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JPH061763B2 - Resist developing device - Google Patents
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JPH061763B2 - Resist developing device - Google Patents

Resist developing device

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Publication number
JPH061763B2
JPH061763B2 JP61107875A JP10787586A JPH061763B2 JP H061763 B2 JPH061763 B2 JP H061763B2 JP 61107875 A JP61107875 A JP 61107875A JP 10787586 A JP10787586 A JP 10787586A JP H061763 B2 JPH061763 B2 JP H061763B2
Authority
JP
Japan
Prior art keywords
heat medium
constant temperature
developing
temperature
control means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP61107875A
Other languages
Japanese (ja)
Other versions
JPS62263635A (en
Inventor
恒男 藤井
俊孝 武居
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daikin Industries Ltd
Original Assignee
Daikin Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daikin Industries Ltd filed Critical Daikin Industries Ltd
Priority to JP61107875A priority Critical patent/JPH061763B2/en
Publication of JPS62263635A publication Critical patent/JPS62263635A/en
Publication of JPH061763B2 publication Critical patent/JPH061763B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はレジスト現像装置、詳しくは、半導体ウエハ、
半導体マスク、光ディスク等の被現像体に装着されたレ
ジスト層の現像を行なうレジスト現像装置に関する。
The present invention relates to a resist developing apparatus, more specifically, a semiconductor wafer,
The present invention relates to a resist developing device that develops a resist layer mounted on an object to be developed such as a semiconductor mask and an optical disk.

(従来の技術) 従来、この種のレジスト現像装置としては、例えば特開
昭57‐166032号公報に記載され、また第3図に
示すように、現像槽(1)内に収容した半導体ウエハ
(W)にノズル等の放出手段(2)から現像処理に供さ
れる薬液を放出することにより、前記ウエハ(W)にお
けるレジスト層の現像を行なうようにしている。
(Prior Art) Conventionally, a resist developing apparatus of this type is described in, for example, Japanese Patent Application Laid-Open No. 57-166032, and as shown in FIG. 3, a semiconductor wafer ( The resist layer on the wafer (W) is developed by discharging the chemical solution used for the developing process from the discharging means (2) such as a nozzle to W).

尚、一般に前記薬液は、レジスト層を溶解する所謂現像
液の他に、該現像液の放出に先立ち前記ウエハ(W)の
経時変化によるレジスト感度のバラツキを除去するため
の前処理液、及び前記現像液の放出後に前記ウエハ
(W)を洗浄する後処理液等から成るものである。
In addition to the so-called developing solution which dissolves the resist layer, generally, the chemical solution is a pretreatment solution for removing the variation in resist sensitivity due to the aging of the wafer (W) prior to the release of the developing solution, and It is composed of a post-treatment liquid for cleaning the wafer (W) after the developer is discharged.

また、最近のレジストパターンの高密度化に伴なってそ
の現像条件、特に前記薬液の温度に対する要求が重要な
ものとなっていることから、前記薬液のひとつである現
像液の内容(3)とその放出手段(2)との間に、温調
器(5)を設けると共に、該温調器(5)から前記放出
手段(2)に至る送液管(6)に電気ヒータ(H)を巻
き付けることにより、前記温調器(5)にて温度調整さ
れる現像液が、前記送液管(6)部分で放熱により温度
低下してしまうのを抑制して、前記放出手段(2)から
放出され前記ウエハ(W)に作用する現像液の温度を設
定値に限定できるようにしている。
Further, with the recent increase in the density of resist patterns, the requirements for the developing conditions, particularly the temperature of the chemical solution, have become important. Therefore, the content (3) of the developer solution, which is one of the chemical solutions, A temperature controller (5) is provided between the discharge means (2) and an electric heater (H) is installed in the liquid delivery pipe (6) from the temperature controller (5) to the discharge means (2). By winding the developer, the temperature of the developer whose temperature is adjusted by the temperature controller (5) is suppressed from decreasing due to heat dissipation in the liquid supply pipe (6), and the developer is discharged from the discharging means (2). The temperature of the developer discharged and acting on the wafer (W) can be limited to a set value.

