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JPH0625735B2 - Zero correction device in optical measuring instrument - Google Patents
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JPH0625735B2 - Zero correction device in optical measuring instrument - Google Patents

Zero correction device in optical measuring instrument

Info

Publication number
JPH0625735B2
JPH0625735B2 JP62136856A JP13685687A JPH0625735B2 JP H0625735 B2 JPH0625735 B2 JP H0625735B2 JP 62136856 A JP62136856 A JP 62136856A JP 13685687 A JP13685687 A JP 13685687A JP H0625735 B2 JPH0625735 B2 JP H0625735B2
Authority
JP
Japan
Prior art keywords
optical
zero
correction
light
zero correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62136856A
Other languages
Japanese (ja)
Other versions
JPS63300941A (en
Inventor
鴻三 白戸
明男 金子
三郎 井上
昭彦 永井
徳人 福永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eruma Shii Aaru Kk
Original Assignee
Eruma Shii Aaru Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eruma Shii Aaru Kk filed Critical Eruma Shii Aaru Kk
Priority to JP62136856A priority Critical patent/JPH0625735B2/en
Publication of JPS63300941A publication Critical patent/JPS63300941A/en
Publication of JPH0625735B2 publication Critical patent/JPH0625735B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Description

【発明の詳細な説明】 <産業上の利用分野> 本発明は、示差屈折計や分光光度計等各種光学測定器に
おけるゼロ補正装置に関するものである。即ち、光学測
定器における検出機構の多くは、測定開始前の光のエネ
ルギーレベルと測定時における光のエネルギーレベルと
の差を電気信号に変換する方式になっている。従ってこ
の場合、当然のことながら測定開始前における出力がゼ
ロを表示するように設定しておく必要があり、この出力
をゼロに設定するための機構をゼロ補正機構(装置)と
言う。
TECHNICAL FIELD The present invention relates to a zero correction device in various optical measuring instruments such as a differential refractometer and a spectrophotometer. That is, most of the detection mechanisms in the optical measuring device are of a system that converts the difference between the energy level of light before the start of measurement and the energy level of light at the time of measurement into an electric signal. Therefore, in this case, as a matter of course, it is necessary to set the output before the start of measurement to display zero, and the mechanism for setting this output to zero is called a zero correction mechanism (device).

<従来の技術> この種ゼロ補正を自動的に行なう機構には、受光体に入
射する光を光学補正機構でコントロールする光学学的オ
ートゼロ方式と、測定開始前の誤差電圧に相当する電圧
を外部から与えて相殺する電気的オートゼロ方式とがあ
る。光学的オートゼロ方式は光のエネルギーを測定開示
前に常に同一とすることが出来るためエネルギーレベル
の変動に伴なう測定時の試料濃度と出力との関係を示す
検量線の直線性及び直線性の範囲が常に一定となる利点
を有するが、受光体に入射する光量や光軸を調整するた
めの光学補正機構を制御モータで駆動させなければなら
ない為、ゼロ補正作業に時間が掛かり、速く駆動させる
とゼロ補正の精度が低下すると言った不具合がある。
又、電気的オートゼロ方式ではゼロ補正時間は速いが光
学的エネルギーレベルのバランス補正を行なわない為、
検量線の変動を伴ない測定値の補正を必要とする不具合
がある。
<Prior art> As a mechanism for automatically performing this kind of zero correction, an optical auto-zero method in which light incident on a photoreceptor is controlled by an optical correction mechanism and a voltage corresponding to an error voltage before the start of measurement are externally supplied. There is an electrical auto-zero method that cancels by giving it from. Since the optical auto-zero method can always make the light energy the same before the measurement is disclosed, the linearity and linearity of the calibration curve showing the relationship between the sample concentration and the output at the time of measurement accompanying the fluctuation of the energy level Although it has the advantage that the range is always constant, the optical correction mechanism for adjusting the amount of light incident on the photoreceptor and the optical axis must be driven by the control motor, so it takes time to perform zero correction work and it can be driven quickly. There is a problem that the accuracy of zero correction is reduced.
Also, in the electric auto-zero method, the zero correction time is fast, but since the optical energy level balance correction is not performed,
There is a problem that it is necessary to correct the measured value with the fluctuation of the calibration curve.

