容値を
超える凹部相互の間隔が限界値と比較されて合否
を判定される。 Next, the convex interval determination circuit 8A extracts the convex waveform within the determination width l (see FIG. 8), and calculates the height from the front end to the peak and the height from the rear end to the peak, respectively. The average value is determined, this average value is compared with a tolerance value, and furthermore, the distance between the convex portions exceeding the tolerance value is compared with a limit value to determine pass/fail. In the recess interval determination circuit 8B, the depth of the recess is similarly calculated by the average value before and after, this average value is compared with the tolerance value, and the interval between the recesses exceeding the tolerance value is compared with the limit value to determine pass/fail. It will be judged.
(実施例)
第2図において、2は前記の光学式変位検出
器、4はA/D変換器であり、タイヤ1周分に対
する光学式変位検出器2の出力、すなわちセンサ
出力Vの一例が第3図に示される。なお、第3図
において横軸にはデジタル化によるサンプル番号
をとり、「512」はタイヤの1周目を表わす。(Example) In FIG. 2, 2 is the above-mentioned optical displacement detector, 4 is an A/D converter, and the output of the optical displacement detector 2 for one rotation of the tire, that is, an example of the sensor output V is It is shown in FIG. In addition, in FIG. 3, the horizontal axis shows the sample number obtained by digitization, and "512" represents the first rotation of the tire.
A/D変換器4の出力は、微分回路51で微分
され、第4図のグラフで示される微係数が出力さ
れ、この微係数が比較回路52において微係数設
定値Dと比較され、第5図に示すように三値化さ
れる。例えば、タイヤ1の回転方向の長さ3mmに
対して0.05mm以上の凸部および凹部があるとき、
それぞれ+1および−1を与え、0.05mm(勾配
0.05/3)未満の凹凸に対して0を与える。な
お、微分回路51および比較回路52によつて第
1図の微分比較回路5が形成される。 The output of the A/D converter 4 is differentiated by a differentiation circuit 51 to output a differential coefficient shown in the graph of FIG. The image is ternarized as shown in the figure. For example, when there are convex portions and concave portions of 0.05 mm or more for a length of 3 mm in the rotational direction of the tire 1,
+1 and -1 respectively, 0.05mm (slope
0 is given to irregularities less than 0.05/3). The differential comparison circuit 5 of FIG. 1 is formed by the differential circuit 51 and the comparison circuit 52.
上記三値化信号の+1から−1に変る途中の0
信号が凸部用識別回路6Aに送られ、0信号の横
軸上長さ、すなわち切返し幅t1、t2等が切返し幅
設定値Tと比較され、切返し幅設定値T(例えば、
長さ10mm、サンプル数3個)未満のものt2が出力
される。同様に、三値化信号の−1から+1に変
る途中の0信号が凹部用識別回路6Bに送られ、
その切返し幅が設定値未満のものが出力される。 0 in the middle of changing from +1 to -1 in the above ternary signal
The signal is sent to the convex portion identification circuit 6A, and the length on the horizontal axis of the 0 signal, that is, the width of the turn t 1 , t 2 , etc., is compared with the width of the width set T 1 , t 2 , etc.
(10 mm in length, 3 samples) t 2 is output. Similarly, the 0 signal in the middle of changing from -1 to +1 of the ternary signal is sent to the recess identification circuit 6B,
Those whose cutback width is less than the set value are output.