ところが、前記電気ヒータ(H)による場合には、前記
送液管(6)を通る現像液の外気への放熱による温度低
下は抑制できても、外気からの吸熱による温度上昇は抑
制できず、従って、例えば外気温度が現像液の温度より
も高い場合には現像液の温度を設定値に制御できないと
いう致命的な問題があった。
However, in the case of using the electric heater (H), even if the temperature decrease due to the heat radiation of the developer passing through the liquid supply pipe (6) to the outside air can be suppressed, the temperature rise due to the heat absorption from the outside air cannot be suppressed, Therefore, for example, when the outside air temperature is higher than the temperature of the developing solution, there is a fatal problem that the temperature of the developing solution cannot be controlled to a set value.

一方、この問題を解決するために、第4図に示すよう
に、送液管(6)に二重管(40)を用いて、該二重管
(40)の内管(41)に温調器(5)からの薬液のひ
とつである現像液を、また、外管(42)に温度調整さ
れた恒温水をそれぞれ通すことにより、現像液の温度が
外気に対し高い場合でも低い場合でも常に任意の設定温
度に制御することが考えられる。
On the other hand, in order to solve this problem, as shown in FIG. 4, a double pipe (40) is used as the liquid feeding pipe (6), and the inner pipe (41) of the double pipe (40) is heated. Regardless of whether the temperature of the developing solution is high or low with respect to the outside air, by passing the developing solution which is one of the chemical solutions from the controller (5) and passing the temperature-controlled constant temperature water through the outer tube (42), respectively. It is conceivable to always control the temperature to an arbitrary set temperature.

尚、送液管(6)の前記二重管(40)の出口からノズ
ル等の放出手段(2)に接続される部分、すなわち放出
手段(2)の近くには、現像液をろ過するためのストレ
ーナ(62)と現像液の出停を制御するための制御弁
(61)とを介装している。
In order to filter the developing solution, a portion of the liquid supply pipe (6) connected to the discharge means (2) such as a nozzle from the outlet of the double pipe (40), that is, near the discharge means (2). A strainer (62) and a control valve (61) for controlling the start / stop of the developing solution are interposed.

(発明が解決しようとする問題点) 第4図の例によると、前記二重管(40)の部分では外
気の影響を排して現像処理に供される薬液のひとつであ
る現像液の温度を任意の設定値に保持できるけれども、
前記二重管(40)の出口と前記現像槽(1)とを接続
する、ストレーナ(62)、制御弁(61)及び放出手
段(2)等の制御手段(A)(送液管(6)も含む)で
外気の影響を受けることゝなり、前記放出手段(2)か
ら放出されウエハ(W)に作用する現像液の温度を高精
度に設定値に制御できない問題があった。
(Problems to be Solved by the Invention) According to the example shown in FIG. 4, the temperature of the developing solution, which is one of the chemical solutions used for the developing process by eliminating the influence of the outside air in the portion of the double pipe (40). Can be held at any set value,
A control means (A) such as a strainer (62), a control valve (61), and a discharging means (2) for connecting the outlet of the double pipe (40) and the developing tank (1) (the liquid feeding pipe (6 However, there is a problem that the temperature of the developing solution discharged from the discharging means (2) and acting on the wafer (W) cannot be controlled to a set value with high accuracy.

即ち、前記放出手段(2)等の制御手段(A)は熱容量
が大きく、しかも現像液は現像槽(1)に対し間欠的に
供給されるため、現像液の供給が停止されている間に前
記制御手段(A)が周囲の空気(外気)と熱交換し、外
気に近い温度になってしまう。
That is, since the control means (A) such as the discharging means (2) has a large heat capacity and the developer is intermittently supplied to the developing tank (1), while the supply of the developer is stopped, The control means (A) exchanges heat with the surrounding air (outside air), and the temperature becomes close to the outside air.

このため、次のステップで現像液を現像槽(1)に対し
て供給しようとすると、温調器(5)等で温調された現
像液は前記制御手段(A)の熱影響を顕著に受けて、設
定値とは異なる温度に変動してしまうという問題があっ
た。
Therefore, when it is attempted to supply the developing solution to the developing tank (1) in the next step, the developing solution temperature-controlled by the temperature controller (5) or the like causes the thermal influence of the control means (A) to be remarkable. However, there is a problem that the temperature fluctuates to a temperature different from the set value.