<発明が解決しようとする問題点> 本発明はこの様な従来の不具合に鑑みてなされたもので
あり、ゼロ補正に要する時間を従来の光学的オートゼロ
方式よりも大巾に短縮させることが出来ると共に、ゼロ
補正の精度を従来の光学的オートゼロ方式と同程度とす
ることが出来、しかも光学的エネルギーレベルのバラン
スを測定開始前に常に同一となし検量線の直線性及び直
線性の範囲を常に一定に保持することが出来る光学測定
器におけるゼロ補正装置を提供せんとするものである。
<Problems to be Solved by the Invention> The present invention has been made in view of such conventional problems, and the time required for zero correction can be greatly reduced as compared with the conventional optical auto-zero method. At the same time, the accuracy of zero correction can be made comparable to the conventional optical auto-zero method, and the balance of the optical energy level is not always the same before starting the measurement. An object of the present invention is to provide a zero correction device in an optical measuring device that can be held constant.

<問題点を解決するための手段> 係る目的を達成するため本発明光学測定器におけるゼロ
補正装置は受光体に入射する光をコントロールする光学
補正機構の制御回路を上記受光体と電気的に接続させる
と共に、該制御回路の出力側に、測定開始前の誤差電圧
に相当する電圧を外部から与えて相殺する電気的ゼロ補
正回路を接続させた事を特徴としたものである。
<Means for Solving the Problems> In order to achieve the above object, the zero correction device in the optical measuring instrument of the present invention electrically connects the control circuit of the optical correction mechanism for controlling the light incident on the photoreceptor to the photoreceptor. In addition to that, an electrical zero correction circuit for externally applying a voltage corresponding to the error voltage before the start of measurement to cancel the voltage is connected to the output side of the control circuit.

<実施例> 以下、本発明実施例を図面に基づいて説明する。<Examples> Examples of the present invention will be described below with reference to the drawings.

第1図は示差屈折計の例を示し、第3図は分光光度計の
例を示すが、この値にも測定開始前の光のエネルギーレ
ベルと測定時における光のエネルギーレベルとの差を電
気信号に変換する検出機構を備えたあらゆる光学測定器
に本発明装置が適用できることは以下の説明によって容
易に理解されるだろう。
Fig. 1 shows an example of a differential refractometer, and Fig. 3 shows an example of a spectrophotometer. This value also shows the difference between the energy level of light before the start of measurement and the energy level of light at the time of measurement. It will be easily understood from the following description that the device of the present invention can be applied to any optical measuring device having a detection mechanism for converting into a signal.

第1図において図中1は光源ランプであり、この光源ラ
ンプ1からの光Pは試料セル2を通り、試料セル2の後
方に設置した反射鏡3で反射されてガラス板4を通して
受光体5に入射する。受光体5に入射した光エネルギー
はその受光体5で電気エネルギーに変換され、制御回路
6で増巾されて電気的ゼロ補正回路7に出力される。こ
の反射鏡3から受光体5に至る光学系において、制御回
路6から信号によって制御モータ8を駆動させガラス板
4の角度を動かすことにより受光体5に入射する光軸を
平行に移動させて、測定開始前の光学的ゼロ補正を行な
うものである。即ち、受光体5に入射する光Pをコン
トロールする光学補正機構は、ガラス板4とそのガラス
板4を動かすための制御モータ8及び制御モータ8の駆
動させる制御回路6とで構成され、その制御回路6を受
光体5と電気的に接続させてなり、測定開始前の状態に
おいて試料側受光素子と対照側受光素子からなる受光体
5に入射した光Pが上記試料側受光素子と対照側受光
素子とに均等に入射されていない場合には、受光体5か
らそれに応じた信号が出力されて制御回路6に印加さ
れ、その信号によって試料側受光素子と対照側受光素子
とに光が均等に入射するように制御モータ8を介してガ
ラス板4が動かされ、受光体5に入射する光軸を平行に
移動させて光学的ゼロ補正を行なうものである。
In FIG. 1, reference numeral 1 in the drawing is a light source lamp, and light P from this light source lamp 1 passes through a sample cell 2, is reflected by a reflecting mirror 3 installed behind the sample cell 2, and passes through a glass plate 4 to receive a light receiver 5 Incident on. The light energy incident on the light receiver 5 is converted into electric energy by the light receiver 5, amplified by the control circuit 6 and output to the electrical zero correction circuit 7. In the optical system from the reflecting mirror 3 to the light receiving body 5, a control motor 8 is driven by a signal from the control circuit 6 to move the angle of the glass plate 4 to move the optical axis incident on the light receiving body 5 in parallel. Optical zero correction is performed before the start of measurement. That is, the optical correction mechanism that controls the light P 1 incident on the light receiver 5 is composed of the glass plate 4, the control motor 8 for moving the glass plate 4, and the control circuit 6 for driving the control motor 8. The control circuit 6 is electrically connected to the light receiving body 5, and the light P 1 incident on the light receiving body 5 composed of the sample side light receiving element and the reference side light receiving element in the state before the measurement is compared with the sample side light receiving element. When the light is not evenly incident on the side light receiving element, a signal corresponding thereto is output from the light receiving body 5 and applied to the control circuit 6, and the signal causes light to be transmitted to the sample side light receiving element and the control side light receiving element. The glass plate 4 is moved through the control motor 8 so that the light is evenly incident, and the optical axis incident on the light receiver 5 is moved in parallel to perform optical zero correction.