凸部用ピーク検出回路71Aには、A/D変換
器4の出力および凸部用識別回路6Aの出力の双
方が入力され、切返し幅t1内に含まれるA/D変
換器4の出力を比較し、最大値すなわちピーク値
を算出し、その横座標(時間軸座標)、すなわち
サンプル信号を探し出す。第6図は、第5図の一
部の拡大図であり、上記ピーク値の横座標がPで
示される。なお、第6図において、Bは凸部の幅
を示す。次いで、ゲート回路72Aにおいて、ピ
ーク値の横座標Pの前後に等しい幅(例えば、10
〜25mm)の判定幅Mを設定し、判定幅Mを超える
幅に制限をかけて第7図のゲート信号0が作成さ
れる。同様にして、凸部用ピーク検出回路71A
および凹部用ゲート回路72Bによつて、ゲート
信号が作成される。なお、凸部用のピーク検出回
路71Aおよびゲート回路72Aが第1図のゲー
ト設定回路7Aを構成し、凹部用のピーク検出回
路71Bおよびゲート回路72Bが第1図のゲー
ト設定回路7Bを構成する。 Both the output of the A/D converter 4 and the output of the protrusion identification circuit 6A are input to the convex portion peak detection circuit 71A, and the output of the A/D converter 4 included within the switching width t1 is inputted to the convex portion peak detection circuit 71A. The maximum value, ie, the peak value, is calculated by comparison, and its abscissa (time axis coordinate), ie, the sample signal, is found. FIG. 6 is an enlarged view of a portion of FIG. 5, and the abscissa of the peak value is indicated by P. In addition, in FIG. 6, B indicates the width of the convex portion. Next, in the gate circuit 72A, equal widths (for example, 10
The gate signal 0 shown in FIG. 7 is created by setting a determination width M of 25 mm) and limiting the width exceeding the determination width M. Similarly, peak detection circuit 71A for convex portion
A gate signal is generated by the recess gate circuit 72B. Note that the peak detection circuit 71A and gate circuit 72A for convex portions constitute the gate setting circuit 7A in FIG. 1, and the peak detection circuit 71B and gate circuit 72B for concave portions constitute the gate setting circuit 7B in FIG. .
凸部ピツクアツプ回路81Aは、A/D変換器
4が出力する変位信号(第3図参照)と凸部用ゲ
ート回路72Aが出力するゲート信号(第7図参
照)と合成し、例えば第3図にNで示される凸波
形を取り出す。その拡大図が第8図に示される。
次いで、高さ演算回路82Aにおいて、上記凸波
形Nの前端からの高さaおよび後端からの高さb
の平均値((a+b))/2)が算出される。そし
て、第1凸部判定回路83Aにおいて第1凸部許
容値Ha(例えば0.3mm)と比較され、この第1凸
部許容値Haを超える凸部のうち隣接する2個の
時間軸方向間隔が間隔判定回路84において間隔
限界値L(例えば90度)と順に比較され、この間
隔限界値L以下の場合に欠陥と判定される。同様
にして、凹部ピツクアツプ回路81B、凹部用高
さ演算回路82Bおよび凹部用第1凹部判定回路
83B、第1凹部許容値Hbによつて第1凹部許
容値Hbを超える凹部が取り出され、更にその間
隔が上記の間隔判定回路84において限界値Lと
比較される。 The convex part pickup circuit 81A synthesizes the displacement signal outputted by the A/D converter 4 (see FIG. 3) and the gate signal outputted by the convex part gate circuit 72A (see FIG. 7), for example, as shown in FIG. A convex waveform indicated by N is extracted. An enlarged view is shown in FIG.
Next, in the height calculation circuit 82A, the height a from the front end and the height b from the rear end of the convex waveform N are calculated.
The average value ((a+b))/2) is calculated. Then, in the first convex portion determination circuit 83A, it is compared with a first convex allowable value Ha (for example, 0.3 mm), and the interval in the time axis direction of two adjacent convex portions that exceed this first convex allowable value Ha is determined. In the interval determination circuit 84, the distance is sequentially compared with a distance limit value L (for example, 90 degrees), and if the distance is less than or equal to the distance limit value L, it is determined to be defective. Similarly, a recess that exceeds the first recess allowance Hb is extracted by the recess pickup circuit 81B, the recess height calculation circuit 82B, the first recess determination circuit 83B, and the first recess allowance Hb. The interval is compared with the limit value L in the interval determining circuit 84 described above.