本発明の目的は、上記問題点を解決し、制御手段から供
給される現像液等の現像処理に供される薬液の温度を任
意の設定温度に高精度に制御できるようにしたレジスト
現像装置を提供する点にある。
An object of the present invention is to solve the above problems and to provide a resist developing apparatus capable of highly accurately controlling the temperature of a chemical solution supplied to a developing process such as a developing solution supplied from a control unit to an arbitrary set temperature. It is in the point of providing.

(問題点を解決するための手段) そこで本発明は、現像槽(1)に被現像体(W)の保持
手段を内装すると共にこの保持手段で保持される被現像
体(W)に現像処理に供される薬液、例えば現像液、前
処理液、後処理液等を供給するための制御手段(A)、
例えばノズル等の放出手段(2)、制御弁(61)及び
ストレーナ(62)等を設け、この制御手段(A)を、
温調器(5)を介して薬液容器(3)に接続したレジス
ト現像装置であって、前記現像槽(1)の外部に、前記
制御手段(A)を内部に収容する熱媒チャンバー(3
0)を設けると共に、恒温熱媒発生装置(7)を形成し
て、この恒温熱媒発生装置(7)を前記熱媒チャンバー
(30)の内部に配管(76)(77)を介して連結
し、前記熱媒チャンバー(30)の内部に恒温熱媒体を
循環させる如く成し、前記制御手段(A)に前記恒温熱
媒体を接触させる如くしたことを特徴とするものであ
る。
(Means for Solving the Problems) Therefore, according to the present invention, the developing tank (1) is internally provided with a means for holding the object to be developed (W), and the object to be developed (W) held by the holding means is subjected to a developing treatment. Control means (A) for supplying a chemical solution, such as a developing solution, a pretreatment solution, and a posttreatment solution,
For example, a discharge means (2) such as a nozzle, a control valve (61), a strainer (62), etc. are provided, and this control means (A) is
A resist developing device connected to a chemical liquid container (3) via a temperature controller (5), wherein a heating medium chamber (3) is housed inside the developing tank (1) and inside the control means (A).
0) is provided and a constant temperature heat medium generator (7) is formed, and this constant temperature heat medium generator (7) is connected to the inside of the heat medium chamber (30) via pipes (76) (77). The constant temperature heat medium is circulated inside the heat medium chamber (30), and the constant temperature heat medium is brought into contact with the control means (A).

尚、前記薬液としては、前記現像液等のうち何れか一つ
あればよく、また前記制御手段(A)としては、前記放
出手段(2)等のうち何れか一つあればよい。
The chemical solution may be any one of the developing solutions and the like, and the control means (A) may be any one of the discharging means (2) and the like.

(作用) 前記恒温熱媒発生装置(7)に連結され、恒温熱媒体が
循環する前記熱媒チャンバー(30)の内部に、前記制
御手段(A)を収容することにより、該制御手段(A)
に恒温熱媒体が接触することとなるのであり、この制御
手段(A)への恒温熱媒体の接触により、前記制御手段
(A)が外気の影響を受けるのをなくすることができる
のであり、従って、前記制御手段(A)から前記被現像
体(W)に供給される薬液の温度を設定値に高精度に制
御できるものである。
(Operation) By accommodating the control means (A) inside the heat medium chamber (30) connected to the constant temperature heat medium generator (7) and circulating the constant temperature heat medium, the control means (A) )
The constant temperature heat medium comes into contact with the control means (A), and the contact of the constant temperature heat medium with the control means (A) can prevent the control means (A) from being affected by the outside air. Therefore, the temperature of the chemical solution supplied from the control means (A) to the development target (W) can be controlled to a set value with high accuracy.

(実施例) 第1図において(1)は現像槽であって、この現像槽
(1)は二重壁構造とした胴体(11)と、底壁(1
2)及び蓋体(13)とから成り、内部に現像室(1
0)を形成すると共に、前記胴体(11)の二重壁構造
により、前記現像室(10)を取囲む熱交換チャンバー
(14)を形成している。
(Embodiment) In FIG. 1, (1) is a developing tank, and this developing tank (1) has a body (11) having a double wall structure and a bottom wall (1).
2) and a lid (13), and the developing chamber (1
0) and the double wall structure of the body (11) forms a heat exchange chamber (14) surrounding the developing chamber (10).