次いで、制御回路6の出力側に電気的ゼロ補正回路7を
接続させて、電気的ゼロ補正を行なう。この電気的ゼロ
補正回路7は測定開始前の誤差電圧に相当する電圧を外
部から与えて相殺する回路となっており、具体的には第
2図に示す如く基本的に、受光体5から入力される電圧
の大小(プラズマ・マイナス)を判別するためのコンパ
レータ20と、そのコンパレータ20の判別にしたがい電圧
の加減算を行なうアップダウンカウンタ21と、誤差電圧
を相殺する為の差動増巾器22とで構成される。然して、
測定開始前の状態において受光体5に入射した光P
試料側受光素子と対照側受光素子とに均等に入射されて
いない場合には、受光体5からそれに応じた信号が出力
されるので、その信号を差動増巾器22の一方の入力端子
23から入力させ、その出力をコンパレータ20に入力させ
る。コンパレータ20では入力された信号の電圧の差をゼ
ロVに対してHIGH側にあるかLOW 側にあるかを比較判別
して、その判別結果にしたがいアップダウンカウンタ21
でもってHIGHの時は加算を行ないLOW の時は減算を行な
い、+INと−INの入力がバランスしたところでアップダ
ウンカウンタ21はバランスし平衡状態を保持し、差動増
巾器22に出力する。このアップダウンカウンタ21が平衡
状態の時にラッチをかけると、その出力電圧はこの時の
電圧をラッチが解かれるまで、入力電圧が変化してもこ
の電圧を保持し続ける。これで電気的ゼロ補正が行なわ
れる。
Next, the electrical zero correction circuit 7 is connected to the output side of the control circuit 6 to perform electrical zero correction. This electrical zero correction circuit 7 is a circuit for canceling by externally applying a voltage corresponding to the error voltage before the start of measurement. Specifically, as shown in FIG. The comparator 20 for discriminating the magnitude of the voltage (plasma minus), the up / down counter 21 for adding / subtracting the voltage according to the discrimination of the comparator 20, and the differential amplifier 22 for canceling the error voltage. Composed of and. However,
When the light P 1 that has entered the photodetector 5 before the start of measurement is not evenly incident on the sample-side photodetector and the control-side photodetector, the photodetector 5 outputs a corresponding signal. , That signal to one input terminal of the differential amplifier 22
It is input from 23 and its output is input to the comparator 20. The comparator 20 compares and determines the difference between the voltages of the input signals with respect to zero V on the HIGH side or the LOW side, and according to the determination result, the up / down counter 21
Therefore, when it is HIGH, addition is performed, and when it is LOW, subtraction is performed. When the + IN and -IN inputs are balanced, the up / down counter 21 balances and maintains a balanced state, and outputs it to the differential amplifier 22. If the up / down counter 21 is latched when it is in a balanced state, its output voltage will continue to hold this voltage even if the input voltage changes until the latch voltage is released. With this, electrical zero correction is performed.