一方、高さ演算回路82Aによる平均値の演算
は、タイヤ1の1周分について行なわれ、その全
数の平均値が比較され、その最大値が第2凸部判
定回路85Aにおいて上記第1凸部許容値Haよ
りも大きい第2凸部許容値Hc(例えば0.5mm)と
比較され、上記の最大値が第2凸部許容値Hcを
超えた場合に欠陥と判定される。同様にして、凹
部ピツクアツプ回路81B、凹部用高さ演算回路
82Bおよび第2凹部判定回路85Bによつて凹
部の最大値が決定され、第2凹部許容値Hdと比
較される。なお、凸部用のピツクアツプ回路81
A、演算回路82A、第1凸部判定回路83Aお
よび間隔判定回路84が第1図の凸部間隔判定回
路8Aを構成し、凹部用のピツクアツプ回路81
B、演算回路82B、第1凹部判定回路83Bお
よび間隔判定回路84が第1図の凹部間隔判定回
路8Bを構成する。 On the other hand, the calculation of the average value by the height calculation circuit 82A is performed for one rotation of the tire 1, the average values of all the numbers are compared, and the maximum value is determined by the second convex portion determination circuit 85A. It is compared with a second convex allowable value Hc (for example, 0.5 mm) which is larger than the allowable value Ha, and if the maximum value exceeds the second convex allowable value Hc, it is determined to be a defect. Similarly, the maximum value of the recess is determined by the recess pickup circuit 81B, the recess height calculation circuit 82B, and the second recess determination circuit 85B, and is compared with the second recess allowable value Hd. In addition, the pick-up circuit 81 for the convex portion
A, the arithmetic circuit 82A, the first convex part determination circuit 83A, and the interval determination circuit 84 constitute the convex part interval determination circuit 8A in FIG. 1, and the concave part pickup circuit 81
B, the arithmetic circuit 82B, the first recess determination circuit 83B, and the interval determination circuit 84 constitute the recess interval determination circuit 8B in FIG.
この実施例では、段差ピツクアツプ回路91、
比較回路92、高さ演算回路93および段差判定
回路94によつて段差識別回路9が構成される。
例えば、第9図に示される段差信号が、A/D変
換器4から段差ピツクアツプ回路91に入力され
る一方、第10図に示される微分信号が微分回路
51から比較回路92に入力され、段差微分設定
値S(例えば、勾配が25/1000)と比較され、第1
1図に示すように段差微分設定値S以上の微係数
部分とS未満の部分とに二値化され、この二値化
信号が上記のピツクアツプ回路91に入力され、
第9図の段差信号と合成され、第12図に示すよ
うに、上記の段差微分設定値Sで定まる傾斜角度
以上の傾斜角度部分Wの範囲の波形が取り出さ
れ、その高さHが高さ演算回路93で算出され、
この高さHが段差判定回路94において段差許容
値H0(例えば0.8mm)と比較され、これを超える
場合に第13図の段差判定信号が出力される。 In this embodiment, a step pickup circuit 91,
The comparison circuit 92, the height calculation circuit 93, and the level difference determination circuit 94 constitute the level difference identification circuit 9.
For example, the step signal shown in FIG. 9 is input from the A/D converter 4 to the step pickup circuit 91, while the differential signal shown in FIG. It is compared with the differential set value S (for example, the slope is 25/1000) and the first
As shown in FIG. 1, the differential coefficient part is binarized into a differential coefficient part greater than or equal to the step differential set value S and a part less than S, and this binarized signal is input to the above-mentioned pickup circuit 91.
The waveform is synthesized with the step signal shown in FIG. 9, and as shown in FIG. Calculated by the arithmetic circuit 93,
This height H is compared with a level difference allowable value H 0 (for example, 0.8 mm) in a level difference determination circuit 94, and if it exceeds this, a level difference determination signal shown in FIG. 13 is output.
すなわち、この実施例は、第2凸部判定回路8
5Aおよび第2凹部判定回路85Bを備えている
ので、高さもしくは深さが許容値以上の凸部や凹
部が1個でも存在すると不合格として検出できる
と共に、段差識別回路9を備えているので、立上
り部または立下り部の一方のみが存在していて
も、設定値以上の勾配の部分が設定高さ以上に及
ぶ場合にこれを欠陥段差として検出することがで
きる。 That is, in this embodiment, the second convex portion determination circuit 8
5A and a second recess determination circuit 85B, the presence of even one protrusion or recess with a height or depth exceeding the allowable value can be detected as a failure. Even if only one of the rising portion and the falling portion is present, if a portion with a gradient greater than or equal to the set value extends beyond the set height, this can be detected as a defective step.