また、前記底壁(12)には支持筒(15)を立設し
て、その内部に、上端に被現像体として例えば半導体ウ
エハ(W)を固定状に保持するチャック(16)をもっ
た回転軸(17)を回転自由に支持するのであり、ま
た、前記蓋体(13)には、前記チャック(16)に保
持される前記ウエハ(W)に、現像処理に供される薬液
の一つである現像液を放出する例えばスプレーノズル等
の放出手段(2)を配設している。
Further, a support cylinder (15) is provided upright on the bottom wall (12), and inside thereof, a chuck (16) as a developed object is fixedly held at a top end thereof, for example, a semiconductor wafer (W). The rotation shaft (17) is rotatably supported, and the lid body (13) holds the wafer (W) held by the chuck (16) and a part of the chemical solution used for the development process. Discharge means (2) such as a spray nozzle for discharging the developing solution is provided.

この放出手段(2)は、詳しくは後記する温調器(5)
を介して加圧タンクを構成する薬液容器の一つである現
像液容器(3)に接続され、前記温調器(5)により温
度調整された現像液を、送液管(6)を介して前記放出
手段(2)に導き、該放出手段(2)から前記ウエハ
(W)に薬液(現像液)を例えば噴射により放出するよ
うにしている。
The discharging means (2) is provided with a temperature controller (5) described later in detail.
Is connected to a developing solution container (3) which is one of the chemical solution containers constituting a pressurizing tank, and the temperature of the developing solution is adjusted by the temperature controller (5) via a liquid sending pipe (6). To the discharging means (2), and the chemical solution (developing solution) is discharged from the discharging means (2) to the wafer (W) by, for example, jetting.

更に、送液管(6)には、現像槽(1)への薬液(現像
液)の出停を制御するための制御弁(61)及び現像液
中の微小なゴミを除去するためのストレーナ(62)を
介装しており、これら放出手段(2)、制御弁(61)
及びストレーナ(62)等により制御手段(A)(これ
らを接続する送液管(6)を含む)を構成している。
Further, the liquid supply pipe (6) has a control valve (61) for controlling the flow of the chemical liquid (developing liquid) to the developing tank (1) and a strainer for removing minute dust in the developing liquid. (62) is interposed, these discharge means (2), control valve (61)
Further, the strainer (62) and the like constitute the control means (A) (including the liquid feed pipe (6) connecting these).

なお、制御手段(A)としては、送液管(6)を用いず
に放出手段(2)、制御弁(61)及びストレーナ(6
2)等を一体成形したものでもよく、この制御手段
(A)により、現像液等の薬液を前記半導体ウエハ
(W)に適確に供給することができるのである。
As the control means (A), the discharge means (2), the control valve (61) and the strainer (6) are used without using the liquid feed pipe (6).
2) and the like may be integrally molded, and the control unit (A) can appropriately supply a chemical liquid such as a developing liquid to the semiconductor wafer (W).

尚、現像液としては、例えばイソブチルアルコールとエ
タノールとを約50対50の割合で混合したものを用い
ている。また前処理液や後処理液としては例えばイソプ
ロピルアルコール等が用いられている。
As the developing solution, for example, a mixture of isobutyl alcohol and ethanol in a ratio of about 50:50 is used. As the pretreatment liquid and the posttreatment liquid, for example, isopropyl alcohol or the like is used.

そして、以上のように構成するレジスト現像装置におい
て、前記現像槽(1)の外部に、前記制御手段(A)を
内部に収容する熱媒チャンバー(30)を設けると共
に、恒温熱媒発生装置(7)を形成して、この恒温熱媒
発生装置(7)を前記熱媒チャンバー(30)の内部に
配管(76)(77)を介して連結し、前記熱媒チャン
バー(30)の内部に恒温熱媒体を循環させる如く成
し、前記制御手段(A)に前記恒温熱媒体を接触させる
如くしたのである。
Further, in the resist developing device configured as described above, a heat medium chamber (30) for accommodating the control means (A) therein is provided outside the developing tank (1), and a constant temperature heat medium generating device ( 7) is formed, and the constant temperature heat medium generator (7) is connected to the inside of the heat medium chamber (30) through the pipes (76) (77), and inside the heat medium chamber (30). The constant temperature heat medium is circulated, and the constant temperature heat medium is brought into contact with the control means (A).