又、第3図は分光光度計の例を示し、図中9は入射して
来た光Pを試料側受光体5aと対照側受光体5bとに振り分
けるためハーフミラーであり、10,10b は受光体5a,5b
に入射する光量を調整するための絞り(スリット)であ
り、図中第1図と同じ符号は同様の構成部材を示す。こ
の例では受光体5a,5bに入射する光Pをコントロールす
る光学補正機構は、ハーフミラー9とそのハーフミラー
9を動かすための制御モータ8及び制御モータ8を駆動
させる制御回路6とで構成される。側ち、測定開始前の
状態において試料側受光体5aと対照側受光体5bとに入射
される光量が均等でない場合には、それに応じた信号が
制御回路6に出力されて試料側受光体5a対照側受光体5b
とに入射される光のエネルギー(光量)が均等となるよ
うに制御モータ8を介してハーフミラー9の反射角度を
変えて光学的ゼロ補正を行なうものである。尚、対照側
受光体5bを必要としない単一受光体を使用した場合で
も、試料セル2に達する光量を同様に変化させる事によ
り光学的ゼロ補正を行なうことが出来る。そして、制御
回路6の出力は先に説明した電気的ゼロ補正回路7を通
して出力される。
Further, FIG. 3 shows an example of a spectrophotometer. In the figure, 9 is a half mirror for distributing the incident light P to the sample side light receiving body 5a and the control side light receiving body 5b, and 10 and 10b are Photoreceptors 5a, 5b
It is a diaphragm (slit) for adjusting the amount of light incident on, and the same reference numerals as those in FIG. 1 denote the same constituent members. In this example, the optical correction mechanism for controlling the light P incident on the light receivers 5a and 5b is composed of a half mirror 9, a control motor 8 for moving the half mirror 9, and a control circuit 6 for driving the control motor 8. It On the other hand, when the amount of light incident on the sample-side photoreceptor 5a and the control-side photoreceptor 5b is not equal in the state before the start of measurement, a signal corresponding to that is output to the control circuit 6 and the sample-side photoreceptor 5a. Control side photoreceptor 5b
Optical zero correction is performed by changing the reflection angle of the half mirror 9 via the control motor 8 so that the energy (light amount) of the light incident on and becomes uniform. Even when a single light receiving body that does not require the control side light receiving body 5b is used, optical zero correction can be performed by changing the amount of light reaching the sample cell 2 in the same manner. Then, the output of the control circuit 6 is output through the electrical zero correction circuit 7 described above.

<発明の効果> 本発明光学測定器におけるゼロ補正装置は斯様に構成し
たので、測定開始前のゼロ補正操作を行なうと、光学補
正機構(光学的オートゼロ機構)と電気的ゼロ補正回路
(電気的オートゼロ機構)とが連動してはたらき、従っ
て光学的バランスをとりつつ電気的ゼロ補正を行なうこ
とが出来、光学的アンバランスによって生じる出力の大
きさのずれを生じることなく迅速に且つ正確にゼロ補正
を行なうことが出来る。即ち、光学的補正機構は検量線
の変化が生じない範囲内に光学バランスを戻すためにの
みはたらかせるので、精度を上げるための速度制限が大
幅に緩和され、結果としてゼロ補正に要する時間を従来
の光学的オートゼロ方式よりも大巾に短縮させることが
出来る。又、電気的ゼロの補正範囲を光学的ゼロの補正
範囲内に制限することが出来るので、ゼロ補正の精度を
従来の光学的オートゼロ方式と同等以上に保持すること
ができるものである。
<Effects of the Invention> Since the zero-correction device in the optical measuring instrument of the present invention is configured in this way, if the zero-correction operation is performed before the start of measurement, the optical correction mechanism (optical auto-zero mechanism) and the electrical zero-correction circuit (electric Automatic zero mechanism), so that electrical zero correction can be performed while maintaining optical balance, and the output can be swiftly and accurately corrected without causing a deviation in output magnitude caused by optical imbalance. Correction can be done. In other words, the optical correction mechanism works only to restore the optical balance within the range where the calibration curve does not change, so the speed limit for improving the accuracy is greatly relaxed, and as a result, the time required for zero correction is reduced. It can be greatly shortened compared to the optical auto-zero method. Further, since the correction range of electrical zero can be limited to the correction range of optical zero, the accuracy of zero correction can be maintained at the same level as or higher than that of the conventional optical auto-zero method.