(発明の効果)
この発明は、光学式変位検出器を用いるので光
線を細くしスポツトを小さくすることによつて小
面積の凹凸を個別に捕え、その大きさを検出する
ことができる。また、所定長さの時間軸(切返し
幅)内に所定角度以上の立上り部と立下り部の双
方が存在する場合に、これを捕捉するので、頂部
が平坦な凸部および底部が平坦な凹部を欠陥と判
定することがなく、目視に近い判断が得られる。
また、微係数が上下の限界値以内の部分について
のみA/D変換器の出力信号(変位信号)の大き
さを比較してピークを探すので、サンプル数が少
なく、ピークの位置を容易に探すことができる。
そして、このピークの位置を中心としてその前後
に判定幅を設定し、この判定幅を超えない範囲で
定まる欠陥の前後両端を基準にしてピークの高さ
を算出し、その平均値をもつて凸部または凹部の
高さとするので、再現性が向上し、正確な判定が
可能になり、しかも所定の大きさの凹凸部が所定
の間隔で密集した場合にこれを欠陥と判定するの
で、比較的軽度の凹凸であつても、その集中によ
る外観の低下を防止することができる。(Effects of the Invention) Since the present invention uses an optical displacement detector, by narrowing the light beam and making the spot small, small-area irregularities can be individually captured and their sizes can be detected. In addition, if both a rising part and a falling part of a predetermined angle or more exist within a predetermined length of time axis (turning width), this is captured, so a convex part with a flat top and a concave part with a flat bottom It is possible to obtain a judgment similar to that obtained by visual inspection, without determining it as a defect.
In addition, since the peak is searched by comparing the magnitude of the A/D converter output signal (displacement signal) only for the portion where the differential coefficient is within the upper and lower limit values, the number of samples is small and the peak position can be easily searched. be able to.
Then, a determination width is set before and after this peak position as the center, and the height of the peak is calculated based on both the front and rear ends of the defect, which are determined within a range that does not exceed this determination width. This improves reproducibility and enables accurate determination.Moreover, it is determined as a defect when uneven parts of a predetermined size are closely spaced at a predetermined interval, so it is relatively easy to use. Even if there are slight irregularities, deterioration in appearance due to their concentration can be prevented.
第1図はこの発明の実施例のブロツク図、第2
図は第1図の要部の詳細ブロツク図、第3図ない
し第13図は第2図の装置の要部における出力信
号のグラフである。
1:タイヤ、2:光学式変位検出器、4:A/
D変換器、5:微分比較回路、6A:凸部識別回
路、6B:凹部識別回路、7A:凸部用ゲート設
定回路、7B:凹部用ゲート設定回路、8A:凸
部間隔判定回路、8B:凹部間隔判定回路。
Fig. 1 is a block diagram of an embodiment of this invention;
1 is a detailed block diagram of the main part of the apparatus shown in FIG. 1, and FIGS. 3 to 13 are graphs of output signals in the main part of the apparatus shown in FIG. 1: Tire, 2: Optical displacement detector, 4: A/
D converter, 5: differential comparison circuit, 6A: convex part identification circuit, 6B: concave part identification circuit, 7A: convex part gate setting circuit, 7B: concave part gate setting circuit, 8A: convex part interval determination circuit, 8B: Recess interval determination circuit.
Claims (1)
中心軸の回りに一定の速度で回転させるタイヤ回
転装置と、上記タイヤの側壁に光線を投射し、そ
の反射光を受光して側壁からの距離を連続的に検
出し、電圧の強弱に変換する光学式変位検出器
と、この光学式変位検出器の出力信号と微小時間
間隔のデジタル信号に変換するA/D変換器と、
このA/D変換器の出力信号を微分し微係数が正
の微係数設定値以上の部分、負の微係数設定値以
下の部分およびこれらの中間部分に3区分する微
分比較回路と、上記正の微係数設定値以上の部分
および負の微係数設定値以下の部分の間に挟まれ
た中間部分の時間軸長すなわち切返し幅をあらか
じめ設定されている切返し幅設定値と比較して上
記切返し幅が切返し幅設定値以下の凸部および凹
部を取出す識別回路と、これらの切返し幅が設定
値以下の凸部および凹部についてそのピーク部分
の時間軸座標を算出し、この時間軸座標を中心と
してその前後に設けた所定の判定幅を超えない範
囲で正の微係数設定値以上の部分の開始時から負
の微係数設定値以下の部分の終了時までを凸部の
幅とする凸部用ゲート設定回路および上記の判定
幅を超えない範囲で負の微係数設定値以下の部分
の開始時から正の微係数設定値以上の部分の終了
時までを凹部の幅とする凹部用ゲート設定回路
と、上記A/D変換器の出力から上記判定幅内の
変位信号を取出し、凸部および凹部のそれぞれの
前後両端からそのピークまでの高さを平均し、こ
の平均値が許容値を超える複数個の凸部または凹
部の時間軸方向間隔が限界値以内の場合にこれを
欠陥と判定する凸部間隔判定回路および凹部間隔
判定回路とからなるタイヤ側壁の凹凸検査装置。1. A tire rotation device that rotates a tire filled with air at a predetermined pressure at a constant speed around the center axis of the tire, and a device that projects a light beam onto the side wall of the tire and receives the reflected light to calculate the distance from the side wall. an optical displacement detector that continuously detects and converts the voltage into strength and weakness; an A/D converter that converts the output signal of the optical displacement detector into a digital signal at minute time intervals;