具体的には、前記熱媒チャンバー(30)は、カップ状
の本体(31)を前記蓋体(13)の上部に取付けて構
成するものであって、この熱媒チャンバー(30)の内
部に、前記制御手段(A)を収容する如くしているので
ある。
Specifically, the heat medium chamber (30) is configured by attaching a cup-shaped main body (31) to the upper part of the lid body (13), and the heat medium chamber (30) is provided inside the heat medium chamber (30). The control means (A) is housed.

また、前記現像槽(1)と前記温調器(5)とが離れて
いるため、前記送液管(6)の一部すなわち、前記熱媒
チャンバー(30)と前記温調器(5)との間は断熱構
造とした二重管(40)を用いて接続しているのであっ
て、該二重管(40)の内管(41)に前記薬液の一つ
である現像液を、また外管(42)に恒温熱媒を通して
いるのである。尚、上前二重管(40)は、恒温熱媒の
戻配管(77)及び断熱材(43)と共に1本の複合管
(44)を形成している。
Further, since the developing tank (1) and the temperature controller (5) are separated from each other, a part of the liquid feeding pipe (6), that is, the heat medium chamber (30) and the temperature controller (5). Is connected by using a double tube (40) having a heat insulating structure, and the developing solution, which is one of the chemical solutions, is added to the inner tube (41) of the double tube (40). Further, a constant temperature heat medium is passed through the outer tube (42). The upper front double pipe (40) forms one composite pipe (44) together with the return pipe (77) for the constant temperature heating medium and the heat insulating material (43).

次に恒温熱媒発生装置(7)について説明する。尚、こ
の実施例では、恒温熱媒体として恒温水を用いている。
Next, the constant temperature heat medium generator (7) will be described. In this embodiment, constant temperature water is used as the constant temperature heat medium.

この発生装置(7)は、断熱構造とした恒温槽(70)
に、ヒータ(71)及び冷凍装置の蒸発器(72)を内
装して構成するのであって、熱媒ポンプ(75)により
前記二重管(40)の外管(42)に恒温水(恒温熱媒
体)を供給すると共に、前記戻配管(77)からの恒温
水(恒温熱媒体)を前記恒温槽(70)内に戻すように
している。
This generator (7) is a thermostatic chamber (70) with a heat insulating structure.
In addition, the heater (71) and the evaporator (72) of the refrigerating apparatus are built in, and a constant temperature water (constant temperature) is applied to the outer pipe (42) of the double pipe (40) by the heat medium pump (75). While supplying the heat medium, the constant temperature water (constant heat medium) from the return pipe (77) is returned to the constant temperature tank (70).

また、前記恒温槽(70)内に、前記薬液容器を構成す
る現像液溶液(3)から延びるコイル状の熱交換器(5
0)を配設することにより、前記した薬液の一つである
現像液の温調器(5)を前記発生装置(7)と一体に構
成するのであって、この温調器(5)により前記恒温水
(恒温熱媒体)と同じ温度に設定される現像液を、前記
容器(3)の加圧作用により前記二重管(40)の内管
(41)に供給するようにしている。尚、前記熱交換器
(50)の内部の容積は、1回の現像に用いる液量概ね
200〜400cc以上にするのが好ましい。
Further, in the constant temperature bath (70), a coil-shaped heat exchanger (5) extending from the developer solution (3) constituting the chemical solution container is provided.
0), the temperature controller (5) for the developing solution, which is one of the chemical solutions described above, is formed integrally with the generator (7). The developing solution set to the same temperature as the constant temperature water (constant temperature heating medium) is supplied to the inner pipe (41) of the double pipe (40) by the pressurizing action of the container (3). The internal volume of the heat exchanger (50) is preferably about 200 to 400 cc or more of liquid used for one development.