しかも、基本的なゼロ補正を光学補正機構(光学的オー
トゼロ機構)で行なっているので、光学的エネルギーレ
ベルのバランスを測定開始前に常に同一となし検量線の
直線線性及び直線性の範囲を常に一定に保持することが
出来、繰り返し補正の累積による光学的バランスの不良
がもたらす検量線の変化を来たす虞れがなくなる。第4
図はこの効果を示したグラフであり、縦軸に出力の大き
さを示し、横軸に光学的バランスのずれの大きさを示
し、光学的バランスの不良によって生じる試料濃度によ
って得られる出力信号の大きさの変化がない事が理解さ
れる。
Moreover, since the basic zero correction is performed by the optical correction mechanism (optical auto-zero mechanism), the balance of the optical energy level is not always the same before the measurement is started, and the linearity of the calibration curve and the linearity range are always maintained. It can be held constant, and there is no risk of causing a change in the calibration curve caused by poor optical balance due to the accumulation of repeated corrections. Fourth
The figure is a graph showing this effect, the vertical axis shows the magnitude of the output, the horizontal axis shows the magnitude of the deviation of the optical balance, of the output signal obtained by the sample concentration caused by the poor optical balance. It is understood that there is no change in size.

よって所期の目的を達成し得るTherefore, the intended purpose can be achieved.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明第1実施例を示す模式図、第2図は本発
明に係る電気的ゼロ補正回路の実施の一例を示す回路
図、第3図は本発明第2図実施例を示す模式図、第4図
は本発明装置の効果を説明するグラフである。 図中、5,5a,5bは受光体、6は制御回路、7は電気的
ゼロ補正回路、である。
FIG. 1 is a schematic diagram showing a first embodiment of the present invention, FIG. 2 is a circuit diagram showing an embodiment of an electrical zero correction circuit according to the present invention, and FIG. 3 is a second embodiment of the present invention. FIG. 4 is a schematic diagram for explaining the effect of the device of the present invention. In the figure, 5 and 5a and 5b are photoreceptors, 6 is a control circuit, and 7 is an electrical zero correction circuit.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 永井 昭彦 埼玉県川口市根岸2985 株式会社エルマ川 口工場内 (72)発明者 福永 徳人 埼玉県川口市根岸2985 株式会社エルマ川 口工場内 (56)参考文献 特開 昭51−98090(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Akihiko Nagai 2985 Negishi, Kawaguchi City, Saitama Prefecture Elma Kawaguchi Factory (72) Inventor Tokuto Fukunaga 2985 Negishi, Kawaguchi City Saitama Prefecture Elma Kawaguchi Factory (56) (56) References Japanese Patent Laid-Open No. 51-98090 (JP, A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】受光体に入射する光をコントロールする光
学補正機構の制御回路を上記受光体と電気的に接続させ
ると共に、該制御回路の出力側に、測定開始前の誤差電
圧に相当する電圧を外部から与えて相殺する電気的ゼロ
補正回路を接続させた事を特徴とする光学測定器におけ
るゼロ補正装置。
1. A control circuit of an optical correction mechanism for controlling light incident on a photoreceptor is electrically connected to the photoreceptor, and a voltage corresponding to an error voltage before the start of measurement is provided on the output side of the control circuit. A zero-correction device in an optical measuring instrument, characterized in that an electrical zero-correction circuit for externally applying and canceling is connected.
JP62136856A 1987-05-30 1987-05-30 Zero correction device in optical measuring instrument Expired - Fee Related JPH0625735B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62136856A JPH0625735B2 (en) 1987-05-30 1987-05-30 Zero correction device in optical measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62136856A JPH0625735B2 (en) 1987-05-30 1987-05-30 Zero correction device in optical measuring instrument

Publications (2)

Publication Number Publication Date
JPS63300941A JPS63300941A (en) 1988-12-08
JPH0625735B2 true JPH0625735B2 (en) 1994-04-06

Family

ID=15185110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62136856A Expired - Fee Related JPH0625735B2 (en) 1987-05-30 1987-05-30 Zero correction device in optical measuring instrument

Country Status (1)

Country Link
JP (1) JPH0625735B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008534945A (en) * 2005-03-31 2008-08-28 セドゥー ディアグノスチックス Optical device for blood analysis, analyzer equipped with such device

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03162651A (en) * 1989-11-20 1991-07-12 Shimadzu Corp Polarization type differential refractometer
WO2006025104A1 (en) * 2004-08-31 2006-03-09 Gl Sciences Incorporated Optical detection method and optical detector
JP4793413B2 (en) * 2008-07-30 2011-10-12 株式会社島津製作所 Differential refractive index detector

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5198090A (en) * 1975-02-26 1976-08-28 Atsuenyuno yubunnodosokuteihoho

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008534945A (en) * 2005-03-31 2008-08-28 セドゥー ディアグノスチックス Optical device for blood analysis, analyzer equipped with such device

Also Published As

Publication number Publication date
JPS63300941A (en) 1988-12-08

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