A differential comparison circuit that differentiates the output signal of the A/D converter and divides the differential coefficient into three parts: a part whose differential coefficient is greater than or equal to the positive differential coefficient setting value, a part which is less than the negative differential coefficient set value, and an intermediate part between these; The time axis length of the intermediate portion sandwiched between the part above the differential coefficient setting value and the part below the negative differential coefficient setting value, that is, the turning width, is compared with the turning width setting value set in advance to determine the turning width. The identification circuit extracts the convex portions and concave portions whose reversing width is less than the set value, and calculates the time axis coordinates of the peak portions of the convex portions and concave portions whose reversing width is less than the preset value, and calculates the time axis coordinates of the peak portions with this time axis coordinate as the center. A gate for a convex part whose width is from the start of the part above the positive differential coefficient set value to the end of the part below the negative differential coefficient set value within a range not exceeding the predetermined judgment width provided before and after the convex part. A setting circuit and a gate setting circuit for a concave portion whose width is defined as the width of the concave portion from the start of the portion below the negative differential coefficient setting value to the end of the portion above the positive differential coefficient setting value within a range not exceeding the above judgment width. , extract the displacement signal within the judgment range from the output of the A/D converter, average the heights from both front and rear ends of each of the convex portions and concave portions to the peak, and determine the number of cases where this average value exceeds the allowable value. An apparatus for inspecting irregularities on a tire sidewall, comprising a protrusion interval determination circuit and a recess interval determination circuit for determining a defect when the interval in the time axis direction of convexities or concave parts is within a limit value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62024985A JPS63191947A (en) | 1987-02-05 | 1987-02-05 | Projection and recess inspecting device for tire side wall |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62024985A JPS63191947A (en) | 1987-02-05 | 1987-02-05 | Projection and recess inspecting device for tire side wall |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63191947A JPS63191947A (en) | 1988-08-09 |
| JPH0577243B2 true JPH0577243B2 (en) | 1993-10-26 |
Family
ID=12153273
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62024985A Granted JPS63191947A (en) | 1987-02-05 | 1987-02-05 | Projection and recess inspecting device for tire side wall |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63191947A (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0713564B2 (en) * | 1988-02-12 | 1995-02-15 | 住友ゴム工業株式会社 | Tire sidewall inspection equipment |
| DE10062251C2 (en) * | 2000-12-14 | 2002-12-12 | Fraunhofer Ges Forschung | Device and method for checking the quality of a body |
| DE10062254C2 (en) * | 2000-12-14 | 2002-12-19 | Fraunhofer Ges Forschung | Method and device for characterizing a surface and method and device for determining a shape anomaly of a surface |
| US8712720B2 (en) | 2008-12-19 | 2014-04-29 | Michelin Recherche at Technigue S.A. | Filtering method for improving the data quality of geometric tire measurements |
| WO2010071657A1 (en) * | 2008-12-19 | 2010-06-24 | Michelin Recherche Et Technique, S.A. | Filtering method to eliminate tread features in geometric tire measurements |
| WO2011159272A1 (en) | 2010-06-14 | 2011-12-22 | Michelin Recherche Et Technique, S.A. | Method for prediction and control of harmonic components of tire uniformity parameters |
-
1987
- 1987-02-05 JP JP62024985A patent/JPS63191947A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63191947A (en) | 1988-08-09 |
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