そして前記恒温槽(70)に内装する前記ヒータ(7
1)及び蒸発器(72)の運転は、前記熱媒チャンバー
(30)内の水温(熱媒温度)などを検出し、予じめ任
意に設定した設定温度との比較を行なうコントローラ
(8)により制御されるのであって、前記ヒータ(7
1)及び蒸発器(72)の運転制御により5℃乃至40
℃で誤差±0.1℃の一定の恒温水(恒温熱媒体)を形
成できるのである。
And the heater (7) installed in the constant temperature bath (70)
1) and the operation of the evaporator (72), a controller (8) that detects the water temperature (heat medium temperature) in the heat medium chamber (30) and compares it with a preset temperature that has been arbitrarily set in advance. It is controlled by the heater (7
1) and the evaporator (72) operation control, 5 ℃ -40
It is possible to form a constant temperature water (constant temperature heating medium) with an error of ± 0.1 ° C. at the temperature.

さらに、前記蒸発器(72)に対応する冷凍装置におけ
る凝縮器(78)は、圧縮機と共にコンデンシングユニ
ット(9)に設けるのであって、前記蒸発器(72)の
運転制御は前記圧縮機の発停又は容量制御により行なう
のである。
Further, the condenser (78) in the refrigeration system corresponding to the evaporator (72) is provided in the condensing unit (9) together with the compressor, and the operation control of the evaporator (72) is performed by the compressor. This is done by starting / stopping or controlling the capacity.

かくして、前記恒温熱媒発生装置(7)からの恒温熱媒
体は、前記熱交換チャンバー(14)と前記熱媒チャン
バー(30)とに直列に循環させるのであり、前記恒温
熱媒体は、前記二重管(40)の外管(42)から第1
連絡管(80)を介して前記現像槽(1)の熱交換チャ
ンバー(14)に一旦開放され、該チャンバー(14)
から第2連絡管(90)を介して前記熱媒チャンバー
(30)の内部に供給されるのであって、これら一連の
通路(42)(80)(14)(90)より成る配送管
(76)及び前記戻配管(77)により前記熱媒チャン
バー(30)に恒温熱媒体を循環させているのである。
Thus, the constant temperature heat medium from the constant temperature heat medium generator (7) is circulated in series between the heat exchange chamber (14) and the heat medium chamber (30), and the constant temperature heat medium is First to the outer tube (42) of the heavy tube (40)
The chamber (14) is once opened to the heat exchange chamber (14) of the developing tank (1) through the communication pipe (80).
To the inside of the heat medium chamber (30) through the second connecting pipe (90), and the delivery pipe (76) is composed of a series of these passages (42) (80) (14) (90). ) And the return pipe (77), the constant temperature heat medium is circulated in the heat medium chamber (30).

このとき、前記熱媒ジャケット(30)内に収容される
前記放出手段(2)及び該放出手段(2)を接続する送
液管(6)、また前記ストレーナ(62)及び制御弁
(61)、すなわち制御手段(A)は、所定の設定温度
に調整された恒温熱媒体と直接接触するのであるから、
前記制御手段(A)は外気の影響を受けることはないの
である。従って、前記制御手段(A)から供給される現
像液等の薬液の温度は設定値に高精度に制御できるので
ある。
At this time, the discharge means (2) housed in the heat medium jacket (30), the liquid delivery pipe (6) connecting the discharge means (2), the strainer (62) and the control valve (61). That is, since the control means (A) is in direct contact with the constant temperature heat medium adjusted to a predetermined set temperature,
The control means (A) is not affected by outside air. Therefore, the temperature of the chemical liquid such as the developer supplied from the control means (A) can be controlled to the set value with high accuracy.

また、前記熱交換チャンバー(14)にも恒温熱媒体を
循環させているで、前記現像室(10)内の温度も該現
像室(10)内の雰囲気空気を介して間接的に設定温度
に保持できるのである。
Further, since the constant temperature heat medium is circulated in the heat exchange chamber (14), the temperature in the developing chamber (10) is indirectly set to the set temperature via the atmospheric air in the developing chamber (10). It can be retained.

しかも、この設定温度は、前記コントローラ(8)の入
力器により任意に設定できるし、任意に選択した設定温
度に正確に制御できるのである。
Moreover, the set temperature can be set arbitrarily by the input device of the controller (8), and can be accurately controlled to the arbitrarily set set temperature.

尚、第1図において(20)は、前記現像槽(1)の胴
体(11)に設けるウエハ出入口であって、この出入口
(20)には扉(21)を開閉自由に取付けている。
In FIG. 1, (20) is a wafer entrance / exit provided in the body (11) of the developing tank (1), and a door (21) is attached to the entrance / exit (20) so as to be freely opened and closed.

第1図の実施例では、前記熱媒チャンバー(30)を、
前記現像槽(1)の上部に構成したが、第2図の如く現
像槽(1)と独立に構成してもよい。
In the embodiment shown in FIG. 1, the heating medium chamber (30) is
Although it is arranged above the developing tank (1), it may be formed separately from the developing tank (1) as shown in FIG.

この第2図のものは、熱媒チャンバー(30)を箱形本
体(32)で構成し、該本体(32)の内部に、制御手
段(A)のうち放出手(2)段を除く制御弁(61)及
びストレーナ(62)を収容する如くしたものである。
また、この熱媒チャンバー(30)は、現像室(10)
の雰囲気温度を調節する熱交換チャンバー(14)と配
管(76)(77)により並列に接続され、恒温熱媒発
生装置(7)からの恒温熱媒体を、前記両チャンバー
(30)(14)に並列に循環されている。
In FIG. 2, the heat medium chamber (30) is composed of a box-shaped main body (32), and inside the main body (32), the control means (A) excluding the discharging hand (2) stage is controlled. A valve (61) and a strainer (62) are accommodated.
The heat medium chamber (30) is used as a developing chamber (10).
Is connected in parallel with the heat exchange chamber (14) for adjusting the ambient temperature of the pipes (76) (77), and the constant temperature heat medium from the constant temperature heat medium generator (7) is supplied to the both chambers (30) (14). Are circulated in parallel to.

尚、第2図では、温調器(5)を前記発生装置(7)と
別体に形成しており、また、薬液容器(3)の薬液はポ
ンプ(P)にて送出するようにしている。さらに蓋体
(13)にファン(22)を取付けて、該ファン(2
2)の撹拌により、前記現像室(10)の室内を、前記
放出手段(2)から放出される薬液で迅速に飽和させる
如くしている。
In FIG. 2, the temperature controller (5) is formed separately from the generator (7), and the chemical solution in the chemical solution container (3) is delivered by a pump (P). There is. Further, a fan (22) is attached to the lid body (13), and the fan (2)
By the stirring of 2), the inside of the developing chamber (10) is quickly saturated with the chemical solution discharged from the discharging means (2).

以上の第1図及び第2図の実施例では、現像処理に供さ
れる薬液として、現像液のみを取上げて説明したが、前
処理後、後処理液等についても前記現像液の場合と同
様、本発明が適用されるのは云うまでもない。また、恒
温熱媒体を前記熱交換チャンバー(30)だけでなく、
前記熱交換チャンバー(14)にも循環させているが、
該熱交換チャンバー(14)は設けずに、前記熱交換チ
ャンバー(30)のみに恒温熱媒体を循環させてもよ
い。
In the embodiments of FIGS. 1 and 2 described above, only the developing solution was taken as the chemical solution to be used in the developing process, but the pre-treatment and post-treatment solutions are the same as in the case of the developing solution. Needless to say, the present invention is applied. In addition to the constant temperature heat medium, not only the heat exchange chamber (30),
It is also circulated in the heat exchange chamber (14),
The constant temperature heat medium may be circulated only in the heat exchange chamber (30) without providing the heat exchange chamber (14).

(発明の効果) 本発明は以上のように、前記現像槽(1)の外部に、前
記制御手段(A)を内部に収容する熱媒チャンバー(3
0)を設けると共に、恒温熱媒発生装置(7)を形成し
て、この恒温熱媒発生装置(7)を前記熱媒チャンバー
(30)の内部に配管(76)(77)を介して連結
し、前記熱媒チャンバー(30)の内部に恒温熱媒体を
循環させる如く成し、前記制御手段(A)に前記恒温熱
媒体を接触させる如くしたから、前記制御手段(A)か
ら供給される現像液、前処理液、後処理液等の現像処理
に供される薬液の温度を任意に設定できると共に、設定
した温度に高精度に保持できるのである。
(Effects of the Invention) As described above, the present invention provides a heating medium chamber (3) that accommodates the control means (A) inside the developing tank (1).
0) is provided and a constant temperature heat medium generator (7) is formed, and the constant temperature heat medium generator (7) is connected to the inside of the heat medium chamber (30) through pipes (76) (77). Then, the constant temperature heat medium is circulated in the heat medium chamber (30), and the constant temperature heat medium is brought into contact with the control means (A), so that the constant temperature heat medium is supplied from the control means (A). The temperature of the chemical solution to be used in the development process such as the developing solution, the pretreatment solution, and the posttreatment solution can be arbitrarily set, and the set temperature can be maintained with high accuracy.

従って、現像液等の薬液の温度変化によるレジスト感度
のバラつきを最小限に抑制でき、半導体ウエハ等の被現
像体の製品保留を向上できるのである。
Therefore, it is possible to minimize variations in resist sensitivity due to temperature changes of a chemical such as a developing solution, and to improve product retention of a development target such as a semiconductor wafer.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明現像装置の第1実施例を示す概略説明
図、第2図は同第2実施例を示す概略説明図、第3図及
び第4図は従来例を示す概略説明図である。 (1)……現像槽 (2)……放出手段 (3)……薬液容器 (5)……温調器 (6)……送液管 (7)……恒温熱媒発生装置 (30)……熱媒チャンバー (61)……制御弁 (62)……ストレーナ (76)(77)……配管 (A)……制御手段 (W)……被現像体。
FIG. 1 is a schematic explanatory view showing a first embodiment of a developing device of the present invention, FIG. 2 is a schematic explanatory view showing the second embodiment, and FIGS. 3 and 4 are schematic explanatory views showing a conventional example. is there. (1) …… Developing tank (2) …… Discharging means (3) …… Chemical liquid container (5) …… Temperature regulator (6) …… Liquid transfer pipe (7) …… Constant temperature heat medium generator (30) …… Heat medium chamber (61) …… Control valve (62) …… Strainer (76) (77) …… Piping (A) …… Control means (W) …… Development target.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】現像槽(1)に被現像体(W)の保持手段
を内装すると共にこの保持手段で保持される被現像体
(W)に現像処理に供される薬液を供給するための制御
手段(A)を設け、この制御手段(A)を、温調器
(5)を介して薬液容器(3)に接続したレジスト現像
装置であって、前記現像槽(1)の外部に、前記制御手
段(A)を内部に収容する熱媒チャンバー(30)を設
けると共に、恒温熱媒発生装置(7)を形成して、この
恒温熱媒発生装置(7)を前記熱媒チャンバー(30)
の内部に配管(76)(77)を介して連結し、前記熱
媒チャンバー(30)の内部に恒温熱媒体を循環させる
如く成し、前記制御手段(A)に前記恒温熱媒体を接触
させる如くしたことを特徴とするレジスト現像装置。
1. A developing tank (1) is equipped with a means for holding a material to be developed (W), and a solution for development is supplied to the material to be developed (W) held by the holding means. A resist developing device in which control means (A) is provided, and the control means (A) is connected to a chemical liquid container (3) through a temperature controller (5), and is provided outside the developing tank (1). A heat medium chamber (30) for accommodating the control means (A) is provided, and a constant temperature heat medium generator (7) is formed, and the constant temperature heat medium generator (7) is used for the heat medium chamber (30). )
Is connected to the inside of the heating medium via pipes (76) and (77), and the constant temperature heating medium is circulated in the heating medium chamber (30), and the constant temperature heating medium is brought into contact with the control means (A). A resist developing device characterized by the above.
JP61107875A 1986-05-12 1986-05-12 Resist developing device Expired - Fee Related JPH061763B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61107875A JPH061763B2 (en) 1986-05-12 1986-05-12 Resist developing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61107875A JPH061763B2 (en) 1986-05-12 1986-05-12 Resist developing device

Publications (2)

Publication Number Publication Date
JPS62263635A JPS62263635A (en) 1987-11-16
JPH061763B2 true JPH061763B2 (en) 1994-01-05

Family

ID=14470303

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61107875A Expired - Fee Related JPH061763B2 (en) 1986-05-12 1986-05-12 Resist developing device

Country Status (1)

Country Link
JP (1) JPH061763B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7258196B2 (en) * 2018-06-12 2023-04-14 東京エレクトロン株式会社 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

Also Published As

Publication number Publication date
JPS62263635A (en) 1987-11-16

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